EMC TEST REPORT (Class B)

Transcription

1 Page 1 of 60 EMC TEST REPORT (Class B) REGULATORY MODEL NUMBER: REGULATORY TYPE: N/A REPORT NUMBER: TA11008C#1 ISSUED DATE: December 07, 2012 Applicant: LSI Corporation 3718 N. Rock Road Wichita, KS USA Manufacturer: LSI Corporation 3718 N. Rock Road Wichita, KS USA Issued By: Inventec Corporation (Taoyuan) EMC Lab No. 349, Section 2, Jen-Ho Road, Tachi Town, Taoyuan, Taiwan, Republic of China Receipt date of EUT: May 27, 2011 Date of testing: May 27, 2011 ~ June 08, 2011 Approved By Jane Lin / EMC Lab Manager Inventec Corp. (Taoyuan) EMC Lab The test results in this report only apply to the tested sample. This report should not be reproduced, except in full, without the written approval of Inventec Corporation.

2 Page 2 of 60 Table of Contents Page Table of Contents Page 1. RELEASE CONTROL RECORD PRODUCT INFORMATION PRODUCT DESCRIPTION PRODUCT FEATURE PRODUCT BLOCK DIAGRAM PRODUCT COMPONENTS TEST INFORMATION TEST MODE DESCRIPTION EUT OPERATING CONDITIONS SUMMARY OF TEST RESULTS MEASUREMENT UNCERTAINTY TEST FACILITY TEST SETUP CONDUCTED EMISSION MEASUREMENT TEST LIMIT TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF CONNECTIONS BETWEEN EUT AND TEST PERIPHERAL BLOCK DIAGRAM OF TEST SETUP TEST DATA CALCULATION RADIATED EMISSION MEASUREMENT TEST LIMIT TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF RADIATED BETWEEN EUT AND TEST PERIPHERAL BLOCK DIAGRAM OF TEST SETUP TEST DATA CALCULATION POWERLINE HARMONIC MEASUREMENT TEST LIMIT TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF POWERLINE HARMONIC BETWEEN EUT AND TEST PERIPHERAL BLOCK DIAGRAM OF TEST SETUP TEST DATA VOLTAGE FLICKER MEASUREMENT TEST LIMIT AND TEST DATA TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF VOLTAGE FLICKER BETWEEN EUT AND TEST PERIPHERAL BLOCK DIAGRAM OF TEST SETUP ELECTROSTATIC DISCHARGE IMMUNITY TEST APPLY LEVEL TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION LOCK DIAGRAM OF TEST SETUP TEST DATA PHOTOGRAPHS OF TEST POINT RADIO FREQUENCY ELECTROMAGNETIC FIELD IMMUNITY TEST APPLY LEVEL TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF TEST SETUP TEST DATA ELECTRICAL FAST TRANSIENT / BURST IMMUNITY TEST APPLY LEVEL TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF TEST SETUP TEST DATA POWERLINE SURGE TRANSIENT IMMUNITY TEST APPLY LEVEL TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF TEST SETUP TEST DATA CONDUCTED RF IMMUNITY TEST APPLY LEVEL TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF TEST SETUP TEST DATA POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST APPLY LEVEL TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF TEST SETUP TEST DATA VOLTAGE DIPS/INTERRUPTION IMMUNITY TEST APPLY LEVEL AND TEST DATA TEST INSTRUMENTS SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION BLOCK DIAGRAM OF TEST SETUP PRODUCT LABELING PHOTOGRAPHS... 50

3 Page 3 of RELEASE CONTROL RECORD Issue No. Reason For Change Date Issued Original release N/A June 22, 2011 Second release Revised standard version. December 07, 2012

4 Page 4 of PRODUCT INFORMATION 2.1. PRODUCT DESCRIPTION Product Type: PCI-E SAS HBA Card (Host Bus Adaptor Card) Regulatory Model: Regulatory Type: N/A SR (with DDR3 512MB Memory Module) Serial Number: SR (with DDR3 1GB Memory Module) Firmware Version: TEST-SNANDURI-09A6-PL-Ver _CFGI-Ver Host System: HSTNS-2123 (Server) Host Operating System: Windows Server 2008 R2 Condition: Engineering Sample Brand: LSI Applicant: LSI Corporation 3718 N. Rock Road Wichita, KS USA Issued By: Inventec Corporation (Taoyuan) EMC Lab No. 349, Section 2, Jen-Ho Road, Tachi Town, Taoyuan, Taiwan, Republic of China Standard: EN 55022:2010, EN 55022:2010/AC :2011 and CISPR 22:2008 EN :2006 +A1:2009 +A2:2009 and EN :2002 +A1:2009 EN :2008 EN 55024:2010 and CISPR 24:2010 EN :2009 EN :2006 +A1:2008 +A2:2010 EN :2004 +A1:2010 EN :2006 EN :2009 EN :2010 EN : PRODUCT FEATURE Feature Description LSI SAS 2208R SAS Interface Controller PCI Express 3.0 x8 lane slot Two internal horizontal mini SAS4i connectors Attached Transportable Flash Module and remote connection to super cap Local/Remote connection to an ibbu Note: The above EUT information was declared by manufacturer, and for more detailed features description please refers to the manufacturer s specifications or User s Manual.

5 Page 5 of PRODUCT BLOCK DIAGRAM Remote BBU connector Local BBU connector Transportable Flash Module connector PCI-E 3.0 x8 lane slot LSI SAS2208R Internal Port 0 minisas4i Connector Internal Port 1 minisas4i Connector Y2L1 25MHz Y3A MHz

6 Page 6 of PRODUCT COMPONENTS Component Manufacture Model / Part Number Serial Number PCI-E SAS HBA Card LSI (with DDR3 512MB Memory Module) SR PCI-E SAS HBA Card (with DDR3 1GB Memory Module) LSI SR Flash Module LSI L SR Host System (Server) HP HSTNS-2123 CN D Motherboard HP 1395T Y707MP2359 CPU Intel E GHz/1066MHz Memory HC HYNIX HMT125R7BFR8C-H9 TB AB-C (DDR3 2GB) DC HDD (3.5 SATA 1TB), for OS Seagate ST NS 9WK017T5 HDD (2.5 SAS 146GB) HP DG0146FAMWL 3SD1DW33 3SD1DKDZ 3SD1DXKB 3SD1E7VB 3SD1DXGC 3SD1EDJX 3SD1ECT4 3SD1DYF1 HDD (2.5 SATA 60GB) FUJITSU MHW2060BK G2 K30HT88254PC K30HT88254M6 K30HT88254LT K30HT88254KN K30HT88254KP K30HT88254LW K30HT88254KU K30HT88254KS Power Supply (1200W) HP (LITE-ON) HSTNS-PL

7 Page 7 of TEST INFORMATION 3.1. TEST MODE DESCRIPTION TEST MODE OF CONDUCTION The EUT has been pre-tested as following modes: Mode Processor Storage PCI-E SAS HBA Card Power Voltage Mode 1 Mode 2 Mode 3 Mode 4 Intel E5520 Processor 2.27GHz/1066MHz Intel E5520 Processor 2.27GHz/1066MHz *1 2.5" SATA HDD 60GB *8 *1 2.5" SATA HDD 60GB *8 Intel E5520 Processor *1 2.5" SATA HDD 2.27GHz/1066MHz 60GB *8 Intel E5520 Processor *1 2.5" SAS HDD 2.27GHz/1066MHz 146GB *8 With DDR3 1GB Memory Module With DDR3 1GB Memory Module and Flash Module With DDR3 512MB Memory Module With DDR3 512MB Memory Module HSTNS-PL11 *1 110V/60Hz HSTNS-PL11 *1 110V/60Hz HSTNS-PL11 *1 110V/60Hz HSTNS-PL11 *1 110V/60Hz According to pre-tested data, Mode 4 was the worst combination for final test and description as following: Component Manufacture Model / Part Number Type / Specification PCI-E SAS HBA Card LSI With DDR3 512MB Memory Module Board HP 1395T Motherboard CPU Intel E GHz/1066MHz *1 Memory HYNIX HMT125R7BFR8C-H9 TB AB-C DDR3 DIMM (2GB) *2 HDD (for OS) Seagate ST NS 3.5 SATA (1TB) *1 HDD HP DG0146FAMWL 2.5 SAS (146GB) *8 Power Supply HP (LITE-ON) HSTNS-PL W 10A/7.8A, 50/60Hz, 100V-120V, 200V-240V AC

8 Page 8 of TEST MODE OF RADIATION (30MHz~1000MHz) The EUT has been pre-tested as following modes: Mode Processor Storage PCI-E SAS HBA Card Power Voltage Mode 1 Mode 2 Mode 3 Mode 4 Intel E5520 Processor *1 2.5" SAS HDD 2.27GHz/1066MHz 146GB *8 Intel E5520 Processor *1 2.5" SAS HDD 2.27GHz/1066MHz 146GB *8 Intel E5520 Processor 2.27GHz/1066MHz Intel E5520 Processor 2.27GHz/1066MHz *1 2.5" SAS HDD 146GB *8 *1 2.5" SATA HDD 60GB *8 With DDR3 1GB Memory Module With DDR3 512MB Memory Module With DDR3 1GB Memory Module and Flash Module With DDR3 1GB Memory Module HSTNS-PL11 *1 110V/60Hz HSTNS-PL11 *1 110V/60Hz HSTNS-PL11 *1 110V/60Hz HSTNS-PL11 *1 110V/60Hz According to pre-tested data, Mode 1 was the worst combination for final test and description as following: Component Manufacture Model / Part Number Type / Specification PCI-E SAS HBA Card LSI With DDR3 1GB Memory Module Board HP 1395T Motherboard CPU Intel E GHz/1066MHz *1 Memory HYNIX HMT125R7BFR8C-H9 TB AB-C DDR3 DIMM (2GB) *2 HDD (for OS) Seagate ST NS 3.5 SATA (1TB) *1 HDD HP DG0146FAMWL 2.5 SAS (146GB) *8 Power Supply HP (LITE-ON) HSTNS-PL W 10A/7.8A, 50/60Hz, 100V-120V, 200V-240V AC

9 Page 9 of TEST MODE OF RADIATION (ABOVE 1GHz) The EUT has been pre-tested as following modes: Mode Processor Storage PCI-E SAS HBA Card Power Voltage Mode 1 Mode 2 Mode 3 Mode 4 Intel E5520 Processor *1 2.5" SAS HDD 2.27GHz/1066MHz 146GB *8 Intel E5520 Processor *1 2.5" SAS HDD 2.27GHz/1066MHz 146GB *8 2.5" SAS HDD Intel E5520 Processor *1 146GB *8 2.27GHz/1066MHz Intel E5520 Processor 2.27GHz/1066MHz *1 2.5" SATA HDD 60GB *8 With DDR3 1GB Memory Module With DDR3 512MB Memory Module With DDR3 1GB Memory Module and Flash Module With DDR3 1GB Memory Module HSTNS-PL11 *1 110V/60Hz HSTNS-PL11 *1 110V/60Hz HSTNS-PL11 *1 110V/60Hz HSTNS-PL11 *1 110V/60Hz According to pre-tested data, Mode 4 was the worst combination for final test and description as following: Component Manufacture Model / Part Number Type / Specification PCI-E SAS HBA Card LSI With DDR3 1GB Memory Module Board HP 1395T Motherboard CPU Intel E GHz/1066MHz *1 Memory HYNIX HMT125R7BFR8C-H9 TB AB-C DDR3 DIMM (2GB) *2 HDD (for OS) Seagate ST NS 3.5 SATA (1TB) *1 HDD FUJITSU MHW2060BK G2 2.5 SATA (60GB) *8 Power Supply HP (LITE-ON) HSTNS-PL W 10A/7.8A, 50/60Hz, 100V-120V, 200V-240V AC

10 Page 10 of TEST MODE OF POWERLINE HARMONIC, VOLTAGE FLICKER, AND IMMUNITY TESTS The EUT test mode: Mode Processor Storage PCI-E SAS HBA Card Power Voltage Mode 1 Intel E5520 Processor 2.27GHz/1066MHz *1 2.5" SAS HDD 146GB *8 The EUT description used for test was as following: With DDR3 512MB Memory Module HSTNS-PL11 *1 110V/60Hz Component Manufacture Model / Part Number Type / Specification PCI-E SAS HBA Card LSI With DDR3 512MB Memory Module Board HP 1395T Motherboard CPU Intel E GHz/1066MHz *1 Memory HYNIX HMT125R7BFR8C-H9 TB AB-C DDR3 DIMM (2GB) *2 HDD (for OS) Seagate ST NS 3.5 SATA (1TB) *1 HDD HP DG0146FAMWL 2.5 SAS (146GB) *8 Power Supply HP (LITE-ON) HSTNS-PL W 10A/7.8A, 50/60Hz, 100V-120V, 200V-240V AC 3.2. EUT OPERATING CONDITIONS The EUT should run the programs listed below during the test. Run the program WinHpattern.exe on host server with full screen display, and let EUT to read and write data to all the HDDs. Run the Smasher.exe on host server, and let EUT to read and write data to all the HDDs.

11 Page 11 of SUMMARY OF TEST RESULTS The worst data was found as following: Test Standard Test Item Remarks Result Conducted Worst emission frequency is 1.48MHz at Neutral Emission for Mains PASS And minimum passing margin is 7.98dB, Average Ports EN 55022:2010, EN 55022: 2010/AC :2011 and CISPR 22: 2008 EN : A1:2009 +A2:2009 and EN : A1:2009 EN : 2008 EN : 2009 EN : A1:2008 +A2:2010 EN : A1:2010 EN : 2006 EN : 2009 EN : 2010 EN : 2004 Conducted Emission for Telecommunication Ports Radiated Emission (30MHz~1000MHz) Radiated Emission (Above 1GHz) Powerline Harmonic Voltage Flicker Electrostatic Discharge Immunity Test Radio Frequency Electromagnetic Field Immunity Test Electrical Fast Transient/Burst Immunity Test Powerline Surge Transient Immunity Test Conducted RF Immunity Test Power Frequency Magnetic Field Immunity Test Voltage Dips/ Interruption Immunity Test N/A Not applicable PASS PASS Worst emission frequency is MHz at Horizontal And minimum passing margin is 4.31dB, Quasi-Peak Height of antenna is 1.23m Angle of turntable is 186deg. Worst emission frequency is MHz at Horizontal And minimum passing margin is 5. 90dB, Average Height of antenna is 1.29m Angle of turntable is 42deg. PASS Active Power = 183.6W PASS Meets the requirements PASS PASS PASS PASS (1) Air discharge: up to +/- 8.0kV (Plastic) (2) Contact discharge: up to +/- 6.0kV (Metal) MHz and 6 sensitive frequencies: 100MHz, MHz, 150MHz, 300MHz, 533MHz, 800MHz (AM 1kHz): 3V/m (1) AC Input: +/- 1.0kV (2) Signals, Telecom.: +/- 0.5kV (1) Common Mode: +/- 2.0kV (2) Differential Mode: +/- 1.0kV PASS MHz (AM 1kHz): 3V PASS Test field strength: 1A/m PASS >95% Dips reduction, 0.5 period 30% Dips reduction, 25 period >95% Interruption reduction, 250 period Note: 1. The EUT has no telecommunication ports, so there s no need to test for Conducted Emission for Telecommunication Ports. 2. The EUT s highest operating frequency is 3GHz. Radiated Emission need to be measured up to 6GHz. Tester GF Sheu N/A GF Sheu GF Sheu Angus Lin Angus Lin Angus Lin Angus Lin Angus Lin Angus Lin Angus Lin Angus Lin Angus Lin

12 Page 12 of MEASUREMENT UNCERTAINTY Where relevant, the following measurement uncertainty levels have been estimated for tests performed on the EUT as specified in CISPR : Measurement Frequency Test Site Uncertainty Conducted Emission 150kHz ~ 30MHz (Mains ports) SR No dB Radiated Emission 30MHz ~ 1000MHz 10m Chamber 4.40dB Above 1GHz 3m Chamber No dB Powerline Harmonic - EMS Test No.1 N/A Voltage Flicker - EMS Test No.1 N/A Electrostatic Discharge Immunity Test - ESD Test No.3 N/A Radiated Immunity 80MHz to 1000MHz 3m Chamber No dB Electrical Fast Transient/Burst - EMS Test No.1 N/A Immunity Test Powerline Surge Transient Immunity Test - EMS Test No.1 N/A Conducted Immunity 0.15MHz to 80MHz EMS Test No dB Power Frequency Magnetic Field Immunity - EMS Test No.1 N/A Test Voltage Dips/ Interruption Immunity Test - EMS Test No.1 N/A This uncertainty represents an expanded uncertainty expressed at approximately the 95% confidence level using a coverage factor of k= TEST FACILITY The Inventec Corp. (Taoyuan) EMC lab located at: No. 349, Section 2, Jen-Ho Road 33547, Tachi Town, Taoyuan, Taiwan, Republic of China. The Lab has a turntable with a diameter at maximum 2 meters and can measure ITE products at the 3 and 10 meters of antenna distance. A site description and calibration report to ANSI C63.4 is available upon request. It is authorized for testing ITE devices by NVLAP. EMC Laboratory Accreditation: Nemko ELA No. 127

13 Page 13 of TEST SETUP TEST METHODOLOGY A. Emission tests were performed according to the following methods and procedures: ANSI C63.4 Methods of Measurement of Radio-Noise Emissions for Low Voltage Electrical and Electronic Equipment in the range of 9kHz to 40GHz. EN Limits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment. IEC /EN IEC /EN IEC /EN Harmonic General Guide on Harmonics and Interharmonics Measurements and Instrumentation Voltage Flicker B. Immunity tests were performed according to the following methods and procedures: EN Information technology equipment - Immunity characteristics - Limits and methods of measurement. IEC /EN IEC /EN IEC /EN IEC /EN IEC /EN IEC /EN IEC /EN Electrostatic Discharge Immunity Test Radio Frequency Electromagnetic Field Immunity Test Electrical Fast Transient/Burst Immunity Test Powerline Surge Transient Immunity Test Conducted RF Immunity Test Power Frequency Magnetic Field Immunity Test Voltage Dips/Interruption Immunity Test C. Description of departing from standard test method & any other specific: NONE MODIFICATIONS IMPLEMENTED FOR COMPLIANCE No modifications were made to the equipment under test by Test Laboratory TECHNICAL BASIC FOR COMPLIANCE It was examined to the following sections of the standards EN 55022, CISPR 22 and EN underlying the basic requirements of the EMC directive 2004/108/EC RELATED SUBMITTAL(S) NOTES A. The results relate only to the items tested. B. The report must not be used by the client to claim product certification, approval or endorsement by NVLAP or any agency of the federal government. C. There are no related submittals to this file.

14 Page 14 of TEST CONDITION Test of Conducted Emission Conducted emissions were measured from 0.15MHz to 30MHz with a resolution bandwidth of 9kHz and return leads of the EUT according to the methods defines in Standard EN55022, Clause 9. The EUT was placed on a nonmetallic stand in a shielded room, 0.8 meter above the ground plane, as shown in section 3.5. The interface cables and equipment positions were varied within limits of reasonable applications to determine the positions producing maximum conducted emissions Test of Radiated Emission Radiated emissions from 30MHz to 1000MHz were measured with a resolution bandwidth of 120kHz according to the methods defines in Standard CISPR 22, Clause 10 and above 1000MHz shall be performed using a minimum resolution bandwidth of 1MHz. The EUT was placed on a nonmetallic stand, 0.8 meter above the ground plane, as shown in section 4.5. The interface cables and equipment positions were varied within limits of reasonable applications to determine the positions producing maximum radiated emissions. Frequency range of radiated measurement: Highest frequency generated or used within the EUT or on which the EUT operates or tunes (MHz) Upper frequency of measurement range (GHz) Below ~ ~ Above 1000 Up to 5 times of the highest frequency or 6GHz, whichever is less

15 Page 15 of CONDUCTED EMISSION MEASUREMENT 4.1. TEST LIMIT Frequency range (MHz) Test Standard: EN55022 (Class B) Quasi-Peak Limit [db(µv)] Average 0.15 ~ ~ ~ ~ ~ Note: 1. The lower limit shall apply at the transition frequencies. 2. The limit decreases linearly with the logarithm of the frequency in the range of 0.15 ~ 0.50MHz TEST INSTRUMENTS Serial Calibration Calibration Name Manufacturer Model Number Date Due Receiver Rohde & Schwarz ESCI Jan Jun-2011 Pulse Limiter Rohde & Schwarz ESH3-Z Jan Jun-2011 LISN EMCO 3825/ Nov Oct-2011 LISN Rohde & Schwarz ENV Apr Apr-2012 RF Cable Harbour Industries RG400 N/A 09-Mar Feb-2012 EMI Test Program Audix e3(ver. 6) N/A N/A N/A Note: The test instruments above have been calibrated and are traceable to NML/ROC and NIST/USA SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor DELL U2410f CN-082WXD B-173L DoC VGA Yes 1.75m 1 PS2 HP Keyboard KB-0136 BAUEL0KVBZH0O3 DoC PS2 Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8F28QRR DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1

16 Page 16 of BLOCK DIAGRAM OF CONNECTIONS BETWEEN EUT AND TEST PERIPHERAL DUP EUT (25413) in Host System (HSTNS-2123) Monitor DUP DUP Modem USB HDD DSD DSD USD DSD USD PS2 Keyboard PS2 Mouse DUP Test Table Legend: USD = Undetachable Shielded Data cable DSD = Detachable Shielded Data cable DUP = Detachable Unshielded Power cord 4.5. BLOCK DIAGRAM OF TEST SETUP Metal EUT 140cm1 Test Peripheral (mains ports) ISN 50Ω Wooden table 80cm 80cm LISN LISN 50Ω 50Ω Metal Ground Plane 50Ω PC Test Receiver Pulse Limiter Converter Client

17 Page 17 of TEST DATA Data Log: Date of Test: Jun 01, 2011 Tested By: GF Sheu EUT: Main: 230V/50Hz Test Mode: Mode 4 Temperature ( C): 25.0 Humidity (%): 56.8 Frequency Range: 0.15MHz~30MHz Item Freq Read Level Total Factor Level Limit Line Over Limit (Mark) (MHz) (dbµv) (db) (dbµv) (dbµv) (dbµv) Detector Phase QP Line Average Line QP Line Average Line QP Line Average Line QP Line Average Line QP Line Average Line QP Line Average Line Remark: 1. Negative number in the margin column indicates the amount (in db) that the recorded emission is below the limit.

18 Page 18 of 60 Item Freq Read Level Total Factor Level Limit Line Over Limit (Mark) (MHz) (dbµv) (db) (dbµv) (dbµv) (dbµv) Detector Phase QP Neutral Average Neutral QP Neutral Average Neutral QP Neutral Average Neutral QP Neutral Average Neutral QP Neutral Average Neutral QP Neutral Average Neutral Remark: 1. Negative number in the margin column indicates the amount (in db) that the recorded emission is below the limit.

19 Page 19 of CALCULATION 1. Freq. (MHz), means Conducted Emission frequency. 2. Reading Level (dbµv), means the reading of Analyzer or Test Receiver. 3. Correction Factor (db), means the value of LISN(or ISN) Loss add Cable Loss. 4. Conducted Emission (dbµv), means the values of Reading Level add CF added. CE=RL+CF 5. Ave. Limit (dbµv), means Limit stated in Standard. 6. Ave. Delta (db), Reading in reference to Limit. AD=CE AL

20 Page 20 of RADIATED EMISSION MEASUREMENT 5.1. TEST LIMIT Frequency range (MHz) Test Standard: EN55022 (Class B) Distance (Meter) Quasi-peak limits db(μv/m) 30 ~ ~ Note: 1. The lower limit shall apply at the transition frequency. 2. Additional provisions may be required for cases where interference occurs. Frequency range (MHz) Test Standard: EN55022 (Class B) Distance Peak limit (Meter) db(µv) 1 ~ Average limit db(µv) 3 ~ Note: 1. The lower limit shall apply at the transition frequency TEST INSTRUMENTS TEST INSTRUMENTS FOR 30MHz~1000MHz Name Manufacturer Model Serial Number Calibration Date Calibration Due Receiver Rohde & Schwarz ESU Jan Jun-2011 Receiver Rohde & Schwarz ESU Jan Jul-2011 Antenna TESEQ CBL6111D Jan Aug-2011 Antenna TESEQ CBL6111D Jan Aug-2011 Pre-amplifier Agilent 11909A Nov Sep-2011 Pre-amplifier Agilent 11909A Nov Sep-2011 RF Cable Huber+Suhner S BD N/A 09-Mar Feb-2012 RF Cable Huber+Suhner S BD N/A 09-Mar Feb-2012 Test Program Audix e3(ver. 6) N/A N/A N/A Note: The test instruments above have been calibrated and are traceable to NML/ROC and NIST/USA TEST INSTRUMENTS FOR ABOVE 1GHz Name Manufacturer Model Serial Number Calibration Date Calibration Due Receiver Rohde & Schwarz ESU Jan Jun-2011 Antenna EMCO May May-2012 Pre-amplifier EMC Instruments EMC Apr Apr-2012 RF Cable Huber+Suhner SUCOFLEX 104 N/A 09-Mar Feb-2012 Test Program Audix e3(ver. 6) N/A N/A N/A Note: The test instruments above have been calibrated and are traceable to NML/ROC and NIST/USA.

21 Page 21 of SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION FOR 30MHz~1000MHz Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor DELL U2410f CN-082WXD B-173L DoC VGA Yes 1.75m 1 PS2 Logitech Y-S0002 Keyboard SY041UK DoC PS2 Yes 1.50m 1 PS2 Mouse HP M-S34 F66C80F5B0B01S2 DZL PS2 Yes 1.78m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION FOR ABOVE 1GHz Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor DELL U2410f CN-082WXD B-173L DoC VGA Yes 1.75m 1 PS2 HP Keyboard KB-0136 BAUEL0KVBZH0O3 DoC PS2 Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8F28QRR DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m 1 USB HDD HP md1000h WCAV5E DoC USB Yes 1.25m BLOCK DIAGRAM OF RADIATED BETWEEN EUT AND TEST PERIPHERAL DUP EUT (25413) in Host System (HSTNS-2123) Monitor DUP DUP Modem USB HDD DSD DSD USD DSD USD PS2 Keyboard PS2 Mouse DUP Test Table Legend: USD = Undetachable Shielded Data cable DSD = Detachable Shielded Data cable DUP = Detachable Unshielded Power cord

22 Page 22 of BLOCK DIAGRAM OF TEST SETUP TEST SETUP FOR 30MHz~1000MHz TEST SETUP FOR ABOVE 1GHz

23 Page 23 of TEST DATA FREQUENCY RANGE (30MHz~1000MHz) Data Log: Date of Test: May 30, 2011 Tested By: GF Sheu EUT: Main: 230V/50Hz Test Mode: Mode 1 Temperature ( C): 23.1 Humidity (%): 67.3 Frequency Range: 30MHz~1000MHz Item Freq Read Level Total Factor Level Limit Line Over Limit Detector Ant. Height Table Ang. (Mark) (MHz) (dbµv) (db/m) (µv/m) (µv/m) (db) (cm) (deg) Ant. Pol Peak Vertical QP Vertical Peak Vertical QP Vertical Peak Vertical QP Vertical Peak Vertical QP Vertical Peak Vertical QP Vertical Peak Vertical QP Vertical Remark: 1. Negative number in the margin column indicates the amount (in db) that the recorded emission is below the limit.

24 Page 24 of 60 Item Freq Read Level Total Factor Level Limit Line Over Limit Detector Ant. Height Table Ang. (Mark) (MHz) (dbµv) (db/m) (µv/m) (µv/m) (db) (cm) (deg) Ant. Pol Peak Horizontal QP Horizontal Peak Horizontal QP Horizontal Peak Horizontal QP Horizontal Peak Horizontal QP Horizontal Peak Horizontal QP Horizontal Peak Horizontal QP Horizontal Remark: 1. Negative number in the margin column indicates the amount (in db) that the recorded emission is below the limit.

25 Page 25 of FREQUENCY RANGE (ABOVE 1GHz) Data Log: Date of Test: May 31, 2011 Tested By: GF Sheu EUT: Main: 230V/50Hz Test Mode: Mode 4 Temperature ( C): 24.6 Humidity (%): 69.8 Frequency Range: Above 1GHz Item Freq Read Level Total Factor Level Limit Line Over Limit Detector Ant. Height Table Ang. (Mark) (MHz) (dbµv) (db/m) (µv/m) (µv/m) (db) (cm) (deg) Peak Vertical Average Vertical Peak Vertical Average Vertical Peak Vertical Average Vertical Peak Vertical Average Vertical Peak Vertical Average Vertical Peak Vertical Average Vertical Remark: 1. Negative number in the margin column indicates the amount (in db) that the recorded emission is below the limit. Ant. Pol.

26 Page 26 of 60 Item Freq Read Level Total Factor Level Limit Line Over Limit Detector Ant. Height Table Ang. (Mark) (MHz) (dbµv) (db/m) (µv/m) (µv/m) (db) (cm) (deg) Ant. Pol Peak Horizontal Average Horizontal Peak Horizontal Average Horizontal Peak Horizontal Average Horizontal Peak Horizontal Average Horizontal Peak Horizontal Average Horizontal Peak Horizontal Average Horizontal Remark: 1. Negative number in the margin column indicates the amount (in db) that the recorded emission is below the limit.

27 Page 27 of CALCULATION The field strength is calculated by adding the Total Factor to the receiver or analyzer reading to determine the resultant field strength. The Total Factor is determined by adding the antenna factor and the loss of the cables connection the antenna to the receiver. Front-end amplifier gain if any is accounted for in the receiver reading. The basic equation with a sample calculation is as follows: FS (dbµv/m) = RA (dbµv) + TF (db/m) The sum of Total Factor is measured mean Antenna Factor, Cable Loss Factor and Amplifier Gain TF = AF + CL - AG FS = Field Strength AF = Antenna Factor CL = Cable Loss Factor RA = Receiver Amplitude AG = Amplifier Gain The difference between Field Strength and Test Limit, Delta (db) = FS Limit [db(µv/m)] Assume a receiver reading of 22dBµV is obtained. The Antenna factor of 7.4dB and a cable loss factor of 1.1dB are added to yield 8.5dB Total Factor. The Calculated Field Strength is the sum of = 30.5dBµV/m. All values are listed as db, either referenced to 1µV or 1µV/m.

28 Page 28 of POWERLINE HARMONIC MEASUREMENT 6.1. TEST LIMIT Harmonic order (Odd) Test Standard: EN (According to EN ) Limits for Class D equipment Max current (ma/w) Max current (A) n /n Refer Class A (Odd only) Note: 1. Class D is classified according to item section 5 of EN According to section 7 of EN , the above limits for all equipment except for lighting equipment having and active input power >75W and no limits apply for equipment with an active input power up to and including 75W TEST INSTRUMENTS Serial Calibration Calibration Name Manufacturer Model Number Date Due HARMONICS/FLICKER SYSTEM EMC-PARTNER HAR1000-1P Jan Jan-2012 Software --- HARCS (Ver. 4.18) N/A N/A N/A 6.3. SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor HP LA2405wg CN Z DoC VGA Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8FZ8QQF DoC PS2 Yes 1.80m 1 PS2 Keyboard HP KB-0136 BAUEL0KVBZH0OE DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1

29 Page 29 of BLOCK DIAGRAM OF POWERLINE HARMONIC BETWEEN EUT AND TEST PERIPHERAL DUP EUT (25413) in Host System (HSTNS-2123) Monitor DUP DUP Modem USB HDD DSD DSD USD DSD USD PS2 Keyboard PS2 Mouse DUP Test Table Legend: USD = Undetachable Shielded Data cable DSD = Detachable Shielded Data cable DUP = Detachable Unshielded Power cord 6.5. BLOCK DIAGRAM OF TEST SETUP Test Peripheral Non-Conducted Table EUT PC Harmonics /Flicker System 80cm Ground Reference Plane (GRP) AC Power Source Ground Reference Plane (GRP)

30 Page 30 of TEST DATA Data Log: Date of Test: Jun 03, 2011 Tested By: Angus Lin EUT: Main: 230V/50Hz Test Mode: Mode 1 Temperature ( C): 25 Humidity (%): 57 P (W): Urms = 230.3V Freq = Range: 2A Irms = 0.881A Ipk = 1.575A cf = P = 183.6W S = 202.9VA pf = THDi = 27.8% THDu = 0.20% Class D Test - Time: 10min (100%) Order Iavg Iavg%L Irms Irms%L Imax Imax%L Limit Status [A] [%] [A] [%] [A] [%] [A]

31 Page 31 of VOLTAGE FLICKER MEASUREMENT 7.1. TEST LIMIT AND TEST DATA Test Standard: EN Data Log: Date of Test: Jun 03, 2011 Tested By: Angus Lin EUT: Main: 230V/50Hz Test Mode: Mode 1 Temperature ( C): 24 Humidity (%): 55 Urms = 230.1V Freq = Range: 2A Irms = 0.893A Ipk = 1.606A cf = P = 189.4W S = 205.4VA pf = Test - Time: 12 x 10min = 120min (100%) LIN (Line Impedance Network): L: 0.24ohm + j0.15ohm N: 0.16ohm + j0.10ohm Limits: Plt: 0.65 Pst: 1.00 dmax: 4.00% dc: 3.30% dtlim: 3.30% dt>lim: 500ms Plt= Pst P50s P10s P3s P1s P0.1s dmax dc dt>lim [%] [%] [ms] TEST INSTRUMENTS Serial Calibration Calibration Name Manufacturer Model Number Date Due HARMONICS/FLICKER SYSTEM EMC-PARTNER HAR1000-1P Jan Jan-2012 Software --- HARCS (Ver. 4.18) N/A N/A N/A 7.3. SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION FCC ID Name Brand Model Serial Number Type Shielded LTH Qty or DoC Monitor HP LA2405wg CN Z DoC VGA Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8FZ8QQF DoC PS2 Yes 1.80m 1 PS2 Keyboard HP KB-0136 BAUEL0KVBZH0OE DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1

32 Page 32 of BLOCK DIAGRAM OF VOLTAGE FLICKER BETWEEN EUT AND TEST PERIPHERAL DUP EUT (25413) in Host System (HSTNS-2123) Monitor DUP DUP Modem USB HDD DSD DSD USD DSD USD PS2 Keyboard PS2 Mouse DUP Test Table Legend: USD = Undetachable Shielded Data cable DSD = Detachable Shielded Data cable DUP = Detachable Unshielded Power cord 7.5. BLOCK DIAGRAM OF TEST SETUP Test Peripheral Non-Conducted Table EUT PC Harmonics /Flicker System 80cm Ground Reference Plane (GRP) AC Power Source Ground Reference Plane (GRP)

33 Page 33 of ELECTROSTATIC DISCHARGE IMMUNITY TEST 8.1. APPLY LEVEL Test Standard: EN Customer Customer Level Contact Discharge Apply to Apply to Level Air Discharge [ ] 1 +/- 2.0kV [ ] 1 +/- 2.0kV [ ] 2 +/- 4.0kV [ ] 2 +/- 4.0kV [ V ] 3 +/- 6.0kV [ V ] 3 +/- 8.0kV [ ] 4 +/- 8.0kV [ ] 4 +/- 15.0kV [ ] X special [ ] X special Note: X is an open level. This level has to be specified in the dedicated equipment specification TEST INSTRUMENTS Name Manufacturer Model Serial Number Calibration Date Calibration Due ESD Simulator EM-TEST Dito V Mar Mar SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor HP LA2405wg CN Z DoC VGA Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8FZ8QQF DoC PS2 Yes 1.80m 1 PS2 Keyboard HP KB-0136 BAUEL0KVBZH0OE DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m LOCK DIAGRAM OF TEST SETUP Insulation HCP Test Peripheral EUT VCP Non-Conducted Table 80cm 470kΩ Resistors ESD Simulator Ground Reference Plane (GRP)

34 Page 34 of TEST DATA Data Log: Date of Test: Jun 02, 2011 Tested By: Angus Lin EUT: Main: 230V/50Hz Test Mode: Mode 1 Temperature ( C): 25 Humidity (%): 45 Pressure (kpa): 98.9 Air Discharge Discharge Location Front Side of HOST Rear Side of HOST HDD Front Panel of HOST Test Point A1 A2 A3 Amount of Interval Voltage Required Complied Discharge time (sec) (kv) Criteria to Criteria Result /- 2.0 B A Pass /- 4.0 B A Pass /- 8.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 8.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 8.0 B A Pass Contact Discharge Discharge Location Bracket of EUT at Rear Side of HOST Front Side of HOST Rear Side of HOST Top Side of HOST Left Side of HOST Right Side of HOST I/O bracket of HOST Test Point C1 C2 C3 C4 C5 C6 C7 HCP Note 1 VCP Note 2 Amount of Interval Voltage Required Complied Discharge time (sec) (kv) Criteria to Criteria Result /- 2.0 B A Pass /- 4.0 B A Pass /- 6.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 6.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 6.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 6.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 6.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 6.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 6.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 6.0 B A Pass /- 2.0 B A Pass /- 4.0 B A Pass /- 6.0 B A Pass Performance criteria: A means Must maintain normal operating conditions B means Self-restoring C means Temporary degradation or loss function, requires operator intervention D means Degradation or loss of function, not recoverable N/A = Not Tested Note: 1. Applied at the front edge of each HCP opposite the centre point of each unit of the EUT and 0.1m from the front of the EUT. 2. Applied to the centre of one vertical edge of the coupling plane.

35 Page 35 of PHOTOGRAPHS OF TEST POINT C2 A1 C2 A3 C4 C5

36 Page 36 of 60 C1 C3 C7 A2 C3 C3 C6

37 Page 37 of RADIO FREQUENCY ELECTROMAGNETIC FIELD IMMUNITY TEST 9.1. APPLY LEVEL Test Standard: EN Customer Apply to Level Test field strength (V/m) [ ] 1 1 [ V ] 2 3 [ ] 3 10 [ ] X special Note: X is an open level. This level can be given in the product specification TEST INSTRUMENTS Name Manufacturer Model Serial Calibration Calibration Number Date Due Log Periodic Antenna AR ATR80M6G Jan Jan-2012 RF Power Meter Boonton Jan Sep ohms Diode Power Sensor Boonton E Jan Sep ohms Diode Power Sensor Boonton E Jan Sep-2011 Signal Generator HP E4421B US Jul Jul-2011 RF Test System Controller AR SC N/A N/A Amplifier AR 150W1000M Jan Jan-2012 Dual Directional Coupler AR DC6180A Jan Jan-2012 Software Audix i2 (Ver ) N/A N/A N/A 9.3. SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor HP LA2405wg CN Z DoC VGA Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8FZ8QQF DoC PS2 Yes 1.80m 1 PS2 Keyboard HP KB-0136 BAUEL0KVBZH0OE DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1

38 Page 38 of BLOCK DIAGRAM OF TEST SETUP 9.5. TEST DATA Data Log: Date of Test: Jun 02, 2011 Tested By: Angus Lin EUT: Main: 230V/50Hz Test Mode: Mode 1 Antenna Distance (m): 3 Antenna Height (m): 1.5 Modulation AM/1KHz (%): 80 Temperature ( C): 23 Humidity (%): 55 Frequency Step (%): 1 Frequency Range (MHz) Position Angle (deg.) Field (V/m) Dwell Time (sec) 80 ~ , 90, 180, , 90, 180, , 90, 180, , 90, 180, , 90, 180, , 90, 180, , 90, 180, Required Complied Polarization Criteria to Criteria Result Vertical A A Pass Horizontal A A Pass Vertical A A Pass Horizontal A A Pass Vertical A A Pass Horizontal A A Pass Vertical A A Pass Horizontal A A Pass Vertical A A Pass Horizontal A A Pass Vertical A A Pass Horizontal A A Pass Vertical A A Pass Horizontal A A Pass Performance criteria: A means Must maintain normal operating conditions B means Self-restoring C means Temporary degradation or loss function, requires operator intervention D means Degradation or loss of function, not recoverable N/A = Not Tested

39 Page 39 of ELECTRICAL FAST TRANSIENT / BURST IMMUNITY TEST APPLY LEVEL Test Standard: EN Open-circuit output test voltage +/- 10% Open-circuit output test voltage +/- 10% Customer Customer Apply to Level On Power Supply port Apply to On I/O signal, data and control Level ports [ ] 1 0.5kV [ ] kV [ V ] 2 1.0kV [ V ] 2 0.5kV [ ] 3 2.0kV [ ] 3 1.0kV [ ] 4 4.0kV [ ] 4 2.0kV [ ] X special [ ] X special Note: X is an open level. This level has to be specified in the dedicated equipment specification TEST INSTRUMENTS Name Manufacturer Model Serial Number Calibration Date Calibration Due EMS Multi Tester EMC PARTNER TRANSIENT Sep Sep-2011 Capacitive Coupling Clamp EMC PARTNER CN-EFT Sep Sep-2011 Software EMC PARTNER GENECS (Ver. 3.40) N/A N/A N/A SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor HP LA2405wg CN Z DoC VGA Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8FZ8QQF DoC PS2 Yes 1.80m 1 PS2 Keyboard HP KB-0136 BAUEL0KVBZH0OE DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1

40 Page 40 of BLOCK DIAGRAM OF TEST SETUP 10cm Test Peripheral EUT Non-Conducted Table EMC Immunity Test System PC Ground Reference Plane (GRP) AC Power Source Ground Reference Plane (GRP) TEST DATA Data Log: Date of Test: Jun 03, 2011 Tested By: Angus Lin EUT: Main: 230V/50Hz Test Mode: Mode 1 Burst Period (msec): 300 Burst Duration (msec): 15 Test Duration (min): 1 Temperature ( C): 25 Humidity (%): 53 Pressure (kpa): 98.9 Repetition Rate (khz): 5 On Power Supply Port Voltage Inject Required Complied Inject Line Polarity Attached Cable (kv) Method Criteria to Criteria Result CDN E90165 B A Pass L CDN E90165 B A Pass CDN E90165 B A Pass N CDN E90165 B A Pass CDN E90165 B A Pass PE CDN E90165 B A Pass CDN E90165 B A Pass L+N+PE CDN E90165 B A Pass On I/O signal, data and control ports Test Port Voltage Inject Required Complied Polarity Attached Cable (kv) Method Criteria to Criteria Result RJ Clamp 5.0m CAT6 UTP Cable *1 B A Pass Clamp 5.0m CAT6 UTP Cable *1 B A Pass Performance criteria: A means Must maintain normal operating conditions B means Self-restoring C means Temporary degradation or loss function, requires operator intervention D means Degradation or loss of function, not recoverable N/A = Not Tested

41 Page 41 of POWERLINE SURGE TRANSIENT IMMUNITY TEST APPLY LEVEL Customer Apply to Test Standard: EN Mode Level Open-circuit test Customer voltage +/-10 % Apply to Mode Level [ ] Common 1 0.5kV [ ] Differential 1 [ ] Common 2 1.0kV [ ] Differential 2 0.5kV [ V ] Common 3 2.0kV [ V ] Differential 3 1.0kV [ ] Common 4 4.0kV [ ] Differential 4 2.0kV [ ] Common X special [ ] Differential X special Note: X is an open level. This level can be specified in the product specification. Open-circuit test voltage +/-10 % TEST INSTRUMENTS Name Manufacturer Model Serial Number Calibration Date Calibration Due EMS Multi Tester EMC PARTNER TRANSIENT Sep Sep-2011 Software EMC PARTNER GENECS (Ver. 3.40) N/A N/A N/A SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor HP LA2405wg CN Z DoC VGA Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8FZ8QQF DoC PS2 Yes 1.80m 1 PS2 Keyboard HP KB-0136 BAUEL0KVBZH0OE DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m BLOCK DIAGRAM OF TEST SETUP 10cm Test Peripheral EUT Non-Conducted Table EMC Immunity Test System PC Ground Reference Plane (GRP) AC Power Source Ground Reference Plane (GRP)

42 Page 42 of TEST DATA Data Log: Date of Test: Jun 03, 2011 Tested By: Angus Lin EUT: Main: 230V/50Hz Test Mode: Mode 1 Number of Surge: 5 Interval (sec): 60 Temperature ( C): 25 Humidity (%): 52 Pressure (kpa): 98.8 Common Mode Inject Line L PE N PE Voltage Phase Angle Required Complied to (kv) (deg.) Criteria Criteria Result , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass Differential Mode Inject Line L N Voltage Phase Angle Required Complied to Result (kv) (deg.) Criteria Criteria , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass , 90, 180, 270 B A Pass Performance criteria: A means Must maintain normal operating conditions B means Self-restoring C means Temporary degradation or loss function, requires operator intervention D means Degradation or loss of function, not recoverable N/A = Not Tested

43 Page 43 of CONDUCTED RF IMMUNITY TEST APPLY LEVEL Test Standard: EN Customer Apply to Level Test field strength (V) [ ] 1 1 [ V ] 2 3 [ ] 3 10 [ ] X special Note: X is an open level. This level can be specified in the product specification TEST INSTRUMENTS Name Manufacturer Model Serial Number Calibration Date Calibration Due Conducted Immunity Test System TESEQ NSG Jan Aug-2011 CDN (for Host) TESEQ CDN-M Jan Aug-2011 CDN (for peripheral) FRANKONIA CDN-M Apr Mar-2012 CDN (for peripheral) FRANKONIA CDN-M Apr Mar-2012 CDN (for peripheral) FRANKONIA CDN-M Apr Mar-2012 Attenuator TESEQ ATN Jan Aug-2011 Software TESEQ NSG (Ver. 1.28) N/A N/A N/A SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor HP LA2405wg CN Z DoC VGA Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8FZ8QQF DoC PS2 Yes 1.80m 1 PS2 Keyboard HP KB-0136 BAUEL0KVBZH0OE DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1

44 Page 44 of BLOCK DIAGRAM OF TEST SETUP Attenuator CDN CDN 50Ω CDN 50Ω CDN 50Ω PC Compact Immunity Test System RF in RF out 10cm EUT Non-conducted table Test Peripheral Artificial Hand Ground Reference Plane (GRP) AC Power Source Ground Reference Plane (GRP) TEST DATA Data Log: A Date of Test: Jun 03, 2011 Tested By: Angus Lin EUT: Main: 230V/50Hz Test Mode: Mode 1 Modulation AM/1KHz (%): 80 Step Size (%): 1 Dwell Time (sec): 2.9 Temperature ( C): 24 Humidity (%): 56 Frequency Range Field Strength Inject Required Complied to Inject Line Result (MHz) (V) Method Criteria Criteria 0.15 ~ 80 AC Line 3 Direct A A Pass Performance criteria: A means Must maintain normal operating conditions B means Self-restoring C means Temporary degradation or loss function, requires operator intervention D means Degradation or loss of function, not recoverable N/A = Not Tested

45 Page 45 of POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST APPLY LEVEL Test Standard: EN Customer Apply to Level Test field strength (A/m) [ V ] 1 1 Note: X is an open level. [ ] 2 3 [ ] 3 10 [ ] 4 30 [ ] [ ] X special This level can be specified in the product specification TEST INSTRUMENTS Name Manufacturer Model Serial Number Calibration Date Calibration Due EMS Multi Tester EMC PARTNER TRANSIENT Sep Sep-2011 Magnetic Field Antenna EMC PARTNER MF Sep Sep-2011 Software EMC PARTNER GENECS (Ver. 3.40) N/A N/A N/A SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor HP LA2405wg CN Z DoC VGA Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8FZ8QQF DoC PS2 Yes 1.80m 1 PS2 Keyboard HP KB-0136 BAUEL0KVBZH0OE DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1

46 Page 46 of BLOCK DIAGRAM OF TEST SETUP TEST DATA Data Log: B Date of Test: Jun 08, 2011 Tested By: Angus Lin EUT: Main: 230V/50Hz Test Mode: Mode 1 Temperature ( C): 26 Humidity (%): 56 Pressure (kpa): 98.6 Power Frequency Field Strength Test Duration Orthogonal Required Complied Result (Hz) (A/m) (sec) Axes Criteria to Criteria X-axis B A Pass Y-axis B A Pass Z-axis B A Pass Performance criteria: A means Must maintain normal operating conditions B means Self-restoring C means Temporary degradation or loss function, requires operator intervention D means Degradation or loss of function, not recoverable N/A = Not Tested

47 Page 47 of VOLTAGE DIPS/INTERRUPTION IMMUNITY TEST APPLY LEVEL AND TEST DATA Test Standard: EN Data Log: C Date of Test: Jun 07, 2011 Tested By: Angus Lin EUT: Main: 230V/50Hz Test Mode: Mode 1 Temperature ( C): 27 Humidity (%): 56 Pressure (kpa): 98.5 Voltage Rating (V): 100~120, 200~240 Environmental Phenomenon Voltage Dips Reduction (%) Phase Angle (deg.) Duration (Periods) Repetition Rate (sec.) Required Criteria Complied to Criteria Result > B A Pass 30 0, 90, C A Pass Voltage Interruption > 95 0, 90, C C Pass Performance criteria: A means Must maintain normal operating conditions B means Self-restoring C means Temporary degradation or loss function, requires operator intervention D means Degradation or loss of function, not recoverable N/A = Not Tested TEST INSTRUMENTS Name Manufacturer Model Serial Number Calibration Date Calibration Due EMS Multi Tester EMC PARTNER TRANSIENT Sep Sep-2011 Software EMC PARTNER GENECS (Ver. 3.40) N/A N/A N/A SUPPORT TEST PERIPHERALS & CABLING CONFIGURATION Name Brand Model Serial Number FCC ID or DoC Type Shielded LTH Qty Monitor HP LA2405wg CN Z DoC VGA Yes 1.80m 1 PS2 Mouse HP M-SBF96 FATSQ0C8FZ8QQF DoC PS2 Yes 1.80m 1 PS2 Keyboard HP KB-0136 BAUEL0KVBZH0OE DoC PS2 Yes 1.80m 1 Modem Hayes 3124US A BFJ9D9231AA RS-232 Yes 1.80m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1 USB HDD Onnto TA-S12T A04824-H DoC USB Yes 0.50m 1

48 Page 48 of BLOCK DIAGRAM OF TEST SETUP 10cm Test Peripheral EUT Non-Conducted Table EMC Immunity Test System PC Ground Reference Plane (GRP) AC Power Source Ground Reference Plane (GRP)

49 Page 49 of PRODUCT LABELING

50 Page 50 of PHOTOGRAPHS Front View of Radiated Test (30MHz ~ 1000MHz) Rear View of Radiated Test (30MHz ~ 1000MHz)

51 Page 51 of 60 Front View of Radiated Test (Above 1GHz) Rear View of Radiated Test (Above 1GHz)

52 Page 52 of 60 Front View of Conducted Test Side View of Conducted Test

53 Page 53 of 60 View of Harmonics/Voltage Flicker Test View of ESD Test

54 Page 54 of 60 Front View of Radiated Immunity Test Rear View of Radiated Immunity Test

55 Page 55 of 60 View of EFT/Surge/Dips Test View of Conducted Immunity Test

56 Page 56 of 60 View of PFMF Test EUT, Antenna and Absorber

57 Page 57 of 60 EUT in HOST System Top View of EUT (with DDR3 512MB Memory Module & with DDR3 1GB Memory Module)

58 Page 58 of 60 Bottom View of EUT (with DDR3 512MB Memory Module & with DDR3 1GB Memory Module) Top View of Flash Module

59 Page 59 of 60 Bottom View of Flash Module Near View (Y3A1) of Noise Source

60 Page 60 of 60 Near View (Y2L1) of Noise Source