Using PXI, TestStand, LabVIEW and some ingenuity to create a high throughput solution

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Michael Rice
6 years ago
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1 Using PXI, TestStand, LabVIEW and some ingenuity to create a high throughput solution Presenter: Paul Attwell CEng. Customer Application Specialist, Circuit Check 1

2 Introduction Hardware Software Sum up and feedback Video Questions 2

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maintained system Better test coverage Instant

4 Improved product connection methods and reduced loading time A re-useable architecture An easily maintained system Better test coverage Instant visibility of test results Shorter test time Improved yields 4

5 High performance multi material solution Complex multistage manufacture process Manufactured under cleanroom conditions Integrated electronic drive circuitry at wafer level. Extensive use of wire bonding. This is where testing is important 6

6 Test wire bonding at multiple stages of the process Pre and post potting tests Detect faults while the part is still repairable The tester has to accommodate different physical forms Introduce a short circuit load to check the bonds Have multiple units tested at once (6-8) Use optimal device communication and test methodology to reduce test time. Tester should be compliant with use in a class 10,000 clean room. 7

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9 Fixture Platform Instrumentation Safety and power Test controller Mass Interconnect 10

10 PXI Based 1062 chassis 2x 2594 MUX 4x1 4x 2593 MUX 16x1 1x 5160 Digitiser 2 ch Keysight 6700 PSU 11

11 Safety strategy is to keep hazards together and enclosed Safety controller & relays Auxiliary PSUs Soft start Simplifies risk assessments Standardised build 12

12 VPC G6 Interchangeable fixtures Quick Reliable Robust Platform is reusable 13

Pneumatic actuation Sensors to detect part present

13 Designed and reviewed in CAD Safe materials Special ribbon cable mating system Shorting bar mechanism Pneumatic actuation Sensors to detect part present and part types Pan used for digital drive and switching. 14

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18 Access to test points Small and fast signals Creation of a reliable short circuit Custom communications Large data sets to analyse Custom analysis Large data sets to store and manage 19

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20 NI TestStand sequenced NI LabVIEW VIs low level code Designed to work together TestStand Delivers: Multi socket environment 1 sequence 6-8 DUTs Looping models Test parameter file management Test Limits High level test re-ordering Test data management User interface User administration and access 21

21 Run and debug controls Commands available Sub Seq Main Sequence Variables Passing Parameters Calling a VI 22

22 Simple Clearly indicates test status Shows test progress Relays user messages Arranged as on the fixture top Includes simple stats on the performance Has a retest request function. 23

23 User message Test Type/Stage Progress Retest Request Used for fault reports Counters 24

24 Ability to check fixture and tester sensors and other hardware without the test sequence. Check sensors Operate pneumatics Power up the DUTs 25

25 Tabs: Nest sensors DUT power Safety Sensors Optical part present and part type sensors Pneumatic position sensors Can choose to look at 1 DUT at a time 26

26 Test stand collects data in a number of standard formats: ASCII Text Only HTML XML ATML Database (MS Access) With some effort it can also work with SQL Server Oracle MySQL And others that support SQL 27

27 Human readable formats (Text & HTML) are inefficient but friendly XML & ATML still need tools to use them Access database has tools with MS office but is limited to 2GB Enterprise databases are scalable but need expertise as well as external software and sometimes hardware In this case the customer wanted a special format of data exporting. 28

28 Easiest to produce a database and then export the data with SQL and a simple VI Data size limitations meant MySQL was needed Stand alone data interrogation tool produced 29

29 Date Range S/N of tested parts Fault detail for failed parts 30

30 Looking at the detailed results visually 31

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Delivered better more robust connections Easier access for maintenance More comprehensive testing including EEPROM tests and updating Automatic

32 Delivered better more robust connections Easier access for maintenance More comprehensive testing including EEPROM tests and updating Automatic detection of part type 1 tester for all variations and build states Conservatively 6 times quicker running tests (with scope for further optimisation) 33

33 The 60% yield increase has been the most significant improvement, the ease with which the product can be loaded means that together with the speed at which the test is conducted significant throughput improvements on original testing methods have been realised. 34

34 The quality of the data analysis and detailed data provided means we have not only the confidence of appropriate Pass / Fail results originally requested but has presented the further opportunity to analyse the presented data in greater detail to potentially determine the quality and strength of bonds and predict early life failures. 35

35 The machines on-going reliability is proving popular with both the manufacturing teams and Equipment Support Engineers, and gives us a high confidence for manufacturing stability and capability. 36

36 The delivered solution has exceeded the expectations of all stakeholders and continues to deliver against the planned objectives and present further opportunities. 37

Functional Testing of Electric Vehicle Battery Management Systems (BMS) using a PXI Platform Grant Gothing Project Engineer Bloomy Controls U.S.A.

Functional Testing of Electric Vehicle Battery Management Systems (BMS) using a PXI Platform Grant Gothing Project Engineer Bloomy Controls U.S.A. The Challenge: Design and develop a flexible and cost-effective