SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005

Transcription

1 SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 MICROSOFT EMC LABORATORY NE 67 th Court Redmond, WA Sajay Jose sajose@microsoft.com Phone: ELECTRICAL (EMC) Valid to: August 31, 2019 Certificate Number: In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this laboratory at the location listed above, as well as the two satellite laboratory locations listed below, to perform the following Information Technology Equipment (ITE) and tests: Test Description: Test Method(s) 2 : Emissions Radiated and Conducted CISPR 22, EN 55022, AS/NZS CISPR 22; CISPR 32, EN 55032, AS/NZS CISPR 32, VCCI-CISPR 32:2016 (up to 6 GHz) (excluding equipment within the scope of CISPR 13); VCCI V-3; ICES-003 Unintentional Radiators (FCC Part 15, Subpart B) ANSI C63.4:2014, American National Standard for Methods of Measurement of -Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 khz to 40 GHz Harmonics EN ; IEC Flicker EN ; IEC Radiated (RI) EN ; IEC Electrical Fast Transients (EFT) EN ; IEC Surge EN ; IEC Conducted (CI) EN ; IEC Magnetic Field EN ; IEC (A2LA Cert. No ) Revised 01/05/2018 Page 1 of 6

2 Test Description: Test Method(s) 2 : (cont.) Voltage Dips and Interrupts EN ; IEC Generic/Product Family Standards CISPR 24; EN 55024; CISPR 35; EN Intentional Radiators (FCC Part 15, Subpart C) U-NII without DFS Intentional Radiators (FCC Part 15, Subpart E) Unlicensed National Information Infrastructure Devices (U-NII without DFS) U-NII with DFS Intentional Radiators (FCC Part 15, Subpart E) Unlicensed National Information Infrastructure (U-NII) Devices with Dynamic Frequency Selection (DFS) UWB Intentional Radiators (FCC Part 15, Subpart F) (excluding vehicular devices) Ultra-wideband Operation Commercial Mobile Services (FCC Licensed Service Equipment) Part 22 (cellular) Part 24 Part 25 (non-microwave) Part 27 General Mobile Services (FCC Licensed Service Equipment) Part 22 (non-cellular) Part 90 (non-microwave*) Part 95 Part 97 Part 101 (non-microwave*) (*Non-microwave: Below 890 MHz only) - Canada License-exempt - Canada ANSI C63.10:2013, American National Standard for Testing Unlicensed Wireless Devices ANSI C63.10:2013, American National Standard for Testing Unlicensed Wireless Devices KDB KDB D02 UNII DFS Compliance Procedure New Rules v02 ANSI C63.10:2013, American National Standard for Testing Unlicensed Wireless Devices ANSI/TIA-603-D (2010), Land Mobile FM or PM Communications Equipment Measurement and Performance Standards KDB ANSI/TIA-603-D (2010), Land Mobile FM or PM Communications Equipment Measurement and Performance Standards RSS-132, RSS-133, RSS-139, RSS-220 (excluding Vehicular Radar Devices); RSS-247; RSS-GEN (using ANSI C63.4:2014 and ANSI C63.10:2013) RSS-210 (A2LA Cert. No ) Revised 01/05/2018 Page 2 of 6

3 Test Description: Test Method(s) 2 : (cont.) - Europe (CE) EN (Radiated Spurious Emissions only); EN (Radiated Spurious Emissions only); ETSI EN ; ETSI EN ; ETSI EN ; ETSI EN ; ETSI EN ; ETSI EN ; ETSI EN ; ETSI EN (excluding Section 9.6); ETSI EN ; ETSI EN ; ETSI EN Australia / NZS AS/NZS 4268 SAR (Specific Absorption Rate) IEEE 1528:2013; IEEE 1528:2003; IEEE 1528a:2005; RSS-102; EN 50360; EN 50566; EN 62311; EN 62479; EN ; EN ; IEC ; IEC ; Australian Communications Authority communications (Electromagnetic Radiation Human Exposure) Standard 2014 RF Exposure Devices Subject to SAR requirements Hearing Aid Compatibility (Part 20) HAC for Commercial Mobile Services IEEE Std 1528 :2013, IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques KDB KDB ANSI C63.19:2007, American National Standard for Methods of Measurement of Compatibility Between Wireless Communication Devices and Hearing Aids ANSI C63.19:2011, American National Standard for Methods of Measurement of Compatibility Between Wireless Communication Devices and Hearing Aids RF Exposure / Maximum Permissible Exposure IEEE C95.1:1999; IEEE C95.1:2005; IEEE C95.3: This accreditation covers testing performed at the main laboratory listed above, as well as the two satellite laboratories listed below: (A2LA Cert. No ) Revised 01/05/2018 Page 3 of 6

4 Sajay Jose Studio B/1128, NE 40 th St. Redmond, WA Phone: Studio B/1128 Test Description: Test Method(s) 2 : Radiated (RI) EN ; IEC Europe ETSI EN (Sections 9.2, and 9.3); ETSI EN ; ETSI EN Studio B/1864 Emissions Conducted CFR 47, FCC Part 15, Subpart B (using ANSI C63.4:2014); CISPR 22, EN 55022, AS/NZS CISPR 22; CISPR 32, EN 55032, VCCI-CISPR 32:2016 (up to 6 GHz) (excluding equipment within the scope of CISPR 13); VCCI V-3; ICES-003 Electrical Fast Transients (EFT) EN ; IEC Surge EN ; IEC Conducted (CI) EN ; IEC Voltage Dips and Interrupts EN ; IEC Europe ETSI EN (Sections 8.3, 8.7, 9.3, 9.4, 9.5, 9.7, and 9.8); ETSI EN ; ETSI EN (A2LA Cert. No ) Revised 08/24/2017 Page 4 of 6

5 Sajay Jose Building 87/ 1317, th Place NE Redmond, WA Phone: Test Description: Test Method(s) 2 : Emissions Conducted CFR 47, FCC Part 15, Subpart B (using ANSI C63.4:2014); CISPR 22, EN 55022, AS/NZS CISPR 22; CISPR 32, EN 55032, VCCI-CISPR 32:2016 (up to 6 GHz) (excluding equipment within the scope of CISPR 13); VCCI V-3; ICES-003 Radiated (RI) EN ; IEC Electrical Fast Transients (EFT) EN ; IEC Surge EN ; IEC Conducted (CI) EN ; IEC Voltage Dips and Interrupts EN ; IEC Europe ETSI EN (Sections 8.3, 8.7, 9.2, 9.3, 9.4, 9.5, 9.7, and 9.8); ETSI EN ; ETSI EN When the date, revision or edition of a test method standard is not identified on the scope of accreditation, the laboratory is required to be using the current version within one year of the date of publication, per part C., Section 1 of A2LA R101 - General Requirements- Accreditation of ISO-IEC Laboratories. If a specifier/regulator imposes a different transition period, this will supersede the A2LA one-year implementation period. (A2LA Cert. No ) Revised 08/24/2017 Page 5 of 6

6 Testing Activities Performed in Support of FCC Declaration of Conformity and Certification in Accordance with 47 Code of Federal Regulations and FCC KDB , Appendix A, Table A.1 3 : Rule Subpart/Technology Test Method Maximum Frequency Unintentional Radiators Part 15B ANSI C63.4: MHz Intentional Radiators Part 15C ANSI C63.10: MHz U-NIII without DFS Intentional Radiators Part 15E ANSI C63.10: MHz U-NIII with DFS Intentional Radiators Part 15E FCC KDB D02 (v02) MHz UWB Intentional Radiators Part 15F ANSI C63.10: MHz Commercial Mobile Services (FCC Licensed Service Equipment) Parts 22 (cellular), 24, 25 (non-microwave), and 27 General Mobile Services (FCC Licensed Service Equipment) Parts 22 (non-cellular), 90 (non-microwave), 95, 97, and 101 (non-microwave) ANSI/TIA-603-D; TIA-102.CAAA-D ANSI/TIA-603-D; TIA-102.CAAA-D MHz MHz RF Exposure Devices Subject to SAR Requirements IEEE Std 1528: MHz Hearing Aid Compatibility Part 20 (HAC for Commercial Mobile Services) ANSI C63.19:2007 or MHz 3 Accreditation does not imply acceptance to the FCC equipment authorization program. Please see the FCC website ( for a listing of FCC approved laboratories. (A2LA Cert. No ) Revised 08/24/2017 Page 6 of 6

7 Accredited Laboratory A2LA has accredited MICROSOFT EMC LABORATORY Redmond, WA for technical competence in the field of Electrical Testing This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated 8 January 2009). Presented this 16 th day of August President and CEO For the Accreditation Council Certificate Number Valid to August 31, 2019 For the tests to which this accreditation applies, please refer to the laboratory s Electrical Scope of Accreditation.