Measuring Projector PJ-A3000 Series

Transcription

1 Measuring Projector PJ-A3000 Series Series 302 The PJ-A3000 Series profile projector is a medium-sized model that gives you excellent versatility and easy operation. The PJ-A3000 offers you the following benefits: The easy-to-read digital XY counter is located near the projection screen to minimize eye movement. You can measure angles easily with the digital readout protractor screen D Specifications Projected image Inverted Projector screen Effective diameter : 315 mm Screen material : Fine-ground glass Screen rotation : ±360, fine feed and clamp Angle display : Digital counter (LED) Resolution : 1' or 0,01 (switchable) Range : ±370 ABS/INC mode switching, Zero Set Reference lines : Cross-hairs Projection lens 10X (990948) Optional : 20X, 50X, 100X Magnification Contour illumination : ±0,1% or accuracy better Surface illumination : ±0,15% or better Contour illumination Surface illumination Focusing Resolution Power supply Light source : Halogen bulb (24V, 150W) Optical system : Telecentric Functions : 2-step (High/Low) brightness switch, Heat-absorbing filter, Cooling fan Light source : Halogen bulb (24V, 150W) Optical system : Vertical illumination with adjustable condenser lens Functions : Heat-absorbing filter, Cooling fan Manual 0,001 mm (0,001 mm : digital head) V AC, 50/60Hz D W H D D D D : Max. workpiece diameter W : Working distance H : Max. workpiece height D ( ) When using surface illumination Optical Measuring Refer to the PJ-A3000 brochure 486

2 Measuring Projector PJ-A3000 Series Standard accessories Description Projection lens 10X Protective hood Halogen bulb (24V, 150W) Optional accessories Description Standard scale 50 mm Green filter Reading scale 300 mm Swivel centre support Projection lens 20X Projection lens 50X Projection lens 100X Oblique illumination mirror 10X Projection lens Oblique illumination mirror 20X Projection lens V-block with clamp (Max. workpiece ø25 mm) Holder with clamp Reading scale 200 mm Green filter Swivel centre support D Fixture mount adapter Halogen bulb (24V, 150W) 12AAE671 Detector mounting plate for ø250 to ø350 mm Optoeye Rotary table 66 mm Rotary table 100 mm Rotary table 100 mm with fine adjustment D QM-Data 200 Stand type D QM-Data 200 Arm mount type : for stage 150 x 50 mm and : for stage 100 x 100 and 200 x 100 mm Series Metric model Metric XY stage 50 x 50 or 150 x 50 or 100 x100 or 200 x 100 mm Model PJ-A3005D-50 PJ-A3005F-150 PJ-A3010F-100 PJ-A3010F D D D D XY stage 50 x x x x 100 Measuring method Digimatic micrometer Linear encoder Linear encoder Linear encoder head Quick-release mechanism _ X and Y axes X and Y axes X and Y axes XY stage table top size 152 x x x x 250 XY stage effective area 82 x x x x 170 Stage glass BAE Swiveling function _ ±3 Max stage loading [kg] Mass kg mm A = 593 mm : D, A = 446 mm : D A = 427 mm : D A 706 * Fixture mount adapter (999678) is required for D D, QM-Data 200 OPTOEYE

3 Measuring Projector PJ-H30 Series Series 303 This measuring projector has adjustable incident illumination. The PJ-H30 offers you the following benefits: By rotating the condenser lens and changing the angle of the mirror in the objective, you can represent even poorly reflecting surfaces optimally. Improved light intensity of a projected subject thanks to the new optical contour illumination system. High measuring accuracy (above JIS standard). Measuring stage with rapid single-handed adjustment on both axes enabling you to switch smoothly between quick positioning and fine adjustment. Constant current power supply unit with acceleration control to maximize the service life of the halogen lamp. Easily read digital counter with large digit display. The PJ-H30D models also offer you a built-in precision edge detector (Optoeye). RS-232C output. Specifications Accuracy (3+0,02L) µm L : Max length measurement Projected image Erect Projector screen Effective diameter : 306 mm Screen material : Fine-ground glass Screen rotation : ±360, fine adjustment and clamp Angle display : Digital counter (LED) Resolution : 1' or 0,01 (switchable) Range : ±370 ABS/INC mode switching, Zero Set Reference lines : Cross-hairs Projection lens 10X ( ) Optional : 5X, 20X, 50X, 100X Magnification Contour illumination : ±0,1% or accuracy better Surface illumination : ±0,15% or better Contour illumination Surface illumination Power supply Resolution Light source : Halogen bulb (24V, 150W) Optical system : Telecentric zoom Functions : Continuously variable brightness adjustment, Heatabsorbing filter, Cooling fan Light source : Halogen bulb (24V, 150W) Optical system : Vertical/Oblique illumination with an adjustable condenser lens Functions : Continuously variable brightness adjustment, Heatabsorbing filter, Cooling fan 220V AC, 50/60Hz 0,001 mm D Vertical / oblique switchable surface illumination Vertical illumination Oblique illumination Optical Measuring 1010B 2010B 2017B Profile Projector brochure on request 488

4 Measuring Projector PJ-H30 Series Series 303 Model 1010B x 100 mm XY stage table size : 300 x 240 mm XY stage effective area : 180 x 150 mm Stage glass : Swiveling function : ±3 Max stage loading : 10 kg Mass : 176 kg Model PJ-H30A PJ-H30D D D Focusing Manual Power focus Edge detector Optional Built-In Model 2010B x 100 mm XY stage table size : 350 x 280 mm XY stage effective area : 250 x 150 mm Stage glass : Swiveling function : ±3 Max stage loading : 10 kg Mass : 178 kg Model PJ-H30A PJ-H30D D D Focusing Manual Power focus Edge detector Optional Built-In Model 2017B x 170 mm XY stage table size : 410 x 342 mm XY stage effective area : 270 x 240 mm Stage glass : 12BAD363 Swiveling function : ±5 Max stage loading : 20 kg Mass : 205 kg Model PJ-H30A PJ-H30D D D Focusing Manual Power focus Edge detector Optional Built-In Model 3017B x 170 mm XY stage table size : 510 x 342 mm XY stage effective area : 370 x 240 mm Stage glass : 12BAD330 Swiveling function : ±5 Max stage loading : 20 kg Mass : 212 kg Model PJ-H30A PJ-H30D D D Focusing Manual Power focus Edge detector Optional Built-In 489

5 Measuring Projector PJ-H30 Series Series B model Optional accessories Description Optoeye AAE671 Detector mounting plate for ø250 to ø350 mm 12AAG983 Detector mounting bracket for PJ- H30A/PJ-H30E 12AAG981 Green filter Standard scale 50 mm Reading scale 200 mm Reading scale 300 mm Projection lens 5X Projection lens 20X Projection lens 50X Projection lens 100X Swivel centre support Swivel centre support Rotary table 100 mm with fine adjustment V-block with clamp (Max. workpiece ø25 mm) Rotary table with fine feed wheel ø183 mm Rotary table with fine feed wheel ø240 mm Cleaner for optics 12AAA807D RS-232C cable (2m) 12AAG982 Mounting stand for QM-Data D QM-Data 200 Stand type D QM-Data 200 Arm mount type 3017B model Thermal Printer DPU414: 12AAD032 (with the connecting cable) FD-unit: 12AAA799 Footswitch: T External printer (ESC/P) cable: 12AAA804 QM-Data200 (arm-type specification) QM-Data200 (mounting stand:) 12AAG982 QM-Data200 (stand-type specification) RS-232C-cable (cross): 12AAA807 Note: The connectors at both ends are D-sub 9-pin female Real-time control program MeasurLink Inspection table generation program MeasureReport Note: A appropriate PC is required PC transferprogram option D QM-Data 200 OPTOEYE 200: Detector mounting plate A: 12AAE671 RS-232C-cable (cross): 12AAA807D Note: The connectors at both ends are D-sub 9-pin female Footswitch: 12AAA846 Detector mounting bracket: 12AAG983 for PJ-H30 and PJ-H30A only Standard scale 50 mm: Reading scale 200 mm: Projection screen Edge detection Data calculation processing Counter data transfer Counter data printing Standard accessory Reading scale 300 mm: Overlay chart, 12-sheet set: Green filer: 12AAG981 Halogen bulb 24V/150W (for contour/surface illumination): Long-life halogen bulb 24V/150W (for contour/surface illumination): Main unit contour illumination Stage peripheral Projection lens PJ-H30 Projection lens 5X Projection lens 10X Projection lens 20X Projection lens 50X Projection lens 100X Size 505/1010 Size 2010 Size 2017/3017 Rotary table with fine feed wheel (A): Stage adapter C: Stage adapter A: Rotary table with fine feed wheel (B): Holder with clamp: V-block with clamp: Swivel center support: Swivel center support (small): Rotary table with fine feed wheel (with built-in scale) Holder with clamp: V-block with clamp: Swivel center support: Swivel center support (small): Holder with clamp: V-block with clamp: Swivel center support: Swivel center support (small): Digital rotary head (up to ø13): Digital rotary head (up to ø20):

6 Measuring Projector PV-5110 Specifications Projected image Inverted Projector screen Effective diameter : 508 mm Screen material : Fine-ground glass Screen rotation : ±360, fine adjustment and clamp Angle reading : Digital counter (LED) Resolution : 1' or 0,01 (switchable) Range : ±370 ABS/INC mode switching, Zero Set Reference lines : Cross-hairs Projection lens 10X ( ) Optional : 5X, 20X, 50X, 100X Magnification Contour illumination : ±0,1% or accuracy better Surface illumination : ±0,15% or better Contour illumination Surface illumination Focusing Resolution Power supply Mass Light source : Halogen bulb (24V, 150W) Optical system : Telecentric zoom Functions : 2-step (High/Low) brightness switch, Heat-absorbing filter, Cooling fan Light source : Halogen bulb (24V, 150W) Optical system : Vertical illumination Functions : Adjustable condenser lens, Oblique illumination (for 5X, 10X and 20X), Heat-absorbing filter, Cooling fan Manual 0,001 mm V AC, 50/60Hz 210 kg Series 304 This measuring projector is a robust stand-alone device. The large rotatable screen guarantees you good observation and easy measuring D Counter is optional ( ) When using surface illumination Optical Measuring Profile Projector brochure on request KA Counter QM-Data 200 OPTOEYE

7 Measuring Projector PV-5110 Series Accessories/Dimensions Model PV D XY stage 200 x 100 Measuring method Linear encoder Quick-release mechanism X and Y axes XY stage table top size 380 x 250 XY stage effective area 266 x 170 Stage glass Swiveling function ±3 Max stage loading [kg] ø mm Standard accessories Description X projection lens set including : Objective Condenser Halogen bulb (24V, 150W) 12AAF182 Digital counter stand Stage glass 280x Surface illumination unit Optional accessories Description X projection lens set including : Objective Condenser Adapter for objective X projection lens set including : Objective Condenser X projection lens set including : Objective Condenser X projection lens set including : Objective Condenser Standard scale 50 mm Standard scale 80 mm Reading scale 300 mm Reading scale 600 mm Green filter Canopy Protective hood Rotary table 100 mm with fine adjustment Swivel centre support Holder with clamp V-block with clamp (Max. workpiece ø25 mm) Cleaner for optics D KA-Counter 2 axes 12AAE672 Optoeye mounting plate for ø500 to ø600 mm screen D QM-Data 200 Arm mount type

8 Measuring Projector PH-A14 Specifications Projected image Inverted Projector screen Effective diameter : 356 mm Screen material : Fine-ground glass Screen rotation : ±360, fine adjustment and clamp Angle reading : Vernier, graduation : 1' Resolution : 1' or 0,01 (switchable) Range : ±370 Reference lines : Cross-hairs Projection lens 10X ( ) Optional : 20X, 50X, 100X Magnification Contour illumination : ±0,1% or accuracy better Surface illumination : ±0,15% or better Contour illumination Surface illumination Focusing Resolution Power supply Mass Light source : Halogen bulb (24V, 150W) Optical system : Telecentric Functions : Heat-absorbing filter, Cooling fan Light source : Halogen bulb (24V, 150W) Optical system : Vertical illumination Functions : Adjustable condenser lens, Heat-absorbing filter, Cooling fan Manual 0,001 mm (using optional KA counter) V AC, 50/60Hz 140 kg Series 172 Measuring Projector PH-A14 Due to the PH-A14 s horizontal-beam illumination, you can easily measure larger and heavier workpieces including toothed racks and punching tools. You can use the projector for a wide range of applications due to its generous 203 x 102 mm stage travel and 45 kg allowable stage loading. L : Max. workpiece width W : Working distance D : Max. workpiece diameter D With optional evaluation unit QM-Data 200 KA Counter QM-Data 200 OPTOEYE

9 Measuring Projector PH-A14 Series Accessories/Dimensions mm Standard accessories Description Lens 10X for Profile Projector PH-A Halogen bulb (24V, 150W) Model PH-A D XY stage 203 x 102 Measuring method Linear encoder XY stage table top size 407 x 153 Max stage loading [kg] 45 Optional accessories Description D KA-Counter 2 axes Lens 50X for Profile Projector PH-A Lens 20X for Profile Projector PH-A Lens 100X for Profile Projector PH-A Standard scale 50 mm Reading scale 200 mm Green filter Centre support riser Rotary vice (Max. workpiece ø60 mm) V-block with clamp (Max. workpiece ø50 mm) Vertical holder Reading scale 300 mm Support for straight gear Support for flat gear Centre support Cleaner for optics Optoeye AAE671 Detector mounting plate for ø250 to ø350 mm D QM-Data 200 Arm mount type 12AAF182 Digital counter stand 494

10 Measuring Projector PH-3515F Specifications Projected image Erect Projector screen Effective diameter : 353 mm Screen material : Fine-ground glass Screen rotation : ±360, fine feed and clamp Angle display : Digital counter (LED) Resolution : 1' or 0,01 (switchable) Range : ±370 ABS/INC mode switching, Zero Set Reference lines : Cross-hairs Projection lens 10X ( ) Optional : 5X, 20X, 50X, 100X Magnification Contour illumination : ±0,1% or accuracy better Surface illumination : ±0,15% or better Contour illumination Surface illumination Focusing Resolution Power supply Mass Light source : Halogen bulb (24V, 150W) Optical system : Telecentric system Functions : 2-step (High/Low) brightness adjustment, Heatabsorbing filter, Cooling fan Light source : Halogen bulb (24V, 150W) Optical system : Vertical illumination Functions : Adjustable condenser lens, 2-step (High/Low) brightness adjustment, Heat-absorbing filter, Cooling fan Manual 0,001 mm V AC, 50/60Hz 150 kg Series 172 Measuring Projector PH-3515F Due to the PH-3515F s horizontal-beam illumination, you can easily measure larger and heavier workpieces including toothed racks and punching tools. You can use the projector for a wide range of applications due to its generous 254 x 152 mm stage travel and 45 kg allowable stage loading. L : Max. workpiece width W : Working distance D : Max. workpiece diameter D ( ) When using surface illumination Model PH-3515F D XY stage 254 x 152 Measuring method Linear encoder Quick-release mechanism X axis XY stage table top size 450 x 146 Swiveling function ±10 Max stage loading [kg]

11 Measuring Projector PH-3515F Series Accessories/Dimensions Standard accessories Description Protective hood Projection lens 10X Halogen bulb (24V, 150W) 12BAA637 Halogen bulb (24V, 200W) Optional accessories X X10* X20 X50 X QM-Data 200 PC OPTOEYE AAE671 Description Projection lens 5X with condenser Projection lens 20X with condenser Projection lens 50X with condenser Projection lens 100X with condenser Vertical surface illumination unit Standard scale 50 mm Reading scale 200 mm Reading scale 300 mm Green filter Centre support Centre support riser Rotary vice (Max. workpiece ø60 mm) V-block with clamp (Max. workpiece ø50 mm) Vertical holder 12AAM027 Overlay chart set (12 sheets) ( 12AAM587 to 12AAM598) 12AAF182 Digital counter stand Cleaner for optics D KA-Counter 2 axes Optoeye AAE671 Detector mounting plate for ø250 to ø350 mm D QM-Data 200 Arm mount type QM-Data (1 m) x (2 m) x 2 KA Counter QM-Data

12 Data Processing Unit QM-Data 200 Specifications Resolution Dimensions Screen Program functions Power supply Statisical processing Measuring of Geometric Elements Measurement result file output Data output Display language 1 / 0,1 260 x 242 x 310 : Stand-mount type 318 x 153 x 275 : Arm-mount type Colour graphic TFT LCD (320 x 240 dots, with background lighting) Part program creation, execution, editing 100/240V AC, 50/60 Hz Number of data, maximum value, minimum value, mean value, standard deviation, range, histogram Maximum of 1000 elements, point, line, circle, distance, ellipse, rectangular hole, slotted hole, intersection and intersecting angle and point & angle, plus a number of functions for evaluation, e.g. perpendicularity and parallelism are provided. CSV format; MUX-10F format USB, RS-232C, Printer Japanese/English/German/French/ Italian/Spanish/Portuguese/Chech/ Traditional Chinese/Simplified Chinese/Korean/Turkish/Swedish/ Polish/Dutch/Hungarian Functions Mitutoyo's Al Function : The Al function (Al=Artificial Intelligence) renders choosing the element type before measuring obsolete. Point measurements are analysed by the QM-Data and the results for basic elements calculated, thus accelerating the measuring procedure. Data input Optional accessories Customized Operation : Macro functions and the creation of part programs speed up single and repetition measurements. Additionally macro commands and part programs as well as frequently used standard operations can be stored as user menus. USB, RS-232C, X/Y/Z-axis signal, Footswitch Description 12AAD033 Thermal printer (with connection cable) Printer paper for thermal printer I Cable for printer (2 m) T Footswitch 12AAA807D RS-232C cable (2m) Signal cable RS-232C D-SUB 25 to D-SUB 9 (2m) Series 264 The Data Processing Unit QM 200 has been especially designed to process measurement data generated by a profile projector or measuring microscope. The QM-Data 200 offers you the following benefits: Measuring instructions, measuring values and calculation results for various operations are shown on the back-lit LCD in a clear, easy to understand style. You can also print measuring results, either on a small and convenient thermal printer (available as a special option) or on an ESC/P printer and continuous paper. By connecting an optional floppy disk drive newly created part programs, you can store and/or load measurement results as well as calculation results. Stand-mount type Mass [kg] Description D 2,9 Stand-mount type D 2,8 Arm-mount type D 2,9 Stand-mount type for Hyper MF / MF-U Intuitive panel design Arm-mount type Clear function icons Coloured LCD display with backlight Guided measurements 497

13 Edge Detection Sensor OPTOEYE 200 Series 332 This edge sensor allows you to make accurate measurements whatever your skill level by automatically detecting edges used in measurement. The Optoeye 200 offers you the following benefits: Optoeye 200 reduces the effect of operator skill level on accuracy by automatically detecting edges used in measurement. PJ-H30: You can use the Optoeye edge detector on models PJ-H30A (requires adapter plate 12AAG983). The PJ-H30D models have a built-in edge detector. PV-5110, PJ-3515F and PJ-A14: You can use the Optoeye edge detector in conjunction with the QM-Data 200. PJ-A3000: You can use the Optoeye edge detector on models / / in conjunction with the QM-Data 200. When you are using the Optoeye all projector scales must be connected to QM-Data 200 directly and built-in counters can no longer be used (except PJ-H30D type). Specifications Image detection Min. diameter Min. width Applicable illumination Function Optional accessories 12AAE671 12AAE672 Directivity : All directions 2 mm on the screen 1 mm on the screen Type : Surface/Contour illumination Range : 30 to 2000 Lux on the screen Bright-Dark field difference : 20 Lux Automatic detection of feature edges for use in measurement Description Detector mounting plate for ø250 to ø350 mm Optoeye mounting plate for ø500 to ø600 mm screen Description Edge detection sensor OPTOEYE

14 Additional Specifications Grid divisions 10X : 0,1 mm 20X : 0,05 mm 50X : 0,02 mm 100X : 0,01 mm Accessories for Measuring Projectors Group 1 For measuring projectors These standard overlay charts increase the range of application and the efficiency of Mitutoyo profile projectors. This chart set offers you the following benefits: The charts are supplied in sizes ø250, 300, 340, 500 and 600 mm to suit the screens of Mitutoyo projectors. A large range of scales and profiles is provided that enables you to test workpiece features quickly and easily. You can test length, height, parallelism, angle, radius, taper, bore position, diameter, as well as all standardized thread and tooth profiles. All charts are made of a distortion-free special plastics compound and are provided with a protective coating. Combination chart Angle : Divisions at 10 and 30' intervals at 178mm/7" diameter increasing to 381mm/15" intervals at 279mm/11" diameter. Features : All purpose chart for checking diameters, angles, radii and linear divisions Diameter Combination chart Grid/protractor chart Angle : 15 increments Features : Ideal for checking diameters, concentricity of diameters, radii, angles and cams. Diameter Grid/protractor chart Radius/protractor chart Angle : Divisions at 1 and 30' intervals at 178mm/7" diameter increasing to 381mm/15" intervals at 279mm/11" diameter. Features : Ideal for checking diameters, concentricity of diameters, radii, angles, radii and cams Diameter Radius/protractor chart 499

15 Accessories for Measuring Projectors Group 1 For measuring projectors These standard overlay charts increase the range of application and the efficiency of Mitutoyo profile projectors. This chart set offers you the following benefits: The charts are supplied in sizes ø250, 300, 340, 500 and 600 mm to suit the screens of Mitutoyo projectors. A large range of scales and profiles is provided that enables you to test workpiece features quickly and easily. You can test length, height, parallelism, angle, radius, taper, bore position, diameter, as well as all standardized thread and tooth profiles. All charts are made of a distortion-free special plastics compound and are provided with a protective coating. Additional Specifications Grid divisions 10X : 0,1 mm 20X : 0,05 mm 50X : 0,02 mm 100X : 0,01 mm Involute gear teeth Diameter Involute gear teeth ISO Metric threads Diameter ISO Metric threads Protractor chart Angle : Divisions at 1 and 30' intervals at 178mm/7" diameter increasing to 381mm/15' intervals at 279mm/11" diameter. Features : Dedicated chart especially designed for checking angles with exceptional clarity. Suitable for use at any magnification. Diameter Protractor chart Radius chart Features : Dedicated chart especially designed for checking radii, diameters and concentricity with exceptional clarity. Diameter Radius chart 500

16 Optional accessories 12AAM027 Description Overlay chart set (12 sheets) ( 12AAM587 to 12AAM598) 12AAM587 12AAM588 Accessories for Measuring Projectors Group 2 - Makes inspection of projected images an easy process. Metric Description Concentric circles 1 mm pitch Concentric circles at 1 mm pitch with radial index 1 increments Crossed lines with 0,5 mm pitch Crossed lines with 1 mm graduation and concentric circles 5 mm pitch Grid chart (10 x 10 mm) Grid chart (1 mm pitch) Horizontal for 20X, vertical for 50X with 1 mm graduations Horizontal lines 1 mm pitch Metric threads 0,075-0,225 mm, 100X involute gear teeth : 20 MOD 0,2-1, 14,5 MOD 0,2-1 Metric threads 0,2-2 mm, unified threads TPI 20X Whitworth threads TPI 20X Radial index 1 increments Radial index 1 increments (upper) concentric circle 1 mm pitch (lower) ø 300 mm 12AAM589 12AAM596 12AAM592 12AAM588 12AAM591 12AAM593 12AAM590 12AAM595 12AAM598 12AAM597 12AAM594 12AAM587 12AAM589 12AAM590 12AAM591 12AAM592 12AAM593 12AAM594 12AAM595 12AAM596 12AAM597 12AAM

17 Accessories for Measuring Projectors Workpiece Fixtures For Profile Projectors and Measuring Microscopes Centre Support Max. workpiece height Mass [kg] , Centre Support Riser Max. workpiece height Mass [kg] , Holder with Clamp Max. workpiece height Mass [kg] , Rotary Tables Effective glass dia. Angular resolution Fine feed Mass [kg] , Available 2, , Available 5, Available 6, Rotary Vice Width of jaws Max. workpiece height Mass Rotary range Angle graduations [kg] , Swivel Centre Support Max workpiece dia. Swivel range Max. workpiece length (45 ) when swiveled (65) when swiveled 10 Mass [kg] ± ,4 ± , V-Block with Clamp Max workpiece dia. Width of block Mass [kg] , , Vertical Holder Mass [kg] ,

18 Quick Guide to Precision Measuring Instruments Erect Image and Inverted Image An image of an object projected onto a screen is erect if it is orientated the same way as the object on the stage. If the image is reversed top to bottom, left to right and by movement with respect to the object on the stage (as shown in the igure below) it is referred to as an inverted image (also known as a reversed image, which is probably more accurate). F F F Workpiece X-axis movement Y-axis movement An erect image Magniication Accuracy The magniication accuracy of a projector when using a certain lens is established by projecting an image of a reference object and comparing the size of the image of this object, as measured on the screen, with the expected size (calculated from the lens magniication, as marked) to produce a percentage magniication accuracy igure, as illustrated below. The reference object is often in the form of a small, graduated glass scale called a `stage micrometer or `standard scale, and the projected image of this is measured with a larger glass scale known as a `reading scale. (Note that magniication accuracy is not the same as measuring accuracy.) L M ΔM(%) = X 100 M Projection screen Top of the stage F An inverted image F ΔM(%): Magnification accuracy expressed as a percentage of the nominal lens magnification L : Length of the projected image of the reference object measured on the screen : Length of the reference object M : Magniication of the projection lens Proile Projectors Telecentric Optical System An optical system based on the principle that the principal ray is aligned parallel to the optical axis by placing a lens stop on the focal point on the image side. Its functional feature is that the image will not vary in size though the image blurs as the object is shifted along the optical axis. For measuring projectors and measuring microscopes, an identical effect is obtained by placing a lamp ilament at the focal point of a condenser lens instead of a lens stop so that the object is illuminated with parallel beams. (See the igure below.) Light source (lamp) Principal ray Object surface Focal point on the image side Optical axis Condenser lens Workpiece Projection lens Projection screen surface Telecentric contour illumination Working distance Refers to the distance from the face of the projection lens to the surface of a workpiece in focus. It is represented by L in the diagram below. Workpiece stage Workpiece Projection lens Parallax error This is the displacement of an object against a ixed background caused by a change in the observer's position and a inite separation of the object and background planes. L Type of Illumination Contour illumination: An illumination method to observe a workpiece by transmitted light and is used mainly for measuring the magniied contour image of a workpiece. Coaxial surface illumination: An illumination method whereby a workpiece is illuminated by light transmitted coaxially to the lens for the observation/measurement of the surface. (A half-mirror or a projection lens with a built-in half-mirror is needed.) Oblique surface illumination: A method of illumination by obliquely illuminating the workpiece surface. This method provides an image of enhanced contrast, allowing it to be observed threedimensionally and clearly. However, note that an error is apt to occur in dimensional measurement with this method of illumination. (An oblique mirror is needed. Models in the PJ-H30 series are supplied with an oblique mirror.) Field of view diameter The maximum diameter of workpiece that can be projected using a particular lens. Parallax error Projector screen Field of view diameter (mm) = Screen diameter of proile projector Magniication of projection lens used Example: If a 5X magniication lens is used for a projector with a screen of ø500mm: Field of view diameter is given by 500mm = 100mm 5 503

19 Form Measurement Surface Roughness Measuring Instruments Surftest Page 505 Contour Measuring Instruments Contracer Page 522 Surface Roughness & Contour Measuring Instruments Formtracer Page 528 Accessories Surftest, Contracer, Formtracer Page 536 Form Measuring Instruments Roundtest Page

20 Surftest SJ-210 Specifications Drive unit Measuring range Traverse Measuring speed 16 mm 4,8 mm [S-type] 17,5 mm 5,6 mm [S-type] 0,25 mm/s ; 0,5 mm/s; 0,75 mm/s Detector Measuring method Differential inductance Range 360 µm Stylus Diamond Tip Skid radius 40 mm Display unit Profiles Roughness standards Digital filter Cut-off length Tolerance Roughness Profile (R), R-Motif, DF-Profile and more EN ISO, VDA, JIS, ANSI and customize settings Gauss, 2CR75, PC75 λc : 0,08 mm; 0,25 mm; 0,8 mm; 2,5 mm λs : 2,5 µm; 8 µm Coloured upper / lower limit Series Portable Surface Roughness Measuring Instrument This is a portable measuring instrument that allows you to easily and accurately measure surface roughness. The Surftest SJ-210 offers you the following benefits: It works independently of mains power, allowing you to make on-site measurements. The 6 cm [2,4 ] colour graphic, back-lit LCD gives you excellent readability. It complies with many standards including EN ISO, VDA, ANSI, JIS as well as customised settings. Different drivers expanding the range of applications. Calculation results, assessed profiles, bearing and amplitude curves can be displayed. Support of 16 languages. Operation by keys on the front and under the sliding cover. Interface Power supply USB, Digimatic, RS-232C, Foot switch AC adapter or rechargeable battery SJ-210 Metric Detector measuring force Stylus Tip radius Stylus Tip angle [mn] Description D 0, SJ-210 model D 0, SJ-210R model D 0, SJ-210S model Software USB COMMUNICATION TOOL as a free download on (refer to page Optional Software USB Communication Tool) Standard R-type S-type Form Measurment Refer to Surftest SJ-210 brochure 505

21 Surftest SJ-210 Series Portable Surface Roughness Measuring Instrument The SJ-210R Retract System is a portable measuring instrument for surface roughness that includes a safety system. The detector starts in a safety position, not in contact with the workpiece surface. When measurement starts, the detector is lowered onto the workpiece while the drive unit moves in X measuring direction. During the return movement, the detector lifts up from the workpiece surface before returning to the start position. This is useful for avoiding stylus damage in applications where you cannot easily see the test surface. SJ-210S (detailed information further on in this chapter) The SJ-210S model is a portable measuring instrument for surface roughness that has a transverse drive capability. This allows you to test shrouded surfaces in the transverse direction, such as crankshaft bearing surfaces, flanged features or deep grooves. Additional Specifications Other accessories Optional accessories Other optional and standard accessories are listed later in this section Description Granite stand (12AAA221 is needed for SJ-210/310) Measuring device for cylindrical workpieces Measuring device as universal fixture Measuring device for measuring inside diameter 12AAA221 Adapter for magnetic stand Standard drive unit 17,5 mm R-Type drive unit 17,5 mm S-Type drive unit 5,6 mm Digimatic cable (1 m) Digimatic cable (2 m) 02AZD790D Connecting cable U-Wave 06ADV380D USB Input Tool Direct cable (2 m) 12BAA303 Connecting cable for extension 1 m Keyboard protective cover open SJ ,1 174, , ,1 POWER START DATA STOP PAGE 65,8 Back view Dimensions (displayed with SJ-210) 506

22 Surftest SJ-310 Specifications Drive unit Measuring range Traverse Measuring speed 16 mm 4,8 mm [S-type] 17,5 mm 5,6 mm [S-type] 0,25 mm/s; 0,5 mm/s; 0,75 mm/s Detector Measuring Differential inductance method Range 360 µm Stylus Diamond Tip Skid radius 40 mm Display unit Profiles Roughness standards Digital filter Cut-off length Printer Tolerance Roughness Profile (R), R-Motif, DF-Profile and more EN ISO, VDA, JIS, ANSI and customize settings Gauss, 2CR75, PC75 λc : 0,08 mm; 0,25 mm; 0,8 mm; 2,5 mm; 8 mm λs : 2,5 µm; 8 µm Thermal Printer Coloured upper / lower limit Series Portable Surface Roughness Measuring Instrument This is a portable measuring instrument that allows you to easily and accurately measure surface roughness. The Surftest SJ-310 offers you the following benefits: Skid system with touch-screen functionality and built-in printer. It works independently of mains power, allowing you to make on-site measurements. Easy and intuitive menu navigation. The large 14,5cm [5,7 ] colour LCD gives you high visibility. It complies with many standards including EN ISO, VDA, ANSI, JIS as well as customised settings. You can store up to 10 different measuring conditions inside the SJ-310, and up to 500 with an optional SD card. Statistical analysis and coloured tolerance judgement. 2 different evaluation conditions within 1 measurement adjustable. You can separately password protect many functions. It comes with support for 16 languages. Interface Power supply USB, Digimatic, RS-232C, Foot switch AC adapter or rechargeable battery SJ-310 Metric Detector measuring force Stylus Tip radius Stylus Tip angle [mn] Description D 0, SJ-310 model D 0, SJ-310R model D 0, SJ-310S model Software USB COMMUNICATION TOOL as a free download on (refer to page Optional Software USB Communication Tool) Standard R-type S-type Form Measurment Refer to Surftest SJ-310 brochure 507

23 Surftest SJ-210 and SJ S-Type Series 178 Portable Transverse Measurement with S-Type Drive Unit This is an S-Type drive unit for the Surftest SJ-210 and SJ-310 that provides portable transverse measurement. It offers you the following benefits: It is compatible with the conventional drive units of the Surftest SJ-210 and SJ-310. You can simply connected it to the display unit. A typical application would be to position the S-Type unit on a crankshaft journal bearing, as shown in the photograph below. Once started the S-Type drive will track the stylus across the surface transversely to its own axis and reliably measure surface roughness in the direction of the crankshaft axis. Transverse tracking simplifies the measurement of surface roughness even in very confined situations, which has long been a problem with conventional instruments which allow only longitudinal measurement. Specifications Traverse Measuring speed Optional accessories 5,6 mm 0,25 mm/s; 0,5 mm/s; 0,75 mm/s Description Granite stand (12AAA221 is needed for SJ-210/310) 12AAA221 Adapter for magnetic stand Standard drive unit 17,5 mm R-Type drive unit 17,5 mm S-Type drive unit 5,6 mm S - Type Drive Unit Set: [ incl AAE644-12AAE643 ] Traverse Detector measuring force Stylus Tip radius Stylus Tip angle [mn] ,6 mm 0, Linear movement of S-Type 12AAE644 V-type adapter 12AAE643 Point - contact adapter 508

24 Accessories for SJ-210 and SJ-310 Series Standard and Optional Accessories for Surftest SJ-210 / SJ-310 Model Surftest SJ-210 Surftest SJ-210R Surftest SJ-210S Surftest SJ-310 Surftest SJ-310R Surftest SJ-310S Description Std Opt Std Opt Std Opt Std Opt Std Opt Std Opt 12AAA210 12AAA216 12AAA217 12AAA218 12AAA219 12AAA221 12AAA222 12AAD510 12AAE643 12AAE644 12AAJ088 12AAL066 12AAL067 12AAL068D 12AAL069 12AAN040 12AAN046 12BAA303 12BAG834 12BAK700 12BAK728 12BAL402 Extension rod length 50 mm Height adjustment feet Nosepiece (flat) Nosepiece (cylindrical) Adapter for vertical position Adapter for magnetic stand Height gauge adapter USB cable for SJ-310 / SJ-410 Point - contact adapter V-type adapter Footswitch Protective sheets for display (5 sheets) RS-232C cable for printer USB cable for SJ-210 Memory card Protective film Battery Connecting cable for extension 1 m Touch pen Calibration table AC adapter 9V Touch Panel Protection AC Adapter 12V Granite stand Standard Drive unit 17,5 mm S-Type drive unit 5,6 mm R-Type drive unit 17,5 mm Standard detector 2 µm; 0,75 mn Detector for small holes Ø4,5 mm; 2 µm; 0,75 mn Detector for small holes Ø2,8mm Deep groove detector 2 µm; 0,75 mn Detector for S-drive 5 µm; 4 mn Detector for S-drive 2 µm; 0,75 mn Detector for gear tooth surface 2 µm; 0,75 mn Detector 5 µm; 4 mn Detector for soft materials 10 µm; 4 mn Detector for small holes Ø4,5 mm; 5 µm; 4 mn Detector for small holes Ø2,8 mm; 5 µm; 4 mn Deep groove detector 5 µm; 4 mn Detector for gear tooth surface 5 µm; 4 mn; DDS Printer set for SJ Roughness specimen Ra 3 µm Roughness specimen Ra 0,4 µm /3 µm Roughness specimen Ra 1 µm Printer papers (5 rolls) 509

25 6 9 Accessories for SJ-210 and SJ-310 Series AAA210 12AAA219 Optional accessories Description Measuring device for cylindrical workpieces Measuring device as universal fixture Measuring device for measuring inside diameter BAA303 12AAA AAA218 12AAA217 12AAA216 12AAA221 (ø 8 mm) ø2.4 R / ø / ø (displayed with 12AAA221 + SJ-210) ø Stylus / ø / / ø ø ø / AAA AAA221 12AAA AAA216 12AAA217 12AAA

26 Surftest SJ-410 Specifications Drive unit Traverse Measuring speed SJ-411: 25 mm SJ-412: 50 mm 0,05 mm/s; 0,1 mm/s; 0,2 mm/s; 0,5 mm/s; 1 mm/s Detector Measuring Skidless - Differential inductance method Range 800 µm; 80 µm; 8 µm (up to 2,4 mm with an optional stylus) Positioning ±1,5 (tilting), 10 mm (up/down) Display unit Profiles Standards Analysis graphs Digital filter Cut-off length Printer Tolerance Primary Profile (P), Roughness Profile (R), Waviness (W), MOTIF (R, W) and more EN ISO, VDA, JIS, ANSI and customize settings BAC, ADC Gauss, 2CR75, PC75 λc : 0,08 mm; 0,25 mm; 0,8 mm; 2,5 mm; 8 mm λs : 2,5 µm; 8 µm; 25 µm Thermal Printer Coloured upper / lower limit Series Portable Surface Roughness Measuring Instrument This is a portable measuring instrument that allows you to easily and accurately measure surface roughness. The Surftest SJ-410 offers you the following benefits: Skidless system with touch-screen functionality and built-in printer. It works independently of mains power, allowing you to make on-site measurements. Easy and intuitive menu navigation. The large 14,5cm [5,7 ] colour LCD gives you high visibility. The skidless detector allows you to measure the primary profile (P), roughness profile (R), waviness profile (W) and more. Surface compensation of curved, radial and tilted surfaces. It complies with many standards including EN ISO, VDA, ANSI, JIS as well as customised settings. You can store up to 10 different measuring conditions inside the SJ-410, and up to 500 with an optional SD card. It allows two different evaluation conditions within one measurement adjustable. You can separately password protect many functions. It comes with support for 16 languages. Available options include an auto-set unit, X-axis fine adjustment and digital levelling unit. Interface Power supply USB, Digimatic, RS-232C, Foot switch AC adapter or rechargeable battery SJ-410 Software USB COMMUNICATION TOOL as a free download on (refer to page Optional Software USB Communication Tool) Form Measurment Surftest SJ-411 Traverse : 25 mm Traverse straightness : 0,3 µm / 25 mm Detector measuring force [mn] Stylus Tip angle Stylus Tip radius D 0, D Surftest SJ-412 Traverse : 50 mm Traverse straightness : 0,5 µm / 50 mm Detector measuring force [mn] Stylus Tip angle Stylus Tip radius D 0, D Refer to Surftest SJ-410 brochure 511

27 Surftest SJ-410 Series Portable Surface Roughness Measuring Instrument Additional Specifications Optional accessories Other optional and standard accessories are listed later in different sections for accessories and styli. Deep groove measurement R-surface measurement Optional: Autoset unit X-axis adjustment Tilting adjustment unit Upside down measurement SJ-411: 207,5 mm / SJ-412: 234 mm Drive unit Scope of delivery Optional accessories Description Detector 0,75 mn Detector 4 mn Three-axis adjustment table Leveling table D.A.T Digimatic XY leveling table 25 mm x 25 mm XY leveling table 25 mm x 25 mm Roughness specimen Ra = 1 µm Step gauge (1, 2, 5, 10) µm Reference step specimen (2, 10) µm Precision vise 12AAB358 Cylinder attachment ø15-60 mm Digimatic cable (1 m) Digimatic cable (2 m) 02AZD790D Connecting cable U-Wave 12AAD510 USB cable for SJ-310 / SJ AAL069 Memory card 12AAG202 Extension rod 50 mm 12AAG203 Extension rod 100 mm Stands Granite stand Consumable spares Description 12AAB355 Nosepiece 12BAG834 Touch pen 12BAL402 Touch Panel Protection 12AAN046 Battery Printer paper (5 rolls) Leveling table D.A.T. 12AAB358 Cylinder attachment (displayed with SJ-411) 512

28 Surftest SJ-500 Specifications Drive unit Traverse Measuring speed Drive speed Traverse straightness 50 mm 0,02-5 mm/s 0-20 mm/s or joystick operation 0,2 µm / 50 mm Detector Measuring Skidless - Differential inductance method Range 800 µm; 80 µm; 8 µm (up to 2,4 mm with an optional stylus) Positioning ±1,5 (tilting) 30 mm (up/down) Display unit Profiles Standards Analysis graphs Digital filter Cut-off length Printer Optional accessories Primary Profile (P), Roughness Profile (R), Waviness (W), MOTIF (R, W) and more EN ISO, VDA, JIS, ANSI and customize setting BAC, ADC Gauss, 2CR75, PC75, RobustSpline λc : 0,025 mm; 0,08 mm; 0,25 mm; 0,8 mm; 2,5 mm; 8 mm; 25 mm λs : 0,25 µm; 0,8 µm; 2,5 µm; 8 µm; 25 µm; 80µm; 250µm; None λf : 0,08mm; 0,25mm; 0,8mm; 2,5mm; 8mm; 25mm; None Thermal printer Description Detector 0,75 mn Detector 4 mn Granite stand 600x450x710 mm Granite stand 400x250x578 mm Three-axis adjustment table Leveling table D.A.T Digimatic XY leveling table 25 mm x 25 mm XY leveling table 25 mm x 25 mm 12AAG202 Extension rod 50 mm 12AAG203 Extension rod 100 mm Series Surface Roughness Measuring Instrument This is a portable measuring instrument that allows you to easily and accurately measure surface roughness. The Surftest SJ-500 offers you the following benefits: The skidless detector allows you to measure the primary profile (P), roughness profile (R), waviness profile (W) and more. User friendly control unit for high precision surface roughness measurement. The large 19cm [7,5 ] colour TFT LCD with touch-screen functionality gives you high visibility and ease of use. The display menu is easy to read and simple to operate. It complies with many standards including EN ISO, VDA, ANSI, JIS as well as customised settings. The built-in joystick on the control unit enables quick and easy positioning. The manual adjustment knob allows you to finely position a small stylus to measure the inside surface of small holes. The detector unit allows a 90 displacement of the stylus, which is ideal for crankshaft and narrow space measurement. You can use the instrument stand-alone or mounted on a stand. SJ-500 Detector measuring force Stylus Tip radius Stylus Tip angle [mn] D D 0, SJ-500 with optional manual column stand Preview Software USB COMMUNICATION TOOL as a free download on (refer to page Optional Software USB Communication Tool) Form Measurment Refer to SURFACE MEASUREMENT brochure x450x710 mm x250x578 mm

29 Surftest SV-2100 Series Surface Roughness Measuring Instrument This is a stationary measuring instrument that allows you to easily and accurately measure surface roughness. The Surftest SV-2100 offers you the following benefits: It is mounted on a granite base with a manual or power column. The large 19cm [7,5 ] colour TFT LCD gives you high visibility and touch-screen functionality. It has a user friendly display unit for high precision surface roughness measurement. It complies with many standards including EN ISO, VDA, ANSI, JIS as well as customised settings. Designed for usage in workshop areas. Specifications Drive unit Traverse Measuring speed Drive speed Traverse straightness 100 mm 0,02-5 mm/s X = 0-40 mm/s Z2 = 0-20 mm/s or joystick operation 0,15 µm / 100 mm Detector Measuring Skidless - Differential inductance method Range 800 µm; 80 µm; 8 µm (up to 2,4 mm with an optional stylus) SV-2100S4 SV-2100H4 model Vertical travel : 550 mm power column Granite base size (WxD) : 600 x 450 mm Detector measuring force [mn] Stylus Tip angle Stylus Tip radius D 0, D SV-2100M4 model Vertical travel : 350 mm manual column Granite base size (WxD) : 600 x 450 mm Detector measuring force [mn] Stylus Tip angle Stylus Tip radius D 0, D SV-2100M4 Display unit Profiles Standards Analysis graphs Digital filter Cut-off length Printer Optional accessories Primary Profile (P), Roughness Profile (R), Waviness (W), MOTIF (P, R, W) and more EN ISO, VDA, JIS, ANSI and customize settings BAC, ADC Gauss, 2CR75, PC75, RobustSpline λc : 0,025 mm; 0,08 mm; 0,25 mm; 0,8 mm; 2,5 mm; 8 mm; 25 mm; 80 mm λs : 0,25 µm; 0,8 µm; 2,5 µm; 8 µm; 25 µm; 80 µm; 250 µm; none λf : 0,08 mm; 0,25 mm; 0,8 mm; 2,5 mm; 8 mm; 25 mm; 80 mm; none Thermal printer Description 12AAG202 Extension rod 50 mm 12AAG203 Extension rod 100 mm Cross-travel table XY range : 100x50 mm Rotary vice (heavy-duty type) SV-2100S4 model Vertical travel : 350 mm power column Granite base size (WxD) : 600 x 450 mm Detector measuring force [mn] Stylus Tip angle Stylus Tip radius D 0, D Preview SV-2100W4 model Vertical travel : 550 mm power column Granite base size (WxD) : 1000 x 450 mm Detector measuring force [mn] Stylus Tip angle Stylus Tip radius D 0, D Software USB COMMUNICATION TOOL as a free download on (refer to page Optional Software USB Communication Tool) Form Measurment Refer to SURFACE MEASUREMENT brochure 514

30 Surftest SJ-500P - SV-2100P Specifications Drive unit Traverse Measuring speed Drive speed Traverse straightness 50 mm 0,02-5 mm/s 0-20 mm/s 0,2 µm / 50 mm Detector Measuring Skidless - Differential inductance method Range 800 µm; 80 µm; 8 µm (up to 2,4 mm with an optional stylus) Positioning ±1,5 (tilting) 30 mm (up/down) Series Surface Roughness Measuring Instruments with Software FORMTRACEPAK These are surface roughness measuring instruments with software FORMTRACEPAK. Software FORMTRACEPAK offers you the following benefits: It supports all standard conform analyses including EN ISO, VDA, ANSI, JIS as well as customised settings. It can be used for contour calculation within the measuring range. It offers total support for measurement system control, analysis and inspection report. All advantages of the SJ-500 and SV-2100 also apply to the P Type. Software FORMTRACEPAK Measurement conditions SJ-500P Detector measuring force Stylus Tip radius Stylus Tip angle [mn] D 0, D Specifications Drive unit Traverse Measuring speed Drive speed Traverse straightness Formtracepak layout 100 mm 0,02-5 mm/s X = 0-40 mm/s Z2 = 0-20 mm/s 0,15 µm / 100 mm Surftest SV-2100M4P Detector Measuring Skidless - Differential inductance method Range 800 µm; 80 µm; 8 µm (up to 2,4 mm with an optional stylus) Software FORMTRACEPAK Form Measurment SV-2100P Refer to SURFACE MEASUREMENT brochure Detector measuring force Stylus Tip radius Stylus Tip angle [mn] D 0, D

31 Surftest SV-3100 Series Surface Roughness Measuring Instrument This is a stationary surface roughness measuring instrument with software FORMTRACEPAK that allows you to take highly accurate measurements. The Surftest SV-3100 offers you the following benefits: It complies with many standards including EN ISO, VDA, ANSI, JIS as well as customised settings. It also supports contour calculation within the measuring range of the styli software. Part programing as well as motorised axes give you many features of a CNC instrument. The X-axis uses a superbly anti-abrasive ceramic drive unit guideway, so you don t need any lubrication. You can choose from a huge number of styli that are easy to replace. It has an easy-to-operate remote box with many functionalities. Specifications Traverse 100 mm / 200 mm Range 800 µm; 80 µm; 8 µm (up to 2,4 mm with an optional stylus) Drive speed X = 0-80 mm/s Z2 = 0-20 mm/s Measuring 0,02-5 mm/s speed Inclining ±45 range Profiles Primary Profile (P), Roughness Profile (R), Waviness (W), MOTIF (P, R, W) and more Standards EN ISO, VDA, JIS, ANSI and customize setting Software FORMTRACEPAK Enables control of all axes and rotary table for realizing efficient measurement automation. Perform contour evaluation that allows free analysis of level differences, angles, pitch, area and other characteristics as well as surface roughness evaluation. Able to create an original inspection certificate by setting the print format to suit particular requirements. SV-3100 X-axis measuring range : 100 mm X-axis Traverse straightness : (0,05+1L/100) µm, L = Measurement length (mm) Model SV-3100S4 SV-3100S4. SV-3100H4 SV-3100H4. SV-3100W4 SV-3100W D D D D D D-2 Detector measuring force [mn] 0,75 4 0,75 4 0,75 4 Stylus Tip angle Stylus Tip radius Vertical travel Granite base size (WxD) 600x x x x x x450 X-axis measuring range : 200 mm X-axis Traverse straightness : 0,5 µm/200 mm Model SV-3100S8 SV-3100S8. SV-3100H8 SV-3100H8. SV-3100W8 SV-3100W D D D D D D-2 Detector measuring force [mn] 0,75 4 0,75 4 0,75 4 Stylus Tip angle Stylus Tip radius Vertical travel Granite base size (WxD) 600 x x x x x x

32 Surftest SV-3100 Additional Specifications Optional accessories Other optional and standard accessories are listed later in different sections for accessories and styli. Series Surface Roughness Measuring Instrument Dimensions and Optional accessories Optional accessories Description Y-axis table 12AAD975 θ1-axis table θ2-axis table Manual vibration isolator Stand for vibration isolator Dynamic vibration isolator Cross-travel table XY range : 100x50 mm Rotary vice (heavy-duty type) 12AAG202 Extension rod 50 mm 12AAG203 Extension rod 100 mm Reference step specimen (2, 10) µm Automatic leveling table SV-, CV-series, CS [1176] [500] [640] [1000] 156 SV-3100S4 - SV-3100H4 - SV3100W SV-3100 SH [590] [500] [1176] FORMTRACEPAK [1000] 166 SV-3100S8 - SV-3100H8 - SV-3100W SV-3100 H8 517

33 Surftest Extreme SV-3000CNC Series 178 CNC Surface Roughness Measuring Instrument These is a fully CNC surface roughness measuring instrument with powerful software FORMTRACEPAK. The Surftest Extreme SV-3000CNC offers you the following benefits: It is perfectly made for increased throughput of multiple profile and workpiece measurement tasks. Each axis has a drive speed of up to 200 mm/s. You can take continuous measurement over horizontal and inclined surfaces by power-tilting the drive unit. Within the measuring range of the styli software FORMTRACEPAK supports contour calculation 3D topography measurement as option available Inclined plane measurement is possible through 2-axis simultaneous control in the X and Y directions. The detector unit incorporates an anti-collision safety device, causing it to automatically stop if its main body collides with a workpiece or jig. Specifications Traverse X = 200 mm Y = 200mm Range 800 µm; 80 µm; 8 µm (up to 2,4 mm with an optional stylus) Measuring 0,02-2 mm/s speed Drive speed CNC mode: max. 200 mm/s Joystick mode: 0-60 mm/s Traverse 0,5 µm / 200 mm straightness Inclining +45 (CCW) to -10 (CW) range Profiles Primary Profile (P), Roughness Profile (R), Waviness (W), MOTIF (P, R, W) and more Standards EN ISO, VDA, JIS, ANSI and customize setting Software FORMTRACEPAK Allows control of all axis, optional motor-driven Y-axis table and rotary table for efficient automated measurement. Surface roughness analysis and contour evaluation can be performed using analysis of level differences, angle, pitch, area and contour tolerancing as standard. An inspection certificate can be created by setting the print format as required. Additional Specifications Optional accessories Other optional and standard accessories are listed later in different sections for accessories and styli. SV-3000CNC Optional accessories Description 12AAD975 θ1-axis table θ2-axis table Automatic leveling table CNC D leveling table 12AAE032 Vibration isolator stand 12AAE449 Cabin for H-type Model SV-3000CNC-S SV-3000CNC-H SV-3000CNC-S. SV-3000CNC-H Z2-axis vertical travel Y-axis table unit - - Installed Installed α-axis unit Installed Installed Installed Installed Form Measurment Refer to SURFACE MEASUREMENT brochure Automatic measurement 518

34 Surftest Extreme SV-M3000CNC Specifications Traverse X = 200 mm Y = 800 mm Z2 = 500 mm Range 800 µm; 80 µm; 8 µm (up to 2,4 mm with an optional stylus) Measuring 0,02-2 mm/s speed Drive speed CNC mode: max. 200 mm/s Joystick mode: 0-50 mm/s Traverse straightness Inclining range Profiles Standards Loading weight X = 0,5 µm / 200 mm (standard) X = 0,7 µm / 200 mm (long-type detector) X = 0,5 µm / 200 mm (rotary-type detector) Y = 0,5 µm / 50 mm; 2 µm / 800 mm (standard) Y = 0,7 µm / 50 mm; 3 µm / 800 mm (long-type detector) Y = 0,7 µm / 50 mm; 3 µm / 800 mm (rotary-type detector) -45 (CCW) to +10 (CW) Primary Profile (P), Roughness Profile (R), Waviness (W), MOTIF (P, R, W) and more EN ISO, VDA, JIS, ANSI and customize setting 300 kg Series CNC Surface Roughness Measuring Instrument This is a top performance CNC surface roughness measuring instrument with powerful software FORMTRACEPAK. The Surftest Extreme SV-M3000CNC offers you the following benefits: You can measure large and heavy workpieces such as engine blocks and crankshafts. It has an 800mm moving column configuration to largely eliminate workpiece size restrictions. Each axis has a drive speed of up to 200 mm/s. When combined with the optional detector swivelling unit, continuous measurement over the bottom, top and side surface of a workpiece is possible. The huge load table has a self-contained structure ensuring that you can easily accommodate various size workpieces, standard and custom jigs, and auto-feed devices. Software FORMTRACEPAK Enables control of all axes for realizing efficient measurement automation. Perform contour evaluation that allows free analysis of level differences, angles, pitch, area and other characteristics as well as surface roughness evaluation. Able to create an original inspection certificate by setting the print format to suit particular requirements. Additional Specifications Optional accessories Other optional and standard accessories are listed later in different sections for accessories and styli. Form Measurment Refer to SURFACE MEASUREMENT brochure Detector hold type (Essential option) Standard Long type Rotary type Model Typical measurement task 519

35 Quick Guide to Precision Measuring Instruments Profiles and filters (DIN EN ISO 4287:1998 and DIN EN ISO 11562:1998) The actual surface profile is the result of the actual surface of the workpiece intersecting with a plane that is perpendicular to this surface. The plane should run approximately vertical to the tool marks. The measured surface profile is the profile after tracing the actual surface profile using a probe. The measured values are filtered due to the effect of the stylus tip radius r and, if applicable, due to the skid of the probe system. Surface imperfections, such as cracks, scratches and dents, are not considered roughness and should not be measured. If necessary, specify the tolerances in accordance with DIN EN ISO The primary profiles the profile after low-pass filtering of the measurement values with the cutoff wavelength λs. For this, the short-wave profile segments are segregated. The parameters are identified by P and are evaluated within the individual sampling length. In this case, this is equal to the evaluation length or the length of the measured surface profile. Surftest (Surface Roughness Testers) Roughness parameters (DIN EN ISO 4287:1998) Ra Arithmetic average roughness value: arithmetic mean of the sums of all profile values Rmr(c) Material portion of profile: quotient from the sum of the material lengths of the profile elements at the specified section height c (in µm) and of the evaluation length ln (specified as a percentage) RSm Mean groove width: mean value of the width of the profile elements Xsi (previously Sm); horizontal and vertical counting thresholds have been defined for the evaluation Rt Total height of the roughness profile: Sum from the height Zp of the highest profile peak and the depth Zv of the lowest profile valley within the evaluation length ln Rzi Maximum height of the roughness profile: Sum from the height of the highest profile peak and the depth of the lowest profile valley within a sampling length lri Rz1max Maximum roughness depth: Largest of the five Rzi values from the five sampling lengths lri within the evaluation length ln Rz Mean roughness depth: mean value of the five Rzi values from the five sampling lengths lri within the evaluation lengthln Fig. 1: Primary profile and mean line for the λs profile filter The roughness profile is the result of high-pass filtering of the primary profile with the cutoff wavelength λc. For this, the long-wave profile segments are segregated. The parameters are identified by R and are analyzed across the evaluation length ln, which usually consists of five individual sampling lengths lr. The sampling length is equal to the cutoff wavelength λc of the profile filter. Fig. 6: Arithmetic average roughness value Ra Fig. 7: Total height of the roughness profile Rt, mean roughness depth Rz and maximum roughness depth Rz1max Fig. 2: Roughness profile with mean line (high-pass filtering of the primary profile using the λc- profile filter) The waviness profile is the result of low-pass filtering of the primary profile with the cutoff wavelength λc and high-pass filtering with the cutoff wavelength f. The parameters are identified by W and are evaluated over the evaluation length ln, which consists of several sampling lengths lw. The sampling length lw corresponds to the cutoff wavelength λf of the high-pass filter. However, the number of sampling lengths is not standardized and must therefore always be specified on the drawing. It should be between five and ten. Fig. 8: The mean groove width RSm is the mean value of the width Xsi of the profile elements Fig. 3: Mean line from the primary profile and mean line for the λf profile filter after high-pass filtering Fig. 9: The material ratio curve of the profile represents the material portion Rmr(c) of the profile as a function of the section height c (Abbott-Firestone curve) Fig. 4: Waviness profile with mean line after low-pass filtering using the λc profile filter Filtered Short-wave profile segments Roughness Waviness Filtered Long-wave profile segments Fig. 5: Transmission characteristics of the filters for the different profiles, Gaussian filter as per DIN EN ISO 11562:1998 Preferred parameters Maximum roughness depth Rz1max for surfaces where individual deviations strongly affect the function of the surface, e.g. sealing surfaces. Material portion of the profile Rmr(c) for guide surfaces and opposing sealing surfaces Mean roughness depth Rz usually applies to all other surfaces. The arithmetic mean roughness value Ra hardly reacts to individual peaks or valleys due to the mean value formed from all profile values; its significance is therefore rather low. 520

36 Roughness measuring conditions (DIN EN ISO 4288:1998) Non-periodic profiles Grinding, honing, lapping, eroding Rt, Rz µm > 0,025 0,1 or Ra µm > 0, ,02 Periodic profiles Turning, milling, planing Evaluation of roughness measurements (DIN EN ISO 4288:1998) Roughness measurement values, particularly the vertical parameters Rt, Rz, Rz1max and Ra, have a spread of somewhere between -20 % and +30 %. A single measurement value can therefore not provide a complete statement with regard to compliance with the permissible parameter tolerances. The following procedure is specified in the DIN EN ISO 4288 Appendix A: RSm mm Measuring conditions as per DIN EN ISO 4288 and DIN EN ISO 3274 rtip Maximum stylus tip radius Max rule All roughness parameters with the addition of max as the maximum of the mean value from the five sampling lengths: Measure at least three points on the surface where the highest values are expected; the stated limit must not be exceeded at any point. 16 % rule All roughness parameters without the addition of max as the mean value from the five sampling lengths: 16% of the measured values may exceed the stated limit; the step-by-step procedure is as follows: 1. If the first measured value is less than 70% of the stated limit, this is considered compliant. 2. If the result is otherwise, two additional measurements are taken at other locations on the surface; if all three measured values are less than the stated limit, this considered compliant. 3. If the result is otherwise, nine additional measurements are taken at other locations on the surface; if no more than two of the measured values exceed the stated limit, this is considered compliant. lr ln lt rtip µm Sampling length Evaluation length Traversing length (evaluation length plus pre-travel and post-travel lengths) λc=lr mm ln mm lt mm > 0,013 0,04 2 0,08 0,4 0,48 > 0,1 0,5 > 0,02...0,1 > 0,04 0,13 2 0,25 1,25 1,5 > 0,5 10 > 0,1 2 > 0,13 0,4 2* ) 0,8 4 4,8 > > 2 10 > 0,4 1,3 5 2,5 12,5 15 > > > 1, * ) For Rz > 3 µm or Ra > 0.5 µm, the stylus tip radius rtip = 5 µm may be used. In addition, the measuring point distance x and the cutoff wavelength λs of the low-pass filter are standardized. However, these values have already been set in the roughness measuring devices. Practical tip 1: If there is insufficient space on the workpiece surface for the required traversing length lt, the number of evaluation lengths must be reduced and indicated in the drawing. Practical tip 2: If there is still insufficient space, the total height of the primary profile Pt is measured over the available length instead of Rt or Rz. Pt is still equal to Rt, but defined at the primary profile, and the measurement value is always larger. Drawing symbols (DIN EN ISO 1302:2002) = Parallel * Basic symbol Material removal through mechanical processing required Material removal not permitted Identical texture of all surfaces Vertical * ) a b c d e x Symbol entries (top) A single surface finish requirement Additional surface requirement Production process (e.g. turned, ground, chrome-plated) Symbol for direction of lay (surface grooves) Machining allowance (in mm) Letter for simplified benchmarking, if space is limited Symbols for direction of lay (position d, bottom) X Intersecting M Mixed * )... to projection plane of view in which the symbol is entered Examples C Concentric Explanation R Radial P Undirected No material removal allowed, default transmission band, R profile, 16% rule, mean roughness depth 5 µm (upper limit) Material removal allowed, default transmission band, R profile, max rule, maximum roughness depth 3 µm (upper limit); machining allowance 0.2 mm Material removal permitted, default transmission band, R profile, evaluation length of 3 sampling lengths, 16% rule, mean roughness depth 4 µm (upper limit); concentric surface grooves Material removal allowed, default transmission band, R profile, 16% rule, mean roughness depth 5 µm; arithmetic average roughness value 1 µm (upper limit) Material removal allowed, default transmission band, R profile, 16% rule, mean roughness depth between 1 µm (lower limit) and 3 µm (upper limit) Material removal allowed, default transmission band for λs, no λc filter, P profile, evaluation length equals workpiece length, 16% rule, total height of primary profile 25 µm (upper limit) Material removal allowed, default transmission band 0.8 (=λc) 25 (=λf=lw) mm, W profile, evaluation length of 5 sampling lengths ln=5*lw= 125 mm), 16% rule, total height of profile 10 µm (upper limit) Material removal allowed, default transmission band, R profile, 16% rule, total height of roughness profile 1 µm (upper limit); material portion of profile is 90% in cutting height c =0.3 µm (lower limit) Material removal allowed, default transmission band, R profile, mean groove width between 0.1 mm (lower limit) and 0.3 mm (upper limit) Explanation of the meaning (right) of simplified benchmarking (left), if space is limited. 521