PinPoint IIR. Advanced Diagnostic System. A.Whitehead 2011
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1 PinPoint IIR Advanced Diagnostic System A.Whitehead 2011
2 The Organisation UK based design & manufacturing centers Over 30 years experience in the test business Electronic Test & Repair solutions market leader Specialise electronic diagnostics Obsolescence management solutions World-Wide customer & Application support Major Defence test provider Over 2000 installations world wide
3 World Wide Presence Distributors DiagnoSYS offices
4 Company History DCA Tech Test solutions Membrain 1991 Diagnosys Ltd Out Sourced Repair PCB Diagnostics Factron Schlumberger Diagnosys Systems Ltd MBO Fairchild PCB Test and Diagnostics High Performance ATE
5 Market Sectors Maintenance & repair of high value or critical electronics Military Aerospace Transportation Telecom Industrial Energy
6 Our Customers Military Avionics AIDC Taiwan Bharat Electronics (BEL) British Army Cyprus Army & Air Force DERA UK DSO Singapore Egypt Air Force French Army India Air Force / Navy South Korea Air Force Malaysian Air Force /Navy Israeli Air Force NAMSA Pakistan Air Force / Navy Israeli Army / Air Force AEC Saudi Arabia Thai Air Force Indonesia Air Force US Air Force / Navy Thales Boeing British Aerospace KLM Delta Airlines Lockheed Martin EADS G.E Avionics Gulf Helicopters Honeywell Panasonic (MAS) Saudi Airlines Selex S.R. Technics Smiths Aerospace Singapore Technologies Taly Avionics China Ultra United Airlines
7 Our Customers Mass Transit Industrial New York City Transit RATP France Alstom Intel London Underground Metro Atlanta Alcatel Texas Instruments Kawasaki Rail Car Bombardier Celestica Erricson Massachusetts Bay Transit Alstom Ford Samsung Metronet UK Fuji Electric Japan Mitsubishi AT&T SpoorNet South Africa Taiwan High Speed Rail NEC Transco Power Boston Mass Transit Vapor Rail GE Medical Siemens Shanghai Metro Deutsche Bahn AG Transco Nissan EuroMaint Manila Metro GE Medical
8 Product Family High Performance ATE Mixed Signal Functional and In-circuit diagnostic systems PCB and Module level performance diagnostics DiagnoSYS ATE & Diagnostic Products D-Tech Series Scaleable Performance Functional Go/NoGo Test Module and PCB Mid-Range ATE Functional Test with In-circuit diagnostic system. Module and PCB PCB Diagnostics PCB Diagnostic systems and tools Fault Finding Reverse engineering UDA Diagnostic sub-system for System Integrators PCB Diagnostics PCB Diagnostic systems and tools
9 What is PinPoint II? Worlds Leading Fault Finding System Powerful High specification Multi functional versatile test system Provides both In-Circuit and Functional test Supports multiple test strategies Flexible & modular Software & Hardware architecture Supports all technologies Digital, Analog & Mixed Signal User friendly interface
10 Why PinPoint II Cost effective solution Ability to repair & maintain all Boards Supports all Technologies High Back drive Current & high speed test for all circuit conditions Consistent repeatable and reliable results every time Fail Safe Guarantee, will not damage boards Detects and Isolate faults quickly Reverse Engineering capability Future proof protects your investment
11 Overview PC-based system running in a Windows environment Developed for troubleshooting populated PCB s Designed to fault-find to component level quickly Combines several test techniques for maximum fault coverage Generates Schematics and Documentation Uses an intuitive, easy-to-use Graphical Interface Dynamically tests components while in circuit Library of 17,000+ pre-developed Device Test Routines
12 Feature Summary Dynamic, In-circuit, Digital testing Analog Tests with Virtual Instruments Analog Signature Analysis Edge Connector Functional test JTAG Boundary Scan Option Reverse Engineering Schematic Generation IC Identifier on Unknowns PXI Test Integration Large IC Device Library Tests Traces between components +/- 12v Programmable Drive Levels
13 Features - Cont Back driving to DEF STD 0053 Large functional device library Intuitive Windows based Software Flexible interfacing PXI, GPIB, LabView etc Boundary Scan capability Wide range of fixtures available Reliable provides consistent Results Will not damage other components
14 Multiple Test Strategies Analog Functional Dynamic Digital Network Signatures Boundary Scan TMS TC KTDI TD O
15 Modular Versatile approach P2PMX: 48 Channel Multiplexor 8 / 14 slot Chassis P2A: Analog Instrumentation Card P2D: 48 Channel Driver Card P2M: 4 x 96 Matrix Card JTAG Port P2 UUT-PSU: +5, -5, +12, -12, +3.3v, Variable Reverse Engineering P2C: Controller Card 8 Guard Channel P2I-VTC: Vectorless Test Card
16 UUT Power Supply Integrated Test Power Supply +/- 5v, +/- 12v, +3.3v Programmable Over Current Detect Programmable Current Monitoring Options Integrated Programmable PSU Add external PSU s IEEE interface External PSU Control
17 Test Strategy Test Methodology Definitions & Colour Alignment COLOR KEY BOUNDARY SCAN TESTED STTO TESTED IN-CIRCUIT / FUNC TESTED MIXED SIGNAL TESTED FUNC / SPECIALIZED ANALOG TESTED ADAPTOR TESTED V/I SIGNATURE TESTED TEST METHODOLOGIES DEFINITIONS VALIDATES INTERCONNECTS AND FUNCTIONALITY OF COMPLEX DEVICES AND PERIPHERAL DEVICES SAFE TO TURN ON TEST (STTO), COMPLETED FROM EDGE TO VERIFY THE INTEGRITY OF CCA POWER PLANES, AND ASSOCIATED DEVICES. DYNAMIC POWERED ON TESTS, CONTACTS, OPENS / SHORTS, AND DEVICE FUNCTIONALLITY. INFERRED AND CLUSTER TESTING WILL BE UTILIZED WHENEVER POSSIBLE. CUSTOM FUNCTIONAL TESTS INCLUDING ANALOG STYLED MEASUREMENTS (VOLTAGE, FREQUENCY, PERIOD, TIME..ETC) UTILIZE SPECIALIZED PXI INSTRUMENTATION AND CUSTOM TEST ADAPTERS TO PERFORM COMBINATIONAL DVI AND RGB TESTS. ANALOG MEASUREMENTS (VOLTAGE, FREQUENCY, PERIOD, TIME..ETC) DE-SOCKET TEST COMPONENT UTILIZING CUSTOM DIAGNOSYS I/C SOCKET ADAPTOR OPTION NODAL RESPONSE ANALOG SIGNATURE ANALYSIS OF DISCRETE DEVICE NETWORKS, FROM THE EDGE.
18 Test Strategy PASS With Confidence J1 JTAG Port U8 U9 U10 U11 P1 U48 U22 U38 U32 U43 DVI Video Generator U58 U53 U54 DVI Digital Receiver In J3 U74 L1 U76 (STTO) 1.8V Regulator FPGA DVI Digital Transmitter Out J4 U91 J5 J6 L4 U90 2.5V Regulator VCC_AUX 3.3V Regulator 1.2V Reg Virtex 4 CORE (+ -) 5V (+ -) 12V (RGB NI PXI Generator Instrument)
19 Back-Driving PinPoint is 100% DEF STAN Compliant Devices have to be Functionally Tested in the In-Circuit Configuration Outputs of Devices Connected to the Inputs being Tested Must be Overdriven Outputs are Forced to the Correct Logic State by Saturating the Driver Reliable results and safe conditions demand High currents being administered with in safe time periods.
20 Back-Driving
21 Back Driving - Assurance Risk - Back driving can damage components Def Stan defines the safe limits for back driving these must not be exceeded Unless a system is fully Def Stan compliant premature component damage can occur. PinPoint is fully 100% Def Stan compliant Consistent reliable and safe results,
22 Schematic Generation Powerful Reverse engineering tool Generates Netlist and Circuit Diagram Ideal for unknown boards Simple Schematic generation Netlist Schematic
23 Reverse Engineering Utilising Multiple Clips and Connectors, Learn Interconnects of Circuit PinPoint II time to complete Netlist and Schematic 16 hours card shown (100 components approx) Manually, Over 4 Months AAA, U1.5_U2.11, AAB, U1.9_U1.19 U1 U2
24 Analog Test Facilities Digit Digital Multi Meter 100Mhz Dual Channel Oscilloscope Dual Channel Frequency / Timer Counter Arbitrary Waveform Generator 4 max per card 16 Single Ended / 8 Differential Analog Inputs Shorts Locator LCR Bridge Parametric Tester
25 Software Features TestVue TM Operating Software Environment TestFlow Program Studio TM Programming SW Device Libraries SeaWave TM Logic Analyser Display TrakTest TM Software Windows TM Operating System TestFlow
26 Graphical Programming Providing Structure & Guidance Visual Guidance and Test Results Test Program
27 Data Sheet Library included
28 Data Capture Pod Capture Input Data Pass stimulus data to PPII Reset or Sync Inputs driven Program Generated Outputs collected
29 Wide Range of Test Clips available Diagnosys unique Patent Design 1000 s of Clips Available Custom Interfaces available, on request Long Life design - Fatigue Life of over 1,000,000 cycles Ergonomic Handles for Even Weight Dist. High Reliable electrical contact Repairable should a pin fail Underside Clips DIP, SOIC, TQFP, QVSOP. TSOP -1,2, SSOP, PQFP, QFP PGA, ZIP, PLCC, SIL,
30 Test Clip Examples Up to 240 pin PQFP 70 pin TSSOP Up to 42 pin CSOP Up to 160 pin QFP
31 Boundary Scan Complete Boundary Scan System (JTAG) 100% IEEE Compliant System Development & Production solution Interactive testing of BGA Components In-System Programming of devices Quick & easy to Use TMS TC KTDI TD O
32 Conformal Coating Removal Efficient & safe coating removal ESD Safe Environment No chemicals No PCB contamination or degradation Controlled & Selective removal Reusable Media Aerospace Industry recognition Safely Removes: Epoxy, Urethane, Parlance, Silicon & Acrylic coatings
33 PinPoint II Summary Best in Class Diagnostic system Detects and finds component faults FAST High Reliability & Quality system Excellent Reverse engineering capability Provides the complete tool set Best Solution Available Safe Investment Widely Used within Military and Mass Transit industry
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