Microcontroller and Off-Board Peripherals

Transcription

1 Digi-Spi Team

2 Functional Blocks Microcontroller and Off-Board Peripherals (Block A) Audio and GPIO (Block B) On-Board Wireless Peripherals (Block C) Power Management (Block D)

3 Microcontroller and Off-Board Peripherals SS URTS SS RA UCTS SPI CONN to SD J Parallel CONN to of f board LCD J SDO URX SCK RA5 SS RG5 AN9 AN0 AN 5 RC 6 RC 7 RC 8 RC 9 SCK 0 SDI SDO MCLR_L SS Vss 5 6 TMS 7 AN0 8 AN 9 RB5 0 RB RB SS RB RB0 5 RB6 6 RB7 7 RA9 8 RA0 9 A 0 AVss RB8 RB9 RB0 RB 5 Vss 6 7 RA 8 URTS 9 UCTS 0 AN AN AN AN5 Vss 5 6 UCTS 7 URTS 8 URX 9 UTX 50 UTX 5 URX 5 SD0 5 SDI 5 SCK 55 SDA 56 SCL 57 SCL 58 SDA 59 RA 60 RA5 6 6 RC 6 RC5 6 Vss 65 RA 66 RA5 67 RD8 68 RD9 69 RD0 70 RD 7 OC 7 RC 7 RC 7 Vss 75 RD 76 RD 77 RD 78 RD 79 RD 80 RD 8 RD5 8 RD6 8 RD7 8 core RF0 87 RF 88 RG 89 RG0 90 AN 9 AN 9 AN 9 AN5 9 CSCK 95 CSDI 96 CSDO 97 RE 98 RE 99 RE Pin TQFP dspicfj56gp70 PIC RC RC5 RD RD5 C + C 0uF RD6 RD7 C5 SDI RC RC AN9 RD RC RD RC RC5 UCTS RC C8 C7 RE RE RE RE RE RE C0 UTX OC C UTX URX C6 URTS

4 Block A FMECA Failur e No. Failure Mode Possible Causes Failure Effects Method of Detection Criticality Remarks A Inability to read / write to SD card Software, corrupt SD, micro, or damaged board Speech will not be recorded. Check SD with an external reader. Medium Medium criticality is given due to the recording of audio being the device s main function. A LCD display malfunction (blank or incorrect) Software, corrupt LCD, micro, or damaged board Current status of device will not be displayed. Observation. Low Low criticality is awarded because none of main functionality is lost A Uncharacteristic micro behavior Software, shorted bypass capacitors causing micro to operate below, corrupt micro Unpredictable behavior and loss of functionality (partial or complete) Observation Low - Medium Low - Medium criticality given because of variable functionality loss.

5 Audio and GPIO C MAX98_ 6 SHDN_L IN 5 GND BIAS OUT Vcc MAX98L C5 R.k PHONEJACK STEREO J8 PushButton_Input_Header J MAX_ IN OUT 6 GND VCC 5 IN OUT MAX687 RD RD C7 R 6800 C AN9 PHONEJACK STEREO J6 5nF OC R 6800 C 5nF

6 Block B FMECA Failur e No. Failure Mode Possible Causes Failure Effects Method of Detection Criticality Remarks B No audio output PWM software error, shorting of LPF capacitor. Inability to use PWM output for debugging purposes. Observation Low Low criticality is given because this feature is only for debugging. B Push button malfunction MAX687 no longer de-bounces switch, or mechanical failure in push button No longer able to turn on/off recording, or alter settings Observation Low Low criticality because no vital components will be damaged and recording can still occur via wireless access. B No audio input MAX98L damage, or passive component breakdown / short Inability to sample audio from on-board mic. Observation Low Low criticality is given because this feature is only for debugging.

7 On-Board Wireless Peripherals

8 Block C FMECA Failur e No. Failure Mode Possible Causes Failure Effects Method of Detection C No Wi-Fi access Software, internal Wiport damage, bypass capacitor short, or pin connection error. User loses ability to access embedded web server. Observation (trying to log into the device) Criticality Low Remarks Low criticality because device does not lose recording functionality C No Bluetooth audio streaming Software, internal BSIM damage, bypass capacitor short, or pin connection error. Failure to record audio. Observation (scope PCM output) Medium Medium criticality because devices loses ability to record audio. C No GSM access Software, internal GM86 damage, bypass capacitor short, or pin connection error. Inability to call into the device and access live audio. Observation Low Low criticality because user can find other ways to access audio. C GSM will not turn on/off or reset Software, internal damage, external BJT damage. May not be able to call, unnecessary power drain. Observation Low Low criticality because user can find other ways to access audio.

9 Power Management

10 Block D FMECA Failur e No. Failure Mode Possible Causes Failure Effects Method of Detection Criticality Remarks D V OUT = 0 V LT58 is damaged, short of peripheral capacitor, wall wart failure Device failure to function Observation, measurement of voltage Medium Medium criticality because device loses all functionality D V OUT >. V or.8 V LT58 is damaged, passive component failure (resistors), wall wart failure. Damage to major components (i.e. micro, GSM, Wiport, Bluetooth) Observation, excess heat High High criticality because of its potential to cause irreparable damage to the device D V OUT does not meet tolerance values for normal operation LT58 is damaged, passive component failure (resistors), wall wart failure, shorted bypass capacitors Unpredictable behavior from MCU and other power components Observation Medium Medium criticality due to potential loss of all device functionality