256K X28HC256 32K x 8 Bit

Transcription

1 256K X28HC256 32K x 8 Bit 5 Volt, Byte Alterable EEPROM FEATURES Access time: 70ns Simple byte and page write Single 5V supply No external high voltages or V PP control circuits Self-timed No erase before write No complex programming algorithms No overerase problem Low power CMOS Active: 60mA Standby: 500µA Software data protection Protects data against system level inadvertent writes High speed page write capability Highly reliable Direct Write cell Endurance: 1,000,000 cycles Data retention: 100 years Early end of write detection DATA polling Toggle bit polling DESCRIPTION The X28HC256 is a second generation high performance CMOS 32K x 8 EEPROM. It is fabricated with Xicor s proprietary, textured poly floating gate technology, providing a highly reliable 5 Volt only nonvolatile memory. The X28HC256 supports a 128-byte page write operation, effectively providing a 24µs/byte write cycle, and enabling the entire memory to be typically rewritten in less than 0.8 seconds. The X28HC256 also features DATA Polling and Toggle Bit Polling, two methods of providing early end of write detection. The X28HC256 also supports the JEDEC standard Software Data Protection feature for protecting against inadvertent writes during power-up and power-down. Endurance for the X28HC256 is specified as a minimum 1,000,000 write cycles per byte and an inherent data retention of 100 years. BLOCK DIAGRAM X Buffers Latches and Decoder 256Kbit EEPROM Array A 0 A 14 Address Inputs Y Buffers Latches and DECODER I/O Buffers and Latches Control Logic and Timing I/O 0 I/O 7 Data Inputs/Outputs V CC V SS Characteristics subject to change without notice. 1 of 23

2 PIN CONFIGURATION A 14 A 12 A 7 A 6 A 5 A 4 A 3 A 2 A 1 A 0 I/O 0 Plastic DIP RDIP Flat Plastic SOIC X28HC V CC A 13 A 8 A 9 A 11 A 10 I/O 7 I/O 6 A 6 A 5 A 4 A 3 A 2 A 1 A 0 NC I/O 0 A A 12 LCC PLCC A 14 NC V CC X28HC256 (Top View) A A 8 A 9 A 11 NC A 10 I/O 7 I/O 6 A 2 A 1 A 0 I/O 0 I/O1 I/O2 NC VSS NC I/O 3 I/O4 I/O 5 I/O6 I/O7 A TSOP X28HC256 PGA A 3 A 4 A 5 A 6 A 7 A 12 A 14 NC V CC NC A 13 A 8 A 9 A 11 I/O 1 I/O 2 V SS I/O 5 I/O 4 I/O 3 I/O 1 I/O 2 V SS NC I/O 3 I/O 4 I/O 5 I/O 1 I/O I/O 0 11 A 0 10 I/O 3 15 V SS 14 I/O 5 17 I/O 4 16 I/O 6 18 I/O 7 19 A 1 9 A 3 7 A 5 5 A 2 8 X28HC256 A 4 6 A 12 V CC A 9 24 A A A 8 25 A 6 A 7 A A (Bottom View) PIN DESCRIPTIONS Addresses (A 0 A 14 ) The Address inputs select an 8-bit memory location during a read or write operation. Chip Enable () The Chip Enable input must be LOW to enable all read/ write operations. When is HIGH, power consumption is reduced. Output Enable () The Output Enable input controls the data output buffers, and is used to initiate read operations. Data In/Data Out (I/O 0 I/O 7 ) Data is written to or read from the X28HC256 through the I/O pins. Write Enable () The Write Enable input controls the writing of data to the X28HC256. PIN NAMES Symbol Description A 0 A 14 Address Inputs I/O 0 I/O 7 Data Input/Output Write Enable Chip Enable Output Enable V CC +5V V SS Ground NC No Connect Characteristics subject to change without notice. 2 of 23

3 DEVI OPERATION Read Read operations are initiated by both and LOW. The read operation is terminated by either or returning HIGH. This two line control architecture eliminates bus contention in a system environment. The data bus will be in a high impedance state when either or is HIGH. Write Write operations are initiated when both and are LOW and is HIGH. The X28HC256 supports both a and controlled write cycle. That is, the address is latched by the falling edge of either or, whichever occurs last. Similarly, the data is latched internally by the rising edge of either or, whichever occurs first. A byte write operation, once initiated, will automatically continue to completion, typically within 3ms. Page Write Operation The page write feature of the X28HC256 allows the entire memory to be written in typically 0.8 seconds. Page write allows up to one hundred twenty-eight bytes of data to be consecutively written to the X28HC256, prior to the commencement of the internal programming cycle. The host can fetch data from another device within the system during a page write operation (change the source address), but the page address (A 7 through A 14 ) for each subsequent valid write cycle to the part during this operation must be the same as the initial page address. The page write mode can be initiated during any write operation. Following the initial byte write cycle, the host can write an additional one to one hundred twentyseven bytes in the same manner as the first byte was written. Each successive byte load cycle, started by the HIGH to LOW transition, must begin within 100µs of the falling edge of the preceding. If a subsequent HIGH to LOW transition is not detected within 100µs, the internal automatic programming cycle will commence. There is no page write window limitation. Effectively the page write window is infinitely wide, so long as the host continues to access the device within the byte load cycle time of 100µs. Write Operation Status Bits The X28HC256 provides the user two write operation status bits. These can be used to optimize a system write cycle time. The status bits are mapped onto the I/O bus as shown in Figure 1. Figure 1. Status Bit Assignment I/O DATA Polling (I/O 7 ) The X28HC256 features DATA Polling as a method to indicate to the host system that the byte write or page write cycle has completed. DATA Polling allows a simple bit test operation to determine the status of the X28HC256. This eliminates additional interrupt inputs or external hardware. During the internal programming cycle, any attempt to read the last byte written will produce the complement of that data on I/O 7 (i.e., write data = 0xxx xxxx, read data = 1xxx xxxx). Once the programming cycle is complete, I/O 7 will reflect true data. Toggle Bit (I/O 6 ) DP TB Reserved Toggle Bit DATA Polling The X28HC256 also provides another method for determining when the internal write cycle is complete. During the internal programming cycle I/O 6 will toggle from HIGH to LOW and LOW to HIGH on subsequent attempts to read the device. When the internal cycle is complete the toggling will cease, and the device will be accessible for additional read and write operations. Characteristics subject to change without notice. 3 of 23

4 DATA POLLING I/O 7 Figure 2. DATA Polling Bus Sequence Last Write I/O 7 V IH HIGH Z V OH V OL X28HC256 Ready A 0 A 14 An An An An An An An Figure 3. DATA Polling Software Flow Write Data DATA Polling can effectively halve the time for writing to the X28HC256. The timing diagram in Figure 2 illustrates the sequence of events on the bus. The software flow diagram in Figure 3 illustrates one method of implementing the routine. Writes Complete? No Yes Save Last Data and Address Read Last Address IO 7 Compare? No Yes X28HC256 Ready Characteristics subject to change without notice. 4 of 23

5 THE TOGGLE BIT I/O 6 Figure 4. Toggle Bit Bus Sequence Last Write I/O 6 V OH HIGH Z * * V OL X28C512/513 Ready * I/O 6 Beginning and ending state of I/O 6 will vary. Figure 5. Toggle Bit Software Flow Last Write Yes Load Accum From Addr n Compare Accum with Addr n Compare ok? Yes X28C256 Ready The Toggle Bit can eliminate the chore of saving and fetching the last address and data in order to implement DATA Polling. This can be especially helpful in an array comprised of multiple X28HC256 memories that is frequently updated. The timing diagram in Figure 4 illustrates the sequence of events on the bus. The software flow diagram in Figure 5 illustrates a method for polling the Toggle Bit. No HARDWARE DATA PROTECTION The X28HC256 provides two hardware features that protect nonvolatile data from inadvertent writes. Default V CC Sense All write functions are inhibited when V CC is 3.5V typically. Write Inhibit Holding either LOW, HIGH, or HIGH will prevent an inadvertent write cycle during power-up and power-down, maintaining data integrity. SOFTWARE DATA PROTECTION The X28HC256 offers a software-controlled data protection feature. The X28HC256 is shipped from Xicor with the software data protection NOT ENABLED; that is, the device will be in the standard operating mode. In this mode data should be protected during power-up/ down operations through the use of external circuits. The host would then have open read and write access of the device once V CC was stable. The X28HC256 can be automatically protected during power-up and power-down (without the need for external circuits) by employing the software data protection feature. The internal software data protection circuit is enabled after the first write operation, utilizing the software algorithm. This circuit is nonvolatile, and will remain set for the life of the device unless the reset command is issued. Once the software protection is enabled, the X28HC256 is also protected from inadvertent and accidental writes in the powered-up state. That is, the software algorithm must be issued prior to writing additional data to the device. Characteristics subject to change without notice. 5 of 23

6 SOFTWARE ALGORITHM Selecting the software data protection mode requires the host system to precede data write operations by a series of three write operations to three specific addresses. Refer to Figure 6 and 7 for the sequence. The three-byte sequence opens the page write window, enabling the host to write from one to one hundred twenty-eight bytes of data. Once the page load cycle has been completed, the device will automatically be returned to the data protected state. SOFTWARE DATA PROTECTION Figure 6. Timing Sequence Byte or Page Write V CC 0V (V CC ) Data Address AAA AAA A Writes ok t WC Write Protected t BLC MAX Byte or Age Figure 7. Write Sequence for Software Data Protection Write Data AA to Address 5555 Write Data 55 to Address 2AAA Regardless of whether the device has previously been protected or not, once the software data protection algorithm is used and data has been written, the X28HC256 will automatically disable further writes unless another command is issued to cancel it. If no further commands are issued the X28HC256 will be write protected during power-down and after any subsequent power-up. Note: Once initiated, the sequence of write operations should not be interrupted. Write Data A0 to Address 5555 Write Data XX to Any Address Write Last Byte to Last Address Byte/Page Load Enabled Optional Byte/Page Load Operation After t WC Re-Enters Data Protected State Characteristics subject to change without notice. 6 of 23

7 RESETTING SOFTWARE DATA PROTECTION Figure 8. Reset Software Data Protection Timing Sequence V CC Data Address AAA AAA 80 AA AAA 5555 t WC Standard Operating Mode Figure 9. Write Sequence for resetting Software Data Protection Write Data AA to Address 5555 Write Data 55 to Address 2AAA Write Data 80 to Address 5555 Write Data AA to Address 5555 Write Data 55 to Address 2AAA Write Data 20 to Address 5555 After t WC, Re-Enters Unprotected State In the event the user wants to deactivate the software data protection feature for testing or reprogramming in an EEPROM programmer, the following six step algorithm will reset the internal protection circuit. After t WC, the X28HC256 will be in standard operating mode. Note: Once initiated, the sequence of write operations should not be interrupted. SYSTEM CONSIDERATIONS Because the X28HC256 is frequently used in large memory arrays, it is provided with a two line control architecture for both read and write operations. Proper usage can provide the lowest possible power dissipation, and eliminate the possibility of contention where multiple I/O pins share the same bus. To gain the most benefit, it is recommended that be decoded from the address bus and be used as the primary device selection input. Both and would then be common among all devices in the array. For a read operation, this assures that all deselected devices are in their standby mode, and that only the selected device(s) is/are outputting data on the bus. Because the X28HC256 has two power modes, standby and active, proper decoupling of the memory array is of prime concern. Enabling will cause transient current spikes. The magnitude of these spikes is dependent on the output capacitive loading of the l/os. Therefore, the larger the array sharing a common bus, the larger the transient spikes. The voltage peaks associated with the current transients can be suppressed by the proper selection and placement of decoupling capacitors. As a minimum, it is recommended Characteristics subject to change without notice. 7 of 23

8 that a 0.1µF high frequency ceramic capacitor be used between V CC and V SS at each device. Depending on the size of the array, the value of the capacitor may have to be larger. In addition, it is recommended that a 4.7µF electrolytic bulk capacitor be placed between V CC and V SS for each eight devices employed in the array. This bulk capacitor is employed to overcome the voltage droop caused by the inductive effects of the PC board traces. Characteristics subject to change without notice. 8 of 23

9 ABSOLUTE MAXIMUM RATINGS Temperature under bias X28HC C to +85 C X28HC256I, X28HC256M C to +135 C Storage temperature C to +150 C Voltage on any pin with respect to V SS... 1V to +7V D.C. output current... 10mA Lead temperature (soldering, 10 seconds) C COMMENT Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device (at these or any other conditions above those indicated in the operational sections of this specification) is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. RECOMMENDED OPERATING CONDITIONS Temperature Min. Max. Supply Voltage Limits Commercial 0 C +70 C Industrial 40 C +85 C Military 55 C +125 C X28HC256 5V ±10% D.C. OPERATING CHARACTERISTICS (Over recommended operating conditions unless otherwise specified.) Limits Symbol Parameter Min. Typ. (7) Max. Unit Test Conditions I CC I SB1 I SB2 V CC active current (TTL Inputs) V CC standby current (TTL Inputs) V CC standby current (CMOS Inputs) ma = = V IL, = V IH, All I/O s = open, address inputs =.4V/2.4V f = 10MHz 1 2 ma = V IH, = V IL, All I/O s = open, other inputs = V IH µa = V CC 0.3V, = GND, All I/Os = open, other inputs = V CC 0.3V I LI Input leakage current 10 µa V IN = V SS to V CC I LO Output leakage current 10 µa V OUT = V SS to V CC, = V IH V (2) ll Input LOW voltage V (2) V IH Input HIGH voltage 2 V CC + 1 V V OL Output LOW voltage 0.4 V I OL = 6mA V OH Output HIGH voltage 2.4 V I OH = 4mA Notes: (1) Typical values are for T A = 25 C and nominal supply voltage. (2) V IL min. and V IH max. are for reference only and are not tested. POR-UP TIMING Symbol Parameter Max. Unit (3) t PUR Power-up to read 100 µs t (3) PUW Power-up to write 5 ms Note: (3) This parameter is periodically sampled and not 100% tested. Characteristics subject to change without notice. 9 of 23

10 CAPACITAN T A = +25 C, f = 1MHz, V CC = 5V Symbol Test Max. Unit Conditions C (9) I/O Input/output capacitance 10 pf V I/O = 0V (9) C IN Input capacitance 6 pf V IN = 0V ENDURAN AND DATA RETENTION Parameter Min. Max. Unit Endurance 1,000,000 Cycles Data retention 100 Years A.C. CONDITIONS OF TEST Input pulse levels 0V to 3V Input rise and fall times 5ns Input and output timing levels 1.5V SYMBOL TABLE WAVEFORM INPUTS OUTPUTS Must be steady Will be steady MODE SELECTION Mode I/O Power L L H Read D OUT active L H L Write D IN active H X X Standby and High Z standby write inhibit X L X Write inhibit X X H Write inhibit May change from LOW to HIGH May change from HIGH to LOW Don t Care: Changes Allowed N/A Will change from LOW to HIGH Will change from HIGH to LOW Changing: State Not Known Center Line is High Impedance EQUIVALENT A.C. LOAD CIRCUIT 5V 1.92KΩ OUTPUT 1.37KΩ 30pF Characteristics subject to change without notice. 10 of 23

11 A.C. CHARACTERISTICS (Over the recommended operating conditions, unless otherwise specified.) Read Cycle Limits X28HC X28HC X28HC X28HC Symbol Parameter Min. Max. Min. Max. Min. Max. Min. Max. Unit (5) t RC Read cycle time ns (5) t Chip enable access time ns (5) t AA Address access time ns t Output enable access time ns (4) t LZ LOW to active output ns (4) t OLZ LOW to active output ns (4) t HZ HIGH to high Z output ns (4) t OHZ HIGH to high Z output ns t OH Output hold from address change ns Read Cycle t RC Address t t V IH t OLZ t OHZ t LZ t OH t HZ Data I/O HIGH Z Data Valid Data Valid t AA Notes: (4) t LZ min., t HZ, t OLZ min. and t OHZ are periodically sampled and not 100% tested, t HZ and t OHZ are measured with CL = 5pF, from the point when, return HIGH (whichever occurs first) to the time when the outputs are no longer driven. (5) For faster 256K products, refer to X28VC256 product line. Characteristics subject to change without notice. 11 of 23

12 Write Cycle Limits Symbol Parameter Min. Typ. (6) Max. Unit t (7) WC Write cycle time 3 5 ms t AS Address setup time 0 ns t AH Address hold time 50 ns t CS Write setup time 0 ns t CH Write hold time 0 ns t CW pulse width 50 ns t S HIGH setup time 0 ns t H HIGH hold time 0 ns t WP pulse width 50 ns (8) t WPH HIGH recovery (page write only) 50 ns t DV Data valid 1 µs t DS Data setup 50 ns t DH Data hold 0 ns (8) t DW Delay to next write after polling is true 10 µs t BLC Byte load cycle µs Notes: (6) Typical values are for T A = 25 C and nominal supply voltage. (7) t WC is the minimum cycle time to be allowed from the system perspective unless polling techniques are used. It is the maximum time the device requires to automatically complete the internal write operation. (8) t WPH and t DW are periodically sampled and not 100% tested. Controlled Write Cycle Address t WC t AS t AH t CS t CH t S t H t WP Data In Data Valid Data Out t DS HIGH Z t DH Characteristics subject to change without notice. 12 of 23

13 Controlled Write Cycle t WC Address t AS t AH t CW t S t H t CS t CH Data In Data Valid t DS t DH Data Out HIGH Z Page Write Cycle (9) t WP t BLC t WPH Address (10) I/O Last Byte Byte 0 Byte 1 Byte 2 Byte n Byte n+1 Byte n+2 *For each successive write within the page write operation, A 7 A 15 should be the same or writes to an unknown address could occur. t WC Notes: (9) Between successive byte writes within a page write operation, can be strobed LOW: e.g. this can be done with and HIGH to fetch data from another memory device within the system for the next write; or with HIGH and LOW effectively performing a polling operation. (10)The timings shown above are unique to page write operations. Individual byte load operations within the page write must conform to either the or controlled write cycle timing. Characteristics subject to change without notice. 13 of 23

14 DATA Polling Timing Diagram (11) Address A n A n A n t H t S t DW I/O 7 D IN = X D OUT = X D OUT = X t WC Toggle Bit Timing Diagram (11) t H t S I/O 6 HIGH Z * * t DW t WC * I/O 6 beginning and ending state will vary, depending upon actual t WC. Note: (11)Polling operations are by definition read cycles and are therefore subject to read cycle timings. Characteristics subject to change without notice. 14 of 23

15 PACKAGING INFORMATION 28-Lead Ceramic Flat Pack Type F Pin 1 Index (0.48) (0.38) (1.27) BSC (18.80) Max (1.14) Max (0.15) (0.08) (11.18) Max (3.30) (2.29) (9.40) (6.35) Typ Plcs (0.76) Min (4.57) Min (1.14) (0.66) NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) Characteristics subject to change without notice. 15 of 23

16 PACKAGING INFORMATION 28-Lead Ceramic Pin Grid Array Package Type K A (0.20) (1.27) A NOTE: LEADS 4,12,18 & Typ (2.54) All Leads Pin 1 Index (2.03) (1.78) (2.03) 4 Corners (1.78) (2.79) (2.29) (1.83) (1.57) (0.51) (0.41) (16.76) (16.26) A (14.25) (13.75) A (4.70) (4.44) NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) Characteristics subject to change without notice. 16 of 23

17 PACKAGING INFORMATION 28-Lead Plastic Dual In-Line Package Type P (37.34) (35.56) (14.15) (12.95) Pin 1 Index Pin (33.02) Ref (2.16) (1.02) Seating Plane (4.06) (3.05) (4.06) (3.17) (0.76) (0.38) (2.79) (2.29) (1.65) (1.02) (0.56) (0.36) (15.88) (14.99) Typ (0.25) 0 15 NOTE: 1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 2. PACKAGE DIMENSIONS EXCLUDE MOLDING FLASH Characteristics subject to change without notice. 17 of 23

18 PACKAGING INFORMATION 28-Lead Plastic Small Outline Gull Wing Package Type S (7.59) (7.37) (10.64) (10.01) (0.508) (0.356) (18.11) (17.70) (2.67) (2.34) Base Plane (1.270) BSC (0.30) (0.08) Seating Plane (0.5080) (0.2540) X " Typical (0.32) (0.20) 0.42" Max " Typical (0.8890) (0.4064) FOOTPRINT 0.030" Typical 28 Places NOTES: 1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 2. FORMED LEAD SHALL BE PLANAR WITH RESPECT TO ONE ANOTHER WITHIN INCHES Characteristics subject to change without notice. 18 of 23

19 PACKAGING INFORMATION 32-Lead Hermetic Dual In-Line Package Type D (42.95) Max (15.49) (12.70) Pin (0.13) Min (2.54) Max. Seating Plane (5.90) Max (3.81) Min (1.52) (0.38) (5.08) (3.18) (2.79) (2.29) Typ (2.54) (1.65) (0.84) Typ (1.40) (0.58) (0.36) Typ (0.46) (15.75) (14.99) Typ (15.60) (0.38) (0.20) 0 15 NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) Characteristics subject to change without notice. 19 of 23

20 PACKAGING INFORMATION 32-Pad Ceramic Leadless Chip Carrier Package Type E (7.62) BSC (0.38) (0.08) (3.81) BSC (0.51) x 45 Ref. Pin (2.41) (1.91) (0.56) DIA (0.15) (5.08) BSC (0.38) Min (1.39) (1.14) TYP. (4) PLCS (0.71) (0.56) (32) Plcs (1.27) BSC (1.02) x 45 Ref. Typ. (3) Plcs (11.63) (11.22) (11.63) (3.05) (1.52) (2.24) (1.27) (14.22) (13.71) (14.17) (10.16) BSC Pin 1 Index Corner NOTE: 1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 2. TOLERAN: ±1% NLT ±0.005 (0.127) Characteristics subject to change without notice. 20 of 23

21 PACKAGING INFORMATION 32-Lead Plastic Leaded Chip Carrier Package Type J (10.67) 0.050" Typical 0.030" Typical 32 Places (1.27) Typ " Typical 0.400" 0.050" Typical (1.14) x (12.57) (12.32) Typ (12.45) (11.51) (11.35) Typ (11.43) (7.62) Ref (0.53) (0.33) Typ (0.43) FOOTPRINT 0.300" Ref " Seating Plane ±0.004 Lead CO Planarity (0.38) (2.41) (1.52) (3.56) (2.45) Typ (3.45) (1.22) (1.07) Pin (14.05) (13.89) Typ (13.97) (10.16) Ref (15.11) (14.86) Typ (14.99) 3 Typ. NOTES: 1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS) 2. DIMENSIONS WITH NO TOLERAN FOR REFEREN ONLY Characteristics subject to change without notice. 21 of 23

22 PACKAGING INFORMATION 32-Lead Thin Small Outline Package (TSOP) Type T See Note (0.492) (0.484) Pin #1 Ident. O 0.76 (0.03) 0.50 (0.0197) BSC See Note (0.315) 7.98 (0.314) 0.26 (0.010) 0.14 (0.006) 1.18 (0.046) 1.02 (0.040) 0.58 (0.023) 0.42 (0.017) (0.557) (0.544) 0.17 (0.007) 0.03 (0.001) Seating Plane ± 0.05 (0.583 ± 0.002) Solder Pads 0.30 ± 0.05 (0.012 ± 0.002) Typical 32 Places 15 Eq. Spc ± ± = 7.50 ± 0.06 (0.295 ± ) Overall Tol. Non-Cumulative FOOTPRINT 0.17 (0.007) 0.03 (0.001) 1.30 ± 0.05 (0.051 ± 0.002) 0.50 ± 0.04 ( ± ) NOTE: 1. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS (INCHES IN PARENTHESES). Characteristics subject to change without notice. 22 of 23

23 Ordering Information X28HC256 X X -X Device Access Time 70 = 70ns 90 = 90ns 12 = 120ns 15 = 150ns Temperature Range Blank = Commercial = 0 C to +70 C I = Industrial = 40 C to +85 C M = Military = 55 C to +125 C MB = MIL-STD-883 Package P = 28-Lead Plastic DIP D = 28-Lead RDIP J = 32-Lead PLCC S = 28-Lead plastic SOIC E = 32-Pad LCC K = 28-Pin grid array F = 28-Lead flat pack T = 32-Lead TSOP LIMITED WARRANTY Xicor, Inc Patents Pending Devices sold by Xicor, Inc. are covered by the warranty and patent indemnification provisions appearing in its Terms of Sale only. Xicor, Inc. makes no warranty, express, statutory, implied, or by description regarding the information set forth herein or regarding the freedom of the described devices from patent infringement. Xicor, Inc. makes no warranty of merchantability or fitness for any purpose. Xicor, Inc. reserves the right to discontinue production and change specifications and prices at any time and without notice. Xicor, Inc. assumes no responsibility for the use of any circuitry other than circuitry embodied in a Xicor, Inc. product. No other circuits, patents, or licenses are implied. TRADEMARK DISCLAIMER: Xicor and the Xicor logo are registered trademarks of Xicor, Inc. AutoStore, Direct Write, Block Lock, SerialFlash, MPS, and XDCP are also trademarks of Xicor, Inc. All others belong to their respective owners. U.S. PATENTS Xicor products are covered by one or more of the following U.S. Patents: 4,326,134; 4,393,481; 4,404,475; 4,450,402; 4,486,769; 4,488,060; 4,520,461; 4,533,846; 4,599,706; 4,617,652; 4,668,932; 4,752,912; 4,829,482; 4,874,967; 4,883,976; 4,980,859; 5,012,132; 5,003,197; 5,023,694; 5,084,667; 5,153,880; 5,153,691; 5,161,137; 5,219,774; 5,270,927; 5,324,676; 5,434,396; 5,544,103; 5,587,573; 5,835,409; 5,977,585. Foreign patents and additional patents pending. LIFE RELATED POLICY In situations where semiconductor component failure may endanger life, system designers using this product should design the system with appropriate error detection and correction, redundancy and back-up features to prevent such an occurrence. Xicor s products are not authorized for use in critical components in life support devices or systems. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. Characteristics subject to change without notice. 23 of 23