2-Wire universal Cable /Harness Tester

Transcription

1 Wire universal Cable /Harness Tester User Manual Version: 1.03 Issued Date: November 2015

2 Table of Contents Chapter 1 Cautions Safety Symbols Avoid Self-Modification or Calibration Static Electricity Ground Power Supply Warming-Start Device Malfunctions Unexpected Termination during Test Process Location and Storage Troubleshooting for Urgent Conditions... 5 Chapter 2 General Summary Packaging and Accessories Notations and Symbols used in this User Manual Operating Basics Front and Back Panel Displays Front Panel Back Panel Block Diagram of Tester Functions Installation Push Buttons Chapter 3 Setup instructions for Function and Analytical Mode Functions Self-Test System Information Calibration Pin Search System Setup (SYS) Setting Up System Environment Setting Up Test Environment Setting Up DATE / TIME

3 3.2.4 Resetting System Password Print Learn File Statistic Test Mode Setting (O/S Setting) Multi DUT Test Mode Chapter 4 Test Modes Setup Test Condition Test Condition Setting for Open/Short List (OPEN/SHORT) Conductance Test/Edit (Conductance) R/C/D Element Setup/Edit (Resistance/Caps/Diode) High Voltage Setup/Edit Implement test Real-Time Test Existed Test File Choosing files Sequence test Creating New File Uploading Single File Uploading All Files Deleting Files Sorting files Importing Files APPENDIX A Transmission Cable Configuration APPENDIX B Test Range and Function APPENDIX C Technical Specification APPENDIX D Version Copyright 2015 Microtest Corporation. All rights reserved Disclaimer: Microtest Corporation reserves the right to change the terms and conditions in this User Manual at any time without prior notice. 2

4 Chapter 1 Cautions Do not use this instrument outside and avoid humid or dusty areas. Use of this instrument in an improper setting can increase the risk of electrical shock. Carefully read all safety instructions before using the device to prevent accidents due to misuse. 1.1 Safety Symbols The following safety symbols may appear in this user manual and on the device itself. Caution: Carefully read the user manual for detailed information. Earthing Required: Check that this terminal is earthed before operating the device to prevent electrical shocks due to leakage or contact with the housing. : Improper use of the device may result in instrument or testing object malfunctions. : Improper use of the device may result in injury or death. 1.2 Avoid Self-Modification or Calibration Never install surrogate parts onto the machine or undertake any device modifications and internal calibrations yourself without the express permission of Microtest, as you may increase the levels of danger associated with the device or damage the device. 1.3 Static Electricity Keep items bearing static electricity away from the device to prevent damage. 3

5 1.4 Ground A safe ground terminal is located on the outer housing of the back panel of the device; check that this terminal is properly grounded to prevent contact with the housing and risk of electrical shock. 1.5 Power Supply You must use a power supply cable that meets local national specifications and an IEC320-compatible connector to connect the cable to the instrument. The user must check that the earth wire is properly earthed. If a fuse is included in the power supply plug it must be a 3.15A fuse compatible with relevant safety regulations. Always check before use to ensure A/C power supply and voltage values are between 50/60Hz. 1.6 Warming-Start The testing device can be used normally immediately after switching the power on, but will not meet accuracy specifications unless allowed to warm up for 30 minutes. 1.7 Device Malfunctions Return all malfunctioning instruments to the manufacturer for professional repair in order to ensure the accuracy and operational safety of the instrument. 1.8 Unexpected Termination during Test Process Please turn the device off at the power source if it will not be used for a long period of time. 4

6 1.9 Location and Storage The device may be operated normally in temperatures of C with up to 80% RH. The device may not operate in conditions exceeding these limits. The device should be stored at -20 C~70 C with up to 80% RH. In order to ensure testing accuracy and safety, avoid installing the device anywhere it would be exposed to direct sunlight, extreme heat, extreme humidity, vibration frequencies, dust, or unstable power grids Troubleshooting for Urgent Conditions Switch off the power supply and disconnect the power supply cable in the event of electrical shock, test item combustion and device combustion. 5

7 Chapter 2 General Summary 2.1 Packaging and Accessories Standard packaging and accessories of Wire universal Cable /Harness Tester are: 1 x Wire universal Cable /Harness Tester 2 x 64 pin header connector(128-p) 1 x Pin Search probe 1 x power cord and power plug adapter (3 prong to 2 prong) 1 x User manual 2.2 Notations and Symbols used in this User Manual [xxxx] :The push button name of the test, e.g. [TEST] [Sy[xxxx] :The touch buttons on LCD screen, y stands for Soft key numbers (1~6), and xxxx for the touch button name, e.g. S1 [PROG] {xxxxxxxx}:the messages shown on LCD screen xxxx : The switch button name on LCD screen, e.g. ON <Pxx>:The reference page number of this user manual, e.g. <P21> (xxxx) : English descriptions 6

8 2.3 Operating Basics Number and letter inputs: Please use Edit key to enter numbers and letters when saving files in our system. Please press a number for first position of the file name, followed by three more press to enter capital letters for second and third positions. Please find instruction as follows: Edit key Numbers of pressing Edit key LCD screen A 1 1A 1 3 1AB Move Use [ ][ ][ ][ ] to move the cursor. Confirmation Press [Enter] for confirmation. Test/Exit Press [TEST] to start a test, [Exit] to exit a test. 7

9 2.4 Front and Back Panel Displays Front Panel 128 and 256 Model: (1) LCD screen (2) S1~S6 Soft Key push buttons (Soft Key) (3) PASS & FAIL & HIPOT LED (4) Chap(Edit Key) push buttons group (5) Fast key push buttons group (6) System reset push button (7) Power switch (8) Pin Search connector (9) 128-Pin 2 slots, 256-Pin 4 slots (10) Push button [TEST] (11) System push buttons(sys Key) group 8

10 512 Model : (1) LCD screen (2) S1~S6 Soft Key push buttons (Soft Key) (3) PASS & FAIL & HIPOT LED (4) Edit key(edit Key) push buttons group (5) Fast key push buttons group (6) System reset push button (7) Power switch (8) Pin Search port (9) 512-Pin, 8 slots (10) Push button [TEST] (11) System push buttons(sys Key) group (12) USB disk (13) High voltage calibration output connector 9

11 2.4.2 Back Panel 128 Model : (1) Serial port(rs-232 Port) (2) Remote Port (3) Printer Port (4) High voltage calibration output connector (5) AC power input(230/115 VAC) (6) 115/230V Voltage selector (7) Fuse holder 250V/3A (8) Audio output Caution: 1. Please make sure that the supply voltage matches the rated supply voltage of the AC. 2. Input power supply should be connected to ground when the tester is in use. 10

12 512 Model : (1) Serial port(rs-232 Port) (2) Remote Port (3) Printer Port (4) AC power input(230/115 VAC) (5) 115/230V Voltage selector (6) Fuse holder 250V/3A (7) Audio output Caution: 1. Please make sure that the supply voltage matches the rated supply voltage of the AC. 2. Input power supply should be connected to ground when the tester is in use. 11

13 2.5 Block Diagram of Tester Functions [Mode] [TEST] Main Test Mode setup Test Modes [Func] Mode Function setup Conductance Test setup Y/N [Setup] Mode System setup DC insulation setup AC withstand voltage setup Test Y/N [Stat] Statistical data R setup Test Y/N [Print] Print setup C setup Test Y/N [TEST] Test Modes Diode setup Test Y/N [File] File O/S setup Test management Y/N 12

14 2.6 Installation (1) Please confirm the voltage provided by power supply is AC115V or 230V. (2) Attach connectors (If needed) and DUT. (3) When the power is turned on, the tester will start to perform self-test automatically. (4) You will enter 8740 system after the self test is completed, LCD screen displays as follows: (5) Press [Power] if you want to terminate the process. Caution: 1. Self-test takes approximately 60~80 seconds after power is turned on. 2. Under {READY} status, you may press Soft key S1~S6 for following adjustments: S1 Turn the LCD backlight brightness up S2 Turn the LCD backlight brightness down S3 Turn the volume up S4 Turn the volume down S5 Software version and last modified date S6 Switch languages between Traditional Chinese and English 1 Jump to Open/Short (Use [O/S] for the same menu) 13

15 2 Jump to Learn (Use [Learn] for the same menu) 3 Jump to File Management (Use [File] for the same menu) 4 Jump to Conductance Test/Edit (Use [Cond] for the same menu) 5 Jump to Element Setup/Edit (Use [R/C/D] for the same menu) 14

16 2.7 Push Buttons 1 System push buttons(sys Key) group [Func] System function menu [Sys] System setup menu [Print] Print function menu 2 Fast key push buttons group [Learn] [File] [Stat] [Mode] [O/S] [Cond] [R] [C] [D] [H.V.] Learn open /short File management setup Display statistical data Test mode setup Open /Short status Conductance Test Edit Resistance setup/edit Capacitance setup/edit Diode setup/edit DC insulation/ac withstand voltage setup/edit 3 Edit key push buttons group Number and letter push buttons Enter numbers and letters, including 0~1,A~Z,./. [BS] ( ) Back Space Movement key Move cursor,including [ ] [ ] [ ] [ ] [PgUp] [PgDn] for fast data editing [Exit] Exit current screen and go back to previous one 4 [Enter] For confirmation 5 [TEST] Start to test 15

17 6 S1~S6 Soft key push buttons group S1~S6 are at the right side of LCD screen for ancillary operation and setup 7 [Reset] Reset the system, equivalent to Warm Start 8 [Save] Save files 9 [Shift] Switch functions 16

18 Chapter 3 Setup instructions for Function and Analytical Mode This chapter includes setup instructions for system: function [Func], system setup [Setup] and print function [Print], please find details as follows: 3.1 Functions Please take the following steps to select system function: (1) Press [Func] (2) LCD screen displays: (3) Press [ ] or [ ] to highlight desired function. (4) Press [Enter] for confirmation and move to the next screen. (5) Press [Exit] and return to previous screen. 17

19 3.1.1 Self-Test System self-test would perform right after the power is turned on. This function is optional. (1) Press [Func] then [ ] or [ ] to highlight self-test function, press [Enter]. (2) System will start to perform self-test. (3) LCD screen displays: (4) Press [Exit] and return to previous screen System Information You may use this function to obtain system information and software version of 8740 model, such as the model type, the numbers of test points, used and free space in the system as well as system updates. (1) Press [Func] followed by [ ] or [ ] to highlight System information, then press [Enter]. (2) LCD screen displays: 18

20 3.1.3 Calibration This function includes DC high voltage calibration, AC high voltage calibration and resetting internal conductance to zero. (1) Press [Func]. (2) Use [ ] or [ ] to highlight Calibration and press [Enter]. (3) LCD screen displays: (4) Press [Exit] and return to previous screen. 19

21 DC High Voltage Calibration Bring DC Read value as close to its setting value as possible. (1) Press [Func]. (2) Use [ ] or [ ] to highlight Calibration and press [Enter], then choose DC H.V CAL. press [Enter]. (3) LCD screen displays: (4) Press S1 [UP] or S2 [DOWN] to adjust DC Read value as close to its setting value as possible or press S5 for auto-adjustment. (5) Press S4 [OK] after completing the process. (6) Press S6 [QUIT] if you want to cancel the adjustment. AC high Voltage Calibration Adjust the AC Read value as close to its setting value as possible. (1) Press [Func] (2) Use [ ] or [ ] to highlight Calibration and press [Enter], then choose AC H.V CAL. press [Enter]. (3) LCD screen displays: 20

22 (4) Press S1 [UP] or S2 [DOWN] to adjust AC Read value as close to its setting value as possible or press S5 for auto-adjustment. (5) Pres S4 [OK] after completing the process. (6) Press S6 [QUIT] if you want to cancel the adjustment. Internal Conductance Zero Adjustment tester internal conductance back to zero by calibration step with OFFSET board. (1) Press [Func]. (2) Use [ ] or [ ] to highlight Calibration and press [Enter], then choose INT.COND.ZERO, press [Enter]. (3) LCD screen displays: 21

23 (4) Press [Enter] to execute this function (Make sure you have already inserted INTERNAL OFFSET zero impedance board). (5) When the process is finished at PORT A, the LCD screen would display a message asking if you would like to proceed at PORT B with the same process.please note that if your device has 256-PIN, then the second PORT to reset would be PORT D. if device is 512-PIN model the final PORT would be PORT H (6) Remove INTERNAL OFFSET zero impedance board and insert COND OFFSET zero impedance board, then repeat step (4) and (5). (7) Replace COND OFFSET zero impedance board with 50Ω COND zero impedance board then reset at PORT A Pin Search Display the PIN number of a particular location of cable. (1) Press [Func]. (2) Use [ ] or [ ] to highlight Pin Search and press [Enter] (3) Attach the probe to PIN Search port then place the probe tip on the location where requires the PIN info. (4) LCD screen displays: 22

24 (5) A36 represents the 36 th PIN at slot A and B29 represents the 29 th PIN at slot B in above figure. 3.2 System Setup (SYS) This function Includes relevant instructions regarding system configuration and test environment setting, please find operation steps and function details as follows: (1) Press [Sys]. (2) LCD screen displays: (3) Press [ ] or [ ] to highlight function then press [Enter]. (4) Press [Exit] to exit after finishing the process Setting Up System Environment (1) LCD screen displays: 23

25 (2)Press [ ] or [ ] to select item. (3)Press S1 for confirmation or [Select item] for other items. (4) Press [Exit] after finishing the process. (1) Power on Selft-Test There are two options. The default setting is ON. ON: Perform Power-on self-test OFF: Do not perform Power-on self-test (2)Power Line Frequency Input power frequency (50Hz/60Hz) (3)Key Stroke Sound You may turn on or turn off the push button sounds of this tester. The default setting is All Keyl. All key: All the push buttons beep when they are pressed Disable: All the push buttons will not beep when they are pressed Valid: All the enabled buttons beep when they are pressed Invalid: All the disabled push buttons beep when they are pressed (4)Key Lock The push buttons are protected to prevent data theft. Please go to System Environment choose Password,change the password, then go to Key Lock and select Lock to enable this function. 24

26 Caution: 1. You will need to enter the password to deactivate push button protection, please read this user manual thoroughly for relevant contents. (1) Press [Sys] then use [ ] or [ ] to highlight this function. (2) Press S1 or [Select item]. (3) LCD screen displays: (5) Sound Volume Press S1 or [Select item ] to adjust the volume (6)LCD Contrast Press S1 or [Select item] to adjust LCD contrast (7)Inverse LCD Press S1 or [Select item ] to switch display style between normal and inverse. 25

27 (8) Language Press S1 or [Select item] to switch the language between traditional Chinese and English Setting Up Test Environment (1) LCD screen displays: (2) Press [ ] or [ ] to select the item. (3) Press S1 for confirmation or [Select item] for other options. (4) Press [Exit] and return to previous screen. 26

28 (1) Tester ID You may use this function to assign each tester a number for identification. (2) Test Alarm Please choose among following four options according to your requirements. All on The alarm will sound on both test results Pass/Fail No The alarm will not sound on both test results Pass/Fail Pass The alarm will sound only when the testing result is Pass Fail The alarm will sound only when the testing result is Fail (3) Consecutive Alarm When there are errors during testing, consecutive alarm is activated. On: Consecutive alarm is activated Off: Consecutive alarm is deactivated (4) Display Test Data There are three options for displaying and printing Statistical Data All Display and print the statistical data no matter there is an error or not. No Do not display and print statistical data no matter there is an error or not Fail Display and print messages of faulty testing steps (5) Auto Print Data There are two options for auto printing testing result data, the default setting is Manual Key: Deactivate this function, the testing result will be printed out manually by pressing the [print] button Auto: Testing result data auto printing function is activated (6) Output Signal There are three control signal output modes: Continuous signal, pulse signal and Off. Off: Remote port does not output any signal 27

29 Static: Remote port outputs signals continuously until next test Pulse: Remote port outputs pulse signals every 100ms (7)Step Trigger There are three startup modes: Key, Auto or External. (8)Test File You can test only one file or all the files step-by-step. Single: Testing current file (i.e. {Current file} shown on home screen). Multi-Step: Test all the files sequentially. Auto: If Step-by-step is not selected, then the system will auto switch to One file. (9)Step Test Fail When encountered with step-by step file testing errors, you may choose between following four options: Break Test, Test All, Back First, and Repeat Test. (10)Step Display All You may choose to activate or deactivate this function. (11)Fail Stop The tester will activate auto-lock function when there is a testing error. You may unlock using remote port testing signals. (12)Test Statistic You may activate or deactivate Statistical data of test results function. (13)Test Data Up Load There are three options for you to upload test results: Off: Do not upload test results USB Store: Testing result files will be stored in USB disk To PC USB: Transmit test results to the computer through RS232 interface 28

30 (14)Step Test Comparison Compare the files sequentially until the comparison result is PASS as well as test result and end the test. If all files are tested as Fail, then the test result is FAIL. When this function is activated,"[9] Step-by-step file testing errors is disabled Setting Up DATE / TIME Adjust system time includes year/month/date/time/minute/second. (1) Press [Sys]. (2) Use [ ] or [ ] to select this function. (3) LCD screen displays: (4) Date pattern is MM/DD/YY, press S1 [set] to save after you input the data. (5) Press [Exit] and return to previous screen. Caution: 1. This tester uses 24-hour clock. 29

31 3.2.4 Resetting System Password This tester provides KEY lock function to avoid unauthorized user change the tester setting, if use the function; change any setting system will requirement password. (1) Press [Sys] (2) Use [ ] or [ ] to highlight this function and press [Enter] (3) LCD screen displays: (4) Please input password for first login or enter current password then press [Enter]. (5) Type the new password then press [Enter], message {Saved} would appear on LCD screen. (6) After new password is saved, the system will go back to system function menu automatically. (7) Please repeat above steps if you want to change the password again. 3.3 Print You may connect a printer to this tester and printout the data as required. Please find instructions as follows: (1) Select data or pages that you would like to printout. (2) Press [Print]. 30

32 3.4 Learn This tester has the capability to learn Open/Short setup, i.e. store cable connection status in the system and display test results on LCD screen. 3.5 File Please find Chapter 4 Test Modes and 4.3 File Management for details. 31

33 3.6 Statistic The statistical data of testing result includes: total quantity tested, passed, and failed, as well as determine cause of faults and corresponding quantity. (1) Press [Stat]. (2) LCD screen displays: (3) Press S1[Ratio],the quantity of each fault will be converted to percentages. (4) LCD screen displays: (5) Press S6 [Clear] to remove all the current statistical data. (6) Press [Exit] and return to previous screen after completing the process. 32

34 3.7 Test Mode Setting (O/S Setting) (1) Open/Short circuit threshold: You may choose among 2K, 5K, 10K, 20K, 50K to verify an Open/Short circuit, e.g. If the threshold is 2k,when the impedance of a cable is under 2K, then it s classified as short circuit, on the contrary, impedance above 2k is classified as open circuit. Press [O/S] then S6 [Set] to enter Test Mode Setting 33

35 2. Cable Type:{Normal} Press [Learn], LCD screen displays: When the cable is ready for testing, press [TEST], LCD screen displays: When the test is finished, LCD screen would display total quantity tested, passed and failed. (2) When the cable type {Single Step} is selected under Test Mode Setting. 34

36 Press [Learn], LCD screen displays: Use Pin search probe to specify the short circuit PIN, i.e. LCD screen would display A01 when the Pin search probe which is attached to front panel placed on the cable s short circuit PIN (A01). Place the probe on other assigned PINs (A03, A05, A07) sequentially, press S1 [READ] then S4 [OK] when the learning process is finished. 35

37 When the cable is ready for testing, press [TEST], LCD screen displays: Place the Pin search probe on A01, LCD screen displays: Please place the probe on A03, A05, A07 PIN to finish the harness test. There are only four default testing steps, and only the cables passing all these four steps sequentially will be considered as non-defective parts. The maximum testing steps would be

38 When the cable type is {Single Side} in Test Mode Setting. Press [Learn] when there is no DUT,LCD screen displays: The figures on the right side of the LCD screen indicate the single side sensitivity, you may press S5 [Single side Zero].Press S4 to clear single side zero figures. Press [Learn] when the DUT is engaged, LCD screen displays: In Test Mode setting, input the required figures in single side sensitivity area, I.e. you may input 80%~90% of minimum Learn figures as setting values. 37

39 When the cable is ready for testing, press [TEST] then LCD screen displays: When the test is finished, the LCD screen would display total quantity tested, passed and failed. (3) Maximum capacitance range: 0.05u~1u. Please apply larger capacitance setting value for a longer cable to stabilize the testing process. (4) Start up Mode: Auto When the DUT is emgaged, the test start automatically. Manual When the DUT is engaged, press [Test] to start the test. Continuous Press [Test] then the test will go on continuously. (5) Auto Scan Delay: You may use this function only when Auto mode is activated. The test will delay for few seconds after the DUT is engaged. (6) Repeat Count.: This function is effective only when you choose Continuous startup method, and you are able to setup the numbers of testing cycles. (7) Break if Fail : Please choose among three options {Stop testing}, {Ignore high voltage}, {Finish all test} if you encounter errors during testing. (8) Identify O/S Ends: Display fault locations of open or short circuit, e.g. A Port or B Port. (9) Signal Side Sensitive: When the measured value is higher than setting value with cable type selected as {Single Side} in Test Mode Setting, it would be considered as open circuit. (10) Internal O/S Time: When the setting value is zero, then the test duration would be infinite unless you unplug the sample. When the setting value is not zero, the test duration equals to the setting value (Unit: Second). 38

40 3.7.1 Multi DUT First the tester needs to learn the PIN ID, please press Test Mode setting. Select MultDut Then set up the first and last PIN according to learned PIN ID. The maximum numbers of DUT would be four and allow to setup first/last PIN (Remark: Other DUT is prohibited between first and last PIN). After following the steps above, press [Test]. 39

41 3.7.2 Test Mode Press [Mode]. Press {ITEM}. (1) Please use [ ] or [ ] to select item (2) Press S1 [PROG] to check or uncheck the item. 40

42 Chapter 4 Test Modes By applying programmable design method, the test modes are able to setup unique test conditions for every different items and auto execute simultaneously to suit varied requirements as well as achieve highest efficiency. Setting up test conditions Test implementations File management Please find details as follows: 4.1 Setup Test Condition Establish test conditions according to required specifications of DUT, including O/S / Cond / R / C / HIPOT / Diode: The values of each parameter, e.g. frequency, voltage and current. Specification requirements, standard values of established guidelines and tolerance Test Condition Setting for Open/Short List (OPEN/SHORT) (1) Press [O/S] (2) LCD will show DUT wire- connection relation: 41

43 (3) This Open/Short list is established by learning. (4) Press [Exit] and return to previous screen Conductance Test/Edit (Conductance) (1) Press [COND] (2) LCD screen displays: (3) Please use [ ] or [ ] to select item. 1 Maximum conductance: Please use numeric keys to input cable maximum conductance as required. 2 Minimum conductance: Please use numeric keys to input cable minimum conductance as required. 42

44 3 COND. OFFSET : You may input figures to increase or reduce jig impedance. 4 Conductance Mode: Please press S1 [Select item] then choose from Series, Emanate or Compound. 5 INTERMITTENCE LIMIT: Please input impedance value to determine the testing result. 6 INTERMITTENCE TIME: Please input figures to set up test time. 7 COND NET: You may import the learned O/S to Element edit. Press S3 [COND NET] to enter Conductance edit menu: Press S1 [Select] for desired item then press S4 [OK]. 43

45 Enter Element edit menu: 8 Conductance zero: After the zero-setting jig is engaged, press S5 [Conductance zero], a message on the lower left of LCD screen would read: Conductance zero: Yes. 9 Clear Zero: Press S6 [Clear Zero] to clear previous conductance values, a message on the lower left of LCD screen would read: Conductance zero: No. Caution: 1. Please short circuit the Zero setting jig with the lower impedance according to DUT s NET. 44

46 4.1.3 R/C/D Element Setup/Edit (Resistance/Caps/Diode) (1) Press [R/C/D],LCD screen displays: (2) Enter element name, move the cursor to T row then use S1 S2 S3 to choose among capacitor, resistor, diode, capacitor polarity, leak current. (3) Set up + - PIN, you can input manually or use PIN SEARCH ( Please insert the probe into PIN SEARCH port then contact with ABCDEFG PORT), LCD screen displays: 45

47 (4) Move cursor to standard value row then enter measured values or use S1[MEAS STEP],S2[MEAS ALL],LCD screen displays: (5) If the element is resistor or capacitor, please press S5 [CLR.OFFS] to start offset-calibration, LCD screen displays: (6) Press [Enter] to start offset-calibration. (7) Press S6 [CLR.OFFS] to clear the offset value data of resistors or capacitors. (8) If the element is resistor, please press SHIFT+S5 [OFFS] to present details regarding resistors zero-setting, LCD screen displays: 46

48 (9) When the element is diode or leak current, press S3[SET PARA] for setting up parameters, LCD screen displays: (9.1) You can switch to input test current/voltage values when setting up diode parameters on the same screen, LCD screen displays: (9.2) You can use LEFT / RIGHT buttons switch to input test voltage values when setting 47

49 up leak current parameters on the same screen, LCD screen displays: (10) Please find Item details as follows: Number Please assign a group name of each resistor testing for identification. Pin (Positive polarity Pin ) Positive polarity Pin setup, please input desired Pin. Pin (Negative polarity Pin ) Negative polarity Pin setup, please input desired Pin. Standard values Please input figures for setting up standard values. Tolerance % Please insert figures between for tolerance setup. Press S6 [Same] if the desired tolerance for each item is the same. >= STD Press S1 [Greater] to make the tolerance greater than or equal to standard values. >= STD Press S2 [Lower] to make the tolerance lower than or equal to standard values. 48

50 4.1.4 High Voltage Setup/Edit Set up for DC insulation, AC withstand voltage test, frequency, time duration, specification and other items. (1) Press [HV] (2) LCD screen displays: " (1) Use movement keys to select desired item. (2) Key in the standard values of established guidelines. (3) Regarding DC insulation and AC withstand voltage test, please find details as follows: (1) Voltage Test voltage ranges of DC insulation and AC withstand voltage test: DC voltage 50V~1000V(8740N/8740NA), 50V~1500V(8740FA), AC voltage 100V~700V(8740-NA), 100~1000(8740FA) (2) Frequency Only the test frequency range for AC withstand voltage test can be set up: 50/60Hz. For DC insulation: if you switch between DC insulation and AC withstand voltage test, the test mode will be changed. The unit of withstand voltage test is ua, insulation test is MΩ. 49

51 (3) Time The test durations of DC insulation and AC withstand voltage test range are both 0.01Sec~60Sec. (4) Specifications The specifications of DC insulation and AC withstand voltage test: DC insulation 0.1M ~1000MΩ,0.1uA~1000uA. When the specification is 5MΩ or under 5uA, the maximum test voltage is 650V, the current range of AC withstand voltage test is 0.01mA~5mA. (5) Offset The measured values of AC withstand voltage test returns to zero. (6) All -Ground You will need to setup ground connection points for this test, therefore this test can perform insulation test on a non-earth cable. The advantage of this test is fast speed. On the other hand, the disadvantage is that no insulation test can be performed on non-earth cables. All to ground tests (7) Binary This is Similar to Binary test method. When there are 8 test points, A, B, C, D, E, F, G, H in DUT,it would take 7 subsequent tests on the harness to verify a non-defective part using one by one test method. But it would take only 3 tests to verify one using Binary test method by following grouping steps: Step 1. Make A, B, C, D as one group and E, F, G, H as the other group then test. Step 2. Make A, B, E, F as one group, and C, D, G, H as the other group then test. Step 3. Make A, C, E, G as one group and B, D, F, H as the other group then 50

52 test. If DUT has 128 test points,it would take 127 subsequent tests on the harness to verify a non-defective part using Binary test method while it would take only 8 tests applying Rapid dichotomy test method. The disadvantages of Rapid dichotomy test method are not able to tell the exact defective point, and the harness impedance is slightly lower than the actual value due to parallel testing. Binary test method (8) All Nets This is a basic method of high voltage insulation test: Engaging measuring point A with high voltage and others with the ground then observing leak current and insulation value. Next, engaging measuring point B with high voltage and others with the ground then observing leak current and insulation value, and so on Finally, you are able to verify if all the test points have passed the high voltage insulation test. The total cycles of this test is N-1, and it allows you obtain the insulation and leak current value of each test point although the speed is rather slow. All net test method 51

53 (9) Gnd PIN Set up ground connection points (10) Test Rate SLOW: A test method emphasized on measured value stability. NORM: A test method balanced between measured value stability and test speed. FAST: A test method without shift time when the test specifications are known. Required conditions for using Fast test: 1. Fast test is designed for DUT with a fixed range of insulation R-values. It has short test duration as the shift time is removed for aiming at highest test productivity. 2. Fast test can only use 1V for 1M ohm, and 1uA is extremely low current. 3. Set up accurate test specifications, i.e. if the test specification asks for 100M ohm, then resistance range should be higher than the maximum expected value: 100M ohm. 4. Test duration is adjusted according to DUT. (11) Max. Pin Set up the maximum test points of Binary test method. Press S6 [Next Page], LCD screen displays: (1) V ramp time Setup voltage rising time of DC insulation and AC withstand voltage test. The range of voltage climbing time for DC insulation is 0~64 sections, the climbing-speed would be faster with a shorter time. 52

54 (2) Arc detect You may choose to turn on or turn off arc detection function. (3) Single node This function can verify a loop-free condition. You may choose to turn on or turn off this function. (4) DC arc sensitivity Set up DC arc sensitivity, a lower value indicates better sensitivity, a higher value represents lower sensitivity. (5) AC arc sensitivity Setting up AC arc sensitivity, a lower value indicates better sensitivity, a higher value represents lower sensitivity. (6) A Port Max. Pin Setting up the last test point of A (B, C, D, E, F, G, H) PORT 4.2 Implement test After completing above setups, you can now proceed with test Implementations. There are two types of implementations varied by operation steps: Real Time Test and Existed Test. Please find details as follows: Real-Time Test Utilize the test conditions saved in the main memory to perform tests on DUT. This is the most common test implementation, please find instructions as follows: (1) First please check if all the test conditions are correct. (2) Press [Mode] to display Test Mode Setup menu 53

55 (3) Confirm the test conditions or revise accordingly. (4) Press [EXIT] to go back to home screen after confirmation. (5) Press [TEST] to start the test. (6) Press [EXIT] after the test is completed or terminate the operating steps Existed Test Import existed files from the memory of this tester to its main memory then perform tests. Please find instruction as follows: (1) Press [File] (2) Use [ ] or [ ] to move the cursor then select the file that you would like to import. (3) Press [Enter] for confirmation,the test will start to import the selected file to its main memory. (4) LCD would display the file name that you have just selected on home screen to confirm that the process is completed. (5) Press [EXIT] to go back to home screen. (6) Press [Mode] to display Test Mode Setup menu. (7) Confirm the test conditions or revise accordingly. (8) Press [EXIT] to go back to home screen after confirmation. (9) Press [TEST] to start the test. (10) Press [EXIT] after the test is completed or terminate the operating steps. 54

56 4.3 File You may choose from Choosing files/deleting files/sorting files to manage and utilize the files, please find instructions as follows: Choosing files Import the desired files from ROM to main memory of the tester for various usages, e.g. Test, Edit, Print, etc. Please find instructions as follows: (1) Press [File] (2) LCD screen displays: (3) Use [ ] or [ ] to move the cursor then select the file that you would like to import. (4) Press [Enter] for confirmation. (5) The tester will start to import the selected file to its main memory. (6) LCD screen would display the file name that you have just imported to confirm that the process is completed Sequence test When a DUT is ready for several tests, you may set up a running sequence to simplify the procedures and reduce test duration. (1) Press [File] then S1 [EDIT STEP]. 55

57 (2) LCD screen displays: (3) Press S3[SET], LCD screen displays: (4) Use [ ] or [ ] to move cursor then select and setup the test sequence of DUT. (5) Example: If we want to select EX1, EX2, EX3 three files. (6) Use [ ] or [ ] to highlight EX1 then press S3[SET]. (7) LCD screen displays: 56

58 Next, use [ ] or [ ] to highlight EX2 then press S3 [SET]. (8) LCD screen displays: (9) Continue to use [ ] or [ ] to highlight EX3 then press S3 [SET]. (10) LCD screen displays: (11) Press S4 [OK], LCD screen displays as follows: 57

59 (12) The test running sequence is established. You may use S2 [LEARN ] for setting up the same function: (13) Example: When the DUT is engaged, press S2 [LEARN], LCD screen displays as follows: (14) Press S1[Learn ] to establish first step, LCD screen displays as follows: (15) Follow the same pattern to establish second, third step, etc. If we have established total five steps, the LCD would display as follows after we press S3 [OK]: 58

60 (16) The test running sequence has been established. (17) Press S3[STEP TEST] or [TEST],LCD screen displays: (18) Undergone test step 1, LCD screen displays: 59

61 (19)The result of step 1 is PASS, LCD screen displays {step 2 } (20) Follow the same patter and finish all these five steps,lcd screen displays : (21) All the test steps have been executed. Caution 1. The tester will start auto (O/S) scan after every test step is completed and will not proceed with following step unless the (O/S) status has been changed. 2. If you want the tester to proceed with following test step and ignore (O/S) status change, please reset {startup mode} as Continuous of a test step. 60

62 4.3.3 Creating New File Establish new files in ROM, please find instructions as follows: (1) Press [File] (2) Press S2 [New]. (3) LCD screen displays: (4) Input the file name (5) Make sure that you have entered the correct file name then press [Enter] to create the file Uploading Single File Upload single file to USB disk, please find instructions as follows: (1) Press [File] then use [ ] or [ ]to move cursor, highlight desired file, insert USB disk to the corresponding port on the front panel. (2) Press S3 [UPLOAD]. (3) LCD screen displays: 61

63 (4) Confirm the file name that you want to upload then press [Enter] to complete the process Uploading All Files Upload all files to USB disk, please find instructions as follows: (1) Press [File]. (2) Press S4 [Up all] to upload the files. (3) LCD screen displays: 62

64 4.3.6 Deleting Files Delete files in the ROM permanently to prevent them from taking up too much space. Please instructions as follows: (1) Use [ ] or [ ] to move the cursor then select the file that you would like to delete. (2) Press S5 [Deleting file] to delete the file. Press [SHIFT] +S5 [Deleting file] to delete all the files. (3) LCD screen displays: (4) Confirm the file name that you want to delete then press [Enter] to complete the process Sorting files You may sort the files by four orders, please find instruction as follows: (1) Press [File]. (2) Press S6 [SORT] to arrange files. (3) LCD screen displays: 63

65 1. Unsorted files 2. Press S6 [SORT] to arrange files. 3. Sorted files. 64

66 4.3.8 Importing Files Import files from USB DISK to the tester, please find instruction as follows: (1) Press [SHIFT]+[File]. (2) LCD screen displays: 1. All the files in USB disk in Importing files menu. 2. Press S1 [PROG] or S4 [SEL ALL] to choose the files that you want to import. Otherwise you can press S5 [Cancel] to remove the selection. 3. Use [ ] or [ ] select files and press S1 [PROG] to remark the files Press S3 [IMP SEL] to import the files. 65

67 APPENDIX A Transmission Cable Configuration 1. RS-232C CABLE Baud Rate: bps Character Length: 8bits Stop Bit: One Bit Parity: Non-Parity Character: ASCII Character Function 8740 Controller RxD Pin2 Pin3 TxD Pin3 Pin2 GND Pin5 Pin5 2. PRINTER CABLE 25-PIN 36-PIN S i g n a l connector (male) connector (male) 1 1 STROBE 2 2 DATA DATA DATA DATA DATA DATA DATA DATA ACKNLG BUSY SLCT 66

68 18 ~ ~ 30, 33 GND 8740 REMOTE 15-PIN Connector 1 CTL0 9 EGND 2 CTL1 10 SW1 3 CTL2 11 SW2 4 CTL3 12 RESET 5 CTL D 6 CTL D 7 CTL6 15 EGND 8 CTL7 EGND + SW1 Start testing after short circuit (The push button [TEST] on front panel performs the same function) EGND+ SW2 Exit after short circuit (The push button [Exit] on front panel performs the same function). EGND+ EGND Reset after short circuit (The push button [Reset] on front panel performs the same function). Equipment EGND & GND have insulation designs to interface various zero level electric potential devices. CTL[7:0] Open collector output, high electric potential is provide through external pull up resistors.ctl 0, CTL 2, CTL 3 are output signals under testing and defined as follows: Single DUT and Test Running Sequence CTL0 CTL1 CTL2 Start to test During high voltage testing PASS 67

69 CTL3 FAIL MultDut signal Multiple DUT CTL0 CTL1 CTL2 CTL3 CTL4 CTL5 CTL6 CTL7 Start to test During high voltage testing All PASS All FAIL DUT 1 FAIL DUT 2 FAIL DUT 3 FAIL DUT 4 FAIL +5D and +12D maximum output current:100ma CTL0 ~ CTL1 Please find internal circuit diagram as follows: CTL 0 CTL 7 68

70 APPENDIX B Test Range and Function Item Symbol Measurement range Tolerance Minimum test voltage Resistance R 0.10 ~ 1.99 ±20% R 2.00 ~ 4.99 ±10% R 5.00 ~ ±5% R ~ 99.99K ±2% R 100.0K ~ 199.9K ±2% R 200.0K ~ 499.9K ±2% R 500.0K ~ 999.9K ±2% R 1.00M ~1.99M ±5% R 2.00 M ~ 4.99M ±5% R 5.00 M ~ 9.99 M ±5% R 10.0M ~ 20.0 M ±10% Capacitance C 1pF~19.99pF ±20% C 20.00pF~39.99pF ±10% C 40.00Pf ~ 1uF ±5% Conductance CON 0.1 ~ 50.0 ±1% D Insulation IS 1M ~ 1.99M ±10% 50V resistance IS 2.00 M ~ 4.99 M ±10% 50V IS 5.00 M ~ 9.99 M ±10% 50V IS M ~ M ±10% 50V IS M ~ M ±10% 50V IS M ~ M ±10% 100V IS M ~ M ±10% 200V IS M ~ 499.9M ±20% 500V IS 500 M ~ M ±20% 1000V Diode D 0.6 ~ 6.8V ±25% >=7.0V

71 Open/Short O/S 2K ~ 100K ±10% threshold Momentary 20 ~ 2K ±10% conductance test Single side test 1pF~999pF ±20% HIPOT leak 0.02mA~0.0499mA ±50% current 0.05mA~0.099mA ±20% 0.1mA~0.199mA ±20% 0.2mA~0.499mA ±20% 0.5mA~4.99mA ±10% 70

72 APPENDIX C Technical Specification Advanced features Programmable continuous test Pin search Self-diagnosis Self-calibration and zero- setting Basic accuracy 5% Test scan mode Auto/short circuit scan interchangeable Measurement signal source Low voltage measurement signals Rated output 5Vdc 5% Accuracy DC insulation/ac withstand voltage test 8740-FA 50~1500VDC / 100~1000VAC 8740-NA 50~1000VDC / 100~700VAC 8740-N 50~1000VDC / V Resolution High voltage output accuracy ±5% Accuracy Display/Sound device 320x240 Resolution LCD screen 6-digits display Pass/Fail LED red green indicator lights/screen display/sound Measuring contacts 128 independent measuring contacts Expandable to 256 measuring contacts High voltage calibration +- output ports Pin search terminal Control panel System/Fast/Edit/Function push buttons group Interface RS-232 Communication transmission 71

73 Storage Power supply port(only for future connection software) Printer port Remote port USB port (Test result/test profile/system update) Built-in 2048KB SRAM Maximum 250 test profiles storage Built-in CR2032 battery 115/230 Vac switchable voltage input 10% 60/50Hz 72

74 APPENDIX D Version 2015/10/14 V1.0 First version 2015/10/14 V1.01 Spec revised,adding USB feature description 2015/11/18 V1.02 Revise UART and Remote port description 2015/12/9 V1.03 Add Required conditions for using Fast test description 73