March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive

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1 March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive 2018 BiTS Workshop Image: pilgrims49 / istock

2 COPYRIGHT NOTICE The presentation(s)/poster(s) in this publication comprise the Proceedings of the 2018 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2018 BiTS Workshop. This version of the presentation or poster may differ from the version that was distributed in hardcopy & softcopy form at the 2018 BiTS Workshop. The inclusion of the presentations/posters in this publication does not constitute an endorsement by BiTS Workshop or the workshop s sponsors. There is NO copyright protection claimed on the presentation/poster content by BiTS Workshop. However, each presentation/poster is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies. The BiTS logo and are trademarks of BiTS Workshop. All rights reserved.

3 Innovative Ground Block Pin Design for Improved High-Frequency Test Performance over a Conventional Ground Block Approach Introduction With the growth of electronic products that require wireless connection such as mobile and IoT, there is continuous demand for many high frequency devices. High-performance sockets for testing such high-frequency devices are indispensable to ensure product reliability. For reliable testing, it is necessary to ensure stable contact between the pin and the device, but oxides and foreign matter affect test stability, so sockets are required to prevent them. Similar to the contact pin, the ground (GND) Block is susceptible to oxides and foreign matter. The contact properties are improved by redesigning the tip shape, however, this is not enough. Challenges Eichi Osato Soheil Khavandi with scrubbing performance can be used for reliable testing of high frequency devices with less cleaning iteration. Low thermal resistance, high current capability and low load are also required. Pin (International Patent Pending) Material: BeCu Plating: NiAu Micronics Japan Co.,Ltd. MJC Electronics Corporation Mechanical specifications Contact force Contact stroke Mechanical durability Electrical specifications (Flat) (Peaked) Innovative Solution (International Patent Pending) 0.076±0.015N/pin 0.06mm Up to 1M insertions Contact resistance <0.1ohm Current rating (Total ) 7.4A High frequency (GND 2) 2.96GHz

4 Contact Mechanism Pin action and Pin arrangement Hard stop Pin tip Scrub length (~0.015mm) Before contact After contact (Stroke ~0.06mm) Minimum of 4 Pins are required to have a complete configuration. Mechanical Durability Conditions: Test stroke 0.06mm, 1M insertions, Room temp. * Pin did not show any load reduction or pin tip damage. Thermal Resistance Conditions: Heat source=1w, Applied time=500sec. 1.2x1.2=1.44mm 2 2.4x2.1=5.04mm 2 4.3x4mm 0.4 /W 4.3x4= 17.2mm /W Pin 2.4x2.1mm 6.3 /W 6.9 /W 1.2x1.2mm 11 /W 8.4 /W *For small PKG, Pin has better performance than the. Innovative Ground Block Pin Design for Improved High-Frequency Test Performance over a Conventional Ground Block Approach 2

5 Current Capability Conditions: Pin temperature rise less than 20C. 8.4A 8.6A 1.2x1.2 =1.44mm^2 2.4x2.1 =5.04mm^2 9.3A 4.3x4 =17.2mm^2 4.3x4mm 9.3A 9.4A Pin 9.4A 2.4x2.1mm 8.6A 7.8A 7.8A 7.4A High Frequency 1.2x1.2mm 8.4A Conditions: Housing εr=3.3, Elastomer εr=3.0, Device size 5x5mm : 2.8x2.8mm, Pin: 24 pins 7.4A *For large PKG, Pin has the same performance as the. (-1.0dB) :14.36GHz pin:14.36ghz (-20dB) :3.01GHz pin: 2.96GHz Port 1 Port 1 Conclusion Port 2 Pin Pin Port 2 * Pin has high frequency performance equivalent to the. High frequency characteristics equivalent to. Stable electrical contact at low contact force. Excellent heat dissipation and high current capabilities. Cleaning frequency reduction with scrub motion configuration. Pin Innovative Ground Block Pin Design for Improved High-Frequency Test 3 Performance over a Conventional Ground Block Approach