Certus Optic. NanoScanTechnology. Basic Datasheet. reasoned innovations. Integrated Optical and Scanning Probe Microscope

Similar documents
Certus Light. NanoScanTechnology. Basic Datasheet. reasoned innovations. Entry Level Scanning Probe Microscope. Scanning Probe Microscope

Certus Standard. NanoScanTechnology. Basic Datasheet. reasoned innovations. Basic Configuration of Scanning Probe Microscope

SPECTRUM. The world s first fully automated Raman AFM. AFM - confocal Raman - SNOM - TERS AFM KPFM. Raman. AFM-Raman characterization of PS-PVAC

The Anfatec Level AFM a short description. Atomic Force Microscopy - approved devices for affordable prices

Sample Sizes: up to 1 X1 X 1/4. Scanners: 50 X 50 X 17 microns and 15 X 15 X 7 microns

MultiView 2000 TM. The First Tip and Sample Scanning Probe Microscope. The Next Evolution in SPM. The Next Evolution in SPM

SYNCERITY TM 1024 x 256

Solver PRO-M Scanning Probe Microscope. SPM Controller

ND 1300 QUADRA-CHEK the Digital Readouts for Convenient 2-D Measurement

PInano 1x3 XYZ & XY Piezo Stage Systems

FLEX 2 NEW. Key points. 3D Confocal Raman, 2 lasers, fiber based, AFM combined

Introduction to. 3D Scanning Confocal Microscope with Spectrometer

Lecture: P1_Wk3_L5 Contact Mode Scans. Ron Reifenberger Birck Nanotechnology Center Purdue University 2012

Indian Institute of Technology Kanpur Centre for Nanosciences

MultiView Tomorrow s Systems. for Today s Challenges. Benefits of the Multiprobe System

M-545 Manual XY Microscope Stage For Olympus, Nikon, Leica & Zeiss Microscopes / PI Piezo Stages

M-545 XY Microscope Stage with Ultrasonic Linear Drives High Stability, Low Profile, High Speed, Direct Position Measurement

TRiCAM APPLICATIONS KEY FEATURES. Time Resolved intensified CAMera. TRiCAM 13001A01 31/10/2013

SCALA. Scanning Laser Analyzer

Confocal Raman Microscope RAMOS

M-545 XY Microscope Stage with Ultrasonic Linear Drives High Stability, Low Profile, High Speed, Direct Position Measurement

MonoVista CRS+ Raman Microscopes

Development of AFM Based on Nano Positioning Stage Niandong Jiao 1,2,*, Yuechao Wang 1, Ning Xi 1,3, and Zaili Dong 1

3D Surface Analysis Form & Roughness Measurement Automatic Depth Composition Z Depth Measurement

Versatile laser Raman Spectrometer. RMP-500 series

mo Boards and Development Kits Real-Time Indoor Air Quality Monitoring The IAQSense Technologies are Coming on Demo Boards and Development Kits

phoenix Upgrade Packages for SLM Model 4800/48000/8000/8100 Spectrofluorometers

LIFA KEY FEATURES APPLICATIONS. Fluorescence Lifetime Attachment LIFA 15001A02 16/03/2015

LIFA. SPECIFICATIONs. Fluorescence Lifetime Attachment LIFA14001A02 25/02/2014

Leica TCS SPE. Spectacular Imaging! Technical Documentation

Minimizes reflection losses from UV - IR; Optional AR coatings & wedge windows are available.

Optical properties and characterization

PI-MAX 4: 1024 x 256 SPECTROSCOPY GROUP

USB 1608G Series USB Multifunction Devices

Compatible with Windows 8/7/XP, and Linux; Universal programming interfaces for easy custom programming.

Sensor based adaptive laser micromachining using ultrashort pulse lasers for zero-failure manufacturing

PI-MAX 4: 1024 x 256

SLC ultra low jitter Clock Synthesizer 2 MHz to 7 GHz

Chemical Characterization of Diverse Pharmaceutical Samples by Confocal Raman Microscopy

Control approach to high-speed large-range AFM imaging and nanofabrication

Confocal Raman Systems SPECTROSCOPY GROUP

Characterization of MEMS Devices

PI-MAX 4: 1024i-RF. Compatible with Windows 8/7/XP, and Linux; Universal programming interfaces for easy custom programming.

CPL190 CPL290 CPL490 MM190 TMP190 EN190

ND 1202 ND 1203 ND monochrome flat-panel display for position values, dialogs and inputs, graphics functions and soft keys

USB 1608G Series USB Multifunction Devices

nanometronom simplifying nanoanalytics

Easy integration into complex experimental setup

PARAMETER MIN TYP MAX UNITS COMMENTS

CMOS USORIA. Features

AUTOFOCUS SENSORS & MICROSCOPY AUTOMATION IR LASER SCANNING CONFOCAL MICROSCOPE IRLC DEEP SEE. Now See Deeper than ever before

NSCRIPTOR DPN System Product Data Sheet

Ndrive QL andqle Digital Panel-Mount Piezo Drive

SR4000 Data Sheet.

PyLoN: Applications: Astronomy, Chemiluminescence, Bioluminescence, Phosphor Imaging, Ultra-low light Imaging and Spectroscopy.

Technical Specifications for High speed PIV and High speed PIV-PLIF system

NIRvana: 640ST. Applications: Nanotube fluorescence, emission, absorption, non-destructive testing and singlet oxygen detection

MAR2100 Maradin MEMS Drive & Control

Computer Hardware Requirements for Real-Time Applications

PI-MTE3. Datasheet LARGE-FORMAT, IN-VACUUM CAMERAS. Direct detection of soft x-rays. Up to 4k x 4k sensor formats. Reads out as fast as 3 full fps

Mk3DRV controller user manual 2018/01/09

MEMS SENSOR FOR MEMS METROLOGY

UULA FOCALSPEC 3D LINE CONFOCAL SCANNER DID THEY TELL YOU THAT NO-ONE CAN MEASURE IT? WE CAN.

BETATRON TUNE MEASUREMENT SYSTEM UPGRADE AT NUCLOTRON

Portable Benchtop Raman Instruments Agility Series

EMPIR Grant Agreement 14IND07 3D Stack

Modular Raman Spectrometers

Linear, and segmented over up to 1000 points Squareness calibration Matrix compensation over up to 30 x 30 points

SPECTROMETERS USER MANUAL. Ver. 1.2_09/16. Making spectroscopy brighter

Tools for Microscopy & Imaging

Dynamic & High-Resolution

CSM Technical Features //// ULTRA NANOINDENTATION TESTER (UNHT)

An Inspection and Measurement Technology Platform Leading the Way to More Advanced Manufacturing

andor.com Scientific CMOS - Fast, sensitive, compact and light Features and Benefits Specifications Summary Ultra Sensitive Imaging Low Light Imaging

Mu lt i s p e c t r a l

Hyperspectral Microscope based on Imaging Fourier transform Spectrometry. Dr. Li Jianping, Claude. Copyright: Claude.

Confocal Raman Imaging with WITec Sensitivity - Resolution - Speed. Always - Provable - Routinely

Vibrometer Introduction

DMS 803 FEATURES OPTIONS GONIOMETER SYSTEM FOR COMPLETE DISPLAY CHARACTERIZATION

3D Scratch Tester. 3D Profilometer. Scratch Tester. Fully Automated. Nano, Micro and Macro Range

Expand Your Research to New Possibilities. Park AFM Options & Accessories.

Vibration Transducer Calibration System

NIRvana: 640. Applications: Nanotube fluorescence, emission, absorption, non-destructive testing and singlet oxygen detection

PI-MAX 4: 1024 EMB. Applications:

Product Overview Life Sciences & Industrial Division

Integrating Machine Vision and Motion Control. Huntron

ihr Series horiba.com/osd Research Grade Spectrometers Simply the best imaging spectrometers with no compromise

The CCD-S3600-D(-UV) is a

Basic Configuration Package

20 MHz/16-bit readout 61 fps rate at full-frame resolution. Use ROI/binning for hundreds of frames per second.

The Platform Monitoring System for Wisdom shipyard Based on the CCD Sensor Su Wan Pan 1, Yuan jiang LI 2, Meng Chen 3 1 Undergraduate Student School

More Precision. optocontrol // Optical precision micrometers

TABLE OF CONTENTS PRODUCT DESCRIPTION CINCAM CCD TECHNICAL DATA SENSOR RESPONSE DIMENSIONS CINCAM CCD LARGE FORMAT TECHNICAL DATA SENSOR RESPONSE

LIGHT SHEET MICROSCOPE. Alphα NEW GENERATION. Ground Breaking Technology For Selective Plane Illumination Microscopy

Development of AFM Based on Nano Positioning Stage

From Eye to Insight. Leica DMC2900. Digital microscope camera for easy, efficient documentation and presentation in industry and research

Piezoelectric Tip-tilt Mirror

Mirror positioning on your fingertip. Embedded controller means tiny size plus fast, easy integration. Low power for hand-held systems

Depth analysis for laminated film by confocal Raman mapping

Electronic SUNSTAR & 传感与控制 Software TEL: FAX: KiBox To Go Measurement and Ev

Transcription:

NanoScanTechnology reasoned innovations Nano Scan Technology Ltd. Russia, 141700, Dolgoprudny, Zavodskaya St, 7 Phone: +7 (495) 642-40-68 +7 (495) 642-40-67 Skype: NanoScanTech E-mail: info@nanoscantech.ru Certus Optic Integrated Optical and Scanning Probe Microscope Basic Datasheet Certus Optic includes: Scanning head Certus; XY-scanning stage Ratis; Optical microscope (upright or inverted); Integrated mechanical XY-stage for sample adjustment; SPM controller EG-3000; NSpec software package. Certus Optic is indispensable tool to study physical and chemical properties of the surface in such areas as: Chemistry; Physics; Biology; Interdisciplinary researches. 1

Advantages of Certus Optic: Scanning stage Ratis can position the sample with sub-nanometer accuracy; Two scanning modes: XY sample scanning with stage and Z scanning with head scanner, or XYZ probe scanning with head scanner; Plane-parallel scanners in head and base allows measurements without distortion typical for tube scanners; Study both transparent and non-transparent samples (depending on the microscope type); Optical microscope makes it possible to use all traditional observation techniques for sample studying. So one can easily find appropriate area on the sample and position the tip over it. Certus Optics can be equipped with brand new microscope or adopted for the customer is one; Independent systems of sample and probe positioning give a possibility to put the sample in the middle of field of view and install probe over it; Certus Optic can be integrated with spectroscopic devices and can be upgraded to Centaur or Centaur HR. Advanced applications: Coatings; Polymers (including liquid crystals and composites); Semiconductors; Biological objects (especially in combination with fluorescent microscopy); MEMS and other electronic components. Cantilever above surface of polymer. Optical image. Objective 40x. Certus Optic can be easily upgraded to our Centaur (HR) SPM-Confocal-Spectroscopy system. Glue drop on glass surface deposited by bioprinting. Semi-contact mode. Topography 3D. Image size 100x99 μm. 600x600. Glue drop on glass surface deposited by bioprinting. Semi-contact mode. Topography. Image size 60x60 μm. 600x600. 2

Main parameters 1 SPM 1.1 SPM head 1.1.1 Built-in XYZ scanner 1.1.1.1 Scanning/positioning XYZ range 100x100x15 μm 1.1.1.2 XY stage resonant frequency 1 кhz 1.1.1.3 Z rezonant frequency 7 кhz 1.1.1.4 SPM resolution (XY lateral) <1 nm 1.1.1.5 SPM resolution (Z vertical) <0.1 nm 1.1.1.6 Residual nonlinearity <0.3% 1.1.2 Displacement sensors 1.1.2.1 Sensors type Capacitance 1.1.2.2 Measuring principle Time-to-digital convertion 1.1.3 Scanning head approach system 1.1.3.1 Minimum step 1 μm 1.1.3.2 Coarse approach implementation Stepper motors 1.1.3.3 Number of stepper motors 3 1.2 Scanning Basement 1.2.1 Built-in XY plain-paralllel stage 1.2.1.1 XY scanning range 100x100 μm 1.2.1.2 XY resonant frequency 1 khz 1.2.1.2 Residual nonlinearity 0.3% 1.2.2 Displacement sensors 1.2.2.1 Sensors type Capacitance 1.2.2.1 Measuring principle Time-to-digital convertion 1.3 Sample positioning 1.3.1 Sample coarse positionig range 5x5 mm 1.3.2 Positioning Micro screws 1.3.3 Positionig accuracy ~ 5 μm 2 Optical microscope 2.1 Type, manufacturer and specifications of the microscope Optionally, in accordance with the terms of the specification either upright or inverted microscope Certus Optic idea: Sample Prepararation Object detected with optical microscope SPM image High resolution optical microscope allows easy object detection; Scanning probe microscope alows to obtain object 3D image; Samples can be studied being in native state. 3

EG-3000 SPM drive digital controller Electronic controller EG-3000 is designed to control SPM or scanning confocal microscope. Controller provides data acquisition from internal sensors and external devices, applies control voltage to scanners piezoelectric actuators. All obtained information is transferring to PC workstation for visualization and processing. One of the most important parts of the EG- 3000 controller is closed loop feedback system realized by means of 20-bit TDC (Time-to-Digital Convertion) to measure displacement capacitance sensors. Controller is capable to operate 6 channels with feedback simultaneously, which allows to independently scan with tip and sample both. Any available system signal can be used for SPM feedback. EG-3000 SPM controller contains 2-channel lock-in amplifier to provide resonant SPM techniques, for example non-contact SPM mode. Lock in amplifier includes high stable voltage generator based on digital frequency synthesizer. High speed data processing is implemented using programmable logic (FPGA). This allows to perform high quality lock-in detection up to 1.5 MHz band. EG-3000 has multy channel (up to 12) control for stepper motor with micro step option, for example, for adjustment of scanning head (stage). Controller has analog inputs and outputs for external equipment connections, synchronization inputs and outputs and USB interface for connection with PC. Controller is managed with NSpec software. Compatibility: Centaur and Centaur HR Snotra Certus Optic Certus Standard Certus Light Ratis NSpec Universal software for all NST devices. Nspec controls all EG-3000 functionality, and all devices connected to controller (SPM Certus, scanning stage Ratis, stepper motors etc.). Software has capability to operate CCD detectors and spectrometers, connected to PC workstation. Multithread core of the program is build with modern crossplatform compiler (GCC4) and interface part based on QT4 toolkit. Software is compatible with all modern versions OS Windows (XP, 2003, Vista, 7). Version for Linux, *BSD or MacOS X available by customer request. 4

NSpec features: Control of SPM head Certus parameters and functions; Control of scanning with SPM head or Stage; Full control of Centaur system, including spectrometer and CCD camera; Stepper motors control; Basic data processing. Please note that only basic data processing functions are implemented in NSpec Software. Specialized data processing (such as Gwyddion http://gwyddion.net) software is recommended for more detailed and powerful data processing. Special spectroscopy data processing software (e.g. GRAMS) is recommended for spectral data processing and filtering. NSpec Software has direct data export to ASCII, gwy (gwyddion), spc (GRAMS) formats. 1 Controller 1.1 General characteristics 1.1.1 CPU 32 bit; RISC 1.1.2 PC Interface USB 2.0 1.1.3 Other interfaces RS 232, RS485, SYNC I/O 1.2 High-voltage outputs 1.2.1 Voltage -10..150 V 1.2.2 Noise < 5 ppm. 1.2.3 Number of channels 3 or 6 1.2.4 Resolution (digital-analog converters) 18 bit 1.3 Stepper motors control unit 1.3.1 Number of channels 4/8/12 1.3.2 Power supply 24V, 3A 1.3.3 Microstepping mode support 1/1, ½, ¼, 1/16 step 1.4 Lock-in amplifier 1.4.1 Number of channels 2 1.4.2 Preamplifier gain 1-100 1.4.3 Input voltage range ±10 V 1.4.4 ADC resolution 16 bit 1.4.4 Frequency range of input signals 0-1,2 MHz 1.4.6 Frequency range of main oscillator 10 Hz 3 MHz 1.4.7 Output voltage amplitude 10 mv-10 V 1.4.8 Frequency stability < 5 ppm 1.4.9 Additional channels ADC / DAC 1.4.9.1 Number of input channels 2 1.4.9.2 Voltage Range ±10 V 1.4.9.3 ADC resolution 16 bit 1.4.9.4 Number of output channels 2 1.4.9.5 Voltage range ±10 V 1.4.9.6 DAC resolution 16 bit 2 Minimal PC configuration 2.1 CPU Min 2 GHz 2.2 RAM 512 GB 2.3 HDD 200 GB 2.4 Monitors 2 monitors 20`` 5

1 Accessories 1.1 Lateral calibration of SPM scanners; Detection of lateral and vertical scanner nonlinearity; Detection of angular distortions. 1.1.1 Grating for 2-D (XY) tip characterization 1 pcs 1.2 Detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects; Determination of the tip aspect ratio; Detection of lateral and vertical scanner nonlinearity; Detection of angular distortions. 1.2.1 Grating for 3-D (XYZ) tip characterization 1 pcs 1.3 Сantilevers and probes 1.3.1 Contact mode 20 pcs 1.3.2 Tapping mode 20 pcs 1.4 Other accessories Optional NanoScanTechnology reasoned innovations Contact: Russia 141700, Dolgoprudny, Zavodskaya St, 7 Phone: +7-495-642-4068 +7-495-642-4067 Skype: NanoScanTech E-mail: info@nanoscantech.ru Nano Scan Technology Ltd. 6