Agilent Technologies Advanced Signal Integrity

Transcription

1 Agilent Technologies Advanced Signal Integrity Measurements for Next Generation High Speed Serial Standards Last Update 2012/04/24 (YS)

2 Appendix VNA or TDR Scope? ENA Option TDR Overview USB 3.0 Cable/Connector Compliance Test Solution Summary 2

3 Time Domain Measurements TDR (Time Domain Reflection) x-axis is time or distance evaluate the impedance profile to locate discontinuities Incident wave DUT Reflected wave the shape and polarity of the reflections provide insight about the line Connector Stepped impedance Adjacent trace 3

4 Time Domain Measurements TDT (Time Domain Transmission) x-axis is time or distance evaluate propagation delay and rise time degradation Incident wave DUT Transmitted wave propagation delay very important for differential systems useful for monitoring crosstalk and mode conversion 4

5 Frequency Domain Measurements Return Loss (Sdd11) x-axis is frequency evaluate reflection of signal through interconnect Incident wave DUT Reflected wave 5

6 Frequency Domain Measurements Insertion Loss (Sdd21) x-axis is frequency evaluate attenuation of signal through interconnect Incident wave DUT Transmitted wave Estimate highest useable frequency, or the bandwidth of the interconnect 6

7 Time Domain and Frequency Domain Measurements Measurement Example (differential 2-port device) TDR (Tdd11, Tdd22) Return Loss (Sdd11, Sdd22) TDT (Tdd21, Tdd12) Insertion Loss (Sdd21, Sdd12) 7

8 Time Domain and Frequency Domain Measurements Complete Characterization (All S-parameters) Sdd11 Sdd12 Sdc11 Sdc12 Sdd21 Sdd22 Sdc21 Sdc22 Scd11 Scd12 Scc11 Scc12 Scd11 Scd22 Scc11 Scc22 8

9 Time Domain and Frequency Domain Measurements Complete Characterization (All T-parameters) Tdd11 Tdd12 Tdc11 Tdc12 Tdd21 Tdd22 Tdc21 Tdc22 Tcd11 Tcd12 Tcc11 Tcc12 Tcd11 Tcd22 Tcc11 Tcc22 9

10 Time Domain and Frequency Domain Measurements Using Fourier Transform techniques, the time domain response can be mathematically transformed into the frequency domain response and back again without changing or losing any information. 10

11 VNA or TDR Scope? Measurement domain Display domain VNA Frequency Domain TDR Scope Time Domain 11

12 VNA or TDR Scope? VNA ENA Option TDR TDR Scope Measurements (Modes): Frequency Domain (S-parameters) Yes Yes Yes Time Domain (TDR/TDT) Yes Yes Yes Eye Diagram / Mask Testing No Yes (simulated) Yes (live) Oscilloscope No No Yes Jitter Analysis No No Yes VNA ENA Option TDR TDR Scope Speed and Accuracy Best Best Fair ESD Robustness Best Best Fair (ext protection) Simple and Intuitive Operation Fair Yes Yes Cost Fair Fair Best 12

13 Agenda VNA or TDR Scope? ENA Option TDR Overview USB 3.0 Cable/Connector Compliance Test Solution Summary 13

14 Agilent VNA Solutions PNA-X, NVNA Industry-leading performance 10 M to 13.5/26.5/43.5/50/67 GHz Banded mm-wave to 2 THz FieldFox Handheld RF Analyzer 5 Hz to 4/6 GHz E5061B NA + ZA in one-box 5 Hz to 3 GHz Low cost RF VNA E5071C World s most popular economy VNA 9 khz to 4.5, 8.5 GHz 300 khz to 20.0 GHz E5072A Best performance ENA 30 khz to 4.5, 8.5 GHz 100 k to 1.5/3.0 GHz ENA Series PNA Performance VNA 10 M to 20, 40, 50, 67, 110 GHz Banded mm-wave to 2 THz PNA-L World s most capable value VNA 300 khz to 6, 13.5, 20 GHz 10 MHz to 40, 50 GHz PNA-X receiver 8530A replacement Mm-wave solutions Up to 2 THz PNA Series Last update: Nov

15 What is ENA Option TDR? The ENA Option TDR is an application software embedded on the ENA, which provides an one-box solution for high speed serial interconnect analysis. Time Domain Frequency Domain 3 Breakthroughs for Signal Integrity Design and Verification Eye Diagram Simple and Intuitive Operation Fast and Accurate Measurements ESD protection inside ESD Robustness 15

16 One-box Solution for High Speed Serial Interconnect Analysis Time domain Time Domain Frequency Domain TDR Return Loss Frequency domain TDT Insertion Loss Eye diagram 16

17 One-box Solution for High Speed Serial Interconnect Analysis Time domain Eye Diagram Frequency domain Eye diagram 17

18 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive Similar look-and-feel to TDR scopes Intuitive operation even for users unfamiliar to vector network analyzers and S-parameter measurements. Fast and Accurate ESD Robustness ESD protection inside 18

19 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive Setup Wizard Guides the user through all of the required steps, making setup, error correction, and measurement intuitive and error-free. Fast and Accurate 4 steps!! ESD Robustness ESD protection inside 19

20 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive EDN (Oct 12, 2006) Fast and Accurate ESD Robustness ESD protection inside 20

21 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive DUT: 50 Ohm pattern Fast and Accurate ENA Option TDR TDR Scope 1 ohm/div 1 ohm/div ESD Robustness ESD protection inside VNA Based TDR measurements = Low Noise 21

22 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive DUT: 50 Ohm pattern Fast and Accurate ENA Option TDR TDR Scope 1 ohm/div Averaging 1 ohm/div ESD Robustness ESD protection inside Averaging can lower noise BUT 22

23 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive DUT: 50 Ohm pattern Fast and Accurate ENA Option TDR TDR Scopes 1 ohm/div Averaging 1 ohm/div ESD Robustness ESD protection inside Real-Time Analysis 23

24 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive Dynamic range is generally defined as the maximum power the receiver can accurately measure minus the receiver noise floor. Fast and Accurate ESD Robustness ESD protection inside E5071C Datasheet ( EN) July 10, 2009 System Dynamic Range 10Hz IFBW 86100C Technical Specifications ( EN) October 1, 2009 Attenuation Dynamic Range Internal 24

25 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive Fast and Accurate ENA Option TDR [Source] Source power leveled and constant across entire frequency range -> NO loss of accuracy for higher frequencies TDR Scope [Source] Source power rapidly decreases with increase in frequency -> loss of accuracy for higher frequencies ESD Robustness ESD protection inside [Receiver ] Narrowband Noise attenuated in stopband of filter -> Noise reduction [Receiver] Broadband All noise up to the bandwidth of the system is observed ->NO noise reduction For further details (including mathematical analysis), refer to the White Paper Comparison of Measurement Performance between Vector Network Analyzer and TDR Oscilloscope ( EN). 25

26 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive TDR Scopes Difficult to implement protection circuits inside the instrument without sacrificing performance. Fast and Accurate In addition, protection diodes cannot be placed in front of the sampling bridge as this would limit the bandwidth. This reduces the safe input voltage for a sampling oscilloscope to about 3 V, as compared to 500 V available on other oscilloscopes. ESD Robustness External ESD protection module available, but rise time is degraded. ESD protection inside Reflected rise time when used with 80E04: 28ps -> 37ps 26

27 Three Breakthroughs for Signal Integrity Design and Verification Simple and Intuitive ENA Option TDR ESD protection circuits inside the instrument Fast and Accurate ESD Robustness Higher robustness against ESD, because protection circuits are implemented inside the instrument for all ports, while maintaining excellent RF performance. Proprietary ESD protection chip significantly increase ESD robustness, while at the same time maintaining excellent RF performance (22ps rise time for 20GHz models). ESD protection inside To ensure high robustness against ESD, ENA Option TDR is tested for ESD survival according to IEC801-2 Human Body Model. 27

28 Measurement Correlation TDR/TDT DUT: USB3.0 Cable 50 ps rise time (20-80%) 28

29 Measurement Correlation Eye Diagram DUT: USB3.0 Cable PRBS 5 Gbps ENA Option TDR (simulated) N4903B C (live) Refer to Appendix for DisplayPort and SATA correlation data. 29

30 Summary The Agilent ENA Option TDR application Provides one-box solution for high speed serial interconnect analysis Time domain Frequency domain Eye diagram Brings three breakthroughs for signal integrity design and verification Simple & Intuitive Operation Fast & Accurate Measurements ESD Robustness 30

31 Agenda VNA or TDR Scope? Correlation to TDR Scopes ENA Option TDR Overview USB 3.0 Cable/Connector Compliance Test Solution Summary 31

32 Agilent Digital Standards Program Our solutions are driven and supported by Agilent experts involved in international standards committees: Joint Electronic Devices Engineering Council (JEDEC) PCI Special Interest Group (PCI-SIG ) Video Electronics Standards Association (VESA) Serial ATA International Organization (SATA-IO) USB-Implementers Forum (USB-IF) Mobile Industry Processor Interface (MIPI) Alliance Optical Internetworking Forum (OIF) We re active in standards meetings, workshops, plugfests, and seminars Our customers test with highest confidence and achieve compliance faster 32

33 USB 3.0 Cable/Connector Compliance Test Solution Cable Assembly Host CabCon Device 2 SS USB Pair Full Simplex 2 SS USB Pair Full Simplex 2 USB 2.0 Pair Half-Duplex PWR (1), GND (1) SuperSpeeed USB Developers Conference Presentation, Taipei, Taiwan (April 1-2, 2010), SuperSpeed USB Physical Layer, Howard Heck, Intel Corporation 33

34 USB 3.0 Cable/Connector Compliance Test Solution Measurement Parameters Time Domain Measurements Mated Connector Impedance Cable Electrical Performance Characteristic Impedance Intra-pair Skew Near-end Crosstalk between SuperSpeed Pairs Differential Near-end Crosstalk between SuperSpeed Pairs Differential Crosstalk between D=/D- and SuperSpeed Pairs Frequency Domain Measurements Differential Insertion Loss (Sdd21) Differential to-common-mode Conversion (Scd21) SuperSpeeed USB Developers Conference Presentation, Taipei, Taiwan (April 1-2, 2010), SuperSpeed USB Physical Layer, Howard Heck, Intel Corporation 34

35 USB 3.0 Cable/Connector Compliance Test Solution Solution Overview USB 3.0 cable/connector compliance testing requires parametric measurements in both time and frequency domains Traditional Solution New Solution Frequency Domain Insertion Loss (Sdd21) Mode Conversion (Scd21) Vector Network Analyzer (VNA) ALL parameters can be measured with ENA Option TDR One-box Solution!! Time Domain Mated Connector Impedance Profile (TDR) Crosstalk (NEXT, FEXT) (TDT) TDR Scope 35

36 USB 3.0 Cable/Connector Compliance Test Solution Measurement Parameters Time Domain Frequency Domain Connector Z (Tdd11, Tdd22) Cable Z (Tdd11, Tdd22) Insertion Loss (Sdd21) Intra-Pair Skew (T31, T42) D+/D- Intra-Pair Skew & Propagation Delay (T31, T42) Near End Xtalk D+/D- SS Xtalk (Tdd21) Mode Conversion (Scd21) D+/D- Pair Attenuation (Sdd21) 36

37 USB 3.0 Cable/Connector Compliance Test Solution Mated Connector Impedance Host CabCon Device 2 Multiple reflections from impedance mismatches cause noise at the receiver. Therefore, the impedance profile provides an indication of multiple reflection induced noise Impedance is the most used parameter, but is an indirect measure of the signal arriving at the receiver TDR with 50 ps (20-80%) rise time Tdd11 SS USB Pair Full Simplex 2 SS USB Pair Full Simplex Tdd22 2 USB 2.0 Pair Half-Duplex PWR (1), GND (1) 37

38 USB 3.0 Cable/Connector Compliance Test Solution SS Differential Insertion Loss (Sdd21) Measure of frequency response that the differential signal sees as it propagates through the interconnect direct measure of the signal arriving at the receiver Host CabCon Device 2 SS USB Pair Full Simplex 2 Sdd21 SS USB Pair Full Simplex 2 USB 2.0 Pair Half-Duplex PWR (1), GND (1) 38

39 USB 3.0 Cable/Connector Compliance Test Solution Differential Near End Crosstalk Between SS Pairs (NEXT) Measure of coupling between the differential pairs Crosstalk can be expressed in time domain (%), or frequency domain rise time 50 ps (20-80%) Host CabCon Device 2 SS USB Pair Full Simplex 2 NEXT SS USB Pair Full Simplex 2 USB 2.0 Pair Half-Duplex PWR (1), GND (1) 39

40 USB 3.0 Cable/Connector Compliance Test Solution Differential Crosstalk Between D+/D- and SS Pairs (NEXT/FEXT) Measure of coupling between the differential pairs Crosstalk can be expressed in time domain (%), or frequency domain rise time 500 ps (10-90%) Host CabCon Device 2 NEXT SS USB Pair Full Simplex 2 SS USB Pair Full Simplex FEXT 2 USB 2.0 Pair Half-Duplex PWR (1), GND (1) 40

41 USB 3.0 Cable/Connector Compliance Test Solution Differential to Common Mode Conversion (Scd21) Common-mode current is directly responsible for EMI and Scd21 is a measure of EMI generation Main purpose of this requirement is to limit EMI emission Host CabCon Device 2 Differential Mode SS USB Pair Full Simplex 2 SS USB Pair Full Simplex 2 Common Mode USB 2.0 Pair Half-Duplex PWR (1), GND (1) 41

42 USB 3.0 Cable/Connector Compliance Test Solution Summary ENA Option TDR Cable/Connector Compliance Testing Solution is. One-box solution which provides complete characterization of high speed digital interconnects (time domain, frequency domain, eye diagram) Similar look-and-feel to traditional TDR scopes, providing simple and intuitive operation even for users unfamiliar to VNAs and S-parameters Adopted by test labs worldwide 42

43 Bandwidth Needs in High-speed Serial Standards Standard Data Rate [Gbps] Clock Frequency 3 rd Harmonic 5 th Harmonic PCI Express I XAUI SATA II Fibre Channel USB PCI Express II SATA III CEI

44 Response Resolution and Bandwidth Time domain response resolution: the ability to resolve two closely spaced responses, or a measure of how close two responses can be to each other and still be distinguished from each other. Response resolution depends upon whether it is a reflection or a transmission measurement, and the relative propagation velocity of the signal path. For responses of equal amplitude, the response resolution is equal to the step rise time. response resolution = step rise time * speed of light * velocity of propagation E5071C 20GHz 14GHz 8.5GHz 6.5GHz 4.5GHz 3GHz Rise Time (LP Step) Response Resolution Spec. Typ. Typ. min (10-90%) LP Step mode, reflection meas, in air (εr = 1) LP Step mode, reflection meas, in FR4 (εr = 4.9) 22.3 ps 31.9 ps 52.5 ps 68.6 ps 99.1 ps 149. ps 3.3 mm 4.8 mm 7.9 mm 10.3 mm 14.9 mm 22.4 mm 1.5 mm 2.2 mm 3.5 mm 4.6 mm 6.7 mm 10.1 mm [Example] Time domain response resolution for responses of equal amplitude, using 20 GHz model, reflection measurement, in FR4 (εr=4.9, vf=1/ εr=0.45) response resolution (transmission) = (22.3 ps) x (3.0e8 m/s) x (0.45) = 3.0 mm response resolution (reflection) = (22.3 ps) x (3.0e8 m/s) x (0.45) / 2 = 1.5 mm 44

45 45 Questions?