Measuring Microfeatures with Dense Point Clouds

Size: px
Start display at page:

Download "Measuring Microfeatures with Dense Point Clouds"

Transcription

1 Measuring Microfeatures with Dense Point Clouds Scanning with tomography, microprobes and confocal or contrast variation systems Dr.-Ing. Ingomar Schmidt

2 Microfeature Geometries smaller than 300 µm, which cannot be reached by standard probes Part tolerances between 1 µm 20 µm Independent of workpiece size

3 Measure Microfeatures No difference in the possibilities compared to standard geometries (with the right sensor ) Dimensions Position Form / Shape Roughness

4 Measure Microfeatures Standard sensors do not deliver enough point density, because feature form in relation to dimension is almost always worse.

5 Measure Microfeatures Solution: Create dense point clouds by using the right sensor technology

6 Measuring Point Clouds VT-A _E

7 Color coded Presentation VT-A _E

8 The Microfeature CMM Werth VideoCheck UA 400x400 -Highest precision and accuracy for measurements on MICROPARTS due to one nanometer resolution and accuracy optimized design - MPE E1 (unid./20x) : ( L /900) µm - MPE E (3D WFP) : ( L /600) µm

9 Werth VideoCheck UA 400x400 Multisensor Head High precision, telecentric optics Werth Fiber Probe WFP Highly accurate distance sensor Werth Chromatic Focus Probe (CFP) VT-A _E

10 Multisensor IP in Picture K IP at Picture IP Scanning Grid Scanning Trigger Probe Scanning Probe Z O Z Focus Variation Laser Line Probe Chromatic Focus Probe Computer Tomography Nano Focus Probe Werth Laser Probe Werth Interferometer Probe Werth Contour Probe Werth Fiber Probe VT-A _E

11 Multisensor K Z O Z Focus Variation Computer Tomography Nano Focus Probe Werth Interferometer Probe Werth Fiber Probe VT-A _E

12 3D-Patch Focus Variation Z2 Z0 Z1 VT-A _E

13 3D-Patch Micro Form Punch

14 Nano Focus Probe - Principle Z2 Z0 Z1 VT-A _E

15 Confocal Scanning of a Micro Form Punch with NFP

16 Werth Fiber Probe WFP (Pat.) Principle Ball Size down to 10µm Radius Sensor Chip Probe in Zero Probe deflected Probing Element DL Moving Direction Workpiece Developed in cooperation with PTB Braunschweig, Germany VT-A _E

17 Scanning of Micro-gears with WFP

18 Tooth Implant Measured by WFP Scanning

19 Werth 3D Fiberprobe WFP Principle Sensor Chip z- deflection, measured with distance sensor Distance sensor x-/y- deflection, measured with image processing sensor Fiber Probe in zero position Fiber Probe Spring leaf suspension Fiber Probe deflected DL Workpiece Direction of movement

20 Werth 3D Fiberprobe WFP Design

21 Error in mm Werth 3D Fiber Probe WFP Results 3D probing deviation: 0,15 µm* Error on a calibration sphere 0,15 0, ,075-0, position * measured on a reference sphere with VideoCheck UA and 3D correction of probing sphere form error

22 Werth Interferometer Probe WIP

23 Werth Interferometer Probe WIP Fiber Carrier Beam Former Unit µm 23

24 Werth Interferometer Probe WIP Technical Data Sensor principle: interferometry Working distance: mm Measuring range: ± 150 μm Probe diameter: mm Probe length: mm 0 up to 90 beam direction Probing error MPE for P1: 0.25 μm

25 X-Ray Tomography VT-A _E

26 The Microfeature CT - CMM Werth TomoCheck Computer Tomography integrated in a Multisensor Coordinate Measuring Machine

27 Measurement of an Injector Nozzle with the Werth TomoScope Tomography result VT-A _E

28 Measurement of an Injector Nozzle with the Werth TomoScope Results can be displayed either color coded

29 Measurement of an Injector Nozzle with the Werth TomoScope as values which can be measured in defined areas. This Example shows how to measure the diameter devolution

30 SOFTWARE

31 WinWerth 3D CAD Module Online and Offline 3D CAD- Online Control of the machine with CAD-data Selection of an element CNC measuring process is calculated automatically Support of all sensors Measuring points can be defined on patches, curves, and points 3D CAD- Offline - Programming without machine The measuring process is shown in the graphic VT-A _E

32 WinWerth 3D BestFit color coded presentation of deviations VT-A _E

33 Result Output Numerical Output 3D Nominal / Actual Comparison 2D Nominal / Actual Comparison Formplot Meßprotokoll Bericht Nr. : Messung in Tiefe : Seite 4 90 Kreisformabweichung 0-1,0 0,0 1,0 2,0 3,0-6,0-5,0-4,0-3,0-2,0-10,0-9,0-8,0-7,0-15,0-14,0-13,0-12,0-11,0-20,0-19,0-18,0-17,0-16, Kreisformabweichung 3,0 2,0 1,0 0,0-1, ,0-3,0-4,0 Graphical Presentation Roughness Plot First Article Inspection Report Statistics VT-A _E

34 The integration of scanning sensors for dense point clouds in Multisensor CMM s opens new horizons in the metrology field. For more information see

35 Questions?

Coordinate Measuring Machines with Computed Tomography

Coordinate Measuring Machines with Computed Tomography Always a Step Ahead with Quality Coordinate Measuring Machines with Computed Tomography Multisensor Coordinate Measuring Machines with Computed Tomography Computed Tomography in Coordinate Measuring Machines

More information

EMRP JRP IND62 TIM: Use of on-board metrology systems for area-scanning on machine tools

EMRP JRP IND62 TIM: Use of on-board metrology systems for area-scanning on machine tools EMRP JRP IND62 TIM: Use of on-board metrology systems for area-scanning on machine tools Author: Co-authors: doc. Ing. Vít Zelený, CSc. doc. Ing. Ivana Linkeová, Ph.D. Ing. Jakub Sýkora Pavel Skalník Jaromír

More information

View in Several Directions

View in Several Directions Multi-Sensor Machine Allows Two Measurements in One Setup View in Several Directions Measuring injection molded parts from the top and from the side in one setup has been impossible for medical device

More information

Sensor based adaptive laser micromachining using ultrashort pulse lasers for zero-failure manufacturing

Sensor based adaptive laser micromachining using ultrashort pulse lasers for zero-failure manufacturing Sensor based adaptive laser micromachining using ultrashort pulse lasers for zero-failure manufacturing Fraunhofer Institute for Production Technology, Aachen M. Sc. Guilherme Mallmann Prof. Dr.-Ing. Robert

More information

Industrial Metrology. Multisensor Measuring Machines O-INSPECT 322/442

Industrial Metrology. Multisensor Measuring Machines O-INSPECT 322/442 Industrial Metrology Multisensor Measuring Machines O-INSPECT 322/442 The moment the answer is right in front of your eyes. This is the moment we work for. // Certainty Made By Zeiss 2 Table of Contents

More information

Computed Tomography & 3D Metrology Application of the VDI/VDE Directive 2630 and Optimization of the CT system

Computed Tomography & 3D Metrology Application of the VDI/VDE Directive 2630 and Optimization of the CT system Computed Tomography & 3D Metrology Application of the VDI/VDE Directive 2630 and Optimization of the CT system ECNDT 2014 Prague October 6-10, 2014 Dr. Eberhard Neuser Dr. Alexander Suppes Imagination

More information

ASSESSMENT OF MEASUREMENT UNCERTAINTY CAUSED IN THE PREPARATION OF MEASUREMENTS USING COMPUTED TOMOGRAPHY

ASSESSMENT OF MEASUREMENT UNCERTAINTY CAUSED IN THE PREPARATION OF MEASUREMENTS USING COMPUTED TOMOGRAPHY XIX IMEKO World Congress Fundamental and Applied Metrology September 6 11, 2009, Lisbon, Portugal ASSESSMENT OF MEASUREMENT UNCERTAINTY CAUSED IN THE PREPARATION OF MEASUREMENTS USING COMPUTED TOMOGRAPHY

More information

VISION MEASURING SYSTEMS

VISION MEASURING SYSTEMS VISION MEASURING SYSTEMS Introducing Mitutoyo s full line of Vision Measuring Equipment. VISION MEASURING SYSTEMS Quick Scope Manual Vision Measuring System Manual XYZ measurement. 0.1 µm resolution glass

More information

Multi-sensor measuring technology. O-INSPECT The best of optical and contact measuring technology for true 3D measurements.

Multi-sensor measuring technology. O-INSPECT The best of optical and contact measuring technology for true 3D measurements. Multi-sensor measuring technology O-INSPECT The best of optical and contact measuring technology for true 3D measurements. 2 // multifunctionality made BY CarL Zeiss The moment you realize that new requirements

More information

IND62 TIM CALIBRATION OF FREE-FORM STANDARD AND THEIR APPLICATIONS FOR IN-PROCESS MEASUREMENT ON MACHINE TOOLS

IND62 TIM CALIBRATION OF FREE-FORM STANDARD AND THEIR APPLICATIONS FOR IN-PROCESS MEASUREMENT ON MACHINE TOOLS IND62 TIM CALIBRATION OF FREE-FORM STANDARD AND THEIR APPLICATIONS FOR IN-PROCESS MEASUREMENT ON MACHINE TOOLS VÍT ZELENÝ, IVANA LINKEOVÁ, PAVEL SKALNÍK (LENGTH MEASUREMENT DEPARTMENT) 5th November 2014

More information

Quality Digest Magazine 1 of 10 DLP-Based Projected Fringe Measuring Technology This technology eases the burden of optical 3-D digitization and coordinate measurement of parts. by M. Kaestner, G. Frankowski,

More information

Calypso the Easy Way to Create Part Programs

Calypso the Easy Way to Create Part Programs Industrial Measuring Technology from Carl Zeiss Calypso the Easy Way to Create Part Programs We make it visible. Philosophy Visual Metrology TM CAD model feature characteristics Elements are selected to

More information

Fiber Probe with Interferometric Z-Measurement

Fiber Probe with Interferometric Z-Measurement Fiber Probe with Interferometric Z-Measurement Sabine Linz, Alexander Schöch, Carlo Bach, Andreas Ettemeyer, Buchs, Switzerland, Benjamin Hopp, Matthias Andräs, Giessen Abstract Increasing manufacturing

More information

Image Measuring Instrument

Image Measuring Instrument EASY QUICK ACCURATE SAVE Time & Cost Improved efficiency & accuracy L26 All new Image Measuring Instrument Top Series come with new innovative design in structural quality, functionality, and accuracy,

More information

HIGH RESOLUTION COMPUTED TOMOGRAPHY FOR METROLOGY

HIGH RESOLUTION COMPUTED TOMOGRAPHY FOR METROLOGY HIGH RESOLUTION COMPUTED TOMOGRAPHY FOR METROLOGY David K. Lehmann 1, Kathleen Brockdorf 1 and Dirk Neuber 2 1 phoenix x-ray Systems + Services Inc. St. Petersburg, FL, USA 2 phoenix x-ray Systems + Services

More information

New Approach in Non- Contact 3D Free Form Scanning

New Approach in Non- Contact 3D Free Form Scanning New Approach in Non- Contact 3D Free Form Scanning Contents Abstract Industry Trends The solution A smart laser scanning system Implementation of the laser scanning probe in parts inspection Conclusion

More information

m&h 3D FORM INSPECT SOFTWARE

m&h 3D FORM INSPECT SOFTWARE m&h 3D FORM INSPECT SOFTWARE MEASURING AND REPORTING ON THE MACHINE TOOL PRODUCT BROCHURE 2 HEXAGON MANUFACTURING INTELLIGENCE HexagonMI.com mh-inprocess.com 3D FORM INSPECT SOFTWARE THE ORIGINAL SINCE

More information

INSPECTION OF MACHINED PARTS FROM CAD MODEL USING 3D PROFILOMETRY

INSPECTION OF MACHINED PARTS FROM CAD MODEL USING 3D PROFILOMETRY INSPECTION OF MACHINED PARTS FROM CAD MODEL USING 3D PROFILOMETRY Prepared by Duanjie Li, PhD, Erik Steinholt and Jeronimo Silva 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com

More information

INDUSTRIAL PHOTOGRAMMETRY FOR APPLICATIONS IN AUTOMOTIVE AND AEROSPACE INDUSTRY

INDUSTRIAL PHOTOGRAMMETRY FOR APPLICATIONS IN AUTOMOTIVE AND AEROSPACE INDUSTRY INDUSTRIAL PHOTOGRAMMETRY FOR APPLICATIONS IN AUTOMOTIVE AND AEROSPACE INDUSTRY 56th Photogrammetric Week 1 INDUSTRIAL PHOTOGRAMMETRY FOR APPLICATIONS IN AUTOMOTIVE AND AEROSPACE INDUSTRY Werner Bösemann

More information

Micro coordinate measuring machine for parallel measurement of microstructures

Micro coordinate measuring machine for parallel measurement of microstructures Micro coordinate measuring machine for parallel measurement of microstructures Christian Schrader 1*, Christian Herbst 1, Rainer Tutsch 1, Stephanus Büttgenbach 2, Thomas Krah 2 1 TU Braunschweig, Institute

More information

Complete 3D measurement solution

Complete 3D measurement solution Complete 3D measurement solution Complete access The S neox Five Axis 3D optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S neox

More information

Optiv The multitalented system for industrial metrology. 3D multi-sensor metrology

Optiv The multitalented system for industrial metrology. 3D multi-sensor metrology Optiv The multitalented system for industrial metrology 3D multi-sensor metrology A new perspective. The Optiv multi-sensor brand from Hexagon Metrology opens countless opportunities for you in the quality

More information

OPTIV. The multitalented system for industrial metrology PRODUCT BROCHURE. S.A.S 3D Spark Private Limited

OPTIV. The multitalented system for industrial metrology PRODUCT BROCHURE. S.A.S 3D Spark Private Limited PRODUCT BROCHURE OPTIV The multitalented system for industrial metrology Sold & Serviced by: S.A.S 3D Spark Private Limited #328, Third Main Road Domlur Layout BENGALURU - 560071 Ph:+91-9008006149 E-Mail:

More information

Multisensor Coordinate Measuring Machines ZEISS O-INSPECT

Multisensor Coordinate Measuring Machines ZEISS O-INSPECT Multisensor Coordinate Measuring Machines ZEISS O-INSPECT Having all the necessary options for reliable measurements. ZEISS O-INSPECT // RELIABILITY MADE BY ZEISS 2 The O-INSPECT multisensor measuring

More information

Comparision of contact and contactless measuring methods for form evaluation

Comparision of contact and contactless measuring methods for form evaluation Available online at www.sciencedirect.com Procedia Engineering 48 (2012 ) 273 279 MMaMS 2012 Comparision of contact and contactless measuring methods for form evaluation Peter Ka uch a, Miroslav Dovica

More information

Renishaw touch-trigger probing technology. Rugged and flexible solutions for discrete point measurement on CMMs

Renishaw touch-trigger probing technology. Rugged and flexible solutions for discrete point measurement on CMMs Renishaw touch-trigger probing technology Rugged and flexible solutions for discrete point measurement on CMMs Touch-trigger probe technologies Resistive Simple Compact Rugged Strain-gauge Solid-state

More information

Wieblinger Weg 92a, Heidelberg, Germany, Phone: , Fax: ;

Wieblinger Weg 92a, Heidelberg, Germany, Phone: , Fax: ; HOW INDUSTRIAL COMPUTER TOMOGRAPHY ACCELERATES PRODUCT DEVELOPMENT IN THE LIGHT METAL CASTING AND INJECTION MOULDING INDUSTRY. Christof REINHART 1, Christoph POLIWODA 1, Thomas GÜNTHER 1 1 Volume Graphics

More information

MULTIPLE-SENSOR INTEGRATION FOR EFFICIENT REVERSE ENGINEERING OF GEOMETRY

MULTIPLE-SENSOR INTEGRATION FOR EFFICIENT REVERSE ENGINEERING OF GEOMETRY Proceedings of the 11 th International Conference on Manufacturing Research (ICMR2013) MULTIPLE-SENSOR INTEGRATION FOR EFFICIENT REVERSE ENGINEERING OF GEOMETRY Feng Li, Andrew Longstaff, Simon Fletcher,

More information

Ch 22 Inspection Technologies

Ch 22 Inspection Technologies Ch 22 Inspection Technologies Sections: 1. Inspection Metrology 2. Contact vs. Noncontact Inspection Techniques 3. Conventional Measuring and Gaging Techniques 4. Coordinate Measuring Machines 5. Surface

More information

EMPIR Grant Agreement 14IND07 3D Stack

EMPIR Grant Agreement 14IND07 3D Stack EMPIR Grant Agreement 14IND07 3D Stack Good Practice Guide: Recommendations on the strategy for measuring the dimensional properties of TSVs based on Confocal microscopy, IR interferometry and optical

More information

Experimental accuracy assessment of different measuring sensors on workpieces with varying properties

Experimental accuracy assessment of different measuring sensors on workpieces with varying properties Experimental accuracy assessment of different measuring sensors on workpieces with varying properties Rauf Oezden 1,*, Metin Aclan 1 and Saliba Danho 2 1 Technical University of Cluj-Napoca, Ph.D. Stud.,

More information

The measuring software of the 4 th generation

The measuring software of the 4 th generation The measuring software of the 4 th generation METROSOFT QUARTIS YOU DECIDE THE PROGRAM Significant measurement results - fast and easy! With Metrosoft QUARTIS, WENZEL Metromec introduces a new software

More information

INSPECTION OF FREE FORM SURFACES

INSPECTION OF FREE FORM SURFACES 7 th INTERNATIONAL MULTIDISCIPLINARY CONFERENCE Baia Mare, Romania, May 17-18, 2007 ISSN-1224-3264 INSPECTION OF FREE FORM SURFACES Prof. Ing. Dr. Jozef Peterka Ing. Ladislav Morovič - Ing. Peter Pokorný,

More information

MCT225 HA Metrology CT

MCT225 HA Metrology CT MCT225 HA Metrology CT Absolute accuracy for inside metrology nikon metrology I vision beyond precision Today, manufacturers are seeking to reduce time-to-market, despite a greater variety of products

More information

UULA FOCALSPEC 3D LINE CONFOCAL SCANNER DID THEY TELL YOU THAT NO-ONE CAN MEASURE IT? WE CAN.

UULA FOCALSPEC 3D LINE CONFOCAL SCANNER DID THEY TELL YOU THAT NO-ONE CAN MEASURE IT? WE CAN. FocalSpec builds optical sensors to measure and inspect the quality of the advanced materials and devices in use today and currently in development for the future. Our sensors combine 3D topography, 3D

More information

Innovations in touch-trigger probe sensor technology

Innovations in touch-trigger probe sensor technology White paper Innovations in touch-trigger probe sensor technology Abstract Since the invention of the touch-trigger probe in the 1970s, these devices have formed the main means of sensing for dimensional

More information

PowerINSPECT. Measuring and Evaluation Software. Messtechnik

PowerINSPECT. Measuring and Evaluation Software. Messtechnik Measuring and Evaluation Software Messtechnik Universal 3D measuring and evaluation software Fields of Application Hardware independent for manual and CNC-controlled machines PowerINSPECT The User-Friendly

More information

Comparison of Probing Error in Dimensional Measurement by Means of 3D Computed Tomography with Circular and Helical Sampling

Comparison of Probing Error in Dimensional Measurement by Means of 3D Computed Tomography with Circular and Helical Sampling nd International Symposium on NDT in Aerospace - We..A. Comparison of Probing Error in Dimensional Measurement by Means of D Computed Tomography with Circular and Helical Sampling Jochen HILLER, Stefan

More information

Length, Germany, PTB (Physikalisch-Technische Bundesanstalt)

Length, Germany, PTB (Physikalisch-Technische Bundesanstalt) Laser radiations Laser radiations Laser radiations Laser radiations Length Length Frequency stabilized laser (He- Ne): vacuum wavelength Frequency stabilized laser (He- Ne): absolute frequency Frequency

More information

Multisensor Coordinate Measuring Machines ZEISS O-INSPECT

Multisensor Coordinate Measuring Machines ZEISS O-INSPECT Multisensor Coordinate Measuring Machines ZEISS O-INSPECT Having all the necessary options for reliable measurements. ZEISS O-INSPECT // RELIABILITY MADE BY ZEISS 2 The O-INSPECT multisensor measuring

More information

TECHNICAL DATA OPTIV PERFORMANCE 663/664 DUAL Z

TECHNICAL DATA OPTIV PERFORMANCE 663/664 DUAL Z OPTIV PERFORMANCE 663/664 DUAL Z Product description The Optiv Performance 663 / 664 Dual Z combines optical and tactile measurement in one system. The system supports multi-sensor measurements using the

More information

A RADIAL WHITE LIGHT INTERFEROMETER FOR MEASUREMENT OF CYLINDRICAL GEOMETRIES

A RADIAL WHITE LIGHT INTERFEROMETER FOR MEASUREMENT OF CYLINDRICAL GEOMETRIES A RADIAL WHITE LIGHT INTERFEROMETER FOR MEASUREMENT OF CYLINDRICAL GEOMETRIES Andre R. Sousa 1 ; Armando Albertazzi 2 ; Alex Dal Pont 3 CEFET/SC Federal Center for Technological Education of Sta. Catarina

More information

SENSOR GUIDED MICRO ASSEMBLY BY USING LASER-SCANNING TECHNOLOGY

SENSOR GUIDED MICRO ASSEMBLY BY USING LASER-SCANNING TECHNOLOGY SENSOR GUIDED MICRO ASSEMBLY BY USING LASER-SCANNING TECHNOLOGY Sven Rathmann, Jan Wrege, Kerstin Schottler, Annika Raatz and Jiirgen Hesselbach Institute of Machine Tools and Production Technology (IWV,

More information

PCMM System Specifications Leica Absolute Tracker and Leica T-Products

PCMM System Specifications Leica Absolute Tracker and Leica T-Products www.leica-geosystems.com/metrology PCMM System Specifications Leica Absolute Tracker and Leica T-Products Leica Absolute Tracker accuracy The measurement uncertainty of a coordinate U xyz is defined as

More information

PCMM System Specifications Leica Absolute Tracker and Leica T-Products

PCMM System Specifications Leica Absolute Tracker and Leica T-Products www.leica-geosystems.com/metrology PCMM System Specifications Leica Absolute Tracker and Leica T-Products Leica Absolute Tracker accuracy Feature Benefit The measurement uncertainty of a coordinate U xyz

More information

MEMS SENSOR FOR MEMS METROLOGY

MEMS SENSOR FOR MEMS METROLOGY MEMS SENSOR FOR MEMS METROLOGY IAB Presentation Byungki Kim, H Ali Razavi, F. Levent Degertekin, Thomas R. Kurfess 9/24/24 OUTLINE INTRODUCTION Motivation Contact/Noncontact measurement Optical interferometer

More information

1. Motivation 2. Nanopositioning and Nanomeasuring Machine 3. Multi-Sensor Approach 4. Conclusion and Outlook

1. Motivation 2. Nanopositioning and Nanomeasuring Machine 3. Multi-Sensor Approach 4. Conclusion and Outlook Prospects of multi-sensor technology for large-area applications in micro- and nanometrology 08/21/2011-08/25/2011, National Harbor E. Manske 1, G. Jäger 1, T. Hausotte 2 1 Ilmenau University of Technology,

More information

Optical 3D measurements capture the entire surface with nanometer precision

Optical 3D measurements capture the entire surface with nanometer precision Optical 3D measurements capture the entire surface with nanometer precision Traceability of any structure to the gold standard of stylus profilometers as used by Germany s National Metrology Institute

More information

Marsurf Marsurf ud 120 / Marsurf Ld 120. combined contour and roughness measurements

Marsurf Marsurf ud 120 / Marsurf Ld 120. combined contour and roughness measurements - + Marsurf Marsurf ud 120 / Marsurf Ld 120 combined contour and roughness measurements - 2 MarSurf. Surface Metrology MarSurf UD 120 / LD 120. Two in One THE UNIVERSAL CONTOUR AND SURFACE MEASURING SYSTEM

More information

UNIT IV - Laser and advances in Metrology 2 MARKS

UNIT IV - Laser and advances in Metrology 2 MARKS UNIT IV - Laser and advances in Metrology 2 MARKS 81. What is interferometer? Interferometer is optical instruments used for measuring flatness and determining the lengths of slip gauges by direct reference

More information

The new generation of industrial computed tomography. The Desktop CT exact S

The new generation of industrial computed tomography. The Desktop CT exact S The new generation of industrial computed tomography The Desktop CT S Volume scanning technology Innovation with a family tradition Founded in 1968, the family-owned, WEN- ZEL Metrology Group is one of

More information

Length, United States, NIST (National Institute of Standards and Technology)

Length, United States, NIST (National Institute of Standards and Technology) Calibration or s Laser radiations Other stabilized laser: vacuum wavelength Optical beat frequency 633 633 4E-10 2 95% Yes 1 Length instruments Laser system: error of indicated L Comparison to master length

More information

quality news Carl Zeiss Updated Software

quality news Carl Zeiss Updated Software quality news Carl Zeiss Updated Software S P E E D S G E A R M E A S U R E M E N T Carl Zeiss has updated its Gear Pro software to include the ability to calculate a gear s mass and moment of inertia after

More information

HP-L-8.9 LASER SCANNER

HP-L-8.9 LASER SCANNER PRODUCT BROCHURE HP-L-8.9 LASER SCANNER Cost-effective laser scanning for the ROMER Absolute Arm 2 HP-L-8.9 LASER SCANNER HIGHLIGHTS MAKING LASER SCANNING ACCESSIBLE TO ALL The HP-L-8.9 is an affordable

More information

[Type text] [Type text] [Type text] GearPro Procedure

[Type text] [Type text] [Type text] GearPro Procedure GearPro Procedure Pictured below is the GearPro main screen. In this manual the icons on the top right corner (Chapter 1), far left side (Chapters 2-5), and far right side (Chapters 6&7) will be discussed.

More information

MarSurf. The new generation of contour measurement systems MarSurf XC 20 MarSurf XC 2

MarSurf. The new generation of contour measurement systems MarSurf XC 20 MarSurf XC 2 MarSurf The new generation of contour measurement systems MarSurf XC 20 MarSurf XC 2 The new generation of contour measurement systems Ladies and Gentlemen, There is an increasing need in industrial production

More information

Optiv Classic 321 GL tp Technical Data

Optiv Classic 321 GL tp Technical Data Optiv Classic 321 GL tp Technical Data Version 07/2011 3D multi-sensor metrology www.optiv.net Product description Fields of application Design Measuring range (X x Y x Z) (1) Vision sensor < > Touch-trigger

More information

TECHNICAL DATA OPTIV PERFORMANCE 443 DUAL Z

TECHNICAL DATA OPTIV PERFORMANCE 443 DUAL Z OPTIV PERFORMANCE 443 DUAL Z Product description The Optiv Performance 443 Dual Z combines optical and tactile measurement in one system. The system supports multi-sensor measurements using the Vision-Sensor,

More information

Industrial Measuring Technology from Carl Zeiss. `lkqro^ `lkqro^ do=oap do=^hqfs

Industrial Measuring Technology from Carl Zeiss. `lkqro^ `lkqro^ do=oap do=^hqfs Industrial Measuring Technology from Carl Zeiss `lkqro^ `lkqro^ do=oap do=^hqfs lîéêîáéï fåíêççìåáåö=íüé=åéñí=öéåéê~íáçå ëå~ååáåö=éä~íñçêãk `lkqro^=do=oap=~åç=`lkqro^=do=^hqfsw=qüé=`jj=íü~í=äêçìöüí ^ÅíáîÉ=pÅ~ååáåÖ=íç=ëã~ää=~åÇ=ãáÇëáòÉ=ã~åìÑ~ÅíìêÉêë=Ü~ë=ÄÉÉå=êÉÇÉëáÖåÉÇ

More information

Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing. SEMATECH Workshop on 3D Interconnect Metrology

Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing. SEMATECH Workshop on 3D Interconnect Metrology Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing SEMATECH Workshop on 3D Interconnect Metrology Chris Lee July 11, 2012 Outline Introduction Motivation For New Metrology

More information

Advantages of 3D Optical Profiling Over Other Measurement Technologies

Advantages of 3D Optical Profiling Over Other Measurement Technologies Horizontal milling Ra (6.35 μm, 250 uin.) Vertical milling Ra (1.6 μm, 63 uin.) Flat lapping Ra (0.2 μm, 8 uin.) Application Note #558 Correlating Advanced 3D Optical Profiling Surface Measurements to

More information

Metrology and Sensing

Metrology and Sensing Metrology and Sensing Lecture 4: Fringe projection 2016-11-08 Herbert Gross Winter term 2016 www.iap.uni-jena.de 2 Preliminary Schedule No Date Subject Detailed Content 1 18.10. Introduction Introduction,

More information

3D FORM MEASURING INSTRUMENT

3D FORM MEASURING INSTRUMENT POINT AUTOFOCUS PROBE 3D FORM MEASURING INSTRUMENT FOR THE TOPOGRAPHY MEASUREMENT OF A LARGE RANGE OF SURFACES Point autofocus measurement exceed the capability of conventional non-co MLP-3 offers all-round

More information

OUT OF MACHINE CALIBRATION TECHNIQUE FOR ANALOG PROBES

OUT OF MACHINE CALIBRATION TECHNIQUE FOR ANALOG PROBES XVIII IMEKO WORLD CONGRESS Metrology for a Sustainable Development September, 17 22, 2006, Rio de Janeiro, Brazil OUT OF MACHINE CALIBRATION TECHNIQUE FOR ANALOG PROBES J.J. Aguilar 1, J.A. Yagüe 1, J.A.

More information

Length, Singapore, NMC, A*STAR (National Metrology Centre, Agency for Science, Technology and Research)

Length, Singapore, NMC, A*STAR (National Metrology Centre, Agency for Science, Technology and Research) Calibration or m 633 633 nm 0.5 MHz 2 95% No LS/L/001 633 633 nm 0.016 fm 2 95% No LS/L/003 474 474 THz 12 khz 2 95% No LS/L/003 543 633 nm 0.0016 fm 2 95% No LS/L/003 553 474 THz 1.2 khz 2 95% No LS/L/003

More information

FOCALSPEC 3D LINE CONFOCAL SCANNER UULA DID THEY TELL YOU THAT NO-ONE CAN MEASURE IT? WE CAN.

FOCALSPEC 3D LINE CONFOCAL SCANNER UULA DID THEY TELL YOU THAT NO-ONE CAN MEASURE IT? WE CAN. FOCALSPEC 3D LINE CONFOCAL SCANNER UULA DID THEY TELL YOU THAT NO-ONE CAN MEASURE IT? WE CAN. FocalSpec 3D Line Confocal Scanner UULA UULA is an automated optical 3D imaging and metrology system for sub-micron

More information

Thickness of the standard piece: 10 mm The most important calibration data are engraved in the side face of the specimen.

Thickness of the standard piece: 10 mm The most important calibration data are engraved in the side face of the specimen. Rk standard The surface of this standard is made up of turned grooves (average curve radius approx. 150 mm). The surface consists of a hardened nickel coating (> 900HV1) on a base body made from brass.

More information

COMPARISON OF ERROR MAPPING TECHNIQUES FOR COORDINATE MEASURING MACHINES USING THE PLATE METHOD AND LASER TRACER TECHNIQUE

COMPARISON OF ERROR MAPPING TECHNIQUES FOR COORDINATE MEASURING MACHINES USING THE PLATE METHOD AND LASER TRACER TECHNIQUE I IMEKO World Congress Fundamental and Applied Metrology September 6, 9, Lisbon, Portugal COMPARISON OF ERROR MAPPING TECHNIQUES FOR COORDINATE MEASURING MACHINES USING THE PLATE METHOD AND LASER TRACER

More information

The Virtual CMM a software tool for uncertainty evaluation practical application in an accredited calibration lab

The Virtual CMM a software tool for uncertainty evaluation practical application in an accredited calibration lab The Virtual CMM a software tool for uncertainty evaluation practical application in an accredited calibration lab Michael Trenk *, Matthias Franke **, Dr. Heinrich Schwenke ** * FEINMESS GmbH&Co. KG **

More information

ACCURACY MONITORING AND CALIBARTION OF CNC MACHINES

ACCURACY MONITORING AND CALIBARTION OF CNC MACHINES ACCURACY MONITORING AND CALIBARTION OF CNC MACHINES Ivan Kuric 1, Ivan Ďurica 2, Miroslav Maduda 3 1,2,3 Department of Automation and Production Systems, Faculty of Mechanical Engineering, University of

More information

INSPECTION OF THE TURBINE BLADES USING SCANNING TECHNIQUES

INSPECTION OF THE TURBINE BLADES USING SCANNING TECHNIQUES INSPECTION OF THE TURBINE BLADES USING SCANNING TECHNIQUES H. Nieciag, M. Traczynski and Z. Chuchro Department of Geometrical Quanities Metrology The Institute of Metal Cutting, 30-011 Cracow, Poland Abstract:

More information

On the impact of probing form error on form measurement in Computed Tomography

On the impact of probing form error on form measurement in Computed Tomography On the impact of probing form error on form measurement in Computed Tomography Jan Lasson Andreasen 1, Filippo Montanari 2, Leonardo De Chiffre 2 More info about this article: http://www.ndt.net/?id=23729

More information

R0 in µm THP in µm 18 C - 22 C

R0 in µm THP in µm 18 C - 22 C ZEISS O-INSPECT Specifications Status: November 2017 System description Type according to ISO 10360-1:2000 O-INSPECT 3/2/2: Column CMM, O-INSPECT 5/4/3 and 8/6/3: Fixed bridge CMM Operating mode motorized

More information

Leica Absolute Trackers

Leica Absolute Trackers PRODUCT BROCHURE Leica Absolute Trackers Probing Solutions Leica Absolute Tracker AT402 and B-Probe ENTRY-LEVEL ULTRA-PORTABLE Probing System The Leica B-Probe is a handheld and battery-powered point probing

More information

CurveAnalyzer - Presentation

CurveAnalyzer - Presentation CurveAnalyzer - Presentation CurveAnalyzer - introduction Optimal solution for elaboration of 2D profiles Starting from building of simple geometrical elements and relationships between them, dimensioning

More information

PRODUCT BROCHURE DEA MICRO-HITE. Handy and Cost-Effective CMM

PRODUCT BROCHURE DEA MICRO-HITE. Handy and Cost-Effective CMM PRODUCT BROCHURE DEA MICRO-HITE Handy and Cost-Effective CMM DEA MICRO-HITE Micro-Hite, the line of small CMMs featuring excellent performance, is the result of the synergy among Hexagon Metrology companies

More information

DPA. 3D coordinate measurement with hand-held digital camera MEASURE THE ADVANTAGE. MoveInspect TECHNOLOGY

DPA. 3D coordinate measurement with hand-held digital camera MEASURE THE ADVANTAGE. MoveInspect TECHNOLOGY DPA 3D coordinate measurement with hand-held digital camera MEASURE THE ADVANTAGE MoveInspect TECHNOLOGY DPA 3D coordinate measurement with hand-held digital camera Industrial metrology Industrial metrology

More information

Industrial Measuring Technology from Carl Zeiss CONTURA CONTURA G2 RDS G2 AKTIV

Industrial Measuring Technology from Carl Zeiss CONTURA CONTURA G2 RDS G2 AKTIV Industrial Measuring Technology from Carl Zeiss CONTURA CONTURA G2 RDS G2 AKTIV Overview Introducing the next generation scanning platform. CONTURA G2 RDS and CONTURA G2 AKTIV: The CMM that brought Active

More information

Micro Cutting Tool Measurement by Focus-Variation

Micro Cutting Tool Measurement by Focus-Variation Micro Cutting Tool Measurement by Focus-Variation Stefan Scherer 1, Reinhard Danzl 2, and Franz Helmli 3 1 CEO Alicona*; e-mail: stefan.scherer@alicona.com 2 Alicona Research*; e-mail: reinhard.danzl@alicona.com

More information

Automatic NC Part. Programming Interface for a UV Laser Ablation Tool

Automatic NC Part. Programming Interface for a UV Laser Ablation Tool Automatic NC Part Programming Interface for a UV Laser Ablation Tool by Emir Mutapcic Dr. Pio Iovenitti Dr. Jason Hayes Abstract This research project commenced in December 2001 and it is expected to be

More information

VELO Module Production - Final Module Metrology

VELO Module Production - Final Module Metrology LHCb-2007-087 11 January 2008 VELO Module Production - Final Module Metrology LHCB Technical Note Issue: Draft Revision: 1 Reference: LHCb 2007-087 Created: 10 th October 2006 Last modified: 11 th January

More information

MODERN DIMENSIONAL MEASURING TECHNIQUES BASED ON OPTICAL PRINCIPLES

MODERN DIMENSIONAL MEASURING TECHNIQUES BASED ON OPTICAL PRINCIPLES MODERN DIMENSIONAL MEASURING TECHNIQUES BASED ON OPTICAL PRINCIPLES J. Reichweger 1, J. Enzendorfer 1 and E. Müller 2 1 Steyr Daimler Puch Engineering Center Steyr GmbH Schönauerstrasse 5, A-4400 Steyr,

More information

Jenoptik twist measuring systems - Twist measurement in practice

Jenoptik twist measuring systems - Twist measurement in practice Jenoptik twist measuring systems - Twist measurement in practice Twist measurement Twist measurement with Jenoptik Dynamically stressed seals place high demands on the surface texture of a shaft at the

More information

3Shape Convince D Scanning and Quality Control

3Shape Convince D Scanning and Quality Control 3Shape Convince 2011 3D Scanning and Quality Control About 3Shape Digitally moving the world of 3D scanning and 3D software Global provider of innovative 3D technology Established in 2000 in Copenhagen,

More information

Highlights Metrosoft CM 3.60

Highlights Metrosoft CM 3.60 Highlights Metrosoft CM 3.60 Highlights, new functions and improvements for Metrosoft CM 3.60 Please note: The complete CM 3.60 functions and their description is available in the release notes. 1. 3D

More information

PRODUCT BROCHURE SCANNING SOLUTIONS PORTABLE LASER SCANNING WITH THE LEICA ABSOLUTE TRACKER

PRODUCT BROCHURE SCANNING SOLUTIONS PORTABLE LASER SCANNING WITH THE LEICA ABSOLUTE TRACKER PRODUCT BROCHURE SCANNING SOLUTIONS PORTABLE LASER SCANNING WITH THE LEICA ABSOLUTE TRACKER INTRODUCTION THE RIGHT SOLUTION FOR EVERY SCANNING APPLICATION Hexagon Manufacturing Intelligence s portable

More information

Calypso Freeform Overview

Calypso Freeform Overview 2 of 17 The Calypso Free Form Option is used to evaluate 3-D sections of a part. Free Form uses a CAD model to create a scan path, then gather data from the actual part. Using a Profile characteristic,

More information

PRISMO Vario. Specifications and Performance Features. Industrial Measuring Technology from Carl Zeiss. Wide sensor variety

PRISMO Vario. Specifications and Performance Features. Industrial Measuring Technology from Carl Zeiss. Wide sensor variety Industrial Measuring Technology from Carl PRISMO Vario Specifications and Performance Features Wide sensor variety For all requirements Highly versatile More measuring options PRISMO Vario Technology The

More information

O-RING SURFACE INSPECTION USING 3D PROFILOMETRY

O-RING SURFACE INSPECTION USING 3D PROFILOMETRY O-RING SURFACE INSPECTION USING 3D PROFILOMETRY Prepared by Jorge Ramirez 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials. 2010 NANOVEA

More information

Digital Volume Correlation for Materials Characterization

Digital Volume Correlation for Materials Characterization 19 th World Conference on Non-Destructive Testing 2016 Digital Volume Correlation for Materials Characterization Enrico QUINTANA, Phillip REU, Edward JIMENEZ, Kyle THOMPSON, Sharlotte KRAMER Sandia National

More information

Metrology and Sensing

Metrology and Sensing Metrology and Sensing Lecture 4: Fringe projection 2018-11-09 Herbert Gross Winter term 2018 www.iap.uni-jena.de 2 Schedule Optical Metrology and Sensing 2018 No Date Subject Detailed Content 1 16.10.

More information

PROBE RADIUS COMPENSATION AND FITTING ERRORS IN CAD-BASED MEASUREMENTS OF FREE-FORM SURFACE: A CASE STUDY

PROBE RADIUS COMPENSATION AND FITTING ERRORS IN CAD-BASED MEASUREMENTS OF FREE-FORM SURFACE: A CASE STUDY XIX IMEKO World Congress Fundamental and Applied Metrology September 11, 9, Lisbon, Portugal PROBE RADIUS COMPENSATION AND FITTING ERRORS IN CAD-BASED MEASUREMENTS OF FREE-FORM SURFACE: A CASE STUDY Malgorzata

More information

Calibration of a portable interferometer for fiber optic connector endface measurements

Calibration of a portable interferometer for fiber optic connector endface measurements Calibration of a portable interferometer for fiber optic connector endface measurements E. Lindmark Ph.D Light Source Reference Mirror Beamsplitter Camera Calibrated parameters Interferometer Interferometer

More information

TESTING THE CAPABILITIES OF THE THREE-SPHERES ALIGNMENT METHOD FOR LASER TRIANGULATION SENSORS

TESTING THE CAPABILITIES OF THE THREE-SPHERES ALIGNMENT METHOD FOR LASER TRIANGULATION SENSORS 6th International DAAAM Baltic Conference INDUSTRIAL ENGINEERING 24-26 April 2008, Tallinn, Estonia TESTING THE CAPABILITIES OF THE THREE-SPHERES ALIGNMENT METHOD FOR LASER TRIANGULATION SENSORS Martínez,

More information

MICROSPHERE DIMENSIONS USING 3D PROFILOMETRY

MICROSPHERE DIMENSIONS USING 3D PROFILOMETRY MICROSPHERE DIMENSIONS USING 3D PROFILOMETRY Prepared by Craig Leising 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials. 2010 NANOVEA

More information

2D MANUAL. is a manual 2D vision system with a massive difference.

2D MANUAL. is a manual 2D vision system with a massive difference. vision systems 2D MANUAL is a manual 2D vision system with a massive difference. VuMaster Due to the newly patented Colourmap scale system, the VuMaster does not have a conventional stage or encoders just

More information

CAMIO7 Multi-sensor CMM software

CAMIO7 Multi-sensor CMM software Ryf AG Bettlachstrasse 2 2540 Grenchen tel 032 654 21 00 fax 032 654 21 09 www.ryfag.ch CAMIO7 Multi-sensor CMM software Productivity-focused metrology software for tactile and 3D laser CMM inspection

More information

Contour LS-K Optical Surface Profiler

Contour LS-K Optical Surface Profiler Contour LS-K Optical Surface Profiler LightSpeed Focus Variation Provides High-Speed Metrology without Compromise Innovation with Integrity Optical & Stylus Metrology Deeper Understanding More Quickly

More information

Advanced automated High Speed Computed Tomography for production process control. DGZfP 2011, Bremen

Advanced automated High Speed Computed Tomography for production process control. DGZfP 2011, Bremen DGZfP-Jahrestagung 2011 - Mo.3.B.3 Advanced automated High Speed Computed Tomography for production process control DGZfP 2011, Bremen Dr. Ingo Stuke* and Dr. Oliver Brunke** GE Sensing & Inspection Technologies

More information

Improvements Metrosoft QUARTIS R12

Improvements Metrosoft QUARTIS R12 Improvements Metrosoft QUARTIS R12 Improvements Metrosoft QUARTIS R12 At a glance Metrosoft QUARTIS R12 offers a wide range of improvements for all users and significantly contributes to optimize daily

More information