Lesson 2 Instrument Configurations for Profex / BGMN
|
|
- Milo McLaughlin
- 5 years ago
- Views:
Transcription
1 Lesson 2 Instrument Configurations for Profex / BGMN Nicola Döbelin RMS Foundation, Bettlach, Switzerland June 13 15, 2018, Bettlach, CH
2 Fundamental Parameters Approach 2
3 BGMN: Wavelength Distribution Geometric Instrument Data Refined Parameters (*.geq) (*.lst) Wavelength Distribution (*.lam) Diffraction Pattern Refinement Control File (*.sav) Run BGMN Refined Pattern (*.dia) Peak Parameters (*.xy) (*.par) Structure Models 1 n Refined Structures (*.str) (*.str, *.res, *.fcf, *.pdb ) 3
4 BGMN: Wavelength Distribution Charakteristic X-radiation is a physical constant. All characteristic spectra for a certain target element look the same. Values can be taken from literature. BUT: Filters change the spectrum recorded by the detector: Kbeta filter Monochromator crystal (primary or secondary beam) Digital filter (energy dispersive detector) 4
5 BGMN: Wavelength Distribution Lorentzian Curves In /Profex-BGMN-Bundle/BGMNwin/*.lam Show sub-curves 5
6 BGMN: Wavelength Distribution Lorentzian Curves Half width [1/nm] Center inverse Wavelength [1/nm] Relative Intensity ILAM = number of curves 6
7 BGMN: Wavelength Distribution 100 CuKβ CuKα 3 CuKβ CuKα 3 Intensity [a.u.] E Wavelength [Angstrom] 7
8 BGMN: Wavelength Distribution If «betaratio» is defined: Intensity = betaratio Else: Intensity =
9 When to change the *.lam file? When default Kβ / Kα 3 intensity is not correct When using a primary-beam monochromator cu_berger86.lam cu_doebelin2012.lam (= cu.lam) betaratio=
10 «Spectral Line Cursor» (S key) Default: Shows Kα 1, Kα 2, Kβ only 10
11 «Spectral Line Cursor» (S key) ILAM= *ifthenelse(ifdef(alpha3ratio),(alpha3ratio)/ ,1) % CaKa *ifthenelse(ifdef(alpha2ratio),(1-alpha2ratio)/ ,1) % CuKa1 (1) *ifthenelse(ifdef(alpha2ratio),(1-alpha2ratio)/ ,1) % CuKa1 (2) *ifthenelse(ifdef(alpha2ratio),(alpha2ratio)/ ,1) % CuKa2 (1) *ifthenelse(ifdef(alpha2ratio),(alpha2ratio)/ ,1) % CuKa2 (2) *ifthenelse(ifdef(betaratio),(betaratio)/ ,1) % CuKb Trailing comment = label Lines without comment will not be shown 11
12 BGMN: Geometric Instrument Data Geometric Instrument Data Refined Parameters (*.geq) (*.lst) Wavelength Distribution (*.lam) Diffraction Pattern Refinement Control File (*.sav) Run BGMN Refined Pattern (*.dia) Peak Parameters (*.xy) (*.par) Structure Models 1 n Refined Structures (*.str) (*.str, *.res, *.fcf, *.pdb ) 12
13 BGMN: Geometric Instrument Data Profile Interpolation Raytraced Peak Profiles (*.ger) Monte-Carlo Simulations Geometric Instrument Data (*.geq) Wavelength Distribution (*.lam) Diffraction Pattern (*.xy) Refinement Control File (*.sav) Instrument Description (*.sav) Structure Models 1 n (*.str) 13
14 BGMN: Geometric Instrument Data Profile Interpolation Geometric Instrument Data (*.geq) Raytraced Peak Profiles (*.ger) Monte-Carlo Simulations Instrument Description (*.sav) 14
15 BGMN: Geometric Instrument Data 3 things required 15
16 BGMN: Geometric Instrument Data 1. Physical access to the instrument and technical documentation 16
17 BGMN: Geometric Instrument Data 2. Access to the control software 17
18 BGMN: Geometric Instrument Data 3. A reference dataset - Reference sample (e.g. NIST SRM) - Measured with the instrument configuration to be used with Profex - Measured over a wide angular range (e.g ), wider than future standard measurements 18
19 BGMN Variables 19
20 BGMN: Geometric Instrument Data Open existing instrument *.sav file Choose one that resembles your configuration (same manufacturer, same detector, variable or fixed divergence slit) Change / add / remove variables Run raytracing and interpolation Go through the file line by line If your instrument has the optical element but you don t know the setting, leave it at the default If your instrument doesn t have this element, remove (or comment) the line If your instrument has additional elements, add them according to the schematic no Test config by refining ref. dataset Result ok? yes Done Difference curve must be nearly perfect Crystallite sizes must be realistic (compare with SRM certificate) Practical examples after lunch 20
21 BGMN: Geometric Instrument Data Open existing instrument *.sav file Change / add / remove variables Run raytracing and interpolation Test config by refining ref. dataset no Result ok? yes Done 21
22 BGMN: Geometric Instrument Data Open existing instrument *.sav file Change / add / remove variables Run raytracing and interpolation Test config by refining ref. dataset no Result ok? yes Done 22
23 Verification with SRM NIST SRM 1976b Al 2 O 3 The platelets were typically 5 μm to 10 μm in diameter by 2 μm to 3 μm in thickness This leads to a minimal development of micro-strain and its associated line broadening Given this, and the essential absence of crystallite size broadening, SRM 1976b can be used to obtain an approximation of the instrument profile function (IPF) 23
24 NIST Standard Reference Materials (SRM) 24
25 Non-standard configurations What about: - Primary beam monochromators - Area detectors - Synchrotron / neutron diffractometers - Future optics Fake the configuration until the peak profile matches Or use Profex with FullProf 25
26 Faked Instrument Configurations We need to get there No matter how 26
27 Faked Instrument Configurations Aligned instrument Misaligned instrument Anti-Scatter Slit Divergence Slit Anti-Scatter Slit Divergence Slit Beam Shape Beam Shape H H W W 27
28 Exercises Exercise 1: Configure the RMS standard instrument setup, starting from a totally wrong template. Exercise 2: Configure an instrument with a primary beam monochromator. (Nobody has succeeded yet ) 28
Lesson 8 Crystal Structure Models
Lesson 8 Crystal Structure Models Nicola Döbelin RMS Foundation, Bettlach, Switzerland June 07 09, 2017, Oslo, N BGMN Project Structure device.geq Interpolated peak profile sample.lst sample.xy Measured
More informationLesson 2 BGMN & Profex
Lesson 2 BGMN & Profex Nicola Döbelin RMS Foundation, Bettlach, Switzerland March 3, 2015, Lyon, France Rietveld Refinement Software BGMN BGMN: - Fundamental Parameters Approach - Free for academic use
More informationLesson 5 BGMN and Profex
Lesson 5 BGMN and Profex Nicola Döbelin RMS Foundation, Bettlach, Switzerland February 11 14, 2013, Riga, Latvia Repetition: BGMN BGMN: - Fundamental Parameters Approach - Free for academic use - Device
More informationLesson 6 Profex Graphical User Interface for BGMN and Fullprof
Lesson 6 Profex Graphical User Interface for BGMN and Fullprof Nicola Döbelin RMS Foundation, Bettlach, Switzerland June 07 09, 2017, Oslo, N Background Information Developer: License: Founded in: 2003
More informationRietveld refinements collection strategies!
Rietveld refinements collection strategies! Luca Lutterotti! Department of Materials Engineering and Industrial Technologies! University of Trento - Italy! Quality of the experiment! A good refinement,
More informationLesson 4 Crystal Structure Files
Lesson 4 Crystal Structure Files Nicola Döbelin RMS Foundation, Bettlach, Switzerland March 3, 2015, Lyon, France Repetition: BGMN Project Structure device.geq Interpolated peak profile sample.lst sample.xy
More informationRietveld-Method part I
Rietveld-Method part I Dr. Peter G. Weidler Institute of Functional Interfaces IFG 1 KIT 10/31/17 The Research University in the Helmholtz Association Name of Institute, Faculty, Department www.kit.edu
More information1
In the following tutorial we will determine by fitting the standard instrumental broadening supposing that the LaB 6 NIST powder sample broadening is negligible. This can be achieved in the MAUD program
More informationCrystal Quality Analysis Group
Crystal Quality Analysis Group Contents Contents 1. Overview...1 2. Measurement principles...3 2.1 Considerations related to orientation and diffraction conditions... 3 2.2 Rocking curve measurement...
More informationFormula for the asymmetric diffraction peak profiles based on double Soller slit geometry
REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 69, NUMBER 6 JUNE 1998 Formula for the asymmetric diffraction peak profiles based on double Soller slit geometry Takashi Ida Department of Material Science, Faculty
More informationLECTURE 15. Dr. Teresa D. Golden University of North Texas Department of Chemistry
LECTURE 15 Dr. Teresa D. Golden University of North Texas Department of Chemistry Typical steps for acquisition, treatment, and storage of diffraction data includes: 1. Sample preparation (covered earlier)
More informationCharacterizing x-ray mirrors in reciprocal space
Characterizing x-ray mirrors in reciprocal space Preliminary results from the NIST X-ray Optics Evaluation Double-Crystal Diffractometer D.L. Gil, D. Windover, J.P. Cline, A. Henins National Institute
More informationOptics Vac Work MT 2008
Optics Vac Work MT 2008 1. Explain what is meant by the Fraunhofer condition for diffraction. [4] An aperture lies in the plane z = 0 and has amplitude transmission function T(y) independent of x. It is
More informationAPPLICATION OF Ni/C-GÖBEL MIRRORS AS PARALLEL BEAM X-RAY OPTICS FOR Cu Ka AND Mo Ka RADIATION
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 212 APPLICATION OF Ni/C-GÖBEL MIRRORS AS PARALLEL BEAM X-RAY OPTICS FOR AND RADIATION T. Holz, R. Dietsch,
More informationStructural Refinement based on the Rietveld Method. An introduction to the basics by Cora Lind
Structural Refinement based on the Rietveld Method An introduction to the basics by Cora Lind Outline What, when and why? - Possibilities and limitations Examples Data collection Parameters and what to
More informationX-ray Powder Diffraction
X-ray Powder Diffraction Chemistry 754 Solid State Chemistry Lecture #8 April 15, 2004 Single Crystal Diffraction Diffracted Beam Incident Beam Powder Diffraction Diffracted Beam Incident Beam In powder
More informationratio of the volume under the 2D MTF of a lens to the volume under the 2D MTF of a diffraction limited
SUPPLEMENTARY FIGURES.9 Strehl ratio (a.u.).5 Singlet Doublet 2 Incident angle (degree) 3 Supplementary Figure. Strehl ratio of the singlet and doublet metasurface lenses. Strehl ratio is the ratio of
More informationStructural Refinement based on the Rietveld Method
Structural Refinement based on the Rietveld Method An introduction to the basics by Cora Lind Outline What, when and why? - Possibilities and limitations Examples Data collection Parameters and what to
More informationGrazing Angle 2 Theta Phase Analysis
Page 1 of 7 Grazing Angle 2 Theta Phase Analysis 1. Log into the User Log System on the SMIF web site Hardware Setup X-Ray Tube The line focus configuration of the x-ray tube is used. This is the default
More informationChapter 36. Diffraction. Copyright 2014 John Wiley & Sons, Inc. All rights reserved.
Chapter 36 Diffraction Copyright 36-1 Single-Slit Diffraction Learning Objectives 36.01 Describe the diffraction of light waves by a narrow opening and an edge, and also describe the resulting interference
More informationMonte Carlo simulation for adaptive optics
Monte Carlo simulation for adaptive optics R. Valicu 1, P. Böni 1,3, J. Stahn 2, U. Filges 2, T. Panzner 2, Y. Bodenthin 2, M. Schneider 2,3, C.Schanzer 3 1 Physik-Department E21, James-Franck-Strasse,
More informationACCURATE TEXTURE MEASUREMENTS ON THIN FILMS USING A POWDER X-RAY DIFFRACTOMETER
ACCURATE TEXTURE MEASUREMENTS ON THIN FILMS USING A POWDER X-RAY DIFFRACTOMETER MARK D. VAUDIN NIST, Gaithersburg, MD, USA. Abstract A fast and accurate method that uses a conventional powder x-ray diffractometer
More informationIntroduction to diffraction and the Rietveld method
Introduction to diffraction and the Rietveld method Luca Lutterotti Department of Materials Engineering and Industrial Technologies, University of Trento - Italy Luca.Lutterotti@unitn.it Goal of the Rietveld
More informationTowards 0.1 mm spatial resolution
Submitted for publication in ICNS Proceedings Towards 0.1 mm spatial resolution A. D. Stoica and X. L. Wang Spallation Neutron Source 701 Scarboro Road Oak Ridge National Laboratory Oak Ridge, TN 37831,
More informationMaintenance Package Measurement
Maintenance Package Measurement Contents Contents 1. Package measurement flow...1 2. Measurement procedures...3 2.1 Startup... 3 2.2 Hardware setup... 4 2.3 Setting Package measurement conditions... 7
More informationLecture 4 Recap of PHYS110-1 lecture Physical Optics - 4 lectures EM spectrum and colour Light sources Interference and diffraction Polarization
Lecture 4 Recap of PHYS110-1 lecture Physical Optics - 4 lectures EM spectrum and colour Light sources Interference and diffraction Polarization Lens Aberrations - 3 lectures Spherical aberrations Coma,
More informationInstytut Fizyki Doświadczalnej Wydział Matematyki, Fizyki i Informatyki UNIWERSYTET GDAŃSKI
Instytut Fizyki Doświadczalnej Wydział Matematyki, Fizyki i Informatyki UNIWERSYTET GDAŃSKI I. Background theory. 1. Characteristics of the apparatus: prismatic, grating, interferometers. 2. Operating
More informationLIGHT SCATTERING THEORY
LIGHT SCATTERING THEORY Laser Diffraction (Static Light Scattering) When a Light beam Strikes a Particle Some of the light is: Diffracted Reflected Refracted Absorbed and Reradiated Reflected Refracted
More informationFinal Exam and End Material Test Friday, May 12, 10:00-12:00
Final Exam and End Material Test Friday, May 12, 10:00-12:00 Test rooms: Instructor Sections Room Dr. Hale F, H 104 Physics Dr. Kurter B, N 125 BCH Dr. Madison K, M B-10 Bertelsmeyer Dr. Parris J St. Pats
More informationPH 222-3A Fall Diffraction Lectures Chapter 36 (Halliday/Resnick/Walker, Fundamentals of Physics 8 th edition)
PH 222-3A Fall 2012 Diffraction Lectures 28-29 Chapter 36 (Halliday/Resnick/Walker, Fundamentals of Physics 8 th edition) 1 Chapter 36 Diffraction In Chapter 35, we saw how light beams passing through
More informationExperimental Observation of Invariance of Spectral Degree of Coherence. with Change in Bandwidth of Light
Experimental Observation of Invariance of Spectral Degree of Coherence with Change in Bandwidth of Light Bhaskar Kanseri* and Hem Chandra Kandpal Optical Radiation Standards, National Physical Laboratory,
More informationScattering/Wave Terminology A few terms show up throughout the discussion of electron microscopy:
1. Scattering and Diffraction Scattering/Wave Terology A few terms show up throughout the discussion of electron microscopy: First, what do we mean by the terms elastic and inelastic? These are both related
More informationChemistry Instrumental Analysis Lecture 6. Chem 4631
Chemistry 4631 Instrumental Analysis Lecture 6 UV to IR Components of Optical Basic components of spectroscopic instruments: stable source of radiant energy transparent container to hold sample device
More informationDigital Scatter Removal in Mammography to enable Patient Dose Reduction
Digital Scatter Removal in Mammography to enable Patient Dose Reduction Mary Cocker Radiation Physics and Protection Oxford University Hospitals NHS Trust Chris Tromans, Mike Brady University of Oxford
More informationCondenser Optics for Dark Field X-Ray Microscopy
Condenser Optics for Dark Field X-Ray Microscopy S. J. Pfauntsch, A. G. Michette, C. J. Buckley Centre for X-Ray Science, Department of Physics, King s College London, Strand, London WC2R 2LS, UK Abstract.
More informationPowder Diffraction Data for Pure KHP
Powder Diffraction Data for Pure KHP This is the simple example template containing only headers for each report item and the bookmarks. The invisible bookmarks are indicated by text between brackets.
More informationChapter 36 Diffraction
Chapter 36 Diffraction In Chapter 35, we saw how light beams passing through different slits can interfere with each other and how a beam after passing through a single slit flares diffracts in Young's
More informationSpectrographs. C. A. Griffith, Class Notes, PTYS 521, 2016 Not for distribution.
Spectrographs C A Griffith, Class Notes, PTYS 521, 2016 Not for distribution 1 Spectrographs and their characteristics A spectrograph is an instrument that disperses light into a frequency spectrum, which
More informationRIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 166 RIETVELD REFINEMENT OF POWDER DATA FROM MULTILAYER OPTICS ABSTRACT Scott T. Misture NYS College
More informationLenses lens equation (for a thin lens) = (η η ) f r 1 r 2
Lenses lens equation (for a thin lens) 1 1 1 ---- = (η η ) ------ - ------ f r 1 r 2 Where object o f = focal length η = refractive index of lens material η = refractive index of adjacent material r 1
More informationChapter 4 - Diffraction
Diffraction is the phenomenon that occurs when a wave interacts with an obstacle. David J. Starling Penn State Hazleton PHYS 214 When a wave interacts with an obstacle, the waves spread out and interfere.
More informationWave Phenomena Physics 15c. Lecture 19 Diffraction
Wave Phenomena Physics 15c Lecture 19 Diffraction What We Did Last Time Studied interference > waves overlap Amplitudes add up Intensity = (amplitude) does not add up Thin-film interference Reflectivity
More informationLecture 39. Chapter 37 Diffraction
Lecture 39 Chapter 37 Diffraction Interference Review Combining waves from small number of coherent sources double-slit experiment with slit width much smaller than wavelength of the light Diffraction
More informationDr. Larry J. Paxton Johns Hopkins University Applied Physics Laboratory Laurel, MD (301) (301) fax
Dr. Larry J. Paxton Johns Hopkins University Applied Physics Laboratory Laurel, MD 20723 (301) 953-6871 (301) 953-6670 fax Understand the instrument. Be able to convert measured counts/pixel on-orbit into
More informationReproducing the hierarchy of disorder for Morpho-inspired, broad-angle color reflection
Supplementary Information for Reproducing the hierarchy of disorder for Morpho-inspired, broad-angle color reflection Bokwang Song 1, Villads Egede Johansen 2,3, Ole Sigmund 3 and Jung H. Shin 4,1,* 1
More informationANOMALOUS SCATTERING FROM SINGLE CRYSTAL SUBSTRATE
177 ANOMALOUS SCATTERING FROM SINGLE CRYSTAL SUBSTRATE L. K. Bekessy, N. A. Raftery, and S. Russell Faculty of Science, Queensland University of Technology, GPO Box 2434, Brisbane, Queensland, Australia
More informationGRAZING INCIDENCE IN-PLANE X-RAY DIFFRACTION IN THE LABORATORY
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 309 GRAZING INCIDENCE IN-PLANE X-RAY DIFFRACTION IN THE LABORATORY B. K. Tanner, T. P. A. Hase,
More informationISO INTERNATIONAL STANDARD. Particle size analysis Laser diffraction methods Part 1: General principles
INTERNATIONAL STANDARD ISO 13320-1 First edition 1999-11-01 Particle size analysis Laser diffraction methods Part 1: General principles Analyse granulométrique Méthodes par diffraction laser Partie 1:
More informationX-Ray fluorescence and Raman spectroscopy
X-Ray fluorescence and Raman spectroscopy Advanced physics laboratory (nd part) 4CFU Catalini Letizia, De Angelis Giulia Vittoria, Piselli Verdiana Abstract In this paper we report about two different
More informationRay Optics I. Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex
Phys 531 Lecture 8 20 September 2005 Ray Optics I Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex Today shift gears, start applying
More informationAstronomical spectrographs. ASTR320 Wednesday February 20, 2019
Astronomical spectrographs ASTR320 Wednesday February 20, 2019 Spectrographs A spectrograph is an instrument used to form a spectrum of an object Much higher spectral resolutions than possible with multiband
More informationRectangular Lenslet Array
Rectangular Lenslet Array INTRODUCTION Lenslet arrays are used in a variety of applications that include beam homogenization. This knowledge base article demonstrates the setup of an imaging lenslet array
More informationCHARACTERIZATION OF CONCAVE-CURVED SPECTROMETERS FOR 2D X-RAY OPTICS
Vol. 86 (1994) ACTA PHYSICA POLONICA A No. 4 Proceedings of the ISSSRNS '94, Jaszowiec 1994 CHARACTERIZATION OF CONCAVE-CURVED SPECTROMETERS FOR 2D X-RAY OPTICS F.N. CHUKHOVSKH W.Z. CHANGE AND E. FŐRSΤER
More informationDETERMINATION OF THE ORIENTATION OF AN EPITAXIAL THIN FILM BY A NEW COMPUTER PROGRAM CrystalGuide
The Rigaku Journal Vol. 16/ number 1/ 1999 Technical Note DETERMINATION OF THE ORIENTATION OF AN EPITAXIAL THIN FILM BY A NEW COMPUTER PROGRAM CrystalGuide R. YOKOYAMA AND J. HARADA X-Ray Research Laboratory,
More informationSingle slit diffraction
Single slit diffraction Book page 364-367 Review double slit Core Assume paths of the two rays are parallel This is a good assumption if D >>> d PD = R 2 R 1 = dsin θ since sin θ = PD d Constructive interference
More informationChapter 9. Coherence
Chapter 9. Coherence Last Lecture Michelson Interferometer Variations of the Michelson Interferometer Fabry-Perot interferometer This Lecture Fourier analysis Temporal coherence and line width Partial
More informationMonoVista CRS+ Raman Microscopes
MonoVista CRS+ Benefits Deep UV to NIR wavelength range Up to 4 integrated multi-line lasers plus port for large external lasers Dual beam path for UV and VIS/NIR Motorized Laser selection Auto Alignment
More informationPhysics 228 Today: Diffraction, diffraction grating
Physics 228 Today: Diffraction, diffraction grating Website: Sakai 01:750:228 or www.physics.rutgers.edu/ugrad/228 Diffraction is a further expansion of the idea of interference. We expand from two sources
More informationSupporting information
Velocity (μm/s) Z (μm) Supporting information Precise gold nanoparticles sorting in flowing system Wei Wu, Xiaoqiang Zhu, Yunfeng Zuo, Li Liang, Shunping Zhang, Xuming Zhang, Yi Yang *. School of Physics
More informationProton dose calculation algorithms and configuration data
Proton dose calculation algorithms and configuration data Barbara Schaffner PTCOG 46 Educational workshop in Wanjie, 20. May 2007 VARIAN Medical Systems Agenda Broad beam algorithms Concept of pencil beam
More informationTo see how a sharp edge or an aperture affect light. To analyze single-slit diffraction and calculate the intensity of the light
Diffraction Goals for lecture To see how a sharp edge or an aperture affect light To analyze single-slit diffraction and calculate the intensity of the light To investigate the effect on light of many
More informationIMAGING SPECTROMETER DATA CORRECTION
S E S 2 0 0 5 Scientific Conference SPACE, ECOLOGY, SAFETY with International Participation 10 13 June 2005, Varna, Bulgaria IMAGING SPECTROMETER DATA CORRECTION Valentin Atanassov, Georgi Jelev, Lubomira
More informationMode-Field Diameter and Spot Size Measurements of Lensed and Tapered Specialty Fibers
Mode-Field Diameter and Spot Size Measurements of Lensed and Tapered Specialty Fibers By Jeffrey L. Guttman, Ph.D., Director of Engineering, Ophir-Spiricon Abstract: The Mode-Field Diameter (MFD) and spot
More informationMu lt i s p e c t r a l
Viewing Angle Analyser Revolutionary system for full spectral and polarization measurement in the entire viewing angle EZContrastMS80 & EZContrastMS88 ADVANCED LIGHT ANALYSIS by Field iris Fourier plane
More informationMichelson Interferometer
Michelson Interferometer The Michelson interferometer uses the interference of two reflected waves The third, beamsplitting, mirror is partially reflecting ( half silvered, except it s a thin Aluminum
More informationA CONVERGENT BEAM, PARALLEL DETECTION X-RAY DIFFRACTION SYSTEM FOR CHARACTERIZING COMBINATORIAL EPITAXIAL THIN FILMS
The Rigaku Journal Vol. 18/ No. 1/ 2001 CONTRIBUTED PAPERS A CONVERGENT BEAM, PARALLEL DETECTION X-RAY DIFFRACTION SYSTEM FOR CHARACTERIZING COMBINATORIAL EPITAXIAL THIN FILMS K. OMOTE, T. KIKUCHI, J.
More informationLED Evenement 2014 Spectroscopy - Straylight. Avantes BV Apeldoorn, The Netherlands
LED Evenement 2014 Spectroscopy - Straylight Avantes BV Apeldoorn, The Netherlands Content: - Company - Spectroscopy - Spectrometer measuring light - Straylight - How to prevent - Why - conclusion Introduction
More informationGeometric Field Tracing through an Off- Axis Parabolic Mirror
UseCase.0077 (1.0) Geometric Field Tracing through an Off- Axis Parabolic Mirror Keywords: focus, geometric field tracing, diffractive field tracing Description This use case explains the usage of the
More informationLecture 6: Waves Review and Examples PLEASE REVIEW ON YOUR OWN. Lecture 6, p. 1
Lecture 6: Waves Review and Examples PLEASE REVEW ON YOUR OWN Lecture 6, p. 1 Single-Slit Diffraction (from L4) Slit of width a. Where are the minima? Use Huygens principle: treat each point across the
More informationStandard Operating Procedure for the Horiba FluroMax-4
Standard Operating Procedure for the Horiba FluroMax-4 Adapted from Horiba Operations Manual Created by Michael Delcau, Modified by Brian Lamp The Fluoromax is capable of making a variety of measurements.
More informationIntermediate Physics PHYS102
Intermediate Physics PHYS102 Dr Richard H. Cyburt Assistant Professor of Physics My office: 402c in the Science Building My phone: (304) 384-6006 My email: rcyburt@concord.edu My webpage: www.concord.edu/rcyburt
More informationThroughput of an Optical Instrument II: Physical measurements, Source, Optics. Q4- Number of 500 nm photons per second generated at source
Throughput of an Optical Instrument II: Physical measurements, Source, Optics Question- Value Q1- Percent output between 450-550 nm by mass Answer (w/ units) Q2- Energy in J of a 500 nm photon Q3- Flux
More informationGrating Spectrometer GRATING.TEX KB
UNIVERSITÄTK OSNABRÜCK 1 Grating Spectrometer GRATING.TEX KB 20020119 KLAUS BETZLER 1,FACHBEREICH PHYSIK, UNIVERSITÄT OSNABRÜCK This short lecture note recalls some of the well-known properties of spectrometers.
More informationcif_pd.dic 1 PD_BLOCK
cif_pd.dic 1 PD_BLOCK Dictionary name: cif_pd.dic Dictionary version: 1.0 Dictionary last updated: 1997-10-29 _pd_block_[pd] _pd_block_id is used to assign a unique id code to a data block. This code is
More informationDiffraction and Interference of Plane Light Waves
1 Diffraction and Interference of Plane Light Waves Introduction In this experiment you will become familiar with diffraction patterns created when a beam of light scatters from objects placed in its path.
More informationSingle Slit Diffraction
Name: Date: PC1142 Physics II Single Slit Diffraction 5 Laboratory Worksheet Part A: Qualitative Observation of Single Slit Diffraction Pattern L = a 2y 0.20 mm 0.02 mm Data Table 1 Question A-1: Describe
More informationSpectroscopic Ellipsometer --- J. A. Woollam alpha-se
Spectroscopic Ellipsometer --- J. A. Woollam alpha-se Introduction Figure 1: J. A. Woollam alpha-se spectroscopic ellipsometer An ellipsometer measures the change in polarization as light reflects or transmits
More informationCollege Physics 150. Chapter 25 Interference and Diffraction
College Physics 50 Chapter 5 Interference and Diffraction Constructive and Destructive Interference The Michelson Interferometer Thin Films Young s Double Slit Experiment Gratings Diffraction Resolution
More informationProfex User Manual. May 1, 2016
Profex User Manual Version 3.9.0 Nicola Döbelin May 1, 2016 Contents 1. Introduction 5 2. Installation 6 2.1. Windows............................................ 6 2.1.1. Profex-BGMN bundle................................
More informationModels of Light The wave model: The ray model: The photon model:
Models of Light The wave model: under many circumstances, light exhibits the same behavior as sound or water waves. The study of light as a wave is called wave optics. The ray model: The properties of
More informationLecture 6: Waves Review and Examples PLEASE REVIEW ON YOUR OWN. Lecture 6, p. 1
Lecture 6: Waves Review and Examples PLEASE REVEW ON YOUR OWN Lecture 6, p. 1 Single-Slit Slit Diffraction (from L4) Slit of width a. Where are the minima? Use Huygens principle: treat each point across
More informationBasics of X-Area for image plates
Basics of X-Area for image plates Commercial software to process single-crystal and powder x-ray data from STOE image plates and PILATUS detectors Andrzej Grzechnik 1 & Karen Friese 2 1 Institute of Crystallography,
More informationEM Waves Practice Problems
PSI AP Physics 2 Name 1. Sir Isaac Newton was one of the first physicists to study light. What properties of light did he explain by using the particle model? 2. Who was the first person who was credited
More informationApex High Performance Spectrometer
Apex High Performance Spectrometer 1 Elite High Performance Spectrometers Challenge Integrated, high end instruments are required to detect low light levels for challenging Fluorescence and Raman applications
More informationChapter 35 &36 Physical Optics
Chapter 35 &36 Physical Optics Physical Optics Phase Difference & Coherence Thin Film Interference 2-Slit Interference Single Slit Interference Diffraction Patterns Diffraction Grating Diffraction & Resolution
More informationModeling the ORTEC EX-100 Detector using MCNP
Modeling the ORTEC EX-100 Detector using MCNP MCNP is a general-purpose Monte Carlo radiation transport code for modeling the interaction of radiation with materials based on composition and density. MCNP
More information25-1 Interference from Two Sources
25-1 Interference from Two Sources In this chapter, our focus will be on the wave behavior of light, and on how two or more light waves interfere. However, the same concepts apply to sound waves, and other
More informationLight Tec Scattering measurements guideline
Light Tec Scattering measurements guideline 1 Our Laboratory Light Tec is equipped with a Photometric Laboratory (a dark room) including: Goniophotometers: REFLET 180S. High specular bench (10 meters),
More informationEffective Medium Theory, Rough Surfaces, and Moth s Eyes
Effective Medium Theory, Rough Surfaces, and Moth s Eyes R. Steven Turley, David Allred, Anthony Willey, Joseph Muhlestein, and Zephne Larsen Brigham Young University, Provo, Utah Abstract Optics in the
More informationPhysics 309 Lab 3. where the small angle approximation has been used. This pattern has maxima at. Y Max. n L /d (2)
Physics 309 Lab 3 Introduction This will be a lab whose purpose is to give you some hands-on experience with optical interference and diffraction, using small green diode lasers as the light sources. Each
More information5. Double Slit Diffraction
Double Date slit : diffraction 5. Double Slit Diffraction Background Aim of the experiment Huygens s principle Interference Fraunhofer and Fresnel diffraction Coherence Laser 1. To plot the intensity distribution
More informationPresented By:- Abhishek Chandra, Abhishek Singh, Akash Gupta, Abhishek Pandey, Amit Tiwari B.Sc.:-IIIrd Year
Diffraction Grating Presented By:- Abhishek Chandra, Abhishek Singh, Akash Gupta, Abhishek Pandey, Amit Tiwari B.Sc.:-IIIrd Year DIFFRACTION The Phenomenon of bending of light round the corners of an obstacle
More informationLecture 16 Diffraction Ch. 36
Lecture 16 Diffraction Ch. 36 Topics Newtons Rings Diffraction and the wave theory Single slit diffraction Intensity of single slit diffraction Double slit diffraction Diffraction grating Dispersion and
More information1.1 The HeNe and Fourier Lab CCD Camera
Chapter 1 CCD Camera Operation 1.1 The HeNe and Fourier Lab CCD Camera For several experiments in this course you will use the CCD cameras to capture images or movies. Make sure to copy all files to your
More informationPhase. E = A sin(2p f t+f) (wave in time) or E = A sin(2p x/l +f) (wave in space)
Interference When two (or more) waves arrive at a point (in space or time), they interfere, and their amplitudes may add or subtract, depending on their frequency and phase. 1 Phase E = A sin(2p f t+f)
More informationThe Italian LBT spectroscopic data reduction pipeline
LBTO 2017 Users' Meeting The Italian LBT spectroscopic data reduction pipeline Alida Marchetti INAF-IASF Milano Firenze, June 20th-23rd reduction pipeline SOME NUMBERS INAF nights 46 Effective observing
More informationA raytracing code for zone plates
A raytracing code for zone plates Alexei Erko *, Franz Schaefers, Nikolay Artemiev a BESSY GmbH, Albert-Einstein-Str.15, 12489 Berlin, Germany a Laboratoire d'optique Appliquee ENSTA Ecole Polytechnique
More informationApplication of MCNP Code in Shielding Design for Radioactive Sources
Application of MCNP Code in Shielding Design for Radioactive Sources Ibrahim A. Alrammah Abstract This paper presents three tasks: Task 1 explores: the detected number of as a function of polythene moderator
More informationUsing the Sample Changer
Using the Sample Changer with the High-Speed Bragg-Brentano Optics on the PANalytical X Pert Pro MPD Scott A Speakman, Ph.D Center for Materials Science and Engineering at MIT Speakman@mit.edu 617-253-6887
More informationChapter 24. Wave Optics
Chapter 24 Wave Optics Diffraction Huygen s principle requires that the waves spread out after they pass through slits This spreading out of light from its initial line of travel is called diffraction
More information