IEEE-SME Exam; WSU-EET Program Adjustments and Lessons Learned

Transcription

1 ASEE Conference for Industry and Education Collaboration IEEE-SME Exam; WSU-EET Program Adjustments and Lessons Learned February 8-10, 2017 Jacksonville, FL Christian W. Hearn Fred Y. Chiou Department of Engineering Technology Weber State University - Ogden, UT Proceedings of the 2017 Conference for Industry and Education Collaboration Copyright 2017 American Society for Engineering Education

2 Outline: I. Introduction II. Background III. IEEE-SME EET Exam IV. WSU-EET Program Exam V. Results and Discussion VI. Conclusions Summary: WSU-EET recently adopted the nationally-normed IEEE-SME Exam WSU-EET faculty also created a separate Program Exam for internal tracking Faculty believe coupling the nationally-normed exam with the internal exam is a flexible solution to assessment of learning for small programs

3 I. Introduction Weber State University Engineering Technology Department programs reaccredited by ETAC of ABET in 2015 WSU-Manufacturing Engineering Technology (MFET) has successfully used the SME exam for assessment, in spite of administration of exam fees and effective student incentives EET program has endured significant program challenges and has made efforts to update the program One EET program priority is student opportunities for certifications (ex soldering, NABCEP)

4 II. Background IEEE-SME EET exam was made available in 2010 o Seven subject areas o Approximately 120 questions WSU-EET students commented the IEEE exam was daunting. Student cross-section selection and preparation challenges similar to RIT + Buffalo State experience 1 [1] AC : EET Nationally-Normed Assessment Exam: First Experiences and their Relations to ABET Outcomes, I. Grinberg, R.E. Land, ASEE 2011

5 III. IEEE-SME nationally-normed EET assessment exam (ECETDHA) Electrical and Computer Engineering Technology Department Heads Association Provide EET programs with reliable direct assessment method for accreditation reviews Figure X. Fall 2015 IEEE-SME exam problem distribution. The test date was October 1, [SOURCE: Coordinator Report-Examination Analysis SME-E33, Test Code 7763.v1]

6 III. IEEE-SME Exam (cont d) (ECETDHA) Electrical and Computer Engineering Technology Department Heads Association Provide EET programs with reliable direct assessment method for accreditation reviews # Category N Q % I Basic Concepts of Electricity Elec II Alternating Current Concepts AC III Basic Circuit Analysis Methods Ckt An 8 7 IV Digital Electronics Digital V Analog Electronics Analog VI Microcontrollers-Microprocessors µcntrllrs VII Instrumentation and Measurements Instrm Total Table 1. Fall 2015 IEEE-SME exam problem distribution. The test date was October 1, [SOURCE: Coordinator Report-Examination Analysis SME-E33, Test Code 7763.v1]

7 III. IEEE-SME Exam (cont d) IEEE-Exam, WSU Results Four senior-level EET student Volunteers* No tutoring or coaching Exam scores trend downward with increase in topic specialization (Ref Buffalo State-RIT analysis) Weakness in Analog category may/may not be due to fatigue Student # I Elec II AC III Ckt An IV Digital V Analog VI µcntrllrs VII Instrm IEEE SME (%)

8 IV. WSU-EET Program Exam - Topic Distribution Category I Circuit Analysis II AC ,49-50 III Digital IV Electronics Total

9 IV. WSU-EET Program Exam (cont d) 8 EET-Program Exam Score Analysis 7 6 N OCCURENCES % Score N STUDENTS x AVE Spring Fall Total

10 V. Results and Discussion IV. EET Program Exam Results for seniors who completed the IEEE exam Student # I Ckt Analysis II AC III Digital IV Electronics WSU EET (%)

11 V. Results and Discussion (cont d) Student # Cross-comparison of Exam Results IEEE SME (%) Concern (Section score below overall score) Analog, µcontrollers, instrumentation Circuit Analysis, Analog, Analog, µcontrollers, instrumentation Circuit Analysis, AC, Analog, µcontroller Student # WSU EET Concern (Section score below overall average) Circuit Analysis., Digital Digital AC, Digital, Electronics Digital

12 V. Results and Discussion (cont d) Discussion WSU ET Department is currently using nationally-normed exams for MFET and EET The WSU-EET program also developed an independent internal exam to track learning outcomes Small sample of exam results (IEEE-SME and internal EET) Future format changes Trends should become more apparent as exam dataset continues to increase

13 VI. Conclusions The WSU-EET program is in the process of implementing the following modifications: Organize internal exam to IEEE-SME format Internal exam will be more comprehensive with a target of 100 questions Program exam will count towards a student grade Faculty will study the internet accessible IEEE Body of Knowledge document for course curriculum and test question development

14 Questions?

15 Thank You! Acknowledgements : Dr. Warren Hill (ASEE-fellow, professor emeritus WSU)