S-2900A. Rev CMOS 512-bit SERIAL E 2 PROM
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- Roy Bridges
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1 Rev.1.11 CMOS 512-bit SERIAL E 2 PROM S-29A The S-29A is a wide operating voltage range, low power consumption 512-bit E 2 PROM. The organization is 64-word 8-bit, and can be read or written serially. It is easily interfaced with a serial port because the instruction is composed of eight-bit units. Features Operating voltage Read : 1.5 to 5.5 V Write : 2.7 to 5.5 V Power consumption Standby : 1 µa max. Read : 1.4 ma max. (V CC =5.5 V).4 ma max. (V CC =1.5 V) Operating Frequency 2 MHz (V CC =4.5 V to 5.5 V) 5 khz (V CC =2.7 V to 4.5 V) 1 khz (V CC =1.5 V to 2.7 V) Memory configuration 512 bits (64-word 8-bit) Byte writing/byte reading Data retention: 1 years Package : 8-pin DIP/SOP SOT-89-5 Bare chip Package y 8-pin DIP (PKG drawing code : DP8-A) y 8-pin SOP PKG drawing code : FE8-A) ysot-89-5 PKG drawing code : UP5-A) Pin Assignment CS GND NC pin DIP/SOP VC C NC SK 5 1 SOT-89-5 Top view : CS 2 : GND 3 : 4 : SK 5 : VCC Data input/output CS Chip select SK Serial clock Vcc Power supply voltage GND Ground ( V) Figure 1 Block Diagram Memory array Address decoder Input/Output buffer Data register CS SK Clock generator Mode decode logic V CC GND Figure 2 Seiko Instruments Inc. 1
2 S-29A Instruction Set Table 1 Instruction Op code Address Data READ (Read data) 1 A 5 to A D 7 to D output PROGRAM (Program) 1 A 5 to A D 7 to D input PEN (Program enable) STRD (Status read) output Absolute Maximum Ratings Table 2 Parameter Symbol Ratings Unit Power supply voltage V CC -.3 to +7. V Input voltage V IN -.3 to V CC +.3 V Output voltage V OUT -.3 to V CC V Storage temperature under bias T bias -5 to +95 C Storage temperature T stg -65 to +15 C Recommended Operating Conditions Table 3 Parameter Symbol Conditions Min. Typ. Max. Unit Power supply voltage V CC Read Write V V High level input voltage V IH V CC =2.7 to 5.5 V V CC =1.5 to 2.7 V.8 V CC. V CC V CC V CC V V Low level input voltage V IL V CC =2.7 to 5.5 V V CC =1.5 to 2.7 V...2 V CC.15 V CC V V Operating temperature T opr -4 + C 2 Seiko Instruments Inc.
3 DC Electrical Characteristics Table 4 CMOS 512-bit SERIAL E 2 PROM S-29A (Ta=-4 C to C) Parameter Smbl Conditions Read/Write operations Read operation Unit Current consumption (READ) Current consumption (PROGRAM) V CC =5. V±1 % V CC =3 V ± 1 % V CC =1.5 to 2.7 V Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. I CC1 DO unloaded ma I CC2 DO unloaded ma Table 5 (Ta=-4 C to C) Parameter Smbl Conditions Read/Write operations Read operation Unit Standby current consumption Input leakage current Output leakage current Low level output voltage High level output voltage V CC =5. V±1 % V CC =2.7 to 4.5 V V CC =1.5 to 2.7 V Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. I SB Input: V CC or GND µa I LI V IN =GND to V CC µa I LO V OUT =GND to V CC µa V OL CMOS I OL =1 µa V V OH TTL I OL =2.1 ma.45 V CMOS V CC =2.7 to 5.5 V: I OH =-1 µa V CC =1.5 to 2.7 V: I OH =-1 µa V CC -.7 V CC -.7 V CC -.3 V TTL, I OH =-4 µa 2.4 V Rewriting Times Table 6 ( Ta=-4 C to + C) Parameter Symbol Min. Typ. Max. Unit Rewriting times N W 1 5 times/word Pin Capacitance Table 7 (Ta=25 C, f=1. MHz, V CC =5 V) Parameter Symbol Conditions Min. Typ. Max. Unit Input capacitance C IN V IN = V 8 pf Input/Output C I/O V I/O = V 1 pf capacitance Seiko Instruments Inc. 3
4 S-29A AC Electrical Characteristics Table 8 Measuring conditions Input voltage level.1 V CC to.9 V CC Output voltage level.5 V CC Output load 1 pf Table 9 (Ta=-4 C to C) Parameter Symbol Read / Write operations Read operations Unit V CC =5. V±1% V CC =2.7 to 4.5 V V CC =1.5 to 2.7 V Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. CS setup time t CSS µs CS hold time t CSH µs CS deselect time t CDS µs Data setup time t DS µs Data hold time t DH µs 1 data output delay t PD µs data output delay t PD µs Clock frequency f SK MHz Clock pulse width t SKH, t SKL µs Output disable time t HZ1, t HZ ns Program time t PR ms CS t CSS t SKH t SKL t CSH t CDS SK (Input) t DS t DH Valid data Valid data (Output) t PD t PD1 Input data is fetched at the rise of SK. Output data is triggered at the fall of SK. Figure 3 Timing chart 4 Seiko Instruments Inc.
5 S-29A Operation (1) Read (READ) mode After changing CS from L to H, this mode inputs the op code and address into, synchronized with the rise of SK. When A is input at the rise of the eighth SK clock cycle, eight-bit data in the specified address is output from the pin, synchronized with the falling of SK. The pin changes to high impedance after CS changes to L. CS t CSS t SKH tskl t CSH SK t DS t DH t PD t HZ2 1 A5 A4 A3 A2 A1 A D7 D6 D5 D4 D3 D2 D1 D t HZ1 Figure 4 (2) Write (PROGRAM) mode After changing CS from L to H, this mode inputs the op code, address, and data (eight -bit) into, synchronized with the rise of SK. After data is input, by changing CS from H to L again, data is written to the chip (the write operation). The write operation time is decided by the timer inside of the IC (1 ms max.). After the write operation, The S-29A is automatically in program disable mode. Therefore, the S-29A must be in program enable mode through executing the PEN instruction before the write operation. For confirming completion of the write operation, check the status read mode described later. CS t CSS t CSH t CDS t SKH t SKL SK t DS t DH 1 A5 A4 A3 A2 A1 A D7 D6 D5 D4 D3 D2 D1 D t PR Figure 5 Seiko Instruments Inc. 5
6 S-29A (3) Program enable (PEN) mode After being in program enable mode through executing the PEN instruction, data can be written (programmed). Before executing a program instruction, the PEN instruction must be executed. After changing CS from L to H, this mode inputs the op code and address H into, synchronized with the rise of SK. When instruction is received at the rise of the eighth SK clock cycle, the S-29A is in program enable mode. CS t CSS tcsh SK t DS tdh Figure 6 (4) Status read (STRD) mode STRD confirms whether or not the write operation has been completed. During the write (Busy) operation, low level is output from, and after completing the write operation (Ready status), high level is output. After changing CS from L to H, this mode inputs the op code and address 3F H into, synchronized with the rise of SK. From the falling edge of the eighth SK clock cycle, the S-29A outputs the write operation status. C t CSS SK t DS t t t HZ2 DH PD t HZ1 Busy Ready Figure 7 Please refer Application Note S-29 & S-93C series EEPROMs Tips, Tricks & Traps for equivalent circuit of each pin. 6 Seiko Instruments Inc.
7 S-29A Ordering Information S-29A XX Package DP : DIP FE : SOP UP : SOT-89-5 CA : Bare chip Product name Note : Each bit is set to 1 before delivery (except bare chip). Seiko Instruments Inc. 7
8 S-29A Characteristics 1. DC characteristics 1.1 Current consumption (READ) I CC1 1.2 Current consumption (READ) I CC1 V CC =5.5V f SK =2 MHz =11 V CC =3.3V f SK =5kHz = I CC1 I CC Current consumption (READ) I CC1 Power supply voltage V CC 1.4 Current consumption (READ) I CC1 Clock frequency f SK Ta=25 C f SK =1 MHz =11 V CC =5.V Ta=25 C I CC1 I CC V CC (V) 1K 1K 1M 2M fsk (Hz) 1.5 Current consumption (PROGRAM) I CC2 I CC V CC =5.5V Continuous PROGRAM mode 1.6 Current consumption (PROGRAM) I CC2 I CC V CC =3.3V Continuous PROGRAM mode 1.7 Current consumption (PROGRAM) I CC2 Power supply voltage V CC I CC Ta=25 C 1.8 Standby current consumption I SB I SB (A) V CC =5.5V V CC (V) 8 Seiko Instruments Inc.
9 S-29A 1.9 Input leakage current I LI 1.1 Input leakage current I LI 1. V CC =5.5V CS, SK, DI=V 1. V CC =5.5V CS, SK, DI=5.5V I LI (µa) I LI (µa) Output leakage current I LO I LO (µa) 1..5 V CC =5.5V DO=V 1.12 Output leakage current I LO I LO (µa) 1..5 V CC =5.5V DO=5.5V 1.13 High level output voltage V OH 1.14 High level output voltage V OH 4.6 V CC =4.5V I OH =-4µA 2.7 V CC =2.7V I OH =-1µA 4.4 V OH (V) 2.6 V OH (V) Low level output voltage V OL 1.16 Low level output voltage V OL.3 V CC =4.5V I OL =2.1mA.3 V CC =1.5V I OL =1µA.2 V OL (V) V OL (V) Seiko Instruments Inc. 9
10 S-29A 1.17 High level output current I OH 1.18 High level output current I OH -5. V CC =4.5V V OH =3.8V -4 V CC =2.7V V OH =2.V I OH -2.5 I OH Low level output current I OL 1.2 Low level output current I OL 2 V CC =4.5V V OL =.45V 1. V CC =1.5V V OL =.1V I OL I OL Input reversal voltage V INV Power supply voltage V CC V INV (V) Ta=25 C CS, SK and DI pins 1.22 Input reversal voltage V INV V INV (V) V CC =5.V CS, SK and DI pins V CC (V) 1 Seiko Instruments Inc.
11 S-29A 2. AC characteristics 2.1 Maximum operating frequency f max Power supply voltage V CC Ta=25 C 2.2 Program time t PR Power supply voltage V CC Ta=25 C f max (Hz) 2M 1M 1K 1K t PR (ms V CC (V) V CC (V) 2.3 Program time t PR 2.4 Program time t PR V CC =5.V V CC =3.V 6 6 t PR (ms) t PR (ms) data output delay time t PD1 t PD1 (µs).3.2 V CC =4.5V data output delay time t PD1 t PD1 (µs).3.2 V CC =2.7V data output delay time t PD t PD (µs).3.2 V CC =4.5V data output delay time t PD t PD (µs).3.2 V CC =2.7V Seiko Instruments Inc. 11
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15 The information described herein is subject to change without notice. Seiko Instruments Inc. is not responsible for any problems caused by circuits or diagrams described herein whose related industrial properties, patents, or other rights belong to third parties. The application circuit examples explain typical applications of the products, and do not guarantee the success of any specific mass-production design. When the products described herein are regulated products subject to the Wassenaar Arrangement or other agreements, they may not be exported without authorization from the appropriate governmental authority. Use of the information described herein for other purposes and/or reproduction or copying without the express permission of Seiko Instruments Inc. is strictly prohibited. The products described herein cannot be used as part of any device or equipment affecting the human body, such as exercise equipment, medical equipment, security systems, gas equipment, or any apparatus installed in airplanes and other vehicles, without prior written permission of Seiko Instruments Inc. Although Seiko Instruments Inc. exerts the greatest possible effort to ensure high quality and reliability, the failure or malfunction of semiconductor products may occur. The user of these products should therefore give thorough consideration to safety design, including redundancy, fire-prevention measures, and malfunction prevention, to prevent any accidents, fires, or community damage that may ensue.
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