ST-ATAC. Dynamic 3D Probe Head with Adaptive Touch Advanced Control

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1 Industrial Measuring Technology from Carl Zeiss ST-ATAC. Dynamic 3D Probe Head with Adaptive Touch Advanced Control SIMPLY MEASURE

2 Spectrum of Applications Fast, dynamic data acquisition by means of single-point probing in the production of automobiles, machines, tools and patterns totally free from probe bending and mechanical hysteresis. Sturdy, durable, wear-free design, and all with high sensibility constant in all spatial directions and therefore directionally independent. Flexible, universal,reliable For all length measurements on prismatic parts or quick point sequences on any surfaces. Complete testing of the workpiece using only a few probe combinations. A plausibility test is available to identify probing errors. Complete collision protection of the mobile probe part. All also possible with long probes even if they are mounted laterally for the measurement of deep bores and even with very high probe masses. Optimal use of measuring volume If spatial probe orientation is performed using articulating probe holders, valuable measuring space is lost primarly in the Z-range, but also in the X- and Y-directions: Much larger CMMs are required for workpieces of the same size. The use of probe changing system greatly reduces this loss in measuring volume. Drastically reduced setting-up times Prequalified probe combinations eliminate the preparation times otherwise needed to configurate the probes. Your CMM is instantly ready for use. With articulating probe holders, a serious part of CMM measuring range gets lost. Articulating probe holder With ST-ATAC, the CMM measuring range is optimally used. ST-ATAC typical Z-measuring range lost area remaining meas. range lost area lost area Zeiss-typical nomination of Z-measuring range: from lower edge of adapter plate

3 High-accuracy probe change Highly accurate electromagnetic mounting mechanism provides a repeatability of within 1 µm without recalibration. The Probe change can be performed manually or CNC controlled in connection with a probe change magazine. Fully automatic measurement Due to the use of a probe changing system. Uninterrupted multi-shift operation for the measurement of different parts even with automatic loading. Simple operation Brief probe changing times, only one CNC calibration. An appropriately configurated probe combination can be assigned to each workpiece. Data storage All calibration data is stored and can be recalled at a later time. Measuring ranges: Probe systems in comparison ST-ATAC with probe changer Articulating probe holder

4 Technology The unique combination of the technical features gives the ST-ATAC a wide application spectrum at a high precision. Dual principle Piezoelectric elements supply the actual probing pulse. They are located in front of the buckling mechanism. Three-point bearing as a mechanical buckling mechanism, to acknowledge the probing contact and protect the ST when contact is made or a collision occurs. First, virtually force-free probing pulse, then mechanical deflection: condition for reliable probing. Force-free and direction-independant probing The probing pulse is generated on the slightest contact with the part with a measuring force of less than 0.01 N, in other words, virtually forcefree.the probing pulse is generated prior to the mechanical probe head deflection, with the reading of the length-measuring system being stored. These two conditions must be met before the measured data can be recorded. As a result, the deflection forces, which differ as a function of the bearing and direction, do not affect the measuring result: The ST-ATAC provides constant accuracy in all probing directions. No special calibration is required when measuring probing objects inclined in three dimensions. Mechanical contact closed Measuring force on contact < 0.01 N ATAC for even better probing security Piezo signal Mechanical contact open Electr. signal Piezo signal a) e.g. with standard probing conditions b) e.g. with light drilling oil contamination intelligent on-line computation of contact point trigger treshold c) e.g. with flexible workpiece materials and very thin probes contact point probing pulses

5 Specifications General Design Probe mounting system ST-ATAC Directionally independent 6-way probe head with dual principle (mechanical and piezo pulses). For single-point measurement Held electromagnetically via adapter plates Adapter plate diameter = 44 mm (1.7 in.) Performance Data Probing directions 6; ±X, ±Y, ±Z Measuring force on data transfer < 0.01 N at mechanical deflection: Vertical: up to 5 N Horizontal: up to 1,4 N Overshoot X, Y: ±14 mm (±0.55 in.) Z: ± 7 mm (±0.28 in.) Permiss. probe mass 200 g (0.44 oz) Permiss. probe length 200 mm (8 in.) Min. ball tip diameter Standard 1.5 mm (0.06 in.) Special probes 1.0 mm (0.04 in.) Probe changing repeatability 1 µm / 200 mm probe length ( in. / 8 in. probe length) Repeatability 0.5 µm / 60 mm probe length ( in. / 2.36 in. probe length), with 8mm (0.31 in.) ball tip diameter Permissible sound level 75 dba at sinusodial excitation 80 dba noise Permissible environmental Conditions Ambient operating temperature +5 C to +40 C (41 F to 104 F)

6 Carl Zeiss Unternehmensbereich Industrielle Meßtechnik D Oberkochen Sales: / Service: / Fax: / Internet: e Printed in Germany. VII/99 Noo Subject to technical modification and to changes in scope and design. Printed on chlorine-free paper. Carl Zeiss conception, text and design: Carl Zeiss.