IEC Test Equipment Requirements

Transcription

1 OMICRON K IEC Test Equipment Requirements Dr. Alexander Apostolov K Page: 1

2 Intelligent Substation Automation Systems OMICRON K Page: 2 Intelligent Sensor Control Status Advanced Merging Unit Comms Gateway LAN Switch HMI Analysis Tools Configuration Tools Advanced Merging Unit Communications Based Protection IED Intelligent Sensor Control Status Advanced Merging Unit Protection IED Communications Based Protection IED Communications Based Control IED Communications Based Control IED Protection IED Protection IED Communications Based Monitoring/Recording IED Communications Based Monitoring/Recording IED

3 OMICRON K Page: 3 Intelligent Substation Automation Systems IMED IMED IEC IMED IMED IMED IMED Substation Substation Computer PCMR Unit IMED IMED IMED IMED IMED IMED IMED IMED

4 OMICRON K Page: 4 Intelligent Substation Automation Systems Substation HMI Substation Protection, Control, Monitoring & Recording (PCMR) Bay PCMR Bay PCMR Device PCMR Device PCMR Device PCMR Device PCMR

5 OMICRON K Page: 5 Substation Communications Architecture Substation HMI Substation Computer Router WAN Ethernet Switch Substation Bus IED IED IED IED SCADA Master Ethernet Switch Process Bus MU IOU IOU MU

6 Quality Process OMICRON K Page: 6

7 OMICRON K Page: 7 Type test The verification of correct behavior of the IEDs of the SAS by use of the system tested software under the environmental test conditions corresponding with the technical data. Marks the final stage of the hardware development and is the precondition for the start of the production. Type test must be carried out with IEDs that have been manufactured through the normal production cycle

8 OMICRON K Page: 8 System test System test is used to check the correct behavior of the IEDs and of the overall SAS under various application conditions. The system test marks the final stage of the development of IEDs as part of a SAS product family

9 OMICRON K Page: 9 Factory Acceptance Test (FAT) The factory acceptance test (FAT) is a customer agreed functional tests of the specifically manufactured SASinstallation or its parts, using the parameter set for the planned application. This test should be carried out in the factory of the system integrator by the use of process simulating test equipment

10 OMICRON K Page: 10 Site Acceptance Test (SAT) The site acceptance test (SAT) is the verification of each data and control point and the correct functionality inside the SAS and between the SAS and its operating environment at the whole installed plant by use of the final parameter set. The SAT is a precondition for the SAS being put into operation

11 OMICRON K Page: 11 Test responsibilities The manufacturer is responsible for the correct handling of type tests and system tests of his individual products and the SAS product family. Type tests and system tests are preconditions for starting the regular delivery. All IEDs have to pass device specific routine tests defined by the manufacturer to ensure quality before the products are handed over for delivery.

12 OMICRON K Page: 12 Test responsibilities Customer specific verifications and approvals may be required according to the customer s philosophy and shall be negotiated between the system integrator and the customer. The system integrator is obliged to prepare and carry out these special investigations with individual products and the overall SAS. The system integrator is obliged to prove the fulfillment of the technical requirements, including performance criteria.

13 OMICRON K Page: 13 Test responsibilities When introducing an SAS, the system integrator is responsible for ensuring that all functions are jointly tested by the representatives of the system integrator and the customer The Factory Acceptance Test (FAT) is optional The Site Acceptance Test (SAT) is mandatory Both are performed with the specific configuration and parameter set of the customer.

14 OMICRON K Page: 14 Test responsibilities The successful finishing of the FAT (if required) is the precondition for the equipment delivery and the further site acceptance test at the customer s premises. FAT and SAT, as well as their contents, shall be negotiated between the customer and the system integrator. The commissioning of the SAS on site is normally the responsibility of the system integrator. Commissioning is followed by a trial operation phase.

15 OMICRON K Page: 15 Test Equipment Test equipment: all tools and instruments which simulate and verify the input/outputs of the operating environment of the SAS such as switchgear, transformers, network control centers or connected telecommunication units on the one side, and the communication channels between the IEDs of the SAS on the other The test equipment shall support: normal process simulation transient and fault process simulation communication check and simulation

16 OMICRON K Page: 16 Normal Process Test Equipment Basic Process test equipment must be able to provide: all alarms and position indications for the substation control system enable the simulation of measured values (including overrange) be able to display all commands from the SAS.

17 OMICRON K Page: 17 Normal Process Test Equipment More complex test equipment must be able to simulate reactions of the switchgear in real time. There is a need to be able to generate various conditions for the reactions, such as to simulate an earth fault on one busbar section during a switching sequence. Test equipment should also be capable of generating a large quantity of data traffic in a short time or intermittent data traffic on a regular basis.

18 OMICRON K Page: 18 Transient and Fault Test Equipment This test equipment should be capable of injecting programmable transients of voltages and currents in a three-phase power system. It shall allow the simulation of many kinds of faults or other abnormal conditions such as: Short circuit faults Power swing Saturation of current transformers Others The test equipment should be capable of producing simulated faults, thus producing disturbance records.

19 OMICRON K Page: 19 Communications Test Equipment This test equipment is used for performing tests at all communication channels for: internal links of the SAS telecommunication The communication test system should be a convenient and efficient tool which enables the performance of the following functions at all required levels (network control center, substation, bay and process level): simulation of a server, simulation of a client, monitoring of the data traffic; quality analysis of the data traffic (for example, the quality of electrical signals, time breaks, etc.).

20 OMICRON K Page: 20 Basic Test Requirements The manufacturer should provide a test concept that covers all activities beginning with prototype functional tests in the development state to the final type and system tests. The scope and object of tests, the test procedures and the passing criteria must be specified. All tests shall be documented in such a way that the results are reproducible. All tests should be performed by an internal part of the manufacturer s organization that is qualified for performing the tests and has the organizational independence to state whether a product has passed the tests or not.

21 OMICRON K Page: 21 System Test Requirements The system test is the proof of correct functionality and the performance of each IED under different application conditions (different configuration and parameters) and in co-operation with other IEDs of the overall SAS product family including all tools.

22 OMICRON K Page: 22 Type Test Requirements The fitness for use of a newly designed product shall be proven by a type test. The type test shall be performed using samples from the manufacturing process. The type test is the verification of the product against the technical data which are specified, such as: mechanical withstandability electromagnetic compatibility climatic influences functional correctness and completeness

23 OMICRON K Page: 23 Routine Test Requirements The routine test consists of special hardware and functionality tests The routine tests should be carried out for each product before leaving the manufacturer. Routine tests include: Function tests Insulation test Burn-in test

24 OMICRON K Page: 24 Conformance Test The conformance tests are performed on the communication channels of IEDs. They include the verification of the communication procedure in accordance with the standard or its parts. Conformance Testing is defined in IEC

25 OMICRON K Page: 25 Required documentation Model Implementation Conformance Statement (MICS): details the standard data object model elements supported by the system or device The Protocol Implementation Conformance Statement (PICS) is a summary of the capabilities of the system to be tested. Protocol Implementation extra Information for Testing (PIXIT) contains system specific information regarding the capabilities of the system to be tested and which are outside the scope of the standard. The PIXIT shall not be subject to standardisation.

26 Conformance Test Process OMICRON K Page: 26

27 OMICRON K Page: 27 Conventional Multifunctional IED Performance Process Analog Sensor Sensor Module Function Module Outputs Module Process Control Status Sensor Input Module Multifunctional IED Process Process Event Start Event End t SM t FM t OM t PC t EVT

28 OMICRON K Page: 28 IEC Based Hybrid Function Performance Process Merging Unit Protection IED Analog Sensor Sensor Module Interface Module LAN Switch Interface Module Function Module Outputs Module Status Sensor Input Module Interface Module Process Control Process Input/Output Unit Process Event Start Event End t SM t IM1 t LAN t IM2 t PM t OM t PC t EVT

29 OMICRON K Page: 29 IEC Based Hybrid Function Performance Process Merging Unit Analog Sensor Sensor Module Interface Module LAN Switch GOOSE Interface Module SAV Interface Module Protection IED Function Modules Outputs Module Process Control Process

30 OMICRON K Page: 30 IEC Based Function Performance Process Merging Unit Protection IED Analog Sensor Sensor Module Interface Module LAN Switch Interface Module Function Module Status Sensor Input Module Interface Module Process Outputs Module Control Interface Unit Process Control Event Start Event End t SM t IM1 t LAN1 t IM2 t FM t IM3 t LAN2 t IM4 t OM t PC t EVT

31 OMICRON K Page: 31 Functionality Protection Control Monitoring Recording Analysis Metering Remote interface

32 OMICRON K Page: 32 Conventional Functional Test Setup Multifunctional IED V I 52a Trip Test Device Laptop Computer

33 OMICRON K Page: 33 Test setup Ethernet Switch Laptop Computer GOOSE or GSSE Ethernet IEC Based IED V I GOOSE or GSSE Trip Ethernet IEC Based Test Device

34 OMICRON K Page: 34 Test setup Laptop Computer Ethernet Switch Ethernet GOOSE or GSSE GOOSE or GSSE IEC Based MU V I IEC Based IED Trip Ethernet IEC Based Test Device

35 NET-1 1 Option for the CMC 256 OMICRON K Page: 35

36 NET-1 1 Option for the CMC 256 OMICRON K Page: 36

37 OMICRON K Page: 37 Protection Testing Conventional Hard-Wired Protection Relay Sampled Values Test Set Hard-wired Analog Signals Hard-wired binary outputs to binary inputs GSE

38 OMICRON K Page: 38 The Vision: Fully Networked Protection Testing GOOSE, GSSE Protection Relay Test Set SV (Sampled Values)

39 The GOOSE Module OMICRON K Page: 39

40 OMICRON K Page: 40 GOOSE Module Functions Configuration of the CMC NET-1 Subscriptions Simulations (Publishing GOOSE) Editing GOOSE Data GOOSE Parameters Datasets Mapping To / from binary Inputs / Outputs Importing GOOSE Data from SCL

41 OMICRON K Page: 41 OMICRON's Layering Test Modules Binary Inputs Binary Outputs GOOSE Subscriptions Mappings Network GOOSE Simulations

42 OMICRON K Page: 42 Getting the GOOSE Data Import SCL File File Import Configuration SCL File (*.icd, *.cid, *.scd) All GOOSE Data are imported Both for Subscription and Simulation Delete what is not needed / wanted New Import adds Data again Eventually Edit GOOSE Data

43 OMICRON K Page: 43 GOOSE Parameters Identification (GOOSE Header) Dataset (Payload)

44 Mapping is Simple OMICRON K Page: 44

45 OMICRON K Page: 45 Virtual Wiring GOOSE Configuration is another Type of HCC Binary I/Os of Test Set are assigned Fully Automatic Totally virtual No changing of Wires No User Interaction

46 OMICRON K Page: 46 Multiple GOOSE Mappings Map only Data needed for a Specific Test Re-Assign Binary I/Os of the Test Set as needed Fully automatic Use Standard Assignments Bin In 1 = Trip Bin In 2 = Start Minimal Setup Work Re-use of Existing Test Plans

47 Test setup OMICRON K Page: 47

48 Test results OMICRON K Page: 48

49 Test results OMICRON K Page: 49

50 OMICRON K Page: 50 The IEC Functional System Test ICD File ICD File IEC Standard System Configuration Tool SCD File Network System Simulator Scheme Testing Tool IEC Standard Test Configuration Tool Other Test Modules IED IED IED Simulator Simulator Simulator MU Simulator MU Simulator MU Simulator Test Device

51 OMICRON K Page: 51 The IEC Functional System Test IEC Standard System Configuration Tool SCD File IEC Standard IED Configuration Tool Network System Simulator CID File CID File CID File Scheme Testing Tool IEC Standard Test Configuration Tool Other Test Modules IED IED IED Simulator Simulator Simulator MU Simulator MU Simulator MU Simulator Test Device Test Device Test Device