PXI Maestro Software that both accelerates wireless device test speed and reduces ATE system development time Data Sheet

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1 PXI Maestro Software that both accelerates wireless device test speed and reduces ATE system development time Data Sheet The most important thing we build is trust Highlights End-to-end ATE for multi-up non signalling mode RF test One or two transceiver channels Able to test up to 8 devices in parallel Synchronous and asynchronous (operation) Fully integrated with chipset specific device control and calibration methods RF performance verification in accordance with published radio standards Transmit and receive RF measurements for GSM, EDGE, W-CDMA, LTE, WLAN and Bluetooth TM Parallel processing of multiple measurement parameters Simple to integrate within any automated test system and software environment Support for DC source and measure unit (SMU) integration Production line operator and Test Engineering user modes Reference implementations for Qualcomm, Atheros, Quantenna and Broadcom (plus others on request) Introduction PXI Maestro extends the PXI 3000 Series RF modular platform to provide a production-ready test system with integrated device under test control and the ability to test multiple devices in parallel. PXI Maestro provides the ideal solution to accelerate test system development, reduce test time and lower the cost of test. Reducing the Cost of Test The cost of test is both a capital expense dominated by RF test equipment selection and an operating expense dominated by test system engineering overhead. Using PXI Maestro with PXI 3000 RF modular instruments reduces both. Compared to conventional solutions, the capital costs using PXI Maestro are lowered by as much as 75%. This is achieved by reducing both the cost per tester and the number of testers required for a given manufacturing throughput. Operating expenses are dramatically reduced because PXI Maestro is production ready, requiring very little integration effort irrespective of whether it is incorporated within an existing production line or new installations. Reducing Integration Complexity Production test system engineers face a constant challenge posed by the ever increasing complexity of wireless mobile devices. Developing, adapting and optimizing RF test systems can be time consuming and requires highly skilled staff with detailed knowledge of their test tools. PXI Maestro lowers test engineering complexity. It provides an optimized ATE solution out of the box, ready for testing multi-com devices. It simplifies the process of test system integration to accelerate new product introduction and help save cost.

2 PXI Maestro provides the user with a simple graphical user interface to select, generate and execute or edit test plans. While the test plan is running, all tester and device control commands are executed as an uninterrupted measurement sequence with no further user input. Measurement results are displayed as they are executed with a final test report available in a user friendly format. Facilities exist to integrate SMU control at specific points within the measurement sequence. The effort to develop and maintain test system code is radically reduced leading to much faster new product introduction cycles. Reducing Test Time Fig 2. PXI Maestro software made simple to integrate PXI Maestro uses innovative methods to reduce test time and so maximize production throughput. This is achieved by first understanding that the key to RF test system efficiency is not only raw measurement speed but more importantly optimizing test equipment utilization and managing test flow. Inefficient test system development can too often lead to high value capital assets being idle for significant periods of time between each device, between successive test steps and within each measurement step. PXI Maestro addresses all these in a variety of novel ways. Firstly, PXI Maestro includes a multi threaded intelligent sequencer designed to take full advantage of modern multi-core CPUs. This ensures different tasks within a measurement sequence or step are overlapped or executed concurrently rather than sequentially as with conventional instrumentation. Where multiple RF measurements are required for a single test condition, PXI Maestro uses it s intelligence to perform them in parallel on the same captured data and hence save time. PXI Maestro takes advantage of the benefits of PXI 3000 Series where signal acquisition and signal processing are decoupled. Data processing is performed in parallel while the hardware is busy changing states or acquiring a new event. Transferring the acquired for processing is pipelined i.e. as the event occurs. Fig 3. PXI Maestro Test Engineering User Interface example

3 Testing Devices in Parallel Fig 4. PXI Maestro Parallel Test of 4 UEs PXI Maestro makes it possible to test multiple devices in parallel with a single tester comprizing a single vector signal analyzer (VSA), a single vector signal generator (VSG) channel, an RF conditioning interface and a test system controller. PXI Maestro supports customization of the interconnection between the device or devices under test and the test resources. For multiple device testing PXI Maestro can use the Aeroflex PXI 3066 Multi-way Active RF Combiner that supports multiple device connection and parallel testing. Using the 3066 it is possible to connect to and test 4 devices in approximately the same time as required to test one. This is made possible by supporting and multiplexing of PXI resources between each DUT to maximize test efficiency. Using PXI 3066 provides PXI Maestro a range of different connection models to chose from for single or multiple device testing and synchronous or asynchronous fixture loading. In Figure 6, 3066 is used to sequentially multiplex between four transmit signals synchronously while broadcasting a common downlink signal for execution of synchronous parallel Rx sensitivity measurements across four devices. PXI Maestro can also be used with a PXI 3061 or PXI 3065A RF Combiner modules. PXI 3065A provides VSA and VSG interconnection to a DUT with a main and auxiliary antenna. PXI 3061 supports switched interconnection between VSA and VSG resources and up to 3 device antennas. This feature is exposed in PXI Maestro s WLAN test capability for 3x3 MIMO testing. For cellular device testing PXI 3061 can be used for a single antenna connection. Fig 5. PXI 3066 Multi Way RF Combiner Module An alternative approach, commonly referred to as ping pong can also be adopted when using PXI The ping pong method has the advantage of minimizing idle time for test equipment between testing successive devices. In this case while an operator loads two devices into their test fixtures another pair of devices are coincidently undergoing test. By combining the efficiencies of parallel testing as described above and benefits of ping pong described here leads to the most efficient production test flow of all. Where device handling time is equal to or less than device test time then by using the ping pong method handling time is effectively zero.

4 Figure 7 below illustrates this approach. Device handling is taking place sequentially and as each pair of device is loaded, both are tested synchronously while two other test fixtures are unloaded and reloaded with the next pair of devices. Fig 6. Switched uplink, broadcast downlink use model using PXI 3066 Fig 7. An example test flow combining ping pong with parallel test The connection model used in figure 6 can be further extended using external passive RF power combiners as illustrated in figure 8: This approach is ideal for testing multiple WLAN devices with MIMO antenna connections. In this case transmitter and receiver measurements can be made for each antenna individually or across all antennas on each device as a composite measurement. This approach reduces the number of test points within a test plan and hence further accelerates throughput in high volume production. Fig 8. Multi Up testing of MIMO devices PXI Maestro can also be used with PXI 3061 or PXI 3065A RF Combiner modules. PXI 3065A provides VSA & VSG interconnection to a DUT with a main and auxiliary antenna. PXI 3061 supports switched interconnection between VSA and VSG resources and up to 3 device antennas. This feature is exposed in PXI Maestro s WLAN test capability for 3x3 MIMO testing. For cellular device testing PXI 3061 can be used for a single antenna connection.

5 Fig 9. PXI 3065A RF Combiner Module PXI Maestro will also support integrated control of user supplied customized RF connection models. Summarizing the Benefits of Using PXI Maestro Simplifies automated test software development and maintenance and so lowers the cost of test development Improves production throughput and lowers the cost per unit tested Lowers test system capital and operating expenses by using a single tester to measure multiple devices Reduces production line test station footprint, energy costs and through life operating expense using modular instrumentation. Provides a simple software upgrade path for all compatible PXI 3000 systems PXI Maestro Software Architecture PXI Maestro comprises a number of constituent parts Fig 10. PXI Maestro software architecture Executive; a simple programming and user customizable result capture interface. The core of PXI Maestro comprizes a generic measurement sequencer to insert, edit or delete measurement groups within the test plan, organize the measurement sequence order and provide methods to execute operation and query progress. PXI Maestro Measurement Modules are a collection of optional radio standard specific measurement modules designed to optimize the speed of characterizing the RF parameters using methods in accordance with the relative conformance specification. Each measurement module is distributed separately and enabled with soft-key password on the 303x PXI RF Digitizer module. A device under test manager controls communication with the device under test. This generic interface permits control for any device type to be inserted. The DUT connection manager provides control of the RF interfacing between DUT and PXI modules.

6 Use Cases PXI Maestro can be used in any automated test application for wireless devices including design verification/regression test, pilot or routine production and high volume servicing. PXI Maestro can be used as a reference test system in R&D to assist debugging problems as new products enter manufacturing. Reference Designs PXI Maestro is supplied as standard with reference implementation models for controlling devices from Qualcomm, Quantenna and Broadcom. These reference designs can be used directly as supplied. Customizable versions of these reference designs can be made available upon request. Silicon Vendor Device Models Technologies Qualcomm Technologies Inc All devices supported by QMSL version GSM/EDGE, WCDMA, LTE (FDD) Qualcomm/Atheros All devices supporting control using NART device control inside ART2 codebases 2.x and 4.x revisions WLAN Broadcom BCM4360 WLAN ac Quantenna Communications QHS710 WLAN n

7 SPECIFICATION COMMUNICATION STANDARD OPTIONS W-CDMA UMTS UL Measurement Suite version or later 3GPP TS version ( ) LTE FDD (1) Required options Recommended options W-CDMA (1) GSM / EGPRS (1) WLAN Bluetooth (1) See below for PXI 3000 module compatibility and configuration requirements TEST COVERAGE GSM GSM measurement suite version or later 3GPP TS Required options Recommended options 3030 option 100, 200 None 3010 option 01 Frequency Bands 850 MHz 900 MHz 1800 MHz 1900 MHz Measurements 3GPP TS reference Phase/Freq error 13.1, Tx Power & burst timing 13.3, EVM & IQ offset ORFS 13.4, option 101, 201 None 3010 option 01 Frequency Bands I to XIV Measurements 3GPP TS Reference Max Output Power 5.2 Frequency Error 5.3 ILPC A-H Minimum Output Power OBW 5.8 SEM 5.9 ACLR 5.10 EVM PCDE Reference sensitivity 6.2 Max input level 6.3 LTE LTE FDD Measurement Suite version GPP TS Required options Recommended options 3030 option 107, 207 None 3010 option 01 Frequency Bands 1 to 21 and 25 Rx sensitivity , , Measurements 3GPP TS Reference Ue Max power MPR Additional MPR Minimum Output Power Freq error EVM Carrier leak In band emission in non allocated RC Spectral Flatness OBW SEM /2 ACLR Reference sensitivity 7.3 Max Input Level 7.4 Version ( ) ( ) ( )

8 CONNECTIVITY WLAN WLAN measurement suite version or later IEEE (2012) and ac Required options Recommended options Bluetooth Bluetooth measurement suite version or later Required options Recommended options 3030 option 106, 203 None 3070 option 106, option 103, 203 Add 3030 option 113 for ac 3010 option option 103, 203 Add 3070 option 113 for ac Measurements NON HT HT VHT DSSS Mbps 1 & & OFDM 11 Tx Power / Tx power on and off ramp NA Transmit Spectral Mask Spectral Flatness NA Transmit Centre Frequency Tolerance Chip / Symbol clock frequency tolerance Transmit Centre Frequency Leakage Transmit modulation accuracy / Constellation Error Receiver minimum input level sensitivity Receiver maximum input level sensitivity / / Measurements Transmit output power Power Density Transmit Output Spectrum -20 db BW Transmit Output Spectrum ACP Modulation Characteristics Initial Carrier Frequency Tolerance Carrier Frequency Drift EDR Relative Transmit Power EDR Carrier Frequency Stability & ModAcc EDR Differential Phase Encoding EDR In-band Spurious Emissions LE Ouput Power Bluetooth Test Specification v1.2/2.0/2.0+edr/2.1/2.1+edr August 2007 RF12.TS/2.1.E.1; RF20.TS/2.1.E.1; RF21.TS/2.1.E.1 Bluetooth Low Energy RF PHY Test Specification, RF-PHY.TS/4.0.0 DEC 2009 TRM/CA/01/C TRM/CA/02/C TRM/CA/05/C TRM/CA/06/C TRM/CA/07/C TRM/CA/08/C TRM/CA/09/C TRM/CA/10/C TRM/CA/11/C TRM/CA/12/C TRM/CA/13/C TRC/LE/CA/01C The above table shows the supported test clause references for IEE and ac LE In-Band Emissions TRM/LE/CA/03/C LE Modulation TRM/LE/CA/05/C Characteristics LE Carrier Frequency Offset TRM/LE/CA/06/C & Drift RCV/CA/01/C RCV/CA/02/C Receiver Sensitivity RCV/CA/07/C RCV/LE/CA/05/C

9 QUALCOMM DEVICE TUNING GSM / EDGE W-CDMA LTE Qualcomm Calibration 80-VA360-6 C Section GSM Kvco 2.1 GSM Kvco2 2.2 GSM Rx calibration 2.3 GSM carrier suppression (CS) calibration 2.4 GSM external polar TX calibration 2.5 GSM delay calibration 2.6 GSM linear Tx calibration Qualcomm Calibration W-CDMA TxLinearizer calibration 2.1 W-CDMA composite Tx/Rx vs. frequency calibration 2.4 W-CDMA IM2 calibration 2.6 Qualcomm Calibration LTE Tx Linearizer calibration VA C Section 80 VA C Section 3000 SERIES COMPATIBILITY Bandwidth (MHz) Frequency Band (GHz) GSM, UMTS, LTE WLAN Bluetooth 3020C+301x 3021C+301x 3025C+301x 3026C+301x 3050A/ C+301x 3035C+301x x 3070A A 3066 (Items marked as blue indicate the typical recommended configuration. Where 3065A or 3061 RF Combiners are selected then 3026C Signal Generator is recommended in cases where test plans include test cases for Max Rx input sensitivity. LTE composite Tx/Rx vs. frequency calibration 2.4 Dependencies The following items are required to be installed on the PC controller: Other Qualcomm Calibration Reference Section XO calibration 5.2 Thermistor cal 80-VR DC Cal PXI 3000 module drivers and required options (see ordering information) Installed radio standard measurement suite Device under test driver dll Device under test connection control dll Minimum Controller PC Requirements Operating System Windows 7/32 bit, XP CPU Memory Quad core is recommended 2 G Byte (4 G Byte recommended) Reference Device Drivers Reference implementation models are supplied as standard for: Qualcomm. Note, operation requires QMSL MSVC7R.DLL version to be installed (available from Qualcomm Technologies Inc). Broadcom BCM4360 WLAN n/ac Quantenna QHS710 WLAN n Qualcomm/Atheros NART WLAN n/ac

10 PXI MODULE CONFIGURATION RECOMMENDATION WHEN USING PXI MAESTRO VSG Selection Cellular Connectivity 3020A * * 3025 * * 3020C/3021C (1) * 3025C/3026C (1) (1,4) 3050A/3320 NA (2,3) VSA Selection Cellular Connectivity 3030A * * 3035 * * 3030C (1) * 3035C/3036C (1) (1,4) 3070A NA (5,6) * Contact Aeroflex sales Notes RF Combiner Selection Cellular Connectivity 3020A C/3021C 1. Use with 3010 or 3011 RF Synthesizer module fitted with option Requires 3050A options 03 and Add 3320 option 03 when testing IEEE ac signals with 160 MHz bandwidth 4. Not compatible for testing IEEE ac signal with 160 MHz bandwidth 5. Add 3070 option Add 3070 option 05 when testing IEEE ac signals with 160 MHz bandwidth SELECT SOFTWARE CONFIGURATION: 3030 option 100 GSM / EDGE Measurement suite 3030 option 200 GSM Test Sequencing (requires option 100) 3030 option 101 UMTS UL Measurement suite 3030 option 201 UMTS UL Test Sequencing (requires opt 101) 3030 option 107 LTE FDD Measurement suite 3030 option 207 LTE Test Sequencing (requires opt 107) 3030 option 106 Bluetooth Measurement Suite 3030/3070 opt 103 WLAN a,b,g,n Measurement suite 3030/3070 opt 113 WLAN ac Measurement suite (requires opt 103) 3030/3070 opt 203 Connectivity Test sequencing (requires opt 103 and/or opt 106) PXI MAESTRO ORDERING INFORMATION PXI Maestro core software is supplied free of charge and distributed with all PXI 3000 Series RF modules PXI Maestro is supplied together with PXI RF module drivers and other software on CD ROM or can be downloaded from the Cobham website PXI Maestro Radio standard specific sequencer functions are installed together with the respective Measurement Suite. A software enable option key is required to activate the 303x or 3070A RF Digitizer module to utilize these functions. Standard Measurement Suite PXI Maestro Test Sequencing functions GSM/EDGE 3030 opt opt 200 UMTS UL 3030 opt opt 201 LTE FDD 3030 opt opt 207 Bluetooth 3030 opt opt opt opt 203 WLAN a,b,g,n 3030 opt opt opt opt 203 WLAN ac 3030 opt opt opt opt 203 PXI Maestro measurement sequencing options can be added retrospectively as: RTROPT200/3030 RTROPT201/3030 RTROPT207/3030 RTROPT203/30x0 GSM / EDGE Test Sequencing UMTS UL Test Sequencing LTE Test Sequencing Connectivity Test Sequencing (where x is 3 for 3030 Series or 7 for 3070A)

11 Cobham Wireless - Validation Part No.46900/010, Issue 6, 03/16