DataView Features. Input Data Formats. Current Release

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1 DataView Features Input Data Formats STDF, ATDF NI-CSV, generic CSV, others WAT (fab parameters) Open Compressed (GZip) versions of any of the above Merge data files of any of the above types Link to existing database Tester DataStream (real-time) RITdb Session Processing Reopen a saved session to restore settings and parameters Overlay a previously created Session onto new, similar data Save setup and configuration information, including: Tests of interest (hide irrelevant tests) Custom and standard DataSets (groups of records) TestSets (groups of tests) Report information, such as graphs and tables of interest All graph and table configurations Package database files for easy sharing Session Save/Restore screen, allow for selection of Session parameters Configurable Properties, customize the look/feel for every Session Processing information (Process View) Batch Information (number of records, active sites, etc.) File information (lot, processing, tester, etc.) High-level processing settings, enable automatic DataSet generation Batch Information (number of records, active sites, etc.) Processing warnings for: Quick list of failing tests Duplicate test numbers Quick list of failing tests Quick list of tests w/ alarms Tests with no limits Tests with zero standard deviation Tests with Cpk below adjustable threshold Interactive Demos for showcasing features and capabilities Report Generation (Report View) Preview report contents, quickly jump back to graph/table Organize and edit report properties before saving/printing Current Release

2 Report Formats: LS, LS PDF CSV HTML Save images as: PDF GIF JPG PNG Report Builder screen, allow for quick selection of charts, graphs Report Slideshow, iterate through each Report Item Table Reports (Table View) Order, hide, and arrange any column in any table view Multiple table views (Statistics, Values, Tests, Comparison, Analysis) Statistics Tables, configurable with any of the following: Test Info: name, number, DataSet, Limits, Units Run Parameters: total runs, passes, fails, % pass, %fail Statistics: mean, std. deviation, min, max, median, quartiles, IRQ Limit Recommendations: +/-3, 6, 9 std. deviations, Tukey limits Outlier removal information Add custom columns containing any calculation (Custom Statistic) Test Tables, allows for editing and manipulating test information Configure visible tests (Hide unwanted tests in all other views) Create new test limits, outlier limits, view limits Modify test names Group tests into TestSets Add custom Test consisting of any calculation, value, etc (Custom Test) Values Tables, display and manipulate raw test data View/compare raw test values View/group sets of values Histograms (Histo View) Multiple graph formats (Stacked, Adjacent, Expanded, and Individual) View multiple Tests and DataSets on same graph Group sets of tests into TestSets Select any grouping of DataSets, TestSets Remove/Include Outliers Drag/release to zoom in on any part of graph Select regions and view, select, or group into DataSets Overlay Box plots, CDF Curves View local table of statistics, including cumulative stats for given view

3 Set the layout of multiple graphs (tile, cascade, overlay) Adjustable scale (values, limits, std. dev, outlier/view limits) Set number of histogram bins Display details like normal curve, mean/median/sigma lines Swap Y axis and color axis details (DataSets, Tests) Configure all colors for DataSets and Tests Configure and move graph titles and details Change the size and shape of and Y axis Trend Charts (Trend View) Multiple graph formats (Stacked, Expanded, and Individual) View multiple Tests and DataSets on same graph Group sets of tests into TestSets Select any grouping of DataSets, TestSets Remove/Include Outliers Drag/release to zoom in on any part of graph Select regions and view, select, or group into DataSets View local table of statistics, including cumulative stats for given view Set the layout of multiple graphs (tile, cascade, overlay) Adjustable Y scale (values, limits, std. dev, outlier/view limits) Adjustable scale (by record, by order, by run) Display details like mean/median/sigma lines Swap Y axis and color axis details (DataSets, Tests) Configure all colors for DataSets and Tests Configure and move graph titles and details Change the size and shape of and Y axis Scatter Plots (Scatter View) Multiple graph formats (Stacked and Individual) Plot single Test or DataSet to multiple Tests and DataSets View multiple Plots on same graph Remove/Include Outliers Drag/release to zoom in on any part of graph Select regions and view, select, or group into DataSets View local table of statistics, including cumulative stats for given view Set the layout of multiple graphs (tile, cascade, overlay) Adjustable & Y scale (values, limits, std. dev, outlier/view limits) Display details like mean/median/sigma lines Display Linear Regression Statistics & References Configure all colors for DataSets and Tests Configure and move graph titles and details Change the size and shape of and Y axis Bin Paretos (Bin View)

4 View Paretos by Soft Bin, Hard Bin, First Failed Test, and Test Value Plot Pareto by DataSet (Site, Wafer, Custom) View multiple Plots on same graph Drag/release to zoom in on any part of graph Select regions and view, select, or group into DataSets View local table of Bin statistics Set the layout of multiple graphs (tile, cascade, overlay) Jump to raw data records for any bin type Bin and view Test Values by distance from mean (std. deviation) Bin and view Test Values using histogramming Configure all colors for all Bin types Configure and move graph titles and details Change the size and shape of and Y axis Wafer Maps (Bin View) View Wafer maps by Soft Bin, Hard Bin, First Failed Test, and Test Value Plot Wafer maps by DataSet (Site, Wafer, Custom) View multiple Plots/Wafers on same graph Drag/release to zoom in on any part of graph Select regions and view, select, or group into DataSets View local table of Bin statistics Set the layout of multiple graphs (tile, cascade, overlay) Overlay Test Values by distance from mean (std. deviation) Overlay Test Values using histograms Jump to raw data record for any dice View retested Dice Configure all colors for all Bin types Configure and move graph titles and details Change the size and shape of and Y axis Lot Maps (Bin View) - plot bin and test data by site vs. run and more View Lot maps by Soft Bin, Hard Bin, First Failed Test, and Test Value Plot Wafer maps by DataSet (Site, Wafer, Custom) View multiple Plots on same graph Drag/release to zoom in on any part of graph Select regions and view, select, or group into DataSets View local table of Bin statistics Set the layout of multiple graphs (tile, cascade, overlay) Overlay Test Values by distance from mean (std. deviation) Overlay Test Values using histograms Jump to raw data record for any run Configure all colors for all Bin types Configure and move graph titles and details

5 Change the size and shape of and Y axis Data Manipulation (Record View) Group data records into custom DataSets Select records by Site, Wafer, File, Fails, Retest, more Change data File parameters (file ID tags, DataSet colors) Globally remove all failing records User configurable Device Id, can be set to many different parameters Reconstruct Wafer maps from final test data Easily sort, group, and view all Bin, Wafer, Serial number data Exclude individual records Create new test limits, outlier limits, view limits Set good/bad Cpk threshold Change Test Names Select Records by Test, based on equations and value ranges Data Analysis/Comparison Quick Outlier Detection and Removal Wizard and Advanced Setup Interface for all Comparison Functions Compare DataSet to DataSet for any statistical value (mean, std. dev, Cpk, more) using the following: Difference % Difference % Difference of Limits Variation Independent T-Test Paired T-Test Linear Regression Highlight results of comparisons relative to adjustable threshold Exponential Regression Exclude extreme values (infinity, zero, etc.) Compare Test to Test for any statistical value (mean, std. dev, Cpk, more) using the following: Difference % Difference % Difference of Limits Variation Independent T-Test Paired T-Test Linear Regression Highlight results of comparisons relative to adjustable threshold Exponential Regression Exclude extreme values (infinity, zero, etc.) Compare Record to Record for value, pass/fail result, alarm status using the following: Difference % Difference % Difference of Limits Variation

6 Analyze Spec Limits and recommend Statistically-based limits Gage R & R process and analysis capabilities Add Custom Statistic, insert custom calculation into any Table Add Custom Test insert custom calculation into any Table Control Panel Allows for many different configurations and custom adjustments Undock to utilize more table/graphic real estate Consistent controls across most views, learn once/apply over and over Controls also accessible through context-sensitive popups (right-click menu) Process View

7 Demo Mode Record View

8 Create DataSet Table View, Statistic View

9 Table View, Raw Data View

10 Table View, Test Information View Bin View, Bin Paretos

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12 Bin View, Lot Maps

13 Bin View, Wafer Heat Map

14 Bin View, Wafer Variance Map

15 Histo View, Multi-Graph

16 Histo View, Stacked Graph Style

17 Histo View, CDF and Box Plots

18 Histo View, Overlay Graph Style

19 Trend View

20 Trend View, Stacked View

21 Scatter View

22 Scatter View, Multiple Independent Variables

23 Report View

24 Report View, Test Select Tab

25 Report View, Report Builder

26 Report View, Thumbnails Slide Show

27 Report Builder

28 Compare DataSets

29 Compare Tests

30 Compare Records

31 Gage R&R Wizard

32 Create Custom Statistic

33 Create Custom Test

34 Quick Screen Outliers Delete Custom Statistic or Test

35 Analyze Limits

36 Control Panel, Test Selection

37 Control Panel, DataSet Selection

38 Control Panel, Setting

39 Create Custom Spec Limits

40 Edit Device Parameters

41 Modify Test Names

42 Create TestSets License Manager

43 Properties

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