256K x 16 4Mb Asynchronous SRAM

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FP-BGA Commercial Temp Industrial Temp 256K x 16 4Mb Asynchronous SRAM GS74117AX 8, 10, 12 ns 3.3 V V DD Center V DD and V SS Features Fast access time: 8, 10, 12 ns CMOS low power operation: 130/105/95 ma at minimum cycle time Single 3.3 V power supply All inputs and outputs are TTL-compatible Byte control Fully static operation Industrial Temperature Option: 40 to 85 C Package: X: 6 mm x 10 mm Fine Pitch Ball Grid Array package GX: Pb-Free 6 mm x 10 mm Fine Pitch Ball Grid Array package Description The GS74117A is a high speed CMOS Static RAM organized as 262,144 words by 16 bits. Static design eliminates the need for external clocks or timing strobes. The GS operates on a single 3.3 V power supply and all inputs and outputs are TTLcompatible. The GS74117A is available in a 6 x 10 mm Fine Pitch BGA package. Fine Pitch BGA 256K x 16 Bump Configuration 1 2 3 4 5 6 A LB OE A0 A1 A2 NC B DQ1 UB A3 A4 CE DQ16 C DQ3 DQ2 A5 A6 DQ15 DQ14 D VSS DQ4 A17 A7 DQ13 VDD E VDD DQ5 NC A16 DQ12 VSS F DQ6 DQ7 A8 A9 DQ10 DQ11 G DQ8 NC A10 A11 WE DQ9 H NC A12 A13 A14 A15 NC Package X 6 x 10 mm Substrate Top View Pin Descriptions Symbol A0 A17 DQ1 DQ16 CE LB UB WE OE V DD V SS NC Description Address input Data input/output Chip enable input Lower byte enable input (DQ1 to DQ8) Upper byte enable input (DQ9 to DQ16) Write enable input Output enable input +3.3 V power supply Ground No connect Rev: 1.05b 6/2010 1/12 2001, GSI Technology

Block Diagram A0 Address Input Buffer Row Decoder Memory Array A17 Column Decoder CE WE OE Control UB I/O Buffer DQ1 DQ16 Truth Table CE OE WE LB UB DQ1 to DQ8 DQ9 to DQ16 VDD Current H X X X X Not Selected Not Selected ISB1, ISB2 L L Read Read L L H L H Read High Z L X L H L High Z Read L L Write Write L H Write Not Write, High Z H L Not Write, High Z Write IDD L H H X X High Z High Z L X X H H High Z High Z X: H or L Rev: 1.05b 6/2010 2/12 2001, GSI Technology

Absolute Maximum Ratings Parameter Symbol Rating Unit Supply Voltage VDD 0.5 to +4.6 V Input Voltage VIN 0.5 to V DD +0.5 ( 4.6 V max.) V Output Voltage VOUT 0.5 to V DD +0.5 ( 4.6 V max.) V Allowable power dissipation PD 0.7 W Storage temperature TSTG 55 to 150 o C Note: Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional operation shall be restricted to Recommended Operating Conditions. Exposure to higher than recommended voltages for extended periods of time could affect device reliability. Recommended Operating Conditions Parameter Symbol Min Typ Max Unit Supply Voltage for -8/-10/-12 V DD 3.0 3.3 3.6 V Input High Voltage VIH 2.0 V DD +0.3 V Input Low Voltage VIL 0.3 0.8 V Ambient Temperature, Commercial Range Ambient Temperature, Industrial Range TAc 0 70 o C TAI 40 85 o C Notes: 1. Input overshoot voltage should be less than V DD +2 V and not exceed 20 ns. 2. Input undershoot voltage should be greater than 2 V and not exceed 20 ns. Rev: 1.05b 6/2010 3/12 2001, GSI Technology

Capacitance Parameter Symbol Test Condition Max Unit Input Capacitance CIN V IN = 0 V 5 pf Output Capacitance COUT V OUT = 0 V 7 pf Notes: 1. Tested at TA = 25 C, f = 1 MHz 2. These parameters are sampled and are not 100% tested. DC I/O Pin Characteristics Parameter Symbol Test Conditions Min Max Input Leakage Current IIL VIN = 0 to V DD 1 ua 1 ua Output Leakage Current ILO Output High Z VOUT = 0 to V DD 1 ua 1 ua Output High Voltage VOH I OH = 4 ma 2.4 Output Low Voltage VOL I LO = +4 ma 0.4 V Power Supply Currents Parameter Symbol Test Conditions 0 to 70 C 40 to 85 C 8 ns 10 ns 12 ns 8 ns 10 ns 12 ns Unit Operating Supply Current IDD CE VIL All other inputs V IH or VIL Min. cycle time I OUT = 0 ma 130 105 90 140 115 100 ma Standby Current ISB1 CE V IH All other inputs V IH or VIL Min. cycle time 30 25 22 40 35 32 ma Standby Current ISB2 CE V DD 0.2 V All other inputs V DD 0.2 V or 0.2 V 10 20 ma Rev: 1.05b 6/2010 4/12 2001, GSI Technology

AC Test Conditions Parameter Conditions DQ Output Load 1 Input high level VIH = 2.4 V Input low level VIL = 0.4 V 50Ω 30pF 1 Input rise time tr = 1 V/ns VT = 1.4 V Input fall time tf = 1 V/ns Input reference level 1.4 V Output Load 2 Output reference level 1.4 V 3.3 V Output load Fig. 1& 2 DQ 589Ω Notes: 1. Include scope and jig capacitance. 2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted. 3. Output load 2 for tlz, thz, tolz and tohz 5pF 1 434Ω Rev: 1.05b 6/2010 5/12 2001, GSI Technology

AC Characteristics Read Cycle Parameter Symbol -8-10 -12 Min Max Min Max Min Max Unit Read cycle time trc 8 10 12 ns Address access time taa 8 10 12 ns Chip enable access time (CE) tac 8 10 12 ns Byte enable access time (UB, LB) tab 3.5 4 5 ns Output enable to output valid (OE) toe 3.5 4 5 ns Output hold from address change toh 3 3 3 ns Chip enable to output in low Z (CE) Output enable to output in low Z (OE) Byte enable to output in low Z (UB, LB) Chip disable to output in High Z (CE) t t t t LZ OLZ BLZ HZ * 3 3 3 ns * 0 0 0 ns * 0 0 0 ns * 4 5 6 ns Output disable to output in High Z (OE) t * 3.5 4 5 ns OHZ Byte disable to output in High Z (UB, LB) t BHZ * 3.5 4 5 ns * These parameters are sampled and are not 100% tested. Read Cycle 1: CE = OE = V IL, WE = V IH, UB and, or LB = V IL Address trc toh Data Out Previous Data Data valid taa Rev: 1.05b 6/2010 6/12 2001, GSI Technology

Read Cycle 2: WE = V IH trc Address taa CE UB, LB tlz tac tab thz OE tblz tbhz Data Out tolz High impedance toe tohz Data valid Write Cycle Parameter Symbol -8-10 -12 Min Max Min Max Min Max Unit Write cycle time twc 8 10 12 ns Address valid to end of write taw 5.5 7 8 ns Chip enable to end of write tcw 5.5 7 8 ns Byte enable to end of write tbw 5.5 7 8 ns Data set up time tdw 4 4.5 6 ns Data hold time tdh 0 0 0 ns Write pulse width twp 5.5 7 8 ns Address set up time tas 0 0 0 ns Write recovery time (WE) twr 0 0 0 ns Write recovery time (CE) twr1 0 0 0 ns Output Low Z from end of write twlz * 3 3 3 ns Write to output in High Z twhz * 3.5 4 5 ns * These parameters are sampled and are not 100% tested. Rev: 1.05b 6/2010 7/12 2001, GSI Technology

Write Cycle 1: WE control twc Address taw twr OE tcw CE tbw UB, LB WE tas twp Data In Data Out twhz tdw tdh Data valid twlz High impedance Write Cycle 2: CE control twc Address taw twr1 OE CE UB, LB tas tcw tbw WE twp Data In tdw Data valid tdh Data Out High impedance Rev: 1.05b 6/2010 8/12 2001, GSI Technology

Write Cycle 3: UB, LB control twc Address taw twr1 OE CE UB, LB tas tcw tbw WE twp Data In tdw Data valid tdh Data Out High impedance Rev: 1.05b 6/2010 9/12 2001, GSI Technology

Package X 6 mm x 10 mm FP-BGA D Symbol Unit: mm A 1.10±0.10 A1 0.20~0.30 fb f0.30~0.40 E c 0.36(TYP) Pin A1 Index D 10.0±0.05 D1 5.25 E 6.0±0.05 E1 3.75 Top View e 0.75(TYP) A c aaa 0.10 A1 Side View aaa Pin A1 Index A B C D E F G H fb Solder Ball 1 2 3 4 5 6 e E1 D1 e Bottom View Rev: 1.05b 6/2010 10/12 2001, GSI Technology

Ordering Information Part Number * Package Access Time Temp. Range GS74117AX-8 6 mm x 10 mm BGA 8 ns Commercial GS74117AX-10 6 mm x 10 mm BGA 10 ns Commercial GS74117AX-12 6 mm x 10 mm BGA 12 ns Commercial GS74117AX-8I 6 mm x 10 mm BGA 8 ns Industrial GS74117AX-10I 6 mm x 10 mm BGA 10 ns Industrial GS74117AX-12I 6 mm x 10 mm BGA 12 ns Industrial GS74117AGX-8 Pb-free 6 mm x 10 mm BGA 8 ns Commercial GS74117AGX-10 Pb-free 6 mm x 10 mm BGA 10 ns Commercial GS74117AGX-12 Pb-free 6 mm x 10 mm BGA 12 ns Commercial GS74117AGX-8I Pb-free 6 mm x 10 mm BGA 8 ns Industrial GS74117AGX-10I Pb-free 6 mm x 10 mm BGA 10 ns Industrial GS74117AGX-12I Pb-free 6 mm x 10 mm BGA 12 ns Industrial * Customers requiring delivery in Tape and Reel should add the character T to the end of the part number. For example: GS74117AX-8T Rev: 1.05b 6/2010 11/12 2001, GSI Technology

4Mb Asynchronous Datasheet Revision History Rev. Code: Old; New Types of Changes Format or Content Page #/Revisions/Reason 74117A_r1 Format/Content Creation of new datasheet 74117A_r1; 74117A_r1_01 Content Updated Recommended Operating Conditions table on page 3 Updated Read Cycle and Write Cycle AC Characteristics tables 74117A_r1_01; 74117A_r1_02 Content Removed 6 ns speed bin from entire document 74117A_r1_02; 74117A_r1_03 Content Removed 7 ns speed bin from entire document 74117A_r1_03; 74117A_r1_04 Format Updated format 74117A_r1_04; 74117A_r1_05 Content Added Pb-free information for FP-BGA package (Rev1.05a: Removed empty status column on ordering information table) (Rev1.05b: Changed 6 x 10 mm Ball Pitch reference on page 1 to 6 x 10 mm Substrate) Rev: 1.05b 6/2010 12/12 2001, GSI Technology