Technical Description PinPoint The worlds most advanced electronic repair system

Transcription

1 The worlds most advanced electronic repair system Diagnosys Systems Limited 2 July 2010

2 Contents Introduction... 4 Overview... 4 Multi-strategy testing for comprehensive test coverage... 5 Advanced Powerful digital and V/I Testing:... 5 Parametric Test Unit (PTU)... 5 LCR Bridge... 5 Control PXI and GPIB instrumentation:... 6 Reverse Engineering:... 6 Boundary Scan:... 6 TrakTest... 6 Shorts Locator... 6 Back Driving... 7 Data Capture Pod (DCP)... 7 Powerful and Intuitive Software... 7 TestFlow... 7 SeaWave... 7 C-Script... 8 Instrument Strategizer... 8 Test Program Services... 9 Training and Development... 9 Return on Investment... 9 Hardware Description...10 Chassis...10 Chassis Variants Slot Slot...10 System Power Supplies...11 P2C Controller Card...12 Schematic capture...12 Sequence Processing...13 Do While...13 Subroutines...13 Pre-conditioning...13 P2D 48 Channel Driver Card...14 P2PMX Digital Multiplexer card...15 P2M Matrix Card...15 P2E Edge Test Card...16 P2A Analog Card...17 DMM (Digital Multi Meter)...18 Page 2 of 37

3 Timer Counter...19 Frequency...19 Digital Oscilloscope...19 Arbitary Waveform / Function Generator...20 P2I Vectorless Test Card...21 Shorts Locator...21 LCR Bridge...22 Analog V / I Signature Testing...23 Parametric Test Unit (PTU)...24 Software...26 TestVue Software...26 Program Generation Features...27 Board Layout...27 Define Board...27 NetList Generator...28 Schematic Generator...28 Import facilities...29 Jedec...29 LASAR...30 VHDL Importer...30 BSDL Importer...31 Boundary Scan...31 TrakTest...33 Device Test Interfaces...34 Large and robust range of Interfaces...34 Out-of-Circuit Test Adaptors...35 Page 3 of 37

4 Introduction This document provides you with a technical description of the system such that you will understand the purpose, functionality and configuration of the equipment. Overview The gives you the ability to test and fault-find electronic circuits quickly and reliably. Different test techniques can be applied on a single circuit to ensure you have comprehensive fault coverage and full confidence in your circuits. Test methods available are: Passive in-circuit Dynamic digital in-circuit Functional Analog in-circuit Boundary Scan in-circuit Boundary Scan connector Advanced Nodal Signatures Functional Analog edge connector Dynamic digital edge connector Cluster test Analog functional with external instruments With technology today, no single test method can be used to test a complete circuit. A full test requires the use of different test methods to ensure complete test coverage. By selecting and combining the various techniques available in the, you can provide the best no compromise test coverage to rapidly isolate the cause of failures in your circuit. This ensures rapid programming, fast turn-around-times and minimises NFF (No Fault Found) scenarios. The easy-to-learn and intuitive software allows you to access the full power of the so that you can concentrate on testing the circuit and finding the fault quickly, reliably and confidently. Page 4 of 37

5 Multi-strategy testing for comprehensive test coverage Test of Individual Components and from Edge connectors: The system performs tests on individual components using in-circuit test methods and a fixtureless clip technique. These dynamic digital and analog tests prove the correct operation of each device and can also detect open circuit tracks and incorrect, broken or missing passive components on networks. These digital tests can also be applied at the edge connector of a circuit to prove the functionality of the whole circuit. Advanced Powerful digital and V/I Testing: In addition to the advanced and powerful digital tests, the system also utilises a V/I testing technique. This technique applies a sinusoidal signal to a network and learns a four quadrant signature for it. This signature is then stored and used for comparison of the network on other boards giving an instant indication of any error. The results are graphically displayed on the screen. This power-off technique can be applied to any board and is therefore ideal when little or no information is available about the device or networks being tested. Parametric Test Unit (PTU) P MU F+ I, M+ V +100 ua V DD = 0.0V V S S = 0. 0V DUT Four discrete channels on the P2I card are dedicated to DC voltage and current sources. These channels can be used for functional testing of discrete components both in and out of circuit, for example: h FE of transistors or semiconductor junction forward voltage. LCR Bridge The LCR bridge is used to measure the values of Inductors, Capacitors and Resistors in or out of circuit. Powered by TestVue software you immediately feel in control of the tool and can put it to use immediately testing components. Measuring the values or a network impedance is now a straight forward task that enhances the diagnostic arsenal available in the system. Page 5 of 37

6 Control PXI and GPIB instrumentation: Extending the capability of the system even further is its inherent capability to control PXI and GPIB instrumentation. Having control of these instruments through the user friendly TestVue TM software allows you to create functional analog tests for your circuits. Instrument Strategizer gives the graphic capability to program and sequence instruments with other code to provide a seamless mixed signal test program. Additional power supplies can also be added to enhance the standard system UUT (Unit Under Test) power supplies for extended test capabilities. Reverse Engineering: Another key capability of the is the ability to reverse engineer a Schematic diagram or Netlist from an unknown circuit. This provides you with the ability to test, diagnose and repair circuits that have been declared obsolete by the OEM (Original Equipment Manufacturers) and give you protection from obsolescence. Boundary Scan: This technique can be applied to a single device or a chain of devices that are enabled with the necessary hardware. Adding to the arsenal of test methods available the integration of your preferred Boundary Scan solution provides you with the ability to create a flexible and comprehensive test of your circuits. TrakTest This facility tests the continuity of tracks between devices and also tests for the presence of short circuits between pins of a device. Through reference to a netlist for the circuit the rapidly detects incorrect open and short circuits in the circuit. If the netlist is not readily available then the can be used to generate one from a known good board using its Reverse Engineering facility. Shorts Locator The Shorts Locator provides an interactive tool that enables you to determine the exact point at which a short or open circuit has occurred in the circuit being tested. The graphical interface provides an intuitive display of all the relevant data necessary to allow you to easily Page 6 of 37

7 and accurately define the exact point of the failure. Back Driving B Ba Ba D In-circuit testing requires signals to be forced into a circuit often backdriving voltages onto the output of a connected device. To ensure effective testing the has a market leading capability to deliver a minimum of 750mA of back driving current on each channel as required giving it excellent backdriving performance and signal quality. Essential for safe testing of a circuit the fully complies with the internationally recognised UK Defence Standard DEF STN Data Capture Pod (DCP) As an optional accessory the powerful DCP helps you develop functional test programs for devices that are not included in the extensive TestVue component library. The DCP captures live data, while a device is active in the circuit. Powerful tools in the TestVue software convert the captured data into a functional device program that can be stored for immediate or future use. Powerful and Intuitive Software The TestVue software platform offers a powerful array of features including TestFlow, Analogue virtual instruments, SeaWave and a simple intuitive user interface. TestFlow automatically generates a test program, for a board under test, as the components are laid out by the operator. This allows test programs to be edited and constructed in simple flow diagram format. This program writing method means that editing programs is quick and simple. It also gives the programmer the ability to add conditional branches, subroutines, operator test instruction and limits checks at the click of a mouse. SeaWave enables detailed analysis of logic inputs and outputs to the DUT. This is extremely useful for fault finding and debugging programs. Detailed component information is available from the II component library. The library, which is being added to all the time, currently contains over 16,000 component functional test programs including many military components. Many of the components in the library also have data sheets Page 7 of 37

8 included that can provide valuable information when writing board programs. All these powerful software features and more, presented in an intuitive Windowsbased package, ensure that test programs for new boards can be completed in hours/days rather than weeks/months. C-Script complements the TestVue programming environment by allowing you to integrate programs created using the C programming language. Now the full capability of the C programming language is available to you through an icon integrated into the graphic TestVue environment. This means that any program can be executed from the TestVue environment including DLL and Windows API s. Instrument Strategizer The Instrument Strategizer allows you to create a complete sequence of tests using different instruments (internal or external) using a graphical interface. External instruments having a VISA software driver can be immediately integrated into the graphic environment so that you can rapidly start to develop test sequences. The availability of a wide range of external instrumentation further powers your ability to create comprehensive test programs. Page 8 of 37

9 Test Program Services Diagnosys offers test program writing services to help you smooth peaks in demand or to provide a complete turnkey solution ready for use. Supported by a world wide team of experienced programmers test programs are developed, proven and installed to ensure a ready-to-use solution for you. Training and Development is not just a product, it is a total diagnostic, test and repair solution. As such systems include a comprehensive training program to ensure you are ready and can apply the full capability of the system when it is received. Tailored training requirements can also be accommodated through discussions with your local sales contact. Return on Investment The system is in use with major military and commercial customers world wide and has demonstrated excellent returns on investment. This document will give you an overview of some key features but our sales team will be happy to discuss the in more detail and explore how it can help you. Page 9 of 37

10 Hardware Description Chassis The Chassis is designed and manufactured to comply with the latest RoHS standards making it both user and environmentally friendly. Internal temperature monitors automatically adjusts the speed of the fans to run faster or slower dependent on the temperature to provide a quieter working environment for you. It is constructed out of a superior material which provides increased durability and strength. It will withstand higher degrees of stress and is more resistant to day to day handling and shipping for longer lasting look and longevity. With the increase in Boundary Scan requirements a dedicated JTAG IEEE.1149 device tool is available upon request (JTAG Technologies) Chassis Variants Two variants of the desktop chassis are available: 8 Slot Up to 240 driver channels (Digital, Analogue and VI). Running powerful TestVue software the II 8 Slot offers advanced In-Circuit Test capabilities. 14 Slot With up to 240 ICT Driver Channels, full function (Digital, Analogue and VI) and 1664 Edge Card Digital only channels. II 14 Slot is the most powerful In-Circuit Test system available for repair and maintenance of commercial and military PCBs. Based on the 14 or 8 Slot chassis, the II Functional can offer a combination of Functional and In-Circuit Test. The board under test can be connected for Functional Test using Edge Connectors or a Bed of Nails fixture. Page 10 of 37

11 System Power Supplies All II chassis use a standard Universal Input ATX PSU to supply power to the integrated PC plus an additional ±5 and ±15V PSU to supply power to the Test Chassis. There are also additional PSUs to power the Units Under Test. The standard UUT PSUs have the following specifications: 1 off A 1 off 6.0A 1 off - 4.0A 1 off - 1.0A 8 Amp All of the above UUT PSUs are fitted with programmable over current limit detectors (programmable within the range of the relevant UUT supply) as well as current monitoring to monitor the exact amount of current being drawn by the UUT. An optional internal dual isolated variable power supply each offering 0-20 Volts at 10 Amps is available and is ideal for those applications that need more than the standard voltage and power requirements. Page 11 of 37

12 P2C Controller Card The Controller card provides the core functionality for the pin electronics. Hardware consists of: 80 MHz RISC Processor for fast intelligent processing of Subroutines, Conditional Branches etc 2Mb Sequencer RAM for unlimited branching Test rate programmable from 10KHz to 15MHz 8 Auxiliary Guards - Dual Family Driver level programmable ± 11V (10mV resolution) Sensor level programmable ± 13V (10mV resolution) 128Kb memory per pin (64Kb driver and 64Kb sensor) Each channel fully bi-directional and tri-state >750mA drive current per channel, each channel has independent over-current shutdown; all channels shutdown after 25mS (default ) to maintain device integrity Individually programmable pull up, pull down Programmable isolation relays 3 General Purpose high-current outputs Schematic capture The Controller card also provides the hardware necessary for schematic capture process and consists of: Dual channel resistance meter 0 to 81.92Ω (Power nets default to 10Ω - device nets default to 10Ω) 20mΩ resolution -5.5V 0.5mA DC contact detection circuit Expandable to 1248 channels using 13 off P2M (96 Pin Matrix Cards) Page 12 of 37

13 Sequence Processing The P2C memory provides a pattern sequencing function for test vectors. Functions supported include: Do While A set of test vectors will be executed while a defined condition exists on the board or device being tested. The sequencer loads and executes the test vectors ensuring a seamless execution of the program code. Subroutines A subroutine is a set of instructions and/or test vectors that have been created by the user to form a block of code that is generally used more than once in a test program. This code is loaded into the sequencer memory so that it is readily accessible when needed and can be executed as demanded by the test program. A separate program instruction directs the test program execution to run the subroutine code. Subroutines can be nested. This means that one subroutine can call another and so on up to 10 deep. Pre-conditioning This statement is used to pre-condition a device prior to the start of a test. This is necessary for devices which may power-up in an unknown state such as counters when the reset or load function is not available. This statement will cycle a set of test vectors until a certain condition is attained on the device being tested. Once the desired condition is reached then the device is in a known state and therefore the test program can continue. Without the functionality of the P2C card a full and complete test of a device or circuit may not be possible. All of these functions are required to ensure a circuit or device can be tested. provides an industry leading capability for the test of a device and circuit. Page 13 of 37

14 P2D 48 Channel Driver Card Option Up to 5 cards can be fitted per system The P2D card provides 48 channels of high performance digital testing. Intended primarily for the in-circuit test of components this card can also be used for testing circuits from an edge connector. Industry leading pin electronics with an automatic backdrive protector ensures components are tested safely with full compliance to the UK Defence Standard For functional testing of a circuit from an edge connector the backdrive timer can be disabled. The system will automatically configure when cards are inserted. The P2D card is automatically tested when TestVue software is activated. A more extensive test is also available using loop-back connectors to give confidence that the card is fully operational to the connector. The card derives its references from an internal card and therefore does not need calibrating. Card specification: 48 channels per card Driver level programmable ± 11V (10mV resolution) Sensor level programmable ± 13V (10mV resolution) 128KB memory per pin (64Kb driver and 64Kb sensor) Each channel fully bi-directional and tri-state >750mA drive current per channel as required Individually programmable pull up, pull down Programmable isolation relays Expandable to 240 (432 in UDA) channels Page 14 of 37

15 P2PMX Digital Multiplexer card Recommended Option one per P2D digital driver card Digital I/O Multiplexer This card consists of a Relay Matrix and mounts as a daughter card on the P2D Driver Board. It is factory fitted at time of order. Functionality This provides switching of Analogue, Schematic and VI channels to the digital test channels of the P2D. The multiplexer card allows additional test functionality to be routed through to a test channel simplifying wiring requirements and speeding test program creation. P2M Matrix Card Option - cards can be fitted as required. The Matrix card provides a 4 highway x 96 Channel switching resource for routing analog signals to and from the front panel. This allows internal analog test signals to be routed to the DUT (Device Under Test) automatically and signals from the DUT to be switched through to the appropriate internal measurement instrument. The card does not require calibration and is included in the system self test using loop-back connectors to test functionality. The Switch Matrix Card is a 4 Row x 96 Column relay matrix, designed for routing analogue signals to and from the front panel. The 4 rows can be used to route internal signals (eg DMM, ARB etc) or signals derived from external sources. Max Contact Resistance Max Switching Current Max Carry Current <0.15Ω <500mA <1.2A Page 15 of 37

16 P2E Edge Test Card Option - up to 13 cards can be fitted This card is purpose designed to provide excellent cost:performance ratio for digital at the edge connector of a circuit. Each card provides 128 fixed TTL drive and sense level channels per card. Additional cards can be added to the system providing up to 1664 individual test channels. The card derives its references from an internal card and therefore does not need calibrating. The card is automatically tested when the TestVue software is initialised providing confidence in the correct operation. Card Technical specification 128 channels per card. 128Kb memory per pin (64Kb driver and 64Kb Sensor) Fixed TTL drive and sense levels Each channel fully bi-directional and tri-state Expandable to 1664 channels Page 16 of 37

17 P2A Analog Card Recommended Option, one per system The Analogue card adds a suite of analogue tools to the. The card includes a : Frequency Counter, DMM (Digiutal Multi Meter) Oscilloscope Arbitrary waveform generator (1 ARB is included as standard, up to 3 more can be added). These instruments can be used as part of an integrated test sequence or as individual analogue instruments as required The Analog card can be integrated at any time being a plug and use type instrument. The software will automatically recognise and configure the card so that the functionality it provides becomes part of the overall system capability. Software is provided to enable the instruments to be used either in Immediate Mode through a Virtual Front Panel or from an integrated facility within the TestVue environment. The Analogue card provides the functions of a 4 1/2 Digit DMM, Dual Channel Frequency/Timer Counter, Multi-channel Analogue Inputs, Arbitrary Waveform Generator(s) and a Dual-Channel 100MHz Bandwidth Oscilloscope. DMM is capable of AC and DC voltage and current measurements, resistance, diode and capacitance measurements. Frequency counter will perform Frequency, Period, Time AB, Unit Counter and Frequency Ratio measurements. 16 Channel (8 Differential Channels) Analogue Input module. The Arbitrary Waveform Generator(s) can provide Sine, Square, Triangle, Sawtooth and User Waveforms as well as DC offset levels. 100MHz Bandwidth Dual - Channel Oscilloscope. 400Hz 26 Volt AC Avionics Reference Voltage output. Page 17 of 37

18 DMM (Digital Multi Meter) Display Digits 41/2 Display Count Conversion Rates 2, 2.5, 4,5, 10, 20 Maximum input voltage 450V (320V AC) Maximum floating voltage 1000V (750V AC) Maximum input current 2A continuous (3A for 30 seconds) Maximum open circuit voltage 450V (320V AC) Overload protector DMM Measurement Characteristics Range 200mV, 2V, 20V, 200V, 1000V DC Voltage Accuracy (% + 10 counts) ± 0.1% AC Voltage Range 200mV, 2V, 20V, 200V, 1000V Accuracy (% + 40 counts) 50 to 100Hz ± 0.1% >100Hz to 1Khz ± 2.5% >1KHz to 10KHz ± 3.5% >10KHz to 20KHz ± 5.0% Bandwidth 20KHz Input Impedance 1MΩ Paralleled by 100pF Current AC and DC Ranges 2A DC Accuracy (% + 40 counts) ± 0.5% AC Accuracy (% + 40 counts) 50 to 100Hz ± 1% >100 to 1KHz ± 2.5% Bandwidth <= 1KHz Resistance Ranges 200Ω, 2KΩ, 20KΩ, 200KΩ Accuracy Ω(% + 10 counts) 0.2% 200Ω 1.0% 20MΩ 5.0% Page 18 of 37

19 Diode Test Test current Test voltage 1mA <=10V Capacitance Ranges 200nF, 2uF, 20uF, 200uF Accuracy ± 1.0% Timer Counter Frequency Display digits Modes 8 (32 Bits) FREQ, PERIOD, UNIT COUNTER, TIME AB (100ns Min), FREQ RATIO Input Channels CHA, CHB, HIFREQ Ranges Input threshold voltage Input Impedance CHA - 30MHz CHB - 30MHz HIFREQ - 20MHz to 120MHz Programmable ± 10V w.r.t. ground earth (CHA and CHB) 0-5V p-p (HIFREQ) 1MΩ paralleled by 22pF (CHA and CHB) only Accuracy ± 0.01% Digital Oscilloscope Number of channels 2 Input voltage range 50mV to 50V 200 MS/s per channel real-time sampling 8 bit vertical resolution 32K samples per channel 100 MHz Bandwidth Internal and external triggering Page 19 of 37

20 Arbitary Waveform / Function Generator (1 included on Analogue card as standard) Number of independent channels 4 Output voltage range ± 12V (1 fitted as standard, up to 3 Optional available by ordering part P2A- ARB and quantity required. These are implemented on daughter boards) Waveform Generation Types Frequency Functions Sine, Square, Triangle, Sawtooth, Pulse, User 0.1Hz to 300KHz 0.1Hz resolution Offset, Skew/Duty cycle adjustment Waveform Source Resolution 16Bit Samples/Sec 30MSPS Frame depth 32Kbyte Accuracy ± 0.5% Current Limit Analogue Adaptor Mode In-Circuit Mode Max current limit 20m Amps. Indefinite per channel Max current limit 350m Amps. for 25ms. (Ch 1 only) Analogue Inputs Analogue Inputs 16 Single Ended or 8 Differential Input Resolution 16 Bit Sampling range 1.25 MS/s Voltage range ± 12V Internal and External triggering Page 20 of 37

21 P2I Vectorless Test Card Recommended Option Full quadrature Analog Signature Analysis (VI Testing) L, R, C bridge for accurate testing of passive components both in and out of circuit Shorts Locator to identify the exact point at which a short or open circuit is located Parametric Measurement Unit for in / out of circuit test of discrete components and circuits eg h FE of transistors & input leakage Accurate and fast diagnostics Powerful and intuitive TestVue software for ease-of-use User-driven interactive probing or fully guided implementation for comprehensive diagnostics Self configuring plug-and-go implementation Fully integrated into the system, the P2I card provides a range of powerful and flexible capabilities to enhance the excellent fault-finding abilities of the system. Powered by TestVue software for ease-of-use and having an intuitive graphical programming interface, the P2I card can be installed and in use within minutes. Through the use of the integrated V/I analog signatures, the LCR bridge, the Shorts Locator and Parametric Measurement Unit, the P2I card adds significant advantages for accurate fault identification in mixed technology circuits. Identifying the exact fault, whether it is an open or short circuit, an incorrect value component, a damaged or out of tolerance device, the P2I card is an invaluable Shorts Locator The Shorts Locator provides an interactive tool that enables you to determine the exact point at which a short or open circuit has occurred in the circuit being tested. The graphical interface provides an intuitive display of all the relevant data necessary to allow you to easily and accurately define the exact point of the failure. Page 21 of 37

22 By moving the two probes an audible signal and graphical display guide you along a circuit track until the location of the fault is determined. Technical Specification: 500mV max o/c voltage 1A max s/c current 2mV o/c voltage setting resolution 4mA s/c current setting resolution 3 sense ranges (x1, x10, x100) User selectable audio frequency output LCR Bridge The LCR bridge is used to measure the values of Inductors, Capacitors and Resistors in or out of circuit. Powered by TestVue software you immediately feel in control of the tool and can put it to use immediately testing components. Measuring the values or a network impedance is now a straight forward task that enhances the diagnostic arsenal available in the system. Technical Specification: Measures secondary characteristics (D factor, Q, ESR). Series / Parallel equivalent circuits. Kelvin measurement system Multiplexed to Internal Rows A D. Measurement ranges: Inductance Capacitance Resistance Test frequency range Measurement uncertainty*: Inductance Capacitance Resistance 1uH to 1000H 1pF to 1F 10mR to 100M 1Hz to 50kHz <1% + 1uH <0.5% + 1pF <0.1% + 10mR Page 22 of 37

23 Analog V / I Signature Testing Providing a power-off test of devices and networks, the V/I (Voltage / Current) analysis technique is a powerful and rapid way to compare signatures learnt from a known good PCB with those on a faulty PCB. The technique is ideal for testing networks with passive components such as resistors, inductors, capacitors and semiconductor junctions. However, it can also be gainfully used to test the input and output stages of active devices eg IC s, FPGA s etc. providing a rapid indication of possible damage eg static damage destroying the protection diodes or damage to output/input transistors. The technique applies an AC signal to a network and by measuring the voltage and current relationship can display a four quadrant trace signature. The software automatically compares a learnt signature with the one being measured and will make a pass or fail decision based on a user programmable tolerance envelope. However, the technique can also be used in a manual interactive mode where the signature is displayed and analysed by the user. This will give an experienced user an indication of the likely cause of a failure eg damaged semiconductor junction, incorrect resistance, capacitance. The TestVue software will automatically determine the best frequency and voltage to apply to a network and then three readings are taken with Sweep mode but additional readings can be taken for all voltage ranges depending upon the settings to ensure stability and repeatability of the diagnostics. A user defined tolerance is then applied to each measurement on the trace to provide a tapered tolerance envelope to give a sound basis for meaningful diagnostic decisions. Devices made by different manufacturers can cause different signatures (eg different input/output stages affecting the analog signature) even through the device is functioning correctly. To cater for these situations the TestVue software allows the user to learn different alternative signatures for a network and will then automatically compare the measured signature with all allowed alternatives. This feature gives you the benefit of more reliable and accurate diagnostics, with the subsequent reduction in re-work and repair time. A typical signature is shown in the picture. The Green trace is the learnt signature with a programmed tolerance band around it; the red trace is the measured trace and in this case is clearly outside of the acceptable tolerance band and is therefore a failure. With the P2I card the system has a complete arsenal of diagnostic tools available to identify and locate the cause of failures: Reliably. Accurately. Repeatably. Page 23 of 37

24 Technical specification: Digitally Synthesized Waveforms Sine, Square, Triangle, Saw-tooth waveforms 5 Hz to 12KHz, 0.1 Hz resolution. 0.2 Volt to 25 Volt Peak, 0.1 volt resolution 256 Point, 8 bit Comparison architecture 16 Current Ranges. 200 ma Max Dual Contact Detection circuits for both AC and DC detection Pulse Mode Dual Channel +/-10 Volts Multiplexed to rows A through D Parametric Test Unit (PTU) Four discrete channels on the P2I card are dedicated to DC voltage and current sources. These channels can be used for functional testing of discrete components both in and out of circuit, for example: h FE of transistors. Output drive levels of devices or circuits e.g. VOL.. Input leakage of devices or circuits at edge connectors e.g. IIL, IIH. Semiconductor junction forward voltage. Static protection diodes, detect short or open circuit conditions Testing Hybrid devices. Tri-state leakage currents. Technical Specification: I b V CE Apply I b and V ce, Measure I c I c 4 independent channels. Programmable Voltage and Current on each channel. Each channel can be programmed independently to source or sink current or source voltage. Page 24 of 37

25 Channels are calibrated automatically to internal references. Voltage and current read-back on each channel. +/- 10V voltage +/- 20mA current 2.5mV voltage resolution 5uA current resolution 10mV voltage accuracy (before calibration) 50uA current accuracy (before calibration) Page 25 of 37

26 Software The system has an integrated PC which runs Microsoft Windows. By default the will have Windows 7 installed at the factory but Winbows XP or Windows VISTA can be specified. (Windows, Windows 7, Windows XP and Windows Vista are trademarks of Microsoft Inc.) TestVue software is the programming and runtime environment for the and is installed on the PC in the factory. The TestVue software is licenced, you will receive a perpetual licence for the product which is non-transferable. (TestVue is a registered trademark of Diagnosys Test Systems Limited) TestVue Software TestVue is the main software interface for the user and allows different levels of access to the system including administrator, programmer and operator privileges. The TestVue environment is graphical and carefully designed to ensure that you only ever need three levels of menu to achieve any operation. The intuitive operation of the software means that a new user can be trained in 5 days, with a further 3 days required after some experience on the system for the advanced training course. There are numerous features of the TestVue environment which are considered beyond the scope of this document, they are best demonstrated by seeing and trying the software in person. The main program generation features of the software are described in the following sections. Page 26 of 37

27 Program Generation Features TestVue Software contains standard features that enable you to create an electronic layout of a board, learn the interconnections between devices and then produce a schematic diagram for the circuit which can then be exported in various industry formats. Board Layout Board Layout Generation This software is standard part of the TestVue Program Development Suite One element of the programming process is to generate a graphical Board Layout that enables the software to guide the user around the board under test and to indicate the status of devices ie untested, passed, failed etc. This is a simple task that can be performed manually and quickly using the graphic tools provided, however alternative methods also exist. One alternative method is to import the Pick & Place data to automatically produce the Board Layout for you. There are many different types of Pick & Place data (not to be confused with Gerber data the bare board layout information) but these can all be handled through a CSV (Comma Separated Variable) file import facility. This is a rapid and easy method if the data is available. If the Pick & Place data is not available then another alternative is to produce a scan of the board and import the bitmap image as a graphic. Once you have a bitmap then the component layout information (component names etc) can be laid onto the image. Whichever method you select the Board Layout can be produced easily and quickly using the intuitive user-friendly TestVue software. Define Board The Define Board feature in TestVue enables you to create an electronic layout of the circuit to be tested. Using graphical software you can quickly and easily create a representation of the physical layout of the board showing each device. By allocating a Page 27 of 37

28 device type to each element on the layout, the software will automatically link it to an electronic symbol for the device. This symbol is used later by the schematic generator. NetList Generator To create an electronic schematic diagram first requires a NetList. A NetList is literally a list of all the networks in a circuit and gives the interconnections between devices. TestVue software has a NetList Generator to guide you through the process of creating a NetList. In this process, a net (connection) between two devices, is "captured" by determining the resistance between their respective pins. It is necessary to provide physical access for the (or UDA) to each device simultaneously so that the paths can be determined. Diagnosys DTI s (Device Test Interfaces) can be used to achieve this. It is possible to access multiple devices at the same time to significantly reduce capture time. Schematic Generator The next step of the process is to create the Schematic Diagram. To achieve this, the NetList you created in the above process is automatically combined with the graphic symbol for each device to produce a schematic diagram of the circuit. The schematic can be exported in various industry standard formats or simply viewed on the screen as required. The whole process is explained in more detail in the Training Manual and on-line help for the and UDA systems. In addition Diagnosys experts can assist and answer any questions you may have. Define Board, Netlist Generator and Schematic Generator are standard features of the TestVue software. The main features of the Schematic Generation package are listed blow: Rapid Generation - The circuit diagram is generated in a matter of seconds. Creation of Busses. Multiple / single page display - nets going across pages are labelled Easy Navigation between pages Symbols of "unknown" devices are automatically generated. Industry Standard EDIF Format Hard Copy Printout Capability. Page 28 of 37

29 Import facilities As a standard feature, TestVue software contains a number of import facilities that enable different format files to be used on the and UDA systems. Jedec Using JEDEC Device Data JEDEC Data is a term commonly used to refer to programming data for certain types of Integrated Circuits, usually PAL, GAL and other custom-type devices. These devices consist of many logic elements (gates, registers etc) that are linked together by fuses. These fuses can be either defined as Open or Closed thereby either linking elements together or isolating them from each other. A JEDEC File basically contains a description file defining which fuses are to be left Open or Closed - this file is known as the fuse-plot file, and is used by the device programmer to program the device. However, there are different ways in which the JEDEC file can be presented and these are fully described in a separate Application Note available on request. If the Vector file is available it is a simple matter to import this into. The TestVue software has the capability to efficiently handle different types of JEDEC data and offers solutions to the challenges posed by the differing file contents and formats. Page 29 of 37

30 LASAR LASAR is a digital logic simulator (Trademark Teradyne Inc.) commonly used for generating digital test programs. The test programmer creates a series of input test vectors (digital patterns) and the logic simulator then runs these against a software image it creates of the circuit. To build the software image the simulator uses models of each device the circuit contains. These device models can be produced in a variety of ways, LASAR V6.60 supports structural Verilog and VHDL languages. When the simulator runs the input vectors against the circuit image, it predicts the digital activity at every node in the circuit, including the outputs. This process therefore creates digital activity for input and output nodes which is used to create a test program. The activity created for all the internal nodes is used to create diagnostic information for a guided probe. A simulator can also predict the fault coverage, or comprehensiveness, of a test program by applying faults into the software image and seeing if the test program detects them. TestVue software has an importer for the LSRTAP files produced by the LASAR simulator. The LSRTAP file contains the input and output vectors i.e. a go / nogo test program for the circuit. The TestVue importer turns these vectors into a functional source file that can be executed on the or UDA system. Due consideration must be given to the data rate of the test program and hardware configuration of the or UDA system to ensure a successful import and execution of the code. Expert assistance is available from Diagnosys for this import process. VHDL Importer VHDL (Verilog Hardware Description Language, conforming to IEEE Std ) Verilog is a registered trademark of Cadence Design Systems, Inc. A VHDL file describes the hardware of an individual device. This file is used as an input to a VHDL simulator, one of the outputs from which is the vector file called Value Change Dump VCD (file). A VCD file contains information about value changes on selected variables within the design. Two variants of a VCD files exist: a) Four-state: to represent variable changes in 0, 1, X, and Z with no strength information. Page 30 of 37

31 b) Extended: to represent variable changes in all states and strength information. The TestVue VHDL Importer translates the contents of the VCD file into a functional source file that can be executed on the or UDA systems. Expert assistance is available from Diagnosys for this import process. BSDL Importer Boundary Scan testing is performed on a device that has specific Boundary Scan hardware designed into the silicon of the device as defined in the IEEE standard. Boundary Scan Description Language (BSDL) is a subset of VHDL and is used to describe how boundary scan functionality is implemented in a particular device. For a device to be compliant, it must have an associated BSDL file (BSDL files are often available for download from manufacturers' websites). The BSDL file describes the hardware registers and commands that a device can support. This information is used by boundary scan test software to access the device, or chain of such devices, to create a test program automatically. A typical test program will include pin opens, pin shorts, chain integrity, device ID tests and shorts between connected devices. So that this information can be used to test boundary scan enabled devices on the or UDA system, the TestVue software contains a BSDL import facility. The importer translates BSDL information so that it can be used to test devices on the or UDA systems. Boundary Scan Boundary Scan is a test technique which enables the testing of devices through the Test Access Port (TAP). Devices are specially designed to have this capability and enabled devices are often connected together using the TAP to form a chain. Boundary Scan was introduced as a way to overcome testability issues associated with large circuits and devices such as ASIC s, CPLD s, Micro Processors etc. It allows a serial data stream to be passed through a chain of cells internal to devices such that the data can then be applied internally (INTEST) or externally (EXTEST) to the device itself. In this way devices, the interconnect between devices, adjacent devices such as memory, can all be tested using the serial data stream. Boundary Scan is often referred to by several different names: Etc Scan test JTAG (Joint Test Action Group) - the original group formed to propose the standard IEEE 1149 the IEEE standard for Boundary Scan testing Page 31 of 37

32 The TestVue software has a standard feature to enable a quick test of Boundary Scan enabled devices if the pins are accessible. By using the EXTEST mode of the device a serial data stream is applied to the device and then the device pins are monitored to ensure there is correct connectivity into the device. This method will also detect open and short circuits between device pins. As an option, a full Boundary Scan solution is integrated into the system. This is then presented through a dedicated port on the front of the system so that it can be easily connected to devices or chains of devices on a circuit being tested. Diagnosys recognises that there are many Boundary Scan solutions available in the market today and that you may already have a preferred solution that you are using. Diagnosys is therefore able to integrate these solutions into the system. If you are not already using Boundary Scan then Diagnosys can propose a suitable solution to meet your needs. Page 32 of 37

33 TrakTest An important part of any accurate fault diagnostic system is the ability to test for, and diagnose, open circuit tracks or short circuits between tracks of a PCB. Without this ability, erroneous diagnostics messages may be given and devices changed without curing the failure. This type of fault can therefore be a major contributor towards the infamous NFF (No Fault Found) condition. The system eliminates the possibility of NFF situations caused through short or open circuits by using TrakTest software. This facility tests the continuity of tracks between devices and also tests for the presence of short circuits between pins of a device. Obviously a pre-requisite of this functionality is to be able to distinguish between genuine short / open conditions and faults conditions. It is therefore essential to have a Netlist available to define the connections on a PCB before this type of testing can be performed reliably. If the Netlist is not readily available, then the can be used to generate one from a known good board using its Reverse Engineering facility. Page 33 of 37

34 Device Test Interfaces Designed for use in demanding test environments and to cater for custom devices, Diagnosys has a comprehensive range of DTIs (Device Test Interfaces). The Diagnosys DTI range is purposely designed for use in demanding test environments. They provide the physical electrical interface between the pin electronics of the test system and the device being tested. These interfaces are constructed from a special material that is precision milled and drilled, delivering a hardwearing finish that will provide years of use. Large and robust range of Interfaces. A critical requirement for testing components in-circuit is to ensure good electrical contact with the pins of the device being tested. Although there are many commercially available test clips, they are often fragile and limited to the more common device package types. Diagnosys has designed and developed an extensive range of robust DTIs for use in the test environment. This range includes DTIs for fine pitch devices, through hole devices and underside probing. In addition to this standard range, custom DTIs can be provided to accommodate the many varied and diverse package designs you may encounter. Diagnosys DTIs use sharp pointed probes that greatly increase the contact reliability due to the high pressure at the probe tips. The resulting disruption of the oxide and flux that might cover the contact areas allows the tips to make contaminate free connections. The latest in our range of DTIs are 0.4mm designs that are used for the most complex components. While all test interfaces will eventually see some wear and tear, the Diagnosys DTIs are also designed to be repaired, not thrown away! Page 34 of 37

35 Out-of-Circuit Test Adaptors DIP IC Test & Development Module Program, Test, Identify or Compare DIP components up to 48 pins. 2 x 48 pin universal DIL ZIF adapters. 1 x 48 pin ZIF adapter for use with specific test modules. Power LED s for Voltage verification. Bread board panel for external component implementation. Jumper panels and cables for In-circuit simulation. Page 35 of 37

36 PLCC IC Test & Development Module Program, Test, Identify or Compare PLCC components up to 84 pins. 2 X 84 pin universal PLCC ZIF adapters. Power LED s for Voltage verification. Bread board panel for external component implementation. Jumper panels and cables for In-circuit simulation. Page 36 of 37

37 PGA IC Test & Development Module Program, Test or Identify PGA components up to 196 pins (14 x14 matrix) 1 X 196 pin universal PGA ZIF adapter. Power LED s for Voltage verification. Bread board panel for external component implementation. Jumper panels and cables for In-circuit simulation. Page 37 of 37