Scintillators for SwissFEL

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1 P AUL SCHERRER INSTITUT Scintillators for SwissFEL Usage of Scintillators at the SwissFEL Injector Test Facility Rasmus Ischebeck, for the PSI Diagnostics Group

2 Scintillators for SwissFEL Profile monitors for Photocathode laser Electron beam Loss monitors Beam containment Wire scanners 2

3 SwissFEL Injector Test Facility Test the generation of beams suitable for SwissFEL operation Accelerating Cavity Quadrupole Magnets Beam Position Monitor Profile Monitor 3

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5 !"#$%&%'(#!)*) J++<'*,'&*$<A+'K#/',"+'0+I+/%A' 3#?-)*AA#/B'#-+'9?,,#-4',L#'&*.-%A&!(+0&$%&1"23&,'-((%&4%&5-$%#&$5& 6(+0&)"07/ CD6'<3')"%/.+! C5E;'F+G'+-+/.H! C;=6'F+G'+-+/.H'&</+%I!"#$%&'()"*+,*-.+/ Rasmus Ischebeck: Scintillators for 01234'56'7#8+$9+/':;5; <=':5 Thomas Schietinger

6 Profile Monitor for the Photocathode Laser Tb:glass scintillator Part of the photocathode laser is reflected onto the scintillator for online monitoring Imaged onto CCD detector C. Vicario 6

7 Electron Beam Profile Monitors Usage Matching to design optics Measure transverse phase space (phase space density, emittance) Overlap electron beam with seed laser / laser heater With transverse deflecting structure: measure timeresolved parameters Bunch length Slice emittance In dispersive regions Measure energy profile Project the 6-dimensional phase space on 1 or 2 dimensions Reconstruct the phase space by numerical methods

8 Electron Beam Profile Monitors Scintillators, OTR Screens & Wire Scanners Alignment hole and calibration scale Wire scanner Installed scintillators Ce:YAG 5 µm 20 µm 200 µm Fluorescent crystal (Ce:LuAG) Ce:LuAG 200 µm OTR screen (Al-coated Si wafer) RF shield High Energy Screen Low Energy Screen F. Piffaretti 8

9 Electron Beam Profile Monitors Visual Light Optics OTR screen / scintillator is at an angle of 45º to the optical axis For overview camera (1:5.3 demagnification) Use Scheimpflug criterion to correct image plane orientation Projected pixel size: 23 µm For 1:1 imaging Perspective control lens is not available commercially Only central part (~1 2 mm) of the screen can be imaged within depth of field 9

10 Measurement at 7 MeV Electron beam behind a pepper pot (for emittance measurement) 200 µm thick Ce:YAG crystal imaged 1:1 onto CCD detector 10

11 Measurement at 130 MeV 200 pc electron beam focused by quadrupole triplet onto Ce:YAG scintillator Imaged 5.3:1 onto CCD detector 11

12 Measurement at 130 MeV Comparison to beam size measurement with optical transition radiation shows good agreement down to 60 µm rms Gauss fit to beam size; error bars represent statistical variation in 5 images each µm YAG OTR 160 Beam size / µm Focusing Quadrupole Current / A 12

13 Loss Monitors Beam containment Wire scanner readout 13

14 Loss Monitors Polystyrene scintillator fiber (1 mm 1 mm 1 m) Light detected by multi-pixel photon counter Pulse height is integrated, then digitized Work in progress: Fiber has been installed Digital readout is being commissioned 14

15 Summary Profile monitors for Photocathode laser Electron beam Loss monitors 5 µm YAG OTR Beam containment Wire scanners 15

16 Outlook 10 pc operation Use low noise CMOS camera 10 µm beam sizes Construct Scheimpflug-corrected objective Microbunching instability (COTR) Use shorter wavelength Use wire scanners Real-time data processing Use FPGAs for acquisition and on-line analysis 16

17 Outlook 10 pc operation Use low noise CMOS camera 10 µm beam sizes Construct Scheimpflug-corrected objective Microbunching instability (COTR) Use shorter wavelength Use wire scanners Real-time data processing Use FPGAs for acquisition and on-line analysis 16

18 Outlook 10 pc operation Use low noise CMOS camera 10 µm beam sizes Construct Scheimpflug-corrected objective Microbunching instability (COTR) Use shorter wavelength Use wire scanners Real-time data processing Use FPGAs for acquisition and on-line analysis Y(f) Single Sided Power Spectrum of y(t) Schematic Plot Frequency (Hz) x

19 Outlook 10 pc operation Use low noise CMOS camera 10 µm beam sizes Construct Scheimpflug-corrected objective Microbunching instability (COTR) Use shorter wavelength Use wire scanners Real-time data processing Use FPGAs for acquisition and on-line analysis 16

20 Scintillators for SwissFEL Rasmus Ischebeck, for the PSI Diagnostics Group Thank you to the Diagnostics Group & the SwissFEL Team Special thanks for slides, drawings & help with this talk Markus Baldinger, Peter Heimgartner, Goran Marinkovic, Gian Luca Orlandi, Federico Piffaretti, Thomas Schietinger, Volker Schlott, Vincent Thominet, Carlo Vicario Paul Scherrer Institut Rasmus Ischebeck SwissFEL Diagnostics Layout

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