MicraGEM-Si A flexible process platform for complex MEMS devices

Similar documents
ksa MOS Ultra-Scan Performance Test Data

9 rue Alfred Kastler - BP Nantes Cedex 3 - France Phone : +33 (0) website :

LITHOGRAPHY CHALLENGES FOR LEADING EDGE 3D PACKAGING APPLICATIONS

Quilt Packaging Microchip Interconnect Technology

SILICON-ON-INSULATOR (SOI) technology-based

3D Process Modeling - A Novel and Efficient Tool for MEMS Foundry Design Support

Applications, Processing and Integration Options for High Dielectric Constant Multi-Layer Thin-Film Barium Strontium Titanate (BST) Capacitors

21 rue La Nouë Bras de Fer Nantes - France Phone : +33 (0) website :

TES Detectors (and SQUID Muxes) at NIST

Case Studies of All-Surface Inspection in a 3DI-TSV R&D Environment. Rolf Shervey Sr. Applications Engineer Rudolph Technologies, Inc.

Comparison of Singulation Techniques

AUTOFOCUS SENSORS & MICROSCOPY AUTOMATION IR LASER SCANNING CONFOCAL MICROSCOPE IRLC DEEP SEE. Now See Deeper than ever before

CLEAN ROOM TECHNOLOGY

3D SYSTEM INTEGRATION TECHNOLOGY CHOICES AND CHALLENGE ERIC BEYNE, ANTONIO LA MANNA

Bringing 3D Integration to Packaging Mainstream

TLS-Dicing for concentrator dies - a fast and clean technology. Hans-Ulrich Zühlke

MEMS PACKAGES AND MOUNTS GUIDE

9 rue Alfred Kastler - BP Nantes Cedex 3 - France Phone : +33 (0) website :

Physical Design Implementation for 3D IC Methodology and Tools. Dave Noice Vassilios Gerousis

Solidus Technologies, Inc. STI White Paper: AN092309R1

OPTICAL TECHNOLOGIES FOR TSV INSPECTION Arun A. Aiyer, Frontier Semiconductor 2127 Ringwood Ave, San Jose, California 95131

Quilt Packaging For Power Electronics

SMAFTI Package Technology Features Wide-Band and Large-Capacity Memory

Victory Process. Full Physical 3D Semiconductor Simulator Etching and Deposition Simulation

Micron Level Placement Accuracy for Wafer Scale Packaging of P-Side Down Lasers in Optoelectronic Products

EMPIR Grant Agreement 14IND07 3D Stack

SILICON PHOTONICS WAVEGUIDE AND ITS FIBER INTERCONNECT TECHNOLOGY. Jeong Hwan Song

Speed, Accuracy and Automation in MEMS Simulation and Development C. J. Welham, Coventor, Paris

USABILITY OF CERAMIC STRUCTURES FOR POSITIONING OF OPTICAL MICRO ELEMENTS

3D systems-on-chip. A clever partitioning of circuits to improve area, cost, power and performance. The 3D technology landscape

Discover 3D measurements for flexible electronics: a metrology masterclass

Embedded UTCP interposers for miniature smart sensors

Polymer Micro-Optics for Today s Compact Photonic Devices

MEMS SENSOR FOR MEMS METROLOGY

Magnetically actuated microshutter arrays

반도체공정 - 김원정. Lattice constant (Å)

ULTRA-THIN DOUBLE LAYER METROLOGY WITH HIGH LATERAL RESOLUTION. Semicon West 2018, Bernd Srocka

AT&S Company. Presentation. 3D Component Packaging. in Organic Substrate. Embedded Component. Mark Beesley IPC Apex 2012, San Diego.

Packaging and Integration Technologies for Silicon Photonics. Dr. Peter O Brien, Tyndall National Institute, Ireland.

2-DOF Actuated Micromirror Designed for Large DC Deflection

Bulk MEMS Layout 2017 Dr. Lynn Fuller, Casey Gonta, Patsy Cadareanu Webpage:

Scanning Acoustic Microscopy For Metrology of 3D Interconnect Bonded Wafers

Electromagnetic Tip-tilt Mirror

37 (19) - channel micromachined deformable mirror system: typical technical passport

Sony ICX098BL ¼ Inch Optical Format 5.6 µm Pixel Size CCD Image Sensor

Piezoelectric Tip-tilt Mirror

Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing. SEMATECH Workshop on 3D Interconnect Metrology

Comparison & highlight on the last 3D TSV technologies trends Romain Fraux

EECS 598: Integrating Emerging Technologies with Computer Architecture. Lecture 10: Three-Dimensional (3D) Integration

Assembly of thin gratings for soft x-ray telescopes

Thin n-in-p planar pixel modules for the ATLAS upgrade at HL-LHC

FABRICATION OF CMOS INTEGRATED CIRCUITS. Dr. Mohammed M. Farag

Package (1C) Young Won Lim 3/20/13

CHAPTER 4 DESIGN AND MODELING OF CANTILEVER BASED ELECTROSTATICALLY ACTUATED MICROGRIPPER WITH IMPROVED PERFORMANCE

Defect Repair for EUVL Mask Blanks

Influence of Geometrical Configuration of Cantilever Structure on Sensitivity of MEMS Resonant Sensors

From 3D Toolbox to 3D Integration: Examples of Successful 3D Applicative Demonstrators N.Sillon. CEA. All rights reserved

Optic fiber cores. mirror. fiber radius. centerline FMF. FMF distance. mirror tilt vs. necessary angular precision (fiber radius = 2 microns) 1.

Luxtera PN Silicon CMOS Photonic Chip Freescale 130 nm SOI CMOS Process

edram to the Rescue Why edram 1/3 Area 1/5 Power SER 2-3 Fit/Mbit vs 2k-5k for SRAM Smaller is faster What s Next?

2D nano PrintArray Product Data Sheet

Ultra-thin Capacitors for Enabling Miniaturized IoT Applications

ION BEAM MILLING SYSTEM FOR TEM, SEM AND LM PREPARATION. Leica EM RES102

The Cornerstone Project:

Bringing Patterned Media to Production with Value Added Metrology

Hand book for use of library : Start_cmiV4

Package (1C) Young Won Lim 3/13/13

Effective 3-D Process Modeling and Parameters Determination on Double Exposure in Deep X-ray Lithography

OPTIMIZATION OF THROUGH SI VIA LAST LITHOGRAPHY FOR 3D PACKAGING

Advanced modelling of gratings in VirtualLab software. Site Zhang, development engineer Lignt Trans

OPTI510R: Photonics. Khanh Kieu College of Optical Sciences, University of Arizona Meinel building R.626

3D technology evolution to smart interposer and high density 3D ICs

Beyond Chip Stacking---Quilt Packaging Enabled 3D Systems

UBCx Phot1x: Silicon Photonics Design, Fabrication and Data Analysis

Laser Micro-Fabricator. Innovative Laser Technology KORTherm Science

ELASTOMERIC CONNECTORS. the smart solution for high-volume interconnections in compact design

Development of innovative ALD materials for high density 3D integrated capacitors

Non-destructive, High-resolution Fault Imaging for Package Failure Analysis. with 3D X-ray Microscopy. Application Note

Epigap FAQs Part packges and form factors typical LED packages

Photoresist with Ultrasonic Atomization Allows for High-Aspect-Ratio Photolithography under Atmospheric Conditions

Advanced SAW Filter Technology

Maximum Clamping Voltage 8x20μs I/O to pin 2. Typical TLP Clamping Voltage (Note 1) I/O to GND I/O to I/O V RWM V I PP V I PP

MEMS Deformable Mirror Actuators with Enhanced Reliability

CMOS compatible highly efficient grating couplers with a stair-step blaze profile

Increased Yield and Reliability of Packaged MEMS Resonator Devices. Carl Arft, Ph.D. Director of Test Dev. Engineering MEPTEC 2011

MEMS Pro v5.1 Layout Tutorial Physical Design Mask complexity

March 15-18, 2015 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive Session 4

AIR FORCE INSTITUTE OF TECHNOLOGY

Supplementary Materials for Superhydrophobic turbulent drag reduction as a function of surface grating parameters

Sony ICX098BL ¼ Inch Optical Format 5.6 µm Pixel Size CCD Image Sensor

OPTI510R: Photonics. Khanh Kieu College of Optical Sciences, University of Arizona Meinel building R.626

Optimization of Photolithography Process Using Simulation

MPI TS2500-RF 200 mm Fully Automated Probe System For RF Production Test Measurements

Doug Schramm a, Dale Bowles a, Martin Mastovich b, Paul C. Knutrud b, Anastasia Tyurina b ABSTRACT 1. INTRODUCTION

Stress Reduction during Silicon Thinning Using Thermal Relaxation and 3D Curvature Correction Techniques

Schematic creation of MOS field effect transistor.

A U T O C O L L I M A T O R S

Optical Topography Measurement of Patterned Wafers

Mobility and Miniaturization 3D WLI Microscopes Address Key Metrology Needs

Ultrasonic Laserbonder M17

Transcription:

MicraGEM-Si A flexible process platform for complex MEMS devices By Dean Spicer, Jared Crawford, Collin Twanow, and Nick Wakefield

Introduction MicraGEM-Si is a process platform for MEMS prototyping and research offered by Micralyne Inc. This technology is a silicon-on-insulator (SOI) based MEMS process for academic and industrial users to develop devices such as micro mirrors, optical switches, resonators, inertial and bio sensors. The technology offers: Two thick SOI structure layers with up to three functional levels of silicon thickness on the Base device layer. The Top device layer has a silicon etch in the back side as well as a release etch from the top side. Deep etch features in the Base and the release etch in the Top device layer are aligned to better than 0.4 µm. This capability enables structures like vertical comb drive actuators. Base and Top device layers are electrically connected through the bond interface, allowing 3D routing of electrical signals. Patterned low-stress gold metallization on the top surface is suited for highly reflective mirrors and contact pads for gold wire bonding. Micralyne has partnered with CMC Microsystems to make this process available to companies and researchers as part of a Multi-Product Wafer program. This allows customers to purchase a portion of a MEMS fabrication run based on a 4 mm x 4 mm die size. Upon completion of the fabrication run, each client will receive a quantity of individual or packaged die. Larger die sizes are available by request (4 x 8 mm, 8 x 8 mm). CMC Microsystems provides the front end sales, delivery of the design kit, including a design rule checker, and the consolidation of designs for Micralyne to build. For design kit details and ordering visit: https://www.cmc.ca/micragem-si MicraGEM-Si Platform Description The process platform includes a powerful combination of established MEMS technologies. The Engineering team at Micralyne has leveraged its extensive experience in developing bulk machined MEMS devices to create a standard platform designed to enable a wide variety of MEMS structures. Key processes within the platform include high aspect ratio Deep Reactive Ion Etch (DRIE), aligned wafer to wafer bonding, non-contact stepper photolithography, and low stress mirror metallization. Stepper lithography provides non-contact exposures with excellent repeatability, consistency, alignment accuracy, throughput, and quality. Micralyne has demonstrated that silicon fingers in a precisely aligned staggered pattern can be maintained when using 3D wafer stacking. With thoughtful process design, out-of-plane features can be aligned to within 0.4 µm overlay tolerance. Figure 1: Vertical comb drive actuator

This process flow can used to create a vertical comb drive actuator, which is an important structure in the fabrication of advanced optical MEMS (Figure 1). The comb drive actuator provides nearly linear tilt response to the applied voltage at high angles. A well designed comb drive actuator can also significantly reduce the voltage requirement to achieve maximum tilt. MIcraGEM-Si Fabrication Flow Step 1: Define Trench 1, Trench 2 and Trench 3 on Base Wafer The device layer thickness of the Base wafer is 50 µm. The regions defined as Trench 1 are etched to a final depth of 50 µm (all the way through the device layer). Trench 2 regions are etched to a final depth of 35 µm, leaving a 15 µm high section of silicon sitting on the buried oxide of the Base SOI. Trench 3 regions are etched to a final depth of 10 µm, leaving a silicon region with a height of 40 µm sitting on the Base SOI. With these three regions, many complex 3D silicon structures can be created including cavities, electrodes and wires for electrical routing, as well as lower combs for vertical comb drive actuators. Step 2: Define and Etch Top SOI Wafer Backside The Top SOI wafer is patterned and etched to a depth of 20 µm. Once the Top SOI wafer is bonded and the handle wafer is removed, this will leave a suspended region of silicon with a 10 µm thickness. Step 3: Bond Base Wafer to Top Wafer Once the Base Wafer and Top wafer have completed the DRIE etch processes, the wafers are aligned and fusion bonded in a controlled environment. The accuracy of the wafer alignment after the completed fusion bond is +/-10 µm. Step 4: Remove Top SOI Handle and Buried Oxide After fusion bond, the handle of the Top wafer is removed with a grind and polish process. The buried oxide of the Top wafer is also removed leaving a pristine optically flat silicon surface.

Step 5: Deposit and Define Metal The Top device layer is blanket coated with a low stress TiW/Au metallization. This is then patterned to form device elements such as electrodes, bond pads, and highly reflective surfaces. Step 6: Release Pattern and Etching The final DRIE process etches completely through the Top device layer and releases the MEMS structures. Step 7: Singulation The dicing process is done with a laser which enables singulation without Figure 2: damaging the released MEMS devices. MicraGEM-Si Process Example Variable Optical Attenuator (VOA) MEMS Chip The MicraGEM-Si platform is ideal for fabricating simple uni-directional (1D) tilting optical devices (Figure 3). These can be configured for use in variable optical attenuators (VOA) and low port count wavelength selective switch (WSS) modules. With the MicraGEM-Si platform you can create arrays of mirrors driven by vertical comb drives. The result is an array of mirrors requiring low actuation voltage and linear voltage-theta curve within its designed operating range (Figure 4). Figure 3: SEM Micrograph of the VOA Chip demo device

Mirror Tilt (Degrees) 0.7 Variable Optical Attenuator - Demo Design Circular mirror with one axis of tilt using vertical comb drive actuator 0.6 0.5 0.4 0.3 0.2 0.1 0 0 1 2 3 4 5 6 7 Applied Voltage (Volts) Figure 4: MEMS for VOA - Mirror tilt response to an applied voltage The demonstration MEMS chip was designed to meet specific parameters for low voltage. Theoretically, a 1 mm diameter mirror can have a tilt of up to 4 degrees if voltage is not constrained. This platform is suitable for deflection of a mirror flat towards the Base wafer. Horizontal comb drives can also be created for use in inertial sensors. The creativity of the designers will also provide unlimited possibilities for structures, devices, and applications. Summary Micralyne has presented a process platform that provides the benefits of a vertical comb drive and other key MEMS structures, in an elegant and highly manufacturable format. Devices designed with MicraGEM-Si will be able to quickly ramp in to volume production.

MicraGEM-Si TM Wafer