Defect Repair for EUVL Mask Blanks
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1 Defect Repair for EUVL Mask Blanks A.Barty, S.Hau-Riege, P.B.Mirkarimi, D.G.Stearns, H.Chapman, D.Sweeney Lawrence Livermore National Laboratory M.Clift Sandia National Laboratory E.Gullikson, M.Yi Lawrence Berkeley National Laboratory Auspices This work was performed under the auspices of the US Department of Energy by the University of California, Lawrence Livermore National Laboratory under contract No. W-7405-Eng-48. Funding was provided by the Extreme Ultraviolet Limited Liability Company (EUV LLC) under a Cooperative Research and Development Agreement. EUV mask blank repair, slide 1
2 Optional new repair step to increase yield of useable mask blanks Polished and inspected substrates from supplier per SEMI P37 Deposit substrate smoothing layer Deposit EUV multilayer stack Inspect coated blank for defects Too many defects No defects Repair defects and reinspect Mask blank meets customer specifications per SEMI P38 Ready for patterning New option of mask blank repair added An integrated process for defect repair to increase yield of useable mask blanks EUV mask blank repair, slide 2
3 Multilayer defect repair enables the yield of useable mask blanks to be increased, decreasing the mask Cost of Ownership With multilayer defect repair, total mask blank defect density can be cm -2 Mask price $100,000 $80,000 $60,000 $40,000 $20,000 $ Printable Mask Blank Defect Density (cm-2) ) Price=$1500, without repair Price=$1500, with repair Price=$5000, without repair Price=$5000, with repair Multilayer mask blank defect repair process Multilayer deposition Defect inspection Defect review with AIMS E-beam repair for substrate defects FIB repair for defects near surface EUV mask blank repair, slide 3 Acknowledgment: Scott hector, Motorola
4 Defect classification Phase defects Amplitude defects Incident EUV Incident EUV Wafer plane image Wafer plane image EUV mask blank repair, slide 4
5 CCD Camera Optical Microscope Overall concept: An integrated inspection-repair-review capability From initial inspection tool Integrated defect repair tool Phase defect repair (e-beam repair) EUV vendor AIM tool Classification and review Actinic inspection AFM Mask inspection microscope Amplitude defect repair (FIB repair) Evaluation Successful repair Repair not possible Repair unsuccessful EUV mask blank repair, slide 5
6 Defect classification Phase defects Amplitude defects Incident EUV Incident EUV Wafer plane image Wafer plane image EUV mask blank repair, slide 6
7 Amplitude defect repair strategy Damaged top layers are removed locally with a focused ion beam to expose undamaged layers ion beam Raster beam to produce a smooth profile Capping layer protects exposed materials in repaired region EUV mask blank repair, slide 7
8 Feasibility of amplitude defect repair demonstrated in proof-of-principle experiments 500eV Ar ion beam Silicon target 1000eV, 500nA Ar ion beam Multilayer Sputtered Si Craters of suitable profile have been made and inspected Reflectivity variation of >5% observed with no capping layer Reflectivity drop ~ 3% with SiC cap layer Other capping layer materials also show promise (eg: C, Ru, Mo Silicide) Actinic reflectivity profile R max beforehand (66%) (no milling or Si dep) 3.5% drop Secondary electron image EUV mask blank repair, slide 8
9 Removing a small number of surface layers has minimal effect on the phase of the reflected field Reflection does not take place at the surface... Rather it takes place through the bulk of the multilayer film In vacuum: λ 0 OPD = 2(1 n1 )h(x) h If the slope of the crater is sufficiently small it will not print within the exposure process window. In ML: λ 1 = 2d Refractive index, n 1 = λ 0 / λ 1 : n 1 = 0.97 For a 20 bi-layer (130nm) deep defect the crater must be 4um or more in diameter so that it does not print. AIM tool used to help determine defect depth and assess success of repair Multilayer reflection forces all waves to be in phase inside the multilayer EUV mask blank repair, slide 9 Resultant phase shift is small: Refractive index difference between the ML and vacuum is small
10 Reflectivity loss associated with layer removal is minimal if sufficient bi-layers remain after the repair process Calculated Reflectivity reflectivity vs number vs number of bi-layers of bi-layers removed removed 20 or more bi-layers can be removed with little effect on reflectivity Original reflectivity Layer removal will lead to a change in reflectivity across repair region EUV mask blank repair, slide 10 In this case the original multilayer is 60 bi-layers thick Ripple is due to alternating exposed layers of Molybdenum and Silicon as top surface
11 Capping layer material must be carefully selected to minimise reflectivity variation across the repaired region Reflectivity of multilayer depends on terminating material We can calculate the expected reflectivity for various capping layers: No capping layers and no oxidation of exposed layers 40Å Si capping layer deposited (oxidises to 20Å Si + 30Å SiO 2 ) Local reflectivity 1.5% variation in reflectivity predicted 3-4% variation observed Local reflectivity 9.6% variation in reflectivity Position Position EUV mask blank repair, slide % variation in reflectivity expected from exposing Molybdenum as the terminating layer 3-4% variation observed experimentally, attributed to oxidation of exposed Molybdemum layers
12 An example of how amplitude defect repair can mitigate the effect of serious amplitude defects Without repair Resist image With amplitude defect repair Resist image (Mask cross-section) (Mask cross-section) EUV mask blank repair, slide 12 Amplitude defect in proximity to isolated line without repair Parameters for this simulation: 100% opaque 140nm square defect (at mask) 3% reflectivity variation after repair 35nm isolated line (at wafer) 0.25NA camera, σ=0.7 Threshold resist prints to 35nm in focus Best-focus image shown here With amplitude repair the defect is removed. Residual variation in reflectivity within repaired area leads to a small variation in CD
13 Reflectivity variation within repaired region leads to a smaller change in CD across repaired region than without repair 35nm isolated line NA = 0.25 Original defect has >10% reflectivity variation R range currently demonstrated for amplitude repair Amplitude repair reduces R to ~3.5% across repair area EUV mask blank repair, slide 13 R ~ 3.5% leads to CD/CD ~ 2.5%
14 Defect classification Phase defects Amplitude defects Incident EUV Incident EUV Wafer plane image Wafer plane image EUV mask blank repair, slide 14
15 Phase defect repair uses thermally induced layer contraction to repair layer structure in the multilayer defect area Original defect Thermal source (electron beam) After repair Energy density, Log 10 de/dv (kev/µm 3 ) EUV mask blank repair, slide
16 Thermally induced layer contraction is used to repair multilayer structure Thermal source (electron beam) 550 Top layers after repair 4 2 Expected layer profiles Top layer th layer Height (nm) th layer Energy density, Log 10 de/dv (kev/µm 3 ) 110nm diameter defect under ion-smoothed 80-period multilayer film Position (nm) -4 EUV mask blank repair, slide µA e-beam of 100nm FWHM applied at 16kV for 900ms
17 Proof-of-principle experiments demonstrate the feasibility of phase defect repair strategy 3-10µm depressions have been formed in multilayers using commercial E-beam tools Need to reduce beam size to nm diameter for defect repair Auger Electron Beam 10µm -37nm 0nm 0nm Electron Micro Beam 1sec 10sec -45nm 10µm 8nm depression, ~8µm FWHM (10kV, 1µA) 40nm depression, ~3µm FWHM (15kV, 1µA) Further development required: Measure reflectivity and phase impact (we are limited by inspection tools!) Progress to smaller beam sizes (80-150nm diameter, ~1 µa ) EUV mask blank repair, slide 17
18 Phase Electromagnetic modeling predicts improved phase structure Rigorous Coupled-wave analysis (RCWA) used to compute phase and amplitude: (Acknowledgment: Eric Gullikson, LBNL) Before repair After repair Amplitude EUV mask blank repair, slide Phase improved, but reflectivity is degraded Printability analysis required
19 Small wavelength shift is induced by layer contraction Before repair After repair λ= -1.9Å λ= -3.05Å EUV mask blank repair, slide 19 really need to assess how the defect prints
20 An example of how phase defect repair can mitigate the effect phase defects in the printed image Without repair With repair CD CD = +55% CD CD = +16% EUV mask blank repair, slide nm sphere under 80 bi-layers, phase defect in proximity to 35nm isolated line, 0.25NA camera, σ=0.7, threshold resist prints to 35nm in focus Further refinement of repair may be possible, Results depend on printing variables (σ, NA, resist threshold, etc.)
21 Synopsis A reasonable strategy for the repair of phase and amplitude defects in multilayer coated mask blanks has been developed and extensively modeled by the VNL. Aerial image calculations indicate repair methods significantly reduce defect printability CD CD 2.5% CD CD = +55% CD CD = +16% Proof-of-principle experiments demonstrate feasibility of repairing phase and amplitude defects in multilayer coated mask blanks 0nm -45nm 10µm EUV mask blank repair, slide 21 Secondary electron image
22 Defect classification is possible using an AIM microscope Amplitude defect Amplitude defects blur symmetrically through focus Imaged phase defects cause contrast reversal through focus This can be used to distinguish the two types of defects Image Imaging system Phase defect Defect -100nm In focus +100nm EUV mask blank repair, slide 22 Amplitude defect absorb >1% of reflected light but have little phase structure 50nm sphere on the substrate nucleates phase defect at surface (Gaussian HW = 84nm, h=3.3nm = half wave phase error, 25:1 aspect ratio)
23 With repair available process window is increased Without repair Defect process window With repair Process window after repair 110nm diameter (big!) defect under 80-bilayers of ion-smoothed multilayer coating Contours are the worst-case CD change of a 35nm line in the presence of a defect Dashed line is +/-10% process window for an isolated 35nm line Contours will be different for different types of defect - need to explore parameter space EUV mask blank repair, slide 23 This is the current status for a worst-case defect: further refinement of repair parameters likely.
24 A small image shift will be caused by off-axis illumintion 6 Illumination Absorber pattern Due to surface dip the absorber layers are deposited at slightly different depths Beam incident at 6 degree angle This has an effect on image placement d d shift at mask shift at wafer (nm) (nm) (nm) EUV mask blank repair, slide 24
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