1601 North A.W. Grimes, Suite B Round Rock, TX (512) Fax: (512) January 20, 2012

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1 1601 North A.W. Grimes, Suite B Round Rock, TX info@ptitest.com (512) Fax: (512) January 20, 2012 Mr. Bobby Wollard Dynamic Flow Computers Southwest Freeway Suite 320 Stafford, Texas Dear Bobby: Thank you for allowing Professional Testing (EMI) Inc. the opportunity to perform testing on the E-chart Plus by Dynamic Flow Computers. Enclosed is the Electromagnetic Compatibility Test Report, which demonstrates compliance with IEC : 2002 and IEC : If you have any questions, please contact us. Sincerely, Jeffrey A. Lenk President Enclosure

2 Project Number: Electromagnetic Compatibility & Environmental Test Report Dynamic Flow Computers E-chart Plus Prepared for: Dynamic Flow Computers Southwest Freeway Suite 320 Stafford, Texas By Professional Testing (EMI), Inc North A.W. Grimes Blvd., Suite B Round Rock, Texas January 20, 2012 Reviewed by Written by Robert McCollough Director of Testing Services Tara Duval Technical Writer January 20, 2012 Page 2 of 32

3 Table of Contents Title Page... 1 Certificate of Compliance Introduction Scope Description of EUT EUT Operation Modifications to Equipment Applicable Documents Immunity Testing Performance Criteria Ripple on DC Input Power Port Immunity Test Procedures Performance Criteria Test Results Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Procedures Performance Criteria Test Results Appendix A: Policy, Rationale, and Evaluation of EMC Measurement Uncertainty Appendix B: Accreditations End of Report NOTICE: (1) This Report must not be used to claim product endorsement, by NVLAP, NIST, the FCC or any other Agency. This report also does not warrant certification by NVLAP or NIST. (2) This report shall not be reproduced except in full, without the written approval of Professional Testing (EMI), Inc. (3) The significance of this report is dependent on the representative character of the test sample submitted for evaluation and the results apply only in reference to the sample tested. The manufacturer must continuously implement the changes shown herein to attain and maintain the required degree of compliance January 20, 2012 Page 3 of 32

4 Applicant: Applicant s Address: Certificate of Compliance Model: E-chart Plus Serial Number: EPC PTI Project Number: Dynamic Flow Computers Southwest Freeway Suite 320 Stafford, Texas The E-chart Plus by Dynamic Flow Computers was tested utilizing the following documents and found to be in compliance with the required criteria on the indicated test date. Standard Test Type Criterion Test Date IEC : 2002 Ripple on DC Input Power Port Immunity A December 15, 2011 IEC : 2000 Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity B December 16, 2011 I, Jeffrey A. Lenk, for Professional Testing (EMI), Inc., being familiar with the IEC and IEC test procedures, have reviewed the test setup, measured data, and this report, and believe them to be true and accurate. Jeffrey A. Lenk President This report has been reviewed and accepted by Dynamic Flow Computers. The undersigned is responsible for ensuring that the E-chart Plus by Dynamic Flow Computers will continue to comply with the applicable rules. Dynamic Flow Computers Representative January 20, 2012 Page 4 of 32

5 1.0 Introduction 1.1 Scope The purpose of the EMC testing was to determine compliance with specific immunity standards. This report describes the extent to which the equipment under test (EUT) conformed to the standards to which it was tested and the manner in which that testing was conducted. 1.2 Description of EUT The equipment under test (EUT) is the E-chart Plus by Dynamic Flow Computers. The E-chart Plus is an explosion-proof computer powered by solar panel or direct 14.5 or 24-volt power input. The system tested consisted of the following: EUT Manufacturer Model Serial Number Description Dynamic Flow Computers E chart Plus EPC Explosion proof flow computer powered by 14.5 or 24 VDC Oscillator Frequency khz Processor 16 MHz 1.3 EUT Operation The EUT was exercised in a manner consistent with normal operations. It can be powered by solar panel in remote areas or by 14.5 or 24 VDC inside facilities with power supply. For testing purposes, it was powered with both 14.5 and 24 VDC power supplies. The EUT was visually monitored for anomalies during testing and checked for functionality upon completion of each test. 1.4 Modifications to Equipment No modifications were made to the EUT during the performance of the test program January 20, 2012 Page 5 of 32

6 2.0 Applicable Documents Dynamic Flow Computers E-chart Plus Electromagnetic Compatibility Test Report The following documents were used as reference for the test procedures specified herein. Document Title IEC IEC Description Electromagnetic compatibility (EMC) Part 4 17: Testing and measurement techniques Ripple on DC input power port immunity test Electromagnetic compatibility (EMC) Part 4 29: Testing and measurement techniques Voltage dips, short interruptions and voltage variations on DC input power port immunity tests Date of Publication January 20, 2012 Page 6 of 32

7 3.0 Immunity Testing Dynamic Flow Computers E-chart Plus Electromagnetic Compatibility Test Report 3.1 Performance Criteria EUT performance during testing was classified by the following criteria: Performance Criteria A Performance Criteria B Performance Criteria C Normal performance within equipment specifications. Degradation or loss of function or performance that is self-recoverable when the interfering signal is removed. Degradation or loss of function or performance that requires system reset or operator intervention when the interfering signal is removed. 3.2 Ripple on DC Input Power Port Immunity Ripple on DC Input Power Port Immunity testing was performed using the procedures of IEC Test Procedures The EUT was tested connected to a programmable test generator. An AC voltage of 2.4 VAC was superimposed on the input lines. The test was run for 5 minutes at 10% ripple. A diagram showing the test setup is given as Figure Figure : Ripple on DC Input Power Port Immunity Test Setup Diagram Performance Criteria Only performance criterion A was allowed during the performance of the test. Performance criteria B and C were not allowed January 20, 2012 Page 7 of 32

8 3.2.3 Test Results The EUT was subjected to ripple on DC input power port immunity testing on December 15, The EUT maintained normal operation during 5 minutes exposure to voltage ripple. No adverse indications were noted during the performance of the test. Therefore, the EUT met IEC performance criterion A. Table : Ripple on DC Input Power Port Immunity Test Equipment Test Method: IEC : 2002 Ripple on DC Input Power Port Immunity Test Section 5 Test Date(s): 12/15/2011 EUT Serial #: EPC Ripple on DC Input Power Port Immunity Test Equipment List Software Version: MxGui Version 5.01 Test Profile: 4 17 Asset # Manufacturer Model Equipment Nomenclature Serial Number Calibration Due Date 1925 Agilent DSOX2012A Oscilloscope, 2 ch, 100 MHz MY /12/ PTI N/A Switch, On Off N/A N/A 1766 NI GBIP USB HS, GBIP Adapter, USB HA N/A 1936 Ametek MX45 AC/DC Power Source, 45 kva 1123A /21/ January 20, 2012 Page 8 of 32

9 Table : Ripple on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC Test Method: IEC : 2002 Ripple on DC Input Power Port Immunity Test In accordance with: 0 Test Date(s): 12/15/2011 EUT Serial #: EPC Ripple on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC 50 Hz Calibration Scope AC Coupled 50 Hz Calibration Scope DC Coupled 60 Hz Calibration Scope AC Coupled 60 Hz Calibration Scope DC Coupled January 20, 2012 Page 9 of 32

10 Table : Ripple on DC Input Power Port Immunity Test Results 14.5 VDC Test Method: IEC : 2002 Ripple on DC Input Power Port Immunity Test Test Date(s): 12/15/2011 EUT Serial #: EPC Ripple on DC Input Power Port Immunity Test Results 14.5 VDC EUT Line Tested: 14.5 VDC EUT Source Voltage 14.5 VDC Line Tested EUT Mode of Operation Ripple Frequency Test Duration Test Results 14.5 VDC Normal 50 Hz 5 Minutes, Criterion A 14.5 VDC Normal 60 Hz 5 Minutes, Criterion A January 20, 2012 Page 10 of 32

11 Table : Ripple on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC Test Method: IEC : 2002 Ripple on DC Input Power Port Immunity Test Test Date(s): 12/15/2011 EUT Serial #: EPC Ripple on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC 50 Hz Calibration Scope AC Coupled 50 Hz Calibration Scope DC Coupled 60 Hz Calibration Scope AC Coupled 60 Hz Calibration Scope DC Coupled January 20, 2012 Page 11 of 32

12 Table : Ripple on DC Input Power Port Immunity Test Results 24 VDC Test Method: IEC : 2002 Ripple on DC Input Power Port Immunity Test Test Date(s): 12/15/2011 EUT Serial #: EPC Ripple on DC Input Power Port Immunity Test Results 24 VDC EUT Line Tested: Line Tested 24 VDC EUT Mode of Operation EUT Source Voltage 24 VDC Ripple Frequency Test Duration Test Results 24 VDC Normal 50 Hz 5 Minutes, Criterion A 24 VDC Normal 60 Hz 5 Minutes, Criterion A January 20, 2012 Page 12 of 32

13 Table : Ripple on DC Input Power Port Immunity Test Setup Photographs Test Method: IEC : 2002 Ripple on DC Input Power Port Immunity Test Section: 5 Test Date(s): 12/15/2011 EUT Serial #: EPC Ripple on DC Input Power Port Immunity Test Setup Photographs Ripple on DC Input Power Port Immunity Test Setup EUT Switch January 20, 2012 Page 13 of 32

14 3.3 Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Voltage dips, short interruptions, and voltage variations on DC input power port immunity testing was performed using the procedures of IEC Test Procedures The EUT was tested while connected to a programmable test generator. The shortest power supply cable suitable to the application of the EUT was attached. The EUT was subjected to a voltage dip of 60% for 20 ms and a voltage dropout of 100% for 20 ms. A diagram showing the test setup is given as Figure Figure : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Setup Diagram Performance Criteria Performance criterion A and performance criterion B were allowed during the performance of the voltage dip and voltage dropout tests. Performance criterion C was not allowed Test Results The EUT was subjected to voltage dips, short interruptions, and voltage variations on DC input power port immunity testing on December 16, During the performance of the test, EUT cycled power, then rebooted and continued normal operation. Therefore, the EUT met IEC performance criterion B January 20, 2012 Page 14 of 32

15 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Equipment Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Equipment List Asset # Software Version: MxGui Version 5.01 Test Profile: 4 29 Manufacturer 1925 Agilent Model Equipment Nomenclature Serial Number Calibration Due Date DSOX2012A Oscilloscope, 2 ch, 100 MHz MY /12/ PTI N/A Switch, On Off 1766 NI GBIP USB HS, GBIP Adapter, USB 1936 Ametek MX45 AC/DC Power Source, 45 kva N/A N/A HA N/A 1123A /21/ January 20, 2012 Page 15 of 32

16 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC, Page 1 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC Page: 1 of 5 40% for 10 ms Calibration Waveform 40% for 30 ms Calibration Waveform 40% for 100 ms Calibration Waveform 40% for 300 ms Calibration Waveform January 20, 2012 Page 16 of 32

17 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC, Page 2 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC Page: 2 of 5 40% for 1 Sec Calibration Waveform 80% for 0.1 S Calibration Waveform 80% for 0.3 S Calibration Waveform 80% for 1 Sec Calibration Waveform January 20, 2012 Page 17 of 32

18 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC, Page 3 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC Page: 3 of 5 80% for 3 Sec Calibration Waveform 80% for 10 Sec Calibration Waveform 120% for 0.1 Sec Calibration Waveform 120% for 0.3 Sec Calibration Waveform January 20, 2012 Page 18 of 32

19 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC, Page 4 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC Page: 4 of 5 120% for 1.0 Sec Calibration Waveform 120% for 3 Sec Calibration Waveform 120% for 10 Sec Calibration Waveform 0% for 0.01 Sec Calibration Waveform January 20, 2012 Page 19 of 32

20 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC, Page 5 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 14.5 VDC Page: 5 of 5 0% for 0.03 Sec Calibration Waveform 0% for 1 Sec Calibration Waveform January 20, 2012 Page 20 of 32

21 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Results 14.5 VDC Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Test # Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Results 14.5 VDC EUT Line Tested: 14.5 VDC EUT Source Voltage 14.5 VDC Test Level (% of Nominal) Test Level (VDC) Test Duration (seconds) # Applied Performance Criterion Required Performance Criterion Achieved Test Result 40% B A 40% B A 40% B A 40% B A 40% B A 80% A A 80% A A 80% A A 80% A A 80% A A 120% A A 120% A A 120% A A 120% A A 120% A A 0% B B, see note 1 0% Note 1: EUT cycled power, then rebooted and continued normal operation. B B, see note 1 0% B B, see note January 20, 2012 Page 21 of 32

22 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC, Page 1 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC Page: 1 of 5 40% for 10 ms Calibration Waveform 40% for 30 ms Calibration Waveform 40% for 100 ms Calibration Waveform 40% for 300 ms Calibration Waveform January 20, 2012 Page 22 of 32

23 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC, Page 2 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC Page: 2 of 5 40% for 1 Sec Calibration Waveform 80% for 0.1 S Calibration Waveform 80% for 0.3 S Calibration Waveform 80% for 1 Sec Calibration Waveform January 20, 2012 Page 23 of 32

24 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC, Page 3 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC Page: 3 of 5 80% for 3 Sec Calibration Waveform 80% for 10 Sec Calibration Waveform 120% for 0.1 Sec Calibration Waveform 120% for 0.3 Sec Calibration Waveform January 20, 2012 Page 24 of 32

25 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC, Page 4 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC Page: 4 of 5 120% for 1.0 Sec Calibration Waveform 120% for 3 Sec Calibration Waveform 120% for 10 Sec Calibration Waveform 0% for 0.01 Sec Calibration Waveform January 20, 2012 Page 25 of 32

26 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC, Page 5 Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms 24 VDC Page: 5 of 5 0% for 0.03 Sec Calibration Waveform 0% for 1 Sec Calibration Waveform January 20, 2012 Page 26 of 32

27 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Results 24 VDC Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Test # Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Results 24 VDC EUT Line Tested: 24 VDC EUT Source Voltage 24 Test Level (% of Nominal) Test Level (VDC) Test Duration (seconds) # Applied Performance Criterion Required VDC Performance Criterion Achieved Test Result 40% B A 40% B A 40% B A 40% B A 40% B A 80% A A 80% A A 80% A A 80% A A 80% A A 120% A A 120% A A 120% A A 120% A A 120% A A 0% B A 0% B B, see note 1 0% B B, see note 1 Note 1: EUT cycled power, then rebooted and continued normal operation January 20, 2012 Page 27 of 32

28 Table : Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Setup Photographs Test Method: IEC : 2000 Voltage dips, short interruptions, and voltage variations on DC input power port immunity test Test Date(s): 12/16/2011 EUT Serial #: EPC Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Setup Photographs Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity EUT Switch January 20, 2012 Page 28 of 32

29 Appendix A: Policy, Rationale, and Evaluation of EMC Measurement Uncertainty All uncertainty calculations, estimates and expressions thereof shall be in accordance with NIST policy. Since PTI operates in accordance with NIST (NVLAP) Handbook : 2007, all instrumentation having an effect on the accuracy or validity of tests shall be periodically calibrated or verified traceable to national standards by a competent calibration laboratory. The certificates of calibration or verification on this instrumentation shall include estimates of uncertainty as required by NIST Handbook Rationale and Summary of Expanded Uncertainty. Each piece of instrumentation at PTI that is used in making measurements for determining conformance to a standard (or limit), shall be assessed to evaluate its contribution to the overall uncertainty of the measurement in which it is used. The assessment of each item will be based on either a type A evaluation or a type B evaluation. Most of the evaluations will be type B, since they will be based on the manufacturer s statements or specifications of the calibration tolerances, or uncertainty will be stated along with a brief rationale for the type of evaluation and the resulting stated uncertainties. The individual uncertainties included in the combined standard uncertainty for a specific test result will depend on the configuration in which the item of instrumentation is used. The combination will always be based on the law of propagation of uncertainty. Any systematic effects will be accommodated by including their uncertainties, in the calculation of the combined standard uncertainty; except that if the direction and amount of the systematic effect cannot be determined and separated from its uncertainty, the whole effect will be treated as uncertainty and combined along with the other elements of the test setup. Type A evaluations of standard uncertainty will usually be based on calculating the standard deviation of the mean of a series of independent observations, but may be based on a least-squares curve fit or the analysis of variance for unusual situations. Type B evaluations of standard uncertainty will usually be based on manufacturer s specifications, data provided in calibration reports, and experience. The type of probability distribution used (normal, rectangular, a priori, or u-shaped) will be stated for each Type B evaluation. In the evaluation of the uncertainty of each type of measurement, the uncertainty caused by the operator will be estimated. One notable operator contribution to measurement uncertainty is the manipulation of cables to maximize the measured values of radiated emissions. The operator contribution to measurement uncertainty is evaluated by having several operators independently repeat the same test. This results in a Type A evaluation of operator-contributed measurement uncertainty. A summary of the expanded uncertainties of PTI measurements is shown as Table 1. These are the worstcase uncertainties considering all operative influence factors January 20, 2012 Page 29 of 32

30 Table 1: Summary of Measurement Uncertainties for Site 45 Type of Measurement Frequency Range Meas. Dist. Expanded Uncertainty U, db (k=2) Mains Conducted Emissions 150 khz to 30 MHz N/A 2.9 Telecom Conducted Emissions 150 khz to 30 MHz N/A 2.8 Radiated Emissions 30 to 1,000 MHz 10 m to 18 GHz 3 m January 20, 2012 Page 30 of 32

31 Appendix B: Accreditations Laboratory Accreditation Dynamic Flow Computers E-chart Plus Electromagnetic Compatibility Test Report NVLAP accreditation to ISO/IEC 17025: 2005 with the following scope of accreditation: Lab code IEC , Edition 1.1 ( ) Agency Testing Approvals/Registration Federal Communications Commission (FCC) Type listed test firm for measuring devices subject to certification under Parts 15 & 18. Industry Canada O.A.T.S. filing number 3036B-1 for 3 m chamber and 10 m chamber. Voluntary Control Council for Interference (VCCI) registration for Japan for the following scope: o Mains Ports Conducted Interference Measurement (Registration number C-2701) o Telecom Ports Conducted Interference Measurement (Registration number T-1692) o Radiated Interference Measurement (Registration number R-2461) o Radiated Interference Measurement > 1 GHz (Registration number G-283) January 20, 2012 Page 31 of 32

32 End of Report Dynamic Flow Computers E-chart Plus Electromagnetic Compatibility Test Report (This page intentionally left blank.) January 20, 2012 Page 32 of 32