Highly Accelerated Thermal Shock Reliability Report

Transcription

1 Highly Accelerated Thermal Shock Reliability Report Example Analysis Report July 5, 2 Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved.

2 Page 2 Customer Information Date... July 5, 2 Customer... Tim Estes Company... Conductor Analysis Technologies, Inc. Phone tim.estes@cattest.info HATS Test Parameters Number of Coupons... Cycles Requested... 5 Total Cycle Time (minutes)....2 High Temperature (C) Low Temperature (C)... 4 Failure Criterion (%)... Coupon Design Design Name... HATS_ Design Date... April 2, 2 Coupon Width (inches) Coupon Height (inches)....5 Layers... Soldermask Expansion (mils)... 3 Minimum Clearance (mils)... 5 Plane Layers... 3 Ground Plane Relief (mils)... Net Number Via Type Hole Size (mils) Land Size (mils) Track Width (mils) Grid Size (mils) Interconnect Sequence Vias per Net Through..* Through. 2.* Through * Through * * teardrop design Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

3 Coupon Information Page 3 Coupon Number Designation Group Number Thickness (mils) Reflow Count Reflow Cycle (C) A B A B A 2 2 4B 2 Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

4 Page 4 Notched Box Plot Notched box plots are used to display the distribution of the data. The notch is centered at the median, and the box extends from the first quartile (25 th percentile) to the third quartile (75 th percentile), encompassing 5 percent of the population. A line extends from the first quartile to the lower adjacent value. This range encompasses 25 percent of the population except when there are outside values, which are plotted as individual points and reduce the population accordingly. Similarly, a line extends from the third quartile to the upper adjacent value and encompasses 25 percent of the population less any outside values at the upper bound. In some cases, the average is indicated by an open circle and is typically near the median. Outside Values Upper Adjacent Value Third Quartile Average Median First Quartile Lower Adjacent Value Outside Values Weibull Analysis A twoparameter loglikelihood Weibull analysis is only performed when a group includes four or more coupons having one or more thermal cycling failures. The results are presented in graphs that show "Cumulative Failure Probability" plotted vs. "Cycles to Failure" at % resistance change. The Weibull fit is indicated by the dotted line in the graph. The failures are plotted as white triangles while the nets that did not fail by the end of the test or were suspended prior to the end of the test are plotted as black triangles. Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

5 Reliability Page 5 Statistics Cycles to % Change Net Net 2 Net 3 Net 4 Cycles to Open Circuit (2 ohms) Net Net 2 Net 3 Net 4 Count Number Passed Number Suspended Number Failed 5 Minimum First Quartile Median Third Quartile Maximum Mean Range Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

6 Reliability Page 5 % Change Open Cycles to Failure Net Net 2 Net 3 Net 4 Net Net 2 Net 3 Net 4 Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

7 Net Resistance by Cycle Page Change in Resistance (%) Cycle Number Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

8 Net 2 Resistance by Cycle Page 2 9 Change in Resistance (%) Cycle Number Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

9 Net 3 Resistance by Cycle Page Change in Resistance (%) Cycle Number Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

10 Net 4 Resistance by Cycle Page 2 9 Change in Resistance (%) Cycle Number Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

11 Reliability by Coupon Page Assembly Simulation Coupon Resistance Change (%) Number Reference Resistance at 45C (ohms) Cycles to % Change Cycles to Open Circuit (2 ohms) Percent Change at 5 Cycles Net Net 2 Net 3 Net 4 Net Net 2 Net 3 Net 4 Net Net 2 Net 3 Net 4 Net Net 2 Net 3 Net 4 Net Net 2 Net 3 Net > Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

12 Net Reliability (% Change) Page Beta (slope) Eta (scale) Correlation MTTF Cumulative Failure Probability (%) Cycles to Failure Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

13 Net 2 Reliability (% Change) Page Beta (slope) Eta (scale) Correlation MTTF Cumulative Failure Probability (%) Cycles to Failure Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

14 Net 3 Reliability (% Change) Page Beta (slope) Eta (scale) Correlation MTTF Cumulative Failure Probability (%) Cycles to Failure Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2

15 Net 4 Reliability (% Change) Page Beta (slope) Eta (scale) Correlation MTTF Cumulative Failure Probability (%) Cycles to Failure Example Analysis Report Copyright 222 Integrated Reliability Test Systems, Inc., All Rights Reserved. July 5, 2