Agenda. Introduction to NI PXI platform. Software. Platform Completion Trainings, system integration, services. System chassis Controllers Modules

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2 Agenda Introduction to NI PXI platform System chassis Controllers Modules Software o Modular Instruments o Switching o Devices with open firmware Code development environment (incl. graphical programming) Code management software Platform Completion Trainings, system integration, services

3 National Instruments Annual Revenue: $1.14 billion Global Operations: Approximately 7,100 employees; operations in more than 40 countries Broad Customer Base: More than 35,000 companies served annually Diversity: No industry >15% of revenue Culture: Ranked among the top 25 companies to work worldwide by the Great Place to Work Institute Strong Cash Position: Cash and short-term investments of $327 million at March 31, 2013

4 Investments to Drive Service and Innovation * Represents National Instruments expected headcount, communicated April 25, 2013.

5 Moore s Law Is 1970s 2014

6 Escalating Complexity Over Time

7 Today s Need for Modern Test Systems Speaker SPI HDMI Bluetooth Wi-Fi USB LCD I 2 C GPS CDMA GSM LEDs Cameras Microphone EDGE LTE

8 Today s Need for Modern Test Systems

9 HARDWARE SOFTWARE Components of an Automated Test System NI TestStand Test Management Software Test Management, Test Deployment NI LabVIEW Test Development LabWindows /CVI Software Other Software Measurement Studio, Visual Studio.NET, Drivers, Services, Hardware Abstraction IVI, VISA, NI-DAQ, NI-DMM, NI-SCOPE, NI-FGEN, NI-HSDIO, PC or Embedded Controller PXI Chassis Switching Signal Generation RF Measurements Bus Interfaces (GPIB/LXI/Serial) Fixturing/ Mass Interconnects

PXI(e) Combines Standard Technologies Controller Embedded PC or remote PC / laptop interface Runs all standard software Up to 4 cores Up to 8GB RAM SSD Option (front panel accessible) Real-Time OS as

10 PXI(e) Combines Standard Technologies Controller Embedded PC or remote PC / laptop interface Runs all standard software Up to 4 cores Up to 8GB RAM SSD Option (front panel accessible) Real-Time OS as an option (HIL) Chassis: Option for redundant cooling fans Up to 925 W total power, no derating 0-55 C PXI Backplane PCI(e) bus Timing and Synchronization Up to 12GB/s total BW Peer-to-peer streaming (module to module) Peripheral Modules

PXI Products More than 400 PXI Products Available from National

Digital I/O Analog Input/Output Vision and Motion Counter/Timers

Multimeters Signal Generators Switching RF Signal Generation and Analysis

11 PXI Products More than 400 PXI Products Available from National Instruments DAQ and Control: Multifunction I/O FPGA/Reconfigurable I/O Digital I/O Analog Input/Output Vision and Motion Counter/Timers Instruments: Oscilloscopes Digital Waveform Generators/Analyzers Digital Multimeters Signal Generators Switching RF Signal Generation and Analysis Interfaces: GPIB, USB, LAN SCSI + Enet Boundary Scan/JTAG CAN + DeviceNet RS232/RS485 VXI/VME

12 Build Your System Online - PXI Advisor /advisors PXI

13 Application Areas Audio and Video Test Automotive Test Consumer Electronics Test Hardware-in-the-Loop Test RF and Communications Test Military Electronics Test Semiconductor Test

PXI Chassis 4 through 18 slots Portable,

0-55 C Hot-swappable, redundant DC power

14 PXI Chassis 4 through 18 slots Portable, benchtop, and rack mount AC and DC power options Backplane adds timing and synchronization busses Up to 925W, no derating 0-55 C Hot-swappable, redundant DC power supplies (option) Hot-swappable, front-accessible, redundant fans (option)

15 Timing and Synchronization with PXI Chassis Skew: <250ps Skew: <1ns Skew: <1ns Skew: <500ps Skew: <80ns

16 Synchronization&Timing Applications (I) PXI Trigger Lines General purpose triggering Handshaking (for test-time reduction no software calls/polling) Measurement Complete Trigger Input Input Trigger Scanner Advance

17 Synchronization&Timing Applications (II) PXI Star Trigger line Equal length trigger line to each module Master multiple slave synchronization (example: multi-channel oscilloscope measurements) Reference clocks Share oversample clock for PLL (example: audio measurements) Also available from other (external) sources PXI System Timing slot Multichassis clock synchronization (in testers requiring more synchronized modules) High-precision OCXO clocks leveraging External synchronization (GPS, IRIG-B, IEEE 1588)

PXIe-6674 PXI Express System Timing Module Specifications <5ppb OCXO accuracy 2.

18 PXIe-6674 PXI Express System Timing Module Specifications <5ppb OCXO accuracy μhz clock resolution Features 10MHz OCXO (50 ppb accuracy) 1 GHz DDS clock source DstarA, DstarB, DstarC PXI Express trigger routing SMB configurable I/O connections, either: 6 single ended PFI lines or 3 LVDS pairs

19 PXI Controller Options Remote/embedded Computing power Optional: real-time operating system

Hard-Drive Option 4 GB Standard RAM, 16 GB RAM maximum Memory and Hard Drive In-ROM Diagnostics HDD image recovery tools Extended

20 NI PXIe-8135 System Controller Windows 7 (&RT) Intel Quad Core i7-3610qe Processor 2.3 GHz (Base), 3.3 GHz (Single-Core Turbo) Four x4 Gen 2 PCIe links to chassis backplane 8 GB/s Maximum System Throughput SSD Support Removable Hard-Drive Option 4 GB Standard RAM, 16 GB RAM maximum Memory and Hard Drive In-ROM Diagnostics HDD image recovery tools Extended Temperature and 24/7 Operation Option Dual Monitor Support Built-in I/O: Two 10/100/1000BASE-TX (Gigabit) Ethernet ports 2 USB 3.0 Ports and 4 USB 2.0 Ports IEEE 1284 ECP/EPP RS232 GPIB

Remote Controllers Laptops, Rack-Mount, Servers Control

High-performance server Some of the technical specs of

21 Remote Controllers Laptops, Rack-Mount, Servers Control PXI tester from: Laptop Rack-mount controller High-performance server Some of the technical specs of rack-mount controllers: Up to 5.6GB/s throughput (x16 Gen2 PCI Express) Software-transparent link that requires no programming Flexible fiber-optic cabling up to 100m with electrical isolation

22 PXI Modules Modules: Typical Instruments (oscilloscopes, multimeters, generators) Switches Non-electrical measurements

23 Example Component Texas Instruments LMR12010 Step-Down Voltage Regulator Input Voltage Range of 3V to 20V Output Voltage Range of 0.8V to 17V 1A max output PCB designed to output 1.8V

24 PXI Controller Example Tests PXI-4132 SMU (Line) PXI-4071 DMM (Accuracy Measurement) PXI-4141 SMU (Load) PXI-5152 Digitizer (Transient & Noise) Additional Module V IN DC-DC Converter V OUT Open Quiescent Current (with no load) Shut-down Current One SMU needed Additional Module

25 PXI Controller Example Tests PXI-4132 SMU (Line) PXI-4071 DMM (Accuracy Measurement) PXI-4141 SMU (Load) PXI-5152 Digitizer (Transient & Noise) Additional Module Additional Module V IN DC-DC Converter V OUT DC Line Regulation DC Load Regulation Efficiency vs. Load Current Limit Test Two SMUs needed

26 Precision Source Measure Units (SMUs) NI 4138 & 4139 High power Up to 60 V or 3 A DC Up to 500 W pulsing High precision 0,1 pa current sensitivity 100 nv voltage sensitivity High speed 1.8 MS/s sampling rate 100 ks/s update rate NI SourceAdapt for fast and stable measurements

PXIe-4139 Extended Range Pulsing 2 3 Pulse only 3 Max pulse width: 400 µs Max duty cycle: 2% Max instantaneous power: 500W 2 Max pulse width: 1 ms Max duty cycle: 5% Max instantaneous power: 200W 1

27 PXIe-4139 Extended Range Pulsing 2 3 Pulse only 3 Max pulse width: 400 µs Max duty cycle: 2% Max instantaneous power: 500W 2 Max pulse width: 1 ms Max duty cycle: 5% Max instantaneous power: 200W 1 Max pulse energy: 200mJ (V.A. rms) Max pulse average power: 10W Min pulse width: 50 µs Min pulse off time: 5ms pulse width 1 DC region Can pulse in DC region without pulse width or duty cycle constraints. pulse period pulse off time

SourceAdapt - Optimize Settling Time DC instruments have a default settling time Range Setting

V), (10V+) Resistance <10 kohm, 10kOhm, 100kOhm, 1MOhm, >10MOhm AC V DC coupled, AC coupled

AC I 100 µs, 3 µs Diode 10 ms NI 407x Default Settle Times FPGA Control DAC load Output Set Point

28 SourceAdapt - Optimize Settling Time DC instruments have a default settling time Range Setting Measurement Type Capacitance is the enemy Improve speed of control loops Function DC V (100 mv-10 V), (10V+) Resistance <10 kohm, 10kOhm, 100kOhm, 1MOhm, >10MOhm AC V DC coupled, AC coupled Frequency/Period Default Settle Time 1 ms, 2ms 1 ms, 5ms, 25ms, 100ms, 250ms 3 µs, 1s 500 ms DC I, AC I 100 µs, 3 µs Diode 10 ms NI 407x Default Settle Times FPGA Control DAC load Output Set Point ADC Digital Analog NI PXIe-4141 with SourceAdapt Technology Custom Settling Time with NI SourceAdapt Technology

(DUT input) Simulate devices with variable current consumption

29 SMU-to-SMU Electronics Tests - Demo Connecting SMUs to the fixture allows simulation of both load (DUT output) and power (DUT input) Simulate devices with variable current consumption Simulate different input voltages Measure voltage current, power and efficiency

30 Battery Simulator (PXIe-4154) Transient time less than 20 µs RF input (LB) RF output (LB) High current output up to 3 A for GSM/EDGE devices Programmable output resistance from -0.04Ohm to 1Ohm Vbatt Vramp Mode/band/SPI Mobile Device Power Amplifier Vdetect RF input (HB) RF output (HB)

31 120 W Programmable Power Supplies PXIe-4112, 4113 General Purpose Power Supplies 2 isolated 60 W channels PXIe-4112: 60 V, 1 A PXIe-4113: 10 V, 6 A Built-in voltage and current read-back Flexibility to combine channels for 120 W per module Output disconnect relays Remote sense

High Current Four-Channel SMU PXIe-4144/5 Source

channels per single PXI Express slot ± 500mA at ± 6V

SourceAdapt technology: customized response for any

current measurement sensitivity (PXIe-4145) 600 ks/s

32 High Current Four-Channel SMU PXIe-4144/5 Source Measurement Unit High channel density with four SMU channels per single PXI Express slot ± 500mA at ± 6V output with 4-quadrant operation PXIe-4145 features SourceAdapt technology: customized response for any load for faster more stable measurements 15 pa current measurement sensitivity (PXIe-4145) 600 ks/s sampling rates and 15 ks/s source-measure rates for unmatched throughput

33 PXI Controller Example Tests PXI-4132 SMU (Line) PXI-4071 DMM (Accuracy Measurement) PXI-4141 SMU (Load) PXI-5152 Digitizer (Transient & Noise) Additional Module V IN DC-DC Converter V OUT DC Accuracy Test DMM needed - in precision tests 10 nv sensitivity Additional Module

NI PXI-4071 7½-Digit FlexDMM Industry s most accurate 7½-digit DMM 12 + 0.

Sensitivity down to 1 pa/10nv/10µ 1.8 MS/s isolated, high-voltage digitizer Flexible resolution: 1.

34 NI PXI ½-Digit FlexDMM Industry s most accurate 7½-digit DMM ppm basic 2-year Wide measurement ranges ±100 mv to 1000 VDC, ±1 µa to 3 A, 100 to 5 G Sensitivity down to 1 pa/10nv/10µ 1.8 MS/s isolated, high-voltage digitizer Flexible resolution: 1.8 MS/s at 10 bits to 5 S/s at 23 bits 2-year external calibration cycle Gain and offset self-calibration Weight 314g (relevant for multi-instrument test benches)

35 DMM-Based Precision Measurements - Demo Increase voltage or current detection precision Can be added to multi-smu measurements when SMU is not enough (for example low leakage currents of NMOS)

36 PXI Controller Example Tests PXI-4132 SMU (Line) PXI-4071 DMM (Accuracy Measurement) PXI-4141 SMU (Load) PXI-5152 Digitizer (Transient & Noise) Additional Module Additional Module V IN DC-DC Converter V OUT Line Transient Load Transient On/Off Times Ripple & Noise Oscilloscope needed

NI PXIe-5162 4-Channel High-Speed Oscilloscope Specifications Form Factor Vertical Resolution Sample Rate NI PXIe-5162 3U PXI Express(x4) 10 bits 5 GS/s (1-ch) 2.5 GS/s (2-ch) 1.

37 NI PXIe Channel High-Speed Oscilloscope Specifications Form Factor Vertical Resolution Sample Rate NI PXIe U PXI Express(x4) 10 bits 5 GS/s (1-ch) 2.5 GS/s (2-ch) 1.25 GS/s (4-ch) Channel Count 2 or 4 Bandwidth Input Impedance Input Coupling Input Ranges On-Board Memory Selectable Filters Up to 1.5 GHz 50 Ω, 1 MΩ AC, DC 50 mv pp up to 50 V pp 64 MB or 2 GB 20 MHz, 175 MHz

NI PXIe-5186 12.5GS/s Oscilloscope Specifications Form Factor Vertical Resolution NI PXIe-5162 3U PXI Express(x4) 8 bits Sample Rate 12.

38 NI PXIe GS/s Oscilloscope Specifications Form Factor Vertical Resolution NI PXIe U PXI Express(x4) 8 bits Sample Rate 12.5 GS/s (1-ch) Channel Count 2 Bandwidth Input Impedance 3/5 50 Ω, 1 MΩ Input Range -0.5 to 0.5V On-Board Memory 16 MB or 512 MB

39 NI PXIe-5152 General Purpose Oscilloscope Specifications Form Factor Vertical Resolution NI PXIe U PXI Express(x4) 8 bits Sample Rate 2 GS/s Channel Count 2 Bandwidth Input Impedance Input Range On-Board Memory 300MHz 50 Ω, 1 MΩ 100mV to 10V 8 MB or 256 MB

40 Scope-based Measurement - Demo Ensure proper transient behavior for startups and spikes Test overshoot and for proper edge slope

41 PXI Controller Example Tests PXI-4132 SMU (Line) PXI-4071 DMM (Accuracy Measurement) PXI-4141 SMU (Load) PXI-5152 Digitizer (Transient & Noise) Additional Module Additional Module Digital Control RF Measurements V IN DC-DC Converter V OUT Mobile Device Digital I/O RF Measurements Audio/Video Custom Tests More modules needed

NI PXIe-5665 14 GHz High Performance VSA 20 Hz to 3.

db) Phase noise -129 dbc/hz at 10 khz offset Average Noise Floor: -165

42 NI PXIe GHz High Performance VSA 20 Hz to 3.6 GHz or 14 GHz Frequency Range 25 MHz or 50 MHz instantaneous bandwidth (3 db) Phase noise -129 dbc/hz at 10 khz offset Average Noise Floor: -165 GHz TOI dbm WCDMA ACLR: -80 dbc.33% 256 QAM EVM Three stage super heterodyne architecture

43 It is also about switching

44 Types of Relays Armature Reed SSR / FET Speed Up to 150 cycles/s Up to 2000 cycles/s Up to 250/60K cycles/s Power Up to ~300W/3kVA Up to 10W Up to 60W/15W Lifetime Up to 1M cycles Up to 2B cycles Unlimited lifetime Path Ω 1-2 Ω 1-2 Ω 1-2 Ω / 8-15 Ω

45 Key Switching Specs DC Voltage Current Power Max and Min Bandwidth Path resistance Relay lifetime RF Isolation Crosstalk VSWR Insertion Loss RF Power

46 Lifetime Derivation MCBF = Expected Relay Life MTBF = MCBF/Cycles per hour 10 Million cph: MTBF= hours=14 years

48 Hot vs Cold Switching Hot switching: Closing relay with a live signal present o Pay attention to switching power o Relays will wear out faster V - 2 A Cold Switching: Turning off power source before closing relay o Better relay lifetime o Recommended for RF signals o Slower

49 Minimum Load Electromechanical Relays Wetting current: the amount of current required to burn off particulates that collect on the relay Oxidation Avoid contact build-up: o o o Use reed relays 4-wire DMM measurement Source a higher power signal

50 S.S.R. - Solid State Relay Photo-sensitive MOSFET Isolation barrier allows high voltage Infinite life when used within specifications

51 FET Switch Transistor (CMOS/JFET/PFET) Low control/signal isolation Very easily damaged Fast switching rate Unlimited lifetime

52 rows Switching Topologies General Purpose Matrix columns SPST SPDT Multiplexer Fault Insertion Unit (FIU) COM Fault Lines

53 A Switch for Every Application

Card Slots Anlog Bus Reed relay cards 0.

54 High-Density Switches - NI SwitchBlock Carrier Carrier Relay Card Relay Card Expansion Bridge Expansion Bridge 4 PXI Slots 6 Relay Card Slots Anlog Bus Reed relay cards 0.3 A: 4x86, 8x46, 16x22 1 A: 4x43, 8x21, 16x9, 4x21 (2w), 8x9 (2w) More cards in development

55 High-Density Switches - NI SwitchBlock Carrier Carrier Relay Card Relay Card Expansion Bridge Expansion Bridge Fits in between carriers Extends analog bus lines Connect multiple carriers together

56 Offerings of the NI SwitchBlock /advisors PXI

57 NI Switch Health Centre Integrated Relay Test Report Generation Relay Count Tracking 1,2,,N

58 Test Systems Signal Distribution DMM Switch Hardware Devices Under Test Digitizer Arb/FunctGen Matrix Power Supply Gen. Purpose RF Analyzer Mux RF Generator

NI FlexRIO System Architecture Open Firmware PXI/PXIe NI FlexRIO Adapter

FlexRIO Adapter Module Development Kit (MDK) for custom adapters NI FlexRIO

$compilations PXI Platform Synchronization Clocks\triggers Power Supply\Cooling$

59 NI FlexRIO System Architecture Open Firmware PXI/PXIe NI FlexRIO Adapter Module Interchangeable I/O Analog and digital, RF In/Out or RF In & Out NI FlexRIO Adapter Module Development Kit (MDK) for custom adapters NI FlexRIO FPGA Virtex-5 or Kintex-7 FPGA 132 digital I/O lines (up to 1Gb/s) Up to 2GB DDR3 DRAM Up to 1540 DSP Slices LabVIEW FPGA Cloud Compile Service for faster compilations PXI Platform Synchronization Clocks\triggers Power Supply\Cooling Data Streaming

NI FlexRIO Adapter Modules Digital I/O Oscilloscope/Analog IO capabilities 100 Mbps SE DIO 300 Mbps LVDS DIO 100MHz BW, 4.4 GHz RF I/O 200MHz BW, 4.4 GHz RF Rx 200MHz BW, 4.4 GHz RF Tx 2 ch.

60 NI FlexRIO Adapter Modules Digital I/O Oscilloscope/Analog IO capabilities 100 Mbps SE DIO 300 Mbps LVDS DIO 100MHz BW, 4.4 GHz RF I/O 200MHz BW, 4.4 GHz RF Rx 200MHz BW, 4.4 GHz RF Tx 2 ch. 3 GS/s, 8-bit AI 2 ch. 1.6 GS/s, 12-bit AI 300 Mbps SE/LVDS DIO 1 Gbps LVDS DIO 2 ch. 250 MS/s, 14-bit AI/16-bit AO 2 ch. 250 MS/s, 16-bit AI 4 ch. 250 MS/s, 14-bit AI 32 ch. 16 ch. 50 MS/s, 50 MS/s, 12-bit AI 14-bit AI 2 GS/s 14-bit AO Camera Link RS-485/422 2 ch. 100 MS/s, 14-bit AI/16-bit AO 2 ch. 40 MS/s, 12-bit AI 2 ch. 80 MS/s, 14- bit AI 2 ch. 120 MS/s, 16-bit AI 4 ch. 120 MS/s, 16-bit AI 2 ch GS/s, 14-bit AO

61 Coffee Break

62 Software Defines Testers Architecture Fixed Personality Software Defined (Virtual) VS.

63 HARDWARE SOFTWARE Components of an Automated Test System NI TestStand Test Management Software Test Management, Test Deployment NI LabVIEW Test Development LabWindows /CVI Software Other Software Measurement Studio, Visual Studio.NET, Drivers, Services, Hardware Abstraction IVI, VISA, NI-DAQ, NI-DMM, NI-SCOPE, NI-FGEN, NI-HSDIO, PC or Embedded Controller PXI Chassis Switching Signal Generation RF Measurements Bus Interfaces (GPIB/LXI/Serial) Fixturing/ Mass Interconnects

64 Drivers, Services, Hardware Abstraction Tools for hardware configuration, self-calibration and testing Soft-front panels no programming Switch management

65 Drivers - Oscilloscope Example Program the device using LabVIEW, LabWindows/CVI, C/C++ or Microsoft Visual Basic

66 Drivers - Oscilloscope Example ~75 Functions in 9 logical groups (timing, triggering, calibration, etc.) ~200 Properties grouped in 13 groups (acquisition, vertical, fetch, etc.) All functions and properties are well documented and often come with examples

Self-Calibration External Calibration Information Driver Version Management Display

67 NI Measurement & Automation Explorer (MAX) Central PXI System Management Application PXI System Identification Custom Module Naming PXI Module Self-Test PXI Module Self-Calibration External Calibration Information Driver Version Management Display Connectivity/Routing Info Identify/Control GPIB/USB Instruments Launch Test Panels/Soft Front Panels

68 Soft Front Panels (SFP) RF Signal Analyzer SFP NI-SCOPE and NI-SWITCH Soft Front Panels RF Signal Generator SFP

69 Application-Specific Tools (&SFPs) Sound and Vibration Tests Audio Tests (AudioMaster) RF Measurements Picture Quality Analysis Real-time Testing (VeriStand)

endpoints Validates routes and provides documentation Reduce switch code complexity Takes advantage of multimodule

70 NI Switch Executive Reuse and easily maintain test modules Abstracts low-level switch programming details (system-level API) Makes test code hardware agnostic Accelerate switch programming Automatically routes between endpoints Validates routes and provides documentation Reduce switch code complexity Takes advantage of multimodule integration in route groups NI Switch Executive Configuration in MAX NI Switch Executive Control in NI TestStand - Later today

validation with some automation CH3 Output HI PXIe-4141* CH2 Output HI

71 Signal Express Demo Configuration-based (no programming) Migrate easily to LabVIEW for test automation Used for quick concept validation with some automation CH3 Output HI PXIe-4141* CH2 Output HI CH2 Output LO * For NMOS current measurements consider PXIe-4139 with 100fA resolution

72 HARDWARE SOFTWARE Components of an Automated Test System NI TestStand Test Management Software Test Management, Test Deployment NI LabVIEW Test Development LabWindows /CVI Software Other Software Measurement Studio, Visual Studio.NET, Drivers, Services, Hardware Abstraction IVI, VISA, NI-DAQ, NI-DMM, NI-SCOPE, NI-FGEN, NI-HSDIO, PC or Embedded Controller PXI Chassis Switching Signal Generation RF Measurements Bus Interfaces (GPIB/LXI/Serial) Fixturing/ Mass Interconnects

73 Test Development Software Graphical programming - LabVIEW Express VI Technology Custom VI Openness (.m files, dll,.net, ActiveX) LabWindows/CVI for C developers Measurement Studio for Microsoft Visual Studio users

74 Express VIs for Quick Configuration Measurement and Analysis Express VIs Instrument Express VIs

examples 100+ data acquisition examples Examples available in NI LabVIEW,

76 Lower Level Programming in LabVIEW Example Finder - best starting point Exposes full functionality of instrument drivers 200+ PXI instrument examples 100+ data acquisition examples Examples available in NI LabVIEW, C++, VB,.NET NI-SCOPE Example Programs in LabVIEW NI-SCOPE Configured Acquisition

77 Reference Architectures Call NI Proof of Concept Code With Detailed Explanation System Consultation and Hardware/Software Requirements

Using LabVIEW and NI PXI to Test ASICs The Challenge: Designing and testing application-specific integrated circuits (ASICs) for physics and biology applications.

"Our virtual instrument is built on dedicated software written in LabVIEW, so the user can set proper test configurations, ASIC parameters, and readout data, then

78 Using LabVIEW and NI PXI to Test ASICs The Challenge: Designing and testing application-specific integrated circuits (ASICs) for physics and biology applications. The Solution: Using NI LabVIEW software and PXI hardware to create a virtual instrument to test ASICs as quickly as possible. "Our virtual instrument is built on dedicated software written in LabVIEW, so the user can set proper test configurations, ASIC parameters, and readout data, then analyze it illustrating the results on the graphical user interface. Thanks to this solution built on NI products, we have saved up to one year of testing." Author: Piotr Maj - AGH University of Science and Technology

79 HARDWARE SOFTWARE Components of an Automated Test System NI TestStand Test Management Software Test Management, Test Deployment NI LabVIEW Test Development LabWindows /CVI Software Other Software Measurement Studio, Visual Studio.NET, Drivers, Services, Hardware Abstraction IVI, VISA, NI-DAQ, NI-DMM, NI-SCOPE, NI-FGEN, NI-HSDIO, PC or Embedded Controller PXI Chassis Switching Signal Generation RF Measurements Bus Interfaces (GPIB/LXI/Serial) Fixturing/ Mass Interconnects

80 Test Management Software Do I need one? Architecture Unit vs Batch vs Parallel Testing Auto-scheduling

81 Common Needs No matter the industry, every company has testing needs for their products to ensure quality. A proper automated testing framework (either built in-house or off-the-shelf) should: 1. Provide a flexible, open test architecture 2. Eliminate programming of common test executive tasks 3. Enable reuse of existing test code 4. Simplify updates and long-term maintenance 5. Accelerate test system development 6. Ensure high test system performance

82 Role of Test Management Software Test System Components: Operations repeated for each device tested: Operator interfaces User management Unit Under Test (UUT) tracking Test flow control Archiving results Test reports Operations different for each device tested: Calibration Configuring instruments Data acquisition Measurements Analyzing results Test strategies

tested: Operator interfaces Test Management

tracking Test flow control Archiving results

83 Role of Test Management Software Test System Components: Operations repeated for each device tested: Operator interfaces Test Management Software User management Unit Under Test (UUT) tracking Test flow control Archiving results Test reports Operations different for each device tested: Calibration Configuring instruments Data acquisition Measurements Analyzing results Test strategies

84 NI TestStand Test Management Software Graphical development environment Automate tests written in any language Multithreaded sequence execution ASCII, HTML/Web, XML, and ATML report generation Access, Oracle, SQL Server database connectivity

85 NI TestStand Test Management Software Full Featured and Simple User Interfaces are provided in NI LabVIEW, NI LabWindows /CVI, C#, C++, and VB.NET TestStand Deployment Utility builds a simple installer with necessary dependencies

86 NI TestStand System Architecture

87 NI TestStand Sequence Editor Create Edit Manage Execute Debug View reports Deploy Create user profiles Customize

Numeric Limit Test Multiple Numeric Limit Test String Value

88 Sequence Editor Insertion Palette Double-click or drag/drop to add steps to your file Code module steps Pass/Fail Test Numeric Limit Test Multiple Numeric Limit Test String Value Test Action Step Flow control steps Message Popup step Synchronization

89 Sequence Editor Steps Pane

90 Sequence Editor Steps Pane Steps are placed inside sequences Sequences contain 3 groups: Setup Main Cleanup TestStand can call tests written in many different development environments Programmatically determine execution order with flow control steps

91 Sequence Editor Sequences Pane To run a test program, you execute sequences Sequences contain a group of related tests (aka Steps) Sequence files can contain a number of sequences, each with their own list of steps MainSequence is the top-level sequence

module LabVIEW code module steps populate with VI icon and

92 Sequence Editor Step Settings Module Tab Module tab automatically populates with parameters and functions of code module LabVIEW code module steps populate with VI icon and documentation Easily step into LabVIEW or LabWindows/CVI code with Edit button

complexity Reuse and easily maintain test modules Abstracts low-level

93 Switch Automation with NI Switch Executive Automatically routes between endpoints Use per-step switching in NI TestStand Reduces switch code complexity Reuse and easily maintain test modules Abstracts low-level switch programming details (system-level API) NI Switch Executive NI TestStand

94 Debugging Sequences Types of debugging tools: Execution tracing Breakpoint setting Watch Expression pane Single stepping tools Directly debugs LabVIEW code Resume button 2. Pause Execution button 3. Terminate Execution button 4. Step Into button 5. Step Over button 6. Step Out button 7. Resume All Executions button 8. Pause All Executions button 9. Terminate All Executions button

95 Sequence Editor Single Pass vs. Test UUTs Single Pass Executes test sequence once Often used during test development Test UUTs Sequentially loops through test sequence until stopped Often used for production as units roll off of assembly line Shows serial number dialog

96 TestStand Single UUT Demo Ease of automating existing code Tight integration with LabVIEW Debugging VIs Handle Complex Datatypes Use express functionality Debug into LabVIEW code

TestStand Execution Architecture Process Model Sequence file that contains all code not specific to one type of UUT Reporting Database logging Serial number scanning Reporting

97 TestStand Execution Architecture Process Model Sequence file that contains all code not specific to one type of UUT Reporting Database logging Serial number scanning Reporting information to a custom user interface Sequential, Parallel and Batch models are provided Whole companies or groups often standardize on a customized process model SequentialModel.seq

98 Sequential vs. Parallel vs. Auto-scheduled Execution Simple 1 UUT test fixture Extremely simple code structure 12 time blocks for 4 units Multiple UUTs in parallel Switching allows hardware to be shared ~30 60% decrease in testing time Same HW setup as above TestStand auto-schedules resources ~15 20% further decrease in testing time

99 Resource Usage Profiler Provides immediate visualization and performance statistics for all current executions, threads, and resources A fully optimized test should take 4X the longest test time Auto-Scheduled Sequential Parallel Execution Execution

100 TestStand Batch Demo Parallel, Serial or One-thread only execution Automated resource distribution Resource monitoring

101 TestStand Property and Database Demo Integrate TestStand solutions with existing systems Test limits, properties, settings and timing Loadable to database or file Writable to database or file

Run-Time User Interfaces Ideal for use in production environments or for simple development scenarios Customize the user interface to only show

102 Run-Time User Interfaces Ideal for use in production environments or for simple development scenarios Customize the user interface to only show essential information for operators Supports Localization User management Operator Technician Developer Custom Contact NI for licensing options

103 Provided TestStand User Interfaces Default Full UI Operator Mode

104 Provided TestStand User Interfaces Default Full UI Editor Mode ` ` `

TestStand Adoption Since releasing in 1999: Over 50,000 TestStand deployments Over 20,000 TestStand development licenses Cross-industry adoption TestStand Customers Lockhead Martin (Mil/Aero)

105 TestStand Adoption Since releasing in 1999: Over 50,000 TestStand deployments Over 20,000 TestStand development licenses Cross-industry adoption TestStand Customers Lockhead Martin (Mil/Aero) Flextronics (Electronics Mfg) Texas Instruments (Semiconductors) Cochlear (Healthcare) Askey (Consumer Electronics) Visteon (Automotive) CIMTEK (Automotive) Alstom (Transportation) G Systems (Semiconductors) Anoto AB (Imaging Equipment) Tektronix (Instrumentation) Harris (Communications) STMicroelectronics (Semiconductor)

106 NI Supports Your Success Through extensive services and Alliance Partner networks Your Solution Your Team Engineering, Services, and More Alliance Partners Integration and Consulting NI Services Training, Calibration, Maintenance, and More NI Products Ecosystem Users, IP, Add-Ons, and More

107 Assembly & Installation Services Your system assembled by NI certified technicians Test your system functionally before it leaves the factory

instructor-led and self-paced courses Custom training available

108 NI Global Training and Certification 25+ courses and 7 certification programs available Diverse training options include instructor-led and self-paced courses Custom training available >20,000 engineers trained annually >7,000 active certified developers and architects

109 Upcoming Training in Hungary Newest calendar available at: hungary./tanfolyamok/idopontok

Structures and data types How to read existing code Timing

110 Self-Paced Online Training Core LabVIEW Skills Included With Your Software Subscription What You ll Learn Environment basics Structures and data types How to read existing code Timing techniques Basics design patterns Building executables Software engineering basics

111 TOOLS FOR SELF-SERVICE

112 Build Your System Online - PXI Advisor /advisors PXI

113 PXI System Configuration Tool PXI Advisor

114 PXI System Configuration Tool PXI Advisor Guided Part Selection

115 PXI System Configuration Tool PXI Advisor Compatibility Check Allows only valid system configurations Example: Checks to make sure you have selected the correct number and types of controllers, chassis, and modules

116 Summary Complete test hardware and software No compatibility issues on HW-SW line From measurement to test automation and reporting all solutions are graphical environment (including graphical programming) Hardware platforms overview System chassis cooling, remote management, from 3 to 17 slots Controllers from low-cost & real-time to quad-core processors Modules Software o Modular Instruments from 7.5 digit DC to 26GHz RF o Switching o Devices with open firmware for custom DSP (FPGA, oscilloscopes) Code development environment graphical with LabVIEW, LabWindows/CVI for ANSI C code development Test management with TestStand - from step sequencer to databases integration and user management

117 Contact us National Instruments Hungary Kft. Infopark - E épület 1117 Budapest, Neumann János u. 1/E. 2. em. Telefon: Fax: ni.hungary@ Web: hungary.

118

Automated Test Equipments

Automated Test Equipments Elias Nicolas National Instruments - Arabia Tests and Measurements Interactive Measurements Benchtop Non-programmed Automated Measurements Data Acq, Instr I/O Programmed Automated