TS10203: 5 Disruptive Technologies You Need to Know About in Automated Test

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2 TS10203: 5 Disruptive Technologies You Need to Know About in Automated Test Ben Robinson National Instruments Modular Instruments Product Marketing Manager ben.robinson@

3 National Instruments (circa 1995) We want to do for engineers what the spreadsheet did for financial analysis. Dr. James Truchard, Co-Founder, President, and CEO, National Instruments (circa 1986) /smater-test

4 LabVIEW 4

5 LabVIEW 2016 Use The Right Tool for the Right Job to Accelerate Productivity Features at a Glance Channel wires seamlessly transfer data between parallel loops with a single wire Five additional add-ons natively support 64-bit OSes for increased access to RAM Integrate Python scripts with the release of the Python Integration Toolkit for LabVIEW Increased support of third-party devices with over 500 new hardware drivers on IDNet Application Areas Data acquisition Embedded control and monitoring Automated test 5

6 Platform-Based Approach for Automated Test Semiconductor Consumer Electronics Aerospace/Defense Automotive Other Software Measurement Studio, Visual Studio.NET, Operating System and Drivers PXI Chassis and Controllers Switching Reconfigurable Instruments 6 Modular Instruments Bus Interfaces (GPIB/LXI/Serial)

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8 LabVIEW 8

9 NI PXI 9

10 Smarter Test System Open, Flexible Software Modular Hardware Vibrant Ecosystem Customer knows best A smart test system is more than a fixed-functionality instrument it is built for automation and customization. /smater-test

11 Approaches for Test and Measurement C L O S E D A P P R O A C H Vendor knows best Fixed-functionality box instruments Extend with vendor accessible customization Fixed software applications Monolithic instrument design Resulting closed vendor ecosystem P L A T F O R M A P P R O A C H Customer knows best Out of box measurement ready Extend with user accessible customization Productive, approachable software tools Modular instrument design with consistent APIs Resulting open partner, user, and IP ecosystem 11

12 5 Disruptive in Automated Test Connected devices and 5G High-performance, user-defined I/O High-speed digital communication Processors and FPGAs Big analog test data management 12

13 5 Disruptive in Automated Test Connected devices and 5G 13

14 The Big Bang of Smart Devices 20B Connected Cars Connected TVs 15B IoT Devices 10B Tablets 05B Smartphones PCs E Source: BI Intelligence Estimates 14

15 source: nest.com A smart thermostat contains much more than a bimetallic coil. /smater-test

16 Sensirion SHT20 humidity and temperature sensor Ember EM357 integrated ZigBee/ system-on-chip Skyworks 2436L high power 2.4 GHz front-end module 3.7 volts, 2.1 Wh (568 mah) lithium-ion rechargeable battery Avago ADBM-A350 optical finger navigation module Long range motion sensor Short range motion sensor source: teardown.com A smart thermostat contains much more than a bimetallic coil. /smater-test

17 source: qualcomm.com V I All for ~$5 USD Multiple Amplifiers Advanced Filtering Switching Power Management ADCs & DACs A smart power amplifier does much more than amplify power. /smater-test

18 2 nd Generation Vector Signal Transceiver Build flexible RF design and test systems Features At A Glance User-programmable FPGA that engineers can easily design with LabVIEW 1 GHz of instantaneous bandwidth for advanced digital predistortion test and wideband signals Excellent accuracy enables measurement of ax error vector magnitude performance of -50 db FPGA enables measurement speeds up to 10X faster than traditional instrumentation Small size and tight synchronization allow for up to 8x8 MIMO configuration in a single 18-slot chassis Application Areas Spectrum Monitoring Electronic Warfare RADAR Prototyping and more Powered by LabVIEW and TestStand, this smarter test system features the second-generation VST, a PXI source measure unit, and a DAQ device. 18

19 Protocol Complexity Rising Complexity of Wireless Test GSM 1800 GSM 900 5G Candidates Cellular GPS NFC Bluetooth GSM 1900 GSM 1800 GSM 900 GSM 850 Bluetooth g b UMTS 2100 UMTS 1900 UMTS 900 UMTS 850 GSM 1900 GSM 1800 GSM 900 GSM 850 GPS Bluetooth EDR n g b LTE 2600 LTE 2100 LTE 1800 LTE 900 LTE 850 LTE 800 UMTS 2100 UMTS 1900 UMTS 900 UMTS 850 GSM 1900 GSM 1800 GSM 900 GSM 850 Glonass GPS NFC Bluetooth 4.1 (LE) ac n g b LTE 2600 LTE 2100 LTE 1800 LTE 900 LTE 850 LTE 800 UMTS 2100 UMTS 1900 UMTS 900 UMTS 850 GSM 1900 GSM 1800 GSM 900 GSM 850 Galileo Glonass GPS NFC Bluetooth 4.1 (LE) ah af ad ac p n g b G 19

20 5 Disruptive in Automated Test High-performance, user-defined I/O 21

21 Resolution [Bits] Trusted Measurement Quality Modular Innovation Traditional Instruments PXI Instruments K 10K 100K 1M 10M 100M 1G 10G 100G Year: 2014 Sample Rate [Samples/s] 22

22 10 fa Precision System SMU PXIe-4135 IV boundary 200 V 1 A DC, 3 A pulse 20 W DC, 500 W pulse 10 na current range: Accuracy: 0.06% ± 6 pa Sensitivity: 10 fa Noise (pk-to-pk): 1 pa Max Speed: Sampling 1.8 MS/s Update: 100 ks/s NI SourceAdapt Technology Hardware timing & triggering Triaxial connectivity 23

23 Boxes are Throttling Innovation Fixed Functionality Outdated Processors Communication Latency Little Data Streaming Closed Software The old, closed approach to test just isn t smart it can t keep pace with innovation. /smater-test

24 Approaches for Test and Measurement T R A D I T I O N A L A T E Vendor knows best Fixed-functionality box instruments Extend with vendor accessible customization Fixed software applications Monolithic instrument design Resulting closed vendor ecosystem P L A T F O R M A P P R O A C H Customer knows best Out of box measurement ready Extend with user accessible customization Productive, approachable software tools Modular instrument design with consistent APIs Resulting open partner, user, and IP ecosystem 25

25 Approaches for Test and Measurement T R A D I T I O N A L A T E Vendor knows best P L A T F O R M A P P R O A C H Customer knows best 26

26 Semiconductor Test System Built on PXI Platform Rugged Enclosure Production Floor Ready 27

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28 PXI Digital Pattern Instrument Built for Test of Semiconductor Devices RFICs and Transceivers Power Management ICs MEMS IoT Devices with Integrated MCUs and Sensors PXIe-6570 Digital Pattern Instrument ATE Development and Debug Features NI Digital Pattern Editor Source and Capture Memory History RAM, Digital Scope, Pin View, and System View Shmoo Plots ATE Test Capability Time Sets and Edge Placement Opcodes Multi-site Support Integrated Per-Channel PPMU Access Up to 256 Synchronized Channels 29

29 NI Digital Pattern Editor Developing, Editing, or Importing Digital Patterns Pin and Channel Map Specifications, Timing, Levels, and Pattern Files Documented ASCII Format for Pattern Files Debugging Tools for Digital Tests History RAM Overlay and Viewer Pin and System Views Digital Scope Shmoo Plot Tool Sweep Levels, Edges, and Specifications Sweep Multiple Sites in Parallel Integration with TestStand Semiconductor Module Launch Digital Pattern Editor from TestStand Add Break Points in Code to Debug 30

30 TestStand 2016 Semiconductor Module Support for TestStand 2016 Integration with PXIe-6570 Digital Pattern Instrument Native Pin Map support for NI Digital Pattern driver Integration with Digital Pattern Editor projects and associated files Toolbar navigation to Digital Pattern Editor software Advanced debugging capabilities accessible through Digital Pattern Editor software o Monitor and modify instrument states for 6570 and DCPower instruments TestStand Semiconductor Module Action Step.NET support for RFmx and RFPM Improved support for reporting of wafer information in STDF 32

31 Sensirion SHT20 humidity and temperature sensor Ember EM357 integrated ZigBee/ system-on-chip Skyworks 2436L high power 2.4 GHz front-end module 3.7 volts, 2.1 Wh (568 mah) lithium-ion rechargeable battery Avago ADBM-A350 optical finger navigation module Long range motion sensor Short range motion sensor source: teardown.com A smart thermostat contains much more than a bimetallic coil. /smater-test

32 5 Disruptive in Automated Test High-speed digital communication 34

33 The Move From Parallel to Serial Digital Buses 35

34 NI High-Speed Serial Instruments Up to 12.5 Gbps Up to 8 TX and RX lanes Xilinx Kintex-7 410T FPGA Programmable in LabVIEW FPGA 2 GB onboard DRAM 10.6 GB/s bandwidth Gen. 2 x8 PXIe 3.2 GB/s unidirectional bandwidth 2.4 GB/s bidirectional bandwidth Examples for: JESD204B Xilinx Aurora Serial RapidIO 10 Gigabit Ethernet CPRI 36 FlexRIO-like VHDL control of Xilinx MGTs

35 System Bandwidth [GB/s] Continually Increasing System Bandwidth GB/S PER LANE MB/S PER LANE MB/S PER LANE MB/S TOTAL PXI with PCI PXIe with PCIe Gen 1 PXIe with PCIe Gen 2 PXIe with PCIe Gen 3 37

36 PXIe GB/s Chassis Industry s First All Hybrid PXI Chassis with PCIe Gen 3 Technology PXI Express with PCIe Gen 3 Technology 16 hybrid slots; 1 PXIe system timing slot; 1 System Slot Up to 24 GB/s System Bandwidth (each direction) Available Rack Mount Kit Up to 8 GB/s slot bandwidth (each direction) Removable Power Shuttle; 925 W Total System Power W cooling capability per slot 38

37 5 Disruptive in Automated Test Processors and FPGAs 39

38 Processing Power Processing Power Reducing Test Times with Latest CPUs and FPGAs Traditional Box Instruments PXI- Based Test Systems Performance Gap Octo-Core CPU Quad-Core CPU Dual-Core CPU Dual-Core CPU Time Time 40

39 Processing Power Industry-Leading NI PXI Controller Portfolio PXIe-8880 Octo-Core Processing PXI-8156 Intel Pentium MMX 166 MHz, 16 MB RAM PXI-8176 RT Real-Time Operating System PXIe-8103 PXI Express Technology PXIe-8106 Dual-Core Processing PXIe-8135 Quad-core Processing * * Courtesy of Intel Corporation 41

40 NI PXIe-8880 Embedded Controller Industry s First PXI Controller with Intel Xeon Technology Intel Xeon E5-2618L v3 processor 2.3 GHz (base) and 3.4 GHz (Turbo Boost) 8 Physical and 16 Logical CPU Cores 8 GB DDR MHz RAM (standard); 24 GB max Up to 24 GB/s System Bandwidth (each direction) 240 GB, 1.8 in. SSD Hard Drive Windows 7 64-bit or LabVIEW Real-Time OS PXI Express with PCIe Gen 3 Technology * * Courtesy of Intel Corporation 42

41 The use of the latest Intel Xeon processors is a new milestone for our collaboration with NI. The Internet of Things requires the highest possible processing power to reduce time to market and lower the cost of test, and NI s approach with PXI is critical toward that goal. Shahram Mehraban Director, Market Development for Industrial IoT Intel 43

42 5X More DSP Slices for User Customization Testing Multiple Lte Bands 2 ND G E N V S T ST G E N V S T V S T I / O x Faster Measurements 44

43 Pushing Instrument Performance With FPGAs PXIe-5668R 26.5 GHz, >765MHz BW RTBW Vector Signal Analyzer PXIe-5170/71R 250 MS/s, 14-bit, 4-8 ch. Oscilloscope PXIe-5624R 2 GS/s, 12-bit IF Digitizer 45

44 Controller for FlexRIO Program with LabVIEW Decrease development time with a single development environment to target both FPGAs and Processors Leverage High Performance I/O 3GS/s AI 1Gb/s DIO 4.4GHz RF Process Data on Powerful Xilinx FPGAs Kintex-7 K410T w/ 2 GB DRAM 2 x SFP+ Ports for 2.5 GB/s of data streaming Reference clock & trigger inputs for synch. Deploy your Solution 667MHz Dual-Core ARM A9 Processor NI Linux Real-Time OS usd Storage, USB, and 1 GbE Connectivity Optimized for size, weight, and power 1.75 x 5.5 x 9.2 inches 46

45 5 Disruptive in Automated Test Big analog test data management 47

46 source:embraer.com 25,000 H O U R S O F S I M U L AT E D F L I G HT A smart airplane does much more than fly. /smater-test

47 [Tesla] produces the best Model S it can at the time, and that is what the customer receives. source: tesla.com Some customers may be frustrated to miss out on a feature here and there. Tesla, however, manages to deliver most of the upgrades as software updates that everyone gets [over-theair], providing current Model S customers with pleasant surprises. The ultimate goal is to never have to bring your car in after you buy it. Ashlee Vance, Elon Musk, Tesla, SpaceX, and the Quest for a Fantastic Future A smart automobile is much more than a mechanical machine. /smater-test

48 DIAdem Make Data-Driven Decisions Interactively Create Queries to Find the Data Need in Seconds Simplify Reporting With Auto-Populating Templates Load Over 1,000 File Formats Automate Analysis and Reporting Tasks Use More Than Just Data to Make Decisions Hundreds of Built-In Engineering Analysis Functions with Unit Control 50

49 DataFinder Server Edition Make Data-Driven Decisions Faster Data Management for the Enterprise Allow multiple DataFinder servers to communicate with each other regardless of location. Find and Load the Right Data in Seconds Create simple and advanced queries to quickly find the exact data sets you need. User Management and Security Use existing user permissions to control who access which data sets 51

50 HPE Edgeline 52 1 Gartner estimates that there will be 26 billion devices on the IoT by 2020

51 S M ART DEVICES REQUIRE SMARTER AUTO M ATED TEST SY TEMS 53

52 Stay Connected During and After NIDays /community facebook.com/ NationalInstruments twitter.com/ niglobal youtube.com/nationalinstruments 54