VLSI Test System. The Most Cost Effective Solution for Next Generation Cost Sensitive Devices

Transcription

1 VLSI Test System The Most Cost Effective Solution for Next Generation Cost Sensitive Devices W o r k i n g o n B e t t e r s o l u t i o n s

2 Chroma 3600 VLSI Test System We provide the solutions for testing ASIC, Embedded MCU, Personal Computer ICs and Consumer SOC devices. Pin Function IC: Include 4 channels timing generator within 50 ps accuracy Performance Integrated systems-on-a-chip (SOC), combining a wide variety of functions are complex devices and challenge to any device tester. This demanding mixture of digital, analog and power features call for a highly versatile ATE system. The Chroma 3600 is designed to meet this challenge today and for years to come. It offers powerful, integrated and flexible resources, such as 100MHz, 16V and 400mA, in a single test today and is easy to be upgraded for your future needs. 100MHz true Test-per-Pin Architecture Programmable driver/comparator levels from-2v to +7V. Up to 16Mbit of vector memory per pin-deep enough for complex test vectors or sophisticated serial data streams. Test pattern rates up to 100MHz resource per pin design. Timing, format and period changes can be performed on the fly. For enabling parallel and multi-site testing, PMU per pin design(ppmu) can be performed in fully parallel test mode. Preprogrammed operating modes can be stored for short set-up times between tests. Parallel Test Capability The powerful, versatile parallel pin electronics resources 16 channels LPC board: can simultaneously perform identical para- Include 4 High Accuracy PINF IC metric tests on multiple pins. Local controller circuitry manages resources set-up and result readout, and therefore cuts the test system controller overhead time.

3 Multi Site Test Multi-site testing increases the number of devices tested by simultaneously measuring multiple devices in a test cycle on one test head. This requires more than just parallel resources. Devices, especially those in digital tests with looped or nested vectors or sequential data streams, may need varying test sequences. The digital pin electronics contains local controllers capable of independently managing pattern sequence, timing and formatting for small pin increments. Using this ability, the Chroma3600 can split up the test head into multiple test sites for a further throughput boost. Flexibility The semiconductor industry is a fast moving one, and capital equipment must be built to outlive several device generations. With selective options, like ALPG, Converter Test, High Voltage PE Options. Chroma 3600 employed pro-active planning during the design of its architecture to make sure that it will serve you for years to come. RAISE (Software Test Environment) The software test environment for Chroma 3600 is based on the software platform called RAISE. This environment covers the needs for both development engineers and the productions test personnel. Software panels are provided for fast product characterizations and debug. Statistics, security and factory integration tools aid the manufacturing engineers to easily integrate the systems in the test floor. Using industry standard tools based on Window NT and C keeps the learning curve to a minimum. Comprehensive debug tools for on-line debugging of digital waveforms and Shmoo plot capabilities can iterate virtually any test parameter including timing, voltage and current for an assessment of process and test stability. Time to Market Testing can be a bottleneck in bringing your products to market - it takes time to generate comprehensive test programs and circuitry. Through the use of powerful graphic programming and debugging tools, comprehensive hardware resources and a highly versatile pin electronics design, Chroma 3600 dramatically reduces the time needed to create your test programs and eliminates the need for device specific test circuitry.

4 Lowest Cost-of-Test Solution Today's complex devices call for powerful and versatile test systems. Low test costs can only be achieved by reducing test times and overall cost, not just by simply reducing the system price. The design of Chroma 3600 is to suit for all kind of application environment, like engineering verification, wafer sorting, and final testing. Small Footprint Clean room space is scarce and costly. To avoid the need for expensive clean room expansion, only compact test systems should be considered. The Chroma 3600 delivers high throughput in a highly integrated package, offering an unrivalled combination of throughput and test capabilities. Application Support Chroma offers wide bandwidth of application support solutions to its new and established customers, all designed to accurately meet user needs. Whether you need fast production rampup, want to capitalize on emerging market opportunities, enhance productivity, lower testing costs with innovative strategies or require additional capacity for peak load situations, the Chroma worldwide customer support staff is committed to generate timely and efficient solutions for you. The Lowest Cost-of-Test Solution for next generation cost sensitive devices. 3600

5 3600 VLSI Test System Specifications Model 3600 Test Rate 50/100MHZ Maximum Number of Pins (increment) 256 pins (64 pins/unit) Vector Depth 16M bits per pin Over All Timing Accuracy ±700ps Wave/Strobe Format 4096 timing/waveform combination,change on the fly System Programming Language/OS C,C++, Window NT 4.0 Parallel Test Capability 4 DUT / 256 pins Timing Generator Per Pin No. of Edges 6 edges / pin (2 Driver, 2 Driver & I/O, 2 Strobe) No. of Timing Sets 32 sets / pin Edge Setting Resolution 62.5ps Device power supply No. of Channels 8 channels / 256 pins (max.) Voltage Range ±8V, ±16V (2 range) Maximum Output Current ±2A(8V), ±0.8A(16V) DC Measurement (PMU) PMU Channel 4 channels / 256 pins PMU Voltage Range ±2.5V/±8V/±16V PMU Current Range 800nA/8uA/80uA/800uA/8mA/80mA/400mA PPMU Channel 1 channel / 1 pin PPMU Voltage Range -2V ~ +7V PPMU Current Range ±400uA Driver Amplitude 0.1 V ~+ 9 V VIL/VIH Range -2V ~ +5V / -1.9V ~ +7V VIL/VIH Reference Level Per Pin Comparator VOL/VOH Assigned Range -2 V ~ +7 V Min. Window Strobe Width 5ns VOL/VOH Reference Level Per Pin Band Width 250MHZ Programmable Load IOL/IOH Setting Range 0 ~ -35 ma / 0 ~ +35 ma IOL/IOH/VREF DAC Per Pin Options 16 bits AD/DA Converter Test Options ALPG Option X=12, Y=12, D=32 High Voltage PE Option VIL: -1.5V ~ +13.5V, VIH: +1.5V ~ +15.5V Multi Function Manipulator Option System and Dimensions Power Consumption 5KVA max. Cooling System Forced air cooling Test Head L940 x W644 x H571mm Mainframe L900 x W750 x H1650mm * The specification shown above may be revised without prior notice.

6 HEADQUARTERS CHROMA ATE INC. No. 66, Hwa-Ya 1st Rd., Hwa-Ya Technical Park, Kuei-Shan Hsiang, Taoyuan Hsien 333, Taiwan Tel : Fax : chroma@chroma.com.tw http : // BRANCH OFFICES HSINCHU 6F, No. 5, Technology Rd., Science-Based Ind. Park, Hsinchu City 300, Taiwan Tel : Fax : KAOHSIUNG 5F-1, No. 439, Da Shun Yi Rd., Ku Shang, Kaohsiung, Taiwan Tel : Fax : HONG KONG Neworld Electronics Ltd. Unit 6, 6th Floor, Shui Hing Centre, No.13 Sheung Yuet Road, Kowloon Bay, Kowloon, H. K. Tel : Fax : CHINA Chroma Electronics (Shenzhen) Co., Ltd. 8F, No.4, Nanyou Tian An Industrial Estate, Shenzhen, China PC : Tel : Fax : SHANGHAI 3F Building 40, No. 333, Qin Jiang Rd., Shanghai, China PC : Tel : Fax : BEIJING Unit 1902, Block B, Vantone New World Plaza, No. 2 Fuwai Street, Xicheng District, Beijing, P.R. China PC : Tel : ; Fax : SUZHOU 2F, No12-5 New venture Industry Factory, No 625, BinHe Road, Suzhou New District, Suzhou City, Jiang Su Province, China PC : Tel : Fax : U.S.A. CHROMA ATE INC. (U.S.A.) CHROMA SYSTEMS SOLUTIONS, INC. 7 Chrysler Irvine, CA92618 Tel : Fax : Toll Free : scottw@chromaus.com freds@chromausa.com SANTA CLARA OFFICE 3350 Scott Blvd., Ste 1202 Santa Clara, CA Tel : Fax : info@chromaus.com EUROPE Chroma ATE Europe B.V. Max Planckstraat 4, 6716 BE Ede, The Netherlands Tel : Fax : info@chromaate.nl E