Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
|
|
- James Hopkins
- 5 years ago
- Views:
Transcription
1 Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
2 Overview of CAT-GS Mission requirements: Effective area > 1000 cm 2 (0.3 1 kev) Spectral resolution E/ΔE > 3000 (FWHM) Implementation: CAT grating array aft of mirrors (< 6 kg) Linear CCD detector array (32 CCDs) on instrument bus (< 40 kg) Flight mirror assembly view Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
3 Transmission Grating Spectrometer Heritage: Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
4 Diffraction Gratings for X-ray and EUV Spectroscopy Transmission Gratings Blazed Reflection Gratings Relaxed alignment & surface flatness tolerance Low diffraction efficiency (absorption, etc.) High diffraction efficiency Requires precise alignment, flat & smooth surface Grating Equation mλ = p(sinα + sin β ) m m: diffraction order λ: wavelength p: grating period α: incident angle, β m : diffracted angle Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
5 Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
6 Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
7 Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
8 Diffraction efficiency comparison bw. Chandra and CAT gratings Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
9 Mirror only (12.5 HPD) Observatory (15.0 HPD) Effect of sub-aperturing on resolution (Courtesy Andrew Rasmussen) λ/δλ ~ 2200 λ/δλ ~ 1350 Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27, 2009
10 Short history of the Space Nanotechnology Laboratory at MIT - Fabricated 200 (HEG) and 400 (MEG) nm-period Au transmission phase gratings for Chandra HETGS (> 500 gratings, > 1in 2, ) - SNL gratings flown on other missions: - SOHO (1995) - IMAGE (2000) - GOES N, O, P (2004, 2007, 2008) - TWINS A,B (2004, 2006) - Developed advanced high-precision grating patterning and nanofabrication tools and techniques Silicon CAT gratings Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
11 MIT Nanoruler Scanning-Beam Interference Lithography Tool Uses phase-locked, scanning beams to pattern large substrates (up to 300 mm) Tight control of grating phase & duty cycle (< 3 nm) Can pattern up to 5000 l/mm Recently demonstrated spatial frequency division which enables patterning up to 20,000 l/mm Heilmann et al., Nanotechnology 15, S504 (2004). C.-H. Chang et al., Opt. Lett. 33, 1572 (2008) Nanoruler with 300 mm silicon wafer Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
12 Nanoruler II 91 cm x 42 cm pulse compression grating Plymouth Grating Laboratory Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
13 Diffraction Gratings for X-ray and EUV Spectroscopy Transmission Gratings Blazed Reflection Gratings Relaxed alignment & surface flatness tolerance Low diffraction efficiency (absorption, etc.) High diffraction efficiency Requires precise alignment, flat & smooth surface Grating Equation mλ = p(sinα + sin β ) m m: diffraction order λ: wavelength p: grating period α: incident angle, β m : diffracted angle Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
14 How do you go from a blazed reflection grating to a blazed transmission grating? 2m+1 1m 0m-1 0 Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
15 Critical-Angle Transmission Gratings Oblique incidence, normal grating bars Normal incidence, tilted grating bars Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
16 Critical Angle Transmission (CAT) Grating Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
17 Critical-Angle Transmission (CAT) Grating Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
18 CAT Grating Design Issues Design Parameters (IXO) Period, p = 200 nm (large dispersion) Duty cycle (b/p) = 0.2 (high throughput) Critical angle, θ = 1.5º (high reflectivity) d = a/tanθ = 6 µm (optimum filling ) Sidewall roughness < 1 nm (high reflectivity) Fabrication Challenges High aspect ratio (d/b ~ 150) Thin grating bars (b = 40 nm) Freestanding structure Smooth sidewalls (roughness < 1 nm) Fine period gratings (p = 200 nm) Initial prototype: p = 574 nm, d = 10 μm Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
19 Recent 200 nm-period CAT grating fabrication results - Smaller period - Smaller sidewall angle - Higher etch anisotropy - Larger process latitude - Larger open area (> 45%) Scanning electron micrographs: (a) Top view (b) Bottom view (c) Cross section (destructive) As of January 2009: IXO design parameters achieved: d = 6 μm, <b> = 40 nm Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
20 Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
21 -2-3 Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
22 First x-ray data from 200 nm-period CAT gratings intensity [arb. units] nm 1.6 nm 2.4 nm nm nm 17.5 nm α ~ 2.6 o - strong blazing - reduced blazing for λ with θ c (λ) < α -0 th order transmitted at shortest wavelengths (CAT grating becomes weak phase grating) α = 2.6 deg (blaze 5.2 deg from 0 th order) Raw data (not normalized) detector angle [deg] Heilmann et al. Proc. SPIE 7011 (2008) Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
23 Normalized Diffraction Efficiency Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
24 efficiency wavelength [nm] 0th order -1st order -2nd order -3rd -4th -5th -6th -7th -8th -9th -10th order 0th order -1st order -2nd order sum(-1:-10) sum on det. Model calculations: Silicon CAT grating p = 200 nm θ= 1.5 deg 20 m focal length: 78 cm CCD array (32 CCDs) th order -1st order -2nd order 0.7-3rd order -4th 0.6-5th efficiency th -7th -8th -9th -10th order th -12th -13th sum(-1:-10) sum on det. energy [kev] Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
25 The CCD array covers a range of m*λ = 7.2 nm to 15 nm mλ = p(sinα + sin β ) m 0.7 efficiency m*lambda [nm] Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
26 Order Sorting Capability of CAT-GS detector read-out at blaze Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
27 Baseline CCD for CAT MIT/Lincoln, 1024 x 1024, 24-micron pixels, 4 outputs High-performance backside treatment On-chip binning for nominal ~50 fps readout rate Chandra/Suzaku heritage: ~100 CCD-years on-orbit & counting Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
28 Detector Array Linear array of 32 CCDs (25 mm x 25 mm, 24 μm pixel size) Mass: Camera kg (depending on shielding requirement) Detector electronics and power supply (DEA) 22 kg Digital processor 14 kg Power: Camera DEA Digital processor 5 W (thermal control) 28 W 20 W Courtesy David Robinson Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
29 Resolution (FWHM): black CAT-GS <R> ~ 3000 red XMS (ΔE = 2eV) BUT: for A = 1000 cm 2 subaperturing provides R = 4500 Figure of Merit sqrt(a*r): black CAT-GS <R> ~ 3000 A = 3000 cm 2 red XMS (ΔE = 2eV) green no gratings For more detail and response files go to Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
30 Summary - CAT grating spectrometer easily meets & exceeds IXO requirements - CAT gratings combine advantages of transmission and blazed reflection gratings (low mass, relaxed alignment tolerances, high resolution, polarization insensitive - CAT-GS opens window into high-resolution soft x-ray spectroscopy Technology development: Increase open area (pre-etch techniques, etc.) Increase grating size (hierarchical support structures) Acknowledgements Eric Gullikson, Bob Fleming, Kathy Flanagan, Andrew Rasmussen, Chih-Hao Chang, Yong Zhao NSL & MTL (MIT) NASA ROSES APRA, Samsung scholarship program, Kavli Instrumentation Fund Ralf K. Heilmann CAT-GS: Critical-Angle Transmission Grating Spectrometer January 27,
Assembly of thin gratings for soft x-ray telescopes
Assembly of thin gratings for soft x-ray telescopes Mireille Akilian 1, Ralf K. Heilmann and Mark L. Schattenburg Space Nanotechnology Laboratory, MIT Kavli Institute for Astrophysics and Space Research,
More informationControl of Light. Emmett Ientilucci Digital Imaging and Remote Sensing Laboratory Chester F. Carlson Center for Imaging Science 8 May 2007
Control of Light Emmett Ientilucci Digital Imaging and Remote Sensing Laboratory Chester F. Carlson Center for Imaging Science 8 May 007 Spectro-radiometry Spectral Considerations Chromatic dispersion
More informationLenses lens equation (for a thin lens) = (η η ) f r 1 r 2
Lenses lens equation (for a thin lens) 1 1 1 ---- = (η η ) ------ - ------ f r 1 r 2 Where object o f = focal length η = refractive index of lens material η = refractive index of adjacent material r 1
More informationSimple Spectrograph. grating. slit. camera lens. collimator. primary
Simple Spectrograph slit grating camera lens collimator primary Notes: 1) For ease of sketching, this shows a transmissive system (refracting telescope, transmission grating). Most telescopes use a reflecting
More informationDiffractive Optics for Moon Topography Mapping
Diffractive Optics for Moon Topography Mapping John G. Smith a, Luis Ramos-Izquierdo b, Andrew Stockham a, Stan Scott b a MEMS Optical *, Inc., 205 Import Circle, Huntsville, AL, USA 35806 b NASA Goddard
More informationDiffraction Efficiency
Diffraction Efficiency Turan Erdogan Gratings are based on diffraction and interference: Diffraction gratings can be understood using the optical principles of diffraction and interference. When light
More informationOptics Vac Work MT 2008
Optics Vac Work MT 2008 1. Explain what is meant by the Fraunhofer condition for diffraction. [4] An aperture lies in the plane z = 0 and has amplitude transmission function T(y) independent of x. It is
More informationSpectrographs. C. A. Griffith, Class Notes, PTYS 521, 2016 Not for distribution.
Spectrographs C A Griffith, Class Notes, PTYS 521, 2016 Not for distribution 1 Spectrographs and their characteristics A spectrograph is an instrument that disperses light into a frequency spectrum, which
More informationAstronomical spectrographs. ASTR320 Wednesday February 20, 2019
Astronomical spectrographs ASTR320 Wednesday February 20, 2019 Spectrographs A spectrograph is an instrument used to form a spectrum of an object Much higher spectral resolutions than possible with multiband
More informationLECTURE 14 PHASORS & GRATINGS. Instructor: Kazumi Tolich
LECTURE 14 PHASORS & GRATINGS Instructor: Kazumi Tolich Lecture 14 2 Reading chapter 33-5 & 33-8 Phasors n Addition of two harmonic waves n Interference pattern from multiple sources n Single slit diffraction
More informationCondenser Optics for Dark Field X-Ray Microscopy
Condenser Optics for Dark Field X-Ray Microscopy S. J. Pfauntsch, A. G. Michette, C. J. Buckley Centre for X-Ray Science, Department of Physics, King s College London, Strand, London WC2R 2LS, UK Abstract.
More informationIntroduction to Microeletromechanical Systems (MEMS) Lecture 8 Topics. MEMS Overview
Introduction to Microeletromechanical Systems (MEMS) Lecture 8 Topics MicroOptoElectroMechanical Systems (MOEMS) Scanning D Micromirrors TI Digital Light Projection Device Basic Optics: Refraction and
More informationHigh spatial resolution measurement of volume holographic gratings
High spatial resolution measurement of volume holographic gratings Gregory J. Steckman, Frank Havermeyer Ondax, Inc., 8 E. Duarte Rd., Monrovia, CA, USA 9116 ABSTRACT The conventional approach for measuring
More informationScanning laser reflection tool for alignment and period measurement of critical-angle transmission gratings
Scanning laser reflection tool for alignment and period measurement of critical-angle transmission gratings Jungki Song, 1 Ralf K. Heilmann, 1 Alexander R. Bruccoleri, 2 Edward Hertz, 3 and Mark L. Schattenburg
More informationDiffraction efficiency of 200-nm-period critical-angle transmission gratings in the soft x-ray and extreme ultraviolet wavelength bands
Diffraction efficiency of 200-nm-period critical-angle transmission gratings in the soft x-ray and extreme ultraviolet wavelength bands Ralf K. Heilmann, 1, * Minseung Ahn, 1 Alex Bruccoleri, 1 Chih-Hao
More informationIntroduction to Diffraction Gratings
Introduction to Diffraction Diffraction (Ruled and Holographic) Diffraction gratings can be divided into two basic categories: holographic and ruled. A ruled grating is produced by physically forming grooves
More informationUnderstanding and selecting diffraction gratings
Understanding and selecting diffraction gratings Diffraction gratings are used in a variety of applications where light needs to be spectrally split, including engineering, communications, chemistry, physics
More informationSpherical Crystal X-ray Imaging for MTW, OMEGA, and OMEGA EP
Spherical Crystal X-ray Imaging for MTW, OMEGA, and OMEGA EP C.STOECKL, G. FISKEL, R. K. JUNGQUIST, P. M. NILSON, AND W. THEOBALD University of Rochester, Laboratory for Laser Energetics Spherical Crystal
More informationOptical Topography Measurement of Patterned Wafers
Optical Topography Measurement of Patterned Wafers Xavier Colonna de Lega and Peter de Groot Zygo Corporation, Laurel Brook Road, Middlefield CT 6455, USA xcolonna@zygo.com Abstract. We model the measurement
More informationLECTURE 12 INTERFERENCE OF LIGHT. Instructor: Kazumi Tolich
LECTURE 12 INTERFERENCE OF LIGHT Instructor: Kazumi Tolich Lecture 12 2 17.2 The interference of light Young s double-slit experiment Analyzing double-slit interference 17.3 The diffraction grating Spectroscopy
More informationImaging Spectrometers
JOBIN YVON Imaging Spectrometers ihr Series Uniquely shaped for uniquely superior performance. ihr Series Imaging Spectrometers A Unique Shape for a Unique Spectrometer The difference between ihr spectrometers
More informationElectricity & Optics
Physics 24100 Electricity & Optics Lecture 27 Chapter 33 sec. 7-8 Fall 2017 Semester Professor Koltick Clicker Question Bright light of wavelength 585 nm is incident perpendicularly on a soap film (n =
More informationspecular diffuse reflection.
Lesson 8 Light and Optics The Nature of Light Properties of Light: Reflection Refraction Interference Diffraction Polarization Dispersion and Prisms Total Internal Reflection Huygens s Principle The Nature
More information(Fiber-optic Reosc Echelle Spectrograph of Catania Observatory)
(Fiber-optic Reosc Echelle Spectrograph of Catania Observatory) The echelle spectrograph delivered by REOSC (France), was designed to work at the F/15 cassegrain focus of the 91-cm telescope. The spectrograph
More informationFreeform optics at ESA: an overview
Freeform optics at ESA: an overview C.Pachot, A.Zuccaro Marchi, S.Mahalik, M.Miranda, A.Deep, L.Maresi, O.Sqalli, M.Taccola, M.Francois, S.Santandrea European Space Agency ESA, ESTEC, Keplerlaan 1, 2201
More informationd has a relationship with ψ
Principle of X-Ray Stress Analysis Metallic materials consist of innumerable crystal grains. Each grain usually faces in a random direction. When stress is applied on such materials, the interatomic distance
More informationSpectrograph overview:
High performance measurement systems Monochromator Family Gilden Photonics offers a range of integrated optical wavelength solutions in customized designs, OEM design, manufacturing and value added resell
More informationSTANDARD SERIES MONOCHROMATOS FEATURES. Highly Customizable Modular Design. Two Configurable Input and Output Ports
STANDARD SERIES MONOCHROMATOS FEATURES Highly Customizable Modular Design Two Configurable Input and Output Ports Configurable turret and Grating Options USB2.0 Communication A Full Line of Input and Output
More informationDevelopment of EUV-Scatterometry for CD Characterization of Masks. Frank Scholze, Gerhard Ulm Physikalisch-Technische Bundesanstalt, Berlin, Germany
Development of EUV-Scatterometry for CD Characterization of Masks PB Frank Scholze, Gerhard Ulm Physikalisch-Technische Bundesanstalt, Berlin, Germany Jan Perlich, Frank-Michael Kamm, Jenspeter Rau nfineon
More informationIntroduction to. 3D Scanning Confocal Microscope with Spectrometer
Introduction to Nanofinder-S 3D Scanning Confocal Microscope with Spectrometer Alexei Kuzmin E-mail: a.kuzmin@cfi.lu.lv Principle of Confocal Microscopy Laser X-Y Excitation Pinhole Excitation Filter Objective
More informationExtreme Ultraviolet Phase Contrast Imaging
Extreme Ultraviolet Phase Contrast Imaging Gregory Denbeaux 1, Rashi Garg 1, Andy Aquila 2, Anton Barty 3, Kenneth Goldberg 2, Eric Gullikson 2, Yanwei Liu 2, Obert Wood 4 1, University at Albany, Albany,
More informationX-ray Optics. How do we form an X-Ray Image?
X-ray Optics X-Ray Astronomy School V 6 August 2007 Dan Schwartz SAO/CXC How do we form an X-Ray Image? B1509-58 1E0658 Cen A This talk is X-rayted. You must be 2 light-nanoseconds tall for admittance
More informationPHYSICS 213 PRACTICE EXAM 3*
PHYSICS 213 PRACTICE EXAM 3* *The actual exam will contain EIGHT multiple choice quiz-type questions covering concepts from lecture (16 points), ONE essay-type question covering an important fundamental
More information4D Technology Corporation
4D Technology Corporation Dynamic Laser Interferometry for Company Profile Disk Shape Characterization DiskCon Asia-Pacific 2006 Chip Ragan chip.ragan@4dtechnology.com www.4dtechnology.com Interferometry
More informationPhase-Contrast Imaging and Tomography at 60 kev using a Conventional X-ray Tube
Phase-Contrast Imaging and Tomography at 60 kev using a Conventional X-ray Tube T. Donath* a, F. Pfeiffer a,b, O. Bunk a, W. Groot a, M. Bednarzik a, C. Grünzweig a, E. Hempel c, S. Popescu c, M. Hoheisel
More informationWaves & Oscillations
Physics 42200 Waves & Oscillations Lecture 41 Review Spring 2016 Semester Matthew Jones Final Exam Date:Tuesday, May 3 th Time:7:00 to 9:00 pm Room: Phys 112 You can bring one double-sided pages of notes/formulas.
More informationUnit 5.C Physical Optics Essential Fundamentals of Physical Optics
Unit 5.C Physical Optics Essential Fundamentals of Physical Optics Early Booklet E.C.: + 1 Unit 5.C Hwk. Pts.: / 25 Unit 5.C Lab Pts.: / 20 Late, Incomplete, No Work, No Units Fees? Y / N 1. Light reflects
More informationCoupling of surface roughness to the performance of computer-generated holograms
Coupling of surface roughness to the performance of computer-generated holograms Ping Zhou* and Jim Burge College of Optical Sciences, University of Arizona, Tucson, Arizona 85721, USA *Corresponding author:
More informationPhysics 272 Lecture 27 Interference (Ch ) Diffraction (Ch )
Physics 272 Lecture 27 Interference (Ch 35.4-5) Diffraction (Ch 36.1-3) Thin Film Interference 1 2 n 0 =1 (air) t n 1 (thin film) n 2 Get two waves by reflection off of two different interfaces. Ray 2
More informationX-Ray fluorescence and Raman spectroscopy
X-Ray fluorescence and Raman spectroscopy Advanced physics laboratory (nd part) 4CFU Catalini Letizia, De Angelis Giulia Vittoria, Piselli Verdiana Abstract In this paper we report about two different
More informationUniversity Physics (Prof. David Flory) Chapt_37 Monday, August 06, 2007
Name: Date: 1. If we increase the wavelength of the light used to form a double-slit diffraction pattern: A) the width of the central diffraction peak increases and the number of bright fringes within
More informationProgress of the Thomson Scattering Experiment on HSX
Progress of the Thomson Scattering Experiment on HSX K. Zhai, F.S.B. Anderson, D.T. Anderson HSX Plasma Laboratory, UW-Madison Bill Mason PSL, UW-Madison, The Thomson scattering system being constructed
More informationEFFECTS OF VARYING INCIDENT ANGLE ON THE CONTRAST OF THE FRINGE METROLOGY USING A FRESNEL ZONE PLATE
EFFECTS OF VRYING INCIDENT NGLE ON THE CONTRST OF THE FRINGE METROLOGY USING FRESNEL ZONE PLTE Chulmin Joo,G.S.Pati,CarlG.Chen,PaulT.Konkola,RalfK.Heilmann, and Mark L. Schattenburg Massachusetts Institute
More informationarxiv: v1 [physics.ins-det] 13 Jan 2015
The Assembly of the Belle II TOP Counter Boqun Wang, On behalf of the Belle II PID Group Department of Physics, University of Cincinnati, Cincinnati, OH, USA University of Cincinnati preprint UCHEP-14-01
More informationThroughput of an Optical Instrument II: Physical measurements, Source, Optics. Q4- Number of 500 nm photons per second generated at source
Throughput of an Optical Instrument II: Physical measurements, Source, Optics Question- Value Q1- Percent output between 450-550 nm by mass Answer (w/ units) Q2- Energy in J of a 500 nm photon Q3- Flux
More informationFLEX 2 NEW. Key points. 3D Confocal Raman, 2 lasers, fiber based, AFM combined
FLEX 2 3D Confocal Raman, 2 lasers, fiber based, AFM combined NEW Key points Compact size 2 lasers, easily switchable 2 confocal operation modes, easily switchable : High Spatial Resolution 35 nm High
More informationTextbook Reference: Physics (Wilson, Buffa, Lou): Chapter 24
AP Physics-B Physical Optics Introduction: We have seen that the reflection and refraction of light can be understood in terms of both rays and wave fronts of light. Light rays are quite compatible with
More informationOutline. Abstract. Modeling Approach
EUV Interference Lithography Michael Goldstein ϕ, Donald Barnhart λ, Ranju D. Venables ϕ, Bernice Van Der Meer ϕ, Yashesh A. Shroff ϕ ϕ = Intel Corporation (www.intel.com), λ = Optica Software (www.opticasoftware.com)
More informationVariable line-space gratings: new designs for use in grazing incidence spectrometers
Variable line-space gratings: new designs for use in grazing incidence spectrometers Michael C. Hettrick and Stuart Bowyer Applied Optics Vol. 22, Issue 24, pp. 3921-3924 (1983) http://dx.doi.org/10.1364/ao.22.003921
More informationSouthern African Large Telescope. PFIS Distortion and Alignment Model
Southern African Large Telescope PFIS Distortion and Alignment Model Kenneth Nordsieck University of Wisconsin Document Number: SALT-3120AS0023 Revision 2.0 31 May 2006 Change History Rev Date Description
More informationNIRvana: 640ST. Applications: Nanotube fluorescence, emission, absorption, non-destructive testing and singlet oxygen detection
Powered by LightField The NIRvana: 64ST from Princeton Instruments is the world s first scientific grade, deep-cooled, large format InGaAs camera for low-light scientific SWIR imaging and spectroscopy
More informationChapter 4 - Diffraction
Diffraction is the phenomenon that occurs when a wave interacts with an obstacle. David J. Starling Penn State Hazleton PHYS 214 When a wave interacts with an obstacle, the waves spread out and interfere.
More informationIntroduction. Part I: Measuring the Wavelength of Light. Experiment 8: Wave Optics. Physics 11B
Physics 11B Experiment 8: Wave Optics Introduction Equipment: In Part I you use a machinist rule, a laser, and a lab clamp on a stand to hold the laser at a grazing angle to the bench top. In Part II you
More informationSeries Spectrometers PARTICLE CHARACTERIZATION ELEMENTAL ANALYSIS FLUORESCENCE GRATINGS & OEM SPECTROMETERS OPTICAL COMPONENTS RAMAN
Series Spectrometers ELEMENTAL ANALYSIS FLUORESCENCE GRATINGS & OEM SPECTROMETERS OPTICAL COMPONENTS PARTICLE CHARACTERIZATION RAMAN SPECTROSCOPIC ELLIPSOMETRY SPR IMAGING ihr Series Imaging Spectrometers
More informationWaves & Oscillations
Physics 42200 Waves & Oscillations Lecture 42 Review Spring 2013 Semester Matthew Jones Final Exam Date:Tuesday, April 30 th Time:1:00 to 3:00 pm Room: Phys 112 You can bring two double-sided pages of
More informationFour-zone reflective polarization conversion plate
Four-zone reflective polarization conversion plate A.G. Nalimov a,b, S.S. Stafeev* a,b, L, O Faolain c, V.V. Kotlyar a,b a Image Processing Systems Institute of the RAS, 151 Molodogvardeyskaya st., Samara,
More informationLED Evenement 2014 Spectroscopy - Straylight. Avantes BV Apeldoorn, The Netherlands
LED Evenement 2014 Spectroscopy - Straylight Avantes BV Apeldoorn, The Netherlands Content: - Company - Spectroscopy - Spectrometer measuring light - Straylight - How to prevent - Why - conclusion Introduction
More informationAP* Optics Free Response Questions
AP* Optics Free Response Questions 1978 Q5 MIRRORS An object 6 centimeters high is placed 30 centimeters from a concave mirror of focal length 10 centimeters as shown above. (a) On the diagram above, locate
More informationDr. Larry J. Paxton Johns Hopkins University Applied Physics Laboratory Laurel, MD (301) (301) fax
Dr. Larry J. Paxton Johns Hopkins University Applied Physics Laboratory Laurel, MD 20723 (301) 953-6871 (301) 953-6670 fax Understand the instrument. Be able to convert measured counts/pixel on-orbit into
More informationEasy integration into complex experimental setup
NIRvana: 64ST The NIRvana: 64ST from Princeton Instruments is the world s first scientific grade, deep-cooled, large format InGaAs camera for low-light scientific SWIR imaging and spectroscopy applications.
More informationL. Pina, A. Fojtik, R. Havlikova, A. Jancarek, S.Palinek, M. Vrbova
L. Pina, A. Fojtik, R. Havlikova, A. Jancarek, S.Palinek, M. Vrbova Faculty of Nuclear Sciences, Czech Technical University, Brehova 7, 115 19 Prague, Czech Republic CD EXPERIMENTAL ARRANGEMENT SPECTRAL
More informationDiffraction. Introduction:
1 Diffraction Introduction: The phenomenon of diffraction results when a wave interacts with an object or aperture whose size is comparable to the wavelength of the wave interacting with it. Loosely speaking,
More informationLecture 39. Chapter 37 Diffraction
Lecture 39 Chapter 37 Diffraction Interference Review Combining waves from small number of coherent sources double-slit experiment with slit width much smaller than wavelength of the light Diffraction
More informationLaser Beacon Tracking for High-Accuracy Attitude Determination
Laser Beacon Tracking for High-Accuracy Attitude Determination Tam Nguyen Massachusetts Institute of Technology 29 th AIAA/USU Conference on Small Satellites SSC15-VIII-2 08/12/2015 Outline Motivation
More informationThe location of the bright fringes can be found using the following equation.
What You Need to Know: In the past two labs we ve been thinking of light as a particle that reflects off of a surface or refracts into a medium. Now we are going to talk about light as a wave. If you take
More informationCollege Physics 150. Chapter 25 Interference and Diffraction
College Physics 50 Chapter 5 Interference and Diffraction Constructive and Destructive Interference The Michelson Interferometer Thin Films Young s Double Slit Experiment Gratings Diffraction Resolution
More informationSurface and thickness measurement of a transparent film using wavelength scanning interferometry
Surface and thickness measurement of a transparent film using wavelength scanning interferometry Feng Gao, Hussam Muhamedsalih, and Xiangqian Jiang * Centre for Precision Technologies, University of Huddersfield,
More informationChapter 36. Diffraction. Dr. Armen Kocharian
Chapter 36 Diffraction Dr. Armen Kocharian Diffraction Light of wavelength comparable to or larger than the width of a slit spreads out in all forward directions upon passing through the slit This phenomena
More informationLecture 6: Waves Review and Examples PLEASE REVIEW ON YOUR OWN. Lecture 6, p. 1
Lecture 6: Waves Review and Examples PLEASE REVEW ON YOUR OWN Lecture 6, p. 1 Single-Slit Slit Diffraction (from L4) Slit of width a. Where are the minima? Use Huygens principle: treat each point across
More informationPhysics 214 Midterm Fall 2003 Form A
1. A ray of light is incident at the center of the flat circular surface of a hemispherical glass object as shown in the figure. The refracted ray A. emerges from the glass bent at an angle θ 2 with respect
More informationNew Scatterometer for Spatial Distribution Measurements of Light Scattering from Materials
10.2478/v10048-012-0012-y MEASUREMENT SCIENCE REVIEW, Volume 12, No. 2, 2012 New Scatterometer for Spatial Distribution Measurements of Light Scattering from Materials 1,3 E. Kawate, 1,2 M. Hain 1 AIST,
More informationInterference and Diffraction of Light
Name Date Time to Complete h m Partner Course/ Section / Grade Interference and Diffraction of Light Reflection by mirrors and refraction by prisms and lenses can be analyzed using the simple ray model
More informationMeasurement of Highly Parabolic Mirror using Computer Generated Hologram
Measurement of Highly Parabolic Mirror using Computer Generated Hologram Taehee Kim a, James H. Burge b, Yunwoo Lee c a Digital Media R&D Center, SAMSUNG Electronics Co., Ltd., Suwon city, Kyungki-do,
More informationXuechang Ren a *, Canhui Wang, Yanshuang Li, Shaoxin Shen, Shou Liu
Available online at www.sciencedirect.com Physics Procedia 22 (2011) 493 497 2011 International Conference on Physics Science and Technology (ICPST 2011) Optical Tweezers Array System Based on 2D Photonic
More informationChapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena
Chapter 24 Wave Optics Wave Optics The wave nature of light is needed to explain various phenomena Interference Diffraction Polarization The particle nature of light was the basis for ray (geometric) optics
More informationPhys 104: College Physics EXAM 3
Phys 14: College Physics Key Name I. VERY SHORT ANSWER: EXAM 3 FRIDAY, APRIL 16, 21 1) 3 A cat plays with a butterfly at dawn and looks directly up at light from the sun rising in the east that has been
More informationSpectrometers: Monochromators / Slits
Spectrometers: Monochromators / Slits Monochromator Characteristics Dispersion: The separation, or wavelength selectivity, of a monochromator is dependent on its dispersion. Angular Dispersion: The change
More informationApex High Performance Spectrometer
Apex High Performance Spectrometer 1 Elite High Performance Spectrometers Challenge Integrated, high end instruments are required to detect low light levels for challenging Fluorescence and Raman applications
More informationHolographic Elements in Solar Concentrator and Collection Systems
Holographic Elements in Solar Concentrator and Collection Systems Raymond K. Kostuk,2, Jose Castro, Brian Myer 2, Deming Zhang and Glenn Rosenberg 3 Electrical and Computer Engineering, Department University
More informationTutorial Solutions. 10 Holographic Applications Holographic Zone-Plate
10 Holographic Applications 10.1 Holographic Zone-Plate Tutorial Solutions Show that if the intensity pattern for on on-axis holographic lens is recorded in lithographic film, then a one-plate results.
More informationChemistry Instrumental Analysis Lecture 6. Chem 4631
Chemistry 4631 Instrumental Analysis Lecture 6 UV to IR Components of Optical Basic components of spectroscopic instruments: stable source of radiant energy transparent container to hold sample device
More informationCMOS compatible highly efficient grating couplers with a stair-step blaze profile
CMOS compatible highly efficient grating couplers with a stair-step blaze profile Zhou Liang( ) a), Li Zhi-Yong( ) a), Hu Ying-Tao( ) a), Xiong Kang( ) a), Fan Zhong-Chao( ) b), Han Wei-Hua( ) b), Yu Yu-De
More informationDiffraction and Interference of Plane Light Waves
PHY 92 Diffraction and Interference of Plane Light Waves Diffraction and Interference of Plane Light Waves Introduction In this experiment you will become familiar with diffraction patterns created when
More informationImmersion Microlithography at 193 nm with a Talbot Prism Interferometer
RIT Scholar Works Presentations and other scholarship 5-28-2004 Immersion Microlithography at 193 nm with a Talbot Prism Interferometer Anatoly Bourov Yongfa Fan Frank Cropanese Neal Lafferty Lena V. Zavyalova
More informationBenefiting from Polarization: Effects at High-NA Imaging
Benefiting from Polarization: Effects at High-NA Imaging Bruce W. Smith L. Zavyalova, A. Estroff, Y. Fan, A. Bourov Rochester Institute of Technology P. Zimmerman International SEMACH and Intel J. Cashmore
More informationThe Overlapping Effects of Step Exposure by Laser Interferometric. Lithography System
The Overlapping Effects of Step Exposure by Laser Interferometric Lithography System Hung-Lin Hsieh 1, Cheng-Wei Chien 1, Farn-Shiun Hwu 1,, Yi-cheng Huang 3, and *Jyh-Chen Chen 1 1 Dept. of Mechanical
More informationWORCESTER POLYTECHNIC INSTITUTE
WORCESTER POLYTECHNIC INSTITUTE MECHANICAL ENGINEERING DEPARTMENT Optical Metrology and NDT ME-593L, C 2018 Introduction: Wave Optics January 2018 Wave optics: coherence Temporal coherence Review interference
More informationSingle slit diffraction
Single slit diffraction Book page 364-367 Review double slit Core Assume paths of the two rays are parallel This is a good assumption if D >>> d PD = R 2 R 1 = dsin θ since sin θ = PD d Constructive interference
More informationCrystal Quality Analysis Group
Crystal Quality Analysis Group Contents Contents 1. Overview...1 2. Measurement principles...3 2.1 Considerations related to orientation and diffraction conditions... 3 2.2 Rocking curve measurement...
More informationDevelopment of InP Immersion Grating for the near to mid infrared wavelength
Paper No.54 Development of InP Immersion Grating for the near to mid infrared wavelength Takashi. Sukegawa Y.Okura, T.Nakayasu Outline Introduction Immersion grating by CANON InP immersion grating Summary
More informationPhysical Optics. 1 st year physics laboratories. University of Ottawa.
Physical Optics 1 st year physics laboratories University of Ottawa https://uottawa.brightspace.com/d2l/home INTRODUCTION Physical optics deals with light as a wave which can bend around obstacles (diffraction)
More informationMultilayer EUV optics with integrated IR suppression gratings
Multilayer EUV optics with integrated IR suppression gratings Torsten Feigl, Marco Perske, Hagen Pauer, Tobias Fiedler optix fab GmbH Uwe Zeitner, Robert Leitel, Hans-Christoph Eckstein, Philipp Schleicher,
More informationSingle Slit Diffraction *
OpenStax-CNX module: m42515 1 Single Slit Diffraction * OpenStax This work is produced by OpenStax-CNX and licensed under the Creative Commons Attribution License 3.0 Discuss the single slit diraction
More informationStudy of Air Bubble Induced Light Scattering Effect On Image Quality in 193 nm Immersion Lithography
Study of Air Bubble Induced Light Scattering Effect On Image Quality in 193 nm Immersion Lithography Y. Fan, N. Lafferty, A. Bourov, L. Zavyalova, B. W. Smith Rochester Institute of Technology Microelectronic
More informationChapter 8: Physical Optics
Chapter 8: Physical Optics Whether light is a particle or a wave had puzzled physicists for centuries. In this chapter, we only analyze light as a wave using basic optical concepts such as interference
More informationCARBON NANOTUBE FLAT PLATE BLACKBODY CALIBRATOR. John C. Fleming
CARBON NANOTUBE FLAT PLATE BLACKBODY CALIBRATOR John C. Fleming Ball Aerospace, jfleming@ball.com Sandra Collins, Beth Kelsic, Nathan Schwartz, David Osterman, Bevan Staple Ball Aerospace, scollins@ball.com
More informationChapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena
Chapter 24 Wave Optics Wave Optics The wave nature of light is needed to explain various phenomena Interference Diffraction Polarization The particle nature of light was the basis for ray (geometric) optics
More informationWAVELENGTH MANAGEMENT
BEAM DIAGNOS TICS SPECIAL PRODUCTS OEM DETECTORS THZ DETECTORS PHOTO DETECTORS HIGH POWER SOLUTIONS POWER DETECTORS ENERGY DETECTORS MONITORS Camera Accessories WAVELENGTH MANAGEMENT UV CONVERTERS UV Converters
More informationratio of the volume under the 2D MTF of a lens to the volume under the 2D MTF of a diffraction limited
SUPPLEMENTARY FIGURES.9 Strehl ratio (a.u.).5 Singlet Doublet 2 Incident angle (degree) 3 Supplementary Figure. Strehl ratio of the singlet and doublet metasurface lenses. Strehl ratio is the ratio of
More informationNarcissus of Diffractive OpticalSurfaces. Jonathan B. Cohen. ElOp E1ectrooptics Industries Ltd. P.O.B , Rehovot , Israel LINTRODUCTION
Narcissus of Diffractive OpticalSurfaces Jonathan B. Cohen ElOp E1ectrooptics Industries Ltd. P.O.B. 1 165, Rehovot 7611 1, Israel 1. ABSTRACT Narcissus is usually approximated by means of a paraxial ray
More information