Direct Attach ViProbe Series Probe Cards for Wafer Test
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1 Direct Attach ViProbe Series Probe Cards for Wafer Test
2 Probe Cards Direct Attach ViProbe Series FEINMETALL Direct Attach ViProbe Series represents a technology in advanced wafer probing. Our Direct Attach ViProbe Series is designed for high performance and high pin count probe cards. These products provide the capability for substantial time- and cost- savings in wafer testing. 7 good reasons for using Direct Attach ViProbe Series the Vertical Probe Card Technology from FEINMETALL Key Parameters D09 / D32 / D41 / D42 Active Area: from 17x17mm (D41) to 80x80mm (D09) or Ø 213 mm (D32) Tester: Teradyne J750, µflex Advantest V93000 all other testers possible Tolerates changing planarity conditions Pitch: min 72µm Made in Germany Test Points: up to Temperature: -40 C C Excellent electrical performance Full wafer test possible Easy Maintenance & Service Easy exchange of needles Precise alignment over the entire lifetime FEINMETALL GMBH HERRENBERG, GERMANY info@feinmetall.com FEINMETALL SINGAPORE PTE LTD SINGAPORE info@sg.feinmetall.com FEINMETALL-OCT HSINCHU COUNTY, TAIWAN info@tw.feinmetall.com FEINMETALL USA LLC SAN JOSE, USA info.us@feinmetall.com Subject to change without notice Release May 2014
3 ViProbe Space Transformer Series Probe Cards for Wafer Test
4 Probe Cards ViProbe Space Transformer Series FEINMETALL ViProbe Space Transformer Series represents a leading technology in advanced wafer probing. The advantages of our ViProbe Space Transformer Series are excellent electrical performance, high pin count-, high parallel testing as well as excellent temperature behaviour. ViProbe Space Transformer Series products are based on MLC and MLO Technology. These products provide the capability for substantial time- and cost- savings in wafer testing. 7 good reasons for using ViProbe Space Transformer Series the Vertical Probe Card Technology from FEINMETALL Excellent electrical performance Easy Maintenance & Service Easy exchange of needles Precise alignment over the entire lifetime Excellent temperature behaviour Minimum impact on the bond pad Tolerates changing planarity conditions Key Parameters M22 / M23 / S22 / S23 / S24 Active Area: Tester: Pitch: min 56µm 40x40mm (M22/M23/ S22/S23) 50x80mm (S24) Teradyne J750, µflex Advantest V93000 other testers on request Test Points: up to Temperature: -40 C C FEINMETALL GMBH HERRENBERG, GERMANY info@feinmetall.com FEINMETALL SINGAPORE PTE LTD SINGAPORE info@sg.feinmetall.com Subject to change without notice Release May 2014 FEINMETALL-OCT HSINCHU COUNTY, TAIWAN info@tw.feinmetall.com FEINMETALL USA LLC SAN JOSE, USA info.us@feinmetall.com
5 ViProbe Wired Series Probe Cards for Wafer Test
6 Probe Cards ViProbe Wired Series FEINMETALL ViProbe Wired Series represents a technology in advanced wafer probing. The advantages of our ViProbe Wired Series are fast lead time, high flexibility as well as flexible probe tip depth. ViProbe Wired Series products are based on Wired Version Technology. These products provide the capability for substantial time- and cost- savings in wafer testing. 7 good reasons for using ViProbe Wired Series the Vertical Probe Card Technology from Feinmetall Fast lead time and flexibility Key Parameters W10 / W40 / W41 / W42 / W43 Active Area: from 9 x 10 mm (W40) to 45x45mm (W43) Tester: Teradyne J750, µflex Advantest V93000 all other testers possible Minimum impact on the bond pad Pitch: min 56µm Tolerates changing planarity conditions Test Points: up to Temperature: -40 C C Easy Maintenance & Service Easy exchange of needles Precise alignment over the entire lifetime Excellent temperature behaviour FEINMETALL GMBH HERRENBERG, GERMANY info@feinmetall.com FEINMETALL SINGAPORE PTE LTD SINGAPORE info@sg.feinmetall.com FEINMETALL-OCT HSINCHU COUNTY, TAIWAN info@tw.feinmetall.com FEINMETALL USA LLC SAN JOSE, USA info.us@feinmetall.com Subject to change without notice Release May 2014
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