European Conference on Nanoelectronics and Embedded Systems for Electric Mobility. HIL platform for EV charging and microgrid emulation
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1 European Conference on Nanoelectronics and Embedded Systems for Electric Mobility emobility emotion th September 2013, Toulouse, France HIL platform for EV charging and microgrid emulation Salvador Rodríguez, R+D Project Manager GPTECH, Spain
2 Presentation Outline HIL concept Why HIL platform? Real Time Simulation Platform MIL-SIL-HIL Integration process Applications Conclusions Market Addressed
3 HIL concept Implementing a simulation system in an embedded component/platform Provides an effective method by adding the plant under control model to the test platform The system to be tested interacts with its plant simulation Electrical model, I/O, sensors & actuators Communications protocols of real system are incorporated and tested in the simulation platform
4 Why HIL platform? Eliminates potential damages to expensive physical test benches Sets systems in extreme faulty operating conditions that are difficult, dangerous or impossible to perform with physical test benches SW simulation cannot afford some analysis in a reasonable time if detailed models are implemented, due to usually excessive inherent computing time. Peter Hank / NXP Semiconductors 4
5 Why HIL platform? Effects sometimes are very hard to reproduce in computer simulators Reduce time-to-market Reduce maintenance costs Reduce expenses Enables to prepare and validate test plans prior to their execution Peter Hank / NXP Semiconductors 5
6 Real Time Simulation Platform Rapid prototyping and testing by means of a Simulation Platform based on HIL concept Novelty architecture for this application mdsp+nfpga Fast dynamic in FPGA and Slow dynamic in DSP Possible to handle and synthetize signals such as analogue currents and voltages and PWM from a converter Easy Scaling up for larger systems Simple and cheap solution Peter Hank / NXP Semiconductors 6
7 MIL-SIL-HIL Model-In-the-Loop -> SW-In-the-Loop -> HW-In-the-Loop Integration process. MIL- Fast. Standard tools. SIL- Discretization process. Common code programming (C,.m ) HIL- Complex. Technical work requirement 7
8 MIL-SIL-HIL MIL. Model-in-the-Lop Use of already created elements in common simulation software. Simulink, PSIM Block diagram structure Power electronic elements 8
9 MIL-SIL-HIL SIL- Software-in-the-Loop Including compiled production software code into a simulation model System simulation through equations Discretization process Key aspects Code generated verification Faster simulation than MIL Relevant step for the HIL implementation 9
10 MIL-SIL-HIL HIL. Hardware-in-the-Lop Use of MIL&SIL developments DSP: C code programming FGPA: VHDL programming Interaction with physical communications and HW elements Model differential equations synchronization 10
11 Integration process Communications Ethernet & CAN protocols PWM gate signals DAC & ADC conversion Analog signals. Measurement Digital signals. Contactors. HMI Interaction with the platform Monitoring Management 11
12 Integration process Assembly Control and simulation HW integration Communications among all elements HMI 12
13 Applications Automotive. PMSM motor and battery simulation platform X-by-wire system modeled and simulated Steering by wire Throttle by wire Brake by wire 13
14 Applications Automotive. Energy Management System validation V2G functionality assessment Battery, charger, load and grid dynamic modeled CAN bus communication protocol integrated to connect all systems 14
15 Applications Microgrid 15
16 Conclusions The time needed to complete a simulation in the real-time platform is much lower than in the MIL simulations. A high number of modules can be simulated at the same time. Impossible in the MIL models due to the computational resources limitation. The implementation provides the possibility of working with real communication protocols such well as sensors. Method to test HW control in real-time and its interaction with several devices Peter Hank / NXP Semiconductors 16
17 Market Addressed Battery Management system tester Battery manufacturers Energy Management system tester Computing platform to evaluate grid energy quality Different effects can cause serious damages to industrial and domestic devices when multiple distributed generators (wind power, storage systems, power converter) are connected to high impedance-weak grids. Voltage dips, harmonic loads, equivalent line impedance changes, phase unbalance, resonance Necessary to observe and evaluate those effects to foresee any damage when a new generator is connected. This study represents an improvement to not only large consumers as industrial companies but also power companies Peter Hank / NXP Semiconductors 17
18 Market Addressed Peter Hank / NXP Semiconductors 18
19 European Conference on Nanoelectronics and Embedded Systems for Electric Mobility emobility emotion th September 2013, Toulouse, France THANK YOU FOR YOU ATTENTION Salvador Rodríguez, R+D Project Manager (+34) GPTECH, Spain
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