Clocked FIFO. Qualification Report. July, 1994, QTP# Version 1.0 DEVICE DESCRIPTION MARKETING PART NUMBER. 2K x 18 Clocked FIFO
|
|
- Angela Whitehead
- 6 years ago
- Views:
Transcription
1 Qualification Report July, 1994, QTP# Version 1.0 Clocked FIFO MARKETING PART NUMBER CY7C445 CY7C446 CY7C447 CY7C455 CY7C456 CY7C457 DEVICE DESCRIPTION 512 x 18 Clocked FIFO 1K x 18 Clocked FIFO 2K x 18 Clocked FIFO 512 x 18 Cascadable Clocked FIFO 1K x 18 Cascadable Clocked FIFO 2K x 18 Cascadable Clocked FIFO
2 PRODUCT DESCRIPTION (for qualification) Information provided in this document is intended for generic qualification and technically describes the Cypress part supplied: Marketing Part #: Device Description: Cypress Division: CY7C457 Cascadable Clocked FIFO Cypress Semiconductor Corporation Overall Die (or Mask) REV Level (pre-requisite for qualification): Die Size (stepping): 180 mils x 289 mils What ID markings on Die: 7C457A Cypress Qualification completion/marketing Availability Dates (Current REV): July/1994 Now A TECHNOLOGY/FAB PROCESS DESCRIPTION Number of Metal Layers: 1 Metal Composition: 1% SiAl, Ti Passivation Type and Materials: 4KA 2%P LTO, 15KA Oxynitride Free Phosphorus contents in top glass layer(%): None Die Coating(s), if used: Polyimide (Plastic Package) Generic Process Technology/Design Rule (µ-drawn): CMOS, Double Poly, Single Metal /0.8 µm Gate Oxide Material/Thickness (MOS): SiO2 / 165 A Name/Location of Die Fab (prime) Facility: Cypress Texas Inc., Round Rock, TX Die Fab Line ID/Wafer Process ID: Fab2/R2.1
3 PAGE 3 PLASTIC PACKAGE/ASSEMBLY DESCRIPTION Package Outline, Type, or Name: 52-Lead PLCC Die to Package edge clearance: 230 mils per side Mold Compound Name/Manufacturer: Sumitomo EME-6300H(R) Lead Frame material: Copper Lead Finish, composition: Solder Plated, 80%Sn, 20%Pb Die Attach Area Plating: Silver Die Attach Pad Dim: 300 mils x 370 mils Die Attach Method: Syringe Dispenser Die Attach Material: Silver Epoxy Wire Bond Method: Thermosonic Wire Material/Size: Gold / 1.3 mil Name/Location of Assembly (prime) facility: Anam, Korea Assembly Line ID and Process ID: KOREA-A /J52S
4 PAGE 4 OTHER INFORMATION For approval by similarity, identify other devices using the same basic die with bonding or metal mask options or test selections and explain: CY7C455/456 - Laser option of CY7C457 CY7C447 - Metal mask option of CY7C457 CY7C445/446 - Laser option of CY7C447 If Cypress is planning any changes in the near future, identify change (Qtr/Yr) in: Die Design Rev./Shrink: None Die Process Change: None Fab/Assembly site change: None Cross Licensee/Licensor: None Other Devices to be qualified in this technology: Other Packages to be qualified for this device: ESD Voltage Rating (per MIL STD-008, Method 3018): Flammability Classification (UL-94V): Alternate Fab/Assembly Locations: 1/8 or None Assembly : None None PDIP (CY7C445/446/447) >2,000V Please attach the following Qualification / Reliability data for the die revision and Package type, for the fab and assembly sites identified above (mark [X] if included): 1 X HAST (5.5V, 140 C, 85%RH, 15psig) 7 X Operating Life at (temp): 150 C 2 X Temperature Cycles (-65 C to 150 C) 8 X Steady State Life (HTSSL, 5.75V, 150 C) 3 X Temperature Cycles (-40 C to 165 C) 9 Temperature Humidity Bias (5.5V, 85 C, 85%RH) 4 Data Retention Bake, Plastic (165 C) 10 X Latchup Testing 5 Data Retention Bake, Hermetic (250 C) 11 X ESD Tests (MIL-STD 883, method 3015) 6 X Autoclave (PCT, 121 C, 100%RH) 12 Other: Current Density Input Capacitance Alpha Particle Sensitivity
5 PAGE 5 Product Family: Mfg Division: Clocked FIFO Cypress Semiconductor PRODUCT INFORMATION FOR QUALIFICATION BY SIMILARITY Supplier's Part Number Rate Speed (ns) Pkg Size/ Type Die Rev. Die Size mil x mil (stepping) Design Rule (µ) Fabrication Process ID Line ID Passivation Type Mold Compound Assembly Line Location ESD Volt Rating Availa bility (mm/y y) CY7C445 CY7C446 CY7C447 -**PC 14 ns to 30 ns 48.6 PDIP A 180 x R2.1 2 LTO + Oxynitride Sumitomo Anam, Korea >2000V 7/94 CY7C445 CY7C446 CY7C447 -**JC 14 ns to 30 ns 52L PLCC A 180 x R2.1 2 LTO + Oxynitride Sumitomo Anam, Korea >2000V 7/94
6 PAGE 6 DEVICE RELIABILITY SUMMARY Marketing Part: CY7C457 Wafer Fab: Fab2 - Round Rock,TX Pkg Description: 52-Lead PLCC Assembly: Anam, Korea High Temperature Dynamic Operating Life (HTOL, 5.75V, 125 C) - Early Failure Rate Device Assy Lot# Fab Lot # 48 Hours Cumulative CY7C457-JC /646 0/646 High Temperature Dynamic Operating Life (HTOL, 5.75V, 150 C) - Latent Failure Rate Device Assy Lot# Fab Lot# 80 Hours 500 Hours 1000 Hours Cumulative CY7C457-JC /116 0/116 1/311 CY7C457-JC /195 1/195 1 High Temperature Steady State Life Test (HTSSL, 5.75V, 150 C) Device Assy Lot# Fab Lot# 80 Hours 168 Hours Cumulative CY7C457-JC /76 0/76 0/152 CY7C457-JC /76 0/76 Temperature Cycle (JEDEC22, Condition B, -40 C to 125 C) Device Assy Lot# Fab Lot# 500 Cycles 1000 Cycles 1500 Cycles Cumulative CY7C457-JC /46 0/46 0/93 CY7C457-JC /47 0/47 0/47 Autoclave (PCT, No bias, 121 C, 100%RH, 15psig) Device Assy Lot# Fab Lot# 168 Hours Cumulative CY7C457-JC /46 0/46 1 Ionic contamination
7 PAGE 7 High Accelerated Saturation Test (HAST, 5.5V, 140 C, 85%RH, 15psig) Device Assy Lot# Fab Lot# 128 Hours Cumulative CY7C457-JC /46 0/46 High Bias Burn-in (7.0V, 125 C) Device Assy Lot# Fab Lot# 168 Hours 500 Hours Cumulative CY7C457-JC /136 0/136 0/136
8 PAGE 8 Device Reliability Summary CLOCKED FIFO CY7C445/446/447/455/456/457 Electrostatic Discharge Human Body Model Circuit per Mil Std 883, Method 3015 >+2,000V Unit 1 >-2,000V >+2,000V Unit 2 >-2,000V >+2,000V Unit 3 >-2,000V (Highest passing voltage, +10% Guard banded) Latchup Testing to Cypress Internal Latch-up Procedure 3 Tests: Current Injection = 200mA Trigger Hot Socket = VCC 0-8V Temp = 125 C Other miscellaneous tests Current Density Input Capacitance Alpha Particle Sensitivity Pass Pass Pass Other qualifications that affect this product family or process Qual Nbr 9113A Qualification Description 2K x 9 Clocked FIFO
9 PAGE 9 PREVIOUS QUALIFICATION Marketing Part: CY7c453 Prod. Family: 2K x 9 Clocked FIFO Mask ID: 7C453A Status: Complete Results: Pass FIT Rate (FITs): 42 Complete Date: June, 1992 Process ID: R2.1 Technology: CMOS Process Loc: Round Rock, TX Package: PLCC/CDIP Package Loc: Anam, Korea (PLCC) Alphatec, Thailand (CDIP) Test Loc: San Jose,CA Cypress Test No. Stress/Test Reference Method Actual Conditions Status * Qualification Data Reference Test Result Temp/Bias Hrs/Cyc SS/Fail Pass Fail 22A HTOL - EFR/LFR C/5.75V 48 Hrs. 80 Hrs. 500 Hrs. 0/1077 0/423 0/423 C 9113A X 36 High Temp. Steady State Life (HTSSL) C/5.75V 80 Hrs. 168 Hrs. 0/152 C 9113A X 1/ HAST C/5.75V 100 Hrs. 0/151 C 9113A X 24 Steam Test/Autoclave/PCT C/No Bias 96 Hrs. 288 Hrs. 0/152 0/152 C 9113A X 12 Temperature Cycle Cond. C -65C to 150C 100 Cycs. 300 Cycs Cycs. 0/76 0/76 1/76 2 C 9113A X 13 Temperature Cycle JEDEC22, cond. B -40C to 125C 300 Cycs Cycs. 0/76 0/76 C 9113A X 34 Accelerated Soft Error Rate System Soft Error Rate 20 Mechanical Sequence 26 X-Ray 6 ESD-HBM Corner Pins Internal Pins ---- C 9113A X 6 ESD-CDM Corner Pins Internal Pins Latch-up C 9113A X 50 Flammability & Oxygen Index 14 Moisture Resistance 9 Internal Water Vapor 2 Solvent Resistance 4 Internal Visual 1 2 Failure due to metal bridge. Fine Leak failure
CY7C182 8K x 9 Static R/W RAM. Qualification Report January 1994, QTP #92511 & 94451, Version 2.0
CY7C182 8K x 9 Static R/W RAM Qualification Report January 1994, QTP #92511 & 94451, Version 2.0 PRODUCT DESCRIPTION (for qualification) Information provided in this document is intended for generic qualification
More informationCypress Semiconductor Technology Qualification Report
Cypress Semiconducr Technology Qualification Report QTP# 91423 VERSION 2.0 July, 2003 16K Chop Redesign MARKETING PART NUMBER CY7C128A CY7C167A CY7C168A CY7C169A CY7C170A CY7C171A CY7C172A DEVICE DESCRIPTION
More informationQualification Report. October, 1993, QTP Version 1.0. Pinnacle Cache Ram MARKETING PART NUMBER DEVICE DESCRIPTION. 16K x 32 I/O Cache 80 MHz
Qualification Report October, 1993, QTP 93091 Version 1.0 Pinnacle Cache Ram MARKETING PART NUMBER CY7C627-10EC CY7C627-9EC DEVICE DESCRIPTION 16K x 32 I/O Cache 67MHz 16K x 32 I/O Cache 80 MHz PRODUCT
More informationQualification Report 64K RAM 2.1, 7% SHRINK CY7C161/A * CY7C162/A * CY7C164/A * CY7C166/A * CY7C185/A* CY7C187/A *
Qualification Report November, 1994, QTP# 94012/94133 Version 1.1 64K RAM 2.1, 7% SHRINK MARKETING PART NUMBER Y7161/A * Y7162/A * Y7164/A * Y7166/A * Y7185/A* Y7187/A * DEVIE DESRIPTION 16K x 4 Static
More informationQualification Report. June, 1994, QTP Version 1.0. PAL20 Series MARKETING PART NUMBER DEVICE DESCRIPTION. Industry Standard 20-Pin PLDs
Qualification Report June, 1994, QT 93341 Version 1.0 AL20 Series MARKETING ART NUMBER AL16L8 AL16R8 AL16R6 AL16R4 DEVIE DESRITION Industry Standard 20-in LDs Industry Standard 20-in LDs Industry Standard
More informationQualification Report. January, 1995 QTP# Version 1.3. FAB µm FCT-T PRODUCTS
Qualification Rept January, 1995 QTP# 94048 Version 1.3 FB3 0.65 µm FT-T PRODUTS PGE 3 YPRESS SEMIONDUTOR PRODUT DESRIPTION (f qualification) Infmation provided in this document is intended f generic
More informationCypress Semiconductor Product Qualification Report
Cypress Semiconductor roduct Qualification Report QT# 99422 VERSION 1.0 November, 2000 Low Cost VMEbus Interface Controller Family L28ED Technology Fab 2 CY7C960A/CY7C961A CYRESS TECHNICAL CONTACT FOR
More informationCypress Semiconductor Process Qualification Report
Cypress Semiconductor rocess Qualification Report QT# 012806 VERSION 1.0 March 2005 TSMC 0.5um Logic3 Device Family, Fab2 CYW305B CY28323B CY28349B CY28325B-3 Frequency Controller with System Recovery
More informationPowerQUICC Communications Processor
PowerQUICC Communications Processor MPC8548 Product Family Rev. 2.1/2.1.1, 2.1.2 and 3.1.2 783 Lead PBGA Package ATMC/Global Foundries 90nm SOI CMOS Qualification Report Standard C5 Spheres: 62% Sn, 36%
More informationRELIABILITY REPORT FOR. MAX202ExxE PLASTIC ENCAPSULATED DEVICES. February 22, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086
MAX202ExxE Rev. A RELIABILITY REPORT FOR MAX202ExxE PLASTIC ENCAPSULATED DEVICES February 22, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord
More informationRELIABILITY REPORT FOR. MAX4544xxx PLASTIC ENCAPSULATED DEVICES. October 10, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086
MAX4544xxx Rev. A RELIABILITY REPORT FOR MAX4544xxx PLASTIC ENCAPSULATED DEVICES October 10, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationMAXIM INTEGRATED PRODUCTS
MAX149xxxP Rev. A RELIABILITY REPORT FOR MAX149xxxP PLASTIC ENCAPSULATED DEVICES October 13, 2004 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Jim Pedicord Quality Assurance
More informationMAXIM INTEGRATED PRODUCTS
MAX542xxxD Rev. B RELIABILITY REPORT FOR MAX542xxxD PLASTIC ENCAPSULATED DEVICES June 14, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX8685AETD+ PLASTIC ENCAPSULATED DEVICES July 9, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Richard Aburano Quality Assurance Manager, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR PLASTIC ENCAPSULATED DEVICES March 10, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Richard Aburano Quality Assurance Manager, Reliability Operations
More informationRELIABILITY REPORT FOR. MAX4040Exx PLASTIC ENCAPSULATED DEVICES. June 8, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086
MAX4040 Rev. B RELIABILITY REPORT FOR MAX4040Exx PLASTIC ENCAPSULATED DEVICES June 8, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationRELIABILITY REPORT FOR MAX3864ESA PLASTIC ENCAPSULATED DEVICES. November 28, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086
MAX3864ESA Rev. A RELIABILITY REPORT FOR MAX3864ESA PLASTIC ENCAPSULATED DEVICES November 28, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord
More informationMAXIM INTEGRATED PRODUCTS
MAX3089ExxD Rev. A RELIABILITY REPORT FOR MAX3089ExxD PLASTIC ENCAPSULATED DEVICES June 20, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationMAXIM INTEGRATED PRODUCTS
DG409xxx Rev. A RELIABILITY REPORT FOR DG409xxx PLASTIC ENCAPSULATED DEVICES August 21, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX8867EUKxx+ PLASTIC ENCAPSULATED DEVICES January 21, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationRELIABILITY REPORT FOR. MAX485ExxA PLASTIC ENCAPSULATED DEVICES. November 19, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086
MAX485ExxA Rev. A RELIABILITY REPORT FOR MAX485ExxA PLASTIC ENCAPSULATED DEVICES November 19, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MIPL+ PLASTIC ENCAPSULATED DEVICES September 29, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
MAX6106EUR Rev. A RELIABILITY REPORT FOR MAX6106EUR PLASTIC ENCAPSULATED DEVICES February 14, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX238CWG+ PLASTIC ENCAPSULATED DEVICES September 9, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX13208EALB+ PLASTIC ENCAPSULATED DEVICES July 7, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR ETD+T PLASTIC ENCAPSULATED DEVICES August 9, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Don Lipps Quality Assurance Manager, Reliability Engineering
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX5491xxxxx+ PLASTIC ENCAPSULATED DEVICES July 2, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR CTP+ PLASTIC ENCAPSULATED DEVICES January 13, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
MAX3088xxA Rev. A RELIABILITY REPORT FOR MAX3088xxA PLASTIC ENCAPSULATED DEVICES February 26, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR PLASTIC ENCAPSULATED DEVICES March 15, 2012 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Richard Aburano Quality Assurance Manager, Reliability Engineering
More informationMAXIM INTEGRATED PRODUCTS
MAX358xxE Rev. A RELIABILITY REPORT FOR MAX358xxE PLASTIC ENCAPSULATED DEVICES June 5, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX6627MKA-T PLASTIC ENCAPSULATED DEVICES November 19, 2008 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
MAX3378EEUD Rev. A RELIABILITY REPORT FOR MAX3378EEUD PLASTIC ENCAPSULATED DEVICES March 6, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationPEX8619 (Vehicle: PEX 8619 BA50BC Green & non-green) Reliability Product Qualification Report
PEX8619 (Vehicle: PEX 8619 BA50BC Green & non-green) Reliability Product Qualification Report Family Qualification: PEX8619 BA50BC (Green & non-green) PEX8618 BA50BC (Green & non-green) PEX8617 BA50BC
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR PLASTIC ENCAPSULATED DEVICES January 12, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability Engineering
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX17480GTL+ PLASTIC ENCAPSULATED DEVICES August 7, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX186AEAP+ PLASTIC ENCAPSULATED DEVICES July 28, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationRELIABILITY REPORT FOR PLASTIC ENCAPSULATED DEVICES MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086
MAX726xCK Rev. A RELIABILITY REPORT FOR MAX726xCK PLASTIC ENCAPSULATED DEVICES June 20, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR PLASTIC ENCAPSULATED DEVICES July 31, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Richard Aburano Quality Assurance Manager, Reliability Operations
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR PLASTIC ENCAPSULATED DEVICES August 21, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability Engineering
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX1785EUU+ PLASTIC ENCAPSULATED DEVICES May 6, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
MAX8510EXKxx Rev. B RELIABILITY REPORT FOR MAX8510EXKxx PLASTIC ENCAPSULATED DEVICES July 11, 2006 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord
More informationAEC-Q100F Qualification Results Summary
AEC-Q100F Qualification Summary Objective: To qualify NPI 9S08DZ60 M74K in a 64 LQFP Package Freescale PN: 9S08DZ60 Customer Name(s): Multiple Part Name: Longhorn PN(s): Technology: 0.25um Embedded Flash
More informationRELIABILITY REPORT FOR MAX2055EUP PLASTIC ENCAPSULATED DEVICES. April 2, 2004 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086
MAX2055EUP Rev. A RELIABILITY REPORT FOR MAX2055EUP PLASTIC ENCAPSULATED DEVICES April 2, 2004 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX490CSA+ PLASTIC ENCAPSULATED DEVICES January 5, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX846AEEE+ PLASTIC ENCAPSULATED DEVICES December 11, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX7301AAI+ PLASTIC ENCAPSULATED DEVICES January 27, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationProduct Change Notification PCN Additional Manufacturer for the XC18V00 Family of In- System Programmable Configuration PROMs
Product Change Notification PCN2003-04 Additional Manufacturer for the XC18V00 Family of In- System Programmable Configuration PROMs Overview: This notification is to inform you of an additional wafer
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX9716EUA+ PLASTIC ENCAPSULATED DEVICES February 5, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX485ECPA PLASTIC ENCAPSULATED DEVICES November 19, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability
More informationProduct Reliability OVERVIEW FAILURE RATE CALCULATION DEFINITIONS
M Product Reliability OVERVIEW Microchip Technology Inc. s products provide competitive leadership in quality and reliability, with demonstrated performance of less than 1 FITs (Failures in Time) operating
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX17135ETJ+ PLASTIC ENCAPSULATED DEVICES June 8, 2012 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX4950CTO+ PLASTIC ENCAPSULATED DEVICES May 20, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More information12500 TI Boulevard, MS 8640, Dallas, Texas 75243
2500 TI Boulevard, MS 8640, Dallas, Texas 75243 PN 2060309000 TPS6223TDRYRQ and TPS62234TDRYRQ LLGA to etch and Datasheet update for TPS6223-Q/TPS62234-Q Final hange Notification Date: 3/30/206 To: EBV
More informationQualification of the AMD Alchemy Au1500 Processor
Qualification of the AMD Alchemy Au1500 Processor 27364B March 2003 2002, 2003 Advanced Micro Devices, Inc. All rights reserved. The contents of this document are provided in connection with Advanced Micro
More informationFORM A GENERAL INFORMATION (PAGE 1 OF4)
FORM A GENERAL INFORMATION (PAGE 1 OF4) GENERAL INFORMATION Required information Evaluation Type Device Wafer Fab Assembly, Test/Burn-in, Finish): Include FORM B1, B2 or B3. [ ] [ X ] [ ] Temperature Range
More informationMAXIM INTEGRATED PRODUCTS
MAX1788EUI Rev. B RELIABILITY REPORT FOR MAX1788EUI PLASTIC ENCAPSULATED DEVICES November 3, 2008 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Ken Wendel Quality Assurance
More informationRELIABILITY REPORT FOR. MAX16998xAUA+T PLASTIC ENCAPSULATED DEVICES. August 18, 2013 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR xaua+t PLASTIC ENCAPSULATED DEVICES August 18, 2013 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Richard Aburano Quality Assurance Manager, Reliability Engineering
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX3226EETE+ PLASTIC ENCAPSULATED DEVICES February 10, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX3671ETN+ (MAX3673) PLASTIC ENCAPSULATED DEVICES June 8, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director,
More informationPCN Number: PCN Date: 09/29/2015 TPS76950 LEN to NFME Customer. Quality PCN Manager PCN Type: 180 day Dept: Contact:
PCN Number: 20150914001 PCN Date: 09/29/2015 Title: TPS76950 LEN to NFME Customer Quality PCN Manager PCN Type: 180 day Dept: Contact: Services Proposed 1 st Ship Date: 03/29/2016 Estimated Sample Date
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX11060GUU+ PLASTIC ENCAPSULATED DEVICES May 18, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer
More informationMAXIM INTEGRATED PRODUCTS
MAX1619MEE Rev. A RELIABILITY REPORT FOR MAX1619MEE PLASTIC ENCAPSULATED DEVICES October 17, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationRELIABILITY REPORT FOR MAX1300EUG PLASTIC ENCAPSULATED DEVICES. September 16, 2015 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR MAX1300EUG PLASTIC ENCAPSULATED DEVICES September 16, 2015 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim
More informationRELIABILITY REPORT FOR MAX9286GTN+ PLASTIC ENCAPSULATED DEVICES. June 5, 2015 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR MAX9286GTN+ PLASTIC ENCAPSULATED DEVICES June 5, 2015 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated.
More information800 W. 6 th Street, Austin, TX 78701
800 W. 6 th Street, Austin, TX 78701 Assembly Site Transfer from StatsChipPac Kuala Lumpur, Malaysia (SCM) to ANST Wuxi CHINA for the CS4265-CNZ(R) component Process/Product Change Notification (Reference
More informationCommercial Qualification Plan/Results Summary
Objective: New Package Qualification for ER48 in a 40 pin Plastic Land Grid Array Freescale PN: SC9S08ER48 Customer Name(s): Insulet Part Name: "ER48, Eros-ASIC" PN(s): Commercial Qualification Plan/ Summary
More information800 W. 6 th Street, Austin, TX 78701
800 W. 6 th Street, Austin, TX 78701 Assembly Site Transfer from StatsChipPac Kuala Lumpur, Malaysia (SCM) to ANST Wuxi CHINA for the CS42L51-CNZ(R), CS42L51-DNZ(R), CS43L21-CNZ(R), CS53L21-CNZ(R) and
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX9169ESE+ (MAX9170) PLASTIC ENCAPSULATED DEVICES October 29, 2008 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director,
More informationMAXIM INTEGRATED PRODUCTS
MAX2720EUP Rev. A RELIABILITY REPORT FOR MAX2720EUP PLASTIC ENCAPSULATED DEVICES March 25, 2004 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality
More informationRELIABILITY REPORT FOR MAX4017EUA+T PLASTIC ENCAPSULATED DEVICES. February 21, 2013 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR MAX4017EUA+T PLASTIC ENCAPSULATED DEVICES February 21, 2013 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim
More informationPCN Number: A PCN Date: 10/31/2013. Qualification of ASESH, TITL and JCAP as Additional Assembly / Test Site for Select Devices Customer
PCN Number: 20130903003A PCN Date: 10/31/2013 Title: Qualification of ASESH, TITL and JCAP as Additional Assembly / Test Site for Select Devices Customer Quality PCN_ww_admin_team@list.ti.com Phone: +1(214)480-6037
More informationFINAL PRODUCT/PROCESS CHANGE NOTIFICATION 20068A Generic Copy
FINAL PRODUCT/PROCESS CHANGE NOTIFICATION 20068A Generic Copy Issue Date: 23-Apr-2014 TITLE: Qualify OSPI as alternate supplier of SOIC16, SOIC24 & SOIC28 packages PROPOSED FIRST SHIP DATE: SOIC16, SOIC24
More informationRELIABILITY REPORT FOR MAX11254ATJ+T PLASTIC ENCAPSULATED DEVICES. October 2, 2015 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR ATJ+T PLASTIC ENCAPSULATED DEVICES October 2, 2015 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Eric Wright Quality Assurance Reliability Engineer Maxim Integrated.
More informationRELIABILITY REPORT FOR MAX14756EUE+T PLASTIC ENCAPSULATED DEVICES. October 15, 2012 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR MAX14756EUE+T PLASTIC ENCAPSULATED DEVICES October 15, 2012 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Richard Aburano Quality Assurance Manager, Reliability
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX4455ECQ+ PLASTIC ENCAPSULATED DEVICES December 1, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability
More informationRELIABILITY REPORT FOR MAX14600ETA+ PLASTIC ENCAPSULATED DEVICES. December 11, 2012 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR MAX14600ETA+ PLASTIC ENCAPSULATED DEVICES December 11, 2012 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX9266GCM/V+T PLASTIC ENCAPSULATED DEVICES November 29, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Richard Aburano Quality Assurance Manager,
More informationRELIABILITY REPORT FOR MAX44259AUK+T PLASTIC ENCAPSULATED DEVICES. October 3, 2014 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR MAX44259AUK+T PLASTIC ENCAPSULATED DEVICES October 3, 2014 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Eric Wright Quality Assurance Reliability Engineering Maxim
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX5406EUM+ PLASTIC ENCAPSULATED DEVICES November 23, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability
More informationMAXIM INTEGRATED PRODUCTS
MAX6628MKA Rev. A RELIABILITY REPORT FOR MAX6628MKA PLASTIC ENCAPSULATED DEVICES September 30, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord
More informationQUALIFICATION REPORT RELIABILITY LABORATORY PCN #: JAON-14ZJMR243. Date: August 22, 2016
QUALIFICATION REPORT RELIABILITY LABORATORY PCN #: JAON-14ZJMR243 Date: August 22, 2016 Qualification of palladium coated copper with gold flash (CuPdAu) bond wire in selected products of the 0.18um TSMC
More information12500 TI Boulevard, MS 8640, Dallas, Texas 75243
12500 TI Boulevard, MS 8640, Dallas, Texas 75243 Hybrid Au/Cu wire bond flow for NFBGA Shiva and Freon Devices Change Notification / Sample Request Date: 6/23/2014 To: Newark/Farnell PCN Dear Customer:
More informationSDQR 108. Preliminary
PD69012 12 Ports AF/AT PoE Device Qualification Report Table of Contents 1. Introduction 3 2. Product Information 3 3. IC Design and Manufacturing Flow Chart 4 4. Qualification Tests Results 5 5. Package
More informationRELIABILITY REPORT FOR MAX14640ETA+T PLASTIC ENCAPSULATED DEVICES. March 19, 2013 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR MAX14640ETA+T PLASTIC ENCAPSULATED DEVICES March 19, 2013 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Richard Aburano Quality Assurance Manager, Reliability Engineering
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX1722EZK+ PLASTIC ENCAPSULATED DEVICES July 7, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer
More informationAlun D. Jones.
Environmental Screening Alun D. Jones www.micross.com Why? Environmental screening is intended to determine whether a particular device or batch of devices can survive in a given environment, for a known
More informationProduct Change Notification - CSI JAON- 08AHID607 (Convert To PDF )
Product Change Notification - JAON-08AHID607 - CSI0500046-24 May 2018 - CCB 1... Page 1 of 3 VIEW CART (0) Search PRODUCTS APPLICATIONS DESIGN SUPPORT SAMPLE AND BUY ABOUT US CONTACT US MYMICROCHIP LOGIN
More informationMAXIM INTEGRATED PRODUCTS
MAX1692EUB Rev. A RELIABILITY REPORT FOR MAX1692EUB PLASTIC ENCAPSULATED DEVICES February 14, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord
More informationAnalog Devices Welcomes Hittite Microwave Corporation NO CONTENT ON THE ATTACHED DOCUMENT HAS CHANGED
Analog Devices Welcomes Hittite Microwave Corporation NO CONTENT ON THE ATTACHED DOCUMENT HAS CHANGED www.analog.com www.hittite.com Report Title: Report Type: Date: Qualification Test Report See Attached
More information800 W. 6 th Street, Austin, TX 78701
800 W. 6 th Street, Austin, TX 78701 Assembly Site Transfer from StatsChipPac Kuala Lumpur, Malaysia (SCM) to ANST Wuxi CHINA for the CS42L51-CNZ(R), CS42L51-DNZ(R), CS43L21-CNZ(R), CS53L21-CNZ(R) and
More informationMAXIM INTEGRATED PRODUCTS
RELIABILITY REPORT FOR MAX98089EWY+ WAFER LEVEL PRODUCTS March 22, 2012 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Richard Aburano Quality Assurance Manager, Reliability
More informationProduct Change Notification - GBNG-07RHVT039
Product Change Notification - GBNG-07RHVT039-28 Nov 2017 - CCB 3179 Initial No... http://www.microchip.com/mymicrochip/notificationdetails.aspx?pcn=gbng-07rhvt0... Page 1 of 3 12/4/2017 Product Change
More informationRELIABILITY REPORT FOR MAX14582EWC+T WAFER LEVEL PRODUCTS. October 21, 2012 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR MAX14582EWC+T WAFER LEVEL PRODUCTS October 21, 2012 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Richard Aburano Quality Assurance Manager, Reliability Engineering
More informationRELIABILITY REPORT FOR MAX44005EDT+ PLASTIC ENCAPSULATED DEVICES. April 24, 2013 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA
RELIABILITY REPORT FOR EDT+ PLASTIC ENCAPSULATED DEVICES April 24, 2013 MAXIM INTEGRATED 160 RIO ROBLES SAN JOSE, CA 95134 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated.
More informationReliability Monitoring and Outgoing Quality Report Q ESC Division. May 2018
Reliability Monitoring and Outgoing Quality Report Q1 2018 - ESC Division May 2018 1 Revision History 1.1 Revision 1.0 Revision 1.0 is Initial Release of this document published in May 2018. Microsemi
More informationFINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy. 13-Jul SUBJECT: ON Semiconductor Final Product/Process Change Notification #16300
FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 13-Jul-2009 SUBJECT: ON Semiconductor Final Product/Process Change Notification #16300 TITLE: Final Notification for Transfer of High Speed Logic
More informationContact: Bimla Paul Attachment: Yes No Title: Product Quality Assurance
PCN #: W1107-01R1 DATE: November 18, 2011 MEANS OF DISTINGUISHING CHANGED DEVICES: Product Affected: Refer Attachment 3 Product Mark Back Mark Date Code Other Assembly lot# and Date Code Date Effective:
More informationFINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy. 13-Jan SUBJECT: ON Semiconductor Final Product/Process Change Notification #16189
FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 13-Jan-2009 SUBJECT: ON Semiconductor Final Product/Process Change Notification #16189 TITLE: Final Notification for Transfer of Standard Logic Metal
More informationLQFP. Thermal Resistance. Body Size (mm) Pkg. 32 ld 7 x 7 5 x ld 7 x 7 5 x ld 14 x 14 8 x ld 20 x x 8.5
LQFP Low Profile Quad Flat Pack Packages (LQFP) Amkor offers a broad line of LQFP IC packages designed to provide the same great benefits as MQFP packaging with a 1.4 mm body thickness. These packages
More information