Introduction to. 3D Scanning Confocal Microscope with Spectrometer

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Introduction to Nanofinder-S 3D Scanning Confocal Microscope with Spectrometer Alexei Kuzmin E-mail: a.kuzmin@cfi.lu.lv

Principle of Confocal Microscopy Laser X-Y Excitation Pinhole Excitation Filter Objective Z Emission Pinhole Detector (PMT) Emission Filter 3D Sample A type of light microscopy in which a point of illumination is projected or rastered over a specimen, and the reflected illumination is screened through an exit aperture in order to eliminate light from out-of-focus planes.

Nanofinder-S Before Now

Nanofinder-S www.solartii.com Simultaneous / Multifunctional Analysis: Optical and Confocal Microscopy Raman Measurements Luminescence Measurements 0D, 1D, 2D & 3D High-speed Imaging and Spectroscopy

Main components: 1. Inverted microscope (bandpass 400-850 nm) 2. CCD for microscope 3. Laser confocal microscope unit with photomultiplier tube (PMT) 4. Scanning unit with galvanometer mirror scanners (X and Y) 5. Opticomechanical unit 6. Monochromator-spectrograph 7. CCD for spectrograph 8. PMT for spectrograph 9. Reference PMT 10. Laser He-Cd: 441.6 nm, 70 mw (up to 3 lasers possible) 11. Computer and electronics

Nanofinder-S modular optical layout

Inverted Nikon ECLIPSE TE2000-S microscope Works in Reflection & Transmission High-performance Objectives Plan Fluor 10X/0.30 Plan Fluor 40X/0.75 CF Plan Apo 100X/0.95 Coupled with color CCD camera Kappa DX 20 H SONY ICX 285 CCD Sensor 2/3" Interline, Progressive Scan 1384 x 1032 pixel 0.0016 Lux at 10 sec integration 12 bit digital Signal-to-noise ratio 63 db 10x 40x 100x Video Image size (µm) 890 660 222 165 89 66 Confocal Image size (µm) 1100 1320 275 330 110 132

SCANNING UNITS 1. Scanning unit with galvanometer mirror scanners (X and Y) 110 μm 132 µm (with 100x objective) spacial optical resolution 200 nm 2. Piezo-scanner (Z) 0-80 µm (with 100x objective) spacial optical resolution 500 nm

OPTICOMECHANICAL UNIT (OMU) Optimized optics: 400-850 nm Polarizers: Glan-Taylor prism (excitation and detection channels) Zoom beam expander: magnification factor 1.8-7.2 Edge filters positioner: three-position Interference filters positioner: six-position Confocal pinhole: variable from 0 to 1.5 mm Laser beam attenuator: t VND filter

MONOCHROMATOR-SPECTROGRAPH MS5004i Configuration: Focal length: Ports: Flat field: Grating mounts: vertical 520 mm 1 input, 2 output (CCD & PMT) 28 mm x 10 mm 4-position turret Spatial resolution: 0.008 µm Slit control: 0-2.0 mm, step size 0.5 mm

MONOCHROMATOR-SPECTROGRAPH MS5004i Gratings (grooves/mm): 150 600 1800 75 Blaze wavelength (nm): 500 500 500 Echelle Dispersion (nm/mm): 12.7 3.17 0.94 0.149 0.504 Spectral resolution (nm): 0.24 0.06 0.02 0.0052 0.0176 Wavelength accuracy (±nm): 0.32 0.12 0.04 0.013 0.047 Wavelength repeatability (±nm): 0.089089 0.022022 0.007007 0.00160016

Digital Slow Scan CCD Camera PROSCAN HS-101H for spectrograph Ahigh sensitive back-thinned CCD sensor 1024 58 pixels Spectral response range from 200 nm to 1100 nm Pixel size 24 x 24 µm Digitalization rate up to 1 MHz ADC 14 bit, correlative double sampling Peltier cooling with thermo stabilization & water cooling 10/100 Ethernet data transfer

3 PHOTOMULTIPLIER TUBES (PMT) PMT for laser confocal microscope PMT for spectrograph Reference PMT Hamamatsu R928 Wide Spectral Response High Cathode Sensitivity Luminous Radiant at 400nm 185 to 900 nm 250 A/lm 74 ma/w High Anode Sensitivity (at 1000V) Luminous 2500 A/lm Radiant at 400nm 7.4 10 5 A/W Low Drift and Hysteresis

LASER COMPUTER / ELECTRONICS He-Cd 441.6 nm, 70 mw Pentium IV 3GHz, 1GB RAM, 3D Video card with 128 MB RAM,...

For more information please contact: SOLAR TII, LTD 15/2, Akademicheskaya str., Minsk 220072, Republic of Belarus Tel: +375 (17) 284 02 00 Fax: +375 (17) 284 06 38 E-mail: laser@it.org.by Internet: www.solartii.com

EXAMPLES OF APPLICATIONS Imaging of Silicon Gratings for Scanning Probe Microscopy calibration 3D Confocal Microscopy optical tomography Optical Lithography information storage 2D Confocal Imaging and Raman Spectroscopy chemical phase mapping

Calibrating Silicon Gratings for Scanning Probe Microscope 1.5 µm TGG1: image size 36.8 34.8 µm TGQ1: image size 27.0 34.5 µm

3D Confocal Microscopy Atmospheric pressure chemical vapour deposition (APCVD) of ZnO microcrystals on Si substrate 3D confocal images: 110 x 132 x 30 µm 2D optical image

Imaging and Raman Spectroscopy of ZnO needles 2E 1L Raman in ntensity E 2 E 1L ZnO powder Point 3 Point 2 c-si Point 1 500 1000 1500 2000 Wave number (cm -1 ) Point 2 Point 3 Point 1 29 µm 29 µm

Materials for Optical Information Storage Video mode: transmission ZnO x thin film Confocal mode: volume Confocal mode: surface

Optical Data Storage CD-ROM CD-R CD-RW Track pitch = 1.6 μm Track pitch = 1.6 μm Images size: 20 24 μm

a-wo 3 cryst-wo 3 phase transition under laser irradiation an inten nsity (arb b. units) Ram thin film WO 3 /glass cryst-wo 3 a-wo 3 400 600 800 1000 1200 1400 1600 Wave number (cm -1 ) Objective 40 ; laser power: 70 mw for writing, 12 mw for reading; detection ti by CCD.

Confocal Imaging and Raman Spectroscopy CdWO 4 : video mode 66 89 µm Confocal mode: 110 132 132 µm Raman intensity (a a.u.) single-crystal CdWO 4 polycrystalline t.f.-niwo 4 441.6 nm excitation by He-Cd laser 200 400 600 800 1000 Wave number (cm -1 ) Confocal mode: 11 13 µm

2D Chemical Phase Mapping in Oxide Films man intensity (a a.u.) Ra 300 Si 200 100 IrO x Si 0 200 400 600 800 1000 1200 1400 Wave number (cm -1 ) 3D confocal mode: 110 132 µm IrO x Si 2D confocal mode: 110 132 µm Raman mapping at 520 cm -1

2D Chemical Phase Mapping in Oxide Films Rama an intensity (a a.u.) 150 100 50 A 511: TaO x :ReO y B 0 200 400 600 800 1000 1200 1400 1600 Wave number (cm -1 ) 3D confocal mode: 110 132 µm A B 2D confocal mode: 110 132 µm Raman mapping at 750 cm -1 Raman mapping at 1350 cm -1

2D Confocal Imaging and Raman Spectroscopy of Films 40x sity (a.u.) Raman inten 500 Si-Si Re-O Mixed thin film TaO x :ReO y /Si 400 300 200 100 0 200 400 600 800 1000 1200 1400 1600 Wave number (cm -1 ) 40x

Institute of Solid State Physics, University of Latvia NiO/MgO NiO/MgO irradiated by neutrons Ni0.98Co0.02O/MgO NiO powder 2-magnons 2 Raman intensity (a.u.) Confocal m C mode: 275 x 330 µm Confocal Imaging and Raman Spectroscopy of Magnons in Antiferromagnetic Compounds NiO foil NiO irradiated NiO O foil f NiO Ni0.98Co0.02O NiO powder 500 1000 1500 2000-1 Wave number (cm ) 2500 nano-nio

2D Confocal Imaging and Raman Spectroscopy of Glasses ) Raman inte ensity (a.u. 800 600 400 200 0 Microscope slide 400 800 1200 1600 2000 Wave number (cm -1 ) Confocal mode: 275 330 µm

2D&3DI Imaging of ftechnological lprocess 100 100 ZnO Gold contacts on silicon 40 3D nsity (a.u.) Raman inte 1200 900 600 300 E 2 (high) A 1 (TO) E 1 (LO) 2E 1 (LO) Contacts after heat treatment at 700 C and ZnO deposition 133 110 26 µm ZnO column 0 200 400 600 800 1000 1200 1400 Wave number (cm -1 )

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