~ > TEXAS~ SN5427, SN54LS27, SN7427, SN74LS27 TRIPLE 3-INPUT POSITIVE-NOR GATES. Vee INSTRUMENTS POST OFOICE BOX OALLAS.

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SDLS089 Package Options Include Plastic "Small Outline" Packages, Ceramic Chip Carriers and Flat Packages, and Plastic and Ceramic DIPs Dependable Texas Instruments Quality and Reliability

1 SDLS089 Package Options Include Plastic "Small Outline" Packages, Ceramic Chip Carriers and Flat Packages, and Plastic and Ceramic DIPs Dependable Texas Instruments Quality and Reliability description These devices contain three independent 3-input NOR gates. The SN5427 and SN54LS27 are characterized for operation over the full military temperature range of -55 C to 125 C. The SN7427 and SN74LS27 are characterized for operation from O"C to 70"C. logic symbol t. FUTION TABLE (each gatel INPUTS OUTPUT A 8 c y H X X L X H X L X X H l l l l H 1A ;;., 18 1C 28 2C 3A 38 3C 1121 r This symbol is in accordance with ANSI/IEEE Std and IEC Publication Pin numbers shown are for D. J, N. and W packages. (6) (Bl 1Y 2Y 3Y SN5427, SN54LS27, SN7427, SN74LS27 TRIPLE 3-INPUT POSITIVE-NOR GATES DECEMBER REVISED MARCH 1988 SN5427. SN54lS27. J OR W PACKAGE SN7427. N PACKAGE SN74lS27... D OR N PACKAGE!TOP VIEW! Vee 1A 18 1C 1Y 28 3C 2C 3B 2Y 3A GNO 3Y SN54LS27... FK PACKAGE (TOPV!EWI u aj<(u UU ~-z>- 1Y 28 3C 2C 38 logic diagram positive logic >-OU>-<( NZZMM c:j No internal connection ~ > ~ > ~ > 1A 18 1Y 1C 28 2Y 2C 3A 38 3V 3C Y=A+B+CorY=A B C PRODUCTION DATA documents co11tain informati~n cllrrllllt as of pulllicatioa iltt. Prud~~~:ts eentvrm to specifications per the terms of T axas lnstrumnts standard warranty. Production pror:essing does not nucenurily include testing of all parameters. TEXAS~ POST OFOICE BOX OALLAS. TEXAS 75265

2 SN5427, SN54LS27, SN7427, SN74LS27 TRIPLE 3-INPUT POSITIVE-NOR GATES schematics (each gate) '27 r---~ ~--~>--vcc INPUTS A.., ; OUTPUT y 1.5 kf! Resistor values shown are nominal absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage, Vee (see Note 1) V Input voltage: ' V 'LS , V Operating free air temperature: SN54' ,..., C to 125 C SN74'... 0 C to 70 C Storage temperature range C to 150 C NOiE 1 Voltage valug>s are with resp&et to network ground terminal. TEXAS~ POST OFFICE BOX DALLAS. TEXAS 75265

3 SN5427, SN7427 TRIPLE 3-INPUT POSITIVE-NOR GATES recommended operating conditions SN5427 SN7427 MIN NOM MAX MIN NOM MAX Vee Supply voltage v input voltage 2 2 v V1L Low level input voltage v 'oh High level output current ma IOL Low-level output current ma TA Operating free a r temperature ac electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) TEST CONDITIONS t SNS427 SN7427 MIN TYP :j: MAX MIN TYP:t v,k Vee~ MIN, l1~-12ma 1.5 VQH Vee= MIN, V1L = 0.8 V, IQH = -0.8mA A VoL Vee MIN, vih 2V, lol ~ 16 ma II Vee= MAX, Vt = 5.5 V 1 IIH Vee= MAX, V1 = V 40 ltl Vee= MAX, Vt = 0.4 V 1.6 tos Vee= MAX tech Vee= MAX. v, OV I eel Vee= MAX, See Note MAX 1.5 v v 0.4 v I ma 40 p.a -1.6 ma -55 rna 16 ma 26 ma t Fo"' conditions shown as MIN or- MAX. use the appropriate value specified under recommended operating conditions. l All typical values are at Vee~ 5 V, T A; 25 c. Not rnore than one output should be shorted at a time, NOTE 2: One input at 4.5 V, all others at GND. switching characteristics, Vee "' 5 V, T A == 25 C (see note 3) FROM iinputi TO!OUTPUT I TEST CONDITIONS MIN TYP MAX tplh tphl A, B or C y RL =400 n, CL=15pF ns 11 ns NOTE 3: Load circuits and voltage waveforms are shown in Section 1. TEXAS~ POS- OFFICE BOX DALLAS. TEXAS 75265

SN54LS27, SN74LS27 TRIPLE 3-rNPUT POSITIVE-NOR GATES recommended operating conditions SN54LS27 SN74LS27 MIN NOM MAX MIN NOM MAX Vee Supply voltage 4.5 5 5.5 4.75 5 5.

4 SN54LS27, SN74LS27 TRIPLE 3-rNPUT POSITIVE-NOR GATES recommended operating conditions SN54LS27 SN74LS27 MIN NOM MAX MIN NOM MAX Vee Supply voltage v VtH High-level input voltage 2 2 v VIL Low-level input voltage v IQH High-level output current rna 'ol Low-le11el output current 4 B ma TA Operating free-eir temperature ac electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) TEST CONDITIONS t SN54LS27 SN74LS21 MIN TYP* MAX MIN TYP* v,k Vee= MIN, It~- 18 rna -1.5 VOH Vee =MIN, V1L =MAX, 'oh -0.4mA VoL Vee= MIN, VtH = 2 V, lol 4mA Vee MIN, VtH=2V, lol =B ma 0.35 lj Vee= MAX, V1 =7V 0.1 IJH Vee= MAX, v, = 2.7 v 20 ltl Vee= MAX, v, = 0.4 v -0.4 los Vee= MAX 'cch Vcc=MAX, V1 =OV eel Vee= MAX, See Note MAX -1.5 v v v 0.1 rna 20 IJ.A -0.4 ma 100 ma 4 ma 6.8 ma t For conditions shown as M N or MAX, use the appropriate vatue specified undar recommended openutng conditions. t All typical value$ are at V CC ~ 5 V, T A = 25 C. Not more than on output should be shorted at a t1me, and 1he dunnion of the hoft-circuit shoutd not exceed one second. NOTE 2: One input at 4.5 V, all othero at GND. switching characteristics, Vee= 5 V, T A= 25"'e (see note 3) FROM!INPUT I TO ~OUTPUT I TEST CONDITIONS MIN TYP tplh 10 A. B or C y AL =2kn, CL 15 pf tphl 10 MAX 15 ns 15 ns NOTE 3: Load circuits and voltage waveforms are shown in Section 1. TEXAS ""' POST OFFICE BOX GALLAS. TEXAS 75265

IMPORTANT NOTICE Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain

5 IMPORTANT NOTICE Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest version of relevant information to verify, before placing orders, that the information being relied on is current. Tl warrants performance of its semiconductor products and related software to the specifications applicable at the time of sale in accordance with Tl's standard warranty. Testing and other quality control techniques are utilized to the extent Tl deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Certain applications using semiconductor products may involve potential risks of death, personal injury, or severe property or environmental damage ("Critical Applications"). Tl SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, INTENDED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. Inclusion of Tl products in such applications is understood to be fully at the risk of the customer. Use of Tl products in such applications requires the written approval of an appropriate Tl officer. Questions concerning potential risk applications should be directed to Tl through a local SC sales office. In order to minimize risks associated with the customer's applications, adequate design and operating safeguards should be provided by the customer to minimize inherent or procedural hazards. Tl assumes no liability for applications assistance, customer product design, software performance, or infringement of patents or services described herein. Nor does Tl warrant or represent that any license, either express or implied. is granted under any patent right, copyright, mask work right, or other intellectual property right of Tl covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. Copyright 1996, Texas Instruments Incorporated

6 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE ( CRITICAL APPLICATIONS ). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. ILUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER S RISK. In order to minimize risks associated with the customer s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI s publication of information regarding any third party s products or services does not constitute TI s approval, warranty or endorsement thereof. Copyright 1998, Texas Instruments Incorporated

SN54F38, SN74F38 QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS WITH OPEN-COLLECTOR OUTPUTS

SN54F38, SN74F38 QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS WITH OPEN-COLLECTOR OUTPUTS SNF, SN7F SDFS0A MARCH 7 REVISED OCTOBER Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 00-mil DIPs description These devices contain four