LAT PROJECT DOCUMENT CHANGE NOTICE (DCN) SHEET 1 OF 1

Transcription

1 DCN No. LAT-XR LAT PROJECT DOCUMENT CHANGE NOTICE (DCN) SHEET 1 OF 1 ORIGINATOR: Dave Nelson PHONE: DATE: 12/15/04 CHANGE TITLE: DCN for TPS Assembly CPT/LPT Test Procedure ORG.: DOCUMENT NUMBER TITLE NEW REV. LAT-TD Tower Power Supply Assembly CPT/LPT Test Procedure 03 CHANGE DESCRIPTION (FROM/TO): Please see LAT-XR for changes to this document REASON FOR CHANGE: To clean up some minor items ACTION TAKEN: Change(s) included in new release DCN attached to document(s), changes to be included in next revision Other (specify): DISPOSITION OF HARDWARE (IDENTIFY SERIAL NUMBERS): DCN DISTRIBUTION: No hardware affected (record change only) List S/Ns which comply already: List S/Ns to be reworked or scrapped: List S/Ns to be built with this change: List S/Ns to be retested per this change: SAFETY, COST, SCHEDULE, REQUIREMENTS IMPACT? YES NO If yes, CCB approval is required. Enter change request number: APPROVALS DATE OTHER APPROVALS (specify): DATE ORIGINATOR: D. Nelson (signature on file) 12/16/04 ORG. MANAGER: G. Haller (signature on file) 12/16/04 PSA- Darren Marsh (signature on file) 1/5/05 Manufacturing- R. Patterson (signature on file) 12/16/04 DCC RELEASE: Natalie Cramar (signature on file) 1/5/05 Doc. Control Level: Subsystem LAT IPO GLAST Project DCN No: LAT-XR FORM # LAT-FS

2 Document # Date effective LAT-TD /16/04 Author(s) Supersedes D. Nelson LAT-TD Subsystem/Office Electronics & DAQ Subsystem Document Title Tower Power Supply Assembly CPT/LPT Test Procedure revision.

3 CHANGE HISTORY LOG Tower Power Supply Assembly CPT/LPT Test Procedure Revision Effective Date Description of Changes 01 05/21/04 Initial Revision 02 10/28/04 Fine tuned the text and data sheet tolerances, changed Load regulation o-scope views for EM and Flight, changed Test Board Filter Figure, made new boilerplate changes /04/04 Corrected values in Data Sheet on page 68 ( ms). revision. LAT-TD Page 2

4 Table of Contents -TOC 1. SCOPE DEFINITIONS AND ACRONYMS Definitions Acronyms REFERENCES Applicable Documents REQUIREMENTS General Specific Test Requirements Test Personnel and Descriptions Test Readiness Review (TRR) and Post Test Review (PTR) Environmental Conditions Contamination Control Handling and Transportation ESD Mate/Demate Connectors Test Equipment Test Data and Review Flight Hardware Log Book Nonconforming Test Data, Equipment and Software Redlines to Documents Quality Assurance revision. LAT-TD Page 3

5 Product Assurance Requirements Warnings, Cautions, and Notes Safety Crane Operations PROCEDURE Test Procedure Instructions/Information Test Prerequisites Test Sequence Test Equipment Participant List Test Setup Pre-Operation Verifications Test Descriptions Subassembly Level Testing Switching Test LPT and CPT Unit Level Test Procedures LPT Testing CPT Testing Appendix A (Data Sheets and Covers) revision. LAT-TD Page 4

6 1. SCOPE This test procedure verifies compliance with Tower Power Supply Specification and ICD, LAT-SS This document provides a procedure for Performance Testing of the circuits that provide power to the three main parts of the tower assembly. This document also tests the temperatures that are part of the Tower Power Supply (TPS) circuits. This document provides instructions for how to test the TPS at subassembly and box level testing. The TPS receives regulated 28VDC power from the spacecraft bus and provides nine independent regulated DC supply voltages to components of the Tower Assemblies via the Tower Electronics Module (TEM). The Tower Assembly consists of the Calorimeter (CAL), Tracker (TRK), TEM, and the CAL and TRK front end electronics circuit card assemblies (CAL-AFEE [Analog Front End Electronics] and TRK MCM [Multi Chip Module] ). Testing in this procedure measures the accuracy of the 1.5, 2.5, 2.6, 3.3 VDC digital and analog output voltages, and the variable bias voltages for the CAL and TKR functions. This test measures the voltages with input voltages of 26.0, 28.0, 30.0 and VDC. The complete list of testing and descriptions of the tests, see page 26. Note: This procedure shall be considered subordinate to any Assembly and Inspection Data Sheet (AIDS) that is used in conjunction with this testing process. revision. LAT-TD Page 5

7 2. DEFINITIONS AND ACRONYMS The following terms, abbreviations, and acronyms are used in this document. 2.1 Definitions AFEE Analog Front End Electronics A, An Analog D, Dg Digital Hz msec, ms mv Ω Hertz, unit of frequency millisecond, 10-3 Second millivolt, 10-3 Volt ohm, unit of electrical resistance s, sec seconds µ 10-6 V W Volt Watt 2.2 Acronyms AIDS ADC CAL DAC EGSE EM EMI EUT GLAST LAT MCM QAE Assembly and Inspection Data Sheet Analog to Digital Converter Calorimeter Digital to Analog Converter Electrical Ground Support Equipment Engineering Model Electro Magnetic Interference Equipment Under Test Gamma Ray Large Area Space Telescope Large Area Telescope Multi Chip Module Quality Assurance Engineer revision. LAT-TD Page 6

8 RMS TC TEM TKR TP TPS Root Mean Squared Test Conductor Tower Electronics Module Tracker Test Point Tower Power Supply revision. LAT-TD Page 7

9 3. REFERENCES The list below provides documents that are to be used as references for this procedure. 3.1 Applicable Documents Document Number Description SPECIFICATIONS LAT-SS LAT-SS LAT-SS LAT-SS LAT Power Supplies Level IV Specification Specification and ICD, Tower Electronics Module LAT Environmental Specification Specification and ICD, Tower Power Supply PROCEDURES LAT-TD Thermal Vacuum Operation Procedure PLANS LAT-MD LAT-MD LAT-MD LAT-MD LAT-TD LAT-SS Performance Assurance Implementation Plan GLAST LAT System Safety Program Plan LAT Contamination Control Plan LAT Program Instrument Performance Verification Plan LAT Electronics Test Plan T & DF Test Plan DRAWINGS LAT-DS LAT-DS LAT-DS LAT-DS Circuit Card Assembly, Tower Power Supply Printed Wiring Board, Tower Power Supply Schematic Diagram, Tower Power Supply Schematic Diagram, Tower Power Supply Tester (Test Board) OTHER LAT-MD LAT-MD LAT-MD LAT-MD GLAST Quality Manual Control of Nonconforming Product Corrective and Preventative Action Handling, Storage, Packing, Preservation and Delivery revision. LAT-TD Page 8

10 4. REQUIREMENTS This section lists the requirements that shall be followed during the TEM Power supply Qualification and Acceptance process. 4.1 General The Performance Assurance Implementation Plan, LAT-MD shall be utilized to ensure that the products produced by the GLAST LAT project intended for design qualification, flight and critical ground support equipment usage meet the required levels of quality and functionality for their intended purposes. This document shall follow the LAT Program Instrument Performance Verification Plan LAT-MD which details the LAT and its subsystem verification test flow. The LAT T & DF Test Plan, LAT-TD shall be utilized to address the overall requirements at engineering model, qualification and production level phases. This document defines the time period from post circuit board fabrication until electronic box delivery to LAT Integration and Test. Testing within this document shall conform to the requirements stated in LAT Performance and Operations Test Plan LAT-MD for all testing that relates to LAT I & T. 4.2 Specific Test Requirements This document verifies the requirements from the following: Source Document Source Paragraph Test Paragraph Verification LAT-SS-01281: Tower Power Supply Specification and ICD 5.1: Functional Description through 26 Test LAT-SS : Functional Description and Table 1: Tower PS Electrical Specification through 33 Test LAT-SS Table 1: Tower PS Electrical Specification through 37 Test LAT-SS Derived Test LAT-SS LAT-SS : Functional Description and Table 1: Tower PS Electrical Specification 5.1: Functional Description and Table 1: Tower PS Electrical Specification and 42 Test Test revision. LAT-TD Page 9

11 Source Document Source Paragraph Test Paragraph Verification LAT-SS Table 1: Tower PS Electrical Specification Test LAT-SS Table 1: Tower PS Electrical Specification Test LAT-SS Table 1: Tower PS Electrical Specification Test LAT-SS Not applicable (EGSE only) and 12 Test LAT-SS Derived through 25 Test LAT-SS Table 1: Tower PS Electrical Specification Test revision. LAT-TD Page 10

12 4.3 Test Personnel and Descriptions Test personnel are described in GLAST LAT Integration and Test Subsystem Test Plan, LAT-MD Test Readiness Review (TRR) and Post Test Review (PTR) The TRR and PTR are organizational meetings that shall be held at the appropriate times to inform all parties about the testing that is to be accomplished and has been completed. The TRR and PTR meetings are defined in the GLAST LAT Integration and Test Subsystem Test Plan, LAT-MD Environmental Conditions Testing performed in accordance with this document shall conform to standard environmental test conditions unless specific test requirements within this document exist. Standard Environmental test conditions are as follows: Dynamic Mechanical Conditions: No load, at rest Temperature: 18.3 to 25.7 C Atmospheric Pressure: Uncontrolled local conditions Humidity: 30% to 50% RH for testing when the Calorimeter or Engineering Model (EM) Calorimeters are present. For all other testing 30% to 60% RH is required. This document shall follow the LAT Environmental Specification, LAT-SS for all testing where non standard environments are required. The Environmental Specification defines the thermal, vibration and on-orbit exposure design and test environments for the LAT instrument and its subsystems. revision. LAT-TD Page 11

13 4.6 Contamination Control The Contamination Control Plan defines the overall contamination control requirements necessary to establish hardware cleanliness for the GLAST LAT program. When work is performed at SLAC, follow LAT-MD When work is performed elsewhere, follow LAT-MD Handling and Transportation This document shall follow the requirements found in the Handling, Storage, Package, Preservation and Delivery document, LAT-MD This document establishes handling, storage, packaging and transportation practices adequate to maintain the safety, reliability and quality of SLAC LAT flight hardware items and achieve their damage free delivery to the place and time of ultimate use. 4.8 ESD The CAL, TKR, T & DF Contamination Control Plan and the LAT Contamination Control Plan define the ESD requirements for the GLAST LAT program. When work is performed at SLAC follow LAT-MD When work is performed elsewhere follow LAT-MD Mate/Demate Connectors This document shall follow the requirements found in the Mate and Demate Workmanship Standard LAT-PS The mate/demate process shall be followed for each and every connector mate. This consists of a visual inspection of the interface, cleaning if required, and proper mating techniques Test Equipment This document shall follow the requirements found in the LAT Program Instrument Performance Verification Plan, LAT-MD-00408, which defines calibration, accuracy, substitutions, etc. for the test equipment. revision. LAT-TD Page 12

14 4.11 Test Data and Review This document shall follow the requirements found in the LAT Program Instrument Performance Verification Plan, LAT-MD-00408, which defines the test data sheets and details the personnel that reviews test data. Test data shall be recorded on the data sheets that are found in Appendix A of this document. The data sheets and any supporting data shall use a cover sheet that is found in Appendix A of this document Flight Hardware Log Book The LAT Program Instrument Performance Verification Plan, LAT-MD requires that a log of hardware installation, software installation, power ON and mates/demates to flight connectors shall be kept for each flight unit. The log book is part of the package that is deliverable to the customer Nonconforming Test Data, Equipment and Software This document shall follow the requirements found in the Control of Nonconforming Product, LAT- MD This document establishes methods to identify and control nonconforming product developed by the LAT project team Redlines to Documents The users of this document shall follow the requirements found in the Requirements for Creating and Using Redlines for GLAST LAT Documents and Drawings, LAT-MD revision. LAT-TD Page 13

15 4.15 Quality Assurance This document shall follow the requirements found in the Corrective and Preventative Action document, LAT-MD and the GLAST Quality Manual, LAT-MD and LAT Program Instrument Performance Verification Plan, LAT-MD The Corrective and Preventative Action document establishes the method to be used to initiate, implement, evaluate and record corrective and preventive actions. The GLAST Quality Manual defines the methods implemented by the GLAST LAT project to ensure consistent quality of all processes for procurement, design, development and production of flight hardware, flight software, calibration and all associated ground support equipment interfacing with flight hardware and software. The LAT Program Instrument Performance Verification Plan defines test configuration, data sheets and review of test results Product Assurance Requirements The Quality Assurance Engineer (QAE) shall witness the initial test setup and validation operations. In the event of a failure a Non Conformance Report (NCR) shall be written. The root cause and corrective action shall be identified and there shall be QAE approval before the operation is continued. Any deviation from this document requires approval from the QAE as well as the Test Conductor (TC). revision. LAT-TD Page 14

16 4.16 Warnings, Cautions, and Notes The following SAFETY ALERTS are intended to create awareness of the potential safety hazards and the steps that must be taken to avoid accidents. These same alerts are used throughout this document to identify specific hazards that may endanger personnel and/or equipment. Identification of every conceivable hazardous situation is impossible. Therefore, all personnel have the responsibility to diligently exercise safe practices whenever exposed to this equipment. WARNING: Indicates a potential hazardous situation which, if not avoided, could result in death or injury. CAUTION: Note: Indicates a potential hazardous situation which, if not avoided, could result in damage to equipment. Indicates a notification of information that is important, but not hazard related Safety This document shall follow the requirements found in the GLAST LAT System Safety Program Plan, LAT-MD This document defines all phases of the LAT program including: design, development, fabrication, handling, transportation, storage, test, assembly and operation. WARNING: When high voltages are present extreme care should be exercised. revision. LAT-TD Page 15

17 4.18 Crane Operations Before a crane (or any lifting device) is used it should be verified that the proof loading is current and the expected load to be lifted does not exceed the load capacity of the device. The operator shall have a current certification for the operation. There shall be three people present before, during and at the completion of all lifting operations. Each one of these people shall perform only one of the following three duties: Crane Operator When the crane operator controls the crane no other duties shall be performed. At other times this person may help with the mechanical or electrical duties. Spotter During the lifting operation this person guides the item that is to be moved up or down, checks clearances and the overall movement of all items. At other times this person may help with the mechanical or electrical duties. Safety Person (for crane operations only) Before lifting the item, this person double checks all operations and the removal of bolts/hardware from the item to be moved. During crane operations this person is an observer of the operation and directs the overall lifting operation. revision. LAT-TD Page 16

18 5. PROCEDURE This procedure is used for Performance Testing of the circuits that provide power to the three main parts of the tower assembly. This document also tests the temperatures that are part of the TPS circuits. Unless otherwise noted use a DVM for all measurements. Some measurements require the use of an oscilloscope or a true Root Mean Squared (RMS) volt meter. Note: When performing measurements with a DMM connect the negative lead first. 5.1 Test Procedure Instructions/Information This section provides the general instructions and information that is used and required to perform this procedure, including: test parameters, sequence, equipment and Test Participants Test Prerequisites This section describes processes and procedures that must be completed prior to performing the tests in this document. TPS Electrical Interface Continuity and Isolation Test (EICIT): LAT-TD TPS Stray Voltage Test (SVT): LAT-TD TPS Interface Verification Test (SVT): LAT-TD Safe Process for TPS Electrical Ground Support Equipment (EGSE) Validation: LAT-TD Test Sequence This section describes the requirements of the event sequence for performing this procedure. Tests are to be performed in the order listed in this document unless otherwise specified. It is permissible for Assembly Instruction Data Sheets (AIDS) to be used to change the order of tests or select a single test paragraph to be performed. In that case, the data sheet for the test performed will be included in the end item data package linked to the AIDS step that required it. Test sequencing can also be changed in a TRR and black lined into the test procedure. revision. LAT-TD Page 17

19 5.1.3 Test Equipment Tower Power Supply Assembly CPT/LPT Test Procedure The test equipment listed below is necessary for the tests described in this procedure. If additional equipment is used, please add it to the table below with the signature of the TC and QAE, and proceed with the test EGSE To record the test equipment, cables, connector savers and software: 1. Record the information for all equipment on the data sheet. See the list below for descriptions of the information to be recorded. Description and Manufacturer Model/LAT number (Data Logger and cards, etc) Serial/Revision number (for equipment, files and software) Calibration due date (enter NA for non calibrated equipment) Validation completion date for all EGSE The table below lists the major pieces of equipment required to perform this procedure. Test Equipment Description/Manufacturer Oscilloscope, Tektronix 220 Model/LAT Number Digital Voltmeter, Fluke 87-III Power Supply (min. 26.0V to 40.0V capability), BK Precision 1697 True RMS Volt Meter, Agilent (HP) TPS Test Board, SLAC VME crate, Dawn VME Products VME, TST-STP Trans card, SLAC VME SBC MVME2304 card, Motorola VME SBC VMESC5 card, Dawn VME Products VME LCB Mezzanine card, SLAC 3400A LAT-DS VMESC5 LAT-DS MVME VMESC5 LAT-TD PC (local PC, provided by I&T), Dell revision. LAT-TD Page 18

20 Test Equipment Description/Manufacturer LCB Transition board cable, SLAC Model/LAT Number LAT-DS Volt supply cable, SLAC LAT-DS VME to test board cable (3 required), SLAC Filter assembly, SLAC LAT-DS LAT-DS Pin jumper cable, SLAC LAT-DS CAT5 Ethernet cable RS-232 Cable CAT6 Crossover cable TRD855PL-50 TDC003-7 (RECO98M connectors) TB-4F7036 The figure below shows the layout of the test boards test points, jumpers, LEDs and connectors. D2, D3 and D4 LEDs J2 J1 D5 to D11 LEDs JP1 to JP8 Jumpers TP1 to TP29 J3 J5 J Participant List Figure 1. TPS Test Board Layout This section provides a data sheet to record test participants. 1. Record all test participants in the data sheet. revision. LAT-TD Page 19

21 5.2 Test Setup The Figure below is a block diagram of the TPS test setup. TPS Power Supply Test/Load Board True RMS Volt Meter O-Scope DVM Local PC VME Figure 2. TPS Test Setup Block Diagram revision. LAT-TD Page 20

22 5.2 Test Setup (continued) Tower Power Supply Assembly CPT/LPT Test Procedure The Figure below shows the test configuration of the equipment, cables and connections for testing. This equipment is used for taking measurements at test points on the test board as called out by the procedure. J1 TPS pigtail TPS Equipment under test J1 Power In Power Out J2 TPS pigtail J2 VME True RMS Volt Meter LAT-DS Filter Assy. Off the shelf test leads J2 Test board pigtail Test Board LAT-DS J2 Power Out Power In J1 J3 P2 P2 P1 LAT-DS LAT-DS P1 Dawn VME Model VMESC5 card J18 O-Scope P2 P1 J4 LAT-DS J20 DVM P2 P1 J5 LAT-DS J19 J1 J2 Slot 4 TST-STP Trans Card LAT-DS To LCB EVENT To LCB CMD DC Power Supply (+) (-) J1 J2 190 Ohm >1 Watt resistor, provides a soft ground. LAT-DS P1 J6 Note: For Network connection use a) Local network connection or b) Crossover cable. CAT6 Crossover Cable LAT-DS J3 Slot 0 SBC MVME 2304 Card LCB Mezzanine Card LAT-TD Local PC Local network connection TRD855PL-50 CAT5 Ethernet 10/100 Base TDC003-7, (RECO98M Connectors) RS-232 Cable Network card Serial port connection and adapter TDC003-7, (RECO98M Connectors) RS-232 Cable Debug Figure 3. Test Setup Interconnection Diagram Note: The TPS board and TPS box have different labeling for J1 and J2. revision. LAT-TD Page 21

23 5.2 Test Setup (continued) Tower Power Supply Assembly CPT/LPT Test Procedure The Figure below shows the external power supply that is used in this document. RS-232/485 Lock/Unlock Prog. Recall Shift Clear Enter Output Switch condition indicator O/P on/off Figure 4. External Power Supply revision. LAT-TD Page 22

24 5.2 Test Setup (continued) The Figure below shows the RMS volt meter and the filter assembly that is used on the TPS Noise test section of this document. Figure 5. True RMS Volt Meter and Filter Test Setup revision. LAT-TD Page 23

25 5.2.1 Pre-Operation Verifications This section details the pre-operation verification checks before testing the EUT. To perform the pre-operation verification checks: CAUTION: Note: Note: Note: Follow ESD processes during this checkout. Prior to the connection of any hardware to other electronics, it shall be verified that all power supplies, signal generators, VME racks, and any other test and measurement equipment shall be connected to the same AC ground. The simplest way to do this is to connect all AC-powered equipment to the same power strip. In cases where this is not practical (e.g. possibly a thermal-vacuum test), greater care must be taken to ensure there are no floating grounds since this would represent a hazard to the electronics. Leave all connector savers in place until the actual flight mate is to be made. The AIDS provides authorization to install and remove connector savers. All flight mates and demates must be completed and entered into the mate demate log before measurements are made or testing can start. 1. Notify QAE that testing is expected to start, so the QAE can arrange to be present for the setup and start of testing. Record per the data sheet. 2. Verify that the Test Readiness Review has concluded and all parties have signed the cover sheet. Record per the data sheet. 3. Record the serial numbers and locations per the data sheet. 4. Turn off the LAT or the EGSE power. Record in the data sheet. 5. Set the DMM to the auto-ranging setting. Record in the data sheet. 6. Measure DMM lead resistance by connecting the two leads together. Record in the data sheet. revision. LAT-TD Page 24

26 7. Measure the resistance between the EUT chassis and technical ground. Record in the data sheet. 8. Measure the resistance between the test equipment chassis and technical ground. Record in the data sheet. 9. Verify connector savers are on all flight hardware (install the connector savers per authorization from an AIDS if necessary). Record in the data sheet. 10. Verify that the test equipment and participant lists have been completed. revision. LAT-TD Page 25

27 5.3 Test Descriptions Types of tests that are performed on the Equipment Under Test (EUT) in this procedure are in the following three groups: Subassembly (only) level tests: Switching Filter Test (100% load) Checks the wave form of the 28.0 volt power input line just after a filter that is designed to prevent TPS board noise from propagating back to the spacecraft. LPT testing: Voltage and Current Measurements (10% load) Measures the voltages and currents. CAL and TKR on/off Control (10% load) Verifies the operation of the CAL and TKR control circuits. Ripple Voltage (100% load) Measures the conducted EMI of the unit. Load Regulation Tests the ability to maintain a constant output voltage with changes in load (loads at 100% and 150%). Efficiency Ratio (100% load) Compares the power input of the unit vs. the power output of the unit. CPT Testing: Line Regulation (100% load) Tests the ability to maintain a constant output voltage with varied line input voltages. The input voltage settings are 26.0, 28.0, 30.0 and Margin Bias Checks that the TEM, TKR and CAL voltages are stable at 100% load. For Flight unit testing, the margin tests are not run. Load Response Transient (an oscillator switches between 10 and 100% loads) Verifies when a load is applied that the peak to peak transients are within the required levels. TPS Noise (100% load) Verifies noise over a frequency of 1KHz-1MHz. Note: CPT testing contains information on testing the EM and Flight units revision. LAT-TD Page 26

28 5.4 Subassembly Level Testing This section provides the instructions for testing the TPS that is done only at the subassembly level. The Limited Performance Test (LPT) portion of the test is run using the box level procedure and the Comprehensive Performance Test (CPT) is run using the box level. The LPT portion contains the setup process. The process for subassembly level testing is as follows: Run the LPT from Para Run the Switching test Para Run the CPT from Para revision. LAT-TD Page 27

29 5.4.1 Switching Test Switching Test (wave form, after the filter): 1. Run the LPT testing Para Note: Note: Only perform the LPT testing. When the LPT testing is complete continue with step 2. The LPT testing includes the setup procedure for the test. After the LPT test is complete, the setup is left on set with the 100% (nominal) load. 2. Connect an O-scope to the test points (at the TPS on the side of Q12 & ground) per the Figure below (the connections are made directly on the unit under test). Full View Close-up TPS Ground Component Q12 Figure 6. Test Board Filter Test Points revision. LAT-TD Page 28

30 5.4.1 Switching Test (continued) 3. View and verify that the data is good. The Figure below is an example of how the signal after the filter should look. Record per the data sheet. Figure Volt Line After the Filter Note: Verify that the band width (20MHz) limit on the scope is in the on position. 4. Run the CPT Test Procedure from Para revision. LAT-TD Page 29

31 5.5 LPT and CPT Unit Level Test Procedures This procedure verifies that the TPS functions properly for the LPT and CPT tests and performs to the levels required by the TPS specification. The LPT test portion contains the setup of the test. Therefore when the CPT test is performed, it shall be preceded by the LPT test. Note: Test Point 1 (TP1) is used throughout this document as the common ground for all measurements. revision. LAT-TD Page 30

32 5.5 LPT and CPT Unit Level Test Procedures (continued) There are four sections in this procedure as listed below. Setup: A block diagram shows the equipment needed and an interconnect diagram identifies the cabling starting at page 20. A list of equipment and the model numbers is provided at page 18. Verify the external power supply voltage settings. Initialization (how to turn on the equipment and configuration): Boot-up the computer. Initialize the various settings. Functional Tests: Initial voltages and currents Baseline voltages and currents LEDs Illuminated Performance tests: This section tests the line regulation, load regulation, noise performance, and transient response, etc. Calibration measurements: This measures and records the calibration values for the TPS under test that are used when the TEM and TPS are later mated up as one unit. Each TPS unit has different calibration values that are recorded with this check. WARNING: This procedure contains high voltages that are part of the setup and care should be taken when measurements are made. revision. LAT-TD Page 31

33 5.5.1 LPT Testing Setup: 1. Enter the serial numbers and the calibration due dates for all equipment per the data sheet. 2. Mate all cables and power connections per the interconnect diagram. 3. Power up the VME. 4. Power up the PC. 5. Open the ttermpro file located in the C:\Program Files\TeraTermProSSH\ directory. 6. Open a Command Prompt window. and startup the software for the test. 7. At the command prompt, on the C: drive, type in "TPS_Test.bat" and then enter. revision. LAT-TD Page 32

34 8. The TPS Test window appears for configuring the test board and equipment. Figure 8. TPS Test Window revision. LAT-TD Page 33

35 5.5.1 LPT Testing (continued) 9. Disconnect the output cable (LAT-DS-03246) from the external power supply. 10. Power up the external power supply. 11. At the TPS Test window click on each of the power supply buttons to verify the voltage output settings as listed below. 1.0 volt 28.0 volts 26.0 volts 30.0 volts 40.0 volts 12. Click on the Voltage_In 1V button to set the power supply to 1.0V. 13. Reconnect the output cable (LAT-DS-03246) to the external power supply. revision. LAT-TD Page 34

36 5.5.1 LPT Testing (continued) Initialization: The TPS Test GUI contains buttons that configure the following test board and external power supply features: Main Power and Main off buttons Control the power on/off condition of the external power supply. Enable TPS, Disable TPS, Enable CAL, Disable CAL, Enable TKR and Disable TKR buttons Controls the on/off condition of the TPS, CAL and TKR functions. Set_CAL_HV_100, Set_CAL_HV_0, Set_TKR_HV_150 and Set_TKR_HV_0 buttons Controls Bias control settings for the CAL and TKR. Enable_90%_LD, Disable_90%_LD, Enable_50%_LD and Disable_50%_LD buttons Controls the 90% and 50% test loads. When all the loads disabled the test board is configured for a 10% nominal load. Enable_Osc and Disable_Osc buttons Controls the test oscillator. Set_Nom_Margin, Set_Low_Margin and Set_HI_Margin buttons Controls the margin settings. Read all values This creates a list of all readings (i.e. voltages) in the command prompt window. 14. At the TPS Test window, click on Disable_Osc, Disable_90%_LD, Disable_50%_LD, Set_CAL_HV_0, Set_TKR_HV_0, Disable CAL, Disable TKR, Disable TPS and Main Off. Note: Upon powering on the test board, the configuration is the state it was in before it was last powered off. Therefore all the complete configuration commands and settings shall be performed prior to starting this test. revision. LAT-TD Page 35

37 5.5.1 LPT Testing (continued) Functional Tests, LEDs Illuminated Verifications: 15. At the TPS Test window, click on the Voltage_In 28V button. 16. At the test board verify that LEDs D2 (VDD, power to the test board) and D3 (28_IN) are illuminated. Record the values per the data sheet. 17. Monitor the external power supply current level. Record the values per the data sheet. 18. At the TPS Test window, click on the Enable TPS button to turn the DAC on. 19. Verify that LEDs D4 (28_OUT), D10 (TEM 2.5) and D11 (TEM 3.3) are illuminated. Record the values per the data sheet. 20. Monitor the external power supply current level. Record the values per the data sheet. 21. At the TPS Test window, click on the Enable CAL button. 22. Verify that LEDs D5 (CAL 3.3 Analog) and D6 (CAL 3.3 digital) are illuminated. Record the values per the data sheet. 23. Monitor the external power supply current level. Record the values per the data sheet. 24. At the TPS Test window, click on the Enable TKR button. 25. Verify that LEDs D7 (TKR 2.65 digital), D8 (TKR 2.65 analog) and D9 (TKR 1.5 analog) are illuminated. Record the values per the data sheet. 26. Monitor the external power supply current level. Record the values per the data sheet. revision. LAT-TD Page 36

38 5.5.1 LPT Testing (continued) Functional Test Point Measurements: The command window shows the voltages for the test board, as shown in the Figure below. Figure 9. Command Window Measurements 27. Measure the DC voltage for the 28V Current Monitor Test Point (TP2). This voltage measurement indicates the current in this circuit. Record the values per the data sheet. Note: TP1 is used throughout this document as the common ground for most measurements. 28. Measure the TEM high and low voltage for the TEM Current High and Low (TP4, TP5). These voltage measurements indicate the current in this circuit. Record the values per the data sheet. 29. Measure the TKR Bias (set to zero scale) monitors (TP6, TP10). Voltage measurement TP6 (TKR Bias Current Monitor) indicates the current in this circuit. Record the values per the data sheet. revision. LAT-TD Page 37

39 5.5.1 LPT Testing (continued) 30. Measure the CAL Bias (set to zero scale) monitors (TP7, TP8). Voltage measurement TP7 (CAL Bias Current Monitor) indicates the current in this circuit. Record the values per the data sheet. 31. At the TPS Test window, click on the Set_CAL_HV_100 & Set_TKR_HV_150 buttons. 32. Measure the TKR Bias (set to full scale) monitors (TP6, TP10). Voltage measurement TP6 (TKR Bias Current Monitor) indicates the current in this circuit. Record the values per the data sheet. 33. Measure the CAL Bias (set to full scale) monitors (TP7, TP8) and the external power supply. Voltage measurement TP7 (CAL Bias Current Monitor) indicates the current in this circuit. Record the values per the data sheet. revision. LAT-TD Page 38

40 5.5.1 LPT Testing (continued) Baseline Measurements: 34. Measure the CAL and TKR Bias voltages (TP9 & TP11). Record the values per the data sheet. 35. Measure the CAL, TKR and TEM analog and digital voltages (TP12-TP18). Record the values per the data sheet. 36. Measure the TEM V1 and V2 voltages (TP19-TP20). Record the values per the data sheet. 37. Measure the four temperature readings, two for the unit under test and two are simulated TEM temperatures (TP26-TP29). Record the values per the data sheet. revision. LAT-TD Page 39

41 5.5.1 LPT Testing (continued) Ripple Voltage Test: 38. At the TPS Test window, click on the Enable_90%_LD button, to set all supplies at a 100% load. 39. Measure with an O-scope, the AC ripple voltage (TP3), it should look similar to the Figure below. Record the values per the data sheet. Figure 10. Ripple Sample Note: The O-scope screen should look like the capture above and meet the requirement in the data sheet. revision. LAT-TD Page 40

42 5.5.1 LPT Testing (continued) Load Regulation Test: 40. Measure the nine CAL, TKR and TEM supply voltages (TP9, TP11-TP18) and current at the external power supply. This step uses the baseline measurements to calculate the delta. Record the values per the data sheet. 41. At the TPS Test window, click on the Enable_50%_LD button, to set all supplies at a 150% load. 42. Measure the nine CAL, TKR and TEM supply voltages (TP9, TP11-TP18) and current at the external power supply. This step uses the baseline measurements to calculate the delta. Record the values per the data sheet. 43. At the TPS Test window, click on the Disable_50%_LD buttons, to set all supplies to the 100% (nominal) load. Efficiency Test: 44. Record the external power supply current level for the efficiency test per the data sheet. revision. LAT-TD Page 41

43 5.5.2 CPT Testing Line Regulation Test: 1. At the TPS Test window, click on the Enable_90%_LD and Voltage_In 26V buttons, to set all supplies to the 100% (nominal) load and 26 input volts. 2. Measure the nine CAL, TKR and TEM supply voltages (TP9, TP11-TP18) and current at the external power supply. This step uses the baseline measurements to calculate the delta. Record the values per the data sheet. 3. At the TPS Test window, click on the Voltage_In 30V button. 4. Measure the nine CAL, TKR and TEM supply voltages (TP9, TP11-TP18) and current at the external power supply. This step uses the baseline measurements to calculate the delta. Record the values per the data sheet. 5. At the TPS Test window, click on the Voltage_In 40V button. 6. Measure the nine CAL, TKR and TEM supply voltages (TP9, TP11-TP18) and current at the external power supply. This step uses the baseline measurements to calculate the delta. Record the values per the data sheet. 7. At the TPS Test window, click on the Voltage_In 28V button. revision. LAT-TD Page 42

44 5.5.2 CPT Testing (continued) Margin Test: Tower Power Supply Assembly CPT/LPT Test Procedure Note: Do not run the margin tests for Flight unit testing. 8. At the TPS Test window, click on the Enable_90%_LD button. 9. Click on the Set_Low_Margin button. 10. Measure the seven CAL, TKR and TEM supply voltages (TP12-TP18) and current at the external power supply. Record the values per the data sheet. 11. Click on the Set_HI_Margin button. 12. Measure the seven CAL, TKR and TEM supply voltages (TP12-TP18) and current at the external power supply. Record the values per the data sheet. 13. Click on the Set_Nom_Margin button, to set the margin to nominal. revision. LAT-TD Page 43

45 5.5.2 CPT Testing (continued) Load Response Transient Test: 14. At the TPS Test window, click on the Disable_90%_LD button. 15. Click on the Enable_Osc button. The oscillator cycles the load in and out of a 10% to 100% load condition. 16. Connect the scope triggers to the TP9, use CH1 and TP25 toch2 (for all measurements). Note: Verify that the scope probe and scope are set at 10X for the 10X test leads. revision. LAT-TD Page 44

46 5.5.2 CPT Testing (continued) Tower Power Supply Assembly CPT/LPT Test Procedure Load Response Transient Test (continued) The next two Figures are examples of the Engineering Model (EM) and Flight digital transients as viewed on a scope. Note: Use the appropriate Figure for the test being performed. Figure 11. EM Digital Load Response Transient Test revision. LAT-TD Page 45

47 5.5.2 CPT Testing (continued) Tower Power Supply Assembly CPT/LPT Test Procedure Load Response Transient Test (continued) Figure 12. Flight Digital Load Response Transient Test revision. LAT-TD Page 46

48 5.5.2 CPT Testing (continued) Tower Power Supply Assembly CPT/LPT Test Procedure Load Response Transient Test (continued) The next two Figures are examples of the EM and Flight unit analog transients as viewed on a scope. Note: Use the appropriate Figure for the test being performed. Figure 13. EM Analog Load Response Transient Test revision. LAT-TD Page 47

49 5.5.2 CPT Testing (continued) Tower Power Supply Assembly CPT/LPT Test Procedure Load Response Transient Test (continued) Figure 14. Flight Analog Load Response Transient Test revision. LAT-TD Page 48

50 5.5.2 CPT Testing (continued) Tower Power Supply Assembly CPT/LPT Test Procedure Load Response Transient Test (continued) The Figure below is an example of the EM and Flight unit CAL bias transients as viewed on a scope. Figure 15. EM and Flight CAL Bias Load Response Transient Test revision. LAT-TD Page 49

51 5.5.2 CPT Testing (continued) Tower Power Supply Assembly CPT/LPT Test Procedure Load Response Transient Test (continued) The Figure below is an example of the EM and Flight unit TKR bias transients as viewed on a scope. Figure 16. EM and Flight TKR Bias Load Response Transient Test revision. LAT-TD Page 50

52 5.5.2 CPT Testing (continued) Tower Power Supply Assembly CPT/LPT Test Procedure Load Response Transient Test (continued) For this test the scope probe is connected to each of the seven voltages each in succession. The oscillator cycles through all the circuits creating transients that are viewed at the test points. The first measurement is made then the scope trigger is reset and then the other test points are measured. 17. View and verify that the data is good per the sample in Figure 15, for CAL Bias supply voltage (TP9). Record per the data sheet. 18. View and verify that the data is good per the sample in Figure 16, for TKR Bias supply voltage (TP11). Record per the data sheet. 19. View and verify that the data is good per the sample in Figure 13, for CAL 3.3 analog supply voltage (TP12). Record per the data sheet. 20. View and verify that the data is good per the sample in Figure 11, for CAL 3.3 digital supply voltage (TP13). Record per the data sheet. 21. View and verify that the data is good per the sample in Figure 11, for TKR 2.65 digital supply voltage (TP14). Record per the data sheet. 22. View and verify that the data is good per the sample in Figure 13, for TKR 2.65 analog supply voltage (TP15). Record per the data sheet. 23. View and verify that the data is good per the sample in Figure 13, for TKR 1.5 analog supply voltage (TP16). Record per the data sheet. 24. View and verify that the data is good per the sample in Figure 13, for TEM 2.5 supply voltage (TP17). Record per the data sheet. 25. View and verify that the data is good per the sample in Figure 13, for TEM 3.3 supply voltage (TP18). Record per the data sheet. 26. At the TPS Test window, click on the Disable_Osc button. revision. LAT-TD Page 51

53 5.5.2 CPT Testing (continued) TPS Noise Test: 27. At the TPS Test window, click on the Enable_90%_LD button (to set the load at 100%). 28. Measure (with the HP3400A true RMS volt meter) and record the TPS noise on all nine voltages (including the bias voltages). Record the values per the data sheet. 29. If testing is to be continued for other units go back to LPT Para 5.5.1, step 15 and re-run this procedure. 30. When testing is complete shut down all equipment and then disconnect the cables. revision. LAT-TD Page 52

54 Appendix A (Data Sheets and Covers) revision. LAT-TD Page 53

55 COVER SHEET Program: Procedure Number: Procedure Title: GLAST LAT-TD TPS Performance Test Procedure Controlling Document Number: Controlling Document Step Number: Unit S/N: Descriptive Comment: TEST READINESS REVIEW COMPLETED AND APPROVED BY THE FOLLOWING: Test Director: Quality Assurance: Test Conductor: Date: Date: Date: REVIEWED AND APPROVED BY THE FOLLOWING: Test Director: Quality Assurance: Test Conductor: Date: Date: Date: revision. LAT-TD Page 54

56 Tower Power Supply (TPS) Performance Test Procedure TEST DATA SHEET Unit S/N: Date/Temperature: Title: Test Equipment Operator: QA: Para./ Step Test Equipment Description, Manufacturer Model/LAT Number *Cal./Val. Date Record Model/LAT number, Serial/Revision number, Calibration due dates and Validation date for all equipment used in this procedure: Oscilloscope, Tektronix 220 Digital Voltmeter, Fluke Power Supply (min. 26.0V to 40.0V capability), BK Precision True RMS Volt Meter, Agilent (HP) TPS Test Board, SLAC VME crate, Dawn VME Products VME, TST-STP Trans card, SLAC VME SBC MVME2304 card, Motorola VME SBC VMESC5 card, Dawn VME Products VME LCB Mezzanine card, SLAC 87-III A LAT-DS VMESC5 LAT-DS MVME VMESC5 LAT-TD PC (local PC, provided by I&T), Dell LCB Transition board cable, SLAC LAT-DS Volt supply cable, SLAC LAT-DS VME to test board cable (3 required), SLAC Filter assembly, SLAC LAT-DS LAT-DS Pin jumper cable, SLAC LAT-DS CAT5 Ethernet cable RS-232 Cable CAT6 Crossover cable TRD855PL-50 TDC003-7 (RECO98M connectors) TB-4F7036 This column is used to enter the date that equipment is validated, when validated equipment is recorded in this data sheet. revision. LAT-TD Page 55

57 TEST DATA SHEET Unit S/N: Date/Temperature: Title: Participant List Operator: QA: Para./ Step Title Print Name Signature Record names of all personnel that take part in the test/operation: revision. LAT-TD Page 56

58 TEST DATA SHEET Unit S/N: Date: Title: Pre Operation Verifications Operator: QA: Para./ Step Description Limits Unit Data 5.2 Pre-Operation Verifications -1 Notify QAE. OK OK/NG -2 Test Readiness Review is done. OK OK/NG -3 Record the EUT equipment: TEM Part number NA NA TEM LAT Bay location NA NA TEM Serial number NA NA TPS Part number NA NA TPS LAT Bay location NA NA TPS Serial number NA NA -4 Power off the LAT or EGSE. OFF ON/OFF -5 Set DMM to autoranging for resistance. OK OK/NG -6 Measure DMM lead resistance. < 2.0 Ω -7 Measure EUT to ground. < 2.0 Ω -8 Measure equipment to ground. < 2.0 Ω -9 All connector savers are installed on the flight connections. OK OK/NG -10 The test equipment and participant lists have been completed. OK OK/NG revision. LAT-TD Page 57

59 TEST DATA SHEET Unit S/N: Date/Temperature: Paragraph: 5.4 Subassembly Level Testing Operator: QA: Step Description Requirement Units Data Switching Test: Verify that the information on the scope matches the sample, the signal after the filter (TPS EUT) at the top of Q12 (+) and the TPS ground (-) <400m peak to peak Volts 8 to 10µ Seconds revision. LAT-TD Page 58

60 TEST DATA SHEET Unit S/N: Date/Temperature: Paragraph: LPT Testing Operator: QA: Step Description Requirement Units Data Functional Tests, LEDs Illuminated Verifications: Verify that LED D2 is illuminated. OK OK/NG Verify that LED D3 is illuminated. OK OK/NG Record the external power supply current Amperage Verify that LED D4 is illuminated. OK OK/NG Verify that LED D10 is illuminated. OK OK/NG Verify that LED D11 is illuminated. OK OK/NG Record the external power supply current Amperage Verify that LED D5 is illuminated. OK OK/NG Verify that LED D6 is illuminated. OK OK/NG Record the external power supply current Amperage Verify that LED D7 is illuminated. OK OK/NG Verify that LED D8 is illuminated. OK OK/NG Verify that LED D9 is illuminated. OK OK/NG Record the external power supply current Amperage revision. LAT-TD Page 59

61 TEST DATA SHEET Unit S/N: Date/Temperature: Paragraph: LPT Testing (continued) Operator: QA: Step Description Requirement Units Data Initial Functional Test Point Measurements: Measure and record DC voltage for the 28V Current Monitor at TP2 (+) and TP1 (-) (-) Volts Measure and record TEM high voltage for the TEM Current High, at TP4 (+) and TP1 (-) Measure and record TEM low voltage for the TEM Current Low, at TP5 (+) and TP1 (-) Measure and record TKR bias voltage for the TKR Bias Current Monitor, at TP6 (+) and TP1 (-) Volts Volts Volts Measure and record TKR bias monitor, at TP10 (+) and TP1 (-) Volts Measure and record CAL bias for the CAL Bias Current Monitor, at TP7 (+) and TP1 (-) Volts Measure and record CAL bias monitor, at TP8 (+) and TP1 (-) Volts Measure and record TKR bias voltage for the TKR Bias Current Monitor, at TP6 (+) and TP1 (-) Volts Measure and record TKR bias monitor, at TP10 (+) and TP1 (-) Volts Measure and record CAL bias for the CAL Bias Current Monitor, at TP7 (+) and TP1 (-) Volts Measure and record CAL bias monitor, at TP8 (+) and TP1 (-) Volts Record the external power supply current Amps revision. LAT-TD Page 60

62 TEST DATA SHEET Unit S/N: Date/Temperature: Paragraph: LPT Testing (continued) Operator: QA: Step Description Requirement Units Data Baseline Measurements: Measure and record CAL Bias voltage, at TP9 (+) and TP1 (-) Volts Measure and record TKR Bias voltage, at TP11 (+) and TP1 (-) Volts Measure and record CAL 3.3 analog voltage, at TP12 (+) and TP1 (-) Volts Measure and record CAL 3.3 digital voltage, at TP13 (+) and TP1 (-) Volts Measure and record TKR 2.65 digital voltage, at TP14 (+) and TP1 (-) Volts Measure and record TKR 2.65 analog voltage, at TP15 (+) and TP1 (-) Volts Measure and record TKR 1.5 analog voltage, at TP16 (+) and TP1 (-) Volts Measure and record TEM 2.5 voltage, at TP17 (+) and TP1 (-) Volts Measure and record TEM 3.3 voltage, at TP18 (+) and TP1 (-) Volts Measure and record TEM V1 voltage, at TP19 (+) and TP1 (-) Volts Measure and record TEM V2 voltage, at TP20 (+) and TP1 (-) Volts Measure and record TEM T1 temperature, at TP26 (+) and TP1 (-) Volts Measure and record TEM T2 temperature, at TP27 (+) and TP1 (-) Volts Measure and record TEM PS T1 temperature, at TP28 (+) and TP1 (-) Volts Measure and record TEM PS T2 temperature, at TP29 (+) and TP1 (-) Volts revision. LAT-TD Page 61