NEW POSSIBILITIES FOR X-RAY DIFFRACTOMETRY. Bernd Hasse Incoatec, Geesthacht, Germany

Size: px
Start display at page:

Download "NEW POSSIBILITIES FOR X-RAY DIFFRACTOMETRY. Bernd Hasse Incoatec, Geesthacht, Germany"

Transcription

1 NEW POSSIBILITIES FOR X-RAY DIFFRACTOMETRY Bernd Hasse Incoatec, Geesthacht, Germany

2 This document was presented at PPXRD - Pharmaceutical Powder X-ray Diffraction Symposium Sponsored by The International Centre for Diffraction Data This presentation is provided by the International Centre for Diffraction Data in cooperation with the authors and presenters of the PPXRD symposia for the express purpose of educating the scientific community. All copyrights for the presentation are retained by the original authors. The ICDD has received permission from the authors to post this material on our website and make the material available for viewing. Usage is restricted for the purposes of education and scientific research. PPXRD Website ICDD Website -

3 Incoatec Microfocus Source IµS The source Point focus sealed tube Cu, Mo, Cr, or Ag anode High brilliance Low power: 30 W Air-cooled Tube change as easy as for conventional sealed-tubes 3 Years warranty Bright sealed tube for ultimate convenience 2/22

4 Incoatecs Microfocus Source IµS The optics and housing New family of 2D beam shaping Montel Optics: The Quazar Optics 2D focusing or collimating or hybrid (f+c) Patented housing with optional motors Stable positioning Optimized Optics in Incoatec s new very stable and easy-to-align housing 3/22

5 New Equipment for Diffractometry Microfocus Source IµS Optics with Housing 2D detector (VÅNTEC 2000) Sample stage Bruker D8 GADDS with IµS TM 4/22

6 IµS TM & VÅNTEC-2000 symmetrical reflection 600 sec collection time sample to detector 15 cm Sample: quartz powder 5/22

7 IµS TM & VÅNTEC-2000 D8 Discover with GADDS 2θ The five fingers of quartz 6/22

8 IµS TM for XRD with focusing optics measurements in transmission geometry with Bruker D8 GADDS and VÅNTEC /22

9 IµS (Cu-Kα) with focusing optics vs. classical setup Ibuprofen / measured in transmission geometry / Sample-Detector distance 290 mm Sealed Tube 1D collimating optics 0.3 mm collimator IµS 2D focussing optics Spotsize 230 µm 0.3 mm snout small slice for integration to obtain better resolution (poor detector calibration) 120 sec collection time 15 sec collection time 8/22

10 IµS TM focusing onto the detector: LaB 6 60 seconds, 292 mm sample-detector FW HM of LaB6 sample fitted with PV function 105, ,000 95,000 90,000 85,000 80,000 75,000 70,000 65,000 60,000 55,000 50,000 45,000 40,000 35,000 30,000 25,000 20,000 15,000 10,000 5, , FWHM: θ /22

11 D8 DISCOVER with GADDS HTS (IµS): Combinatorial Screening Reflection & Transmission 10/22

12 IµS (Cu-Kα) with collimating optics for SAXS measurements Silver behanate (H 3 C-(CH 2 ) 20 -COOAg) / Bruker AXS NANOSTAR / 3-Pinhole-geometry / 1000 s exposure time / 1035 mm detector distance q Total Intensity: cps 30W) For comparison: Sealed tube with cc-göbel 1.4 kw: cps 11/22

13 IµS with a mardtb 12/22

14 ASS with Cu-Kα Whole tablet Exposure time: 300 s Focusing onto the detector 13/22

15 Temperature-dependent Phase Transition in Copper phthalocyanine N N N N Cu N N N N 14/22 Heating from 30 C to 350 C with a rate of 0.75 K/min Exposure time per frame: 240 s Operation mode of mar345: 100 µm x mm R.E. Dinnebier, M. Müller, MPI for Solid State Research, Stuttgart

16 Results Reaction Temperature: - T R = 295 C (Lab data) - T R = 275 C (Synchrotron data) Activation Energy: - E A = 254 kj mol -1 (Lab data) - E A = 245 kj mol -1 (Synchrotron data) Calculated with the non-isothermal Avrami-theorie - E A = 241 kj mol -1 (isothermal investigation) 15/22 R.E. Dinnebier, M. Müller, MPI for Solid State Research, Stuttgart

17 IµS (Mo-Kα) with focusing optics: LaB 6 Sample-Detector Distance: 260 mm 2θ: 30 Slitsize: 0.2 x 0.2 mm² Spot size: 110 µm Exposure time: 1200 s Frame integrated with Powder3DIP Profile Matching with FullProf <FWHM> = θ 16/22

18 Ibuprofen with Mo-Kα Whole tablet in blister pack Exposure time: 120 s Focusing onto the detector * * * * * 17/22

19 Comparison of IµS (Mo-Kα) and IµS (Ag-Kα) Mo Ag Sample: LaB 6 Exposure Time: 300 s Detector-Distance: 200 mm End of measurement range for Mo-Kα 18/22

20 IµS (Ag-Kα) with focusing optics: Pigment Red 170 in diamond anvil cell Exposure time: 1200 s 19/22 M. Schmidt, Uni Frankfurt/M; K. Friese, A. Grzechnik, Uni Bilbao

21 Summary (1): XRD with IµS Incoatec Microfocus Source IµS Microfocus Source 30 W, air-cooled New 2D - Quazar Multilayer Optics Low maintenance for Cu, Mo, Cr, and Ag 20/22

22 Summary (2): XRD with IµS 1D collimating beam + 1D focusing beam XRD in reflection Texture Phase identification 2D collimating beam SAXS Texture 2D focusing beam XRD in transmission Well plate screening Position sensitive measurements Single crystal diffraction 21/22

23 Acknowledgement All Incoatec GmbH M. Schmidt, Frankfurt/M, Germany K. Friese, A. Grzechnik, Uni Bilbao, Spain R.E. Dinnebier, M. Müller, MPI for Solid State Research, Stuttgart, Germany All colleagues from Bruker AXS

COMPARISON BETWEEN CONVENTIONAL AND TWO-DIMENSIONAL XRD

COMPARISON BETWEEN CONVENTIONAL AND TWO-DIMENSIONAL XRD Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 37 COMPARISON BETWEEN CONVENTIONAL AND TWO-DIMENSIONAL XRD Bob B. He, Uwe Preckwinkel, and Kingsley

More information

ANOMALOUS SCATTERING FROM SINGLE CRYSTAL SUBSTRATE

ANOMALOUS SCATTERING FROM SINGLE CRYSTAL SUBSTRATE 177 ANOMALOUS SCATTERING FROM SINGLE CRYSTAL SUBSTRATE L. K. Bekessy, N. A. Raftery, and S. Russell Faculty of Science, Queensland University of Technology, GPO Box 2434, Brisbane, Queensland, Australia

More information

Stress and Texture by XRD Bob He, Bruker AXS

Stress and Texture by XRD Bob He, Bruker AXS Stress and Texture by XRD Bob He, Bruker AXS Intensity Conventional X-ray Diffractometer Divergence slit Antiscatter slit Monochromator Bragg-Brentano Geometry. Scanning over range to collect XRD pattern.

More information

Basics and Recent Advances in Two-dimensional X-ray Diffraction. Bob He, Bruker AXS April 15, 2014 Harvard University

Basics and Recent Advances in Two-dimensional X-ray Diffraction. Bob He, Bruker AXS April 15, 2014 Harvard University Basics and Recent Advances in Two-dimensional X-ray Diffraction Bob He, Bruker AXS April 15, 2014 Harvard University Basic Concept from XRD to XRD 2 12/4/2017 2 Intensity Conventional X-ray Diffractometer

More information

APPLICATION OF Ni/C-GÖBEL MIRRORS AS PARALLEL BEAM X-RAY OPTICS FOR Cu Ka AND Mo Ka RADIATION

APPLICATION OF Ni/C-GÖBEL MIRRORS AS PARALLEL BEAM X-RAY OPTICS FOR Cu Ka AND Mo Ka RADIATION Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 212 APPLICATION OF Ni/C-GÖBEL MIRRORS AS PARALLEL BEAM X-RAY OPTICS FOR AND RADIATION T. Holz, R. Dietsch,

More information

Bruker AXS D8 FOCUS. Diffraction Solutions XRD. think forward

Bruker AXS D8 FOCUS. Diffraction Solutions XRD. think forward Bruker AXS D8 FOCUS Diffraction Solutions think forward XRD The concept behind the D8 FOCUS is to provide you with a reliable workhorse for powder diffraction applications attractively priced entry-level

More information

Rietveld refinements collection strategies!

Rietveld refinements collection strategies! Rietveld refinements collection strategies! Luca Lutterotti! Department of Materials Engineering and Industrial Technologies! University of Trento - Italy! Quality of the experiment! A good refinement,

More information

A Simple 2-D Microfluorescence

A Simple 2-D Microfluorescence A Simple 2-D Microfluorescence Unit By J.Carsello Department of Materials Science and Engineering, The Robert R. McCormick School of Engineering and Applied Sciences, Northwestern University, Evanston,

More information

Many Patterns & Many Methods

Many Patterns & Many Methods Many Patterns & Many Methods New methods for visualising & utilising multiple analysis techniques in polymorph and salt screening systems 2009 Gordon Barr, Chris Gilmore & Gordon Cunningham WestCHEM, Chemistry

More information

Basics of X-Area for image plates

Basics of X-Area for image plates Basics of X-Area for image plates Commercial software to process single-crystal and powder x-ray data from STOE image plates and PILATUS detectors Andrzej Grzechnik 1 & Karen Friese 2 1 Institute of Crystallography,

More information

THE INFLUENCE OF SURFACE ROUGHNESS ON THE REFRACTION OF X-RAYS AND ITS EFFECT ON BRAGG PEAK POSITIONS

THE INFLUENCE OF SURFACE ROUGHNESS ON THE REFRACTION OF X-RAYS AND ITS EFFECT ON BRAGG PEAK POSITIONS Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 232 THE INFLUENCE OF SURFACE ROUGHNESS ON THE REFRACTION OF X-RAYS AND ITS EFFECT ON BRAGG PEAK

More information

Maintenance Package Measurement

Maintenance Package Measurement Maintenance Package Measurement Contents Contents 1. Package measurement flow...1 2. Measurement procedures...3 2.1 Startup... 3 2.2 Hardware setup... 4 2.3 Setting Package measurement conditions... 7

More information

LABORATORY SYSTEM FOR X-RAY NANOTOMOGRAPHY

LABORATORY SYSTEM FOR X-RAY NANOTOMOGRAPHY 79 LABORATORY SYSTEM FOR X-RAY NANOTOMOGRAPHY Alexander Sasov, SkyScan, Vluchtenburgstraat 3, Aartselaar B2630, Belgium, www.skyscan.be. ABSTRACT Using advanced X-ray technologies and X-ray scattering

More information

Characterizing x-ray mirrors in reciprocal space

Characterizing x-ray mirrors in reciprocal space Characterizing x-ray mirrors in reciprocal space Preliminary results from the NIST X-ray Optics Evaluation Double-Crystal Diffractometer D.L. Gil, D. Windover, J.P. Cline, A. Henins National Institute

More information

LECTURE 15. Dr. Teresa D. Golden University of North Texas Department of Chemistry

LECTURE 15. Dr. Teresa D. Golden University of North Texas Department of Chemistry LECTURE 15 Dr. Teresa D. Golden University of North Texas Department of Chemistry Typical steps for acquisition, treatment, and storage of diffraction data includes: 1. Sample preparation (covered earlier)

More information

GRAZING-INCIDENCE X-RAY DIFFRACTOMETER FOR DETERMINING IN-PLANE STRUCTURE OF THIN FILMS. Kazuhiko Omote and Jimpei Harada

GRAZING-INCIDENCE X-RAY DIFFRACTOMETER FOR DETERMINING IN-PLANE STRUCTURE OF THIN FILMS. Kazuhiko Omote and Jimpei Harada Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 192 GRAZING-INCIDENCE X-RAY DIFFRACTOMETER FOR DETERMINING IN-PLANE STRUCTURE OF THIN FILMS Kazuhiko Omote

More information

Thermo Scientific DXR2 Raman Family

Thermo Scientific DXR2 Raman Family MOLECULAR SPECTROSCOPY Thermo Scientific DXR2 Raman Family Focus on answers, not the technique Product Specifications Easily adapt to any sample challenge using the Thermo Scientific DXR 2 family of Raman

More information

Figure 1: Derivation of Bragg s Law

Figure 1: Derivation of Bragg s Law What is Bragg s Law and why is it Important? Bragg s law refers to a simple equation derived by English physicists Sir W. H. Bragg and his son Sir W. L. Bragg in 1913. This equation explains why the faces

More information

Production dedicated HRXRD for LED / Epi-Layers Wafer Analysis

Production dedicated HRXRD for LED / Epi-Layers Wafer Analysis QC-Velox QC-Velox HRXRD High Resolution X-Ray Diffractometer Production dedicated HRXRD for LED / Epi-Layers Wafer Analysis 72.1512.1635 rev1.00 QC-Velox Overview Introduction Velox (Adj., Latin) - fleet,

More information

THREE-DIMENSIONAL MAPPING OF FATIGUE CRACK POSITION VIA A NOVEL X-RAY PHASE CONTRAST APPROACH

THREE-DIMENSIONAL MAPPING OF FATIGUE CRACK POSITION VIA A NOVEL X-RAY PHASE CONTRAST APPROACH Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 314 THREE-DIMENSIONAL MAPPING OF FATIGUE CRACK POSITION VIA A NOVEL X-RAY PHASE CONTRAST APPROACH

More information

räíê~_êáöüí Microfocus X-Ray Source Technical Data Sheet X-Ray Tube Unit Specifications

räíê~_êáöüí Microfocus X-Ray Source Technical Data Sheet X-Ray Tube Unit Specifications Technical Data Sheet räíê~_êáöüí 4 mm Anode to Object distance True round spot Grounded target = High power, 80W Integrated design No HV cable The choice for use with an x-ray optic due to close coupling

More information

KMC2 - diffractometry

KMC2 - diffractometry KMC2 - diffractometry (version 2006_09_10) ------------------------------------------------ 6-circle diffractometer (HUBER) psi-geometry 4-circle diffractometer with omega/2theta-axis vertically, minimum

More information

Two-dimensional Powder Diffraction. Bob He, Bruker AXS

Two-dimensional Powder Diffraction. Bob He, Bruker AXS Two-dimensional Powder Diffraction Bob He, Bruker AXS XRD : Comparison with Conventional XRD (1) The powder diffraction pattern in 3D space (blue) and the conventional diffractometer plane. Intensity Conventional

More information

AUTOMATED RIETVELD-ANALYSIS OF LARGE NUMBERS OF DATASETS

AUTOMATED RIETVELD-ANALYSIS OF LARGE NUMBERS OF DATASETS Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 91 AUTOMATED RIETVELD-ANALYSIS OF LARGE NUMBERS OF DATASETS Sven Vogel, Hans-Georg Priesmeyer Institut

More information

ACCURATE TEXTURE MEASUREMENTS ON THIN FILMS USING A POWDER X-RAY DIFFRACTOMETER

ACCURATE TEXTURE MEASUREMENTS ON THIN FILMS USING A POWDER X-RAY DIFFRACTOMETER ACCURATE TEXTURE MEASUREMENTS ON THIN FILMS USING A POWDER X-RAY DIFFRACTOMETER MARK D. VAUDIN NIST, Gaithersburg, MD, USA. Abstract A fast and accurate method that uses a conventional powder x-ray diffractometer

More information

XRD-DSC General (BB) D/teX Package Measurement. XRD-DSC General (medium resolution PB/PSA) Package Measurement

XRD-DSC General (BB) D/teX Package Measurement. XRD-DSC General (medium resolution PB/PSA) Package Measurement XRD-DSC General (BB) D/teX Package Measurement XRD-DSC General (medium resolution PB/PSA) Package Measurement XRD-DSC General (2D detector) Package Measurement Contents Contents 1. Package measurement

More information

Related topics Interference, wavelength, refractive index, speed of light, phase, virtuallight source.

Related topics Interference, wavelength, refractive index, speed of light, phase, virtuallight source. Determination of the refractive index TEP Overview Related topics Interference, wavelength, refractive index, speed of light, phase, virtuallight source. Principle Light is brought to interference by two

More information

Crystal Quality Analysis Group

Crystal Quality Analysis Group Crystal Quality Analysis Group Contents Contents 1. Overview...1 2. Measurement principles...3 2.1 Considerations related to orientation and diffraction conditions... 3 2.2 Rocking curve measurement...

More information

Attenuator Correction Package Measurement

Attenuator Correction Package Measurement Attenuator Correction Package Measurement Contents Contents 1. Package measurement flow...1 2. Measurement procedures...3 2.1 Startup... 3 2.2 Hardware setup... 4 2.3 Setting Package measurement conditions...

More information

Void Detection in Large Solder Joints of Integrated Power Electronics. Patrick Schuchardt Goepel electronics LLC

Void Detection in Large Solder Joints of Integrated Power Electronics. Patrick Schuchardt Goepel electronics LLC Void Detection in Large Solder Joints of Integrated Power Electronics Patrick Schuchardt Goepel electronics LLC What are power electronics Solid-state electronic devices which control and convert electric

More information

LECTURE 16. Dr. Teresa D. Golden University of North Texas Department of Chemistry

LECTURE 16. Dr. Teresa D. Golden University of North Texas Department of Chemistry LECTURE 16 Dr. Teresa D. Golden University of North Texas Department of Chemistry A. Evaluation of Data Quality An ICDD study found that 50% of x-ray labs overestimated the accuracy of their data by an

More information

FLEX 2 NEW. Key points. 3D Confocal Raman, 2 lasers, fiber based, AFM combined

FLEX 2 NEW. Key points. 3D Confocal Raman, 2 lasers, fiber based, AFM combined FLEX 2 3D Confocal Raman, 2 lasers, fiber based, AFM combined NEW Key points Compact size 2 lasers, easily switchable 2 confocal operation modes, easily switchable : High Spatial Resolution 35 nm High

More information

X-ray Powder Diffraction

X-ray Powder Diffraction X-ray Powder Diffraction Chemistry 754 Solid State Chemistry Lecture #8 April 15, 2004 Single Crystal Diffraction Diffracted Beam Incident Beam Powder Diffraction Diffracted Beam Incident Beam In powder

More information

RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS

RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 166 RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS ABSTRACT Scott T. Misture NYS College

More information

Introduction to two-dimensional X-ray diffraction

Introduction to two-dimensional X-ray diffraction Introduction to two-dimensional X-ray diffraction Bob Baoping He a) Bruker Advanced X-ray Solutions, Inc., 5465 East Cheryl Parkway, Madison, Wisconsin 53711 Received 7 February 2003; accepted 1 April

More information

Design of Hexagonal Micro Lenses Array Solar Concentrator

Design of Hexagonal Micro Lenses Array Solar Concentrator ISSN: 235-328 Design of Hexagonal Micro Lenses Array Solar Concentrator Alaa Bader Hassan, Sabah Ali Hussein Department of Physics, College of Education Ibn Al-Haitham for Pure Sciences, University of

More information

Formula for the asymmetric diffraction peak profiles based on double Soller slit geometry

Formula for the asymmetric diffraction peak profiles based on double Soller slit geometry REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 69, NUMBER 6 JUNE 1998 Formula for the asymmetric diffraction peak profiles based on double Soller slit geometry Takashi Ida Department of Material Science, Faculty

More information

Optical Ptychography Imaging

Optical Ptychography Imaging Optical Ptychography Imaging Summer Project Annafee Azad Supervisors: Dr Fucai Zhang Prof Ian Robinson Summer 2014 23 October 2014 Optical Ptychography Imaging P a g e 2 Abstract This report details a

More information

Introduction. Experiment A: Snell s Law. Physics 1CL REFLECTION AND REFRACTION OF LIGHT Summer Session II 2010

Introduction. Experiment A: Snell s Law. Physics 1CL REFLECTION AND REFRACTION OF LIGHT Summer Session II 2010 Introduction This laboratory is a quantitative investigation of the reflection and refraction of light off optical interfaces. An optical interface is a boundary between two transparent media of different

More information

Powder Diffraction Data for Pure KHP

Powder Diffraction Data for Pure KHP Powder Diffraction Data for Pure KHP This is the simple example template containing only headers for each report item and the bookmarks. The invisible bookmarks are indicated by text between brackets.

More information

Fischerscope X Ray CIRCULARS 07/01

Fischerscope X Ray CIRCULARS 07/01 Fischerscope X Ray CIRCULARS 07/01 New instrument Fischerscope X-Ray XDVM-P As we informed in December, both the instruments Fischerscope X-RAY XDVM-T7-W 602-636 (measuring head 602-557) and Fischerscope

More information

Textbook Reference: Physics (Wilson, Buffa, Lou): Chapter 24

Textbook Reference: Physics (Wilson, Buffa, Lou): Chapter 24 AP Physics-B Physical Optics Introduction: We have seen that the reflection and refraction of light can be understood in terms of both rays and wave fronts of light. Light rays are quite compatible with

More information

Tutorial: Instantaneous Measurement of M 2 Beam Propagation Ratio in Real-Time

Tutorial: Instantaneous Measurement of M 2 Beam Propagation Ratio in Real-Time Tutorial: Instantaneous Measurement of M 2 Beam Propagation Ratio in Real-Time By Allen M. Cary, Jeffrey L. Guttman, Razvan Chirita, Derrick W. Peterman, Photon Inc A new instrument design allows the M

More information

X-ray thin-film measurement techniques

X-ray thin-film measurement techniques X-ray thin-film measurement techniques VIII. Detectors and series summary Shintaro Kobayashi* and Katsuhiko Inaba* 1. Introduction The various XRD techniques as the characterization tools for thin film

More information

Highly Efficient Assembly of Lenses with. OptiCentric and OptiCentric Cementing

Highly Efficient Assembly of Lenses with. OptiCentric and OptiCentric Cementing Highly Efficient Assembly of Lenses with OptiCentric and OptiCentric Cementing Centration Measurement and Lens Alignment Contents OptiCentric Cementing Centration Measurement and Lens Alignment 3 4 Centration

More information

Quantitative Analysis of Thin Films and Multiple Thin Film Structures by Monte-Carlo Techniques

Quantitative Analysis of Thin Films and Multiple Thin Film Structures by Monte-Carlo Techniques Copyright (C) JCPDS-International Centre for Diffraction Data 1999 54 Quantitative Analysis of Thin Films and Multiple Thin Film Structures by Monte-Carlo Techniques M.Mantler Vienna University of Technology,

More information

Release by the International Centre for Diffraction Data (ICDD) of New Powder Data Mining Tools: the PDF-4/Full File and PDF-4/Organics Databases

Release by the International Centre for Diffraction Data (ICDD) of New Powder Data Mining Tools: the PDF-4/Full File and PDF-4/Organics Databases Release by the International Centre for Diffraction Data (ICDD) of New Powder Data Mining Tools: the PDF-4/Full File and PDF-4/Organics Databases Brian O Connor*, Camden Hubbard #, Tim Fawcett and John

More information

Introduction to XRD analysis of modern functional thin films using a 2-dimensional detector (1) GI-XRD

Introduction to XRD analysis of modern functional thin films using a 2-dimensional detector (1) GI-XRD Technical articles Introduction to XRD analysis of modern functional thin films using a 2-dimensional detector (1) GI-XRD Shintaro Kobayashi* and Katsuhiko Inaba** 1. Introduction The development of new

More information

MCP Photodetector Development at Argonne. Lei Xia ANL - HEP

MCP Photodetector Development at Argonne. Lei Xia ANL - HEP MCP Photodetector Development at Argonne Lei Xia ANL - HEP Introduction large area photodetector development Development of ALD coated large area MCP Development of ceramic/glass packaging for large area

More information

Applications of Piezo Actuators for Space Instrument Optical Alignment

Applications of Piezo Actuators for Space Instrument Optical Alignment Year 4 University of Birmingham Presentation Applications of Piezo Actuators for Space Instrument Optical Alignment Michelle Louise Antonik 520689 Supervisor: Prof. B. Swinyard Outline of Presentation

More information

SPECTRUM. The world s first fully automated Raman AFM. AFM - confocal Raman - SNOM - TERS AFM KPFM. Raman. AFM-Raman characterization of PS-PVAC

SPECTRUM. The world s first fully automated Raman AFM. AFM - confocal Raman - SNOM - TERS AFM KPFM. Raman. AFM-Raman characterization of PS-PVAC Raman KPFM AFM AFM-Raman characterization of PS-PVAC polymer blend film SPECTRUM The world s first fully automated Raman AFM AFM - confocal Raman - SNOM - TERS The first fully integrated & automated AFM

More information

Optical systems design with integrated rigorous vector diffraction

Optical systems design with integrated rigorous vector diffraction Optical systems design with integrated rigorous vector diffraction Bernd H. Kleemann, J. Ruoff, M. Seeßelberg, J.-M. Kaltenbach, C. Menke, and H.-J. Dobschal Corporate Research & Technology Optical Design

More information

ALPHA II. Innovation with Integrity. The new benchmark for compact FTIR spectrometers FTIR

ALPHA II. Innovation with Integrity. The new benchmark for compact FTIR spectrometers FTIR ALPHA II The new benchmark for compact FTIR spectrometers Innovation with Integrity FTIR One Touch - Many Applications Verify/Identify Guided Workflow It takes only three touches for measurement, evaluation

More information

Fujifilm DR Solution. FDR AcSelerate. The new pinnacle in diagnostic imaging from Fujifilm ISS. CsI. Dynamic Visualization. Technology.

Fujifilm DR Solution. FDR AcSelerate. The new pinnacle in diagnostic imaging from Fujifilm ISS. CsI. Dynamic Visualization. Technology. Fujifilm DR Solution FDR AcSelerate The new pinnacle in diagnostic imaging from Fujifilm CsI Scintillator ISS Technology Dynamic Visualization Welcome to the X-ray room of the future! A streamlined solution

More information

Chapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena

Chapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena Chapter 24 Wave Optics Wave Optics The wave nature of light is needed to explain various phenomena Interference Diffraction Polarization The particle nature of light was the basis for ray (geometric) optics

More information

X-ray Diffraction from Materials

X-ray Diffraction from Materials X-ray Diffraction from Materials 2008 Spring Semester Lecturer; Yang Mo Koo Monday and Wednesday 14:45~16:00 8. Experimental X-ray Diffraction Procedures 8.1 Diffraction Experiments using Films 8.1.1 Laue

More information

gelbe Fläche druckt nicht!!!

gelbe Fläche druckt nicht!!! 01980_D8_Advance_neu_MON28:210x279 29.04.09 16:55 Seite 1 D8 ADVANCE Highlights at a glance gelbe Fläche druckt nicht!!! Design: DAVINCI.DESIGN with DAVINCI.MODE DAVINCI.SNAP-LOCK DIFFRAC.DAVINCI X-ray

More information

O-ARM IMAGING SYSTEM TECHNICAL SPECIFICATION GUIDE

O-ARM IMAGING SYSTEM TECHNICAL SPECIFICATION GUIDE IMAGING SYSTEM TECHNICAL SPECIFICATION GUIDE SYSTEM FEATURES CATEGORY PHYSICAL DIMENSIONS IMAGING MODALITY PERFORMANCE SPECIFICATION Length Width Height Weight Gantry Opening Bore Diameter Single Plane

More information

Towards 0.1 mm spatial resolution

Towards 0.1 mm spatial resolution Submitted for publication in ICNS Proceedings Towards 0.1 mm spatial resolution A. D. Stoica and X. L. Wang Spallation Neutron Source 701 Scarboro Road Oak Ridge National Laboratory Oak Ridge, TN 37831,

More information

Lab 12 - Interference-Diffraction of Light Waves

Lab 12 - Interference-Diffraction of Light Waves Lab 12 - Interference-Diffraction of Light Waves Equipment and Safety: No special safety equipment is required for this lab. Do not look directly into the laser. Do not point the laser at other people.

More information

Spherical Crystal X-ray Imaging for MTW, OMEGA, and OMEGA EP

Spherical Crystal X-ray Imaging for MTW, OMEGA, and OMEGA EP Spherical Crystal X-ray Imaging for MTW, OMEGA, and OMEGA EP C.STOECKL, G. FISKEL, R. K. JUNGQUIST, P. M. NILSON, AND W. THEOBALD University of Rochester, Laboratory for Laser Energetics Spherical Crystal

More information

Exp No.(9) Polarization by reflection

Exp No.(9) Polarization by reflection Exp No.(9) Polarization by reflection Figure 1: Experimental arrangement Object: Study reflection of polarized light from a glass plate Equipment: Sodium lamp, collimating lens, Mirror at 56.3 normal,

More information

LIMO LM Medical Series Version March 01, 2010 HIGH-POWER DIODE LASER

LIMO LM Medical Series Version March 01, 2010 HIGH-POWER DIODE LASER SMA905 Plug & Play connector for optical fibres Compact dimensions Passively cooled 2 temperature s (NTC/PT100) Optical data 1 CW nominal output power (W) 15 20 Centre wavelength λ (nm) 805-810 915, 940,

More information

Tutorial Solutions. 10 Holographic Applications Holographic Zone-Plate

Tutorial Solutions. 10 Holographic Applications Holographic Zone-Plate 10 Holographic Applications 10.1 Holographic Zone-Plate Tutorial Solutions Show that if the intensity pattern for on on-axis holographic lens is recorded in lithographic film, then a one-plate results.

More information

Chapter 38. Diffraction Patterns and Polarization

Chapter 38. Diffraction Patterns and Polarization Chapter 38 Diffraction Patterns and Polarization Diffraction Light of wavelength comparable to or larger than the width of a slit spreads out in all forward directions upon passing through the slit This

More information

Laser Diode Collimators Type 48TE, 48-0, and 44TE, universal modular system for self-assembly

Laser Diode Collimators Type 48TE, 48-0, and 44TE, universal modular system for self-assembly Laser Diode Collimators Type 48TE, 48-0, and 44TE, universal modular system for self-assembly Laser Diode Collimators 48TE, 48-0, and 44TE, Laser Diode Base Unit 44TE LD Collimators Types 48TE, 48-0 and

More information

Coaxial Lights LFV3 Series

Coaxial Lights LFV3 Series Coaxial Lights LFV Enhanced Coaxial Lighting for more optimal imaging CCS Inc. Coaxial Lighting Re-engineered LFV Brighter Two times brighter than LFV Higher Quality Glass Window Glass surface accuracy

More information

SECONDARY EXCITATION PROCESS FOR QUANTITATIVE CONFOCAL 3D-XRF ANALYSIS

SECONDARY EXCITATION PROCESS FOR QUANTITATIVE CONFOCAL 3D-XRF ANALYSIS 191 SECONDARY EXCITATION PROCESS FOR QUANTITATIVE CONFOCAL 3D-XRF ANALYSIS Kouichi Tsuji 1) *, Atsushi Tabe 1), Peter Wobrauscheck 2), and Christina Streli 2) 1) Graduate School of Engineering, Osaka City

More information

FTIR-7600 FT-IR Spectrometer Accessories Price List 2011

FTIR-7600 FT-IR Spectrometer Accessories Price List 2011 FTIR-7600 FT-IR Spectrometer Accessories Price List 2011 Lambda Scientific Systems, Inc. Part # Description of Item Price (USD) 50 Magnetic Film/Pellet Holder (for 13 mm film/pellet samples) The Magnetic

More information

XSIMA X-RAY EQUIPMENT

XSIMA X-RAY EQUIPMENT ISO13485 Certified XSIMA X-RAY EQUIPMENT Portable X-ray Machine Mobile X-ray Machine Conventional X-ray Machine High Frequency X-ray Machine Digital X-ray Machine Veterinary X-ray Machine Join Star Business

More information

Single Photon Interference

Single Photon Interference December 19, 2006 D. Lancia P. McCarthy Classical Interference Intensity Distribution Overview Quantum Mechanical Interference Probability Distribution Which Path? The Effects of Making a Measurement Wave-Particle

More information

Chapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena

Chapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena Chapter 24 Wave Optics Wave Optics The wave nature of light is needed to explain various phenomena Interference Diffraction Polarization The particle nature of light was the basis for ray (geometric) optics

More information

Ray Optics. Lecture 23. Chapter 23. Physics II. Course website:

Ray Optics. Lecture 23. Chapter 23. Physics II. Course website: Lecture 23 Chapter 23 Physics II Ray Optics Course website: http://faculty.uml.edu/andriy_danylov/teaching/physicsii Let s finish talking about a diffraction grating Diffraction Grating Let s improve (more

More information

Dr. Larry J. Paxton Johns Hopkins University Applied Physics Laboratory Laurel, MD (301) (301) fax

Dr. Larry J. Paxton Johns Hopkins University Applied Physics Laboratory Laurel, MD (301) (301) fax Dr. Larry J. Paxton Johns Hopkins University Applied Physics Laboratory Laurel, MD 20723 (301) 953-6871 (301) 953-6670 fax Understand the instrument. Be able to convert measured counts/pixel on-orbit into

More information

MICHELSON S INTERFEROMETER

MICHELSON S INTERFEROMETER MICHELSON S INTERFEROMETER Objectives: 1. Alignment of Michelson s Interferometer using He-Ne laser to observe concentric circular fringes 2. Measurement of the wavelength of He-Ne Laser and Na lamp using

More information

LAMBDA DATA SHEET. ANALOGIC mammography unit. ANALOGIC mammography unit. Rev. n.05 of 15/01/13

LAMBDA DATA SHEET. ANALOGIC mammography unit. ANALOGIC mammography unit. Rev. n.05 of 15/01/13 NOTE The manufacturer reserves the right to make further improvements while keeping main features unchanged MAIN CHARACTERISTICS Line voltage 220/230/240 VAC 10% @ 50/60 Hz Power 6.6 kva (0.5 kva stand-by)

More information

Wave-particle duality of light. II.

Wave-particle duality of light. II. Wave-particle duality of light. II. Light can apparently behave like a particle, or like a wave? But under certain circumstances, it must somehow behave like both at once. One of the first experiments

More information

Ray Optics I. Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex

Ray Optics I. Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex Phys 531 Lecture 8 20 September 2005 Ray Optics I Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex Today shift gears, start applying

More information

dq dt I = Irradiance or Light Intensity is Flux Φ per area A (W/m 2 ) Φ =

dq dt I = Irradiance or Light Intensity is Flux Φ per area A (W/m 2 ) Φ = Radiometry (From Intro to Optics, Pedrotti -4) Radiometry is measurement of Emag radiation (light) Consider a small spherical source Total energy radiating from the body over some time is Q total Radiant

More information

The smaller, simpler, safer alternative to radioisotope irradiators. Precision s MultiRad160 is ideal for irradiating larger cell cultures and/or

The smaller, simpler, safer alternative to radioisotope irradiators. Precision s MultiRad160 is ideal for irradiating larger cell cultures and/or The smaller, simpler, safer alternative to radioisotope irradiators. Precision s MultiRad160 is ideal for irradiating larger cell cultures and/or superficial small animal irradiation. STOP Off On The MultiRad160

More information

Typical System Construction Schedule; Balzers Chambers: BAK600 BAK760 QLC800

Typical System Construction Schedule; Balzers Chambers: BAK600 BAK760 QLC800 Typical System Construction Schedule; Balzers Chambers: BAK600 BAK760 QLC800 Chamber / Framework System fully dismantled. Old controls and instruments removed. Chamber and framework stripped and prepared

More information

Thread Mountable Cameo Laser Diode Module

Thread Mountable Cameo Laser Diode Module Thread Mountable Cameo Laser Diode Module Thread Mountable Cameo The Cameo is a unique, versatile, high quality industrial laser diode module widely used in alignment applications. Available in two models,

More information

Z-LASER Improved Beam Modeling With Optical Fibers. Vision Technology Forum April 15th, 2015

Z-LASER Improved Beam Modeling With Optical Fibers. Vision Technology Forum April 15th, 2015 Z-LASER Improved Beam Modeling With Optical Fibers Vision Technology Forum April 15th, 2015 Laser for 3D-Measurement One typical application is the optical 3D measurement of an object with laser triangulation

More information

1

1 In the following tutorial we will determine by fitting the standard instrumental broadening supposing that the LaB 6 NIST powder sample broadening is negligible. This can be achieved in the MAUD program

More information

A CONVERGENT BEAM, PARALLEL DETECTION X-RAY DIFFRACTION SYSTEM FOR CHARACTERIZING COMBINATORIAL EPITAXIAL THIN FILMS

A CONVERGENT BEAM, PARALLEL DETECTION X-RAY DIFFRACTION SYSTEM FOR CHARACTERIZING COMBINATORIAL EPITAXIAL THIN FILMS The Rigaku Journal Vol. 18/ No. 1/ 2001 CONTRIBUTED PAPERS A CONVERGENT BEAM, PARALLEL DETECTION X-RAY DIFFRACTION SYSTEM FOR CHARACTERIZING COMBINATORIAL EPITAXIAL THIN FILMS K. OMOTE, T. KIKUCHI, J.

More information

Product data. Mammographic System

Product data. Mammographic System Technologically advanced mammographic system, offering the best quality/price ratio. Lightweight and easy-to-use, facilitating the operator s job. Excellent diagnostic image quality, similar to the top-of

More information

High-Power Femtosecond Lasers

High-Power Femtosecond Lasers High-Power Femtosecond Lasers FEATURES 190 fs ps tunable pulse duration Up to 2 mj pulse energy Up to 20 W average power Single pulse 1 MHz tunable repetition rate Includes pulse picker for pulse-on-demand

More information

R R : R packaged in reel of 2000 couplers SMT HYBRID COUPLER GHZ Series : Coupler TECHNICAL DATA SHEET 1 / 5

R R : R packaged in reel of 2000 couplers SMT HYBRID COUPLER GHZ Series : Coupler TECHNICAL DATA SHEET 1 / 5 TECHNICAL DATA SHEET 1 / 5 R41.211.502 R41.211.502 : R41.211.500 packaged in reel of 2000 couplers All dimensions are in mm. TECHNICAL DATA SHEET 2 / 5 R41.211.502 ELECTRICAL CHARACTERISTICS Specified

More information

AP Physics Problems -- Waves and Light

AP Physics Problems -- Waves and Light AP Physics Problems -- Waves and Light 1. 1975-4 (Physical Optics) a. Light of a single wavelength is incident on a single slit of width w. (w is a few wavelengths.) Sketch a graph of the intensity as

More information

Filter Fan Unit LIGHT

Filter Fan Unit LIGHT Filter Fan Unit LIGHT Type LIGHT EC Technical Concept Technical Concept Filter Fan Unit LIGHT Product Description Filter Fan Units (FFUs) from M+W Products are designed to provide clean air to individual

More information

How to Analyze Materials

How to Analyze Materials INTERNATIONAL CENTRE FOR DIFFRACTION DATA How to Analyze Materials A PRACTICAL GUIDE FOR POWDER DIFFRACTION To All Readers This is a practical guide. We assume that the reader has access to a laboratory

More information

Advances in the power, brightness, weight and efficiency of fibercoupled diode lasers for pumping and direct diode applications

Advances in the power, brightness, weight and efficiency of fibercoupled diode lasers for pumping and direct diode applications Advances in the power, brightness, weight and efficiency of fibercoupled diode lasers for pumping and direct diode applications Chris Ebert*, Tina Guiney, Joe Braker, Dean Stapleton, Kim Alegria, David

More information

Defining Cutting Edge Quality. Laser Cutting Head BIMO-FSC BIMO-FSC

Defining Cutting Edge Quality. Laser Cutting Head BIMO-FSC BIMO-FSC Defining Cutting Edge Quality Laser Cutting Head BIMO-FSC BIMO-FSC Laser Cutting Head BIMO-FSC for Flat Sheet Laser Cutting Until recently, fibre disc and diode lasers have been playing a minor role in

More information

Technical Concept. Filter Fan Unit LIGHT. Type LIGHT AC Type LIGHT EC

Technical Concept. Filter Fan Unit LIGHT. Type LIGHT AC Type LIGHT EC Technical Concept Filter Fan Unit LIGHT Type LIGHT AC Type LIGHT EC Filter Fan Unit LIGHT Technical Concept Product Description Filter Fan Units (FFUs) from M+W Products are designed to provide clean air

More information

ALPHA II. Innovation with Integrity. The benchmark for compact FTIR spectrometers FTIR

ALPHA II. Innovation with Integrity. The benchmark for compact FTIR spectrometers FTIR ALPHA II The benchmark for compact FTIR spectrometers Innovation with Integrity FTIR One Touch - Many Applications Verify/Identify Quantify Measure Search Efficient Quality Control Incoming goods inspection

More information

Single Photon Counting Module COUNT blue -Series

Single Photon Counting Module COUNT blue -Series Single Photon Counting Module COUNT blue -Series Description Laser Components COUNT blue series of Single Photon Counting Modules has been developed to offer a unique combination of high quantum efficiency,

More information

GRAZING INCIDENCE IN-PLANE X-RAY DIFFRACTION IN THE LABORATORY

GRAZING INCIDENCE IN-PLANE X-RAY DIFFRACTION IN THE LABORATORY Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 309 GRAZING INCIDENCE IN-PLANE X-RAY DIFFRACTION IN THE LABORATORY B. K. Tanner, T. P. A. Hase,

More information

Introduction to Biomedical Imaging

Introduction to Biomedical Imaging Alejandro Frangi, PhD Computational Imaging Lab Department of Information & Communication Technology Pompeu Fabra University www.cilab.upf.edu X-ray Projection Imaging Computed Tomography Digital X-ray

More information

Precautions The XRD uses x-ray radiation. The instrument is designed to prevent radiation exposure.

Precautions The XRD uses x-ray radiation. The instrument is designed to prevent radiation exposure. 1 Operating Procedure for X-Ray Diffraction Purpose and Scope This document describes the procedures and policies for using the MSE Bruker D8 Focus XRD The scope of this document is to establish user procedures.

More information

A Small-Angle Optically Focusing X-Ray Diffraction Camera in Biological Research. Part I

A Small-Angle Optically Focusing X-Ray Diffraction Camera in Biological Research. Part I J. ULTRASTRUCTURE RESEARCH 9, 166-170 (1963) A Small-Angle Optically Focusing X-Ray Diffraction Camera in Biological Research. Part I G. F. ELLIOTT Medical Research Council Biophysics Research Unit King's

More information