AS7C34098A-8TIN 256K X 16 BIT HIGH SPEED CMOS SRAM

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REVISION HISTORY Revision Description Issue Date Rev. 1.0 Initial Issue Jul.12.2012 Rev. 1.1 V CC - 0.2V revised as 0.2V for TEST CONDITION Jul.19.2012 of Average Operating Power supply Current Icc1 on page3 Rev. 1.2 May.7.2013 Revised V IH(max) /V I(min) in DC EECTRICA CHARACTERISTICS Added in t BA /t BHZ* /t BZ* in AC EECTRICA CHARACTERISTICS Added WRITE CYCE 3 in TIMING WAVEFORMS Rev. 1.3 1. Revise TEST CONDITION for V OH, V O on page 5 I OH = -8mA revised as -4mA I O =4mA revised as 8mA 2. Revise V IH(max) & V I(min) note on page 5 V IH(max) = V CC + 2.0V for pulse width less than 6ns. V I(min) = V SS - 2.0V for pulse width less than 6ns. Revised the address pin sequence of TSOP-II pin configuration on page 3 in order to be compatible with industry convention. (No function specifications and applications have been changed and all the characteristics are kept all the same as Rev 1.3 ) Added t BW in AC EECTRICA CHARACTERISTICS Revised WRITE CYCE 1,2 in TIMING WAVEFORMS Jun.04.2013 Sep.23.2013 0

FEATURES Fast access time : 8ns ow power consumption: Operating current: 50mA(TYP.) Standby current: 2mA(TYP.) Single 3.3V power supply All inputs and outputs TT compatible Fully static operation Industrial temperature -40 ~85 Tri-state output Data byte control : B# (DQ0 ~ DQ7) UB# (DQ8 ~ DQ15) Data retention voltage : 1.5V (MIN.) Greenpackage/ROHS compliant (N) Package : 44-pin 400 mil TSOP-II GENERA DESCRIPTION The AS7C34098A is a 4,194,304-bit high speed CMOS static random access memory organized as 262144 words by 16 bits. It is fabricated using very high performance, high reliability CMOS technology. Its standby current is stable within the range of operating temperature. The AS7C34098A operates from a single power supply of 3.3V and all inputs and outputs are fully TT compatible PRODUCT FAMIY Product Family Operating Temperature Vcc Range Speed Power Dissipation Standby(ISB1,TYP.) Operating(ICC1,TYP.) AS7C34098A(I) -40 ~85 3.0 ~ 3.6V 8ns 2mA 50mA 1

FUNCTIONA BOCK DIAGRAM PIN DESCRIPTION Vcc Vss SYMBO A0 - A17 DQ0 D15 DESCRIPTION Address Inputs Data Inputs/Outputs A0-A17 DECODER 256Kx16 MEMORY ARRAY WE# Chip Enable Inputs Write Enable Input OE# Output Enable Input B# ower Byte Control UB# Upper Byte Control DQ0-DQ7 ower Byte DQ8-DQ15 Upper Byte I/O DATA CIRCUIT COUMN I/O VCC VSS NC Power Supply Ground No Connection WE# OE# B# UB# CONTRO CIRCUIT 2

PIN CONFIGURATION A0 A1 A2 A3 A4 DQ0 DQ1 DQ2 DQ3 Vcc Vss DQ4 DQ5 DQ6 DQ7 WE# A5 A6 A7 A8 A9 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 AS7C34098A XXXXX XXXXX 22 23 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 A17 A16 A15 OE# UB# B# DQ15 DQ14 DQ13 DQ12 Vss Vcc DQ11 DQ10 DQ9 DQ8 NC A14 A13 A12 A11 A10 TSOP II(Top View) 3

ABSOUTE MAXIMUM RATINGS* PARAMETER SYMBO RATING UNIT Voltage on VCC relative to VSS VT1-0.5 to 4.6 V Voltage on any other pin relative to VSS VT2-0.5 to VCC+0.5 V Operating Temperature TA -40 to 85(I grade) Storage Temperature TSTG -65 to 150 Power Dissipation PD 1 W DC Output Current IOUT 50 ma *Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability. TRUTH TABE MODE OE# WE# B# UB# I/O OPERATION DQ0-DQ7 DQ8-DQ15 SUPPY CURRENT Standby H X X X X High Z High Z ISB,ISB1 Output Disable H H X X High Z High Z X X H H High Z High Z ICC,ICC1 Read H H H H H D OUT High Z High Z D OUT ICC,ICC1 Write Note: H = VIH, = VI, X = Don't care X X X H H D OUT D IN High Z D IN D OUT High Z D IN D IN ICC,ICC1 4

DC EECTRICA CHARACTERISTICS PARAMETER SYMBO TEST CONDITION MIN. TYP. *4 MAX. UNIT Supply Voltage VCC -8 3.0 3.3 3.6 V Input High Voltage VIH *1 2.2 - VCC+0.3 V Input ow Voltage VI *2-0.3-0.8 V Input eakage Current II VCC VIN VSS - 1-1 µa Output eakage VCC VOUT VSS, IO Current Output Disabled - 1-1 µa Output High Voltage VOH IOH = -4mA 2.4 - - V Output ow Voltage VO IO = 8mA - - 0.4 V Cycle time = Min. ICC = VI, II/O = 0mA, -8-65 80 ma Average Operating Power supply Current ICC1 Others at VI or VIH 0.2, Others at 0.2V or Vcc-0.2V II/O = 0mA;f=max -8-50 60 ma ISB =VIH, Others at VI or VIH - - 30 ma Standby Power VCC - 0.2V, Supply Current ISB1-2 10 ma Others at 0.2V or VCC - 0.2V Notes: 1. VIH(max) = VCC + 2.0V for pulse width less than 6ns. 2. VI(min) = VSS - 2.0V for pulse width less than 6ns. 3. Over/Undershoot specifications are characterized on engineering evaluation stage, not for mass production test. 4. Typical values are included for reference only and are not guaranteed or tested. Typical valued are measured at VCC = VCC(TYP.) and TA = 25 CAPACITANCE (TA = 25, f = 1.0MHz) PARAMETER SYMBO MIN. MAX UNIT Input Capacitance CIN - 8 pf Input/Output Capacitance CI/O - 10 pf Note : These parameters are guaranteed by device characterization, but not production tested. AC TEST CONDITIONS Speed 8ns Input Pulse evels 0.2V to VCC - 0.2V Input Rise and Fall Times 3ns Input and Output Timing Reference evels 1.5V Output oad C = 30pF + 1TT, IOH/IO = -4mA/8mA 5

AC EECTRICA CHARACTERISTICS (1) READ CYCE PARAMETER SYM. AS7C34098A-8 MIN. MAX. UNIT Read Cycle Time trc 8 - ns Address Access Time taa - 8 ns Chip Enable Access Time tace - 8 ns Output Enable Access Time toe - 4.5 ns Chip Enable to Output in ow-z tcz* 2 - ns Output Enable to Output in ow-z toz* 0 - ns Chip Disable to Output in High-Z tchz* - 3 ns Output Disable to Output in High-Z tohz* - 3 ns Output Hold from Address Change toh 2 - ns B#, UB# Access Time tba - 4.5 ns B#, UB# to High-Z Output tbhz* - 3 ns B#, UB# to ow-z Output tbz* 0 - ns (2) WRITE CYCE PARAMETER SYM. AS7C34098A-8 MIN. MAX. UNIT Write Cycle Time twc 8 - ns Address Valid to End of Write taw 6.5 - ns Chip Enable to End of Write tcw 6.5 - ns Address Set-up Time tas 0 - ns Write Pulse Width twp 6.5 - ns Write Recovery Time twr 0 - ns Data to Write Time Overlap tdw 5 - ns Data Hold from End of Write Time tdh 0 - ns Output Active from End of Write tow* 2 - ns Write to Output in High-Z twhz* - 3 ns B#, UB# Valid to End of Write tbw 6.5 - ns *These parameters are guaranteed by device characterization, but not production tested. 6

TIMING WAVEFORMS READ CYCE 1 (Address Controlled) (1,2) Address trc taa toh Dout Previous Data Valid Data Valid READ CYCE 2 ( and OE# Controlled) (1,3,4,5) Address trc taa OE# tace tcz toz toe toh tohz tchz Dout High-Z Data Valid High-Z Notes : 1.WE# is high for read cycle. 2.Device is continuously selected OE# = low, = low. 3.Address must be valid prior to or coincident with = low,; otherwise taa is the limiting parameter. 4.tCZ, toz, tchz and tohz are specified with C = 5pF. Transition is measured ±500mV from steady state. 5.At any given temperature and voltage condition, tchz is less than tcz, tohz is less than toz. 7

WRITE CYCE 1 (WE# Controlled) (1,2,3,5,6) twc Address taw tcw tbw B#,UB# tas twp twr WE# twhz TOW Dout (4) High-Z (4) tdw tdh Din Data Valid WRITE CYCE 2 ( Controlled) (1,2,5,6) twc Address taw tas twr B#,UB# tbw tcw twp WE# Dout twhz (4) High-Z tdw tdh Din Data Valid 8

WRITE CYCE 3 (B#,UB# Controlled) (1,2,5,6) twc Address taw twr B#,UB# tas tcw tbw twp WE# Dout (4) twhz High-Z tdw tdh Din Data Valid Notes : 1.WE#,, B#, UB# must be high during all address transitions. 2.A write occurs during the overlap of a low, low WE#, B# or UB# = low. 3.During a WE# controlled write cycle with OE# low, twp must be greater than twhz + tdw to allow the drivers to turn off and data to be placed on the bus. 4.During this period, I/O pins are in the output state, and input signals must not be applied. 5.If the, B#, UB# low transition occurs simultaneously with or after WE# low transition, the outputs remain in a high impedance state. 6.tOW and twhz are specified with C = 5pF. Transition is measured ±500mV from steady state. 9

DATA RETENTION CHARACTERISTICS PARAMETER SYMBO TEST CONDITION MIN. TYP. MAX. UNIT VCC for Data Retention VDR VCC - 0.2V 1.5-3.6 V Data Retention Current IDR VCC = 1.5V VCC - 0.2V Others at 0.2V or Vcc 0.2V - 2 10 ma Chip Disable to Data See Data Retention tcdr Retention Time Waveforms (below) 0 - - ns Recovery Time tr trc* - - ns trc* = Read Cycle Time DATA RETENTION WAVEFORM VDR 1.5V Vcc Vcc(min.) Vcc(min.) tcdr tr VIH Vcc-0.2V VIH 10

PACKAGE OUTINE DIMENSION 44-pin 400mil TSOP-Ⅱ Package Outline Dimension SYMBOS DIMENSIONS IN MIMETERS DIMENSIONS IN MIS MIN. NOM. MAX. MIN. NOM. MAX. A - - 1.20 - - 47.2 A1 0.05 0.10 0.15 2.0 3.9 5.9 A2 0.95 1.00 1.05 37.4 39.4 41.3 b 0.30-0.45 11.8-17.7 c 0.12-0.21 4.7-8.3 D 18.212 18.415 18.618 717 725 733 E 11.506 11.760 12.014 453 463 473 E1 9.957 10.160 10.363 392 400 408 e - 0.800 - - 31.5-0.40 0.50 0.60 15.7 19.7 23.6 ZD - 0.805 - - 31.7 - y - - 0.076 - - 3 Θ 0 o 3 o 6 o 0 o 3 o 6 o 11

ORDERING INFORMATION Package Type 44Pin(400mil) TSOP-II Access Time (Speed/ns) Temperature Range( ) Packing Type Alliance Memory Part No. 8-40 ~85 Tray Tape Reel TR Copyright Alliance Memory All Rights Reserved Part Number: AS7C34098A Document Version: v. 1.4 Copyright 2003 Alliance Memory, Inc. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document. The data contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this data at any time, without notice. If the product described herein is under development, significant changes to these specifications are possible. The information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide, any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of any product described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including liability or warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express agreed to in Alliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according to Alliance's Terms and Conditions of Sale. The purchase of products from Alliance does not convey a license under any patent rights, copyrights; mask works rights, trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against all claims arising from such use. 12

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