Impact of IEC Edition 2 on Functional Testing of Protection Systems. Dr. Alexander Apostolov March 2018 San Francisco, CA
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1 Impact of IEC Edition 2 on Functional Testing of Protection Systems Dr. Alexander Apostolov March 2018 San Francisco, CA
2 Questions What are we doing? Why are we doing it? How are we doing it? Page 2
3 What are we doing? Improving the efficiency of testing of digital substations Page 3
4 Why are we doing it? To improve the reliability of the electric power system To reduce the duration of outages To improve the efficiency of the use of the time of testing crews To improve safety Page 4
5 Improving Efficiency Efficiency: the extent to which a resource is used in order to effectively achieve an objective Minimize the resources being used to perform the testing Minimize the impact of the testing on the availability of the power system components and protection Page 5
6 Quality Assurance Process
7 Conventional Protection Testing Test Switch Distance Protection Analog Inputs Module Waveform Recording Data Bus V, I, V0, I0, V2, I2 I Relay Outputs Module Distance Protection Module Opto Inputs Module Distance Protection Scheme Test Device Page: 7
8 How are we doing it? It depends! Page 8
9 Conventional Isolation Page 9
10 Digital substation Intelligent Sensor Control Status Advanced PI Unit Advanced PI Unit Intelligent Sensor Control Status Advanced PI Unit Protection IED Comms Gateway LAN Switch HM I Analysis Tools Configuration Tools Communications Based Protection Communications Based Protection Communications Based Control IED Communications Based Control IED Protection IED Protection IED Communications Based Monitoring/Recording Communications Based Monitoring/Recording
11 NCIT with embedded MU Protection IED Waveform Recording Process Interface Module NCIT IEC Data Bus V, I, V0, I0, V2, I2 I Protection Function Element Event Report Opto Inputs Module Page: 11
12 Process Bus interface U/I sensors UAS UAL PI station bus with 8-1 and 9-2 traffic I sensors IA1 IAL PI switch control PI I sensors IA2 PI actor IB1 PI PI IED PMC1 I sensors IB2 IC1 PI PI PMC2 switch control PI I sensors IC2 ICL PI U/I sensors UCS UCL PI
13 Digital Substation Test Setup Ethernet Switch Test Computer GOOS E and SV Etherne t GOOS E and Etherne SV t IEC Based IED IEC Based Test Device K Page: 13
14 Separating Test and Normal information Control Service Test = FALSE GOOSE data q.test = FALSE IED Beh = ON Beh = TEST Output to process processed not processed Control Service Test = TRUE GOOSE data q.test = TRUE IED Output to process Beh = TEST processed Beh = TEST-BLOCKED not processed Page 14
15 Simulation Bit 15
16 Input Reference 16
17 Ed. 2 Mirroring Control Info IED Control service oprcvd opok topok ctlval Wired output A. Command is sent to Data Object B. Response is to set the Data Attribute oprcvd C. opok is set with same timing as wired output D. topok has same time stamp as wired output and opok. E. The attributes are produced independent of the wired output F. Wired Output is Not produced if MOD=TEST-BLOCKED.
18 Edition 2 hierarchy of LDs PIED Logical Device PROT LLN0 LPHD LLN0 LLN0 PIOC1 LD ocp LD gnd LLN0 PTOC 1 PTOC 2 PDIR1 PIOC1 Logic al Nodes LD phs PTOC 1 PTOC 2 PDIR1 PTRC1 RREC 1
19 Hierarchy of logical devices PROT/LLN0.Mod ocp/lln0.mod ocp/lln0.beh gnd/lln0.mod gnd/lln0.beh gnd/lnxx.mod gnd/lnxx.beh LD PROT LD ocp LD gnd LLN0 LLN0 GrRef LLN0 GrRef LN xxxx
20 Bottom-up and Top-down testing Page 20
21 Why do we need remote testing? Page 21
22 Remote Testing
23 The benefits No travel time Minimum setup time Independent of weather conditions Improved PACS availability Reduced outage time Page 23
24 The challenges Changes in test philosophy Changes in test procedures Test object and test system isolation Test equipment availability in the substation Remote access capability Cyber security Page 24
25 Conclusions Edition 2 of IEC introduced many new features that further enhance the power of the standard. They are designed to support not only automated configuration and execution of test procedures, but also remote testing for some specific test cases. Using remote testing by controlling the test system in a remote substation from the convenience of the engineering office brings significant benefits by improving efficiency and safety, as well as reducing outage times. Page 25
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