Presented at the THIC Meeting at the DoubleTree Hotel Del Mar CA on January 18, /24/00

Similar documents
4D Technology Corporation

Applications of Piezo Actuators for Space Instrument Optical Alignment

Red-Green-Blue wavelength interferometry and TV holography for surface metrology

CoSMoS Starter Guide 1.4 Hoskins Lab Last Modified 03/03/2017 Chris DeCiantis

Refractive Index Map Reconstruction in Optical Deflectometry Using Total-Variation Regularization

Status of IEEE SSSWG and ANSI/AIIM MS71 Standards. Presented at the THIC Meeting at the DoubleTree Hotel Del Mar CA on January 18, 2000

CoSMoS Starter Guide 1.6 Hoskins Lab Last Modified 03/30/2017 Chris DeCiantis

Polarized Downwelling Radiance Distribution Camera System

CCD Image Acquisition Tutorial

Calibration of a portable interferometer for fiber optic connector endface measurements

XC-EU50/EU50CE. Dimensions. Outline. Features HD VD. C Lens Mount B/W VIDEO CAMERA MODULE. 1/2 Type CCD. VS Output 44 XC-EU50/EU50CE.

AIRPHEN. The Multispectral camera from HIPHEN

Dimensions. Outline. Features. Accessories. HD VD External Sync. C Lens Mount. BLACK-and-WHITE VIDEO CAMERA MODULE XC-EU50/EU50CE.

Polarized Downwelling Radiance Distribution Camera System

Draft SPOTS Standard Part III (7)

CHAPTER 2: THREE DIMENSIONAL TOPOGRAPHICAL MAPPING SYSTEM. Target Object

195 mm Focal Length, nm, Echelle Spectrograph. Specifications. Wavelength range (nm) Focal length (mm) 195.

DDRO: A Novel Performance Monitoring Methodology Based on Design-Dependent Ring Oscillators

TRiCAM APPLICATIONS KEY FEATURES. Time Resolved intensified CAMera. TRiCAM 13001A01 31/10/2013

Available online at ScienceDirect. Procedia Engineering 79 (2014 )

Using Python with Smoke and JWST Mirrors. Warren Hack, Perry Greenfield, Babak Saif, Bente Eegholm Space Telescope Science Institute

Diffraction-based approaches to the in-situ measurement of dimensional variations in components produced by thermoplastic micro- and nano-embossing

Council for Optical Radiation Measurements (CORM) 2016 Annual Technical Conference May 15 18, 2016, Gaithersburg, MD

WinCamD-LCM 1" CMOS Beam Profiling Camera, SuperSpeed USB 3.0, * nm * model-dependent

DYNAMIC ELECTRONIC SPECKLE PATTERN INTERFEROMETRY IN APPLICATION TO MEASURE OUT-OF-PLANE DISPLACEMENT

White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting

University of Huddersfield Repository

. Ideal for fast, shutterless imaging

SIMULATION AND VISUALIZATION IN THE EDUCATION OF COHERENT OPTICS

Characterization of MEMS Devices

Hyperspectral interferometry for single-shot absolute measurement of 3-D shape and displacement fields

Intellex Digital Video Management System. Quick Reference Guide

High Dynamic Range Images

SPECTROMETERS USER MANUAL. Ver. 1.2_09/16. Making spectroscopy brighter

What is Frequency Domain Analysis?

Interference. Electric fields from two different sources at a single location add together. The same is true for magnetic fields at a single location.

CCD Acquisition Function

LSM 5 MP, LSM 510 and LSM 510 META Laser Scanning Microscopes

Leica TCS SPE. Spectacular Imaging! Technical Documentation

Sensor based adaptive laser micromachining using ultrashort pulse lasers for zero-failure manufacturing

DURIP: A Low-Light Photon-Calibrated High-Resolution Digital Camera Imaging System

Nanorelief measurements errors for a white-light interferometer with chromatic aberrations

Information page for written examinations at Linköping University TER2

PyLoN: Applications: Astronomy, Chemiluminescence, Bioluminescence, Phosphor Imaging, Ultra-low light Imaging and Spectroscopy.

Analysis and Suppression of Image Sensor Nonuniformities

More Precision. optocontrol // Optical precision micrometers

SOFTWARE FOR THE ESO NEW GENERAL DETECTOR CONTROLLER

DV887 (back illuminated)

A New Approach to Network Servers: Bridging the Gap Between Tape and Disk

FACE RECOGNITION USING INDEPENDENT COMPONENT

Update on S3 SYN-VGT algorithm status PROBA-V QWG 4 24/11/2016

CCD Black-and-White Video Camera Module

Easy integration into complex experimental setup

HIE ISOLDE ALIGNMENT AND MONITORING SYSTEM TECHNICAL DESIGN AND PROJECT STATUS

Problem Solving 10: Double-Slit Interference

Extreme Ultraviolet Phase Contrast Imaging

Visual Learning with Explicit and Implicit Manifolds

WORCESTER POLYTECHNIC INSTITUTE

Supplementary Information for. Distinguishing time-delayed causal interactions using convergent cross mapping

Vorstellung von LS-OPT Version 5

QT-Brightek PLCC Series PLCC4 RGB LED

Fiber Probe with Interferometric Z-Measurement

Metrology Tools for Flexible Electronics and Display Substrates. Min Yang

1 Laboratory #4: Division-of-Wavefront Interference

CinCam CCD - Technical Data -

DETECTION AND QUANTIFICATION OF CRACKS IN PRESSURE VESSELS USING ESPI AND FEA MODELLS

LIFA. SPECIFICATIONs. Fluorescence Lifetime Attachment LIFA14001A02 25/02/2014

Agenda. DLP 3D scanning Introduction DLP 3D scanning SDK Introduction Advance features for existing SDK

Minimizes reflection losses from UV - IR; Optional AR coatings & wedge windows are available.

Analysis of Different Reference Plane Setups for the Calibration of a Mobile Laser Scanning System

Advances in Disk Metrology

Parallel two-step spatial carrier phase-shifting common-path interferometer with a Ronchi grating outside the Fourier plane

Operational process interferometric for the generation of a digital model of ground Applied to the couple of images ERS-1 ERS-2 to the area of Algiers

Scintillators for SwissFEL

40 and 100 Gigabit Ethernet Consortium Clause 86 40GBASE-SR4 and 100GBASE-SR10 PMD Test Suite v0.1 Technical Document

Frequently Asked Questions: excelon Back Illuminated CCD/EMCCD Cameras

DEVELOPMENT OF CAMERA MODEL AND GEOMETRIC CALIBRATION/VALIDATION OF XSAT IRIS IMAGERY

0.8mm Height Flat Top Phototransistor

Shock Tube Richtmyer-Meshkov Experiments: Inverse Chevron and Half Height

ProEM -HS:1024BX3 FEATURES BENEFITS

Model 3955 DFB 1550nm Laser in TO-can

TABLE OF CONTENTS PRODUCT DESCRIPTION CINCAM CCD TECHNICAL DATA SENSOR RESPONSE DIMENSIONS CINCAM CCD LARGE FORMAT TECHNICAL DATA SENSOR RESPONSE

REMOTE SENSING OF SURFACE STRUCTURES

Reflectance & Lighting

Formulas of possible interest

Biological Image Information I: A Description of the Modalities

Product Specifications

Particle Imaging Diagnostics

3D OPTICAL PROFILER MODEL 7503

IMPROVEMENT OF SCREEN MONITOR WITH SUPPRESSION OF COHERENT-OTR FOR SACLA

20 MHz/16-bit readout 61 fps rate at full-frame resolution. Use ROI/binning for hundreds of frames per second.

DINSAR: Differential SAR Interferometry

430g Dimensions. 102mm x 84mm x 59mm Detector nm Pixels 3648 Pixel size. 8μm x 200μm Pixel well depth

Achieving One Terabyte per Cartridge by breaking the tape areal density barrier

Wide Guy: Inverted Widefield Microscope

Lecture 39. Chapter 37 Diffraction

Inspection system for microelectronics BGA package using wavelength scanning interferometry

User s Manual DAGE-MTI. IR-1000 IR CCD Camera

High-speed, high-accuracy 3D shape measurement based on binary color fringe defocused projection

CCD Black-and-White Video Camera Module

Transcription:

Simultaneous 5-wavelength Interferometry for Head/Media Spacing Measurement Jiasheng Zhu and Prof. F. E. Talke Center for Magnetic Recording Research University of California at San Diego 9500 Gilman Drive, La Jolla CA 92093-0401 Phone: +1-858-534-3646, FAX: +1-858-534-2720 E-mail: ftalke@ucsd.edu 1/24/00 Presented at the THIC Meeting at the DoubleTree Hotel Del Mar CA 92130-2539 2539 on January 18, 2000

Simultaneous 5-wavelength Interferometry for Head/Media Spacing Measurement Jiasheng Zhu and Prof. F. E. Talke Center for Magnetic Recording Research UC, San Diego

Outline Motivation Implementation of simultaneous 5-wavelength interferometry Spacing measurement in a tape drive Tape asperity compliance measurement Comparison between 3- and 5-wavelength interferometry Summary

Motivation Measurement reliability can be further improved by using more than 3 wavelengths Simultaneous measurement is required to measure the spacing in a tape drive

5-wavelength interferometry Monte Carlo Error Analysis: 5 vs. 3-wavelength3 All units in nm. Spacing: 35 nm Spacing: 50 nm Spacing: 80 nm Technique Mean Std. Dev. Mean Std. Dev. Mean Std. Dev. 3-wavelength 35.0 1.6 50.0 1.5 80.0 2.3 5-wavelength 35.0 1.2 50.0 1.2 80.0 1.9

Two-step sequential 5-wavelength interferometry Sequential measurement--- asperity compliance Synchronized by video frame frequency Data Acquisition PC Data Acq. PC RG T G B Parallel Out Trigger Circuit Red light 650 nm Blue light 480 nm Green light 535 nm Red light 620 nm Blue light 450 nm R G B 3-CCD Camera Head/Tape Interface Video Out Video Monitor Data acq.. in 2 steps Switch wavelengths manually: (a) 650, 535, 480 nm (b) 620, 535, 450 nm

Simultaneous 5-wavelength interferometry 2 possible choices for simultaneous measurement : One 3-CCD 3 camera Two 3-CCD 3 cameras data acq.. must be done in 2 steps (With a switching of wavelengths) w difficult to align the two cameras (No switching of wavelengths)

Simultaneous 5-wavelength interferometry Data acquisition using 3CCD camera Odd Field 1 Video Frame (1 image) + Vertical interval (1.3 ms) Even Field Sequential acquisition Simultaneous acquisition 1 Frame 1 Frame Odd Field Even Field Image 1 (650,480,535) Manual switching (1 min.) Image 2 (620,450,535) Image 1 (650,480,535) Shutter switching (1.3 ms) Image 2 (620,450,535)

Simultaneous 5-wavelength interferometry 5-wavelength measurement 3-wavelength 3 measurement Synchronized by video field frequency Data Acq. Acquisition PC PC R T G B Parallel Out Trigger Circuit Red light 620 nm Green light 535 nm Blue light 450 nm Red light 650 nm Green light 550 nm R G B 3-CCD Camera Head/Tape Interface Video Out Video Out Video Monitor Data acq. to 5 wavelengths is done in 1.3 ms Image 1 650,480,535 1.3 ms Image 2 620,450,535

Simultaneous 5-wavelength interferometry Physical setup Computer 3CCD camera Camera controller Triggering circuit Light sources Microscope Shutters Tape drive 5-in-1 fiber cable

Spacing measurement on DLT4000 tape drive Unloading Device 4π I h = A + B cos( λ φ) Loading/Unloading rod

Spacing measurement on DLT4000 tape drive Envelope calibration (a) Moving fringe pattern I 4πh = A + B cos( λ φ) (b) Envelope extract Upper envelope 535 nm Lower envelope Fringe moving direction

Spacing measurement on DLT4000 tape drive Envelope check (a) A selected contact zone I 4πh = A + B cos( λ φ) (b) Envelope check for 535 nm Upper envelope 535 nm Lower envelope Odd field(620,535,450 nm)

Spacing measurement on DLT4000 tape drive Spacing map of a contact zone

Tape asperity measurement Application in asperity compliance measurement 60 Asperity compliance of DLT4 tape 50 Spacing (nm) 40 30 20 3 2 1 4 DLT4 tape 10 0 0 1 2 3 4 5 Contact pressure (kpa)

Precision comparison Spacing measurement on DLT4000 drive Standard deviation in 10 measurements (spacing is averaged over 200x200 pixels) Mean spacing (nm) Std. Deviation(nm) 3-wavelength 5-wavelength 25.9 ± 29.9 ± 0.8 0.6 0.3 0.2 Robustness: 5-wavelength > 3-wavelength3

Precision comparison Asperity compliance measurement Standard deviation of spacing in 10 measurements (spacing is averaged over 200x200 pixels) Pressure: 9 psi Mean spacing (nm) Std. Deviation(nm) 3-wavelength 5-wavelength 36.9 ± 37.7 ± 3.7 2.3 1.0 0.6 Robustness: 5-wavelength > 3-wavelength3

Summary Implemented simultaneous 5 wavelength interferometry Measurement accuracy is better with 5 wavelengths than with 3 wavelengths