PRODUCT SPECIFICATION

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2 PROUCT SPECIFICATION MOULAR JACK 1.0 SCOPE This specification covers the performance requirements of the Molex High Speed Cat 5e Right Angle Low Profile Modular Telephone Jacks. Where applicable, tests are in accordance with IEC PROUCT ESCRIPTION 2.1 PROUCT NAME **** High Speed Modular Jack Right Angle Low Profile. 2.2 IMENSIONS, MATERIALS, PLATINGS AN MARKINGS CONTACT FINISH: GOL Post Plate mm mm Gold in contact area mm Min pure Tin in Tail area, both over mm Min Nickel overall. OR, PALLAIUM NICKEL WITH GOL FLASH: Post plate mm Min Gold Flash over mm Min Palladium Nickel in contact area, mm Min pure Tin in tail area, both over mm Min Nickel overall. 3.0 APPLICABLE OCUMENTS AN SPECIFICATIONS See the appropriate Sales rawings and the other sections of this Specification for the necessary referenced ocuments and Specifications. IEC TIA-1096-A LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 1 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

3 PROUCT SPECIFICATION 4.0 RATINGS 4.1 VOLTAGE 125 Volts d.c. 4.2 CURRENT 1.5 Amps max 4.3 TEMPERATURE Operating: - 40 C to + 85 C Non operating: - 40 C to + 85 C LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 2 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

4 PROUCT SPECIFICATION 5.0 SCHEULES The following tests specify the characteristics to be checked and the requirements to be fulfilled. For a complete test sequence, a minimum of 62 specimens are needed. This equals 6 groups of 10, and 1 group of 2. The group of 2 is for transmission testing, group EP. All connectors in each group shall undergo the following tests as described in the sequence given, required alteration of the sequence of tests or adding of new tests to verify additional connector characteristics. All the test group specimens shall be subjected to the preliminary group P tests in the following sequence. Test group P P 1 P2 P 3 P 4 P 5 GENERAL EXAMINATION PER IEC , Test 1a INSULATION RESISTANCE IEC , Test 3a, Method a. VOLTAGE PROOF IEC , Test 4a, Method a. Visual examination N/A Mated connectors: (Measurement points per section 7.0) Test voltage 100 Vd.c. Method A mated connectors Contact/contact Method A Mated Connector There shall be no defects that would impair normal operation Initial 20 mω maximum 500 MΩ Minimum 1000 V d.c. or a.c. peak LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 3 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

5 PROUCT SPECIFICATION Test group AP INSERTION AN WITHRAWAL FORCES AP 1 PER IEC , Test 13b EFFECTIVENESS OF CONNECTOR COUPLING AP 2 EVICE. AP 3 AP 4 AP 5 PER IEC , Test 15f RAPI CHANGE OF TEMPERATURE PER IEC INSULATION RESISTANCE IEC , Test 3a, Method a. VOLTAGE PROOF Connector locking device depressed. Rate of load application 44,5 N/S Max -40 C to 70 C Mated connectors 25 cycles ι = 30 min recovery time 2 h Test voltage 100 v ±15 v d.c. method a mated connectors Insertion force 20 N max, Withdrawal force 20 N max. 50N for 60s ± 5s PER P4 change from initial AP 6 IEC , Test 4a, PER P5 PER P5 Method a. AP 7 VISUAL EXAMINATION PER P1 PER P1 21 cycles low temperature 25 C CYCLIC AMP HEAT high temperature 65 C cold subcycle 10 C AP 8 humidity 93 % PER IEC Half of the samples in mated state Half of the samples in unmated state change from initial for signal contacts. Input AP 9 to output resistance 100 mω max for screen. LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 4 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

6 PROUCT SPECIFICATION Test group AP(continued). AP 10 INSERTION AN WITHRAWAL FORCES PER AP1 PER AP1 AP 11 PER IEC , Test 13b EFFECTIVENESS OF CONNECTOR COUPLING PER IEC , Test 15f AP 12 VISUAL EXAMINATION PER P1 PER P1 AP 13 AP 14 AP 15 SOLERABILITY RESISTANCE TO SOLERING HEAT VOLTAGE PROOF IEC , Test 4a, Method a. PER AP2 Solder Bath 260+0/-5 C Immersion Time 2,0 +/- 0.5s For recommended Reflow Profile (See Section 6.0) PER P5 PER AP2 The ipped surface shall be covered with a smooth and bright solder coating. Some imperfections are acceptable but NOT concentrated in the same area. Appearance: No amage. PER P5 LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 5 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

7 PROUCT SPECIFICATION Test group BP BP 1 BP 2 BP 3 BP 4 MECHANICAL OPERATIONS PER IEC , Test 9a FLOWING MIXE GAS CORROSION PER IEC , Test 11g N/A Mate connectors 1,250 cycles, at a maximum rate of 10mm/s maximum. Rest 1s (when mated and when unmated) Locking device inoperative. Method 1, 4 days Half of the samples in mated state Half of the samples in unmated state change from initial BP 5 MECHANICAL OPERATIONS PER IEC , Test 9a Mate connectors 1,250 cycles, at a maximum rate of 10mm/s maximum. Rest 5s (when unmated) locking device inoperative. BP 6 change from initial. BP 7 INSULATION RESISTANCE IEC , Test 3a, Method a. VOLTAGE PROOF Test voltage 100 v ±15 v d.c. method a mated connectors PER P4 BP 8 IEC , Test 4a, PER P5 PER P5 Method a. BP 9 VISUAL EXAMINATION PER P1 PER P1 LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 6 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

8 PROUCT SPECIFICATION Test group CP CP 1 VIBRATION PER IEC , Test 6d (See Section 7.0) f = 10 Hz to 500 Hz, Amplitude: 0.35 mm Accel 50m/s² 10 sweeps / axis measurement points per section 7.0 (For arrangement,see IEC , 7.3) iscontinuities 10µs maximum. CP 2 No disturbance of the free connector to fixed connector electrical connections, between vibration test and contact resistance measurement change from initial. INSULATION RESISTANCE CP 3 PER P4 PER P4 IEC , Test 3a, Method a. CP 4 VISUAL EXAMINATION PER P1 PER P1 LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 7 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

9 PROUCT SPECIFICATION Test group P P 1 P 2 ELECTRICAL LOA AN TEMPERATURE PER IEC , Test 9b INSULATION RESISTANCE IEC , Test 3a, Method a. VOLTAGE PROOF 500 h 70 C Recovery period 2 h PER P4 0.8A 5 connectors, no current 5 connectors PER P4 P 3 IEC , Test 4a, Method PER P5 PER P5 a. P 4 VISUAL EXAMINATION PER P1 PER P1 P 5 change from initial. P 6 MECHANICAL GAUGING Both, free and fixed Passing go / no go PER IEC , Annex L Connector test GAUGING CONTINUITY All signal contacts and 10 µs maximum P 7 screen/specimens PER IEC , Annex A LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 8 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

10 PROUCT SPECIFICATION Test group EP EP 1 EP 2 EP 3 EP 4 EP 5 EP 6 EP 7 EP 8 Test group FP FP 1 FP 2 INSERTION LOSS IEC ,Test a NEXT IEC , Test c RETURN LOSS IEC , Test b FEXT IEC , Test d TRANSVERSE CONVERSION LOSS IEC , Test f TRANSVERSE CONVERSION TRANSFER LOSS IEC , Test g INPUT TO OUTPUT RESISTANCE PER RESISTANCE UNBALANCE IEC ,Test 2a PER IEC All pairs, one direction. All pairs, both directions, (pair to pair) All pairs, both directions All pairs, both directions, (pair to pair) Mate Connectors Millivolt level method 0,04x f db from 1 MHz to 100MHz All Pairs: 83 20log(f) db from 1 MHz to 100 MHz All Pairs: 60 20log(f) db from 1 MHz to 100 MHz All Pairs: 75, 1 20log(f) db from 1 MHz to 100 MHz All Pairs: 68 20log(f) db from 1 MHz to 100 MHz All Pairs: 68 20log(f) db from 1 MHz to 100 MHz Mated Connectors Cable termination to Cable Termination All types: 200 mω maximum. Unbalance resistance = 50 mω maximum. SURGE PER IEC 60512, Test no. ITU_T K.20 INSULATION RESISTANCE IEC , Test 3a, Method a. Mated connectors, Table 2a /2b, Basic test level Tests 2.1.1a, 2.1.1b, 2.1.3, 2.2.1a and 2.3.1A Test voltage 100 v ±15 v d.c. method a mated connectors Test 2.1 & 2.2: Acceptance criteria A per ITU-T K.44, clause 9, Test 2.3: Acceptance criteria B PER ITU-T K.44, CLAUSE 9, PER P4 FP 3 VISUAL EXAMINATION PER P1 PER P1 LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 9 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

11 PROUCT SPECIFICATION Test group AZ AZ1 HIGH TEMPERATURE (RY HEAT) PER IEC , Test 9b Mate connectors; expose to: 96 hours at 85 ± 2 C Use Molex plug AZ 2 change from initial for signal contacts. Input to output resistance 100 mω max for screen. 6.0 SOLERING CONITIONS. RECOMMENE LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 10 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

12 PROUCT SPECIFICATION 7.0 GAUGES AN FIXTURES VIBRATION LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 11 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

13 PROUCT SPECIFICATION 8.0 PACKAGING Parts shall be packaged to protect against damage during handling, transit and storage. 9.0 QUALITY ASSURANCE PROVISIONS The applicable Molex inspection plan specifies the sampling acceptable quality level to be used. imensional and functional requirements shall be in accordance with applicable product drawings and this specification.. LOW PROFILE MOULAR JACKS PROUCT SPECIFICATION. 12 of 12 OCUMENT NUMBER: CREATE / REVISE BY: CHECKE BY: APPROVE BY: PS Byrnes A.Higgins S.Griffin TEMPLATE FILENAME: PROUCT_SPEC[SIZE_A4](V.1).OC

[0.057] 5.8 [0.23]

[0.057] 5.8 [0.23] Product Specification 7 March 13 Rev A1 SL Series Jacks, Category 6 1. SCOPE 1.1 Content This specification covers performance, tests and quality requirements for AMP NETCONNECT*, Category 6 SL Jacks used