BUREAU OF INDIAN STANDARDS
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1 BUREAU OF INDIAN STANDARDS Manak Bhavan, 9 Bahadur Shah Zafar Marg New Delhi Phones Extn 4284 TeleFax Website : eetd@bis.org.in ल ख षण स पन व य पक प रच लन म मस द स दभ दन क तकन क स म त ईट 18 षत : 1. ईट ड 18 क सभ सदस य 2. व य त तकन क वभ ग प रषद क सभ सदस य तथ 3. च रखन व ल अन य सभ नक य ईट ड 18/ ट मह दय / मह दय, क प य नम न ल खत मस द क एक त स लग न ह : ल ख श ष क ईट ड 18 (11550) म य य नय क : भ ग 2 उप कर स ब ध अप ए और प र ण (द सर प नर ण) क य इस मस द क अवल कन कर और अपन स म तय यह बत त ह ए भ ज क अ तत य द य म नक क प म क शत ह ज ए त इस पर अमल करन म आपक यवस य अथव क र ब र म य क ठन इय आ सकत ह स म तय भ जन क अ तम त र ख: 16/07/2017. स म तय य द क ई ह त क य अगल प ठ पर दए प म अध ह त र क उप र ल खत पत पर भ ज द य द क ई स म त त नह ह त अथव स म त म क वल भ ष स ब ध ट ह ई त उपर क त ल ख क यथ वत अ तम प दय ज एग य द क ई स म त तकन क क त क ह ई त वषय स म त क अ य क पर मश स अथव उनक इ छ पर आग क क य व ह क लए वषय स म त क भ ज ज न क ब द ल ख क अ तम प द दय ज एग 1 ध यव द, भवद य, (र ज व शम ) म ख (ईट ड ) ईम ल eetd@bis.org.in स ल न: उपर त
2 BUREAU OF INDIAN STANDARDS Manak Bhavan, 9 Bahadur Shah Zafar Marg New Delhi Phones Extn 4284 TeleFax Website : eetd@bis.org.in DRAFTS IN WIDE DOCUMENT DESPATCH ADVICE CIRCULATION Reference Date ETD 18/ T TECHNICAL COMMITTEE ETD ADDRESSED TO: 1. All Members of ETD All Members of Electrotechnical Division Council; and 3. All other Interested. Dear Madam(s)/ Sir(s), Please find enclosed a copy of the following draft Indian Standard: Doc No. Title ETD 18 (11550) Programmable controllers : Part 2 Equipment requirements and tests (second revision) Kindly examine the draft standards and forward your views stating any difficulties which you are likely to experience in your business or profession, if these are finally adopted as Indian Standards. Comments, if any, may please be made in the format given overleaf and mailed to the undersigned. Last date for comments : 16/07/2017 In case no comments are received or comments received are of editorial nature, you will kindly permit us to presume your approval for the above documents as finalized. However, in case of comments of technical in nature are received then it may be finalized either in consultation with the Chairperson, Sectional Committee or referred to the Sectional Committee for further necessary action, if so desired by the Chairperson, Sectional Committee. It may kindly be noted that the technical contents of the document have not been enclosed as these are identical with the corresponding IEC standard. For details, please refer to the corresponding IEC publication as mentioned in the respective National Forewords or kindly contact the undersigned. Thanking you, Yours faithfully (Rajeev Sharma) Head (Electrotechnical) eetd@bis.org.in Encl : See attachment.
3 BUREAU OF INDIAN STANDARDS Manak Bhavan, 9 Bahadur Shah Zafar Marg New Delhi Phones Extn 4284 TeleFax Website : eetd@bis.org.in Date Document No Doc : ETD 18 (11550) Sl. No. Name of the Organization Clause/ Sub-clause Paragraph/ Figure/Table Type of Comment (General/ Technical/ Editorial Comments Proposed Change
4 BUREAU OF INDIAN STANDARDS DRAFT FOR COMMENTS ONLY (Not to be reproduced without the permission of BIS or used as a STANDARD) Draft Indian Standard Programmable controllers : Part 2 Equipment requirements and tests Last date of receipt of comments is: Industrial Process Measurement and Control Sectional Committee, ETD 18 NATIONAL FOREWORD This Indian Standard (Part 2) (Second Revision) which is identical with IEC : 2007 Programmable controllers - Part 2 : Equipment requirements and tests issued by the International Electrotechnical Commission (IEC) may be adopted by the Bureau of Indian Standards on the recommendation of the Industrial Process Measurement and Control Sectional Committee and approval of the Electrotechnical Division Council. This Indian Standard was first published in 1992 which was identical to IEC Publication (1992). IS/IEC 1131 (Part 2) : 1992 was revised as IS (Part 2) to bring it in line with IEC : This revision has been undertaken to align it with the latest edition of IEC : The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain terminology and conventions are however not identical to those used in Indian Standards. Attention is particularly drawn to the following: a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. In this adopted standard, reference appears to certain International Standards for which Indian Standards also exist. The corresponding Indian Standards, which are to be substituted in their places, are listed below along with their degree of equivalence for the editions indicated:
5 International Standard Corresponding Indian Standard Degree of Equivalence IEC : 1987 Environmental testing Part 2: Tests Test Ea and guidance: Shock IEC : 2001 Degrees of protection provided by enclosures (IP Code) IEC : 1992 Insulation coordination for equipment within low-voltage systems Part 1: Principles, requirements and tests IEC : 2003 Insulation coordination for equipment within low-voltage systems Part 3: Use of coating, potting or moulding for protection against pollution IEC : 2003 Low-voltage switchgear and controlgear Part 5-1: Control circuit devices and switching elements Electromechanical control circuit devices IEC : 2004 Low-voltage switchgear and controlgear Part 5-2: Control circuit devices and switching elements Proximity switches IEC :2001, Information technology equipment Safety Part 1: General requirements IEC : 1995 (EMC) Part 4-2: Testing and measurement techniques Electrostatic discharge immunity test IEC : 2006 (EMC) Part 4-3: Testing and measurement techniques Radiated IS 9000 (Part 7/See 1) : 2006 Basic environmental testing procedures for electronic and electrical items : Part 7 Impact test, Section 1 Shock (Test Ea) (first revision) IS/IEC : 2001 Degrees of protection provided by enclosures (IP CODE) IS (Part 1) : 2014 Insulation coordination for equipment within lowvoltage systems : Part 1 Principles, requirements and tests (first revision) IS (Part 3) : 2006 Insulation coordination for equipment within lowvoltage systems : Part 3 Use of coating, potting or moulding for protection against pollution IS/IEC : 2003 Low-voltage switchgear and controlgear : Part 5 Control circuit devices and switching elements, Section 1 Electromechanical control circuit devices IS (Part 5/See 2) : 2004 Lowvoltage switchgear and controlgear Specification : Part 5 Control circuit devices and switching elements, Section 2 Proximity switches IS (Part 1) : 2010 Information technology equipment Safety : Part 1 General requirements (second revision) IS (Part 4/Sec 2) : 2008 (EMC) : techniques, Section 2 Electrostatic discharge immunity test IS (Part 4/Sec 3) : 2008 (EMC) : techniques, Section 3 Radiated, radio IEC (1 987) IEC : 2001 IEC : 2007 IEC : 2003 IEC : 2003 IEC (1999) IEC : 2005 IEC : 2001 IEC : 2006
6 radio-frequency field immunity test electromagnetic IEC : 2004 (EMC) Part 4: Testing and measurement techniques Section 4: Electrical fast transient/burst immunity test IEC : 2005 (EMC) Part 4-5: Testing and measurement techniques Surge immunity test IEC : 2003 (EMC) Part 4-6: Testing and measurement techniques Immunity to conducted disturbances induced by radiofrequency fields IEC : 1993 (EMC) Part 4-8: Testing and measurement techniques Power frequency magnetic field immunity test IEC : 2004 (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity test IEC : 2005 (EMC) Part 6-1: Generic standards Immunity for residential, commercial and lightindustrial environments IEC : 2005 (EMC) Part 6-2: Generic standards Immunity for industrial environments frequency, electromagnetic field immunity test (first revision) IS (Part 4/Sec 4) : 2008 (EMC) : techniques, Section 4 Electrical fast transient/burst immunity test (first revision) IS (Part 4/Sec 5) : 2012 (EMC) : techniques, Section 5 Surge immunity test IS (Part 4/Sec 6) : 2016 Electromagnetic Compatibility (EMC) : techniques, Section 6 Immunity to conducted disturbances, induced by radio-frequency fields IS (Part 4/Sec 8) : 2008 (EMC) : techniques, Section 8 Power frequency magnetic field immunity test (first revision) IS (Part 4/Sec 11) : 2008 (EMC) : techniques, Section 11 Voltage dips, short interruptions and voltage variations immunity tests IS (Part 6/Sec 1) : 2008 (EMC) : Part 6 Generic standards, Section 1 Immunity for residential, commercial and light-industrial environments IS (Part 6/Sec 2) : 2008 (EMC) : Part 6 Generic standards, Section 2 Immunity for industrial environments IEC : 2004 IEC : 2005 IEC : 2013 IEC : 2001 IEC : 2004 IEC : 2005 IEC : 2005
7 IEC : 2001 Safety requirements for electrical equipment for measurement, control, and laboratory use Part 1: General requirements IEC : 2003 Programmable controllers Part 1: General information IEC : 2005 Environmental testing Part 2: Tests Test Db: Damp heat, cyclic (12h + 12-hour cycle) IS/IEC : 2010 Safety requirements for electrical equipment for measurement, control, and laboratory use : Part 1 General requirements IS (Part 1) : 2006 Programmable controllers : Part 1 General information (first revision) IS 9000 ( Part 5/Sec 1 & 2 ) : 1981 Basic environmental testing procedures for electronic and electrical items : Part 5 Damp heat (cyclic) test IEC : 2010 IEC (2003) Technically Equivalent The technical committee responsible for the preparation of this standard has reviewed the provisions of the following International Standards referred to in this adopted standard and has decided that they are acceptable for use in conjunction with this standard: International Standard Title IEC :1992 IEC :2007 IEC :1974 IEC :1995 IEC :1984 IEC :1969 IEC :1975 High-voltage test techniques Part 1: General definitions and test requirements Environmental testing Part 2-1: Tests Test A: Cold Environmental testing Part 2: Tests Tests B: Dry heat Environmental testing Part 2: Tests Test Fc: Vibration (sinusoidal) Environmental testing Part 2: Tests Test N: Change of temperature Environmental testing Part 2: Tests Test Ec: Drop and topple,primarily for equipment-type specimens Environmental testing Part 2: Tests Test Ed: Free fall IEC :2005 Low-voltage electrical installations Part 1: Fundamental principles, assessment of general characteristics, definitions IEC :2005 Low-voltage electrical installations Part 4-41: Protection for safety Protection against electric shock IEC Graphical symbols for use on equipment IEC :2000 Fire hazard testing Part 2-11: Glowing/hot-wire based test methods Glow-wire flammability test method for end-products IEC :1999 Fire hazard testing Part 11-10: Test flames 50 W horizontal and vertical flame test methods IEC :2002 Low-voltage switchgear and controlgear Part 7-1: Ancillary equipment Terminal blocks for copper conductors IEC :2006 (EMC) Part 4-18: Testing and measurement techniques Damped oscillatory waves immunity test
8 IEC :2000 (EMC) Part 4-29: Testing and measurement techniques Voltage dips, short interruptions and voltage variations on d.c. input power port immunity test IEC :2006 (EMC) Part 6-4: Generic standards Emission standard for industrial environments IEC :2003 Programmable controllers Part 3: Programming languages IEC :2004 CISPR 14-1:2005 CISPR :2003 CISPR :2004 CISPR :2005 CISPR :2006 Programmable controllers Part 4: User guidelines Requirements for household appliances, electric tools and similar apparatus Part 1: Emission Specification for radio disturbance and immunity measuring apparatus and methods Part 1-2: Radio disturbance and immunity measuring apparatus Ancillary equipment Conducted disturbances Specification for radio disturbance and immunity measuring apparatus and methods Part 1-4: Radio disturbance and immunity measuring apparatus Ancillary equipment Radiated disturbances Specification for radio disturbance and immunity measuring apparatus and methods Part 2-1: Methods of measurement of disturbances and immunity Conducted disturbance measurements Specification for radio disturbance and immunity measuring apparatus and methods Part 2-3: Methods of measurement of disturbances and immunity Radiated disturbance measurements For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated expressing the result of a test, shall be rounded off in accordance with IS 2 : 1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard. Note: The technical content of the documents is not available on website. For details, please refer the corresponding IEC : 2007 or kindly contact: Head Electrotechnical Department Bureau of Indian Standards 9, B.S. Zafar Marg, New Delhi eetd@bis.org.in Telephone/ fax:
BUREAU OF INDIAN STANDARDS
BUREAU OF INDIAN STANDARDS Manak Bhavan, 9 Doc Bahadur ETD/42/ Shah 11302 Zafar Marg New Delhi 110002 Phones 2323 0131 2323 3375 Extn 4284 TeleFax +91 11 2323 1192 Website : www.bis.org.in email : eetd@bis.org.in
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Address: Manak Bhavan 9, Bahadur Shah Zafar Marg, New Delhi-110002 Ph: 011 23230131, 23233375, 23239402 PRODUCTION AND GENERAL ENGINEERING DEPARTMENT http://www.bis.org.in Email pgd@bis.org,in व य पक पर
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