Contracer High precision + high functionality + high operability = Contracer

Transcription

1 Contracer igh precision + high functionality + high operability = Contracer Contracer CV-2100 SERIES 218 Contour Measuring Instruments Centralized front control panel Motor-driven jog shuttle Quick-vertical-motion stand CV-2100N4 SPECIFICATIONS CV-2100M4 Desktop PC Notebook PC Form Analysis program FORMTRACEPAK CV-2100M4 Optional accessories dedicated to the CV-2100N4 Column stand Allows the use of the CV-2100N4 in a fixed configuration. Order No Inclination range: ±45 Up/down movement: 3mm Mass: 110kg Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon. Model No. CV-2100M4 CV-2100N4 Measurement X-axis 100mm range Z1-axis (detector unit) 50mm Z2-axis (column) travel range 350mm X-axis inclination angle ±45 Resolution X-axis 0.1μm Z1-axis 0.1μm Drive method X-axis Motorized drive (0 - mm/s) Z1-axis (column) Manual (quick-up-and-down motion, fine feed) Measuring speed 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0mm/s inearity accuracy (X-axis horizontal orientation) 2.5μm/100mm Accuracy X-axis ±( ) μm = Measurement ength (mm) ( C) Z1-axis ±( ) μm = Measurementt height from horizontal position within ±25mm Measurement direction Forward / backward Measurement surface direction Downward 30±10mN (3gf) Stylus traceable angle (Standard accessory stylus) Ascent 77, Descent 87 (Depends on the surface condition) External dimensions (W D ) mm mm Mass kg 5.8 kg Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon. An inspection certificate is supplied as standard. Refer to page X for details. Contour Measuring System enabling measurement that is fast, accurate, and easy. The operation flow is significantly shortened by arranging the controls for stylus position change, measurement start/stop and return on the front of the drive unit. Fine and coarse X-axis positioning can be performed easily by using the jog shuttle that covers the whole measuring range. The quick-vertical-motion stand allows operators to swiftly and easily move the drive unit to and from the measurement height without having to push or pull (only for CV- 2100M4). The detector unit (Z1 axis) is equipped with a highly accurate arc scale. This scale directly tracks the arc locus of the stylus tip so that the most accurate compensation can be applied to the scale output, which leads to higher accuracy and resolution. Operators are free from bothersome operations such as measurement magnification switching and calibrating each magnification as required for analog instruments. A notebook or desktop PC can be used as the data processing unit for the CV-2100M4/N4. Refer to the Contracer CV-2100 (Catalog No.E150) for more details. ighly accurate arc scale -19

2 Optional Accessories for Contracer For CV-2100 series ist of Applicable Arms Arm name Arm No. Order No. Applicable stylus No. (mm) AB SP-51, 52, 53, 54, 55, 56, 57 6 AB SP-61, 62, 63, 64, 65, 66, Straight arm AB-71* SP-71, 72, 73, 74, 75, 76, 77, 79 AB SP-81, 82, 83, 84, 85, 86, AB SP-91, 92, 93, 94, 95, 96, AB SP-51, 52, 53, 54, 55, 56, 57 6 AB SP-61, 62, 63, 64, 65, 66, Eccentric arm AB SP-71, 72, 73, 74, 75, 76, 77, 79 AB SP-81, 82, 83, 84, 85, 86, AB SP-91, 92, 93, 94, 95, 96, SP-11, Small hole arm AB SP-12, 32 1 SP-13, * Standard Accessories Arms Straight arm Small hole arm ø ø Eccentric arm 40 ø ist of Applicable Styli Stylus Stylus No. Order No. Compatible Arm No. (mm) SP AB SP AB One-sided cut stylus SP-71* AB SP AB SP AB SP AB SP AB Intersecting cut stylus SP AB SP AB SP AB SP-57 12AAE865 AB SP-67 12AAE866 AB Cone stylus tip angle (carbide-tipped) SP-77 12AAE867 AB SP-87 12AAE868 AB SP-97 12AAE869 AB Cone stylus tip angle 30 (Sapphire) Cone stylus tip angle 50 (Diamond) Cone stylus tip angle 30 (carbide-tipped) Knife-edge stylus Ball stylus Small hole stylus (One-sided cut) Small hole stylus (Cone) *Standard Accessories SP AB SP AB SP AB SP AB SP AB SP AB SP-56 12AAA566 AB SP-66 12AAA567 AB SP-76 12AAA568 AB SP-86 12AAA569 AB SP-96 12AAA570 AB SP AB SP AB SP AB SP AB SP AB SP AB SP AB SP AB SP AB SP AB SP AB SP AB-11 1 SP AB SP-31 12AAE873 AB SP-32 12AAE874 AB-11 1 SP-33 12AAE875 AB Styli One-sided cut stylus Cone stylus Knife-edge stylus Tip angle: 12 Tip angle: Tip angle: Edge width: 3 mm Small hole stylus SP-11/31 Tip shape: one-sided (Tip angle: ) Tip shape: Cone (Tip angle: 30 ) Small hole stylus SP-13/33 ø ø ø6 50 ø8 Tip shape: one-sided (Tip angle: ) Tip shape: Cone (Tip angle: 30 ) Intersecting cut stylus Cone stylus Ball stylus Tip angle: Tip angle: 30 (50 for SP-79) Material: Sapphire, carbide (Diamond for SP-79) Tip ball diameter: 1 mm Small hole stylus SP-12/32 50 ø6 Tip shape: one-sided (Tip angle: ) Tip shape: Cone (Tip angle: 30 ) -

3 Contracer igh precision + high functionality + high operability = Contracer Contracer CV-30 SERIES 218 Contour Measuring Instruments Dramatically Improved igh-precision Contour Measuring Instruments. CV-30 series are contour measuring instruments equipped with a high-precision arc scale and newly designed arm on the Z1 axis (detector). The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation. CV-30 (conventional model) An inspection certificate is supplied as standard. Refer to page X for details. CV-30 CV-304 (with options) 50 mm 60 mm 10 mm 19 mm Z1-axis measuring range has been extended by 10mm. The 700mm Z2-axis (column) range models are new to the lineup. CV-30S4 SPECIFICATIONS Model No. CV-30S4 CV-304 CV-30W4 CV-304 CV-30S8 CV-308 CV-30W8 CV-308 Measuring 100mm 0mm range Z1 axis (detector) 60mm (±30mm from the horizontal) Z2-axis (column) moving range 300mm 500mm 700mm 300mm 500mm 700mm Arc Resolution 0.04µm Stylus up/down Arc motion Z1 axis Measuring direction Forward / backward (Detector) Face of stylus Vertical direction (up/down, single measurement) 30mN (adjustment using weights) Traceable angle Ascent: 77, descent: 83 (using the standard one-sided cut stylus* 1 provided anddepending on the surface roughness) Separate type linear scale Z2 axis (column) ABS scale Resolution 0.05 µm Z2 axis (column) 1 µm Drive unit 0 to 80mm/s or manual operation Drive speed Z2 axis (column) 0 to 30mm/s or manual operation Measuring speed 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, mm/s Straightness* 2 0.8µm/100mm 2µm/0mm Inclination range ±45 ±( )µm = traverse length (mm) ±( )µm = traverse length (mm) Accuracy ( C) Wide range: 1.8µm/100mm Narrow range: 1.05µm/25mm Wide range: 4.8µm/0mm Narrow range: 1.3µm/25mm Z1 axis (detector) ±( /100)μm = probing height from the horizontal (mm) External dimensions (W D ) Main unit* x mm 1166mm 1176mm 1436mm 966mm 1166mm 1176mm 1436mm Mass Main unit 140kg 150kg 2kg 270kg 140kg 150kg 2kg 270kg *1: SP-71 (No ) *2: In X-axis horizontal position *3: Base material of the main unit is Gabbro. Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon. -21

4 An inspection certificate is supplied as standard. Refer to page X for details. Dramatically Improved igh-precision Contour Measuring Instruments. CV-4500 series are contour measuring instruments equipped with a high-precision arc scale and newly designed arm on the Z1 axis (detector). The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation. CV-4500 (conventional model) CV mm 60 mm 10 mm 19 mm Z1-axis measuring range has been extended by 10mm. The following two features have been added exclusively for the CV-4500 series. (1) Continuous measurement in the vertical direction (up/down) is available in combination with a double-sided conical stylus. Up/down continuous measurement data facilitates the analysis of the effective diameter of screw threads, which has been difficult to measure in the past. (2) The measuring force can be set in the FORMTRACEPAK software. Weight replacement and position adjustment are not required to adjust the measuring force. Downward (Bottom plane) measurement Measuring direction Upward/downward measurement direction is switchable on the software Upward (Top plane) measurement The 700mm Z2-axis (column) range models are new to the lineup. Contracer CV-4500 SERIES 218 Contour Measuring Instruments SPECIFICATIONS CV-4500S4 Model No. CV-4500S4 CV CV-4500W4 CV CV-4500S8 CV CV-4500W8 CV Measuring 100mm 0mm range Z1 axis (detector) 60mm (±30mm from the horizontal) Z2-axis (column) moving range 300mm 500mm 700mm 300mm 500mm 700mm Arc Resolution 0.02µm Stylus up/down Arc motion Z1 axis Measuring direction Forward / backward (Detector) Face of stylus Vertical direction (up/down, available for continuous measurement) 10,, 30, 40, 50mN (switching on the software) Traceable angle Ascent: 77, descent: 83 (using the standard one-sided cut stylus* 1 provided anddepending on the surface roughness) Separate type linear scale Z2 axis (column) ABS scale 0.05 µm Resolution Z2 axis (column) 1 µm Drive unit 0 to 80mm/s or manual operation Drive speed Z2 axis 0 to 30mm/s or manual operation (column) Measuring speed 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, mm/s Straightness* 2 0.8µm/100mm 2µm/0mm Inclination range ±45 ±( )µm = traverse length (mm) ±( )µm = traverse length (mm) Wide range: 1.8µm/100mm Wide range: 4.8µm/0mm Accuracy ( C) Narrow range: 1.05µm/25mm Narrow range: 1.3µm/25mm Z1 axis (detector) ±( /100)μm = probing height from the horizontal (mm) External dimensions (W D ) Main unit* mm mm 1176mm mm mm mm mm mm Mass Main unit 140kg 150kg 2kg 270kg 140kg 150kg 2kg 270kg *1: SP-71 (No ) *2: In X-axis horizontal position *3: Base material of the main unit is Gabbro. Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon. Refer to the Contracer CV-30/4500 series (Catalog No.E15010) for more details. -22

5 Contracer igh precision + high functionality + high operability = Contracer Optional Accessories for Contracer Arms for CV-30/4500 series, SV-C30/4500 series, and SV-C4500 CNC series Arms Straight arm AB-31 Eccentric arm AB-37 Small hole arm AB ist of Applicable Arms Stylus name Model No. Order No. Applicable styli Straight arm AB-31 12AAM101* 1 SP-5, 6, 7, 8, 9 Eccentric arm AB-37 12AAQ762 SPW* 2-56, 66, 76 SP-5, 6, 7, 8, 9 SPW* 2-56, 66, 76 Small hole arm AB-33 12AAM103 SP-41, 42, 43 Stylus Double-sided conical stylus One-sided cut stylus Tip angle: 30 Tip angle: 12 Intersecting cut stylus Tip angle: Cone stylus Tip angle: 30 (50 for SP-79) Tip material: Sapphire, carbide (Diamond for SP-79) Cone stylus Knife-edge stylus Tip angle: Tip angle: Edge width: 3 mm Ball stylus Tip ball diameter: 1 mm Small hole stylus SP ø ø Small hole stylus SP-42 1 ø5 55 Small hole stylus SP ø Tip shape: one-sided (tip angle: ) Tip shape: one-sided (tip angle: ) Tip shape: one-sided (tip angle: ) ist of Applicable Styli Compatible arm No. Stylus name Model No. Order No. CV-30/4500 (mm) SV-C30/4500 SV-C4500CNC SPW-56 Double-sided conical stylus* 2 SPW-66 12AAM SPW-76 12AAM SP SP One-sided cut stylus SP * 5 SP SP SP SP Intersecting cut stylus SP SP SP SP Cone stylus SP tip angle 30 SP (Sapphire) SP SP SP-56 12AAA566 6 SP-66 12AAA567 AB-31, Cone stylus tip angle 30 (carbide-tipped) Cone stylus tip angle (carbide-tipped) Cone stylus tip angle 50 (Diamond) SP-76 12AAA568* 6 SP-86 12AAA SP-96 12AAA SP-57 12AAE865 6 SP-67 12AAE SP-77 12AAE867 SP-87 12AAE SP-97 12AAE SP SP SP Knife-edge stylus SP SP SP SP SP Ball stylus SP SP SP SP-41 12AAM104 2 Small hole stylus SP-42 12AAM105 AB-33 4 SP-43 12AAM *1: Standard accessory for the CV-30/4500, SV-C30/4500, and SV-C4500CNC series. *2: Dedicated stylus for the CV-4500, SV-C4500, and SV-C4500CNC series. *3: When one-sided cut stylus SP-71 (standard accessory) is used. *4: Standard accessory for the CV-4500, SV-C4500, and SV-C4500CNC series. *5: Standard accessory for the CV-30/4500 and SV-C30/4500 series. *6: Standard accessory for the SV-C4500CNC. -23

6 Optional Accessories for Contracer Arm stylus (Arm/stylus integrated type) for CV-4500 series, SV-C4500 series, and SV-4500CNC series Double-sided small hole Arm stylus SPW-21/31 Double-sided small hole Arm stylus SPW-22/32 Double-sided small hole Arm stylus SPW-33 ø8 ø8 ø8 Enlarged view of the tip ø4.8 ø Tip shape: Cone Tip angle: (SPW-21) 30 (SPW-31) Enlarged view of the tip ø5 275 Tip shape: Cone Tip angle: (SPW-22) 30 (SPW-32) Enlarged view of the tip ø4 275 Tip shape: Cone Tip angle: 30 Arm stylus name Model No. Order No. (mm) SPW-21 12AAT SPW-22 12AAT470 5 Double-sided small hole arm stylus* 1 SPW-31 12AAM SPW-32 12AAM109 5 SPW-33 12AAM110 9 *1: Arm stylus for the CV-4500, SV-C4500, and SV-C4500CNC series. Cross-travel table No Code No Dimensions of the table mm eight of the table 100mm Max. stage loading 30kg Fixture mounting T-groove and dovetail groove Travel range 100mm (right/left) 50mm (forward/backward) Resolution/Graduation 0.01mm thimble (with 1mm scales only in the right/left direction) Swivel range Optional accessories that can be used with the cross-travel table. Workpiece fixture for rotary vise Rotary vise Code No Fixing method Two-slide jaw 360 (0, 30, 60, Angle of rotation 90 equipped with quick stop function) Resolution 1 Jaw opening 60mm Jaw width 80mm Jaw depth 35mm Total height 110mm Code No Rotation method One-slide jaw Angle of rotation mm Jaw opening (When the auxiliary block is inserted: 25mm) Jaw width 40mm Jaw depth mm Total height 76mm Swivel center support V-block with clamp Code No Inclination range ±10 Resolution 1 Max. length of workpiece 140mm Max. diameter of workpiece 80mm (when the inclination angle is 0 ) 65mm (when the inclination angle is 10 ) Code No V-block length 60mm 41mm Maximum height of workpiece 50mm 25mm Center support Center support riser Code No Max. length of the workpiece 1mm Max. diameter of workpiece 1mm Code No Total height 60mm older with clamp Code No Maximum supportable height 35mm T-groove 152mm Mounting hole pitch 84mm,1mm -24

7 Contracer igh precision + high functionality + high operability = Contracer Optional Accessories for Contracer For information on the three-axis adjustment table (No ) For the high-accuracy surface roughness measurement of a cylindrical workpiece, it is necessary to set the workpiece line axis parallel with the measurement axis and to adjust the leveling. Using the three-axis adjustment table facilitates the adjustment of the alignment and leveling necessary just by following the guidance supplied by the machine. No experience or intuition is required. Cross-travel table Equipped with micrometer heads on the X and Y axes. Best suited for the alignment of axes since the inclination adjustment center and the rotation center are the same. Precision vise No Can be mounted on the cross-travel table. Code No. Digimatic: Digimatic: venier: Dimensions of table (W D) mm Maximum table loading 15kg Inclination range ±1.5 ±1.5 Rotation range ±3 ±3 X- and Y-axes range ±12.5mm Resolution/Graduation 0.001mm 0.01mm External dimensions (W D ) mm mm mm Mass 6.3kg 5kg 6kg Fixing method Jaw opening Jaw width Jaw depth Total height Two-slide jaw 36mm 44mm 16mm 38mm eveling table Code No Dimensions of table mm Inclination range ±1.5 Maximum table loading 15kg External dimensions (W D ) mm Mass 3kg V-block with clamp Can be mounted on the cross-travel table. No Workpiece diameter (using both V-grooves) ø1 to 7mm ø6 to 160mm V-block stage 2 (A set of two) Maximum supportable diameter: 25mm Mass: 700g No ubricant Apply in a thin layer regularly to the Z-column sliding surfaces of a motorized model. (Standard accessory for the motorized column type models) Order No Centering chuck (knurled ring operated) Suitable for holding small parts with easy-to-operate knurled-ring clamping. No olding capacity External dimensions (D ) Mass OD with internal jaws ø1-6mm ID with internal jaws ø16-ø69mm OD with external jaws ø25-ø79mm ø118 41mm 1.2kg Micro chuck Used for clamping workpieces smaller than ø1 mm that the centering chuck cannot hold. No olding capacity External dimensions (D ) Mass OD ø0.2-ø1.5mm ø mm 0.6kg -25

8 CV-30/4500 series, For SV-C30/4500 series Using the following optional accessories enables semi-automatic (simplified CNC) measurement. Y-axis table Enables efficient, automatic measurement of multiple aligned workpieces and multiple points on a single table surface. No Travel range 0mm Resolution 0.05 µm Positioning accuracy ±3µm Drive speed 80mm/s (max.) Maximum loading 50kg Mass 28kg *Note: This Y-axis table cannot be used with CNC form measuring instruments. 1-axis table No.12AAD975 Calculates the angle in advance when measuring the cross-sectional data in the orthogonal direction or at the specified angle pitch of a cylindrical or spherical workpiece. 2-axis unit Calculates the angle in advance when loading the sectional data at the specified angle pitch when measuring the multiple cross-sectional data of a rectangle workpiece or the axial direction of a cylindrical workpiece. No.12AAD975 Travel range 360 Resolution Rotational speed 10 /sec (max.) Table diameter ø150mm Maximum loading 12kg No Travel range 360 Resolution Rotational speed 18 /sec (max.) Table diameter ø118mm Maximum loading 4kg (loading moment) (343N cm or less) -26

9 Formtracer ybrid machine with dual-role capability Formtracer SV-C30/4500 SERIES 525 Surface Roughness and Contour Measuring Systems Contour measuring SV-C30S4 Surface roughness testing Formtracer SPECIFICATIONS Model No. SV-C30S4 SV-C304 SV-C30W4 SV-C304 SV-C30S8 SV-C308 SV-C30W8 SV-C308 SV-C4500S4 SV-C45004 SV-C4500W4 SV-C45004 SV-C4500S8 SV-C45008 SV-C4500W8 SV-C45008 Surface roughness measurement Measuring (drive unit) 100mm 0mm range Z1 axis (detector) 800µm/80µm/8µm Straightness (0.05+/1000) μm : traverse length (mm) ( ) μm : traverse length (mm) Resolution Z1 axis (detector) 0.01µm(800µm), 0.001µm(80µm), µm(8µm) 0.75mN (when the Code No. of the main unit ends with "-1") / 4mN (when the Code No. of the main unit ends with "-2") Stylus tip shape 60, 2µmR (when the Code No. of the main unit ends with "-1") / 90, 5µmR (when the Code No. of the main unit ends with "-2") Applicable standards JIS1982/ JIS1994/ JIS01/ ISO1997/ ANSI/ VDA Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P q, Pmr(C), Pmr, P c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R q, Rmr(C), Rmr, Parameter R c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W q, Wmr(C), Wmr, W c, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, SC, o, Ir, a, a, q, Vo, tp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW Primary profile, Roughness profile, Filtered waviness profile, Waviness profile, Rolling circle waviness primary profile, Assessed profile Rolling circle waviness profile, Envelope residual profile, DF profile (DIN4776/ ISO ), Roughness motif (Envelope waviness profile is displayed when evaluating the motif.) Material ratio curve, Profile height amplitude distribution curve, Power spectrum chart, Auto-correlation chart, Walsh power Analysis graph spectrum chart, Walsh auto-correlation chart, Slope distribution chart, ocal peak distribution chart, Parameter distribution chart (Contour analysis function can analyze the area of abrasion amount and overlay.) Data compensation functions east squares straight line, R-surface compensation, Ellipse compensation, Parabola compensation, yperbolic compensation, Conic compensation, Polynomial compensation (auto or arbitrary 2nd to 7th), No compensation Filter Gaussian filter, 2CRPC75, 2CRPC50, 2CR75, 2CR50, Robust spline filter Contour measurement Measuring (drive unit) 100mm 0mm range Z1 axis (detector) 60mm (±30mm from the horizontal) Straightness 0.8µm/100mm 2µm/0mm (drive unit) ±( )µm : traverse length (mm) ±( )µm = traverse length (mm) Accuracy Z1 axis (detector) SV-C30 series: ±( /100)μm, SV-C4500 series: ±( /100)μm : Probing height from the horizontal (mm) (drive unit) 0.05 µm Resolution Z1 axis (detector) SV-C30 series: 0.04µm, SV-C4500 series: 0.02µm Z2 axis (column) 1 µm SV-C30 series: 30mN (adjustment using weights) SV-C4500 series: 10,, 30, 40, 50mN (switching on the software) Face of stylus SV-C30 series: Vertical direction (up/down, single measurement) SV-C4500 series: Vertical direction (up/down, available for continuous measurement) Common specification Z2-axis (column) moving range 300mm 500mm 700mm 300mm 500mm 700mm Inclination range ±45 Drive speed 0 to 80mm/s or manual operation Z2 axis (column) 0 to 30mm/s or manual operation Measuring speed 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, mm/s Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon. SV-C304 (with options) An inspection certificate is supplied as standard. Refer to page X for details. The combination of a surface roughness tester and contour measuring instrument saves installation space. Surface roughness testing function Z1-axis detector provides highest resolution of μm (when the measuring range is 8µm) is provided as standard. igh-accuracy glass scales, built-in on the, directly read the drive unit movement. Greatly facilitates spacing parameter evaluation while achieving high-accuracy positioning. for the detector is selectable from 4mN or 0.75mN. Contour measuring function The Z1 axis (detector) is equipped with a highprecision arc scale and newly designed arm. The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation. CV-3100/4100 (conventional model) The following two features have been added exclusively for the SV-C-4500 series as functions dedicated to contour measuring systems. (1) Continuous measurement in the vertical direction (up/ down) is available in combination with a doubletipped stylus. Up/down continuous measurement data facilitates the analysis of the effective diameter of screw threads, which has been difficult to measure in the past. (2) The measuring force can be set in the FORMTRACEPAK software. Weight replacement and position adjustment are not required to adjust the measuring force. Downward (Bottom plane) measurement Upward/downward measurement direction is switchable in the software CV-30/ mm 60 mm 10 mm 19 mm Z1-axis measuring range has been extended by 10mm. The 700mm Z2-axis (column) range models are new to the lineup. Refer to the Formtracer SV-C30/40 series (Catalog No.E15012) for more details. Upward (Top plane) measurement -27

10 An inspection certificate is supplied as standard. Refer to page X for details. Equipped with a wide range and high resolution Z-axis detector. Measuring range Z1 axis (detector): 5mm (Resolution: μm *Applicable when the measuring range is 0.05mm) : 100mm (Resolution: 0.05μm) Overhang of the detector: Max. 70mm (Fixable at a desired position) Formtracer CS-30S4 SERIES 525 Surface Roughness and Contour Measuring System Uses the well-respected FORMTRACEPAK software to provide a rich variety of analysis functions to achieve excellent surface texture evaluation. CS-30S4 SPECIFICATIONS Model No. CS-30S4 100mm/0.05µm Measuring range/ Resolution Z1 axis (detector) 5mm/0.08µm 0.5mm/0.008µm 0.05mm/0.0008µm Z2 axis (column) 300mm/1μm Accuracy ±( )µm = measuring length(mm) ( C) Z1 axis (detector) ±( /100) μm = probing height from the horizontal (mm) Straightness Under normal use 0.2µm/100mm () When protruding to the maximum extent 0.4µm/100mm Roughness measurement 0.02, 0.05, 0.1, 0.2mm/s (4-step) Measuring speed Drive unit Contour measurement 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0mm/s (7-step) Drive speed (horizontal direction) 0 to 80mm/s or manual operation Z2 axis (vertical direction) 0 to mm/s or manual operation Up/down movement 300mm (motorized) Inclination range ±45 Detection method Differential inductance 0.75mN Standard stylus (for roughness/ Detector contour measurement) Tip angle: 60 cone, Tip radius: 2μm, Diamond tip Stylus Cone stylus (for contour measurement) Tip angle: 30 cone,, Sapphire Stylus up/down Available (Stoppable at a mid-air position) Note1: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon. Note2: igh column and 0mm X-axis drive-unit models are also available. Please consult your local Mitutoyo office for applicable specifications. Refer to the Formtracer CS-30 (Catalog No.E15025) for more details. -28

11 Formtracer ybrid machine with dual-role capability Formtracer Extreme SV-C4500CNC SERIES 525 CNC Surface Roughness and Contour Measuring Systems SPECIFICATIONS SV-C4500CNC (Contour detector shown mounted together with the inclinable drive unit and Y-axis table) Model No. SV-C4500CNC Measuring range 0mm Resolution 0.05 µm Reflective-type linear encoder CNC mode Max. 0mm/s Drive speed Joystick mode 0 to 50mm/s X1 axis Measuring speed 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0mm/s (Drive unit) Measuring direction Forward / backward Contour Straightness 2µm/0mm Accuracy ( C) ±(0.8+4/0)μm : Measuring length (mm) Surface Measuring direction Backward roughness Straightness 0.5 µm/0mm Measuring range 60mm (±30mm from the horizontal) Resolution 0.02 µm Measuring direction Both forward and backward (Direction is changed by FORMTRACEPAK) Vertical movement of the stylus Arc motion Contour Arc Z1 axis Accuracy ( C) ±( /100)μm : Measuring height from horizontal position (mm) (Detector) 10,, 30, 40, 50mN (setting measuring force Formtracepak) Traceable angle Ascent: 70, Descent: 70, (Depends on the surface texture.) Note1 Stylus tip 30 cone, Carbide Surface roughness Measuring range 800µm/80µm/8µm Resolution 0.01µm/0.001µm/0.0001µm 0.75mN Drive range Specification is selectable from 300mm or 500mm. Resolution 0.05 µm Reflective-type linear encoder CNC mode Max. 0mm/s Z2 axis Drive speed Joystick mode 0 to 50mm/s (Column) Accuracy Model without axis ±(1.5+10/1000)μm : Z2 axis measuring height (mm) (at C) Model with axis Base size (W D) mm Base material Gabbro Note1: When measuring range is ±15mm and stylus SP-76 and SPW-56 are used. Note2: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon. An inspection certificate is supplied as standard. Refer to page X for details. igh-accuracy stylus type CNC Surface Roughness / Contour Measuring System that allows measurement of surface roughness and form/contour with one unit through detector replacement. The X1-, Y- and Z2-axes have a maximum drive speed of 0mm/s. This permits high-speed positioning that can potentially result in a large increase in the throughput of multiple-profile / multipleworkpiece measurement tasks. For models with the axis, it is possible to perform continuous measurement over horizontal and inclined surfaces by powertilting the X1 axis. In addition, automatic measuring force adjustment function of Z1-axis detector for contour measurement enables automatic measurement with constant measuring force even with the X1 axis tilted. For models with the Y-axis table, it is possible to expand the measuring range for multiple workpieces, etc., through positioning in the Y-axis direction. Detector for contour measuring systems (Z1 axis) Accuracy ±( /100)µm For the model without an axis, indication accuracy of the Z2-axis (column) is guaranteed. For this reason, it expands the measuring range of the Z1 axis (detector) in form/contour measurement by using the Z2- axis tracing function. 2-axis simultaneous control in the X- and Y-axis directions enables inclined plane measurements. When the Z1-axis detector for form/contour measurement is replaced with that for surface roughness measurement, or vice versa, it is a simple, one-touch replacement without rerouting of the connecting cables. Since the Z1-axis detector incorporates an anti-collision safety device, the machine will automatically stop if the detector touches a workpiece or jig. Optional external control function (Ext I/O) through bidirectional communication (RS- 232C) with the PC (programmable logic controller) is available. Detector for surface roughness measurement Detector for contour measurement -29

12 An inspection certificate is supplied as standard. Refer to page X for details. igh-accuracy stylus type CNC Surface Measuring System that allows batch measurement of surface roughness and form/contour. The X1- and Z2-axes have maximum drive speeds of 40mm/s and 0mm/s, respectively. This permits high-speed positioning that can potentially result in a large increase in the throughput of multiple-profile / multipleworkpiece measurement tasks. A Mitutoyo aser oloscale is incorporated in the X1- and Z1-axes so that high resolution is achieved and batch measurement of form/ contour and surface roughness can be made. The active control method is employed for the Z1-axis detector to implement a wide-range measurement capability wherein the variation in dynamic measuring force is restricted. Since the Z1-axis detector incorporates an anti-collision safety device, the machine will automatically stop if the detector touches a workpiece or jig. For models with the axis, it is possible to perform continuous measurement over horizontal and inclined surfaces by powertilting the X1 axis. (CS-5000CNC only) For models with the Y-axis table, it is possible to expand the measuring range for multiple workpieces, etc., through positioning in the Y-axis direction. Optional external control function (Ext I/O) through bidirectional communication (RS- 232C) with the PC (programmable logic controller) is available. SPECIFICATIONS Formtracer Extreme CS-5000CNC/CS-5000CNC SERIES 525 CNC Surface Roughness and Contour Measuring Systems CS-5000CNC (with Y-axis table) Wide range detector employing active control technology Model No. CS-5000CNC CS-5000CNC Measuring range 0mm Resolution µm aser oloscale CNC mode Max. 40mm/s Drive speed Joystick mode 0 to 40mm/s X1 axis Measuring speed 0.02, 0.05, 0.1, 0.2mm/s (surface roughness), 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0mm/s (form/contour) Measuring direction Forward / backward Straightness (with standard stylus) ( )μm : traverse length (mm) ( )μm : traverse length (mm) (with 2X-long stylus) ( )μm : traverse length (mm) ( )μm : traverse length (mm) Accuracy ( C) ±( )µm : traverse length (mm) ±( )µm : traverse length (mm) Measuring range (with standard stylus) 12mm (with 2X-long stylus) 24mm Resolution (with standard stylus) µm (with 2X-long stylus) µm Vertical movement of the stylus Arc motion Transmission-type linear encoder Accuracy ( C) ±( )µm : probing height (mm) ±( )µm : probing height (mm) Z1 axis (with standard stylus) 4mN (Fixed) (Detector) (with 2X-long stylus) 0.75mN (Fixed) Traceable angle Ascent: 60, Descent: 60, (Depends on the surface texture.) Standard stylus Tip angle: 40, Tip radius: 5μm, Diamond tip Standard ball stylus Tip ball radius: 0.25mm, Sapphire Stylus tip shape 2X-long stylus Tip angle: 40, Tip radius: 5μm, Diamond tip 2X-long stylus Tip angle: 60, Tip radius: 2μm, Diamond tip 2X-long ball stylus Tip ball radius: 0.25mm, Sapphire Face of stylus Downward Travel range Z2 axis (column, type S) 300mm Z2 axis (column, type ) 500mm Resolution 0.05 µm Z2 axis Reflective-type linear encoder (Column) CNC mode Max. 0mm/s Drive speed Joystick mode 0 to 50mm/s Base size (width depth) mm Base material Gabbro Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon. -30

13 Contracer Quick Guide to Precision Measuring Instruments igh precision + high functionality + high operability = Contracer Traceable Angle Down slope Contracer (Contour Measuring Instruments) Accuracy As the detector units of the X and Z axes incorporate scales, the magnification accuracy is displayed not as a percentage but as the linear displacement accuracy for each axis. The maximum angle at which a stylus can trace upwards or downwards along the contour of a workpiece, in the stylus travel direction, is referred to as the traceable angle. A one-sided sharp stylus with a tip angle of 12 (as in the above figure) can trace a maximum 77 of up slope and a maximum 87 of down slope. For a conical stylus (30 cone), the traceable angle is smaller. An up slope with an angle of 77 or less overall may actually include an angle of more than 77 due to the effect of surface roughness. Surface roughness also affects the measuring force. For model CV-30/4500, the same type of stylus (SP-71: one-sided sharp stylus with a tip angle of 12 ) can trace a maximum 77 of up slope and a maximum 83 of down slope. Compensating for Stylus Tip Radius A recorded profile represents the locus of the center of the ball tip rolling on a workpiece surface. (A typical radius is 0.025mm.) Obviously this is not the same as the true surface profile so, in order to obtain an accurate profile record, it is necessary to compensate for the effect of the tip radius through data processing. Recorded profile Workpiece contour RxM Up slope R: Stylus tip radius M: Measurement magnification 77 or less If a profile is read from the recorder through a template or scale, it is necessary to compensate for the stylus tip radius beforehand according to the applied measurement magnification. Compensating for Arm Rotation The stylus is carried on a pivoted arm so it rotates as the surface is traced and the contact tip does not track purely in the Z direction. Therefore it is necessary to apply compensation in the X direction to ensure accuracy. There are three methods of compensating for arm rotation. 1: Mechanical compensation 2: Electrical compensation δ RxM 87 or less Stylus Stylus RxM Measuring arm Overload Safety Cutout If an excessive force (overload) is exerted on the stylus tip due, perhaps, to the tip encountering a too-steep slope on a workpiece feature, or a burr, etc., a safety device automatically stops operation and sounds an alarm buzzer. This type of instrument is commonly equipped with separate safety devices for the tracing direction () load and vertical direction (Y axis) load. For model CV-30/4500, a safety device functions if the arm comes off the detector mount. Simple or Complex Arm Guidance In the case of a simple pivoted arm, the locus that the stylus tip traces during vertical movement (Z direction) is a circular arc that results in an unwanted offset in X, for which compensation has to be made. The larger the arc movement, the larger is the unwanted X displacement (δ) that has to be compensated. (See figure, lower left.) The alternative is to use a complex mechanical linkage arrangement to obtain a linear translation locus in Z, and therefore avoid the need to compensate in X. Z axis Measurement Methods Though the measurement method commonly adopted is by means of a digital scale, the Z axis measurement divides into analog methods (using a differential transformer, etc.) and digital scale methods. Analog methods vary in Z axis resolution depending on the measurement magnification and measuring range. Digital scale methods have fixed resolution. Generally, a digital scale method provides higher accuracy than an analog method. Fulcrum δ: Unwanted displacement in X to be compensated 3: Software processing. To measure a workpiece contour that involves a large displacement in the vertical direction with high accuracy, one of these compensation methods needs to be implemented. -31

14 Contour analysis methods You can analyze the contour with one of the following two methods after completing the measurement operation. Data processing section and analysis program The measured contour is input into the data processing section in real time and a dedicated program performs the analysis using the mouse and/or keyboard. The angle, radius, step, pitch and other data are directly displayed as numerical values. Analysis combining coordinate systems can be easily performed. The graph that goes through stylus radius correction is output to the printer as the recorded profile. Data Combination Conventionally, if tracing a complete contour is prevented by stylus traceable-angle restrictions then it has to be divided into several sections that are then measured and evaluated separately. This function avoids this undesirable situation by combining the separate sections into one contour by overlaying common elements (lines, points) onto each other. With this function the complete contour can be displayed and various analyses performed in the usual way. Data 1 Data 2 Tolerancing with Design Data Measured workpiece contour data can be compared with design data in terms of actual and designed shapes rather than just analysis of individual dimensions. In this technique each deviation of the measured contour from the intended contour is displayed and recorded. Also, data from one workpiece example can be processed so as to become the master design data to which other workpieces are compared. This function is particularly useful when the shape of a section greatly affects product performance, or when its shape has an influence on the relationship between mating or assembled parts. Best-fitting If there is a standard for surface profile data, tolerancing with design data is performed according to the standard. If there is no standard, or if tolerancing only with shape is desired, best-fitting between design data and measurement data can be performed. Data combination Measurement Examples <Before best-fit processing> <After best-fit processing> Measured data Measured data Aspheric lens contour Inner/outer ring contour of a bearing Design data Design data The best-fit processing algorithm searches for deviations between both sets of data and derives a coordinate system in which the sum of squares of the deviations is a minimum when the measured data is overlaid on the design data. Internal gear teeth Female thread form Male thread form Gage contour -32