HYPERSPECTRAL IMAGING THIN FILM APPLICATIONS. Dr. Wulf Grählert /

Size: px
Start display at page:

Download "HYPERSPECTRAL IMAGING THIN FILM APPLICATIONS. Dr. Wulf Grählert /"

Transcription

1 Dr. Wulf Grählert / wulf.graehlert@iws.fraunhofer.de

2 Motivation Coating processes: thin film application process stability What s about Monitoring? Random sampling? Real time analysis? 100% analysis? 2

3 Introduction Hyperspectral Imaging combination of spectroscopy and imaging analysis and evaluation of spatial differences of chemistry morphology topology Hypercube R, T = f(x, y, l) extraction of derived sample features 3

4 Information content monochrome 2 8 = 256 tonal values RGB (2 8 ) 3 = 16,7 Mio. colors monochrome 1 image RGB 3 images image analysis texture, topolgy, shape, structure hyperspectral (2 8 ) 1000 tonal values hyperspectral 1000 images 4

5 APPROACH Information content thin films Influence of layer features reflection properties of samples are influenced by: 1. stack composition 5. substrate defects 2. inclusions 6. contaminations 3. cracks and scratches 7. material gradient 4. (pin) holes 8. thickness gradient Influence of spectral characteristics 5

6 Hyperspectral Imaging line scan (pushbroom) HSI 6

7 Thin film analysis * hard modeling of thickness (d), refraction index (n) and absorption (k) evaluation of interferences Diamor thin film 1 cm DLC steel thin film thickness d refraction index n (@1100 nm) absorption k (@1100 nm) * P. Wollmann, F. Gruber, W. Grählert; 2014, patent pending 7

8 Analysis of conductivity and resistance * hard modeling (interferences) full surface resolution, no limitation to mean value (i.e. 4-point measurement) transparent conductive oxide (TCO) ITO glas photograph 2 cm sheet resistance * P. Wollmann, E. Weißenborn, W. Grählert; 2015, patent pending 8

9 Laser scribing / selective removal * derived feature extraction soft modeling of removal performance pulsed laser track 100 nm HDR nm ITO SiN ratio 150 nm SiN 20 µm organic layer PET foil * P. Wollmann, F. Gruber, W. Grählert; 2015, patent pending Laser power 9

10 Prediction of adhesion strength* derived feature extraction fast soft modeling (< 1 min) duration wedge test: ~500 h * P. Wollmann, F. Gruber, W. Grählert; 2015, patent pending

11 Prediction of water vapor transmission rate (WVTR) * derived feature extraction fast soft modeling (< 1 min) 200 µm duration WVTR determination Calcium test / LDS: h * P. Wollmann, F. Gruber, W. Grählert; 2015, patent pending 11

12 Prozess-Monitoring: HSI Zusammenfassung Service Development Process integration Licensing hardware & test sites continous processes patents feasibility studies, measurements algorithms, evaluation complex surfaces imanto pro

13 Prozess-Monitoring: HSI Zusammenfassung hardware control data recording data pretreatment data evaluation process interface imanto pro

14 Summary coating and process control defect and contamination screening* sample classification substrates metals, glas, polymer (-foils), wafer, ceramics, derived feature extraction process parameters, adhesion strength, wet film thickness, barrier capacity, * P. Wollmann, F. Gruber, W. Grählert; 2015, patent pending 14

New concepts for 100% inspection of coated and surface treated webs

New concepts for 100% inspection of coated and surface treated webs New concepts for 100% inspection of coated and surface treated webs F. Gruber, P. Wollmann, W. Grählert, S. Kaskel, Fraunhofer IWS, Winterbergstraße 28, 01277 Dresden, Germany Hyperspectral imaging (HSI)

More information

Laser Applications for Photovoltaics Crystalline and Thin Film Technologies

Laser Applications for Photovoltaics Crystalline and Thin Film Technologies LASERS & MATERIAL PROCESSING I OPTICAL SYSTEMS I INDUSTRIAL METROLOGY I TRAFFIC SOLUTIONS I DEFENSE & CIVIL SYSTEMS Laser Applications for Photovoltaics Crystalline and Thin Film Technologies Back contact

More information

1 Introduction j3. Thicknesses d j. Layers. Refractive Indices. Layer Stack. Substrates. Propagation Wave Model. r-t-φ-model

1 Introduction j3. Thicknesses d j. Layers. Refractive Indices. Layer Stack. Substrates. Propagation Wave Model. r-t-φ-model j1 1 Introduction Thin films of transparent or semitransparent materials play an important role in our life. A variety of colors in nature are caused by the interference of light reflected at thin transparent

More information

Specification Sheet FPI lab

Specification Sheet FPI lab Specification Sheet FPI lab Off-line Process Control Max. Sample Size 500 mm x 500 mm High Resolution Local Defect Detection and Coating Thickness Measurement Professional Process Perfection dr.schwab

More information

Mirror Example Consider a concave mirror radius -10 cm then = = Now consider a 1 cm candle s = 15 cm from the vertex Where is the image.

Mirror Example Consider a concave mirror radius -10 cm then = = Now consider a 1 cm candle s = 15 cm from the vertex Where is the image. Mirror Example Consider a concave mirror radius -10 cm then r 10 f = = = 5 cm 2 2 Now consider a 1 cm candle s = 15 cm from the vertex Where is the image 1 s 2 1 = = r s 1 1 2 + = = s s r 1 1 = 0.13333

More information

New Line Confocal Imaging Method for High-Resolution 3D Surface Imaging Applications. Juha Saily Sales Manager FocalSpec, Inc.

New Line Confocal Imaging Method for High-Resolution 3D Surface Imaging Applications. Juha Saily Sales Manager FocalSpec, Inc. New Line Confocal Imaging Method for High-Resolution 3D Surface Imaging Applications Juha Saily Sales Manager FocalSpec, Inc. Introduction Company Line Confocal Imaging Sensor products Scan examples System

More information

Laser Applications for Photovoltaics Crystalline and Thin Film Technologies

Laser Applications for Photovoltaics Crystalline and Thin Film Technologies LASERS & MATERIAL PROCESSING I OPTICAL SYSTEMS I INDUSTRIAL METROLOGY I TRAFFIC SOLUTIONS I DEFENSE & CIVIL SYSTEMS Laser Applications for Photovoltaics Crystalline and Thin Film Technologies Back contact

More information

Mirror Example Consider a concave mirror radius r = -10 cm then. Now consider a 1 cm candle s = 15 cm from the vertex Where is the image.

Mirror Example Consider a concave mirror radius r = -10 cm then. Now consider a 1 cm candle s = 15 cm from the vertex Where is the image. Mirror Example Consider a concave mirror radius r = -0 cm then r 0 f 5 cm 2 2 Now consider a cm candle s = 5 cm from the vertex Where is the image s 2 r s 2 s s r 0.3333 5 5 f s' 0.333 M ' s 7.5 Magnification

More information

Global Optical Coatings Market

Global Optical Coatings Market Market Report Global Optical Coatings Market Published: April, 2014 Publisher: Acmite Market Intelligence Language: English Pages: 520 Price: from 1,490 Euro Abstract As an enabling technology, thin film

More information

T-Solar Overview. * Patent-pending

T-Solar Overview. * Patent-pending T-Solar T-Solar Overview The T-Solar system combines our best photovoltaic measurement technology into a system designed specifically for measuring textured samples. Based on the established M-2000 rotating

More information

Chapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena

Chapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena Chapter 24 Wave Optics Wave Optics The wave nature of light is needed to explain various phenomena Interference Diffraction Polarization The particle nature of light was the basis for ray (geometric) optics

More information

Add A Lens, Inc th Avenue Suite B-230 New York, New York

Add A Lens, Inc th Avenue Suite B-230 New York, New York Add A Lens Additive Variable Focus Scratch Resistant Multi-Layered Reusable Self Adhesive Eyeglass Lens System Introducing a revolution in eyeglass lens manufacturing and distribution. Add A Lens is a

More information

Production methods for large area printed electronics and organic photovoltaics. Thomas Kolbusch, Vice President

Production methods for large area printed electronics and organic photovoltaics. Thomas Kolbusch, Vice President Production methods for large area printed electronics and organic photovoltaics Thomas Kolbusch, Vice President 11.10.2012 2011 2012 COATEMA Coating Machinery GmbH www.coatema.de 1 Large area printed electronics

More information

Advanced light management techniques for building integrated PV (BIPV)

Advanced light management techniques for building integrated PV (BIPV) Advanced light management techniques for building integrated PV (BIPV) A. Ingenito, J. C. O. Lizcano, O. Isabella, M. Zeman Delft University of Technology Advanced light management Roadmap for decreasing

More information

Chapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena

Chapter 24. Wave Optics. Wave Optics. The wave nature of light is needed to explain various phenomena Chapter 24 Wave Optics Wave Optics The wave nature of light is needed to explain various phenomena Interference Diffraction Polarization The particle nature of light was the basis for ray (geometric) optics

More information

Mikro-und Nanostrukturierung mit Ultrakurzpulslasern für Werkzeugtechnik und funktionale Oberflächen

Mikro-und Nanostrukturierung mit Ultrakurzpulslasern für Werkzeugtechnik und funktionale Oberflächen Micro and Nano Structuring with Ultra Short Pulsed Lasers for Tool Technology and Functional Surfaces Mikro-und Nanostrukturierung mit Ultrakurzpulslasern für Werkzeugtechnik und funktionale Oberflächen

More information

MLI INTRODUCTION GUIDE. copyright reserved 2012 MLI

MLI INTRODUCTION GUIDE. copyright reserved 2012 MLI MLI INTRODUCTION GUIDE Table of Contents MLI, the Company Introduction of MLI Why MLI MLI Test Equipments Pellicle Introduction Pellicle Film Transmission Pellicle Mounting Tool MLI Quality System 3 4

More information

Electronic Supplementary Information

Electronic Supplementary Information Electronic Supplementary Information for Phase-specific pore growth in ultrathin bicomponent films from cellulose-based polysaccharides by Laura Taajamaa, Orlando Rojas,* Janne Laine, Eero Kontturi* ESI

More information

STEEL SURFACE CHARACTERIZATION USING 3D PROFILOMETRY

STEEL SURFACE CHARACTERIZATION USING 3D PROFILOMETRY STEEL SURFACE CHARACTERIZATION USING 3D PROFILOMETRY Prepared by Andrea Novitsky 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials.

More information

AP* Optics Free Response Questions

AP* Optics Free Response Questions AP* Optics Free Response Questions 1978 Q5 MIRRORS An object 6 centimeters high is placed 30 centimeters from a concave mirror of focal length 10 centimeters as shown above. (a) On the diagram above, locate

More information

Metrology Tools for Flexible Electronics and Display Substrates. Min Yang

Metrology Tools for Flexible Electronics and Display Substrates. Min Yang Metrology Tools for Flexible Electronics and Display Substrates Min Yang 1 Acknowledgement The speaker would like to sincerely thank the following collaborators for their contributions: Roger Posusta,

More information

Intermediate Physics PHYS102

Intermediate Physics PHYS102 Intermediate Physics PHYS102 Dr Richard H. Cyburt Assistant Professor of Physics My office: 402c in the Science Building My phone: (304) 384-6006 My email: rcyburt@concord.edu My webpage: www.concord.edu/rcyburt

More information

Bringing 3D Integration to Packaging Mainstream

Bringing 3D Integration to Packaging Mainstream Bringing 3D Integration to Packaging Mainstream Enabling a Microelectronic World MEPTEC Nov 2012 Choon Lee Technology HQ, Amkor Highlighted TSV in Packaging TSMC reveals plan for 3DIC design based on silicon

More information

Cost-effective System for Inline Coating Evaluation in R2R Processes. Craig Johnson Business Developement Manager

Cost-effective System for Inline Coating Evaluation in R2R Processes. Craig Johnson Business Developement Manager Cost-effective System for Inline Coating Evaluation in R2R Processes Craig Johnson Business Developement Manager 2017-10-11 Agenda 1 2 3 4 Markets and Applications Measuring Head Software System Overview

More information

NANOMETRIC LAB PRINTER. Plug & Play Solution for ultra-precise printing of conductive lines in nano-scale

NANOMETRIC LAB PRINTER. Plug & Play Solution for ultra-precise printing of conductive lines in nano-scale NANOMETRIC LAB PRINTER Plug & Play Solution for ultra-precise printing of conductive lines in nano-scale WHO ARE WE? WHAT IS OUR SOLUTION? XTPL S.A. is a company operating in the nanotechnology segment.

More information

Active Yield Management: New Trends in Advanced Optical Disc Production Rolf W. Hertling, Hongda Yue

Active Yield Management: New Trends in Advanced Optical Disc Production Rolf W. Hertling, Hongda Yue White paper Active Yield Management: New Trends in Advanced Optical Disc Production Rolf W. Hertling, Hongda Yue 1. Introduction Today, the market of optical disc is developing to new formats. The old

More information

Review of paper Non-image-forming optical components by P. R. Yoder Jr.

Review of paper Non-image-forming optical components by P. R. Yoder Jr. Review of paper Non-image-forming optical components by P. R. Yoder Jr. Proc. of SPIE Vol. 0531, Geometrical Optics, ed. Fischer, Price, Smith (Jan 1985) Karlton Crabtree Opti 521 14. November 2007 Introduction:

More information

Optical Fiber Assemblies

Optical Fiber Assemblies Optical Fiber Assemblies Installation and Operation Instructions Overview Ocean Optics offers an extensive line of standard and premium grade optical fibers and accessories including patch cords, bifurcated

More information

Touch Technology Brief

Touch Technology Brief Touch Technology Brief Projected Capacitive Technology Introduction Projected Capacitive Technology (PCT) is fast becoming one of the most prevalent touch technologies for an expanding variety of applications

More information

Chemistry Instrumental Analysis Lecture 6. Chem 4631

Chemistry Instrumental Analysis Lecture 6. Chem 4631 Chemistry 4631 Instrumental Analysis Lecture 6 UV to IR Components of Optical Basic components of spectroscopic instruments: stable source of radiant energy transparent container to hold sample device

More information

Increasing laser processing efficiency using multibeam and tailored beam profiles

Increasing laser processing efficiency using multibeam and tailored beam profiles Increasing laser processing efficiency using multibeam and tailored beam profiles Ulrich Rädel TOPAG Lasertechnik GmbH, Darmstadt Overview Presentation of company Topag Increasing processing efficiency

More information

FULLY ORGANIC INTEGRATED ARRAYS ON FLEXIBLE SUBSTRATES FOR X-RAY IMAGING

FULLY ORGANIC INTEGRATED ARRAYS ON FLEXIBLE SUBSTRATES FOR X-RAY IMAGING Pawel E. Malinowski FULLY ORGANIC INTEGRATED ARRAYS ON FLEXIBLE SUBSTRATES FOR X-RAY IMAGING IISW Snowbird, 13 th June 2013 FLEXIBLE ORGANIC IMAGERS: MOTIVATION light-weight flexible robust compatible

More information

VIVALDI VR 7-2 AND VGB 7-2

VIVALDI VR 7-2 AND VGB 7-2 VIVALDI VR 7-2 AND VGB 7-2 Technical Information Vivaldi VR 7-2 is a red-sensitive line film. It is especially designed for ultra-short exposure times (microseconds) in photoplotters with red neon lasers

More information

MACHINING SURFACE FINISH QUALITY USING 3D PROFILOMETRY

MACHINING SURFACE FINISH QUALITY USING 3D PROFILOMETRY MACHINING SURFACE FINISH QUALITY USING 3D PROFILOMETRY Prepared by Duanjie Li, PhD Morgan, Ste1, Irvine CA 91 P: 99.1.99 F: 99.1.93 nanovea.com Today's standard for tomorrow's materials. 1 NANOVEA INTRODUCTION

More information

Lecture # 11: Particle image velocimetry

Lecture # 11: Particle image velocimetry AerE 344 Lecture Notes Lecture # 11: Particle image velocimetry Dr. Hui Hu Dr. Rye M Waldman Department of Aerospace Engineering Iowa State University Ames, Iowa 50011, U.S.A Sources/ Further reading:

More information

High spatial resolution measurement of volume holographic gratings

High spatial resolution measurement of volume holographic gratings High spatial resolution measurement of volume holographic gratings Gregory J. Steckman, Frank Havermeyer Ondax, Inc., 8 E. Duarte Rd., Monrovia, CA, USA 9116 ABSTRACT The conventional approach for measuring

More information

Inspection of imprint templates Sematech Lithography Workshop May, 2008

Inspection of imprint templates Sematech Lithography Workshop May, 2008 Inspection of imprint templates Sematech Lithography Workshop May, 2008 Mark McCord, Tony DiBiase, Bo Magyulan Ian McMackin*, Joe Perez*, Doug Resnick* * Outline Electron beam inspection of templates Optical

More information

Control of Light. Emmett Ientilucci Digital Imaging and Remote Sensing Laboratory Chester F. Carlson Center for Imaging Science 8 May 2007

Control of Light. Emmett Ientilucci Digital Imaging and Remote Sensing Laboratory Chester F. Carlson Center for Imaging Science 8 May 2007 Control of Light Emmett Ientilucci Digital Imaging and Remote Sensing Laboratory Chester F. Carlson Center for Imaging Science 8 May 007 Spectro-radiometry Spectral Considerations Chromatic dispersion

More information

Four-Point Probe System

Four-Point Probe System Manual version: 2.0.E Product code: T2001A2 Product version: 2.0 Software version: 1.1 enabling materials science ossila.com Contents 1. Safety... 3 1.1 Warning... 3 1.2 Caution... 3 2. Introduction...

More information

Session 1B Transparent Materials

Session 1B Transparent Materials Session 1B Transparent Materials Andrew Martin UPenn, February 2014 2014 J.A. Woollam Co., Inc. www.jawoollam.com 1 Overview Transparent substrates & films Cauchy equation Common complexities Evaluating,

More information

Particle Image Velocimetry Part - 1

Particle Image Velocimetry Part - 1 AerE 545X class notes #23 Particle Image Velocimetry Part - 1 Hui Hu Department of Aerospace Engineering, Iowa State University Ames, Iowa 50011, U.S.A Announcement Room 1058, Sweeney Hall for Lab#4 (LDV

More information

Three-dimensional imaging of 30-nm nanospheres using immersion interferometric lithography

Three-dimensional imaging of 30-nm nanospheres using immersion interferometric lithography Three-dimensional imaging of 30-nm nanospheres using immersion interferometric lithography Jianming Zhou *, Yongfa Fan, Bruce W. Smith Microelectronics Engineering Department, Rochester Institute of Technology,

More information

Reflectivity Calculation Program

Reflectivity Calculation Program Reflectivity Calculation Program This optional program allows calculation of the reflectivity spectrum at any incidence angle from the wavelength distribution of the sample n and k values. Additionally,

More information

Announcements. Final exam day events (Friday, May 12, 10:00am to 12:00pm)

Announcements. Final exam day events (Friday, May 12, 10:00am to 12:00pm) Announcements Final exam day events (Friday, May 12, 10:00am to 12:00pm) 50-point multiple choice end-material test (covering material from chapters 33-36). (You get a free 8-point question!) 200 point

More information

ADVANCED ULTRASOUND WAVEFORM ANALYSIS PACKAGE FOR MANUFACTURING AND IN-SERVICE USE R. A Smith, QinetiQ Ltd, Farnborough, GU14 0LX, UK.

ADVANCED ULTRASOUND WAVEFORM ANALYSIS PACKAGE FOR MANUFACTURING AND IN-SERVICE USE R. A Smith, QinetiQ Ltd, Farnborough, GU14 0LX, UK. ADVANCED ULTRASOUND WAVEFORM ANALYSIS PACKAGE FOR MANUFACTURING AND IN-SERVICE USE R. A Smith, QinetiQ Ltd, Farnborough, GU14 0LX, UK. Abstract: Users of ultrasonic NDT are fundamentally limited by the

More information

Lab 12 - Interference-Diffraction of Light Waves

Lab 12 - Interference-Diffraction of Light Waves Lab 12 - Interference-Diffraction of Light Waves Equipment and Safety: No special safety equipment is required for this lab. Do not look directly into the laser. Do not point the laser at other people.

More information

Surface Plasmon Resonance Simulate your reflectivity curve with WinSpall

Surface Plasmon Resonance Simulate your reflectivity curve with WinSpall Introduction tutorial #2 WinSpall is a software for the simulation of surface plasmon resonance curves based on the Fresnel formalism. Winspall is easy to use and lets you model reflection curves pretty

More information

Understanding and selecting diffraction gratings

Understanding and selecting diffraction gratings Understanding and selecting diffraction gratings Diffraction gratings are used in a variety of applications where light needs to be spectrally split, including engineering, communications, chemistry, physics

More information

10.4 Interference in Thin Films

10.4 Interference in Thin Films 0. Interference in Thin Films You have probably noticed the swirling colours of the spectrum that result when gasoline or oil is spilled on water. And you have also seen the colours of the spectrum shining

More information

ECP Embedded Component Packaging Technology

ECP Embedded Component Packaging Technology ECP Embedded Component Packaging Technology A.Kriechbaum, H.Stahr, M.Biribauer, N.Haslebner, M.Morianz, M.Beesley AT&S Austria Technologie und Systemtechnik AG Abstract The packaging market has undergone

More information

Ray Optics I. Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex

Ray Optics I. Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex Phys 531 Lecture 8 20 September 2005 Ray Optics I Last time, finished EM theory Looked at complex boundary problems TIR: Snell s law complex Metal mirrors: index complex Today shift gears, start applying

More information

Solving Integration Challenges for Printed and Flexible Hybrid Electronics

Solving Integration Challenges for Printed and Flexible Hybrid Electronics Solving Integration Challenges for Printed and Flexible Hybrid Electronics SEMICON West 16 July 2015 Proprietary Information www.americansemi.com What are Flexible Hybrid Electronics 2 Flexible Hybrid

More information

Packaging for parallel optical interconnects with on-chip optical access

Packaging for parallel optical interconnects with on-chip optical access Packaging for parallel optical interconnects with on-chip optical access I. INTRODUCTION Parallel optical interconnects requires the integration of lasers and detectors directly on the CMOS chip. In the

More information

Hyperspectral Chemical Imaging: principles and Chemometrics.

Hyperspectral Chemical Imaging: principles and Chemometrics. Hyperspectral Chemical Imaging: principles and Chemometrics aoife.gowen@ucd.ie University College Dublin University College Dublin 1,596 PhD students 6,17 international students 8,54 graduate students

More information

Interference Effects. 6.2 Interference. Coherence. Coherence. Interference. Interference

Interference Effects. 6.2 Interference. Coherence. Coherence. Interference. Interference Effects 6.2 Two-Slit Thin film is a general property of waves. A condition for is that the wave source is coherent. between two waves gives characteristic patterns due to constructive and destructive.

More information

Optical Topography Measurement of Patterned Wafers

Optical Topography Measurement of Patterned Wafers Optical Topography Measurement of Patterned Wafers Xavier Colonna de Lega and Peter de Groot Zygo Corporation, Laurel Brook Road, Middlefield CT 6455, USA xcolonna@zygo.com Abstract. We model the measurement

More information

Benefiting from Polarization: Effects at High-NA Imaging

Benefiting from Polarization: Effects at High-NA Imaging Benefiting from Polarization: Effects at High-NA Imaging Bruce W. Smith L. Zavyalova, A. Estroff, Y. Fan, A. Bourov Rochester Institute of Technology P. Zimmerman International SEMACH and Intel J. Cashmore

More information

EyeTech. Particle Size Particle Shape Particle concentration Analyzer ANKERSMID

EyeTech. Particle Size Particle Shape Particle concentration Analyzer ANKERSMID EyeTech Particle Size Particle Shape Particle concentration Analyzer A new technology for measuring particle size in combination with particle shape and concentration. COMBINED LASERTECHNOLOGY & DIA Content

More information

CODE Analysis, design, production control of thin films

CODE Analysis, design, production control of thin films M.Theiss Hard- and Software for Optical Spectroscopy Dr.-Bernhard-Klein-Str. 110, D-52078 Aachen Phone: (49) 241 5661390 Fax: (49) 241 9529100 E-mail: theiss@mtheiss.com Web: www.mtheiss.com CODE Analysis,

More information

Specification of Thin Film Thickness Measuring Equipment

Specification of Thin Film Thickness Measuring Equipment of Thin Film Thickness Measuring Equipment A. Application: Major application is for solar cell thin film thickness measurement for films such as CIGS, CdS, ITO, ZnO etc. deposited on substrates such as

More information

Model LE-200C/LH-200C/LZ-200C Coating Thickness Testers. Operation Manual

Model LE-200C/LH-200C/LZ-200C Coating Thickness Testers. Operation Manual Model LE-200C/LH-200C/LZ-200C Coating Thickness Testers Operation Manual Contents 1. Features... 1 2. Specifications... 2 3. Measurement Principles... 3 4. Part Names and Functions... 4 5. The Keyboard...

More information

Compact Disc How it Works?

Compact Disc How it Works? Compact Disc How it Works? A Compact Disc (CD) is an optical disc used to store digital data. CD-ROMs and CD-Rs remain widely used technologies in the computer industry.cd-rom drives employ a near-infrared

More information

Using Fringe Projection Phase-Shifting to Correct Contact Angles for Roughness Effects. June th, 2016 Greg Wills Biolin Scientific

Using Fringe Projection Phase-Shifting to Correct Contact Angles for Roughness Effects. June th, 2016 Greg Wills Biolin Scientific Using Fringe Projection Phase-Shifting to Correct Contact Angles for Roughness Effects June 15-16 th, 2016 Greg Wills Biolin Scientific Copyright Biolin Scientific 2014 Content Introduction to Contact

More information

Modeling of Surface Reflectance of Acid Textured Multicrystalline Silicon Wafer for Solar Cell Application

Modeling of Surface Reflectance of Acid Textured Multicrystalline Silicon Wafer for Solar Cell Application International Journal of Electronics and Computer Science Engineering 1065 Available Online at www.ijecse.org ISSN- 2277-1956 Modeling of Surface Reflectance of Acid Textured Multicrystalline Silicon Wafer

More information

Chapter 8: Physical Optics

Chapter 8: Physical Optics Chapter 8: Physical Optics Whether light is a particle or a wave had puzzled physicists for centuries. In this chapter, we only analyze light as a wave using basic optical concepts such as interference

More information

Get PCB Prototypes Sooner with In-House Rapid PCB Prototyping

Get PCB Prototypes Sooner with In-House Rapid PCB Prototyping Get PCB Prototypes Sooner with In-House Rapid PCB Prototyping Save Time with In-House Prototyping In-house circuit board prototyping eliminates waiting for external suppliers. With LPKF systems and solutions,

More information

Epigap FAQs Part packges and form factors typical LED packages

Epigap FAQs Part packges and form factors typical LED packages 3. packges and form factors 3.1. typical LED packages Radiation from LEDs is generated by a semiconductor chip mounted in a package. LEDs are available in a variety of designs significantly influencing

More information

Lecture: P1_Wk3_L5 Contact Mode Scans. Ron Reifenberger Birck Nanotechnology Center Purdue University 2012

Lecture: P1_Wk3_L5 Contact Mode Scans. Ron Reifenberger Birck Nanotechnology Center Purdue University 2012 Lecture: Contact Mode Scans Ron Reifenberger Birck Nanotechnology Center Purdue University 2012 1 The Purpose of a Microscope is to Obtain an Image Reflected laser spot Laser Diode Four-Quadrant Photodetector

More information

Recent Advances in Ultrafast Laser Subtractive and Additive Manufacturing

Recent Advances in Ultrafast Laser Subtractive and Additive Manufacturing Industrial Affiliates Symposium March 16-18, 2017 Recent Advances in Ultrafast Laser Subtractive and Additive Manufacturing Xiaoming Yu Assistant Professor Ultrafast Laser Processing Group CREOL, The College

More information

From Color to Chemometrics

From Color to Chemometrics From Color to Chemometrics Strategies to determine coating thickness and quality Preliminary Version AIMCAL Web Coating & Handling Conference 2016 02.06.2016 Chris Hellwig Agenda 1 About us 2 Process and

More information

HyperRapid NX SmartCleave

HyperRapid NX SmartCleave High-Speed and High-Quality Brittle Material Processing is an industrial high-power picosecond laser that is specifically optimized for high-speed and high-quality cutting of transparent and brittle materials.

More information

Woollam M2000 Operation Manual

Woollam M2000 Operation Manual Woollam M2000 Operation Manual The Woollam M2000 is a spectroscopic ellipsometer used to characterize optically transparent films. The system has the Near IR upgrade that covers 700 wavelengths from 193nm

More information

NON-CONTACT 3D SURFACE METROLOGY

NON-CONTACT 3D SURFACE METROLOGY LOGO TITLE NON-CONTACT 3D SURFACE METROLOGY COMPANY PROFILE SLOGAN BECAUSE ACCURACY MATTERS LASERSCRIBING MEASUREMENT INTRODUCTION One of the last steps in the production of electronic components is the

More information

DENTAL WEAR SURFACE USING 3D PROFILOMETRY

DENTAL WEAR SURFACE USING 3D PROFILOMETRY DENTAL WEAR SURFACE USING 3D PROFILOMETRY Prepared by Ali Mansouri 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials. 2016 NANOVEA

More information

TECHNICAL DATA SHEET

TECHNICAL DATA SHEET TECHNICAL DATA SHEET AutoFlex Matte Topcoat Important : Please read this information carefully and follow the advice given. We reserve the right to make technical changes as necessary. This data sheet

More information

Bartels Micropumps. ( ) rev mp6 double actuator micropump. Functional principle of mp6. mp5 smallest available plastic micropump

Bartels Micropumps. ( ) rev mp6 double actuator micropump. Functional principle of mp6. mp5 smallest available plastic micropump EN Bartels Micropumps Micropumps transporting the tiniest amounts of gases or liquids can be considered the heart of microfluidics. In many sectors they have become indispensable. Dosing lubricants, feeding

More information

Packaging of Selected Advanced Logic in 2x and 1x nodes. 1 I TechInsights

Packaging of Selected Advanced Logic in 2x and 1x nodes. 1 I TechInsights Packaging of Selected Advanced Logic in 2x and 1x nodes 1 I TechInsights Logic: LOGIC: Packaging of Selected Advanced Devices in 2x and 1x nodes Xilinx-Kintex 7XC 7 XC7K325T TSMC 28 nm HPL HKMG planar

More information

Goal of APPOLO APPOLO Objectives Establish and coordinate connections between end-users application laboratories equipment manufacturers Facilitate

Goal of APPOLO APPOLO Objectives Establish and coordinate connections between end-users application laboratories equipment manufacturers Facilitate 1 Lasers have been approved as a tool for diverse material processing. New application ideas, come from universities and research institutions, are implemented by spin-offs, but effective and low-cost

More information

PowerMax-Pro USB and RS Sensors

PowerMax-Pro USB and RS Sensors PowerMax-Pro USB and RS Sensors 200 mw to 150W PowerMax-Pro USB and RS sensors incorporate LabMax-Pro instrumentation directly within the sensor cable. Similar to other Coherent USB and RS sensors, this

More information

SURFACE FINISH INSPECTION OF WOOD USING 3D PROFILOMETRY

SURFACE FINISH INSPECTION OF WOOD USING 3D PROFILOMETRY SURFACE FINISH INSPECTION OF WOOD USING 3D PROFILOMETRY Prepared by Duanjie Li & Craig Leising 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's

More information

WETTING PROPERTIES OF STRUCTURED INTERFACES COMPOSED OF SURFACE-ATTACHED SPHERICAL NANOPARTICLES

WETTING PROPERTIES OF STRUCTURED INTERFACES COMPOSED OF SURFACE-ATTACHED SPHERICAL NANOPARTICLES November 20, 2018 WETTING PROPERTIES OF STRUCTURED INTERFACES COMPOSED OF SURFACE-ATTACHED SPHERICAL NANOPARTICLES Bishal Bhattarai and Nikolai V. Priezjev Department of Mechanical and Materials Engineering

More information

Introduction to Diffraction Gratings

Introduction to Diffraction Gratings Introduction to Diffraction Diffraction (Ruled and Holographic) Diffraction gratings can be divided into two basic categories: holographic and ruled. A ruled grating is produced by physically forming grooves

More information

SURFACE BOUNDARY MEASUREMENT USING 3D PROFILOMETRY

SURFACE BOUNDARY MEASUREMENT USING 3D PROFILOMETRY SURFACE BOUNDARY MEASUREMENT USING 3D PROFILOMETRY Prepared by Craig Leising 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials. 2013

More information

Study of Air Bubble Induced Light Scattering Effect On Image Quality in 193 nm Immersion Lithography

Study of Air Bubble Induced Light Scattering Effect On Image Quality in 193 nm Immersion Lithography Study of Air Bubble Induced Light Scattering Effect On Image Quality in 193 nm Immersion Lithography Y. Fan, N. Lafferty, A. Bourov, L. Zavyalova, B. W. Smith Rochester Institute of Technology Microelectronic

More information

Unit 5.C Physical Optics Essential Fundamentals of Physical Optics

Unit 5.C Physical Optics Essential Fundamentals of Physical Optics Unit 5.C Physical Optics Essential Fundamentals of Physical Optics Early Booklet E.C.: + 1 Unit 5.C Hwk. Pts.: / 25 Unit 5.C Lab Pts.: / 20 Late, Incomplete, No Work, No Units Fees? Y / N 1. Light reflects

More information

Apex High Performance Spectrometer

Apex High Performance Spectrometer Apex High Performance Spectrometer 1 Elite High Performance Spectrometers Challenge Integrated, high end instruments are required to detect low light levels for challenging Fluorescence and Raman applications

More information

Physical or wave optics

Physical or wave optics Physical or wave optics In the last chapter, we have been studying geometric optics u light moves in straight lines u can summarize everything by indicating direction of light using a ray u light behaves

More information

CS 348B Project Report Mingyu Gao, Jing Pu

CS 348B Project Report Mingyu Gao, Jing Pu CS 348B Project Report Mingyu Gao, Jing Pu mgao12@stanford.edu, jingpu@stanford.edu Introduction In this project, we plan to render silicon wafers with the signature of rainbow colors on the reflecting

More information

Block Diagram NC VDD2 VDD1 GND NC NC NC NC GND NC

Block Diagram NC VDD2 VDD1 GND NC NC NC NC GND NC 2048-pixel CCD Linear Seor (B/W) ILX55A Description The ILX55A is a reduction type CCD linear seor designed for facsimile, image scanner and OCR use. This seor reads B4 size documents at a deity of 200DPI

More information

Resistive Touch Panels

Resistive Touch Panels Resistive Touch Panels SMK has a broad repertoire of resistive touch panels to suit all our clients needs. As well as our standard specification models, we have heat-resistant models suitable for outdoor

More information

Organic Photoconductors for Digital Plain Paper Copiers

Organic Photoconductors for Digital Plain Paper Copiers Organic Photoconductors for Digital Plain Paper Copiers Takahito Miyamoto Shuichi Hamada Yuji Nakamura A B S T R A C T Fuji Electric provides type 1A (low, type 1B (medium and type 1C (high s for digital

More information

Highly Transparent and Highly Passivating Silicon Nitride for Solar Cells. Yimao Wan The Australian National University (ANU) 23/10/2014

Highly Transparent and Highly Passivating Silicon Nitride for Solar Cells. Yimao Wan The Australian National University (ANU) 23/10/2014 Highly Transparent and Highly Passivating Silicon Nitride for Solar Cells Yimao Wan The Australian National University (ANU) 23/10/2014 2 Outline Motivation Reviews of SiNx properties Process development

More information

Comparison of Singulation Techniques

Comparison of Singulation Techniques Comparison of Singulation Techniques Electronic Packaging Society, Silicon Valley Chapter Sept. 28, 2017 ANNETTE TENG Sept 28, 2017 1 Definition of Singulation 9/28/2017 Annetteteng@promex-ind.com 2 www.cpmt.org/scv

More information

The World s Smallest Displacement Sensor!!

The World s Smallest Displacement Sensor!! Compact laser displacement sensor Series FASTUS is new product brand name from Optex-FA The World s Smallest Displacement!! Innovative size! Built-in controller Performance Fits in any machine 4 Digit

More information

Efficient metal processing using high average power ultrafast laser

Efficient metal processing using high average power ultrafast laser Efficient metal processing using high average power ultrafast laser Strasbourg, September 13 th, 2017 J. Lopez J. Lopez et al., Journal of Laser Micro and Nanofabrication, submitted (2017) G. Mincuzzi

More information

How-to Guide. Building a Quality Membrane Switch

How-to Guide. Building a Quality Membrane Switch How-to Guide This guide will show you the basic membrane switch design process so that you can better understand your own needs when it comes to planning your project. Building a Quality Membrane Switch

More information

LIMO Line Laser System - PEX High Power Diode Laser System for Industrial Applications

LIMO Line Laser System - PEX High Power Diode Laser System for Industrial Applications General Description: Flat Panel Display The laser system is engineered to generate a homogeneous line of 80 mm x 0.2 mm. Componets: - 9x Laser modules - 9x Fibres - Beam Shaping Module - High power laser

More information

Optimize the Optics for Your High Power Laser Applications

Optimize the Optics for Your High Power Laser Applications 1 Optimize the Optics for Your High Power Laser Applications 2 High power optics configurations for most popular OEM laser models Optics for Solid-State Lasers (1 µm) High power lasers are a growing industry

More information

Supporting Information for Critical Factors of the 3D Microstructural Formation. in Hybrid Conductive Adhesive Materials by X-ray Nano-tomography

Supporting Information for Critical Factors of the 3D Microstructural Formation. in Hybrid Conductive Adhesive Materials by X-ray Nano-tomography Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2014 Supporting Information for Critical Factors of the 3D Microstructural Formation in Hybrid Conductive

More information

FEMTO OpTicsTM in us! O j rld wo T as F ra T ul in an E liv

FEMTO OpTicsTM in us! O j rld wo T as F ra T ul in an E liv FEMTO optics TM We live in an ultrafast world TM join us! 2011 1 FEMTO optics TM 2011 1 A new brand is born We at FEMTOLASERS believe in taking great care of our customers through long-term relationships

More information