Optimizing SiP Test Cost with a Platform Approach

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2 Optimizing SiP Test Cost with a Platform Approach SiP Conferences China 2017 Pearl He Greater China Semi BDM National Instruments ni.com

3 The World of Converged Devices More capability defined in software Functions change rapidly Increasingly complex to design and test

4 Mission Statement NI equips engineers and scientists with systems that accelerate productivity, innovation, and discovery. ni.com

5 Revenue in millions USD $1.23 7,500+ EMPLOYEES 50+ COUNTRIES BILLION IN ,000+ CUSTOMERS WORLDWIDE OVER 18% INVESTMENT IN R&D $1,400 $1,200 $1,000 Long-Term Track Record of Growth $800 $600 $400 $200 $0 '87 '88 '89 '90 '91 '92 '93 '94 '95 '96 '97 '98 '99 '00 '01 '02 '03 '04 '05 '06 '07 '08 '09 '10 '11 '12 '13 '14 '15 '16

6 Committed to Your Success Worldwide Sweden Juarez Austin Guadalajara Munich Debrecen Incheon Zhengzhou Tokyo Seoul Hyogo Dongguan Guangzhou Shanghai Hangzhou Chennai Taipei City Xiamen Shenzhen Manila Penang Singapore Sao Paulo NI Headquarters NI Sales Offices (Sales Engineers) Systems and/or Applications Engineers R&D Development Centers Service Centers and/or Manufacturing Logistics Hubs NI Certified Calibration Centers

7 PXI Platform, LabVIEW, and TestStand National Instruments as a Test System Supplier Semiconductor Production Wireless Production Automotive Electronics 150,000+ PXI Systems Shipped Since ,000+ Global Research and Development Engineers Aerospace and Defense 1,000+ PXI Systems Deployed in Semiconductor Production Energy: Oil and Gas Academic Research Mobile Devices Consumer Electronics 700+ Alliance Partners and System Integrators 300+ NI Semiconductor Test Systems Deployed 40+ Regional Application Engineering Support Offices

8 Unique Attributes of Smart Devices - Common Test Needs CONVERGENCE LOWER PRICE RAPID CHANGE More functionality Ensure high reliability Lowest cost Fast time to market

9 Vendor Strategies for Test and Measurement C L O S E D P L A T F O R M Vendor knows best Fixed-functionality Closed ecosystem Customer pays Customer knows best Customizable solution Open, vibrant ecosystem Customer designs

10 Labs A Smarter Approach Production Floor Same Platform Maximize Leverage Code, setup, training Simpler correlation Faster test cycles Lower cost Designed for automation Optimized for measurement quality Fast test cycles Designed for test cell Optimized for throughput Cost effective

11 NI and the RF Semiconductor Industry Prototyping Semi Char. Semi Prod. Mobile Prod. NI serves the complete RF semiconductor value chain time Prototyping and Design R&D (characterization) Production Test Wireless Production Test

12 Markets for System-in-Package RF and wireless devices Integrated Passive Devices Solid-state drives (SSDs) Automotive applications IoT for wearable and machine to machine (M2M) products Power modules Source:

13 System-in-Package Implications on Test Diverse markets and applications Demand for plug-and-play Demand for lower total cost High volumes and rapid ramp cycles Economics of traditional test solutions disrupted!

14 Observed System-in-Package Test Challenges RF & Wireless, IOT DUT control often black-boxed Algorithms not optimized for test throughput, often not multi-thread safe Parallel test becomes required due to test times, but difficult due to black boxed functionality Exposed functionality more abstracted than at component test DUT control abstracted to higher-level protocols (TCP, USB, etc) Digital complexity reduced while Analog/RF complexity increased Tester footprint must = zero Common requirement to integrate all test equipment into handler cabinet This is almost more like testing a phone than a chip!

15 How can a platform approach help? ni.com

16 NI ECOSYSTEM THIRD-PARTY SOFTWARE ONE-PLATFORM APPROACH NI SERVICES AND SUPPORT Community 300,000+ Online Members 450+ User Groups 9,000+ Code Examples Academia 8,000+ Classrooms Worldwide Partners 1,000+ Alliance Partners Industry-Leading Technology Partners NI PRODUCTIVE DEVELOPMENT SOFTWARE NI MODULAR HARDWARE THIRD-PARTY HARDW ARE Support 700+ Field Engineers 700+ Support Engineers 50+ Worldwide Offices Add-Ons 400+ Software Add-Ons 5M+ Tools Network Downloads Open Connectivity 10,000+ Instrument and Device Drivers 1,000+ Sensor and Motor Drivers NI ECOSYSTEM

17 PXI System Overview PXI Backplane Data Transfer Timing Synchronization Triggering PXI Chassis Power Cooling System Monitoring Enclosure Multicore Embedded Controller PXI I/O Modules 600+ Products RF, DC, DIO

18 Broad Modular Instrumentation Portfolio DAQ and Control Multifunction I/O Counter / Timer / Clock Digital I/O Analog Input / Output Vision and Motion FPGA / Reconfigurable I/O Instrumentation Oscilloscopes High-Speed Digital I/O DMM & SMU Signal Generators Switching RF Analyzers & Generators Interfaces GPIB, USB, LAN RS232 / RS485 CAN, LIN, DeviceNet SCSI, Ethernet VXI - VME Boundary Scan / JTAG

19 Key Instruments for Semiconductor Test NI Vector Signal Transceiver (VST) FPGA-based servoing for measurement acceleration Up to 1 GHz instantaneous bandwidth for wide range of wireless technologies R&D-grade measurement performance with up to -50 db EVM for ax NI Source Measure Units (SMUs) Broad IV range: 200V(20W), 3A (10A pulse) Current resolution to 10fA Max sampling to 1.8MS/s SourceAdapt TM Technology for fast settling in presence of capacitive loads Best in class channel density NI Digital Pattern Instrument ATE-class digital (with PPMU) in PXI Out of the box Digital Pattern Editor software Time sets, drive formats, opcodes, HRAM, Source and capture, history RAM, Shmoo

20 NI Semiconductor Test Software Suite of software for test development, execution, and debug TestStand + TestStand Semiconductor Module Sequence Editor/Operator Interface Binning, Handler Integration, Pin/Channel Map, STDF, Multisite Built-in steps for common measurements (e.g. continuity, V cc, etc) Open interface to integrate 3 rd party instruments with multi-site support Digital Pattern Editor Code module development with NI LabVIEW/LabVIEW FPGA or C#/.NET STS Calibration and Diagnostics Software

21 Common Platform that Scales PXI Chassis and Controller PXI Instrumentation and Measurement Software LabVIEW or C# (Code Module Development) and TestStand (Test Management) STS Standardized Docking and Cabling Interface NI PXI NI STS T1 NI STS T2 NI STS T4

22 Observed System-in-Package Test Challenges Integrated Passive Devices Traditional testers do not have parallel capacitance/inductance instruments at low cost Traditional boxes missing factory integration features Production-ready Operator Interface Handler Control Binning Standard Datalogging (STDF) System calibration and diagnostics

23 Case Study SLT for Connectivity SiP The NI STS T1 is used for SiP(WiFi +BT) Test Quad site tester that communicates to a customdesigned handler STS Benefits: Vendor-supported ATE platform Test time: 17s vs 65s rack & stack solution Lower tester capital cost Zero footprint DC Power Supplies Bench Instruments Industrial PC BlueTooth WiFi

24 IPD Test Solution Overview PXIe Instrumentation 32x PXIe-4139 ±60 V, 3 A Precision System PXI Source Measure Units NI Software LabVIEW, TestStand, TestStand Semiconductor Module Handler Integration STDF Datalogging STS T2 Manipulator Support Electrical interface Docking interface Integrated Passive Device STS T2

25 Semiconductor Test Partner Ecosystem Test Development Services Manipulators/Docking Systems Load Board Design Services Mechanical Customizations Enterprise Data Analytics

26 Summary P L A T F O R M Customer knows best Customizable solution Open, vibrant ecosystem Customer designs The diversity of SiP markets and applications require test solutions that can scale to meet targeted needs. Traditional approaches for IC package and module test over-serve some requirements while not meeting others. A platform approach to SiP test allows customers to use the elements they need while avoiding the elements (and costs) they don t. When these elements are available on the same platform or within the ecosystem they can be effectively leveraged to reduce overall cost of test.