How to Mitigate Hardware Obsolescence in Next-Generation Test Systems

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1 Hw t Mitigate Hardware Obslescence in Next-Generatin Test Systems Intrductin The prblem with many test systems is that the verall system must be in peratin lnger than the individual system cmpnents are supprted. Smetimes the device being tested has an active service life measured in decades, while many test instruments are bslete and n lnger supprted after five years r less. Other times, the device being tested has an active service life measured in mnths. Bth f these are examples f lifecycle mismatch. A life-cycle mismatch creates a need t upgrade bslete instruments withut changing test applicatins, test fixtures, and devices under test (DUTs) r a need t change the test applicatin sftware withut changing any f the hardware r hardware-specific sftware. Updating test systems requires new test sftware develpment, revalidatin, and redcumentatin that are cstly, resurce-intensive, and time-cnsuming. T minimize the time and csts assciated with migrating r upgrading test systems, yu can use hardware abstractin layers (HALs) in test systems t separate the test applicatin frm the instrument hardware. This paper cvers HAL architecture, best practices, features, and benefits as well as utlines examples f LabVIEW and C-based implementatins. HAL Categries Mst HALs fall int ne f three grups: industry-standard, vendr-defined, and user-defined. An industrystandard HAL is defined and maintained by an industry standards bdy. Vendr-defined HALs are prvided and maintained by a single vendr. User-defined HALs are defined and maintained by the end-users building the test systems. The majrity f this paper fcuses n user-defined HALs. Industry-Standard A well-knwn industry-standard HAL is Interchangeable Virtual Instruments (IVI), which is maintained by the IVI Fundatin. IVI prvides a standard applicatin prgram interface (API) fr eight f the mst widely deplyed instrument types. The IVI specificatins have base, extended, and instrument-specific API ptins; range checking; simulatin; and ther features that make upgrading instruments easier. One IVI limit is that a user may require a functin available nly in the instrument-specific driver, thereby reducing interchangeability. This is because it is very difficult fr the user t extend the existing IVI Class Drivers. Vendr-Defined A vendr-defined HAL is ne in which a vendr creates a plug-in system fr different instrument types and mdels. Vendr-defined HALs have the advantage that the vendr invests in the design, prductin, supprt, and maintenance. Limits t vendr-defined HALs include breadth and depth f instruments supprted, quality, and ability t quickly and easily add new instruments especially cmpetitrs instruments. In additin, the vendr might fcus n maximizing the perfrmance f their instruments in the system, but nt the verall system perfrmance. Dependency n the HAL vendr s technical supprt culd increase dwntime duratin and cst, especially if surce cde is nt prvided. The lack f surce cde limits hw much yu can help yurself r yur ability t quickly add a new instrument. Als, the bslescence f the vendr-defined HAL wuld effectively bslete yur entire test system. User-Defined The advantage f user-defined HALs is that yu can custmize them t suit yur unique requirements and ptimize system perfrmance. If well-architected, a HAL wuld facilitate better test applicatin develpment and increase reuse. It is recmmended that yu chse a widely used, well-supprted applicatin develpment envirnment (ADE) that is pwerful enugh and des nt require advanced prgramming skills. Limits t userdefined HALs include the time and cst t design, implement, and maintain them. Natinal Instruments Page 1 f 18

2 Instrument-Centric and Applicatin-Specific HALs Each f the three HAL categries has an instrument-centric applicatin prgram interface (API), an applicatinspecific API, r a cmbinatin f bth. Instrument-Centric An instrument-centric API abstracts instrument differences by using a cmmn set f instrument-like functin calls that unique instruments can supprt. Fr example, IVI takes an instrument-centric view f abstractin that is, having tp level test applicatins call an instrument-centric API that makes all instruments lk similar (fr example, IviScpe_CnfigureAcquisitinType). User-defined HALs with an instrument-centric API can use mydmm r standardsiggen calls t abstract unique instruments. Applicatin-Specific In an applicatin-specific apprach, the test applicatins call an applicatin-specific API that is aligned with the type f tests it needs t perfrm (fr example, LED Test). Applicatin-specific HALs islate yu frm hw a particular instrument type behaves. User-defined HALs are mre likely t use applicatin-specific APIs because they can abstract instrument cmplexity in additin t hardware differences. Applicatin-specific HALs facilitate separating DUT-specific parameters frm reusable test lgic. Als, applicatin-specific HALs can use instrument-centric HALs t prvide an additinal layer f abstractin. HAL Selectin Pririties Categry Selectin Chse an industry-standard HAL if that satisfies yur requirements. The investment f many cmpanies and the stability f the standard ver many years reduce yur need t design, develp, and maintain it, saving yu time and mney. If industry-standard HALs d nt meet yur needs, the remaining ptins are vendr-defined r user-defined. By implementing yur wn user-defined HAL, yu can pick the architecture, tls, and industry sftware standards that are best suited fr yur applicatin. Cnsider vendr-defined HAL slutins very carefully because they may lck yu int their technical architecture and business structure, limiting yur ability t migrate faster and easier which is the main pint f HALs in the first place. API Selectin When designing a user-defined HAL, it is imprtant t decide whether an instrument-centric r applicatinspecific API wrks best t meet yur requirements. If an instrument-centric API is a better ptin, then define an internal cmmn instrument-centric API standard that yu can use acrss multiple types f DUTs. Break functins int three categries similar t IVI base, extended, and specific. The mst cmmn functins fr each instrument type are included in the base functins. Functins that are shared acrss many, but nt all, instruments are gruped in the extended functins, which have a standard API if that functin exists n the instrument. Finally, uncmmn functins are gruped in the specific functins. Build n IVI standards where pssible because it reduces time and effrt t define and implement as well as migrate during system upgrades. If an applicatin-specific API is a better ptin fr yur requirements, yu need t decide which divisin f applicatin functins is the mst efficient t develp and easiest t reuse. Natinal Instruments Page 2 f 18

3 User-Defined HAL Architecture Figure 1 shws the architecture f a user-defined HAL. The test applicatin is at the tp level. The test applicatin develper nly has t knw which tests t run, the parameters fr thse tests, and the test hardware requirements (sampling rate, reslutin, and s n). When designing the test, the develper des nt need t knw the specific instruments. The test applicatin in the LabVIEW example, named Main Test App.vi, calls functins frm the HAL. It is recmmended t have tw levels in yur HAL. The example HAL has an applicatin separatin layer (ASL), which the test applicatin calls int, and a device-specific sftware plug-in (DSSP) that the ASL calls int. Figure 1. User-Defined HAL Architecture Applicatin Separatin Layer (ASL) The ASL prvides applicatin-specific interfaces, such as InitAllDevices.vi, FreqSweepTest.vi, and LED Test.vi. Because the ASL API is applicatin-specific, it des nt expse details abut the instrument-centric peratins that need t be perfrmed. These interfaces are higher level, mre reusable, and easier t maintain. The ASL functins call int the DSSP layer. Device-Specific Sftware Plug-In (DSSP) The DSSP prvides device-specific mdules that manage the differences between instruments including driver type, driver interfaces, available functins, scaling, timing, and frmatting. The DSSP instances either use existing instrument drivers r cmmunicate directly with the instrument. Using Virtual Instrument Sftware Architecture (VISA) is recmmended t abstract the hardware bus and OS-specific hardware cmmunicatin. The DSSP layer makes the hardware interchangeability pssible. Natinal Instruments Page 3 f 18

4 HAL Best Practices Separate Test Lgic frm Cmmn Test Functins An imprtant best practice is t separate DUT-specific test lgic frm mre general, reusable test mdules t imprve reuse and reduce revalidatin and dcumentatin csts. Decupling and making layers mdular imprves system architecture s the layers are easier t develp and maintain. Fr example, separate the DUTspecific test limits (nt reusable) frm the actual limit test implementatin (reusable). Anther reasn t place the mre general test cde in the higher-level ASL is t reduce the amunt f duplicated cde. Separate Cmmn Test Functins frm Instrument Drivers and Hardware Separating cmmn test functins frm instrument drivers and hardware allws the ASL sftware mdule t get the same measurement results. It is als valid t add mre cde t a DSSP instance t make an instrument behave similarly t ther instruments. Fr example, if mst f yur digital multimeters (DMMs) can implement multipint measurements and yu need t use a DMM that is capable nly f single-pint measurements, yu can add lping cde int the DSSP implementatin level f the single-pint DMM t make it behave like a multipint DMM frm the perspective f the ASL. Separate Test System Parameters frm Test Lgic Anther best practice is t separate test system parameters frm test lgic. This reduces the hard-cded dependence n instruments r specific DSSP instances. It als makes it pssible t cmpile the test applicatin int an executable because yu d nt have t change the cde t mdify the test hardware. Design fr Dynamic r Static Interchangeability When designing an applicatin-specific HAL, yu can chse between dynamic r static interchangeability. Dynamic interchangeability means that yu select the specific DSSP implementatins during run time. In this case, yu use an XML cnfiguratin file that identifies the hardware resurce name and LabVIEW class implementatin f the DSSP parent class. Using LabVIEW classes frces yu t have the same cnnectr pane (similar t functin parameters) in the implemented virtual instruments (VIs), which are similar t functins. Static interchangeability means having yur functins cntain the same functin parameters but nt ging t the extra effrt f being able t interchange them at run time. A cmmn way t statically interchange yur functins is find and replace. The main disadvantage f static interchangeability is the effrt required t replace the functins. Either type f interchangeability is ging t require effrt either at develpment time (dynamic) r after deplyment (static). Natinal Instruments Page 4 f 18

5 HAL Implementatin Example This example features a user-defined HAL and instruments frm fur different manufacturers. It shws a system that was designed and implemented using the best practices described in this paper. LabVIEW is used fr its simple graphical system design capabilities that are ptimized fr test sftware develpment, large selectin f native instrument drivers, and bject-riented prgramming (OOP). This example uses OOP because it is an existing framewrk that ensures cnsistent interfaces amng the child classes. Mre imprtantly, it ffers dynamic interchangeability, s the nly element yu need t change is the cnfiguratin file. Yu can implement the same example in ther ADEs and using mechanisms ther than OOP t implement dynamic interchangeability. T learn hw t design HAL in a C-based ADE, refer t Appendix A - C Based HAL Implementatin Example in this dcument. A simple system best highlights the user-defined HAL design principles and best practices; hwever, yu can apply the same principles and practices t a mre cmplex system. Dynamic interchangeability was chsen because it makes system use easier in the future. Als, chsing the type f interchangeability that requires mre upfrnt effrt and cding adds mre value t the example. The example system uses a Fluke DMM, Agilent functin generatr, Tektrnix scillscpe, and an NI PXI switch t test a DUT with a lw-frequency, lw-pass filter, and an LED. The system is then migrated t NI PXI mdular instruments t demnstrate the HAL. Figure 2 shws the tp-level user interface t the test applicatin. Figure 2. Parameters and Results fr Filter and LED Tests Frnt Panel The example tp-level test applicatin (Figure 3) calls five VIs: Natinal Instruments Page 5 f 18

6 Figure 3. Main Test Applicatin 1. Initialize All Devices InitializeAllDevices first cnfigures the switch t test DUT 1 and then reads the XML cnfiguratin file t determine the instrument types, hardware resurce names, and DSSP class paths. It then dynamically lads the crrespnding DSSP classes and calls the Initialize Device instance f each DSSP class. Each Initialize Device pens the hardware resurce sessin and resets the instrument. InitializeAllDevices saves the class references in glbal variables that are used in the ther VIs. 2. Frequency Sweep Test The lw-frequency, lw-pass filter is tested using the FrequencySweepTest ASL VI. The ASL VI calls tw main DSSP functins in a lp: Generate Signal and ReadMaxAmp. The Generate Signal VI generates a selectable wavefrm with variable frequency and amplitude. When implementing the frequency sweep, a sine wave f cnstant amplitude is used and each time the Frequency Sweep Test lp is executed, the frequency f the sine wave is increased until the stp frequency is met. During each iteratin f the lp, the ReadMaxAmp DSSP VI measures the maximum amplitude that is being utput by the filter f the DUT. The utput frequencies and measured amplitudes are stred in an array that is passed t the Limit Test functin. 3. Limit Test The Limit Test VI takes the raw data frm the FreqSweepTest VI and uses the filter errr limits t calculate if the filter respnse data ever went ut f bunds. If it did nt, then the limit test passed and the VI utputs a True frm the Test Passed indicatr. The Limit Test VI als utputs a wavefrm graph shwing the results f the frequency sweep test and the limits. 4. LED Test The LED n the DUT is tested by applying a current and measuring the vltage acrss the LED. This is accmplished by using the Dide Test functin f the digital multimeter (DMM). If the resulting vltage is within the limits, the test is passed and a True is passed t the LED Test Passed? indicatr. The LED Test VI als utputs the actual vltage that was measured. After the LED Test is cmpleted, all f the references are clsed by ClseAll.vi. 5. Clse All Devices This VI des nt have any inputs r utputs ther than the errr clusters. It uses the DSSP class glbal variables t call the Clse VIs fr each DSSP class that is being used. The individual Clse VI f each DSSP then takes care f clsing the resurce sessin fr the specific instrument. Natinal Instruments Page 6 f 18

7 Initial System Cnfiguratin As shwn in Figure 4, the test applicatin is running n an NI PXI embedded cntrller with Windws XP. The PXI cntrller is cnnected t the Agilent 33220A signal generatr thrugh LAN, t the Tektrnix TDS2024 scillscpe ver USB, and t the Fluke 8845A DMM ver GPIB. The NI-SWITCH is cntrlled ver the PXI bus in the PXI chassis. The test fixture is made frm cmmercial-ff-the-shelf (COTS) prducts. A lw-pass, lwfrequency filter and LED are n the DUT. Figure 4. Hardware in Implementatin Example On tp f Windws XP, the applicatin uses NI-VISA t call int the bus specific cde (NI fr GPIB, Windws USB stack, Windws TCP/IP stack). Because NI-VISA will supprt new instrument cntrl buses in the future, yu d nt have t wrry abut upgrading t mdels that incrprate these new bus technlgies. Als, just like LabVIEW, NI-VISA is OS independent, s yu can mve it nt any ther OS that NI supprts. T call int NI-VISA, the applicatin uses either LabVIEW Plug and Play instrument drivers r IVI drivers. The IVI drivers require the IVI Cmpliance Package. NI-VISA includes NI Measurement & Autmatin Explrer (MAX), which is used t establish cmmunicatin with the instruments and cnfigure the IVI Class driver sessins necessary t use the interchangeability feature f IVI. It wuld als have been feasible t call directly int VISA frm the DSSP implementatin (direct I/O), but that is recmmended nly if an instrument driver is nt available. Natinal Instruments Page 7 f 18

8 HAL Implementatin Sftware Architecture Figure 5 shws the HAL architecture with specific functins listed and the instrument mdels displayed. The switch is initialized and clsed directly in ASL by using the NI-SWITCH instrument driver. Thugh less than ideal, this illustrates that smetimes interchangeability is a higher pririty fr certain instrument/measurement types. Deviating frm ASL-DSSP cnventin leaves rm fr future imprvements. The ability t add switch functins t the DSSP and create DSSP mdules fr switches shws hw yu can extend the HAL. Figure 5. Sftware in Implementatin Example Test cde and ASL cde in this implementatin are standard VIs, nt LabVIEW classes. Only the DSSP layer uses LabVIEW classes (OOP) t allw fr dynamic interchangeability and ease develpment effrts by creating a standard set f DSSP functins. The dashed line in Figure 5 shws where the interchangeability ccurs. Figure 6 shws the prject explrer view f the HAL implementatin in LabVIEW. Private data that can be accessed nly by the class is represented as a cntrl (.ctl file) and requires Data Member Access VIs such as Read Instr Resurce Str.vi. Natinal Instruments Page 8 f 18

9 DSSP Class Definitin Figure 6. Prject View f HAL Implementatin in LabVIEW The DSSP parent class definitin has three different types f functins: parent-nly, cmmn, and measurement-based. The DSSP parent class, DSSP.lvclass, cntains a superset f all the child class functins plus sme functins unique t the parent. A single child instance f the parent DSSP class (fr example, Ag Sig Gen.lvclass) has t cntain the cmmn DSSP functins and at least ne f the measurement-based functins. Table 1 shws the different DSSP functins and their categries. Categry Parent-Only Cmmn Measurement-Based Functin Names DSSP Specific References Read Instr Resurce Str Initialize Device Clse Device ReadMaxAmp Generate Signal Read Dide Table 1. DSSP Functin Categries Natinal Instruments Page 9 f 18

10 Table 2 shws which child classes implement parent DSSP functins. Functin Agilent Sig Gen NI Sig Gen Tektrnix Scpe NI Digitizer Fluke DMM NI DMM Initialize and Clse ReadMaxAmp Generate Signal Read Dide Table 2. DSSP Functin Lcatins In the example implementatin, nly the parent DSSP class cntains all f the functins that are needed in the test instrumentatin. This is pssible because the example is nt very cmplex. Fr a mre cmplex system, yu wuld mst likely want t have multiple DSSP definitins t keep the number f functins in each ne dwn t a manageable level. Figure 7 shws the simple implementatin and Figure 8 shws the cmplex implementatin suggestin. Figure 7. Simple Single-Tier Class Hierarchy in Example Implementatin Figure 8. Recmmend Multiple-Tiered Class Hierarchy in Cmplex Systems Natinal Instruments Page 10 f 18

11 The main difference between the tw DSSP hierarchies is that the measurement-based functins in the cmplex system are separated int anther level f subclasses r virtual flders. This makes the develpment and maintenance even mre manageable fr larger systems. Refer t Figure 9 t see that bth the Ag Sig Gen and NI Sig Gen child classes implement the same functins because they are filling the same rle. Parent DSSP class Agilent Sig Gen child class NI Sig Gen child class Figure 9. Agilent and NI Signal Generatrs (inherit same subset f DSSP methds) Natinal Instruments Page 11 f 18

12 Migrated System Cnfiguratin with New Hardware Nw update the system s hardware. Figure 10 shws the updated hardware. Figure 10. Updated System Hardware (n changes t DUT r fixture) The system transitins frm using fur different instrument cntrl buses (USB, LAN, GPIB, PXI) t using nly PXI. Figure 11 shws the updated sftware. Figure 11. Updated Sftware (prvides same measurement result using new DSSP) The blue bx in Figure 11 shws that yu had t develp and test three new DSSP mdules fr the three new instruments. In this case, yu did a ne-t-ne replacement f instruments. Refer t figures 4 and 5 fr a cmparisn t the riginal system. The HAL prevented yu frm having t rewrite the test applicatin. Natinal Instruments Page 12 f 18

13 Steps t Replace Instruments Perfrmance Requirements The imprtant cnsideratin t make when replacing instruments is that the replacements must meet yur requirements, usually by having equal r better measurement functins. Fr example, a replacement DMM shuld have an equal r better reslutin and sampling rate (amng ther things). Cnfiguratin After yu have prcured suitable instruments, yu need t update the cnfiguratin file with the hardware resurce infrmatin. Usually this will require yu t cnfigure the instruments in whichever utility yu use (MAX is used fr NI-VISA and NI mdular instruments). DSSP Develpment and Testing After yu update the cnfiguratin file, yu shuld start develping and debugging the new DSSP mdules fr the new instruments. It is recmmended that yu replace nly ne instrument at a time s yu can debug yur new DSSP with the existing prven DSSPs. Either way, yu shuld use a glden DUT t determine instrument differences and cmpensate fr them in the new DSSP mdule. Thrugh the curse f develping and testing the replacement DSSP mdules, yu start ut by testing nly ne new mdule (and the accmpanying hardware) t see if there are any differences fr which the DSSP needs t cmpensate. In this example, the testing expses a scaling difference between the Tektrnix scpe measurements and the NI digitizer measurements. The slutin is t add linear scaling t the NI digitizer DSSP mdule as shwn in Figure 12. When updating the test hardware, and the crrespnding DSSP mdules, yu d nt necessarily have t d a ne-t-ne replacement. Fr instance, if yu have a signal generatin functin and a DC vltage measurement functin currently implemented with tw separate instruments, the replacement instrument culd be synthetic and implement bth signal generatin and DC vltage measurement. This is ne f the advantages f an applicatin-specific API and having tw layers within the HAL. Figure 12. Linear Scaling in NI Digitizer DSSP Mdule Only the instruments, the DSSPs, and the XML cnfiguratin file changed. The tp level test applicatin and test results did nt change. The main benefits f this hardware replacement prcess are that the tp level test applicatin and the test results were nt altered. Als, nce an instrument has been integrated int the HAL, it can be interchanged and the DSSP can be reused by ther test applicatins and extended if necessary. Natinal Instruments Page 13 f 18

14 HAL Features HALs are useful because f the features that they implement. Table 3 lists the main features f HALs with a shrt explanatin f each. Feature Descriptin Implementatin Example Test Cde and Hardware Separatin Measurement Cmpensatin Sftware layers that separate the test applicatin frm the instruments and DUTs Measurement results vary between instruments, and shuld be cmpensated fr t give the test applicatin the same measurement fr the same actual value n the DUT HAL with tw layers: ASL and DSSP Cmpensate in DSSP mdule because it is device specific LED Test.vi fr ASL and Ag Sig Gen.lvclass fr DSSP Linear scaling in NI Digitizer DSSP API Translatin Translates APIs fr different driver types DSSP mdules translate different instrument driver APIs t a cmmn ASL interface Functin parameter fr dide measurement was 9 n Fluke and 6 n NI DMM Adjustment fr Timing Differences Sme newer instruments may respnd faster than the test cde can cnsume the result Add delays in DSSP N example in this implementatin, but verall test time was reduced frm 26 s t 3 s Data Frmatting Different instruments expect and return different parameter frmats DSSP mdules change data frmats - Scientific versus flating pint - V versus mv - Degree C versus Degree F Backward Cmpatible and Extensible API Internal ASL standards maintain backward cmpatibility while extending t meet new requirements Define internal API standards that are nly extended, nt deprecated this allws an existing applicatin t use an updated ASL Use standard values fr DMM measurements: 0 always means DC V, 1 always means AC V, and s n; extend DMM measurements by adding a new value Errr Filtering HAL can check and respnd t errrs befre passing results t test applicatin Write additinal errr handling cde in either ASL r DSSP mdules If DSSP mdules are nt laded, the parent DSSP class returns errrs/warnings Instrument Simulatin Prvide simulated instrument results withut having actual instrument Develp DSSP with simulatin sftware Fault Insertin Inserting knwn faults can check sftware in higher layers Fault insertin in DSSP can check ASL; ASL can check test applicatin Table 3. Hardware Abstractin Layer Features Natinal Instruments Page 14 f 18

15 HAL Benefits When addressing bslescence, HALs yield the benefits f lwer migratin csts, faster migratin time, higher cde reuse, and easier maintainability. Lwer Migratin Csts The act f designing a user-defined HAL helps yu examine thrughly yur test system requirements and verall design. By mdularizing yur test system sftware int different levels, yu avid the extensive test applicatin redevelpment that is necessary in a mnlithic (nnmdular) test applicatin. In additin t minimizing redevelpment, a user-defined HAL reduces the redcumentatin and revalidatin burden, which can translate directly int lwer migratin csts. Faster Migratin Time The lwer migratin csts are a direct result f decreasing the migratin effrt required. The decrease in effrt als allws the migratin prcess t g mre quickly. Having a well-designed and well-dcumented explanatin f yur HAL requirements allws develpers t wrk n new DSSP cde while the existing DSSP layers are used in the prductin (r released) system. This means yu are better prepared fr a test hardware migratin than yu wuld be with a traditinal mnlithic test applicatin. Higher Cde Reuse When yu start with future reuse in mind, yu are already ahead f the curve when it cmes t system architecture. Fllwing the best practice f separating test lgic frm the ASL minimizes dependencies and maximizes reuse. This greatly reduces the verlap f respnsibilities and redundant develpment effrts. Fr example, the limit test uses an upper and lwer limit with a linear mask n a frequency/amplitude table (array). This can be reused by any instrument where a linear mask is tested by a 2D table (array). Islating yur ASL frm instrument-specific cde als keeps yu frm getting lcked int a certain instrument mdel r manufacturer. Easier Maintainability The mdularity f a user-defined HAL makes islating and fixing bugs easier. In additin, yu can fcus any revalidatin effrts n the mdule that was fixed, nt the entire test applicatin. When yu design a userdefined HAL, yu must dcument the requirements fr each part, which, in turn, allws yu t knw what t test each part fr. In many cases, the act f defining and designing yur HAL expses flaws in yur riginal assumptins, which facilitates better system architecture. FreqSweep.vi in the ASL cntains the lping cde that executes a frequency sweep. This simplifies the requirements f the DSSP functins yu need and gives yu the pwer t use instruments that d nt have a built-in frequency sweep capability. It als simplifies the timing between the utput f the wavefrm at a certain frequency and the measurement f the maximum amplitude f the DUT at that frequency. Summary HALs separate the test applicatin frm the instrument hardware and hardware-specific sftware t streamline the upgrade prcess. The streamlined upgrade prcess minimizes the time and csts assciated with migrating test applicatins. By islating the sftware yu have t mdify, yu reduce the cst and effrt f requalifying cde. The ther case f migrating existing hardware t a new sftware applicatin als benefits frm HAL use. In additin t the separatin f test cde and hardware, the main HAL features are measurement cmpensatin, API translatin, and a backward-cmpatible and extensible API. HAL ptins include standards-based (fr example, IVI), user-defined, r vendr-defined and either an instrument-centric r applicatin-specific API. Yu must weigh the different ptins and chse the mst apprpriate HAL type and API ptin. Because mst test systems require a majr upgrade ver their useful lives, a HAL reduces the time and csts f migrating test sftware t new hardware by minimizing the impact f new test sftware develpment, revalidatin, and redcumentatin. Natinal Instruments Page 15 f 18

16 Appendix A - C-Based HAL Implementatin Example The C-based HAL utlined in this appendix takes advantage f the IVI-C architecture and the NI IVI Cmpliance Package (ICP) implementatin framewrk t prvide the same benefits as the LabVIEW OOP-based HAL. ICP is a distributable prduct that prvides the sftware cmpnents needed t build interchangeable applicatins. ICP is available withut charge n ni.cm. The HAL implements an interchangeable and cnfigurable layer fr high-level applicatin peratins. This layer is similar t the IVI standard instrument classes, which define interchangeable and cnfigurable layers fr device-level peratins. While IVI-C is an architecture defined by the IVI standard fr implementing interchangeable and cnfigurable layers fr device-level peratins, the IVI-C architecture and ICP are sufficiently generic s that yu can use them t implement interchangeable and cnfigurable layers fr high-level applicatin peratins. Building a HAL with IVI Cmpliance Package (ICP) The fllwing figure shws a detailed instance f the HAL architecture with specific functins listed and the instrument mdels displayed. This example uses the IVI-C Custm Class Driver and IVI-C Custm Specific Driver cncepts t implement cmpnents f the DSSP layer. Bth cncepts are explained in IVI-3.1: Driver Architecture Specificatin, Sectin 2.2. The cnfiguratin infrmatin is stred in the IVI Cnfiguratin Stre, which is mdifiable using MAX. This cncept is explained in IVI-3.5: Cnfiguratin Server Specificatin, Sectin 2.4. Frm the bttm layer up: This example includes three instruments. All three have pre-written device-level instrument drivers: tw with IVI-C drivers and ne with a LabWindws /CVI Plug and Play driver. Yu can use the HAL Natinal Instruments Page 16 f 18

17 with any type f device-level prgrammatic interface, such as IVI, LabWindws/CVI Plug and Play, direct I/O, r ther. The drivers are available withut charge n ni.cm/idnet. The DSSP layer includes three IVI-C Custm Specific Drivers. Each custm specific driver calls ne f the device-level instrument drivers t implement the applicatin-level functins required by the DSSP layer. Thus, the custm specific drivers play the rle f the DSSP adapters. In general, the APIs f the custm specific drivers are much smaller than the APIs f the devicelevel instrument drivers, because the custm specific drivers need satisfy nly the needs f the specific applicatin rather than all pssible uses f an instrument. The prefix f the custm specific driver must be mre specific than the prefix f the devicelevel instrument driver. A qualifier that indicates the high-level peratin shuld be appended t the instrument prefix. In the example, the fl2638a LabWindws/CVI Plug and Play driver is called by the Adapter.fl2638.readdmmmeas custm specific driver. The signatures f the functins exprted by the custm specific driver must be 100% cmpliant with the DSSP Interface layer. When replacing an instrument, yu must write a new custm specific driver fr the new instrument. The new custm specific driver must have the same API as the previus driver. The prefix f the new custm specific driver shuld include the same qualifier as the prefix f the replaced custm specific driver. Yu can create custm specific drivers using the IVI Instrument Driver Wizard (Tls»Create IVI Specific Driver r Tls»IVI Develpment»Create IVI Specific Driver) in LabWindws/CVI. IVI-C Custm Class Drivers have nly tw custm class drivers because ne f them, Dssp.Interface.ReadDmmMeas, is used fr tw separate IVI-C Custm Specific Drivers and physical instruments. Using the IVI-C architecture, the custm class drivers dynamically lad the custm specific drivers. The custm class drivers fr a particular applicatin d nt change when replacing instruments. Instead, the custm class drivers just call int different custm specific drivers. Use MAX t update settings in the IVI Cnfiguratin Stre. (Refer t the fllwing sectin abut the IVI Cnfiguratin Stre fr details). Cnsequently, instrument replacement using the HAL is dne withut changing the applicatin surce cde r having t re-link the applicatin prgram. Always include the Initialize and Clse functins in the custm class drivers. The DSSP Interface can be created via IVI Custm Class Driver Wizard (Tls»Create IVI Custm Class Driver) in LabWindws/CVI. Using the IVI Cnfiguratin Stre The IVI Cnfiguratin Stre is an XML cnfiguratin file that is mdifiable using MAX. Fr IVI-C based HALs, use the IVI Cnfiguratin Stre t specify which custm specific driver yu want t use in yur applicatin. In the IVI Cnfiguratin Stre, each Lgical Name is cnfigured t pint t a Driver Sessin. The Driver Sessin specifies the physical instrument t be used, the custm specific driver t be used, and als the cnfiguratin f certain ptinal parameters t be used when the device-level driver happens t be an IVI-C driver. T specify the custm specific driver, the Driver Sessin pints t a Sftware Mdule. The sftware mdule specifies the DLL name (Mdule Path), prefix excluding qualifier (Prefix), and qualifier (Published API) f the custm specific driver. Natinal Instruments Page 17 f 18

18 Using the Fluke 2638A instrument in the example, the IVI Cnfiguratin Stre needs t include: A Lgical Name that crrespnds t the rle that the Fluke 2638A (r a replacement instrument) plays in the applicatin. The Lgical Name shuld pint t a Driver Sessin with a name such as adapter.fl2638.readdmmmeas-sessin. The Driver Sessin shuld pint t a Sftware Mdule with a name such as adapter.fl2638.readdmmmeas-mdule, and shuld specify the physical instrument (e.g., GPIB0::3::INSTR ) using the Hardware Asset setting. The Sftware Mdule shuld specify the DLL name (fr example, adapter.fl2638.readdmmmeas_32.dll, assuming that it is default IVI lcatin fr driver DLLs), the prefix excluding the qualifier (fl2638), and the qualifier (readdmmmeas). When replacing an instrument, yu shuld have already set up the Driver Sessin and Sftware Mdule fr that new instrument and new driver. All yu need t d is t change the Lgical Name t pint t that new Driver Sessin. Nw that yu are familiar with the C-based HAL architecture, yu shuld dwnlad and run the example (Hardware Abstractin Layer C Example). Refer t the dcument Hw t Run the Example and fllw the steps. Additinally, refer t the dcument Implementing a C-based Hardware Abstractin Layer (HAL) fr instructins abut implementing and expanding the example. Natinal Instruments Page 18 f 18

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