Flatness Measurement of a Moving Object Using Shadow Moiré Technique with Phase Shifting
|
|
- Audrey Lynch
- 5 years ago
- Views:
Transcription
1 Flatness Measurement of a Moving Object Using Shadow Moiré Technique with Phase Shifting Jiahui Pan, Dirk Zwemer, Gregory Petriccione, and Sean McCarron AkroMetrix, LLC, 700 NE Expy., C-100, Atlanta, GA, 3035 ABSTRACT A novel method based on the shadow moiré and phase shifting techniques has been developed to measure the flatness of an object moving at a constant speed. In this method, we propose an angled grating approach to achieve phase shifting with a simple and low-cost system. A grating plane is positioned at a small angle with respect to the axis of motion of the object along a continuous conveyor. While the object is moving horizontally, the vertical distance between the grating and the object changes, creating a series of phase shifts. A camera positioned above the grating captures a series of phase-shifted images for 3-D shape reconstruction. Unlike the traditional shadow moiré technique with phase shifting, this technique removes the need for a high-precision vertical motion system and allows a moving object to be measured without cessation. Since we use a phase calculation algorithm where phase shift is a free variable, the system performance is more tolerant of variations in grating angle and sample speed. The proposed technique has applications in a wide variety of areas such as electronics, metal fabrication, paper, textile, and polymer film industries, where on-line product inspection is a requisite. Keywords Flatness measurement, shadow moiré, phase shifting, angled grating, on-line inspection 1. INTRODUCTION Surface flatness is a common measurement specification in manufacturing industry. Flatness critically affects the reliability and assembly yield of electronic products, the cosmetic appearance and handling characteristics of paper products, as well as the mechanical fit and functionality of fabricated metal components. The ability to distinguish and reject components whose nonflatness exceeds user specifications is valuable on the production line because it allows the manufacturer to maintain product quality, and identify and avoid processing problems in manufacturing. There are many flatness measurement technologies applied in manufacturing. Use of a physical barrier is the simplest method for flatness inspection. In this method, a slot or other physical restriction is set up so that the object will only pass through if it is sufficiently flat. A single point sensor is another approach for flatness evaluation. Usually a height sensor, such as a dial indicator, is applied to multiple points on the sample surface. A calculation is made to acquire surface flatness according to these measures. The barrier and single point sensor methods are inexpensive and good for hand sorting of small quantities. However, they do not provide full-field information or automated quantitative processing. Single point sensor arrays or linescan cameras are then used for on-line automated flatness measurement. The sample passes under the sensors, each of which makes a series of measurements along a single line using optical, direct contact, or other principles. Computerized analysis is used to extrapolate the individual line data into a form that can quantify the flatness. Garcia has proposed a flatness inspection system for steel strip production lines using laser and linescan cameras [1]. The system measures the relative length of the material at five points across the strip width. Flatness indices, which represent the sample flatness, are obtained by length comparison. The measurement system works in real-time, but does not have a full coverage on the measuring surface. In order to achieve full-field data, projection moiré and shadow moiré are used. They are the most widely used techniques for flatness measurement because of their non-contact nature, full-field measurement capability and simple implementation [-]. Phase shifting technique is used together with moiré topography to acquire higher resolution, automatic fringe counting, and high tolerance to spatial variations of the recorded intensity values [5]. However, the use of phase shifting requires the sample surface to be motionless during measurement, which is difficult to implement on some manufacturing lines, where measuring surface flatness on a continuously moving surface is a requirement. For example, some materials are formed, woven or extruded on a continuous basis, such as paper, where the production flow cannot be stopped to make a measurement without introducing flaws into the material. Some other samples cannot readily be stopped and started because of sample characteristics, such as heaviness, or the requirements of the remainder of the production line. There are also some techniques based on moiré topography to measure the flatness of a moving object. Paakkari developed an automatic system
2 for measurement of the flatness of large steel plates based on the projection moiré technique [6]. An intensity-based cumulative method was used for phase calculation, which makes the fringe interpretation possible with one image only, and as a result makes dynamic measurement easy to implement. Zwemer and Hassell have patented a shadow moiré method that can measure surface flatness of a moving object [7]. In this method, a stroboscopic light source is used and acted as an optical shutter for image acquisition. Two images are recorded while the object is moving. Image subtraction and edge counting algorithms are used for fringe analysis. The drawbacks of these methods are their low measurement accuracy and difficulty in automatic data processing compared to the phase shifting method. In this paper, we propose an angled grating method based on the traditional phase-shifting shadow moiré technique to measure the flatness of a moving object. The grating is tilted at an angle with respect to the conveyor bed so that a series of phase shifts will be introduced while the sample passes under the grating. The measurement principle and system setup are presented in Section. In Section 3, a phase shifting algorithm with an undefined constant phase shift is described. With this algorithm, the measurement system is less sensitive to the grating angle and the conveyor speed. Experimental results presented in Section verify the feasibility and effectiveness of the proposed method. It was concluded that the angled grating method is a good means for low-cost and dynamic flatness measurement..1 Shadow Moiré with Phase shifting. PRINCIPLE Shadow moiré is a full-field optical method for measuring relative vertical displacement of continuous opaque surfaces [8-10]. This method is based on the geometric interference of a shadow grating projected on the sample surface and a real grating on a flat reference surface. Fig. 1 shows the principle of the shadow moiré technique. Light passes through the reference grating at an oblique angle,, and casts a shadow of the grating on the sample. This shadow grating is observed back through the reference grating at a different angle,. The overlap of the shadow and real gratings is a periodic function of the distance between them. When the surface of the specimen is curved or warped, a series of dark and light fringes (moiré fringes) are produced as a result of the geometric interference pattern created between the reference grating and shadow grating. Each successive fringe represents a height change of the sample surface of W, the height per fringe. W can be calculated with the following equation: p = tan α + tan β W (1) Where p is the pitch of the grating (center-to-center distance between lines), is the angle of illumination, and is the angle of observation. The analysis of static moiré patterns suffers from the need of cumbersome fringe counting and low accuracy. Phase shifting is then introduced to improve the resolution of the moiré techniques [11-1]. In theory, the measurement resolution of the phase shifting shadow moiré method is 1/56 of a fringe height for use with an 8-bit digitizer. But in practice, the effective resolution can be lower due to the experiment situation [13]. Additionally, the fringe counting process is fully automated and the gradient from fringe to fringe across the sample is automatically determined by using the phase shifting method. A phase shift in the traditional shadow moiré system is typically introduced by vertically translating either the sample or grating using a precision motion system. This makes the measurement system not suitable for measuring a continuously moving object. The reason is that each vertical translation of the grating requires a stabilizing time delay, and the sample must stop to allow the motion system to perform a series of phase shifting during the measurement cycle. Besides, the motion system is typically expensive, especially if sample or grating is large or heavy, and not practical to use in some circumstances such as a heating environment. In this paper, we modify the current shadow moiré system and propose an angled grating approach for measuring the flatness of continuously moving parts without any motion system. Light in Light out Grating p Object Fig. 1 Principle of Shadow Moiré.
3 Phase Grating position Shift Grating position 1 Sample Conveyor (a) Conventional Phase Shifting Static Approach Phase Shift Sample-Image 1 Grating Sample-Image Conveyor (b) Angled Grating Phase Shifting Dynamic Approach Fig. Comparison of static and dynamic approaches of phase shifting.. Angled Grating Method In the conventional phase shifting method, the sample must first be brought to a stop, and then the grating is translated vertically with respect to the sample while images are acquired after specific height shifts. In the angled grating method, the sample is moved continuously along the axis of motion on a belt conveyor. The key feature of this method is the use of a tilted grating, where its plane is aligned at an angle with respect to the axis of motion. The angled grating coupled with horizontal translation of the sample causes the relative height change between the sample and grating. Therefore, the phase-shifted images are created laterally during the movement of the sample without any vertical movement of the grating. The comparison of the two approaches is illustrated in Fig.. The main advantage of the angled grating approach is that the sample does not need to be stopped, which is difficult or impossible in some applications. In addition, the grating does not require vertical translation by means of an expensive highprecision motion system. This approach also allows for a more rapid data acquisition cycle. For example, a typical data acquisition cycle (four images) requires 1- seconds for the conventional phase shifting system shown in Fig. (a), as compared to 150 milliseconds for the angled grating system presented in Fig. (b)..3 System Setup The schematic setup of the angled grating system is shown in Fig. 3. A conveyor carrying a sample moves at a constant speed under a grating mounted above the conveyor and oriented a small angle with respect to the plane of the conveyor. The light source is beside and above the plane of the conveyor bed, with the axis of the line light source parallel to the axes of the ruling lines in the grating plane. A video camera is located above the grating at the same height as the light source to acquire the images. Two photosensors aligned along the direction of motion at the front edge of the grating register the passage of the sample. The speed of each sample is derived from the time difference and known distance between the two sensors. With this Side View Top View Fig. 3 Schematic setup of the angled grating system.
4 speed, a time delay can be properly set so that the image acquisition cycle begins after the sample is completely under the field of view of the camera. In addition, a lateral offset between images can be obtained and used to locate the same points among the intensity images. We use four intensity images to calculate phase and relative displacement in the designated area. Since the conveyor speed is derived before measurement of each sample, the analysis is less sensitive to factors that might vary the conveyor speed, such as electric voltage fluctuations or operator-induced changes. The grating angle should be approximately set such that each shift between images is equivalent to one-quarter of a fringe cycle. The maximum shutter period that can be used is a function of camera resolution, belt speed, and field of view of camera. To capture the image with clarity, the sample should shift less than 1 pixel width while the electronic shutter is open. The size, speed, grating pitch and angle, and other quantitative features of the system are inter-related. Any of these parameters can be varied over a significant range, depending on the application. 3. PHASE SHIFTING ALGORITHM WITH AN UNKNOWN PHASE SHIFT In this work, we use a four-step phase shifting method for the measurement. The common four-step phase shifting algorithm requires a phase shift of 90 degrees. The deviations from this value will introduce significant error into the phase calculation if 90-degree phase shift is assumed. In the angled grating system, if the phase shift must be exactly 90 degrees, a precise relationship is required between the speed of the sample, the angle of the grating, and the interval between image acquisitions, which may be difficult to create and maintain. An improved phase calculation algorithm proposed by Cheng and Wyant [8] was used to address this issue. In this algorithm, the phase shift does not have to be exactly 90 degrees. It can be determined as long as it is a constant between phase steps. Assuming that the phase shift is unknown but constant, the intensity value of each pixel for the four phase-shifted images can be expressed as: ( φ + θ ) ( φ θ ) ( φ 3θ ) ( φ θ ) I = I + cos () 1 0 A I (3) = I 0 + Acos + = I + Acos I () = I 0 + Acos + I (5) Where I 1 to I are the intensity value for each pixel in the four images, I 0 is the intensity bias, A is the intensity modulation, φ is the phase value which is related to the height information, and is the unknown phase shift. Solving for, we obtain: [ 3( I ][ ] ( ) 3) ( I1 ) ( I 3) + ( I1 ) ( I1 ) 3 1 θ = tan (6) and φ at each pixel can be determined as: ( I1 ) ( I 3 ) ( I + I ) ( I + I ) 1 φ = tan tanθ 3 1 (7) With the undefined phase shift angle algorithm described here, the phase can be calculated correctly even if speed or grating angle varies over a wide range from their nominal values. As a result, this algorithm eases the relationship between the vertical phase shift and the horizontal motion of the sample, and makes construction and maintenance of the system much simpler.. EXPERIMENTS A by inch plastic printed circuit board (PCB) was measured as a feasibility test of the angled grating method. The PCB on the conveyor passes under the grating at a known speed of 10 inches per second. The known speed together with the camera frame rate and fringe value is used to design the grating angle with respect to the conveyor plane. If sensors are used at the front edge of the grating, the actual speed of each sample can be determined. This measured speed can be used to set a delay time before the first image is acquired. At this initial experimental stage, the delay time was controlled manually by an operator. A series of four images at fixed time interval is then taken after the delay, while the sample moves under the grating, within the camera field of view. The four phase-shifted images acquired by the camera are shown in Fig. (a) through (d). We can see that the fringe contrast is adequate and the four images have a lateral offset between each. A commercially available
5 part location algorithm is then applied to locate the part and the pixels in the desired measurement area are selected based on the part location results. The phase values of the selected pixels are calculated from the four intensity images with offset, using the constant, but unknown phase shift algorithm described in Section 3. Standard algorithms are used to analyze the phase image as shown in Fig. (e) and the reconstructed displacement data is shown in Fig. (f). This experiment has demonstrated the feasibility of the angled grating method for measuring the flatness of a moving object. The theoretical resolution of this method is ±.5 microns with 100 lines per inch grating and light incidence at 5 degrees. Compared to the static approach, this method may have lower repeatability which needs to be further studied. However, it offers a relatively low-cost system for measuring the flatness of continuously moving parts, which is not achievable with the conventional static shadow moiré system. 5. CONCLUSIONS An angled grating method based on the phase shifting shadow moiré technique is proposed for flatness measurement. Compared to the traditional phase shifting shadow moiré technique, this method removes the need for a high-precision vertical motion system and is able to create phase shift while the measuring object is moving. The unique design of the system enables it to measure sample flatness on a continuous transport system. The relationships involving system parameters, such as grating size and pitch, conveyor speed, camera resolution, and shutter period was discussed. We use a phase calculation algorithm such that the effect of variation in grating angle or conveyor speed is minimized. Preliminary experimental results show the technique to be an effective approach for dynamic or real-time flatness measurement with a wide variety of potential applications in the fabrication and process industries. Future work of error analysis and repeatability study has to be conducted to refine this approach. (a) Intensity image one (b) Intensity image two (c) Intensity image three (d) Intensity image four (e) Phase Image (f) Surface Displacement Fig. An example of data acquisition and processing.
6 6. REFERENCES [1] Garcia, D.F., Garcia, M., Obeso, F., and Fernandez, V., Real-time flatness inspection system for steel strip production lines, Real-Time Imaging, 5(1), 35-7 (1999) [] Ding, H., Powell, R. E., Hanna, C. R., and Ume, I. C., Warpage measurement comparison using shadow moiré and projection moiré methods, IEEE Trans. on Components and Packaging Technologies, 5(), (00) [3] Wang, Y. and Hassell, P., Measurement of thermally induced deformation of a BGA using phase-stepping shadow moiré, Experimental/Numerical Mechanics in Electronic Packaging,, 3-39 (1998) [] Petriccione, G. J. and Ume, I. C., Warpage studies of HDI test vehicles during various thermal profiling, IEEE Trans. on Advanced Packaging, (), (1999) [5] Greivenkamp, J. E. and Bruning, J. H., Phase shifting interferometry," in Optical Shop Testing, D. Malacara, ed., Wiley, (New York), (199) [6] Paakkari, Jussi, On-line flatness measurement of large steel plates using moiré topography, VTT Publications Technical Research Center of Finland, n350, 88pp (1998) [7] Pat. US. 5,835,3, System for measuring surface flatness using shadow moiré technology, Zwemer, Dirk and Hassell Patrick (1998) [8] Meadows, D. M., Johnson, W. O., and Allen, J. B., Generation of surface contours by moiré patterns, Appl. Opt., 9(), 9-97 (1970) [9] Takasaki, H., Moiré topography, Appl. Opt., 1(), (1973) [10] Chiang, F. P., Moiré methods of strain analysis, in Manual on Experimental Stress Analysis, Kobayashi, A. S., Ed., Soc. For Exp. Stress Anal., Brookfield Center, CT, (1983) [11] Sullivan, J. L., Phase stepped fraction moiré, Experimental Mechanics, 31, (1991) [1] Chang M. and Ho, C. S., Phase-measuring profilometry using sinusoidal grating, Experimental Mechanics, 33(), (1993) [13] Wang, Y. and Hassell, P., Measurement of thermal deformation of BGA using phase-shifting shadow moiré, Electronic/Numerical Mechanics in Electronic Packaging, II, 3-39 (1998) [1] Cheng, Y. and Wyant, J., Phase shifter calibration in phase-shifting interferometry, Appl. Opt. (18), (1985)
Measurement of Thermally Induced Warpage of BGA Packages/Substrates Using Phase-Stepping Shadow Moiré
ABSTRACT Measurement of Thermally Induced Warpage of BGA Packages/Substrates Using Phase-Stepping Shadow Moiré Yinyan Wang and Patrick Hassell Electronic Packaging Services, Ltd. Co. 430 Tenth Street,
More informationAkrometrix Testing Applications
Akrometrix Optical Techniques: Akrometrix Testing Applications Three full-field optical techniques, shadow moiré, digital image correlation (DIC), and fringe projection (performed by the DFP) are used
More informationDynamic 3-D surface profilometry using a novel color pattern encoded with a multiple triangular model
Dynamic 3-D surface profilometry using a novel color pattern encoded with a multiple triangular model Liang-Chia Chen and Xuan-Loc Nguyen Graduate Institute of Automation Technology National Taipei University
More informationAIDA-2020 Advanced European Infrastructures for Detectors at Accelerators. Milestone Report
AIDA-2020-MS54 AIDA-2020 Advanced European Infrastructures for Detectors at Accelerators Milestone Report Integrated FBG sensors for monitoring the mechanical tension of MPGD films and meshes Benussi,
More informationDynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry
Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry Lei Huang,* Chi Seng Ng, and Anand Krishna Asundi School of Mechanical and Aerospace Engineering, Nanyang Technological
More informationd has a relationship with ψ
Principle of X-Ray Stress Analysis Metallic materials consist of innumerable crystal grains. Each grain usually faces in a random direction. When stress is applied on such materials, the interatomic distance
More informationCh 22 Inspection Technologies
Ch 22 Inspection Technologies Sections: 1. Inspection Metrology 2. Contact vs. Noncontact Inspection Techniques 3. Conventional Measuring and Gaging Techniques 4. Coordinate Measuring Machines 5. Surface
More informationDraft SPOTS Standard Part III (7)
SPOTS Good Practice Guide to Electronic Speckle Pattern Interferometry for Displacement / Strain Analysis Draft SPOTS Standard Part III (7) CALIBRATION AND ASSESSMENT OF OPTICAL STRAIN MEASUREMENTS Good
More informationFull-field optical methods for mechanical engineering: essential concepts to find one way
Full-field optical methods for mechanical engineering: essential concepts to find one way Yves Surrel Techlab September 2004 1 Contents 1 Introduction 3 2 White light methods 4 2.1 Random encoding............................................
More informationOptical Topography Measurement of Patterned Wafers
Optical Topography Measurement of Patterned Wafers Xavier Colonna de Lega and Peter de Groot Zygo Corporation, Laurel Brook Road, Middlefield CT 6455, USA xcolonna@zygo.com Abstract. We model the measurement
More informationSurface and thickness measurement of a transparent film using three-wavelength interferometry
Proceedings of the 4 th euspen International Conference Dubrovnik June 04 Surface and thickness measurement of a transparent film using three-wavelength interferometry K. Kitagawa Toray Engineering Co.,
More informationMeasuring Die Tilt Using Shadow Moiré Optical Measurements; New Techniques for Discontinuous and Semi-Reflective Surfaces Phase 2
Measuring Die Tilt Using Shadow Moiré Optical Measurements; New Techniques for Discontinuous and Semi-Reflective Surfaces Phase 2 Neil Hubble Akrometrix 2700 NE Expressway, Building B500 Atlanta, GA, 30360
More informationSYNTHETIC SCHLIEREN. Stuart B Dalziel, Graham O Hughes & Bruce R Sutherland. Keywords: schlieren, internal waves, image processing
8TH INTERNATIONAL SYMPOSIUM ON FLOW VISUALIZATION (998) SYNTHETIC SCHLIEREN Keywords: schlieren, internal waves, image processing Abstract This paper outlines novel techniques for producing qualitative
More informationNOVEL TEMPORAL FOURIER-TRANSFORM SPECKLE PATTERN SHEARING INTERFEROMETER
NOVEL TEMPORAL FOURIER-TRANSFORM SPECKLE PATTERN SHEARING INTERFEROMETER C. Joenathan*, B. Franze, P. Haible, and H. J. Tiziani Universitaet Stuttgart, Institut fuer Technische Optik, Pfaffenwaldring 9,
More informationCoherent Gradient Sensing Microscopy: Microinterferometric Technique. for Quantitative Cell Detection
Coherent Gradient Sensing Microscopy: Microinterferometric Technique for Quantitative Cell Detection Proceedings of the SEM Annual Conference June 7-10, 010 Indianapolis, Indiana USA 010 Society for Experimental
More informationNew Opportunities for 3D SPI
New Opportunities for 3D SPI Jean-Marc PEALLAT Vi Technology St Egrève, France jmpeallat@vitechnology.com Abstract For some years many process engineers and quality managers have been questioning the benefits
More informationLinescan System Design for Robust Web Inspection
Linescan System Design for Robust Web Inspection Vision Systems Design Webinar, December 2011 Engineered Excellence 1 Introduction to PVI Systems Automated Test & Measurement Equipment PC and Real-Time
More informationHigh spatial resolution measurement of volume holographic gratings
High spatial resolution measurement of volume holographic gratings Gregory J. Steckman, Frank Havermeyer Ondax, Inc., 8 E. Duarte Rd., Monrovia, CA, USA 9116 ABSTRACT The conventional approach for measuring
More informationStudy on Gear Chamfering Method based on Vision Measurement
International Conference on Informatization in Education, Management and Business (IEMB 2015) Study on Gear Chamfering Method based on Vision Measurement Jun Sun College of Civil Engineering and Architecture,
More informationksa MOS Ultra-Scan Performance Test Data
ksa MOS Ultra-Scan Performance Test Data Introduction: ksa MOS Ultra Scan 200mm Patterned Silicon Wafers The ksa MOS Ultra Scan is a flexible, highresolution scanning curvature and tilt-measurement system.
More informationThree Dimensional Measurements by Deflectometry and Double Hilbert Transform
Three Dimensional Measurements by Deflectometry and Double Hilbert Transform Silin Na*, Sanghoon Shin**, Younghun Yu* * Department of Physics, Jeju National University, Jeju, 63243, Korea ** Kanghae Precision
More informationHyperspectral interferometry for single-shot absolute measurement of 3-D shape and displacement fields
EPJ Web of Conferences 6, 6 10007 (2010) DOI:10.1051/epjconf/20100610007 Owned by the authors, published by EDP Sciences, 2010 Hyperspectral interferometry for single-shot absolute measurement of 3-D shape
More informationChapter 3 Image Registration. Chapter 3 Image Registration
Chapter 3 Image Registration Distributed Algorithms for Introduction (1) Definition: Image Registration Input: 2 images of the same scene but taken from different perspectives Goal: Identify transformation
More information3D data merging using Holoimage
Iowa State University From the SelectedWorks of Song Zhang September, 27 3D data merging using Holoimage Song Zhang, Harvard University Shing-Tung Yau, Harvard University Available at: https://works.bepress.com/song_zhang/34/
More informationApplications of Piezo Actuators for Space Instrument Optical Alignment
Year 4 University of Birmingham Presentation Applications of Piezo Actuators for Space Instrument Optical Alignment Michelle Louise Antonik 520689 Supervisor: Prof. B. Swinyard Outline of Presentation
More informationTesting spherical surfaces: a fast, quasi-absolute technique
Testing spherical surfaces: a fast, quasi-absolute technique Katherine Creath and James C. Wyant A technique for measuring the quality of spherical surfaces that provides a quasi-absolute result is presented.
More information4D Technology Corporation
4D Technology Corporation Dynamic Laser Interferometry for Company Profile Disk Shape Characterization DiskCon Asia-Pacific 2006 Chip Ragan chip.ragan@4dtechnology.com www.4dtechnology.com Interferometry
More informationMeasurements using three-dimensional product imaging
ARCHIVES of FOUNDRY ENGINEERING Published quarterly as the organ of the Foundry Commission of the Polish Academy of Sciences ISSN (1897-3310) Volume 10 Special Issue 3/2010 41 46 7/3 Measurements using
More informationAn Innovative Three-dimensional Profilometer for Surface Profile Measurement Using Digital Fringe Projection and Phase Shifting
An Innovative Three-dimensional Profilometer for Surface Profile Measurement Using Digital Fringe Projection and Phase Shifting Liang-Chia Chen 1, Shien-Han Tsai 1 and Kuang-Chao Fan 2 1 Institute of Automation
More informationHigh-resolution 3D profilometry with binary phase-shifting methods
High-resolution 3D profilometry with binary phase-shifting methods Song Zhang Department of Mechanical Engineering, Iowa State University, Ames, Iowa 511, USA (song@iastate.edu) Received 11 November 21;
More informationThermal Stress Analysis Based on Shadow Moiré Technique in a Convective Dryer.
Thermal Stress Analysis Based on Shadow Moiré Technique in a Convective Dryer. Rafael A. de Oliveira a, Daniel Albiero b,inaciom.dalfabbro c,kil J. Park d, and Kil J.B. Park e a State University of Campinas-UNICAMP,13083-875
More informationDETECTION AND QUANTIFICATION OF CRACKS IN PRESSURE VESSELS USING ESPI AND FEA MODELLS
DETECTION AND QUANTIFICATION OF CRACKS IN PRESSURE VESSELS USING ESPI AND FEA MODELLS J GRYZAGORIDIS, DM FINDEIS, JR MYLES Department of Mechanical Engineering University of Cape Town Abstract Non destructive
More informationLaser Technology Inc.
Laser Shearography Inspection of Helicopter Rotor Blades A helicopter is an aircraft that has a main lifting rotor. Main rotor blades come in a variety of configurations. They can be a hollow composite
More informationInspection of Laser Generated Lamb Waves using Shearographic Interferometry
1st International Symposium on Laser Ultrasonics: Science, Technology and Applications July 16-18 28, Montreal, Canada Inspection of Laser Generated Lamb Waves using Shearographic Interferometry Oliver
More informationDYNAMIC ELECTRONIC SPECKLE PATTERN INTERFEROMETRY IN APPLICATION TO MEASURE OUT-OF-PLANE DISPLACEMENT
Engineering MECHANICS, Vol. 14, 2007, No. 1/2, p. 37 44 37 DYNAMIC ELECTRONIC SPECKLE PATTERN INTERFEROMETRY IN APPLICATION TO MEASURE OUT-OF-PLANE DISPLACEMENT Pavla Dvořáková, Vlastimil Bajgar, Jan Trnka*
More information3D DEFORMATION MEASUREMENT USING STEREO- CORRELATION APPLIED TO EXPERIMENTAL MECHANICS
3D DEFORMATION MEASUREMENT USING STEREO- CORRELATION APPLIED TO EXPERIMENTAL MECHANICS Dorian Garcia, Jean-José Orteu École des Mines d Albi, F-81013 ALBI CT Cedex 09, France Dorian.Garcia@enstimac.fr,
More informationTwo slit interference - Prelab questions
Two slit interference - Prelab questions 1. Show that the intensity distribution given in equation 3 leads to bright and dark fringes at y = mλd/a and y = (m + 1/2) λd/a respectively, where m is an integer.
More information16. Holography. Dennis Gabor (1947) Nobel Prize in Physics (1971)
16. Holography Dennis Gabor (1947) Nobel Prize in Physics (1971) Photography Records intensity distribution of light. Does not record direction. Two-dimensional image. Holography = whole + writing Records
More informationACTA TECHNICA CORVINIENSIS Bulletin of Engineering Tome X [2017] Fascicule 2 [April June] ISSN:
Tome X [2017] Fascicule 2 [April June] ISSN: 2067 3809 1. Yung-Cheng WANG, 2. Bean-Yin LEE, 1. Chih-Hao HUANG, 3. Chi-Hsiang CHEN DEVELOPMENT OF THE AXIAL PRECISION INSPECTION SYSTEM FOR SPINDLES IN TOOL
More informationA Comparison of Results Obtained from Alternative Digital Shearography and ESPI Inspection Methods
A Comparison of Results Obtained from Alternative Digital Shearography and ESPI Inspection Methods Dirk Findeis and Jasson Gryzagoridis Department of Mechanical Engineering University of Cape Town, Private
More informationHigh-speed three-dimensional shape measurement system using a modified two-plus-one phase-shifting algorithm
46 11, 113603 November 2007 High-speed three-dimensional shape measurement system using a modified two-plus-one phase-shifting algorithm Song Zhang, MEMBER SPIE Shing-Tung Yau Harvard University Department
More informationREMOTE SENSING OF SURFACE STRUCTURES
REMOTE SENSING OF SURFACE STRUCTURES A.W. Koch, P. Evanschitzky and M. Jakobi Technische Universität München Institute for Measurement Systems and Sensor Technology D-8090 München, Germany Abstract: The
More informationAddressing High Precision Automated Optical Inspection Challenges with Unique 3D Technology Solution
Addressing High Precision Automated Optical Inspection Challenges with Unique 3D Technology Solution John Hoffman CyberOptics Corporation jhoffman@cyberoptics.com Outline/Agenda Phase Profilometry SMT
More informationAccurately measuring 2D position using a composed moiré grid pattern and DTFT
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 Accurately measuring 2D position using a composed moiré grid pattern and DTFT S. Van
More informationAdvanced Stamping Manufacturing Engineering, Auburn Hills, MI
RECENT DEVELOPMENT FOR SURFACE DISTORTION MEASUREMENT L.X. Yang 1, C.Q. Du 2 and F. L. Cheng 2 1 Dep. of Mechanical Engineering, Oakland University, Rochester, MI 2 DaimlerChrysler Corporation, Advanced
More informationAuburn Hills, MI, USA, 2 Dept. of Mechanical Engineering, Oakland University, Rochester, MI, USA
APPLICATIONS OF FULL FIELD OPTICAL METHOD FOR MEASURING STRAIN CONCENTRATION L. Zhang 1,, C. Du 1, Y.J. Zhou 1 and L.X. Yang 1 DaimlerChrysler Corporation, Advanced Stamping Manufacturing Engineering,
More informationDigital Image Correlation combined with Electronic Speckle Pattern Interferometery for 3D Deformation Measurement in Small Samples
Digital Image Correlation combined with Electronic Speckle Pattern Interferometery for 3D Deformation Measurement in Small Samples Phillip L. Reu * and Bruce D. Hansche Sandia National Laboratories, PO
More informationOPTICAL TOOL FOR IMPACT DAMAGE CHARACTERIZATION ON AIRCRAFT FUSELAGE
OPTICAL TOOL FOR IMPACT DAMAGE CHARACTERIZATION ON AIRCRAFT FUSELAGE N.Fournier 1 F. Santos 1 - C.Brousset 2 J.L.Arnaud 2 J.A.Quiroga 3 1 NDT EXPERT, 2 AIRBUS France, 3 Universidad Cmplutense de Madrid
More informationQUANTITATIVE ANALYSIS OF A CLASS OF SUBSURFACE CRACKS USING
QUANTITATIVE ANALYSIS OF A CLASS OF SUBSURFACE CRACKS USING SHEAROGRAPHY AND FINITE ELEMENT MODELING Leland D. Melvin and Brooks A. Childers NASA Langley Research Center Hampton, Virginia 23681 James P.
More informationSTUDY ON LASER SPECKLE CORRELATION METHOD APPLIED IN TRIANGULATION DISPLACEMENT MEASUREMENT
STUDY ON LASER SPECKLE CORRELATION METHOD APPLIED IN TRIANGULATION DISPLACEMENT MEASUREMENT 2013 г. L. Shen*, D. G. Li*, F. Luo** * Huazhong University of Science and Technology, Wuhan, PR China ** China
More informationReal-time quantitative differential interference contrast (DIC) microscopy implemented via novel liquid crystal prisms
Real-time quantitative differential interference contrast (DIC) microscopy implemented via novel liquid crystal prisms Ramzi N. Zahreddine a, Robert H. Cormack a, Hugh Masterson b, Sharon V. King b, Carol
More informationWARPAGE MEASUREMENT OF PCB USING 3D PROFILOMETRY
WARPAGE MEASUREMENT OF PCB USING 3D PROFILOMETRY Prepared by Craig Leising 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials. 2010
More informations70 Prototype of a Handheld Displacement Measurement System Using Multiple Imaging Sensors
Journal of JSEM, Vol.15, Special Issue (2015) s70-s74 Copyright C 2015 JSEM Prototype of a Handheld Displacement Measurement System Using Multiple Imaging Sensors Motoharu FUJIGAKI 1, Hiroki MIAMIO 2,
More informationTransparent Object Shape Measurement Based on Deflectometry
Proceedings Transparent Object Shape Measurement Based on Deflectometry Zhichao Hao and Yuankun Liu * Opto-Electronics Department, Sichuan University, Chengdu 610065, China; 2016222055148@stu.scu.edu.cn
More informationNew Line Confocal Imaging Method for High-Resolution 3D Surface Imaging Applications. Juha Saily Sales Manager FocalSpec, Inc.
New Line Confocal Imaging Method for High-Resolution 3D Surface Imaging Applications Juha Saily Sales Manager FocalSpec, Inc. Introduction Company Line Confocal Imaging Sensor products Scan examples System
More informationApplications of Temporal Phase Shift Shearography
Chapter 5 Applications of Temporal Phase Shift Shearography The main applications of temporal phase shift shearography are in NDT and strain measurement. 5.1. Temporal Phase Shift Shearography for NDT
More informationDigital Volume Correlation for Materials Characterization
19 th World Conference on Non-Destructive Testing 2016 Digital Volume Correlation for Materials Characterization Enrico QUINTANA, Phillip REU, Edward JIMENEZ, Kyle THOMPSON, Sharlotte KRAMER Sandia National
More informationWhite-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting
White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting Maitreyee Roy 1, *, Joanna Schmit 2 and Parameswaran Hariharan 1 1 School of Physics, University
More informationCenter for Nondestructive Evaluation The Johns Hopkins University Baltimore, Maryland 21218
HIGH RESOLUTION HOLOGRAPHIC CONTOURING James W. Wagner Center for Nondestructive Evaluation The Johns Hopkins University Baltimore, Maryland 21218 INTRODUCTION Optical contouring techniques which incorporate
More informationSurface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometry
Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometry Katsuichi Kitagawa Toray Engineering Co. Ltd., 1-1-45 Oe, Otsu 50-141, Japan Corresponding
More informationRange Imaging Through Triangulation. Range Imaging Through Triangulation. Range Imaging Through Triangulation. Range Imaging Through Triangulation
Obviously, this is a very slow process and not suitable for dynamic scenes. To speed things up, we can use a laser that projects a vertical line of light onto the scene. This laser rotates around its vertical
More informationParallel two-step spatial carrier phase-shifting common-path interferometer with a Ronchi grating outside the Fourier plane
Parallel two-step spatial carrier phase-shifting common-path interferometer with a Ronchi grating outside the Fourier plane Mingguang Shan, Bengong Hao, Zhi Zhong,* Ming Diao, and Yabin Zhang College of
More informationCHAPTER 6 ELASTO- PLASTIC STRAIN MEASUREMENTS USING MOIRE INTERFEROMETRIC TECHNIQUE
28 CHAPTER 6 ELASTO- PLASTIC STRAIN MEASUREMENTS USING MOIRE INTERFEROMETRIC TECHNIQUE 6.1 PRINCIPLES OF THE TECHNIQUE Moire interferometry is a modern and attractive optical technique for full field strain
More information[HALL PROBE GRADIOMETRY ]
2008 [HALL PROBE GRADIOMETRY ] A novel Scanning Hall probe gradiometer has been developed and a new method to image x, y & z components of the magnetic field on the sample surface has been demonstrated
More informationABSTRACT. When shadow moiré is practiced in industry for the warpage of microelectronic
ABSTRACT Title of dissertation : SHADOW MOIRÉ USING NON-ZERO TALBOT DISTANCE AND APPLICATION OF DIFFRACTION THEORY TO MOIRÉ INTERFEROMETRY Chang Woon Han, Doctor of Philosophy, 2005 Dissertation directed
More informationPhysical Optics. You can observe a lot just by watching. Yogi Berra ( )
Physical Optics You can observe a lot just by watching. Yogi Berra (1925-2015) OBJECTIVES To observe some interference and diffraction phenomena with visible light. THEORY In a previous experiment you
More informationA. K. Srivastava, K.C. Sati, Satyander Kumar alaser Science and Technology Center, Metcalfe House, Civil Lines, Delhi , INDIA
International Journal of Scientific & Engineering Research Volume 8, Issue 7, July-2017 1752 Optical method for measurement of radius of curvature of large diameter mirrors A. K. Srivastava, K.C. Sati,
More informationSensor Positioning Inside a Linescan Camera
Sensor Positioning Inside a Linescan Camera Atmel innovates with its Aviiva TM cameras By Jean-Luc Diverchy, Camera Project Manager Summary In product inspection processes, companies often face problems
More informationTopometry and color association by RGB Fringe Projection Technique
RESEARCH REVISTA MEXICANA DE FÍSICA 60 (2014) 109 113 MARCH-APRIL 2014 Topometry and color association by RGB Fringe Projection Technique Y.Y. López Domínguez, A. Martínez, and J.A. Rayas Centro de Investigaciones
More informationSimple, complete, and novel quantitative model of holography for students of science and science education
Journal of Physics: Conference Series Simple, complete, and novel quantitative model of holography for students of science and science education To cite this article: Dale W Olson 2013 J. Phys.: Conf.
More informationHANDBOOK OF THE MOIRE FRINGE TECHNIQUE
k HANDBOOK OF THE MOIRE FRINGE TECHNIQUE K. PATORSKI Institute for Design of Precise and Optical Instruments Warsaw University of Technology Warsaw, Poland with a contribution by M. KUJAWINSKA Institute
More informationChapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena
Chapter 24 Wave Optics Wave Optics The wave nature of light is needed to explain various phenomena Interference Diffraction Polarization The particle nature of light was the basis for ray (geometric) optics
More informationTutorial: Instantaneous Measurement of M 2 Beam Propagation Ratio in Real-Time
Tutorial: Instantaneous Measurement of M 2 Beam Propagation Ratio in Real-Time By Allen M. Cary, Jeffrey L. Guttman, Razvan Chirita, Derrick W. Peterman, Photon Inc A new instrument design allows the M
More informationA New Direct Deformation Sensor for Active Compensation of Positioning Errors in Large Milling Machines
A New Direct Deformation Sensor for Active Compensation of Positioning Errors in Large Milling Machines Francesco Biral Phone: +390461882451, fax: +390461882599 e-mail: francesco.biral@ing.unitn.it Paolo
More informationCalibration of a portable interferometer for fiber optic connector endface measurements
Calibration of a portable interferometer for fiber optic connector endface measurements E. Lindmark Ph.D Light Source Reference Mirror Beamsplitter Camera Calibrated parameters Interferometer Interferometer
More informationPhase error correction based on Inverse Function Shift Estimation in Phase Shifting Profilometry using a digital video projector
University of Wollongong Research Online Faculty of Informatics - Papers (Archive) Faculty of Engineering and Information Sciences 2010 Phase error correction based on Inverse Function Shift Estimation
More informationHigh speed 3-D Surface Profilometry Employing Trapezoidal HSI Phase Shifting Method with Multi-band Calibration for Colour Surface Reconstruction
High speed 3-D Surface Profilometry Employing Trapezoidal HSI Phase Shifting Method with Multi-band Calibration for Colour Surface Reconstruction L C Chen, X L Nguyen and Y S Shu National Taipei University
More information3DPIXA: options and challenges with wirebond inspection. Whitepaper
3DPIXA: options and challenges with wirebond inspection Whitepaper Version Author(s) Date R01 Timo Eckhard, Maximilian Klammer 06.09.2017 R02 Timo Eckhard 18.10.2017 Executive Summary: Wirebond inspection
More informationCHAPTER 2: THREE DIMENSIONAL TOPOGRAPHICAL MAPPING SYSTEM. Target Object
CHAPTER 2: THREE DIMENSIONAL TOPOGRAPHICAL MAPPING SYSTEM 2.1 Theory and Construction Target Object Laser Projector CCD Camera Host Computer / Image Processor Figure 2.1 Block Diagram of 3D Areal Mapper
More informationDistortion Correction for Conical Multiplex Holography Using Direct Object-Image Relationship
Proc. Natl. Sci. Counc. ROC(A) Vol. 25, No. 5, 2001. pp. 300-308 Distortion Correction for Conical Multiplex Holography Using Direct Object-Image Relationship YIH-SHYANG CHENG, RAY-CHENG CHANG, AND SHIH-YU
More informationspecular diffuse reflection.
Lesson 8 Light and Optics The Nature of Light Properties of Light: Reflection Refraction Interference Diffraction Polarization Dispersion and Prisms Total Internal Reflection Huygens s Principle The Nature
More informationANALYSIS AND MEASUREMENT OF SCARF-LAP AND STEP-LAP JOINT REPAIR IN COMPOSITE LAMINATES
16 TH INTERNATIONAL CONFERENCE ON COMPOSITE MATERIALS ANALYSIS AND MEASUREMENT OF SCARF-LAP AND STEP-LAP JOINT REPAIR IN COMPOSITE LAMINATES David H. Mollenhauer*, Brian Fredrickson*, Greg Schoeppner*,
More informationEnhanced two-frequency phase-shifting method
Research Article Vol. 55, No. 16 / June 1 016 / Applied Optics 4395 Enhanced two-frequency phase-shifting method JAE-SANG HYUN AND SONG ZHANG* School of Mechanical Engineering, Purdue University, West
More information3D X-ray Laminography with CMOS Image Sensor Using a Projection Method for Reconstruction of Arbitrary Cross-sectional Images
Ke Engineering Materials Vols. 270-273 (2004) pp. 192-197 online at http://www.scientific.net (2004) Trans Tech Publications, Switzerland Online available since 2004/08/15 Citation & Copright (to be inserted
More informationMotion Analysis. Motion analysis. Now we will talk about. Differential Motion Analysis. Motion analysis. Difference Pictures
Now we will talk about Motion Analysis Motion analysis Motion analysis is dealing with three main groups of motionrelated problems: Motion detection Moving object detection and location. Derivation of
More informationInspection of flatness using vision system
Inspection of flatness using vision system Kartik Shah, Department of Industrial Engineering, School of Technology, Pandit Deendayal Petroleum University, Raisan, Gandhinagar-382007, Gujarat, India. kartik.sie13@sot.pdpu.ac.in
More informationOptics Vac Work MT 2008
Optics Vac Work MT 2008 1. Explain what is meant by the Fraunhofer condition for diffraction. [4] An aperture lies in the plane z = 0 and has amplitude transmission function T(y) independent of x. It is
More informationHigh Resolution Phased Array Imaging using the Total Focusing Method
High Resolution Phased Array Imaging using the Total Focusing Method S. Kierspel, Wolfram A. Karl Deutsch, Helge Rast, Philippe Benoist 1, Venkat A 2 KARL DEUTSCH Pruef- und Messgeraetebau GmbH + Co KG
More informationStructural Integrity Evaluation of Polymer Composites using Optical Strain Measurement (ARAMIS)
Structural Integrity Evaluation of Polymer Composites using Optical Strain Measurement (ARAMIS) Z Y Zhang M O W Richardson Centre of Excellence - Manufacturing (RCMI) Department of Mechanical and Manufacturing
More informationChapter 38. Diffraction Patterns and Polarization
Chapter 38 Diffraction Patterns and Polarization Diffraction Light of wavelength comparable to or larger than the width of a slit spreads out in all forward directions upon passing through the slit This
More informationCoupling of surface roughness to the performance of computer-generated holograms
Coupling of surface roughness to the performance of computer-generated holograms Ping Zhou* and Jim Burge College of Optical Sciences, University of Arizona, Tucson, Arizona 85721, USA *Corresponding author:
More informationSIMULATION AND VISUALIZATION IN THE EDUCATION OF COHERENT OPTICS
SIMULATION AND VISUALIZATION IN THE EDUCATION OF COHERENT OPTICS J. KORNIS, P. PACHER Department of Physics Technical University of Budapest H-1111 Budafoki út 8., Hungary e-mail: kornis@phy.bme.hu, pacher@phy.bme.hu
More informationLaboratory 2: 2D Strain Measurement October 12/13, 2005 BIOEN 5201 Introduction to Biomechanics Instructor: Jeff Weiss TA: Trevor Lujan
Laboratory 2: 2D Strain Measurement October 12/13, 2005 BIOEN 5201 Introduction to Biomechanics Instructor: Jeff Weiss TA: Trevor Lujan Lab Quiz: A 10 point lab quiz will be given at the beginning of lab
More informationA RADIAL WHITE LIGHT INTERFEROMETER FOR MEASUREMENT OF CYLINDRICAL GEOMETRIES
A RADIAL WHITE LIGHT INTERFEROMETER FOR MEASUREMENT OF CYLINDRICAL GEOMETRIES Andre R. Sousa 1 ; Armando Albertazzi 2 ; Alex Dal Pont 3 CEFET/SC Federal Center for Technological Education of Sta. Catarina
More informationImproved phase-unwrapping method using geometric constraints
Improved phase-unwrapping method using geometric constraints Guangliang Du 1, Min Wang 1, Canlin Zhou 1*,Shuchun Si 1, Hui Li 1, Zhenkun Lei 2,Yanjie Li 3 1 School of Physics, Shandong University, Jinan
More informationDEFLECTION AND TWIST MEASUREMENT SYSTEM (DTMS) Model 47
Features DEFLECTION AND TWIST MEASUREMENT SYSTEM (DTMS) Model 47 Results are not affected by the motion or acceleration of the structure being tested Three or five degrees of freedom are measured between
More informationWhat is Frequency Domain Analysis?
R&D Technical Bulletin P. de Groot 9/3/93 What is Frequency Domain Analysis? Abstract: The Zygo NewView is a scanning white-light interferometer that uses frequency domain analysis (FDA) to generate quantitative
More informationValidation of Heat Conduction 2D Analytical Model in Spherical Geometries using infrared Thermography.*
11 th International Conference on Quantitative InfraRed Thermography Validation of Heat Conduction 2D Analytical Model in Spherical Geometries using infrared Thermography.* by C. San Martín 1,2, C. Torres
More informationFLOW VISUALISATION OF POLYMER MELT CONTRACTION FLOWS FOR VALIDATION OF NUMERICAL SIMULATIONS
FLOW VISUALISATION OF POLYMER MELT CONTRACTION FLOWS FOR VALIDATION OF NUMERICAL SIMULATIONS R Spares, T Gough, M T Martyn, P Olley and P D Coates IRC in Polymer Science & Technology, Mechanical & Medical
More informationThree-Dimensional Laser Scanner. Field Evaluation Specifications
Stanford University June 27, 2004 Stanford Linear Accelerator Center P.O. Box 20450 Stanford, California 94309, USA Three-Dimensional Laser Scanner Field Evaluation Specifications Metrology Department
More information