OMICRON Test Universe 3.10

Transcription

1 OMICRON Test Universe 3.10 What s New OMICRON Page 1 of 9

2 1 General Test Universe 3.10 is a major Test Universe release, compatible with Microsoft Windows 10 and focusing on the new IEC Client/Server module. It also offers many feature improvements and resolves some problems. The new ISIO Connect module (included for free with Test Universe 3.10) is intended for users extending the input/output scope of their test sets by using up to 3 ISIO 200 units with a default configuration. TU 3.10 can work with test files created with any previous Test Universe version, whereas files created with TU 3.10 cannot be opened with older TU versions. The major changes as compared with TU 3.01 are listed in alphabetical order of the components. Many other minor improvements and bug fixes not mentioned here are also implemented. 2 Global Features 2.1 #58900: Windows 10 compatibility Test Universe 3.10 is tested for proper operation also under Microsoft Windows 10 (32 bit or 64 bit). 2.2 Improved handling of high-resolution screens There were some scaling and positioning problems with high-resolution screens, especially when a large Windows font size (for example, 150% or 200%) was selected. This is improved in this release. 2.3 #47583: Korean language support The user interface of Test Universe modules is now also supporting Korean language. 2.4 #26384: Better visualization of data in small cell sizes Many data elements have been changed in a way that data, which do not fit into the current data field size, are marked by an added ellipsis ( ), indicating that the element contains more digits or characters than shown. In many cases, the tooltip for the data element will show the full information. 2.5 #57028: Context menu for phase-wise rotation In several test modules, you now find a context menu option L1 L2 L3 -> L3 L1 L2 or A B C -> C A B etc. (depending on the system settings), which allows you to conveniently cycle the settings through the phase sequence in order to repeat a test or state with exchanged phases. 2.6 #39205: Copy and Paste from Status History You may now copy the log entries in the Status History window to the clipboard via context menu (via rightclick) or Ctrl+C and then be paste them (for example, pressing Ctrl+V) to any text application. OMICRON 2016 Page 2 of 9

3 3 Advanced Differential modules 3.1 #47540: Enhanced trip treatment during pre-fault A trip during pre-fault is now ignored until right before fault incidence. This allows, for example, undervoltage elements to reset during the pre-fault phase. 4 Advanced Distance 4.1 #64411: Support copy & paste of the Z/t diagram You can now copy the Z/t diagram to the clipboard by pressing Shift+Ctrl+F11 shortcut keys, in order to paste it, for example, in a Microsoft Word document. It will appear as scalable vector graphic where supported, otherwise as bitmap of the size at display time. 5 Advanced TransPlay 5.1 #39838: Fine-positioning of synthetic pre-fault Precisely matches the phase angles of a synthetic pre-fault and the following transient data. 5.2 #39837/#41865: All COMTRADE 2013 file formats supported Reading of CFF and CFG files in these formats: ASCII, BINARY, Bin32, and Float32. 6 Annunciation Checker 6.1 #63493: Support of all virtual binary inputs and outputs Allows support of, for example, ISIO 200 units associated with the ISIO Connect tool. 6.2 #56986: Copy/Paste between tables of the test module and Microsoft Excel Copy/paste is supported in both directions. Make sure that you paste valid data and select a data table size in Excel, which corresponds with the table size in the test module for pasting. 7 Autoreclosure 7.1 #64572: Test Object: CB Configuration: CB close time: Maximum increased To allow proper testing of autoreclosure functions set for slow CB drives, the old maximum limit of 1000 ms for the CB close time has been replaced by ms (500 s) in the Test Object. OMICRON 2016 Page 3 of 9

4 8 CMC The firmware update included with this Test Universe version enhances the AuxDC behavior of the CMC test sets for safety reasons: 8.1 #40683: The AuxDC LED turns on when voltages greater than 0 V are output 8.2 #40684: Power-up sequence with default AuxDC voltage In case an AuxDC voltage greater than 0 V is set as power-up default in the CMC, then the LED will blink for 20 seconds during the power-up boot sequence before it changes to continuous light. The actual voltage output only starts once the light is continuous, allowing 20 seconds alert to disconnect any devices from AuxDC (or shutdown the CMC) in case the default power-up voltage comes unexpected. Note that it takes some seconds after switching on the CMC until the blinking starts. 9 Control Center 9.1 #31815: New text formatting shortcut keys Besides using Text ribbon options, you may now format the selected text in an OCC report using shortcut keys: bold (Ctrl+B), italic (Ctrl+I) and/or underline (Ctrl+U). 10 Differential 10.1 #40723: Differential renamed to Single-Phase Differential This option makes the purpose of this module clearer, as compared to the Advanced Differential modules, which perform three-phase tests. 11 Hardware Configuration 11.1 #56983: Better differentiation between Global and Local Hardware Configuration in a Control Center document Since the global hardware configuration embedded in an OCC file has some editing options differing from the local hardware configuration accessible from each embedded test module, but both looked almost the same when opened, they now get specific window titles to avoid confusion. The local hardware configuration shows a hint regarding entries, which can only be changed in the global hardware configuration #56977: Show connector, display name, and connection terminal in report This feature, per default shown in the Long Report setting, enhances the wiring documentation of the test. For ease of report tailoring, two new context menu entries now allow you to add all neutral terminals for documentation and/or to remove all un-routed signals. OMICRON 2016 Page 4 of 9

5 11.3 #54438: PTP: Option to suppress VLAN ID It is now possible to suppress the sending of a VLAN ID by unchecking the Enable VLAN checkbox in the PTP Settings of the Hardware Configuration. Incoming telegrams without a VLAN ID are always accepted #41143/#62365: Improved Rogowski Sensor configuration You can define Rogowski sensor simulation in the Hardware Configuration. There, you can enter the range as High range or Low range. The default is High range, but you can change it in the System Settings (on the TU start screen), Default Values tab. The selected range is now stored with the test document. 12 IEC Client/Server Module NEW This module focuses on working with IEC Client/Server data exchange for testing purposes. It allows setting the testing preconditions (for example, simulation flag, report enabling), executing arbitrarily defined test states with feedback via Client/Server data (data sets, reports), and finally returning to the conditions prior to the test. Each state may be associated with a Client/Server response. Criteria for automatic assessment may be defined. Configuration data may be conveniently imported from SCL files. For more details, see the related Test Universe Help. To use this module, you must purchase a license. 13 ISIO Connect NEW This new module (included with Test Universe) allows simplified connection with up to 3 ISIO 200 units as binary I/O extensions to the CMC test set, by entering their serial numbers. These, up to 24 binary inputs and 24 binary outputs are mapped into the virtual I/O group 11 in the Hardware Configuration. For details, please see the related Help chapter (for example, press F1 from the module). This works both standalone and embedded in a Control Center document. Any differing configurations (for example, other mappings or more than 3 ISIO 200) require the GOOSE Configuration module. 14 License Manager 14.1 #38183: Local language support The user interface now supports all languages as selected on the Test Universe start screen. 15 Overcurrent 15.1 #22750: Enhanced trip treatment during pre-fault A trip during pre-fault is now ignored until right before fault incidence. This allows, for example, undervoltage elements to reset during the pre-fault phase. OMICRON 2016 Page 5 of 9

6 15.2 #28311: Include Directional View diagram in report Now, you can add the directional view (per fault type) to the report. It is preselected in the Long Form of the report setting. Directional behavior needs to be selected in the Test Object #37132: Deviation [%] added to report The trip time deviation in percent now appears in addition to the nominal and the actual trip time #55391: New SEL U4 inverse-time curve This characteristic (called SEL EI curve U4 (new) ) is now offered in the Manage / Select Characteristics dialog of the Test Object. Also, the SEL STI curve U5 parameters have been slightly changed (by less than 1%) according to the new relay implementation (SEL 421) #18970: Informative icons for characteristics types Test Object: Each of the element characteristics in the Manage / Select Characteristics dialog is now tagged with one of four differently colored icon types representing the four different types of characteristics (blue: inverse; orange: I2T; red: IAC; black: value table). 16 PQ Signal Generator 16.1 #40808: LinkToXRIO supported for interharmonic frequency Multi-Incident state now allows linking of the interharmonic frequency to an XRIO value. 17 Pulse Ramping 17.1 #56986: Copy/paste between the fault state table of the test module and Microsoft Excel Copy/paste is supported in both directions. Make sure that you paste valid data and select a data table size in Excel which corresponds with the table size in the test module for pasting. 18 QuickCMC 18.1 #56984: Allow load current settings for pre-fault state You can now select 0%, 10%, 50%, or 100% load from a dropdown list under the Prefault button. The Phasor View shows the resulting currents while the pre-fault state is active. OMICRON 2016 Page 6 of 9

7 18.2 #56974: Enhanced trip treatment during pre-fault A trip (trigger) in the pre-fault state is shown, but does not stop the test even in case On Trigger / Switch off is activated. This allows, for example, undervoltage elements to reset during the pre-fault phase #56986: Copy/paste between tables of the test module and Microsoft Excel Copy/paste is supported in both directions. Make sure that you paste valid data and select a data table size in Excel, which corresponds with the table size in the test module for pasting #57025/#57026: Support negative Power values Now, it is possible to ramp from positive to negative power values or vice-versa. 19 Ramping Module 19.1 #56995: Improved default settings for calculated assessment The calculated assessment entered by default when a new Ramping instance is created was often overlooked and led to a failed test assessment. The Dev.- and Dev.+ settings are now empty by default thus avoiding a test failure due to these calculated criteria while still offering this sample assessment row. 20 State Sequencer 20.1 #56986: Copy/paste between tables of the test module and Microsoft Excel Copy/paste is supported in both directions. Make sure that you paste valid data and select a data table size in Excel which corresponds with the table size in the test module for pasting #57024: End test on binary trigger condition It is now possible to prematurely end the sequence, instead of continuing with the next sequence states, when a defined binary trigger occurs. Otherwise, the sequence continues after the defined elapsed timeout. 21 SVScout (on Test Universe DVD) 21.1 #61188: SVScout version 1.50 included on DVD SVScout is also available as download from the Customer Area of OMICRON 2016 Page 7 of 9

8 22 Test Set Association 22.1 #52240/#56025: Access to web interfaces for all supported devices With the latest firmware upgrades, all current CMC test sets other than CMC 310 have a web interface, which you can now open directly from the Test Set Association tool via context menu (formerly only possible with CMC 850). 23 Test Universe Start screen 23.1 #56972: Define system settings at first startup In order to make users better aware of Test Universe system settings, a dialog is shown the first time Test Universe starts after a new installation, offering typical system settings for review. 24 TransPlay 24.1 #50315: Setting the time delay compensation via command line option A defined time delay compensation is matching the characteristic of the CMC test sets. In case the output is routed to third-party amplifiers via the low-level outputs, you should deselect this compensation. Now, you can also deselect it when launching TransPlay via command line for batch processing. The syntax is: transplay.exe /bat /nodelaycomp For further details, see Test Universe Help, Starting TransPlay with Command Line Parameters. 25 TransView 25.1 #60746: Updated to version 4.57 OMICRON 2016 Page 8 of 9

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