Lowering the Cost of Test while Improving Time-To-Market with a Platform-based Approach

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2 Lowering the Cost of Test while Improving Time-To-Market with a Platform-based Approach A Smarter Approach to Meet Test Needs in the Era of Smart Devices Ma Lisi Technical Marketing Engineer /semiconductor

3 '84 '87 '88 '89 '90 '91 '92 '93 '94 '95 '96 '97 '98 '99 '00 '01 '02 '03 '04 '05 '06 '07 '08 '09 '10 '11 '12 '13 '14 '15 Revenue in millions USD $1.23 7,500+ EMPLOYEES 50+ COUNTRIES BILLION IN ,000+ CUSTOMERS WORLDWIDE OVER 18% INVESTMENT IN R&D $1,400 $1,200 $1,000 Long-Term Track Record of Growth $800 $600 $400 $200 $0

4 Mission Statement NI equips engineers and scientists with systems that accelerate productivity, innovation, and discovery.

5 Accelerating Engineering For More Than Four Decades 1977 Introduces GPIB to connect instruments to mini computers 1986 LabVIEW starts the computer-based measurement revolution 1991 Creates the Alliance Partner Network to strengthen ecosystem 2004 Makes FPGAs accessible to engineers and scientists 2013 Introduces software-designed instrumentation NI founded 1983 Introduces first GPIB board to connect instruments to IBM PCs 1987 Releases data acquisition solutions to provide accurate measurements 1998 Creates PXI and expands opportunities with complete system solutions 2006 Announces CompactDAQ to increase measurement accuracy 2014 Leads prototyping of 5G systems

6 NI PXI Serves a Broad Range of Applications Automotive Radar Prototyping 5G Research mmwave Channel Sounding Semiconductor Production RFIC Characterization Military Radio Test Electronic Warfare & Spectrum Monitoring Hardware-in-the-Loop (HIL) Simulation RF Record and Playback Depot Testing

7 Global Service and Support, Locally Delivered Arboga Guadalajara Dallas Austin Munich Debrecen Seoul Icheon Incheon Tokyo Hyogo Shenzhen Shanghai Bangkok Taipei City Hsinchu City Chennai Penang Ho Chi Minh City NI Service Center * and Manufacturing São Paulo NI Service Center * Only NI Certified Calibration Centers NI Inventory Services Sites * Provides NI Repair, Calibration, and Inventory Services

8 The Big Bang of Smart Devices 20B 15B Connected Cars Connected TVs 10B IoT Devices 05B Tablets Smartphones PCs E Source: BI Intelligence Estimates

9 Computer phone Watch GPS Calc ulator Televis ion And More Camera Music Player Seismograph Bagpipe Tuner E- Readers A smart phone is much more than a simple radio.

10 Muti mode, multi band RF Front end modules LTE Modem with multiple Celluar standard support (from LTE FDD to GSM/EDGE) Powerful software platform Fusion Applications Processor SoC with LPDDR4 RAM sources: ifixit.com A smart phone contains much more than a simple radio.

11 Protocol Complexity Increasing Complexity of Wireless Standards 5G GSM 1800 GSM 900 Cellular GNSS NFC Bluetooth GSM 1900 GSM 1800 GSM 900 GSM 850 Bluetooth g b UMTS 2100 UMTS 1900 UMTS 900 UMTS 850 GSM 1900 GSM 1800 GSM 900 GSM 850 GPS Bluetooth EDR n g b LTE 2600 LTE 2100 LTE 1800 LTE 900 LTE 850 LTE 800 UMTS 2100 UMTS 1900 UMTS 900 UMTS 850 GSM 1900 GSM 1800 GSM 900 GSM 850 Glonass GPS NFC Bluetooth 4.0 (LE) ac n g b LTE 2600 LTE 2100 LTE 1800 LTE 900 LTE 850 LTE 800 UMTS 2100 UMTS 1900 UMTS 900 UMTS 850 GSM 1900 GSM 1800 GSM 900 GSM 850 Beidou Galileo Glonass GPS NFC Bluetooth ad ac n g b G ax

12 Higher Level Integration in RF Front Ends AD C AD C DA C DA C PMI C 2005 PA 2010 FEM 2015 Multi-band FEM 2020 Integrated Radio Multiple versions of the same LTE device are required to accommodate the worldwide proliferation of cellular bands 40 already and counting. The problem gets even worse when you consider the different band combinations required to support LTE-Advanced carrier aggregation.

13 Higher Integration with Cost Reduction Avg Price $1.00 Wireless IC Average Selling Price Units 16 Billion 12 Billion $0.50 Units 8 Billion 4 Billion Time Source: Databeans, Inc.

14 Unique Attributes of Smart Devices - Common Test Needs CONVERGENCE LOWER PRICE RAPID CHANGE More functionality Ensure high reliability Lowest cost Fast time to market

15 Vendor Strategies for Test and Measurement C L O S E D Vendor knows best Fixed-functionality Closed ecosystem Customer pays

16 Closed Approach in Labs Closed Approach in Production Becoming a Business Risk Box Instrumentation Disconnect Long test cycles Increasing cost ATE Fixed functionality Hard to keep up with change Not optimized to work together Does not economically scale to Mixed Signal/RF ICs Expansive, large footprint

17 Vendor Strategies for Test and Measurement C L O S E D P L A T F O R M Vendor knows best Fixed-functionality Closed ecosystem Customer pays Customer knows best Customizable solution Open, vibrant ecosystem Customer designs

18 Labs A Smarter Approach Production Floor Same Platform Maximize Leverage Code, setup, training Simpler correlation Faster test cycles Lower cost Designed for automation Optimized for measurement quality Fast test cycles Designed for test cell Optimized for throughput Cost effective

19 Common Platform: Lab to Production PXI Chassis and Controller PXI Instrumentation and Measurement Software LabVIEW (Code Module Development) and TestStand (Test Management) STS Standardized Docking and Cabling Interface NI PXI NI STS T1 NI STS T2 NI STS T4 CHARACTERIZATION PRODUCTION

20 NI Semiconductor Test System

21 NI ECOSYSTEM THIRD-PARTY SOFTWARE ONE-PLATFORM APPROACH NI SERVICES AND SUPPORT Community 300,000+ Online Members 450+ User Groups 9,000+ Code Examples Academia 8,000+ Classrooms Worldwide Partners 1,000+ Alliance Partners Industry-Leading Technology Partners NI PRODUCTIVE DEVELOPMENT SOFTWARE NI MODULAR HARDWARE THIRD-PARTY HARDWARE Support 700+ Field Engineers 700+ Support Engineers 50+ Worldwide Offices Add-Ons 400+ Software Add-Ons 5M+ Tools Network Downloads Open Connectivity 10,000+ Instrument and Device Drivers 1,000+ Sensor and Motor Drivers NI ECOSYSTEM

22 NI as a System Supplier 2,000 PXI integrated systems shipped monthly 200,000 PXI chassis shipped since ,000 PXI systems deployed globally into high volume manufacturing 15,000 PXI systems deployed in Semiconductor Labs (Design, V&V, Char) 1,000 PXI systems deployed in Semiconductor production 250 STS Semiconductor production systems deployed (2016) Diverse Industries Including Semiconductor Mobile devices Electronics Aerospace and defense Automotive Energy; Oil and gas Education Diverse Global Conditions Oil Fields to Clean Rooms

23 Key Innovations for Semiconductor Test NI Vector Signal Transceiver (VST) FPGA-based servoing for measurement acceleration Up to 1 GHz instantaneous bandwidth for wide range of wireless technologies R&D-grade measurement performance with up to -50 db EVM for ax NI Source Measure Units (SMUs) Broad IV range: 200V(20W), 3A (10A pulse) Current resolution to 10fA Max sampling to 1.8MS/s SourceAdapt TM Technology for fast settling in presence of capacitive loads Best in class channel density NI Digital Pattern Instrument ATE-class digital (with PPMU) in PXI Out of the box Digital Pattern Editor software Time sets, drive formats, opcodes, HRAM, Source and capture, history RAM, Shmoo

24 Qualcomm Creates A Customized, Flexible WLAN Test System Using The NI PXI Platform "we improved test speeds by more than 200 times compared to traditional rack-and-stack instruments while significantly improving test coverage. Doug Johnson, Qualcomm Atheros

25 Qualcomm Reduces Characterization Test Times TRADITIONAL RACK AND STACK Testing a/b/g T E S T T I M E NI PXI RF AND LABVIEW Testing a/b/g and n 1 0 X F A S T E R NI VST, LABVIEW, AND LabVIEW FPGA Testing a/b/g, n, and ac X F A S T E R

26 Power Amplifier (PA) Testing with Real-Time DPD We were able to reduce manufacturing test time of Power Amp (PA) by 5 times compared to existing test system by using NI VST to implement power servoing on FPGA level. New Product Introduction (NPI) Team, Broadcom

27 Analog Devices Reduces MEMS Production Test Cost Using PXI and LabVIEW, we were able to test our MEMS devices at a fraction of the cost, weight, power consumption, and footprint of our previous ATE system. Woody Beckford, Analog Devices Inc.

28 卓胜微电子使用 NI PXI 平台大幅提升 RFIC 量产测试速度和灵活性 NI 第二代矢量信号收发仪 (VST 2.0), 将 RF 信号发生器和 RF 信号分析仪集成到单个模块中, 提供业内顶尖的 RF 测量性能, 1GHz 高带宽, 更提供高性能的可编程 FPGA, 帮助客户实现灵活的高频性能测试 我们在和 NI 合作的过程中体会到了开放平台的好处, 稍作改动就能够为下一批次的芯片做测试 唐壮, 卓胜微电子 CTO