APPLICATION NOTE. AT04470: Differences between SAM D21 Variants A, B, and L. 32-bit Microcontroller. Introduction

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APPLICATION NOTE AT04470: Differences between SAM D21 Variants A, B, and L 32-bit Microcontroller Introduction This application note describes the differences between A, B, and L variants of SAM D21 devices. For more detailed information, refer to the device datasheet of particular SAM D21 variant. The A and B variants are general purpose mass market product devices and the L variant is target at lighting, motor control, and other applications that need the additional timers and AC in 32 and 48 pin packages. The first section of the application note lists the differences between variant A and variant B of SAM D21 devices. The second section list the difference of A/B variants with L variant of SAM D21 devices. Each section describes the added/removed features for the peripherals. It also highlights the new device packages and new pin functionalities.

1 Differences between SAM D21 A and B Variants This chapter describe how Atmel SAM D21 B variants differ from Atmel SAM D21 A variant and what are the additional features that have been added in Atmel SAM D21 B variant. 1.1 Pin Functionality Differences There are no pinout changes from Atmel SAM D21 A variant to Atmel SAM D21 B variant. 1.2 Peripheral Differences This section summarizes the enhancements or added features in Atmel SAM D21 B variant compared to Atmel SAM D21 A variant. The B variant devices are binary compatible with A variant devices if the application does not use the additional features of B variant. 1.2.1 Internal High-speed Flash with Read-While-Write (RWW) The non-volatile memory of the SAM D21 B variant features a Read-While-Write EEPROM Emulation (RWWEE) section. This section is intended for EEPROM emulation and can be programmed at the same time as reading the main array. This is a separate array intended for the RWW EEPROM emulation, and can be programmed while reading the main array. Figure 1-1 NVM Memory Organization shows the organization of the non-volatile memory of the SAM D21 B variant. The EEPROM emulation space is memory mapped in the same way as the main array. For the SAM D21 B variant devices, the RWWEE address space is located at NVM Base Address + 0x000100000. Figure 1-1. NVM Memory Organization NVM Base Address + 0x00800000 NVM Base Address + 0x00010000 NVM Base Address + NVM Size NVM Base Address In legacy implementations of the NVM controller, the EEPROM emulation area was only available as a part of the main area, which meant that while this was being programmed, all code fetching and execution would stop. The RWWEE section featured in the SAM D21 B variant can be written at the same time as the main area can be read. In addition, it is still possible to use a part of the main area for EEPROM emulation. The size of this 2

area can be configured with the EEPROM bits in the NVM User Row. When reading from the RWWEE area, it is not possible to program the main array. For more details, refer the application note [2]. 2 Differences between SAM D21 A/B and L Variants This chapter describe the differences between L variant and A/B variants devices. The L variant devices are ATSAMD21E15L, ATSAMD21E16L, and ATSAMD21G16L. These will be compared to similar A and B variants devices. The A variant devices used for comparison are ATSAMD21E15A, ATSAMD21E16A, and ATSAMD21G16A. The B variant devices used for comparison are ATSAMD21E15B, ATSAMD21E16B, and ATSAMD21G16B. 2.1 Pin Functionality Differences 2.1.1 Added/Modified Pin Functionality 2.1.1.1 Differences between ATSAMD21E15A/16A/15B/16B and ATSAMD21E15/16L The pinouts of ATSAMD21E15/16L is different from ATSAMD21E15A/16A/15B/16B devices. The L variant devices are not drop-in replacements for A/B variants devices. Table 2-1 shows the pin differences between ATSAMD21E15A/16A/15B/16B and AT-SAMD21E15/16L devices. Analog port pins PB02, PB03, PB04, and PB05 are newly added in physical pins Pin31, Pin32, Pin3, and Pin4 respectively PA02, PA03, RESETN, GND, VDDCORE, PA30, and PA31 pins are rearranged PA00, PA01, PA28, and VDDIN pins are removed to accomplish the above mentioned pins changes Table 2-1. Pin Functionality Differences between ATSAMD21E15A/16A/15B/16B and ATSAMD21E15/16L 32-pin QFN/TQFP package ATSAMD21E15A/16A/15B/16B ATSAMD21E15/16L Pin1 PA00 PA02 Pin2 PA01 PA03 Pin3 PA02 PB04 Pin4 PA03 PB05 Pin25 PA27 RESETN Pin26 RESETN GND Pin27 PA28 VDDCORE Pin28 GND VDDIO Pin29 VDDCORE PA30 Pin30 VDDIN PA31 Pin31 PA30 PB02 Pin32 PA31 PB03 3

2.1.1.2 Differences between ATSAMD21G16A/16B and ATSAMD21G16L The pinout of ATSAMD21G16L is different from the pinout of ATSAMD21G16A/ ATSAMD21G16B devices. The L variant devices are not drop-in replacements for A/B variant devices. Table 2-2 shows the pin differences between ATSAMD21G16A/16B and ATSAMD21G16L devices. Analog port pins PB00, PB01, PB04, and PB05 are newly added in physical pins Pin45, Pin46, Pin3, and Pin4 respectively PA02, PA03, RESETN, GND, VDDCORE, VDDIN, PA27, PA28, PA30, and PA31 pins are rearranged PA00, PA01, PB22, and PB23 pins are removed to accomplish the above mentioned pins changes Table 2-2. Pin Functionality Differences between ATSAMD21G16A/16B and ATSAMD21G16L 48-pin QFN/TQFP package ATSAMD21G16A/16B ATSAMD2121G16L Pin1 PA00 PA02 Pin2 PA01 PA03 Pin3 PA02 PB04 Pin4 PA03 PB05 Pin37 PB22 PA27 Pin38 PB23 RESETN Pin39 PA27 PA28 Pin40 RESETN GND Pin41 PA28 VDDCORE Pin42 GND VDDIN Pin43 VDDCORE PA30 Pin44 VDDIN PA31 Pin45 PA30 PB00 Pin46 PA31 PB01 2.2 Added Packages 2.2.1 Packages added for ATSAMD21E15/16L Table 2-3 shows the ATSAMD21E15/16L device packages with grade and the respective ordering codes. Table 2-3. Added Packages for ATSAMD21E15/16L F = -40 to 125ºC Matte Sn Plating ATSAMD21E15L-AFT ATSAMD21E15L-MFT N = -40 to 105ºC Matte Sn Plating ATSAMD21E15L-MNT ATSAMD21E16L-MNT ATSAMD21E16L-AFT ATSAMD21E16L-MFT 4

2.2.2 Packages added for ATSAMD21G16L Table 2-4 shows the ATSAMD21G16L device packages with grade and the respective ordering codes. Table 2-4. Added Packages for ATSAMD21G16L F = -40 to 125ºC Matte Sn Plating ATSAMD21G16L-MFT N = -40 to 105ºC Matte Sn Plating ATSAMD21G16L-MNT 2.3 Peripheral Differences 2.3.1 Differences between ATSAMD21E15A/16A/15B/16B and ATSAMD21E15/16L This section summarizes the enhancements or added features in Atmel ATSAMD21E15/16L with respect to ATSAMD21E15A/16A/15B/16B devices. The source code compatibility is guaranteed between L variant and A/B variant devices, but it is not binary compatible. So the source code for A/B variants must be recompiled for L variant devices. The differences are highlighted in Table 2-5. Table 2-5. Peripheral Differences between ATSAMD21E15A/16A/15B/16B and ATSAMD21E15/16L Peripheral ATSAMD21E15A/16A/15B/16B ATSAMD21E15/16L Timer Counter (TC) instances 3 3 Waveform output channels per TC instance Timer Counter for Control (TCC) instances 2 2 3 3 Waveform channels PWM per TCC 4/2/2 4/2/2 Waveform outputs PWM per TCC 6/4/2 8/4/2 DMA channels 12 12 USB interface 1 NA Serial Communication Interface (SERCOM) instances 4 5 Inter-IC Sound (I 2 S) interface 1 NA Analog-to-Digital Converter (ADC) channels 10 14 Analog Comparators (AC) 2 4 Digital-to-Analog Converter (DAC) channels 1 1 Real-Time Counter (RTC) Yes Yes RTC alarms 1 1 RTC compare values One 32-bit value or two 16-bit values One 32-bit value or two 16-bit values External Interrupt lines 16 16 Peripheral Touch Controller (PTC) X- and Y-lines 10x6 NA 5

Peripheral ATSAMD21E15A/16A/15B/16B ATSAMD21E15/16L Oscillators 32.768kHz crystal oscillator (XOSC32K) 0.4-32MHz crystal oscillator (XOSC) 32kHz ultra-low-power internal oscillator (OSCULP32K) 8MHz high-accuracy internal oscillator (OSC8M) 48MHz Digital Frequency Locked Loop (DFLL48M) NA 0.4-32MHz crystal oscillator (XOSC) 32kHz ultra-low-power internal oscillator (OSCULP32K) 8MHz high-accuracy internal oscillator (OSC8M) 48MHz Digital Frequency Locked Loop (DFLL48M) 96MHz Fractional Digital Phased Locked Loop (FDPLL96M) Event System channels 12 12 Watchdog Timer (WDT) Yes Yes 96MHz Fractional Digital Phased Locked Loop (FDPLL96M) 2.3.2 Differences between ATSAMD21G16A/16B and ATSAMD21G16L This section summarizes the enhancements or added features in Atmel ATSAMD21G16L with respect to AT- SAMD21G16A/16B devices. The source code compatibility is guaranteed between L variant and A/B variants devices, but it is not binary compatible. So the source code for A/B variants must be recompiled for L variant devices. The differences are highlighted in Table 2-6. Table 2-6. Peripheral Differences between ATSAMD21G16A/16B and ATSAMD21G16L Peripheral ATSAMD21G16A/16B ATSAMD21G16L Timer Counter (TC) instances 3 5 Waveform output channels per TC instance Timer Counter for Control (TCC) instances 2 2 3 3 Waveform channels PWM per TCC 4/2/2 4/2/2 Waveform outputs PWM per TCC 8/4/2 8/4/2 DMA channels 12 12 USB interface 1 NA Serial Communication Interface (SERCOM) instances 6 5 Inter-IC Sound (I 2 S) interface 1 NA Analog-to-Digital Converter (ADC) channels 14 18 Analog Comparators (AC) 2 4 Digital-to-Analog Converter (DAC) channels 1 1 Real-Time Counter (RTC) Yes Yes 6

Peripheral ATSAMD21G16A/16B ATSAMD21G16L RTC alarms 1 1 RTC compare values One 32-bit value or two 16-bit values One 32-bit value or two 16-bit values External Interrupt lines 16 16 Peripheral Touch Controller (PTC) X and Y lines Oscillators 10x6 32.768kHz crystal oscillator (XOSC32K) 0.4-32MHz crystal oscillator (XOSC) 32kHz ultra-low-power internal oscillator (OSCULP32K) 8MHz high-accuracy internal oscillator (OSC8M) 48MHz Digital Frequency Locked Loop (DFLL48M) 96MHz Fractional Digital Phased Locked Loop (FDPLL96M) NA NA 0.4-32MHz crystal oscillator (XOSC) 32kHz ultra-low-power internal oscillator (OSCULP32K) 8MHz high-accuracy internal oscillator (OSC8M) 48MHz Digital Frequency Locked Loop (DFLL48M) 96MHz Fractional Digital Phased Locked Loop (FDPLL96M) Event System channels 12 12 Watchdog Timer (WDT) Yes Yes The ATSAMD21E15/16L and ATSAMD21G16L have enhanced features in the following peripherals such as: Note: Internal high-speed flash with Read-While-Write (RWW) capability on section of the array This RWW feature is also available on ATSAMD21E15B/16B and ATSAMD21G16B. Analog comparator AC1 with window compare function Added features in Timer/Counters for Control (TCC) 2.3.3 Internal High-speed Flash with Read-While-Write (RWW) The non-volatile memory of the ATSAMD21E15/16L and ATSAMD21G16L devices features a Read-While- Write EEPROM Emulation (RWWEE) section. This section is intended for EEPROM emulation and can be programmed at the same time as reading the main array. This is a separate array intended for the RWW EEPROM emulation, and can be programmed while reading the main array. Figure 2-1 NVM Memory Organization shows the organization of the non-volatile memory of the ATSAMD21E15/16L and ATSAMD21G16L. The EEPROM emulation space is memory mapped in the same way as the main array. For the ATSAMD21E15/16L and ATSAMD21G16L devices, the RWWEE address space is located at NVM Base Address + 0x000100000. 7

Figure 2-1. NVM Memory Organization NVM Base Address + 0x00010000 NVM Base Address + 0x00010000 NVM Base Address + NVM Size NVM Base Address In legacy implementations of the NVM controller, the EEPROM emulation area was only available as a part of the main area, which meant that while this was being programmed, all code fetching and execution would stop. The RWWEE section featured in the ATSAMD21E15/16L and ATSAMD21G16L devices can be written at the same time as the main area can be read. In addition, it is still possible to use a part of the main area for EEPROM emulation. The size of this area can be configured with the EEPROM bits in the NVM User Row. When reading from the RWWEE area, it is not possible to program the main array. For more details, refer the application note [2]. 2.3.4 Analog Comparator AC1 In ATSAMD21E15/16L and ATSAMD21G16L devices the Analog Comparator (AC) supports two individual comparators namely AC0 and AC1. The pinout for the AC1 is multiplexed with the PORTB. For more details, refer the device datasheet [3]. 2.3.5 Enhancement in TCC There are few enhanced features in TCC such as Critical RAMP2 (RAMP2C) Operation, Time-stamp Capture, and DMA Operation with circular buffer, DMA operation with circular buffer in RAMP and RAMP2A modes, and DMA operation with circular buffer in DSBOTH mode. The above features are explained in detail in the application note [4] Atmel SAMD21E1xL Application note on New TCC features. 8

3 References [1] Atmel SAM D21 Device Datasheet. [2] Atmel AT03974: Read While Write EEPROM. [3] Atmel SAM D21EL / SAM D21GL Device datasheet. [4] Atmel SAMD21E1xL Application note on New TCC features. 9

4 Revision History Doc Rev. Date Comments 32219A 05/2016 Initial document release. 10

Atmel Corporation 1600 Technology Drive, San Jose, CA 95110 USA T: (+1)(408) 441.0311 F: (+1)(408) 436.4200 www.atmel.com 2016 Atmel Corporation. / Rev.:. Atmel, Atmel logo and combinations thereof, Enabling Unlimited Possibilities, and others are registered trademarks or trademarks of Atmel Corporation in U.S. and other countries. ARM, ARM Connected logo, and others are the registered trademarks or trademarks of ARM Ltd. Other terms and product names may be trademarks of others. DISCLAIMER: The information in this document is provided in connection with Atmel products. No license, express or implied, b y estoppel or otherwise, to any intellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN THE ATMEL TERMS AND COND ITIONS OF SALES LOCATED ON THE ATMEL WEBSITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUTORY WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, OR NON -INFRINGEMENT. IN NO EVENT SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, PUNITIVE, SPECIAL OR INCIDENTAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS AND PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT OF THE USE OR INABILITY TO USE THIS DOCUMENT, EVEN IF ATMEL HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Atmel makes no representations or warranties with respect to the accuracy or completeness of the contents of this document and reserves the right to make changes to specifications and products descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Unless specifically provided otherwise, Atmel products are not suitable for, and shall not be used in, auto motive applications. Atmel products are not intended, authorized, or warranted for use as components in applications intended to support or sustain life. SAFETY-CRITICAL, MILITARY, AND AUTOMOTIVE APPLICATIONS DISCLAIMER: Atmel products are not designed for and will not be used in conne ction with any applications where the failure of such products would reasonably be expected to result in significant personal injury or death ( Safety-Critical Applications ) without an Atmel officer's specific written consent. Safety-Critical Applications include, without limitation, life support devices and systems, equipment or systems for the operation of nuclear facilities and weapons systems. Atmel products are not designed nor intended AT04470: for use in military Differences or aerospace applications Between or environments SAM D21 unless Variants specifically A, desi B, gnated and by L Atmel [APPLICATION as military-grade. Atmel NOTE] products are not designed nor intended for use in automotive applications unless specifically designated by as automotive -grade. 11